Feeding mechanism for semiconductor testing

Abstract

The utility model relates to the field of semiconductor testing, in particular to a feeding mechanism for semiconductor testing. Comprising a conveying device, an adjusting structure is arranged on the lower surface of the conveying device, the adjusting structure comprises two fixing blocks, the two fixing blocks are fixedly connected with the conveying device, rotating shafts are fixedly connected to the inner walls of the two fixing blocks, bases are rotatably connected to the two ends of the rotating shafts, adjusting grooves are formed in the upper surfaces of the bases, and the fixing blocks are fixedly connected with the adjusting grooves. The inner wall of the adjusting groove is rotationally connected with an adjusting rod, one side of the base is fixedly connected with a servo motor, the output end of the servo motor is fixedly connected with the adjusting rod, and the arc surface of the adjusting rod is in threaded connection with a movable plate. The feeding mechanism for semiconductor testing provided by the utility model has the advantages that the servo motor is utilized to drive the adjusting rod to rotate, and the movable plate and the supporting rod are matched to enable one end of the transmission device to rise upwards, so that the occupied space is reduced, and the space utilization rate of a test area is improved.

Description

Technical Field

[0001] The utility model relates to the field of semiconductor testing, in particular to a feeding mechanism for semiconductor testing. Background Art

[0002] Semiconductor testing refers to detecting the functions and performances of semiconductors to determine whether the products meet the standards, which is an important link in semiconductor manufacturing. A feeding mechanism refers to a mechanical device that transports semiconductors to be tested to the test operation area.

[0003] In the prior art, when using a feeding mechanism to feed a semiconductor testing device, the semiconductor to be tested is placed on the conveyor belt of the transmission device, and the conveyor belt transports the semiconductor to be tested to a specified position. However, the following problems will occur in this operation. When the transmission device is placed horizontally, it occupies a large space, resulting in a low space utilization rate of the test operation area. Summary of the Utility Model

[0004] The purpose of the utility model is to solve the shortcoming that the transmission device in the prior art occupies a large space.

[0005] To solve the above technical problems, the utility model provides a feeding mechanism for semiconductor testing, including: a transmission device, a conveyor belt is arranged inside the transmission device, a driving device is installed on one side of the transmission device, an adjusting structure is arranged on the lower surface of the transmission device, the adjusting structure includes two fixing blocks, the two fixing blocks are fixedly connected with the transmission device, a rotating shaft is fixedly connected to the inner walls of the two fixing blocks, the two ends of the rotating shaft are rotatably connected with a base, an adjusting groove is formed on the upper surface of the base, an adjusting rod is rotatably connected to the inner wall of the adjusting groove, a servo motor is fixedly connected to one side of the base, an output end of the servo motor is fixedly connected with the adjusting rod, a moving plate is threadedly connected to the arc surface of the adjusting rod, the moving plate is slidably connected to the inner wall of the adjusting groove, two support rods are rotatably connected to both sides of the moving plate, and one ends of the two support rods far away from the moving plate are rotatably connected with the transmission device.

[0006] The effects achieved by the above components are: the servo motor is used to drive the adjusting rod to rotate, and the moving plate and the support rods cooperate to lift one end of the transmission device, reducing the occupied space and improving the space utilization rate of the test area.

[0007] Preferably, a support frame is rotatably connected to one side of the transmission device away from the driving device, a scale is slidably connected to the inner wall of the support frame, a storage frame is slidably connected to one end of the scale away from the support frame, and the storage frame is fixedly connected with the transmission device.

[0008] The effects achieved by the above components are as follows: First, move the scale away from the storage frame along the support frame, and then rotate the scale and the storage frame vertically downward to determine the lifting height of the transmission device with reference to the scale.

[0009] Preferably, a plurality of pulleys are rotatably connected to the surface of the moving plate, and the arc surface of the pulley is slidably connected to the adjustment groove.

[0010] The effects achieved by the above components are as follows: Reduce the friction between the moving plate and the adjustment groove through the pulleys, making the moving plate move more smoothly along the adjustment groove.

[0011] Preferably, a sliding rod is fixedly connected to the inner wall of the adjustment groove, and the arc surface of the sliding rod is slidably connected to the moving plate.

[0012] The effects achieved by the above components are as follows: Further limit the moving plate by using the sliding rod, making the moving plate move more stably along the adjustment groove.

[0013] Preferably, auxiliary structures are provided on both sides of the base. The auxiliary structures include two auxiliary plates, the two auxiliary plates are fixedly connected to the base, a screw rod is inserted into the surface of the auxiliary plate, the lower end of the screw rod is rotatably connected to a connecting plate, two round rods are fixedly connected to the upper surface of the connecting plate, the arc surfaces of the two round rods are slidably connected to the auxiliary plate, and two universal wheels are installed at both ends of the connecting plate.

[0014] The effects achieved by the above components are as follows: Rotate the screw rod, the screw rod drives the connecting plate and the universal wheels to move downward, and use the universal wheels to support the base, facilitating the user to adjust the position of the transmission device.

[0015] Preferably, an auxiliary block is fixedly connected to the upper end of the screw rod, and a plurality of round holes are formed on the surface of the auxiliary block. A handle rod is slidably connected to the inner wall of one of the round holes.

[0016] The effects achieved by the above components are as follows: Operate the handle rod to slide into the auxiliary block, use the handle rod to drive the auxiliary block to rotate, and the auxiliary block drives the screw rod to rotate, facilitating the user to rotate the screw rod.

[0017] Preferably, an anti-slip sleeve is fixedly connected to the arc surface of the handle rod, and the anti-slip sleeve is a rubber sleeve.

[0018] The effects achieved by the above components are as follows: Increase the friction of the arc surface of the handle rod through the anti-slip sleeve, facilitating the user to operate the handle rod.

[0019] Compared with the related technology, a feeding mechanism for semiconductor testing provided by the present utility model has the following beneficial effects:

[0020] The present utility model provides a feeding mechanism for semiconductor testing. When using the feeding mechanism to feed a semiconductor testing device, the semiconductor to be tested is placed on the conveyor belt of the transmission device, and the conveyor belt transports the semiconductor to be tested to a designated position. However, the following problems may occur in this operation. When the transmission device is placed horizontally, it occupies a large space, resulting in a low space utilization rate in the testing operation area. By setting an adjustment structure, a servo motor is used to drive the adjustment rod to rotate, and the moving plate and the support rod cooperate to lift one end of the transmission device, reducing the occupied space and improving the space utilization rate of the testing area.

[0021] After adjusting the height of the table at one end of the transmission device, it is necessary to adjust the position of the transmission device. The transmission device is heavy and not convenient to move. By setting an auxiliary structure, the screw is rotated, and the screw drives the connecting plate and the universal wheel to move downward, and the universal wheel supports the base, facilitating the user to adjust the position of the transmission device. Description of the Drawings

[0022] Figure 1 is a schematic structural diagram of a feeding mechanism for semiconductor testing provided by the present utility model;

[0023] Figure 2 is Figure 1 the schematic structural diagram of the adjustment structure shown in;

[0024] Figure 3 is Figure 2 the partial structural diagram of the adjustment structure shown in;

[0025] Figure 4 is Figure 1 the schematic structural diagram of the auxiliary structure shown in.

[0026] Reference numerals in the figures: 1, transmission device; 2, conveyor belt; 3, driving device; 4, adjustment structure; 401, fixed block; 402, rotating shaft; 403, base; 404, support frame; 405, scale; 406, storage frame; 407, adjustment groove; 408, adjustment rod; 409, servo motor; 410, moving plate; 411, support rod; 412, pulley; 413, sliding rod; 5, auxiliary structure; 51, auxiliary plate; 52, screw; 53, connecting plate; 54, round rod; 55, universal wheel; 56, auxiliary block; 57, handle bar; 58, anti-slip sleeve. Detailed Embodiments

[0027] In order to make the objectives, technical solutions and advantages of the present utility model clearer and more understandable, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present utility model and are not used to limit the present utility model.

[0028] The following will describe in detail the specific implementation of the present utility model in combination with specific embodiments.

[0029] Please refer to Figures 1 to 4 , a feeding mechanism for semiconductor testing provided by an embodiment of the present utility model includes: a transmission device 1, a conveyor belt 2 is arranged inside the transmission device 1, a driving device 3 is installed on one side of the transmission device 1, an adjusting structure 4 is provided on the lower surface of the transmission device 1, and auxiliary structures 5 are provided on both sides of a base 403.

[0030] In an embodiment of the present utility model, please refer to Figure 2 and Figure 3 , the adjusting structure 4 includes two fixing blocks 401, the two fixing blocks 401 are fixedly connected to the transmission device 1, a rotating shaft 402 is fixedly connected to the inner walls of the two fixing blocks 401, both ends of the rotating shaft 402 are rotatably connected to a base 403, an adjusting groove 407 is formed on the upper surface of the base 403, an adjusting rod 408 is rotatably connected to the inner wall of the adjusting groove 407, a servo motor 409 is fixedly connected to one side of the base 403, an output end of the servo motor 409 is fixedly connected to the adjusting rod 408, a moving plate 410 is threadedly connected to the arc surface of the adjusting rod 408, the moving plate 410 is slidably connected to the inner wall of the adjusting groove 407, two support rods 411 are rotatably connected to both sides of the moving plate 410, and one ends of the two support rods 411 away from the moving plate 410 are rotatably connected to the transmission device 1. By driving the adjusting rod 408 to rotate with the servo motor 409, the cooperation between the moving plate 410 and the support rods 411 causes one end of the transmission device 1 to rise, reducing the occupied space and improving the space utilization rate of the testing area. A support frame 404 is rotatably connected to a side of the transmission device 1 away from the driving device 3, a scale 405 is slidably connected to the inner wall of the support frame 404, a storage frame 406 is slidably connected to one end of the scale 405 away from the support frame 404, and the storage frame 406 is fixedly connected to the transmission device 1. First, move the scale 405 away from the storage frame 406 along the support frame 404, and then rotate the scale 405 and the storage frame 406 vertically downward, and judge the lifting height of the transmission device 1 with reference to the scale 405. A plurality of pulleys 412 are rotatably connected to the surface of the moving plate 410, and the arc surface of the pulley 412 is slidably connected to the adjusting groove 407. The friction between the moving plate 410 and the adjusting groove 407 is reduced through the pulleys 412, making the movement of the moving plate 410 along the adjusting groove 407 smoother. A sliding rod 413 is fixedly connected to the inner wall of the adjusting groove 407, and the arc surface of the sliding rod 413 is slidably connected to the moving plate 410. The sliding rod 413 is used to further limit the moving plate 410, making the movement of the moving plate 410 along the adjusting groove 407 more stable;

[0031] In an embodiment of the present utility model, please refer to Figure 4, the auxiliary structure 5 includes two auxiliary plates 51. The two auxiliary plates 51 are fixedly connected to the base 403. A screw rod 52 is inserted on the surface of the auxiliary plate 51. The lower end of the screw rod 52 is rotatably connected to a connecting plate 53. Two round rods 54 are fixedly connected to the upper surface of the connecting plate 53. The arc surfaces of the two round rods 54 are slidably connected to the auxiliary plate 51. Two universal wheels 55 are installed at both ends of the connecting plate 53. By rotating the screw rod 52, the screw rod 52 drives the connecting plate 53 and the universal wheels 55 to move downward, and the base 403 is supported by the universal wheels 55, which is convenient for the user to adjust the position of the transmission device 1. The upper end of the screw rod 52 is fixedly connected to an auxiliary block 56. A plurality of round holes are formed on the surface of the auxiliary block 56. The inner wall of one of the round holes is slidably connected to a handle rod 57. The handle rod 57 is slid into the auxiliary block 56, and the auxiliary block 56 is driven to rotate by the handle rod 57. The auxiliary block 56 drives the screw rod 52 to rotate, which is convenient for the user to rotate the screw rod 52. An anti-slip sleeve 58 is fixedly connected to the arc surface of the handle rod 57. The anti-slip sleeve 58 is a rubber sleeve. The friction of the arc surface of the handle rod 57 is increased through the anti-slip sleeve 58, which is convenient for the user to operate the handle rod 57;

[0032] The working principle of a feeding mechanism for semiconductor testing provided by the present utility model is as follows: By setting the adjusting structure 4, first start the servo motor 409. The output end of the servo motor 409 drives the adjusting rod 408 to rotate. The adjusting rod 408 drives the moving plate 410 to slide along the adjusting groove 407 by means of the thread. The moving plate 410 moves away from the fixed block 401 and the rotating shaft 402. The moving plate 410 drives the support rod 411 to rotate. At this time, one end of the support rod 411 away from the moving plate 410 supports the transmission device 1 upward. One end of the transmission device 1 is lifted upward, and the other end cooperates with the fixed block 401 and the rotating shaft 402 to rotate with the base 403. Among them, first move the scale 405 away from the storage frame 406 along the support frame 404, and then rotate the scale 405 and the storage frame 406 vertically downward. Refer to the scale 405 to judge the lifting height of the transmission device 1. The friction between the moving plate 410 and the adjusting groove 407 is reduced by the pulley 412, so that the moving plate 410 moves more smoothly along the adjusting groove 407. The moving plate 410 is further limited by the sliding rod 413, so that the moving plate 410 moves more stably along the adjusting groove 407.

[0033] By setting the auxiliary structure 5, the screw rods 52 on both sides of the base 403 are rotated first, and the screw rods 52 move downward along the auxiliary plate 51 with the help of the thread, and the screw rods 52 drive the connecting plate 53 to move downward. During this process, the round rod 54 always slides along the auxiliary plate 51, and the connecting plate 53 drives the universal wheel 55 to move downward until the universal wheel 55 props the base 403 upward off the ground, wherein the operating handle 57 slides into the auxiliary block 56, and the handle 57 drives the auxiliary block 56 to rotate, and the auxiliary block 56 drives the screw rod 52 to rotate, which is convenient for the user to rotate the screw 52, and the anti-slip sleeve 58 increases the friction of the arc surface of the handle 57, which is convenient for the user to operate the handle 57.

[0034] The circuits and controls involved in the present invention are all prior art and will not be described in detail here.

[0035] The above description is only an embodiment of the present invention, and does not limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made by using the contents of the specification and drawings of the present invention, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A feeding mechanism for semiconductor testing, characterized in that, Including: A transmission device (1), inside which a conveyor belt (2) is provided. A driving device (3) is installed on one side of the transmission device (1). An adjusting structure (4) is provided on the lower surface of the transmission device (1). The adjusting structure (4) includes two fixing blocks (401), the two fixing blocks (401) are fixedly connected to the transmission device (1), a rotating shaft (402) is fixedly connected to the inner walls of the two fixing blocks (401), both ends of the rotating shaft (402) are rotatably connected to a base (403), an adjusting groove (407) is formed on the upper surface of the base (403), an adjusting rod (408) is rotatably connected to the inner wall of the adjusting groove (407), a servo motor (409) is fixedly connected to one side of the base (403), the output end of the servo motor (409) is fixedly connected to the adjusting rod (408), a moving plate (410) is threadedly connected to the arc surface of the adjusting rod (408), the moving plate (410) is slidably connected to the inner wall of the adjusting groove (407), two support rods (411) are rotatably connected to both sides of the moving plate (410), and the ends of the two support rods (411) away from the moving plate (410) are rotatably connected to the transmission device (1).

2. The feeding mechanism for semiconductor testing according to claim 1, characterized in that, A support frame (404) is rotatably connected to the side of the transmission device (1) away from the driving device (3). A scale (405) is slidably connected to the inner wall of the support frame (404). A storage frame (406) is slidably connected to the end of the scale (405) away from the support frame (404), and the storage frame (406) is fixedly connected to the transmission device (1).

3. The feeding mechanism for semiconductor testing according to claim 1, characterized in that, A number of pulleys (412) are rotatably connected to the surface of the moving plate (410), and the arc surface of the pulley (412) is slidably connected to the adjusting groove (407).

4. A feeding mechanism for semiconductor testing according to claim 1, wherein A slide bar (413) is fixedly connected to the inner wall of the adjusting groove (407), and the arc surface of the slide bar (413) is slidably connected to the moving plate (410).

5. A feeding mechanism for semiconductor testing according to claim 1, wherein, Auxiliary structures (5) are provided on both sides of the base (403). The auxiliary structures (5) include two auxiliary plates (51), the two auxiliary plates (51) are fixedly connected to the base (403). A screw rod (52) is inserted into the surface of the auxiliary plate (51). The lower end of the screw rod (52) is rotatably connected to a connecting plate (53). Two round rods (54) are fixedly connected to the upper surface of the connecting plate (53), and the arc surfaces of the two round rods (54) are slidably connected to the auxiliary plate (51). Two universal wheels (55) are installed at both ends of the connecting plate (53).

6. The feeding mechanism for semiconductor testing according to claim 5, characterized in that, An auxiliary block (56) is fixedly connected to the upper end of the screw rod (52). A number of round holes are formed on the surface of the auxiliary block (56), and a handle rod (57) is slidably connected to the inner wall of one of the round holes.

7. A feeding mechanism for semiconductor testing according to claim 6, characterized in that, An anti-slip sleeve (58) is fixedly connected to the arc surface of the handle rod (57), and the anti-slip sleeve (58) is a rubber sleeve.

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