Chip tantalum electrolytic capacitor dielectric film repairing device
Through the combination of limiting parts, lifting drive parts and conductive parts, the operation process is simplified, and the sheet-type tantalum electrolytic capacitor dielectric film is repaired by electrochemical reactions, solving the problems of complex structure and insufficient repair function of the existing device, and achieving efficient dielectric film repair.
Patent Information
- Application Number
- CN202421990631.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-16
- Publication Date
- 2025-07-18
- Estimated Expiration
- 2034-08-16
AI Technical Summary
The existing chip tantalum electrolytic capacitor dielectric film repair device has a complex structure, is inconvenient for operation, and has insufficient repair function.
The limiting parts, lifting drive parts, conductive parts and curtain blocking structures are used to repair the dielectric film through rotation and conductive channels, and the curtain blocking is used for insulation barrier.
The operation process is simplified, the repair efficiency and effect of the dielectric film are improved, and the performance of the dielectric film is improved through electrochemical reactions.
Smart Images

Figure CN223123756U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to a dielectric film repair device for chip tantalum electrolytic capacitors, belonging to the technical field of film repair devices. Background Art
[0002] For example, a dielectric film repair device for chip tantalum electrolytic capacitors disclosed in the application number: 202122377967.X, belonging to the technical field of capacitors, includes a base. A repair chamber is fixed on the top of the base. A manganese nitrate solution chamber is fixed on the top of one side of the repair chamber. A ammonium bisulfate solution chamber is arranged at the bottom of the manganese nitrate solution chamber. A liquid extraction pump is arranged between the manganese nitrate solution chamber and the ammonium bisulfate solution chamber. The arrangement of the manganese nitrate solution chamber and the ammonium bisulfate solution chamber outside the repair chamber can store the solutions respectively, and cooperate with the liquid extraction pump and the three-way pipe for use. During the preparation of the solution, the solutions can be extracted simultaneously, making the preparation more convenient. The arrangement of the electric telescopic rod on the top of the bracket, in cooperation with the motor at the bottom of the mounting plate, makes it convenient to control the lifting and rotation of the storage basket during the use of the device. And during the rotation of the storage basket, the flow rate of the solution is accelerated, ensuring the uniformity of the solution.
[0003] Based on retrieval and analysis, it is found that the existing technology still has deficiencies:
[0004] The existing technology has a complex structure, which is not convenient for operation and the corresponding repair function. Therefore, a dielectric film repair device for chip tantalum electrolytic capacitors is needed to improve the above deficiencies. Content of the Utility Model
[0005] The main purpose of the utility model is to provide a dielectric film repair device for chip tantalum electrolytic capacitors.
[0006] The purpose of the utility model can be achieved by adopting the following technical solutions:
[0007] A dielectric film repair device for chip tantalum electrolytic capacitors includes a repair device main body for repair, and baffles are installed on both sides of the repair device main body;
[0008] A limiting member is installed on the repair device main body, a driving and electrical connection structure is installed on the limiting member, a connecting and blocking structure is installed on the driving and electrical connection structure, and a conveying structure is installed inside the repair device main body.
[0009] Preferably, the driving and electrical connection structure includes a lifting driving member and a conductive member. The lifting driving member is installed on the limiting member, and the conductive member is installed at the output end of the lifting driving member.
[0010] Preferably, the connecting and blocking structure includes a curtain and positive and negative conductive members. The positive and negative conductive members are distributed on the conductive member, and the curtain is distributed outside the conductive member.
[0011] Preferably, the conveying structure includes a conveying member, a rotating rod, a driving wheel, and driving teeth. Rotating rods are installed on both sides inside the main body of the repair device. Driving wheels are sleeved on the rotating rods in a distributed manner. Driving teeth are installed around the driving wheels. The conveying member is sleeved on the driving wheels and the driving teeth.
[0012] Preferably, the lifting driving member pushes the conductive member to be connected in a lifting manner along the limiting member.
[0013] Preferably, the blocking curtain is at least a single-piece structure, and the blocking curtain is a detachable structure.
[0014] The beneficial technical effects of the present utility model:
[0015] A chip tantalum electrolytic capacitor dielectric film repair device provided by the present utility model. Baffles are respectively installed on both sides of the main body of the repair device. Rotating rods are driven and installed at both ends inside the main body of the repair device. A driving wheel is sleeved outside the rotating rod. Driving teeth are installed around the driving wheel. The conveying member is sleeved outside the driving wheel and the driving teeth. A limiting member is installed outside the main body of the repair device. A lifting driving member is driven and installed above. The output end of the lifting driving member is installed with a conductive member. Positive and negative conductive members are distributed on the conductive member. A blocking curtain is distributed outside the conductive member. Place the chip tantalum electrolytic capacitor on the conveying member. Drive the conveying member to rotate through the driving member. Drive the chip tantalum electrolytic capacitor to move during the rotation. When the chip tantalum electrolytic capacitor moves to the bottom of the limiting member, start the lifting driving member on the limiting member to move downward, and make contact with the positive and negative power supplies and the chip tantalum electrolytic capacitor to form a conductive channel. This conductive channel will cause an increase in the leakage current of the capacitor. When a specific voltage or current is applied, an electrochemical reaction will be triggered on this conductive channel, thereby repairing or improving the performance of the dielectric film. The blocking curtain outside the conductive member functions as an insulating barrier. Description of the Drawings
[0016] Figure 1 It is a schematic perspective view of the overall structure of a preferred embodiment of a chip tantalum electrolytic capacitor dielectric film repair device according to the present utility model;
[0017] Figure 2 It is an enlarged view of the structure at A in a preferred embodiment of a chip tantalum electrolytic capacitor dielectric film repair device according to the present utility model;
[0018] Figure 3 It is a schematic view of the structure of a linkage member in a preferred embodiment of a chip tantalum electrolytic capacitor dielectric film repair device according to the present utility model;
[0019] Figure 4 It is a side view of the whole in a preferred embodiment of a chip tantalum electrolytic capacitor dielectric film repair device according to the present utility model.
[0020] In the figure: 1. Main body of the repair device; 2. Conveyor; 3. Limiting member; 4. Lifting drive member; 5. Conductive member; 6. Curtain; 7. Positive and negative conductive members; 8. Baffle; 9. Rotating rod; 10. Driving wheel; 11. Driving teeth. Detailed implementation mode
[0021] To make the technical solutions of the present utility model clearer and more definite for those skilled in the art, the present utility model will be further described in detail below in conjunction with embodiments and the accompanying drawings, but the implementation manners of the present utility model are not limited thereto.
[0022] As Figure 1 - Figure 4 shown, a chip tantalum electrolytic capacitor dielectric film repair device provided in this embodiment includes a main body 1 of the repair device for repair, and baffles 8 are installed on both sides of the main body 1 of the repair device;
[0023] A limiting member 3 is installed on the main body 1 of the repair device, a driving and connecting electrical structure is installed on the limiting member 3, a connecting and blocking structure is installed on the driving and connecting electrical structure, and a conveying structure is installed in the main body 1 of the repair device.
[0024] The driving and connecting electrical structure includes a lifting drive member 4 and a conductive member 5. A lifting drive member 4 is installed on the limiting member 3, and a conductive member 5 is installed at the output end of the lifting drive member 4.
[0025] The connecting and blocking structure includes a curtain 6 and positive and negative conductive members 7. The positive and negative conductive members 7 are distributed on the conductive member 5, and the curtain 6 is distributed outside the conductive member 5.
[0026] The conveying structure includes a conveyor 2, a rotating rod 9, a driving wheel 10 and driving teeth 11. Rotating rods 9 are installed on both sides inside the main body 1 of the repair device, driving wheels 10 are sleeved and distributed on the rotating rods 9, driving teeth 11 are installed around the driving wheels 10, and a conveyor 2 is sleeved on the driving wheels 10 and the driving teeth 11.
[0027] The lifting drive member 4 pushes the conductive member 5 to lift and connect along the limiting member 3.
[0028] The curtain 6 is a structure of at least one piece, and the curtain 6 is a detachable structure.
[0029] As Figure 1 - Figure 4As shown in the figure, the working process of a dielectric film repair device for a chip tantalum electrolytic capacitor provided in this embodiment is as follows: Place the chip tantalum electrolytic capacitor on the conveyor 2, drive the conveyor 2 to rotate through the driving member, and drive the chip tantalum electrolytic capacitor to move during the rotation. When the chip tantalum electrolytic capacitor moves to the bottom of the stopper 3, start the lifting driving member 4 on the stopper 3 to move downward, and contact the positive and negative power supplies with the chip tantalum electrolytic capacitor to form a conductive channel. This conductive channel will cause an increase in the leakage current of the capacitor. When a specific voltage or current is applied, an electrochemical reaction will be triggered on this conductive channel, thereby repairing or improving the performance of the dielectric film, and the insulating blocking function is performed by the curtain 6 outside the conductive member 5.
[0030] Embodiment
[0031] As Figure 1 - Figure 4 As shown in the figure, baffles 8 are respectively installed on both sides of the repair device main body 1. Rotating rods 9 are driven and installed at both ends of the repair device main body 1. A driving wheel 10 is sleeved outside the rotating rod 9. Driving teeth 11 are installed around the driving wheel 10. A conveyor 2 is sleeved outside the driving wheel 10 and the driving teeth 11. A stopper 3 is installed outside the repair device main body 1. A lifting driving member 4 is driven and installed on the 13. The output end of the lifting driving member 4 is installed with a conductive member 5. Positive and negative conductive members 7 are distributed on the conductive member 5. A curtain 6 is distributed outside the conductive member 5. Place the chip tantalum electrolytic capacitor on the conveyor 2, drive the conveyor 2 to rotate through the driving member, and drive the chip tantalum electrolytic capacitor to move during the rotation. When the chip tantalum electrolytic capacitor moves to the bottom of the stopper 3, start the lifting driving member 4 on the stopper 3 to move downward, and contact the positive and negative power supplies with the chip tantalum electrolytic capacitor to form a conductive channel. This conductive channel will cause an increase in the leakage current of the capacitor. When a specific voltage or current is applied, an electrochemical reaction will be triggered on this conductive channel, thereby repairing or improving the performance of the dielectric film, and the insulating blocking function is performed by the curtain 6 outside the conductive member 5.
[0032] The above is only a further embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the scope disclosed by the present invention, according to the technical solution and its concept of the present invention, makes equivalent substitutions or changes, all belong to the protection scope of the present invention.
Claims
1. A dielectric film repair device for a chip tantalum electrolytic capacitor, comprising a repair device main body (1) for repair, and baffles (8) are installed on both sides of the repair device main body (1); It is characterized in that: A limiting member (3) is installed on the repair device main body (1), a driving and electrically connecting structure is installed on the limiting member (3), a connecting and blocking structure is installed on the driving and electrically connecting structure, and a conveying structure is installed in the repair device main body (1).
2. The dielectric film repair device for a chip tantalum electrolytic capacitor according to claim 1, characterized in that: The driving and electrically connecting structure includes a lifting driving member (4) and a conductive member (5). The lifting driving member (4) is installed on the limiting member (3), and the conductive member (5) is installed at the output end of the lifting driving member (4).
3. The chip tantalum electrolytic capacitor dielectric film repair device according to claim 2, characterized in that: The connecting and blocking structure includes a curtain (6) and positive and negative conductive members (7). The positive and negative conductive members (7) are distributed on the conductive member (5), and the curtain (6) is distributed outside the conductive member (5).
4. A dielectric film repair device for a chip tantalum electrolytic capacitor according to claim 3, characterized in that: The conveying structure includes a conveying member (2), a rotating rod (9), a driving wheel (10) and a driving tooth (11). Rotating rods (9) are installed on both sides inside the repair device main body (1), the driving wheels (10) are distributed and sleeved on the rotating rods (9), the driving teeth (11) are installed around the driving wheels (10), and the conveying member (2) is sleeved on the driving wheels (10) and the driving teeth (11).
5. A dielectric film repair device for a chip tantalum electrolytic capacitor according to claim 4, characterized in that: The lifting driving member (4) pushes the conductive member (5) to be connected in a lifting manner along the limiting member (3).
6. The chip tantalum electrolytic capacitor dielectric film repair device according to claim 5, characterized in that: The curtain (6) is a structure of at least one piece, and the curtain (6) is a detachable structure.
Citation Information
Patent Citations
Chip tantalum electrolytic capacitor dielectric film repairing device
CN216957779U