Dual-temperature testing device for temperature protector

Abstract

The utility model discloses a double temperature testing device for a temperature protector, which comprises a straight vibrator, a low temperature heating channel and a high temperature heating channel, the straight vibrator is provided with a straight vibration conveying rail for longitudinally conveying a test piece, and a first sorting mechanism for eliminating defective products in a room temperature conductive test is arranged between the straight vibration conveying rail and the low temperature heating channel; a second sorting mechanism used for removing defective products subjected to low-temperature electric conduction testing is arranged between the low-temperature heating channel and the high-temperature heating channel, a third sorting mechanism used for removing defective products subjected to high-temperature electric conduction testing is correspondingly arranged at the tail end of the high-temperature heating channel, and the first sorting mechanism, the second sorting mechanism and the third sorting mechanism are correspondingly provided with electric conduction testing assemblies respectively; the conductive test assembly comprises a conductive test needle used for contacting the pin of the test piece. The double-temperature testing device provided by the utility model can be used for carrying out quality inspection and ordered sorting on the temperature protectors, thereby being beneficial to improving the product quality of the temperature protectors.

Description

Technical Field

[0001] The utility model relates to the field of quality inspection devices for temperature protectors, and particularly relates to a dual-temperature testing device for temperature protectors. Background Art

[0002] At present, temperature protectors adopt a bimetallic strip structure. When the temperature of the temperature protector rises to the operating temperature, the bimetallic strip will suddenly jump to disconnect the circuit of the temperature protector, and when the temperature of the temperature protector drops back to the reset temperature, the bimetallic strip will reset to connect the circuit of the temperature protector. For an example of the structure of a temperature protector in the prior art, reference can be made to the "multi-switch temperature protector" with the Chinese invention patent application publication number CN104134579A. Currently, a temperature protector as shown in Figure 9 is produced, but there is currently a lack of a testing device for this temperature protector, and workers only conduct quality inspection on the appearance structure of the temperature protector, which is not conducive to improving the product quality of the temperature protector. Summary of the Invention

[0003] The purpose of the utility model is to overcome the deficiencies of the prior art and provide a dual-temperature testing device for temperature protectors, which is conducive to improving the product quality of temperature protectors.

[0004] The purpose of the utility model is achieved through the following technical solutions.

[0005] The dual-temperature testing device for temperature protectors disclosed by the utility model includes a linear vibrator, a low-temperature heating channel, and a high-temperature heating channel. The linear vibrator is provided with a linear vibration conveying rail for longitudinally conveying test pieces. A first sorting mechanism for excluding defective products in room-temperature conductivity testing is arranged between the linear vibration conveying rail and the low-temperature heating channel. A second sorting mechanism for excluding defective products in low-temperature conductivity testing is arranged between the low-temperature heating channel and the high-temperature heating channel. A third sorting mechanism for excluding defective products in high-temperature conductivity testing is arranged corresponding to the end of the high-temperature heating channel. Conductivity testing components are respectively arranged corresponding to the first sorting mechanism, the second sorting mechanism, and the third sorting mechanism. The conductivity testing components include conductivity testing needles for contacting the pins of the test pieces.

[0006] Preferably, the first sorting mechanism includes a slide block, on which a test position, a sorting slideway, a defective product discharge hole and a sorted product discharge position are formed. One end of the sorting slideway is connected to the test position, and the other corresponding end of the sorting slideway is connected to the defective product discharge hole. The sorted product discharge position is arranged on one side of the defective product discharge hole. The first sorting mechanism includes a sorting push rod for horizontally pushing a test piece located at the test position above the defective product discharge hole, the first sorting mechanism includes a bridge plate for covering the upper end of the defective product discharge hole and a delivery rod for longitudinally pushing a test piece located on the bridge plate to the sorted product discharge position, the first sorting mechanism includes a sorting cylinder, a bridging cylinder and a delivery cylinder. The sorting cylinder drives the sorting push rod to move horizontally, the bridging cylinder drives the bridge plate to move horizontally, and the delivery cylinder drives the delivery rod to move longitudinally.

[0007] Preferably, the conductive test assembly includes a lifting cylinder, and the lifting cylinder drives the corresponding conductive test needle to move up and down.

[0008] Preferably, the low-temperature heating channel includes a heat transfer rail, an electric heating film and a heat insulation pipeline. The heat transfer rail and the electric heating film are arranged in the heat insulation pipeline. The bottom of the heat transfer rail is abutted against the upper side of the electric heating film, and a conveying slideway for adapting the test piece to slide is arranged at the top of the heat transfer rail.

[0009] Preferably, the second sorting mechanism is arranged with the same structure as the first sorting mechanism. The third sorting mechanism includes a sorting channel switching cylinder and a sorting channel assembly. The sorting channel assembly includes a good product guiding pipeline and a defective product guiding pipeline. The good product guiding pipeline and the defective product guiding pipeline are arranged longitudinally and abutted against each other. The sorting channel switching cylinder drives the sorting channel assembly to move longitudinally. The third sorting mechanism is provided with a discharge slideway. One end of the discharge slideway is connected to the end of the high-temperature heating channel, and the other corresponding end of the discharge slideway is connected to the sorting channel assembly. The third sorting mechanism includes a discharge cylinder and a discharge push rod for horizontally pushing a test piece located on the discharge slideway to the sorting channel assembly. The discharge cylinder is drivingly connected to the discharge push rod.

[0010] Preferably, the third sorting mechanism is provided with a good product collection box and a third defective product collection box. The good product collection box is arranged corresponding to the lower part of the outlet of the good product guiding pipeline, and the third defective product collection box is arranged corresponding to the lower part of the outlet of the defective product guiding pipeline.

[0011] Compared with the prior art, the beneficial effects of the present utility model are as follows: By providing a linear vibrator, a low-temperature heating channel and a high-temperature heating channel, a first sorting mechanism for excluding defective products in room-temperature conductivity testing is provided between the linear vibration conveying rail and the low-temperature heating channel, a second sorting mechanism for excluding defective products in low-temperature conductivity testing is provided between the low-temperature heating channel and the high-temperature heating channel, and a third sorting mechanism for excluding defective products in high-temperature conductivity testing is provided corresponding to the end of the high-temperature heating channel. Conductivity testing components are respectively provided corresponding to the first sorting mechanism, the second sorting mechanism and the third sorting mechanism, so that the dual-temperature testing device of the present utility model can perform quality inspection and orderly sorting on the temperature protector, thereby being beneficial to improving the product quality of the temperature protector. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 is a top perspective structural schematic diagram of the dual-temperature testing device of the present utility model.

[0013] Figure 2 is a top structural schematic diagram of the dual-temperature testing device of the present utility model with the workbench and the test piece vibrating disk removed.

[0014] Figure 3 is Figure 2 a partial structural schematic diagram at position A of

[0015] Figure 4 is a three-dimensional structural schematic diagram of the first sorting mechanism of the present utility model.

[0016] Figure 5 is a three-dimensional partial structural schematic diagram of the dual-temperature testing device of the present utility model at the position of the first sorting mechanism.

[0017] Figure 6 is a three-dimensional partial structural schematic diagram of the dual-temperature testing device of the present utility model at the position of the third sorting mechanism.

[0018] Figure 7 is a bottom perspective structural schematic diagram of the low-temperature heating channel of the present utility model.

[0019] Figure 8 is a cross-sectional structural schematic diagram of the low-temperature heating channel of the present utility model.

[0020] Figure 9 is a three-dimensional structural schematic diagram of the test piece.

[0021] Label description: Linear vibrator 1; Linear vibration conveying track 11; First sorting mechanism 2; First defective product collection box 200; Sorting cylinder 21; Sorting push rod 211; Bridging cylinder 22; Bridge plate 221; Delivery cylinder 23; Delivery rod 231; Slide block 25; Testing position 201; Sorting slideway 202; Defective product discharge hole 203; Sorting discharge position 204; Low-temperature heating track 3; Conveying slideway 301; Heat transfer track 31; Electric heating film 32; Heat insulation pipeline 33; Second sorting mechanism 4; Second defective product collection box 400; High-temperature heating track 5; Third sorting mechanism 6; Discharge cylinder 61; Discharge push rod 611; Sorting channel switching cylinder 62; Sorting channel assembly 621; Good product guiding pipeline 6211; Defective product guiding pipeline 6212; Discharge slideway 601; Good product collection box 610; Third defective product collection box 620; Workbench 7; Testing part vibrating disk 8; Conductive testing component 9; Lifting cylinder 91, Conductive testing needle 911; Testing part 99; Upper pin 991; Lower pin 992. Detailed implementation mode

[0022] The present invention will be further described below with reference to the accompanying drawings.

[0023] The dual-temperature testing device for a thermal protector of the present invention, as Figure 1 and 2 shown, includes a linear vibrator 1, a low-temperature heating track 3 and a high-temperature heating track 5. The linear vibrator 1 is provided with a linear vibration conveying track 11 for longitudinally conveying a testing part 99 (the testing part 99 is a thermal protector). The linear vibrator 1 belongs to the prior art. The linear vibration conveying track 11 is installed on the top of the linear vibrator 1. When the linear vibrator 1 works, it drives the linear vibration conveying track 11 to convey the testing part 99. As Figure 1 and 2 shown, a first sorting mechanism 2 for excluding defective products in room-temperature conductive testing is provided between the linear vibration conveying track 11 and the low-temperature heating track 3. A second sorting mechanism 4 for excluding defective products in low-temperature conductive testing is provided between the low-temperature heating track 3 and the high-temperature heating track 5. A third sorting mechanism 6 for excluding defective products in high-temperature conductive testing is provided corresponding to the end of the high-temperature heating track 5. It should be noted that the "low temperature" in the "low-temperature heating track 3" is relative to the high-temperature heating track 5, that is, the temperature at which the low-temperature heating track 3 heats the testing part 99 is lower than the temperature at which the high-temperature heating track 5 heats the testing part 99, and the low-temperature heating track 3 will heat the testing part 99 to be significantly higher than room temperature. For example, the heating temperature of the low-temperature heating track 3 is set to about 125 °C, and the heating temperature of the high-temperature heating track 5 is about 138 °C. As Figure 1 and Figure 2 shown, the first sorting mechanism 2, the second sorting mechanism 4 and the third sorting mechanism 6 are respectively provided with a conductive testing component 9. The conductive testing component 9 includes a conductive testing needle 911 for contacting the pins of the testing part 99.

[0024] The working principle of the dual-temperature testing device for a temperature protector of the present utility model is briefly described as follows: As Figure 1 and Figure 2 shown, the linear oscillator 1 drives the linear vibration conveying rail 11 to convey the test pieces 99 in a straight line queue to the right (i.e., convey longitudinally). As Figure 1 and Figure 2 shown, the right end of the linear vibration conveying rail 11 is connected to the first sorting mechanism 2. Thus, the rightmost (front of the queue) test piece 99 in the queue of test pieces 99 on the linear vibration conveying rail 11 enters the first sorting mechanism 2. The conductive test needle 911 of the conductive test component 9 corresponding to the first sorting mechanism 2 contacts the pin of the test piece 99 to make the test piece 99 powered on, and tests whether the test piece 99 is conductively connected. If it is conductively connected, the first sorting mechanism 2 transfers the test piece 99 to the low-temperature heating channel 3. If it is not conductively connected, the first sorting mechanism 2 excludes the test piece 99. In actual application, most test pieces 99 can pass the above room-temperature conductive connection test. After that, the test piece 99 is transferred in the low-temperature heating channel 3. The power of the test piece 99 in the low-temperature heating channel 3 comes from the thrust when the first sorting mechanism 2 transfers the test piece 99. The low-temperature heating channel 3 heats up the test piece 99. The test piece 99 after temperature rise reaches the second sorting mechanism 4. The conductive test needle 911 of the conductive test component 9 corresponding to the second sorting mechanism 4 contacts the pin of the test piece 99 to make the test piece 99 powered on. If the test piece 99 is still conductively connected, the second sorting mechanism 4 transfers the test piece 99 to the high-temperature heating channel 5. If the test piece 99 is not conductively connected, the second sorting mechanism 4 excludes the test piece 99, that is to say, if the test piece 99 has tripped in the low-temperature area, it is judged as a defective product. Then, the test piece 99 is transferred in the high-temperature heating channel 5. The high-temperature heating channel 5 heats up the test piece 99 to a higher temperature. When the rightmost test piece 99 in the queue of test pieces 99 in the high-temperature heating channel 5 reaches the third sorting mechanism 6, the conductive test needle 911 of the conductive test component 9 corresponding to the third sorting mechanism 6 powers on the test piece 99. If the test piece 99 is not conductively connected (i.e., has tripped), it is judged as a qualified product. If the test piece 99 is conductively connected (i.e., has not tripped yet), it is judged as a defective product. The third sorting mechanism 6 separates the qualified products from the defective products. The dual-temperature testing device of the present utility model realizes two-temperature testing of the temperature protector by setting the low-temperature heating channel 3 and the high-temperature heating channel 5. By setting the dual-temperature testing device of the present utility model, quality inspection and orderly sorting of the temperature protector can be carried out, which can prevent defective products from flowing into the market and is beneficial to improving the product quality of the temperature protector.

[0025] Furthermore, as Figures 3 to 5As shown, the first sorting mechanism 2 includes a slide block 25, on which a test position 201, a sorting slideway 202, a defective product discharge hole 203 and a sorted product discharge position 204 are formed. One end of the sorting slideway 202 is connected to the test position 201, and the other corresponding end of the sorting slideway 202 is connected to the defective product discharge hole 203. The sorted product discharge position 204 is arranged on one side of the defective product discharge hole 203. The first sorting mechanism 2 includes a sorting push rod 211 for horizontally pushing a test piece 99 located at the test position 201 above the defective product discharge hole 203. The first sorting mechanism 2 includes a bridge plate 221 for covering the upper end of the defective product discharge hole 203 and a delivery rod 231 for longitudinally pushing a test piece 99 located on the bridge plate 221 to the sorted product discharge position 204. The first sorting mechanism 2 includes a sorting cylinder 21, a bridging cylinder 22 and a delivery cylinder 23. The sorting cylinder 21 drives the sorting push rod 211 to move horizontally, the bridging cylinder 22 drives the bridge plate 221 to move horizontally, and the delivery cylinder 23 drives the delivery rod 231 to move longitudinally. Specifically, the piston rod of the sorting cylinder 21 is hinged to the tail end of the sorting push rod 211. The sorting push rod 211 is linearly slidably arranged in the sorting slideway 202. The bridge plate 221 and the delivery rod 231 are respectively linearly slidably connected to the slide block 25. As Figure 5 As shown, the test position 201 of the first sorting mechanism 2 is connected to the right end of the linear vibration conveying rail 11. Thus, the linear vibration conveying rail 11 can convey the test piece 99 to the test position 201. The right inner wall of the sorting slideway 202 blocks the queue of test pieces 99. The conductive test needle 911 of the conductive test component 9 contacts the pins of the test piece 99 located at the test position 201. After the room temperature conductive connection test is completed, if the test piece 99 passes this test, the bridging cylinder 22 drives the bridge plate 221 to move horizontally (backward) to cover the defective product discharge hole 203. Then, the piston rod of the sorting cylinder 21 drives the sorting push rod 211 to move horizontally (forward). Thus, the head end of the sorting push rod 211 pushes the test piece 99 located at the test position 201 onto the rear end of the bridge plate 221. Then, the delivery cylinder 23 drives the delivery rod 231 to move longitudinally (rightward) so that the right end of the delivery rod 231 contacts the test piece 99 located on the bridge plate 221 and pushes the test piece 99 to the sorted product discharge position 204 on the right. The sorted product discharge position 204 is connected to the left end (inlet end) of the low-temperature heating channel 3, enabling the test piece 99 to be transferred to the low-temperature heating channel 3. If the test piece 99 fails to pass the above room temperature conductive connection test, the bridging cylinder 22 does not act, keeping the defective product discharge hole 203 and the sorting slideway 202 in a communicating state. Then, when the sorting push rod 211 moves forward, it pushes the test piece 99 (defective product) above the defective product discharge hole 203, and the test piece 99 falls into the defective product discharge hole 203 by gravity. The above structure of the first sorting mechanism 2 is relatively simple, avoiding the need for the test piece 99 to pass through a complex path for sorting. Due to the use of a cylinder-driven structure, it is also beneficial to reduce the labor intensity and improve the work efficiency.

[0026] Further, as Figure 6 shown, the conductive test assembly 9 includes a lifting cylinder 91 that drives the corresponding conductive test needle 911 to move up and down. Specifically, the lifting cylinder 91 can be a sliding table cylinder. A plastic cantilever is installed on the sliding table of the sliding table cylinder, and the conductive test needle 911 is installed at the end of the plastic cantilever (it should be noted that for easy viewing, Figure 3 the above-mentioned plastic cantilever is not drawn). Thus, the lifting cylinder 91 can drive the conductive test needle 911 to move downward so that the lower end of the conductive test needle 911 contacts the corresponding pin, thereby energizing the test piece 99. After the test is completed, the lifting cylinder 91 raises the conductive test needle 911 to prevent the conductive test needle 911 from interfering with the transfer of the test piece 99. By providing the lifting cylinder 91, it is convenient to realize the contact and separation between the conductive test needle 911 and the pin. As Figure 9 shown, the test piece 99 (lying horizontally) is provided with an upper pin 991 and a lower pin 992. That is to say, the above-mentioned pins include the upper pin 991 and the lower pin 992. Among them, the upper pin 991 is arranged on the insulating seat of the test piece 99, and the lower pin 992 is formed on the base (copper part) of the test piece 99. Thus, the structure in contact with the base of the test piece 99 can be connected to zero potential so that the lower pin 992 is connected to zero potential, and the upper end of the conductive test needle 911 is connected to the test circuit through a wire. Thus, the conductive test assembly 9 only needs to be provided with one conductive test needle 911 to contact the upper pin 991.

[0027] Further, as Figure 7 and Figure 8 shown, the low-temperature heating channel 3 includes a heat transfer rail 31, an electric heating film 32, and a heat insulation pipe 33. The electric heating film 32 belongs to the prior art. The heat transfer rail 31 and the electric heating film 32 are arranged in the heat insulation pipe 33. The bottom of the heat transfer rail 31 is attached to the upper side of the electric heating film 32. The top of the heat transfer rail 31 is provided with a conveying slideway 301 adapted for the test piece 99 to slide. The electric heating film 32 is energized to generate heat and transfer the heat to the heat transfer rail 31. When the test piece 99 slides in the conveying slideway 301, it will be heated by the conveying slideway 301. The cross-section of the heat insulation pipe 33 can be rectangular. Providing the heat insulation pipe 33 can reduce the heat dissipation to the outside, which is beneficial to energy conservation and also beneficial to the rapid heating of the test piece 99. Since the electric heating film 32 is a thin film structure, it is easy to manufacture the electric heating film 32 with a large area and low cost, so it is beneficial for the electric heating film 32 to uniformly transfer heat to the heat transfer rail 31. As Figure 3 and Figure 5As shown, the left end of the conveying chute 301 is connected to the sorting and discharging position 204. The delivery rod 231 pushes the test pieces 99 one by one to the sorting and discharging position 204. The test piece 99 pushed to the sorting and discharging position 204 at a later time squeezes the test piece 99 pushed to the sorting and discharging position 204 at an earlier time into the left end of the conveying chute 301, and so on, so that the conveying chute 301 conveys the test pieces 99 in a queue. The high-temperature heating channel 5 and the low-temperature heating channel 3 are arranged with the same structure, but the input power of the electric heating film of the high-temperature heating channel 5 is greater than the input power of the electric heating film 32 of the low-temperature heating channel 3.

[0028] Further, as Figure 1 and Figure 2 shown, the second sorting mechanism 4 and the first sorting mechanism 2 are arranged with the same structure. As Figure 2 and Figure 6 shown, the third sorting mechanism 6 includes a sorting channel switching cylinder 62 and a sorting channel assembly 621. The sorting channel assembly 621 includes a good product guide pipe 6211 and a defective product guide pipe 6212. The good product guide pipe 6211 and the defective product guide pipe 6212 are arranged in longitudinal abutment. For example, the good product guide pipe 6211 is arranged on the left side of the defective product guide pipe 6212. The sorting channel switching cylinder 62 drives the sorting channel assembly 621 to move longitudinally. The sorting channel switching cylinder 62 can be a double-rod cylinder. The sorting channel assembly 621 is installed on the piston rod of the sorting channel switching cylinder 62. As Figure 6 shown, the third sorting mechanism 6 is provided with a discharge chute 601. The discharge chute 601 can be formed at the top of a block. One end of the discharge chute 601 is connected to the end (i.e., the right end) of the high-temperature heating channel 5. Specifically, the discharge chute 601 extends in the front-rear direction, so that the discharge chute 601 is perpendicular to the high-temperature heating channel 5. The other end corresponding to the discharge chute 601 is connected to the sorting channel assembly 621. The third sorting mechanism 6 includes a discharge cylinder 61 and a discharge push rod 611 for horizontally pushing the test piece 99 located in the discharge chute 601 to the sorting channel assembly 621. The discharge push rod 611 is linearly slidably connected to the discharge chute 601. The discharge cylinder 61 is drivingly connected to the discharge push rod 611. Specifically, the piston rod of the discharge cylinder 61 is hinged to the rear end of the discharge push rod 611. Through the above settings, the test piece 99 in the high-temperature heating channel 5 is pushed into the discharge chute 601. After the conductive test component 9 corresponding to the third sorting mechanism 6 tests the test piece 99, the discharge cylinder 61 drives the discharge push rod 611 to move forward, so that the front end of the discharge push rod 611 pushes the test piece 99 in the discharge chute 601 forward to the sorting channel assembly 621. Among them, when the test piece 99 is a qualified product, as Figure 6As shown in the figure, the sorting channel switching cylinder 62 moves the upper end of the good product guiding pipeline 6211 to the position corresponding to the connection with the discharge chute 601. Then, the qualified test piece 99 slides from the discharge chute 601 into the good product guiding pipeline 6211. When the test piece 99 is a defective product, the sorting channel switching cylinder 62 moves the upper end of the defective product guiding pipeline 6212 to the position corresponding to the connection with the discharge chute 601, so that the defective test piece 99 slides into the defective product guiding pipeline 6212. Through the above settings, the good products and defective products of the temperature protector can be separated orderly.

[0029] Furthermore, as Figure 6 shown in the figure, the third sorting mechanism 6 is provided with a good product collection box 610 and a third defective product collection box 620. The good product collection box 610 is arranged directly below the outlet of the good product guiding pipeline 6211, and the third defective product collection box 620 is arranged directly below the outlet of the defective product guiding pipeline 6212. Specifically, the good product collection box 610 is abutted against the front side of the third defective product collection box 620. The openings of the good product collection box 610 and the third defective product collection box 620 are both opened upward. The lower end of the good product guiding pipeline 6211 is bent forward, while the lower end of the defective product guiding pipeline 6212 is bent backward. In this way, when the sorting channel assembly 621 moves left and right, the good product collection box 610 can be maintained directly below the outlet of the good product guiding pipeline 6211, and the third defective product collection box 620 can be maintained directly below the outlet of the defective product guiding pipeline 6212. By providing the good product collection box 610 and the third defective product collection box 620, it is beneficial to separate and collect the good products and defective products of the temperature protector orderly, facilitating the subsequent processes.

[0030] As Figure 1 shown in the figure, a first defective product collection box 200 is provided directly below the defective product discharge hole 203 of the first sorting mechanism 2, and a second defective product collection box 400 is provided directly below the defective product discharge hole of the second sorting mechanism 4 to facilitate the collection of defective products.

[0031] The dual-temperature testing device of the present utility model is further provided with a control system. Reflective photoelectric sensors are respectively arranged at corresponding positions of the conductive testing component 9. For example, the reflective photoelectric sensors can be arranged in the slide block 25. A detection through-hole is formed at the testing position 201. The positions of the reflective photoelectric sensors are aligned with the above-mentioned detection through-hole, so that the detection infrared rays emitted by the reflective photoelectric sensors can pass through the above-mentioned detection through-hole and irradiate the bottom of the test piece 99. The control system is electrically connected to the reflective photoelectric sensors, so that the control system can sense that the test piece 99 arrives at or leaves the testing position 201. The control system also controls and connects the above-mentioned respective cylinders. Temperature sensors are respectively arranged in the low-temperature heating channel 3 and the high-temperature heating channel 5. The control system is electrically connected to each temperature sensor. The control system is also electrically connected to the circuit corresponding to the conductive testing component 9, so that the control system can correspondingly control the actions of the first sorting mechanism 2, the second sorting mechanism 4, and the third sorting mechanism 6 according to the test results of the conductive testing component 9, thereby realizing the automatic testing of the test piece 99. As Figure 1 shown, a test piece vibrating disk 8 can also be provided. The test piece vibrating disk 8 sorts and conveys the test pieces 99 to the inlet end (i.e., the left end) of the linear vibrating conveyor rail 11.

[0032] As Figure 1 shown, the linear vibrator 1, the first sorting mechanism 2, the low-temperature heating channel 3, the second sorting mechanism 4, the high-temperature heating channel 5, and the third sorting mechanism 6 can be arranged on the workbench 7.

Claims

1. A dual-temperature testing device for a thermal protector, characterized in that: It includes a linear oscillator (1), a low-temperature heating track (3) and a high-temperature heating track (5). The linear oscillator (1) is provided with a linear vibration conveying track (11) for longitudinally conveying a test piece (99). A first sorting mechanism (2) for removing defective products in room-temperature conductivity testing is arranged between the linear vibration conveying track (11) and the low-temperature heating track (3). A second sorting mechanism (4) for removing defective products in low-temperature conductivity testing is arranged between the low-temperature heating track (3) and the high-temperature heating track (5). A third sorting mechanism (6) for removing defective products in high-temperature conductivity testing is correspondingly arranged at the end of the high-temperature heating track (5). The first sorting mechanism (2), the second sorting mechanism (4) and the third sorting mechanism (6) are respectively provided with conductivity testing components (9). The conductivity testing component (9) includes a conductivity testing needle (911) for contacting the pins of the test piece (99).

2. The dual-temperature testing device for a thermal protector according to claim 1, wherein: The first sorting mechanism (2) includes a slide block (25). A test position (201), a sorting slideway (202), a defective product discharge hole (203) and a sorted product discharge position (204) are formed on the slide block (25). One end of the sorting slideway (202) is connected to the test position (201), and the other corresponding end of the sorting slideway (202) is connected to the defective product discharge hole (203). The sorted product discharge position (204) is arranged on one side of the defective product discharge hole (203). The first sorting mechanism (2) includes a sorting push rod (211) for horizontally pushing the test piece (99) located at the test position (201) above the defective product discharge hole (203). The first sorting mechanism (2) includes a bridge plate (221) for covering the upper end of the defective product discharge hole (203) and a delivery rod (231) for longitudinally pushing the test piece (99) located on the bridge plate (221) to the sorted product discharge position (204). The first sorting mechanism (2) includes a sorting air cylinder (21), a bridging air cylinder (22) and a delivery air cylinder (23). The sorting air cylinder (21) drives the sorting push rod (211) to move horizontally. The bridging air cylinder (22) drives the bridge plate (221) to move horizontally. The delivery air cylinder (23) drives the delivery rod (231) to move longitudinally.

3. The dual-temperature testing device for a thermal protector according to claim 2, wherein: The conductivity testing component (9) includes a lifting air cylinder (91). The lifting air cylinder (91) drives the corresponding conductivity testing needle (911) to move up and down.

4. The dual-temperature testing device for a thermal protector according to claim 3, characterized in that: The low-temperature heating track (3) includes a heat transfer track (31), an electric heating film (32) and a heat insulation pipeline (33). The heat transfer track (31) and the electric heating film (32) are arranged in the heat insulation pipeline (33). The bottom of the heat transfer track (31) is abutted against the upper side of the electric heating film (32). The top of the heat transfer track (31) is provided with a conveying slideway (301) adapted for the test piece (99) to slide.

5. The dual-temperature testing device for a thermal protector according to claim 4, characterized in that: The second sorting mechanism (4) is arranged with the same structure as the first sorting mechanism (2). The third sorting mechanism (6) includes a sorting channel switching cylinder (62) and a sorting channel assembly (621). The sorting channel assembly (621) includes a good product guiding pipeline (6211) and a defective product guiding pipeline (6212). The good product guiding pipeline (6211) and the defective product guiding pipeline (6212) are arranged in longitudinal abutment. The sorting channel switching cylinder (62) drives the sorting channel assembly (621) to move longitudinally. The third sorting mechanism (6) is provided with a discharge chute (601). One end of the discharge chute (601) is connected to the end of the high-temperature heating channel (5), and the other end corresponding to the discharge chute (601) is connected to the sorting channel assembly (621). The third sorting mechanism (6) includes a discharge cylinder (61) and a discharge push rod (611) for horizontally pushing the test piece (99) located in the discharge chute (601) to the sorting channel assembly (621). The discharge cylinder (61) is drivingly connected to the discharge push rod (611).

6. The dual-temperature testing device for a thermal protector according to claim 5, wherein: The third sorting mechanism (6) is provided with a good product collection box (610) and a third defective product collection box (620). The good product collection box (610) is arranged corresponding to and below the outlet of the good product guiding pipeline (6211), and the third defective product collection box (620) is arranged corresponding to and below the outlet of the defective product guiding pipeline (6212).

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