Test seat suitable for microchip

Abstract

The utility model relates to a test seat suitable for a microchip, comprising a lower closing cover, the lower closing cover is provided with a test pedestal, a first test groove and a second test groove from bottom to top, the first test groove is internally provided with a first test board, the second test groove is internally provided with a second test board, the top of the second test board is provided with a loading groove, and the loading groove is divided into a test area and a card taking area. A plurality of testing holes are formed in the testing area, hinge seats are symmetrically arranged on the right side of the top of the second testing groove, an upper closing cover is rotationally arranged between the hinge seats through a connecting rod, a square groove is formed in the upper closing cover, and a pressing piece is arranged in the square groove. According to the utility model, the rotary press-fit piece is arranged on the upper closing cover, and the press-fit piece can correspondingly rotate according to the actual placement state of the chip after being in contact with the chip, so that a tester can judge whether the chip is stably placed and limited by checking the inclination angle of the empty window; the damage or complete failure of the chip caused by direct compression is avoided, and the high damage rate of the test and the test cost are reduced.

Description

Technical Field

[0001] The utility model belongs to the technical field of chip testing, and particularly relates to a chip test socket. Background Art

[0002] A chip test socket is a mechanical device specifically designed for semiconductor devices (such as ICs, microcontrollers, memories, etc.), aiming to provide a temporary but reliable electrical connection so that test equipment can perform functional and performance tests on the chip. It facilitates the evaluation of the chip's functions and performance by providing an interface between the chip and the test equipment.

[0003] Traditional chip test sockets mainly fix the chip on the probe socket by mechanical pressing to ensure stable contact between the chip and the test pins, thereby achieving accurate signal transmission and testing. With the rapid development of semiconductor technology, the size of chips has gradually become miniaturized. Due to its extremely small size and thin and light structure, microchips are extremely sensitive to external pressure. When the ordinary test socket presses without confirming whether the chip is in full contact with the test pins, it is very easy to cause damage or complete failure of the chip, resulting in a high damage rate of testing. Coupled with subsequent replacement of damaged chips and repeated testing due to test failures, etc., it also leads to a significant increase in testing costs.

[0004] Therefore, it is necessary to design a chip test socket for microchips that can judge whether the chip is stably placed and in full contact with the test pins before testing, reduce the stress and damage of the chip, and reduce the high damage rate and cost of testing. Summary of the Utility Model

[0005] The purpose of the utility model is to provide a test socket suitable for microchips to solve the problems raised in the above background art.

[0006] To achieve the above purpose, the utility model provides the following technical solution: A test socket suitable for microchips includes a lower cover. The lower cover is provided with a test base, a first test slot, and a second test slot from bottom to top. A first test board is arranged in the first test slot, and a second test board is arranged in the second test slot. A loading slot is opened at the top of the second test board. The loading slot is divided into a test area and a card-taking area. A plurality of test holes are arranged in the test area. Hinge seats are symmetrically arranged on the right side at the top of the second test slot. An upper cover is rotatably arranged between the hinge seats through a connecting rod. A square slot is opened in the upper cover, and a pressing member is arranged in the square slot. The pressing member includes an empty window, a pressing plate, and a pressing block.

[0007] Preferably, the empty window is connected between the front and back of the square slot. The pressing plate is installed at the bottom of the empty window, and the pressing block is arranged at the bottom of the pressing plate.

[0008] Preferably, the test hole penetrates downward through the second test board, the first test board, the first test groove, and the test base.

[0009] Preferably, the test area is square-shaped.

[0010] Preferably, the card-taking area is divided into a first area and a second area. The first area is provided with an arc-shaped extension outward at the four corners of the test area, and the second area is provided with an arc-shaped extension outward along the four sides of the test area.

[0011] Preferably, a buckle is rotatably provided on the left side of the upper cover. A buckle-breaking piece is provided on the upper left side of the buckle. An installation groove is recessed on the upper right side of the top of the upper cover.

[0012] Preferably, a card slot is recessed on the left side of the lower cover, and a clamping rod is provided in the card slot.

[0013] Compared with the prior art, the beneficial effects of the present utility model are as follows: By providing a lower cover composed of multiple layers of structures and opening a test area on the top of the lower cover that is the same size as the microchip, the present utility model can maintain the vertical state of the insertion of the test needles, ensure that each test needle accurately contacts each solder joint of the chip, provide a stable basis for detection, and also ensure that a chip with a very small pin pitch can automatically align with each test needle after being placed in the test area, reducing the preliminary preparation work and improving the detection efficiency; By providing a rotatable pressing member on the upper cover of the present utility model, after the pressing member contacts the chip, it can rotate accordingly according to the actual placement state of the chip. In this way, the tester can judge whether the chip is placed stably and limited by checking the inclination angle of the empty window, avoiding damage or complete failure of the chip caused by direct pressing, reducing the high damage rate and test cost of the test; The present utility model also has a slidable pressing block provided in the pressing member. When the chip is confirmed to be placed flat, the pressing plate and the pressing block can be pressed downward through the round hole, driving each contact point on the chip to fully contact the test needle, ensuring the accuracy and effectiveness of the test. Description of the Drawings

[0014] Figure 1 It is a three-dimensional structural schematic diagram of the present utility model;

[0015] Figure 2 It is an exploded view of the lower cover in the present utility model;

[0016] Figure 3 It is a schematic diagram of the second test board in the present utility model;

[0017] Figure 4 It is an exploded view of the upper cover in the present utility model;

[0018] Figure 5 It is an exploded view of the pressing member in the present utility model;

[0019] Figure 6 Cross-sectional view in the use state.

[0020] Reference numerals in the figure: 1 - lower cover, 101 - test base, 102 - first test slot, 103 - second test slot, 2 - first test plate, 3 - second test plate, 4 - loading slot, 401 - test area, 402 - card-taking area, 5 - test hole, 6 - hinge seat, 7 - connecting rod, 8 - upper cover, 9 - square slot, 10 - pressing member, 11 - first area, 12 - second area, 13 - empty window, 14 - pressing plate, 15 - pressing block, 16 - buckle, 17 - buckling member, 18 - placement slot, 19 - card slot, 20 - clamping rod. Specific implementation mode

[0021] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0022] Embodiment 1

[0023] As Figures 1 to 6 shown, a test seat applicable to a microchip, a chip test seat, includes a lower cover 1. It is characterized in that the lower cover 1 is provided with a test base 101, a first test slot 102 and a second test slot 103 from bottom to top. A first test plate 2 is arranged in the first test slot 102, a second test plate 3 is arranged in the second test slot 103. A loading slot 4 is opened at the top of the second test plate 3. The loading slot 4 is divided into a test area 401 and a card-taking area 402. A plurality of test holes 5 are arranged in the test area 401. Hinge seats 6 are symmetrically arranged on the right side of the top of the second test slot 103. An upper cover 8 is rotatably arranged between the hinge seats 6 through a connecting rod 7. A square slot 9 is opened in the upper cover 8. A pressing member 10 is arranged in the square slot 9. The pressing member 10 includes an empty window 13, a pressing plate 14 and a pressing block 15; an empty window 13 is connected between the front and back of the square slot 9. A pressing plate 14 is installed at the bottom of the empty window 13. A pressing block 15 is arranged at the bottom of the pressing plate 14; the test holes 5 penetrate downward through the second test plate 3, the first test plate 2, the first test slot 102 and the test base 101; the test area 401 is square; the card-taking area 402 is divided into a first area 11 and a second area 12. The four corners of the test area 401 extend outward in an arc to form the first area 11, and the four sides of the test area 401 extend outward in an arc to form the second area 12; a buckle 16 is rotatably arranged on the left side of the upper cover 8. A buckling member 17 is arranged on the upper left side of the buckle 16. A placement slot 18 is recessed on the right side of the top of the upper cover 8; a card slot 19 is recessed on the left side of the lower cover 1. A clamping rod 20 is arranged in the card slot 19.

[0024] The utility model maintains the inserted test needles in a vertical state by providing a lower cover 1 composed of multiple layers of structures and opening a test area 401 with the same size as the microchip at the top of the lower cover 1, ensuring that each test needle precisely contacts each solder joint of the chip, providing a stable basis for detection. It can also ensure that the chip with an extremely small pin pitch can be automatically aligned with each test needle after being placed in the test area 401, reducing the preliminary preparation work and improving the detection efficiency. The utility model sets a rotatable pressing member 10 on the upper cover 8. After the pressing member 10 contacts the chip, it can rotate accordingly according to the actual placement state of the chip. In this way, the tester can judge whether the chip is placed stably and limited by checking the inclination angle of the empty window 13, avoiding damage or complete failure of the chip caused by direct pressing, reducing the high damage rate and test cost of the test. The utility model also has a slidable pressing block 15 arranged in the pressing member 10. After the chip is confirmed to be placed flat, the pressing plate 14 and the pressing block 15 can be pushed downward through the round hole, driving each contact point on the chip to fully contact the test needles, ensuring the accuracy and effectiveness of the test.

[0025] Embodiment 2

[0026] As Figures 1 to 6 shown, a test socket applicable to a microchip includes a lower cover 1 for supporting the entire detection process and fixing the contact medium for internal testing. The lower cover 1 is provided with a test base 101, a first test slot 102, and a second test slot 103 from bottom to top. The first test slot 102 is slidably installed on the top of the test base 101 through a positioning cylinder. The first test slot 102 is a slot plate with an open top and a closed bottom, and a first test plate 2 is installed in the open slot. The second test slot 103 is a frame with open slots at both the top and the bottom, and a second test plate 3 is slidably installed in the open slot. A loading slot 4 is opened at the top of the second test plate 3. The loading slot 4 is divided into two parts, a square test area 401 and an irregular card-taking area 402. The square size of the test area 401 is the same as that of the chip. At the same time, a plurality of test holes 5 are opened inwards along the four sides of the test area 401. The test holes 5 are square, and the number is the same as the number of contact points on the chip to be detected. Since the test needles are inserted upward from the bottom of the lower cover 1, the test holes 5 also penetrate downward through the second test plate 3, the first test plate 2, the first test slot 102, and the test base 101, so that the test needles can not only be inserted upward from the bottom of the lower cover 1 through the test holes 5 to cooperate with the test of the chip, but also maintain a vertical state through multi-layer limiting until they contact the contacts of the chip for testing, lengthening the insertion stroke of the test needles, keeping the test needles in a vertical state, avoiding displacement or deformation during the insertion and extraction process, ensuring that each test needle precisely contacts each solder joint of the chip, and maintaining stable chip detection.

[0027] When testing is required, the chip pad surface can be inserted into the test area 401 in the loading slot 4 with the test needle inserted to make it contact with the chip contacts. During this period, the test needle should avoid contact with the chip welding surface to avoid damage to the chip welding structure. The test needle maintains contact with the chip contacts until the test is completed.

[0028] Since the microchip is small in size, it is very easy to be driven upward and move out of the test area 401 when the test needle is inserted upward to contact it. Then, a pressing piece 10 is provided to apply force from the top of the chip to drive the chip to remain fixed in the test area 401 to cooperate with the contact test of the test needle. The top of the lower cover 1 is specifically the second test slot 103. The top right side is symmetrically provided with hinge seats 6. The upper cover 8 is rotatably provided between the hinge seats 6 through the connecting rod 7. The four sides of the upper cover 8 are consistent with the lower cover 1, and a square groove 9 is opened in the upper cover 8. The square groove 9 is a through setting, which can be understood as the upper cover 8 is actually a square frame; a pressing piece 10 is provided in the square groove 9. The pressing piece 10 can be rotatably or fixedly set. The specific composition structure is: a window 13 is connected between the front and back of the inner wall of the square groove 9, and the window 13 has a through circular hole The diameter of the circular hole gradually decreases from top to bottom. At the same time, a pressing plate 14 is installed at the bottom of the empty window 13, that is, the pressing plate 14 will block the lower surface of the circular hole to block and seal the components below it. A pressing block 15 is provided at the bottom of the pressing plate 14. The four sides of the pressing block 15 are consistent with the test area 401. When the upper cover 8 rotates to close the lower cover 1, it will drive the upper components to move to the top of the upper cover 8. The pressing plate 14 drives the pressing block 15 to insert into the test area 401 to contact and limit the placed chip. When the pressing piece 10 is set to rotate, the contact angle between the pressing block 15 and the chip can drive the window 13 to tilt. The tester can judge whether the chip is stably placed and limited by checking the tilt angle of the window 13. If the window 13 presents a certain tilt angle, it means that the chip is not placed properly and needs to be replaced until the window 13 is horizontal. In this way, damage or complete failure of the chip caused by direct pressing can be avoided, and the high damage rate and test cost of the test can be reduced. When the chip is placed flat, the pressing plate 14 can be squeezed downward through the circular hole. The pressing plate 14 moves downward in the window 13, driving the pressing block 15 to move downward and insert into the test area 401, thereby limiting the chip and driving the various contacts on the chip to fully contact with the test needles to ensure the accuracy and effectiveness of the test.

[0029] Example 3

[0030] like Figures 1 to 6The test seat for a microchip shown in the figure, as described in Example 2, "when the pressing piece 10 is set to rotate, the contact angle between the pressing block 15 and the chip can drive the window 13 to tilt, and the tester can determine whether the chip is stably placed and limited by checking the tilt angle of the window 13." It is necessary to ensure that the upper cover 8 and the lower cover 1 are stably covered together, that is, the contact surfaces of the two are always on the same horizontal line. Therefore, a buckle 16 is also rotatably provided on the left side of the upper cover 8. The buckle 16 can also be installed on the left side of the upper cover 8 through a torsion spring not shown in the figure, and a snap 17 is provided on the upper left side of the buckle 16. Figure 4 As shown, the specific shape of the buckle 16 is a chamfered right angle, with the short horizontal side parallel to the top of the upper cover 8, the long vertical side parallel to the left side of the upper cover 8, and the lower part of the long vertical side extending to form an inward buckle shape; in this way, when the left side of the lower cover 1 is recessed with a slot 19, and a latch rod 20 is provided in the slot 19, the buckle 16 can be opened by pushing the latch member 17 to swing upward before the upper cover 8 is rotated to the lower cover 1. When the upper cover 8 is rotated to the lower cover 1, the latch member 17 is released to drive it to rotate and reset, which can drive the buckle 16 to reset to below the latch rod 20, thereby indirectly realizing the limiting of the upper cover 8.

[0031] Taking into account that the test socket is used for testing microchips and thus has a relatively small overall size, another fulcrum is required to fix the test socket during testing to prevent the test socket from moving around at will and causing damage. It is understandable that the upper surface of the upper cover 8 is divided into three areas, the left side is the snap-fastener 17, the middle part is the rotatably arranged pressing part 10, and it occupies most of the area. The tester can only control the fulcrum of his finger on the top right side of the upper cover 8. To prevent the tester from accidentally pressing his finger on the pressing part 10, causing damage to the chip caused by the pressing part 10, a placement groove 18 is provided inwardly on the right side of the top of the upper cover 8. The placement groove 18 is in the shape of a vertical ellipse, indicating that the tester can place his finger here to apply force.

[0032] Example 4

[0033] like Figures 1 to 6A test socket applicable to a microchip is shown. Referring to Embodiment 2, a loading slot 4 is opened at the top of the second test board 3. The loading slot 4 is divided into two parts, a square test area 401 and an irregular card-taking area 402. The square size of the test area 401 is the same as that of the chip. At the same time, a plurality of test holes 5 are opened extending inwards from the four sides of the test area 401. The test holes 5 are square, and the number is the same as the number of contacts on the chip to be detected. The test area 401 is used to place the chip. Considering that the chip in this embodiment is small in size, the operation of putting it into the detection and taking it out after detection both need to rely on auxiliary fixtures such as tweezers. The conventional clamping angle is to extend in from the edge and then lift one place to facilitate clamping the upper and lower surfaces of the chip. During this process, direct contact with the chip contacts needs to be avoided; however, in this embodiment, the contacts of the chip are also located at the edge. After normal testing, the tester cannot effectively observe the contacts of the chip. Therefore, a card-taking area 402 is also provided extending outwards from the test area 401. The card-taking is divided into two parts: a first area 11 extending outwards in an arc from the four corners of the test area 401, and a second area 12 extending outwards in an arc from the four sides of the test area 401. The first area 11 is a position extended from the included angle, and the distance between the edge and the contact is relatively long. Thus, the tester can directly extend inwards from the first area 11 to the bottom of the four corners of the chip and complete the inversion or taking out of the chip by clamping the four corners; the extended area of the second area 12 is larger than that of the first area 11. Since the contacts on the four sides of the chip are relatively close to the edge, the tester can directly place the tweezers against the bottom edge of the chip through the second area 12 and then lift the chip, or open the tweezers to directly clamp the two sides of the chip. The second area 12 provides a large enough extended area for the operation of the tweezers and facilitates the easy taking out of the chip.

[0034] It should be noted that the lowest points of both the first area 11 and the second area 12 are higher than the lowest point of the test area 401. In this way, it can be avoided that the chip moves randomly after being placed in the test area 401, resulting in the contacts not being aligned with the test needles and affecting the test accuracy; even more seriously, the soldering surface of the chip accidentally contacts the test needles, resulting in the destruction of the soldering structure of the chip and the inability to perform normal testing.

[0035] It should be noted that in this text, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprising", "including" or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements not only includes those elements, but also includes other elements not expressly listed, or further includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising an..." does not exclude the presence of additional identical elements in the process, method, article or device comprising the said element.

[0036] As described above, it is only used to illustrate the technical solution of the present utility model rather than to limit it. Any other modifications or equivalent replacements made by those of ordinary skill in the art to the technical solution of the present utility model shall be covered within the scope of the claims of the present utility model as long as they do not depart from the spirit and scope of the technical solution of the present utility model.

Claims

1. A test socket applicable to a microchip, comprising a lower cover (1), characterized in that, The lower cover (1) is provided with a test base (101), a first test slot (102) and a second test slot (103) from bottom to top. A first test board (2) is arranged in the first test slot (102), and a second test board (3) is arranged in the second test slot (103). A loading slot (4) is formed at the top of the second test board (3). The loading slot (4) is divided into a test area (401) and a card-taking area (402). A plurality of test holes (5) are arranged in the test area (401). On the right side of the top of the second test slot (103), hinge seats (6) are symmetrically arranged. An upper cover (8) is rotatably arranged between the hinge seats (6) through a connecting rod (7). A square slot (9) is formed in the upper cover (8), and a pressing member (10) is arranged in the square slot (9). The pressing member (10) includes an empty window (13), a pressing board (14) and a pressing block (15).

2. The test socket applicable to a microchip according to claim 1, characterized in that, The empty window (13) is connected between the front and back of the square slot (9). The pressing board (14) is installed at the bottom of the empty window (13), and the pressing block (15) is arranged at the bottom of the pressing board (14).

3. The test socket for a microchip according to claim 1, characterized in that, The test holes (5) penetrate downward through the second test board (3), the first test board (2), the first test slot (102) and the test base (101).

4. The test socket for a microchip according to claim 1, characterized in that, The test area (401) is square-shaped.

5. The test socket applicable to a microchip according to claim 4, wherein The card-taking area (402) is divided into a first area (11) and a second area (12). The first area (11) is arc-shaped and extends outward from the four corners of the test area (401), and the second area (12) is arc-shaped and extends outward from the four sides of the test area (401).

6. The test socket applicable to a microchip according to claim 1, characterized in that, A buckle (16) is rotatably arranged on the left side of the upper cover (8). A buckling member (17) is arranged on the upper left side of the buckle (16). An accommodation slot (18) is recessed on the right side of the top of the upper cover (8).

7. A test socket applicable to a microchip according to claim 1, characterized in that, A card slot (19) is recessed on the left side of the lower cover (1), and a clamping rod (20) is arranged in the card slot (19).

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