Chip packaging test probe
By introducing anti-static brush drums and removable designs into the chip-packaged test probes, the problems of dust accumulation and overall replacement are solved, and the probe life and cost reduction are achieved.
Patent Information
- Application Number
- CN202421186553.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-27
- Publication Date
- 2025-07-25
- Estimated Expiration
- 2034-05-27
AI Technical Summary
During the testing process, existing chip-packaged test probes are prone to adsorbing dust on the surface of the needle, resulting in a shortened service life and a waste of resources when the needle is damaged.
A chip-packaged test probe is designed, including a needle tube, a cylinder, a V-ring cylinder, a cleaning cylinder and an anti-static brush cylinder. The anti-static brush cylinder is used to clean the surface of the needle, and the individual removal and replacement of the needle is achieved by rotating the cleaning cylinder.
It improves the service life of the probe, reduces resource waste, reduces replacement costs, and supports the replacement of different models of needles.
Smart Images

Figure CN223155080U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of chip packaging, in particular to a chip packaging test probe. Background Art
[0002] A probe is an important device in the field of integrated circuit technology. It is used for functional testing of wafers before integrated circuits are packaged. By directly contacting the probes on the probe card with the pads or bumps on the chip, the chip signals are led out, and then the chip parameters are tested in cooperation with peripheral test instruments and software control. Unqualified products are selected and then the subsequent packaging process is carried out to avoid waste caused by continued processing of defective products.
[0003] In the existing chip packaging test probes, dust is usually adsorbed on the surface of the needle tip during the test process. Prolonged testing is likely to reduce the service life of the probe. At the same time, when the needle tip on the probe is damaged, it is usually replaced as a whole, which is a waste of resources. Summary of the Utility Model
[0004] The utility model mainly provides a chip packaging test probe that can automatically clean dust from the needle tip.
[0005] To achieve the above object, the utility model adopts the following technical solution: A chip packaging test probe, comprising: a needle tube, one end of the needle tube is provided with a cylinder, one end of the cylinder is fixed with a V-shaped ring cylinder, the other end of the V-shaped ring cylinder is fixed and communicated with a cleaning cylinder, an anti-static brush cylinder is fixed inside the cleaning cylinder, a needle tip is embedded and slidably arranged inside the anti-static brush cylinder, one end of the needle tip passes through the inside of the V-shaped ring cylinder and the cylinder and is embedded inside the needle tube, a plunger is embedded near the other end inside the needle tube, and a spring is arranged inside the needle tube between the needle tip and the plunger.
[0006] Compared with the prior art, the advantages and positive effects of the utility model are as follows.
[0007] 1. In the utility model, an anti-static brush cylinder is fixed on the inner wall of the cleaning cylinder. When the needle tip is embedded inside the cleaning cylinder during the test, it can make the anti-static brush cylinder brush off the dust on the surface of the needle tip, thereby improving the service life of the probe.
[0008] 2. In the utility model, by rotating the cleaning cylinder, the threaded ring cylinder can be disengaged from the threaded ring groove, which can achieve the effect of separately disassembling and replacing the needle tip, thereby reducing costs. At the same time, it can also replace needle tips of different models. Description of the Drawings
[0009] Figure 1The present utility model provides an isometric view of the overall structure of a chip package test probe;
[0010] Figure 2 The present utility model provides a cross-sectional view of the overall structure of a chip package test probe;
[0011] Figure 3 The present utility model provides a plan view of the spring structure of a chip package test probe;
[0012] Figure 4 The present utility model provides a plan view of a partial structure of a chip package test probe;
[0013] Figure 5 The present utility model provides a plan view of the needle tube structure of a chip package test probe.
[0014] Legend: 1. Needle tube; 2. Cylinder; 3. Threaded ring groove; 4. Threaded ring cylinder; 5. V-shaped ring cylinder; 6. Cleaning cylinder; 7. Needle tip; 8. Anti-static brush cylinder; 9. Spring; 10. Plunger; 11. Trapezoidal ring groove. Detailed implementation manners
[0015] In order to more clearly understand the above-mentioned objects, features and advantages of the present utility model, the following further describes the present utility model with reference to the accompanying drawings and embodiments. It should be noted that, without conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.
[0016] Please refer to Figures 1-5 , the present utility model provides a technical solution: a chip package test probe, comprising: a needle tube 1, one end of the needle tube 1 is provided with a cylinder 2, one end of the cylinder 2 is fixedly connected with a V-shaped ring cylinder 5, the other end of the V-shaped ring cylinder 5 is fixedly connected and communicated with a cleaning cylinder 6, an anti-static brush cylinder 8 is fixedly arranged inside the cleaning cylinder 6, a needle tip 7 is embedded and slidably arranged inside the anti-static brush cylinder 8, one end of the needle tip 7 passes through the inside of the V-shaped ring cylinder 5 and the cylinder 2 and is embedded inside the needle tube 1, a plunger 10 is embedded and slidably arranged inside the needle tube 1 and near the other end, and a spring 9 is arranged inside the needle tube 1 between the needle tip 7 and the plunger 10. Through the above arrangement, the V-shaped ring cylinder 5 can limit the needle tip 7, at the same time, the anti-static brush cylinder 8 can clean the needle tip 7 sliding inside it, and the spring 9 can reset the needle tip 7 embedded inside the needle tube 1.
[0017] As Figure 1 and Figure 2 shown, the other end of the cylinder 2 is fixedly connected with a threaded ring cylinder 4, a threaded ring groove 3 is formed in the inner wall of the needle tube 1 near one end, the threaded ring cylinder 4 is embedded inside the threaded ring groove 3 and is threadedly connected therewith. Through the above arrangement, the threaded ring cylinder 4 can be conveniently disassembled.
[0018] As Figure 3 shown, both ends of the spring 9 are respectively in contact with the needle 7 and one end of the plunger 10. Through the above arrangement, the spring 9 can push the needle 7 and the plunger 10 at both ends.
[0019] As Figure 3 shown, a trapezoidal ring groove 11 is formed on the surface of the needle 7, and the V-shaped ring cylinder 5 is located inside the trapezoidal ring groove 11 and is slidably connected thereto. Through the above arrangement, the needle 7 can slide inside the V-shaped ring cylinder 5.
[0020] As Figure 2 shown, both inner walls on both sides of the trapezoidal ring groove 11 are beveled edges, and the beveled edges on both sides of the trapezoidal ring groove 11 are adapted to the beveled edges of the V-shaped ring cylinder 5. Through the above arrangement, the V-shaped ring cylinder 5 can block the needle 7.
[0021] As Figure 5 shown, the surface diameter of the end of the plunger 10 close to the needle 7 is larger than the surface diameter of the end away from the needle 7, and the inner wall diameter of the syringe barrel 1 at the threaded ring cylinder 4 is larger than the inner wall diameter of the syringe barrel 1 close to the plunger 10. Through the above arrangement, the plunger 10 can be prevented from detaching from the inside of the syringe barrel 1.
[0022] Usage method and working principle of the present device: By installing the probe on the detection device, during the detection process, the needle 7 will be inserted into the inside of the cleaning cylinder 6, the cylinder 2 and the syringe barrel 1. At this time, the needle 7 will reciprocate inside the cleaning cylinder 6, the cylinder 2 and the syringe barrel 1 through the spring 9, and the anti-static brush cylinder 8 can clean the dust on the surface of the needle 7, thereby improving the service life of the probe. When the needle 7 needs to be replaced, or when replacing the damaged needle 7, the cleaning cylinder 6 can be rotated to make the threaded ring cylinder 4 rotate inside the threaded ring groove 3 and detach, so as to separately disassemble and replace the needle 7, thereby reducing costs. At the same time, needles 7 of different models can also be replaced, and the spring 9 can also be replaced. After replacement, the needle 7 is reinstalled inside the syringe barrel 1 through the threaded ring groove 3 and the threaded ring cylinder 4.
[0023] The above is only the preferred embodiment of the present invention, and it is not a limitation of the present invention in other forms. Any person skilled in the art may use the disclosed technical content to make changes or modifications into equivalent embodiments with equivalent changes and apply them to other fields. However, as long as it does not depart from the technical solution content of the present invention, any simple modification, equivalent change and modification made to the above embodiments based on the technical essence of the present invention still belong to the protection scope of the technical solution of the present invention.
Claims
1. A chip package test probe, characterized in that, Including: A syringe barrel (1), one end of the syringe barrel (1) is provided with a cylinder (2), one end of the cylinder (2) is fixed with a V-shaped ring cylinder (5), the other end of the V-shaped ring cylinder (5) is fixed and communicated with a cleaning cylinder (6), an anti-static brush cylinder (8) is fixed inside the cleaning cylinder (6), a needle (7) is embedded and slidably arranged inside the anti-static brush cylinder (8), one end of the needle (7) passes through the inside of the V-shaped ring cylinder (5) and the cylinder (2) and is embedded inside the syringe barrel (1), a plunger (10) is embedded and slidably arranged inside the syringe barrel (1) near the other end, and a spring (9) is arranged between the needle (7) and the plunger (10) inside the syringe barrel (1).
2. The chip package test probe according to claim 1, characterized in that: The other end of the cylinder (2) is fixed with a threaded ring cylinder (4), a threaded ring groove (3) is formed on the inner wall of the syringe barrel (1) near one end, and the threaded ring cylinder (4) is embedded inside the threaded ring groove (3) and is threadedly connected thereto.
3. A chip package test probe according to claim 1, characterized in that: Both ends of the spring (9) are respectively in contact with one end of the needle (7) and the plunger (10).
4. The chip package test probe according to claim 1, characterized in that: A trapezoidal ring groove (11) is formed on the surface of the needle (7), and the V-shaped ring cylinder (5) is located inside the trapezoidal ring groove (11) and is slidably connected thereto.
5. The chip package test probe according to claim 4, wherein: Both inner walls on both sides of the trapezoidal ring groove (11) are beveled edges, and the beveled edges on both sides of the trapezoidal ring groove (11) are adapted to the beveled edges of the V-shaped ring cylinder (5).
6. The chip package test probe according to claim 1, wherein: The surface diameter of one end of the plunger (10) close to the needle (7) is larger than the surface diameter of the end far from the needle (7), and the inner wall diameter of the syringe barrel (1) at the position of the threaded ring cylinder (4) is larger than the inner wall diameter of the syringe barrel (1) near the end of the plunger (10).