Anti-static chip test fixture

Abstract

The utility model belongs to the technical field of chip testing, particularly relates to an anti-static chip testing jig, and aims to solve the problems that the testing process depends on manual work and the testing efficiency is low in the background technology, the following scheme is provided: the anti-static chip testing jig comprises a plate frame, a first transverse guide rail is arranged on one side of the outer wall of the top of the plate frame, and a second transverse guide rail is arranged on the other side of the outer wall of the top of the plate frame; a first vertical guide rail is fixedly connected to the first transverse guide rail sliding block, and a first stand column is fixedly connected to the first vertical guide rail sliding block. According to the utility model, the chips in the feeding groove plate can be quickly placed in the test groove, and after the chips are tested, the chips of different qualities can be classified through the transfer conveyor, the NG product conveyor and the qualified product conveyor, so that the automatic chip testing machine has the characteristics of convenience in operation, high automation degree and the like; the signal connecting piece at the bottom of the positioning plate can be quickly transferred into the testing groove to be in butt joint with the chip, so that whether the chip is qualified or not is quickly tested, the testing device has the advantages of being quick in testing and high in efficiency, and manpower is saved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to an anti-static chip testing fixture. Background Art

[0002] Anti-static chips are components used to protect electronic devices from damage caused by electrostatic discharge (ESD). They are typically installed near the USB port on the motherboard. By providing ESD protection, they ensure the safe operation of electronic devices in various environments and are an indispensable component in the electronics industry.

[0003] The anti-static chip testing process requires operators to repeatedly load and unload materials. The entire process is monotonous and boring. In addition, due to the small testing space, operators need to align the test slot, which tests the operator's concentration and slows down the testing efficiency. Utility Model Content

[0004] In view of the deficiencies of the existing technology, the utility model provides an anti-static chip testing fixture, which overcomes the deficiencies of the existing technology and effectively solves the problem that the testing process relies on manual labor and the testing efficiency is slow.

[0005] In order to achieve the above purpose, the present invention adopts the following technical solutions:

[0006] An anti-static chip testing fixture includes a plate frame, a first transverse guide rail provided on one side of the top outer wall of the plate frame, a first vertical guide rail fixedly connected to the first transverse guide rail slider, a first column fixedly connected to the first vertical guide rail slider, and a vacuum suction cup mounted on the bottom outer wall of the first column; a transfer conveyor fixedly connected to the outer wall of one side of the plate frame, and an NG product conveyor and a qualified product conveyor respectively provided at both ends of the transfer conveyor;

[0007] A second horizontal guide rail is provided on the other side of the top outer wall of the plate frame, and a second vertical guide rail is fixedly connected to the second horizontal guide rail slider, a second column is fixedly connected to the second vertical guide rail slider, and a positioning plate is installed on the bottom outer wall of the second column, and a signal connection piece is fixedly connected to the top inner wall of the positioning plate.

[0008] Preferably, a first fixing frame is welded to one side of the outer wall of the top of the plate frame, and the first transverse guide rail is fixedly connected to the inner wall of the first fixing frame.

[0009] Preferably, a second fixing frame is welded to the other side of the outer wall of the top of the plate frame, and the second transverse guide rail is fixedly connected to the inner wall of the second fixing frame.

[0010] Preferably, a test fixture table is fixedly connected to the top outer wall of the board rack, and a test slot is opened on the top outer wall of the test fixture table, and a chip is placed inside the test slot.

[0011] Preferably, a feed trough plate is welded inside the bottom of the plate frame, and the chip is slidably connected to the inner wall of the feed trough plate.

[0012] Preferably, a first baffle and a second baffle are welded to one end of the top outer wall of the qualified product conveyor and the NG product conveyor, respectively.

[0013] The beneficial effects of the utility model are:

[0014] 1. The anti-static chip test fixture designed in this invention can quickly place the chips in the feed trough plate into the test trough through the cooperation of the first horizontal guide rail, the first vertical guide rail, the first column and the vacuum suction cup. After the chip test is completed, the chip quality can be sorted by the transfer conveyor, the NG product conveyor and the qualified product conveyor. It has the characteristics of convenient operation and high degree of automation.

[0015] 2. The anti-static chip test fixture designed in this invention cooperates with the second horizontal guide rail, the second vertical guide rail, the second column, the positioning plate and the signal connection piece. The signal connection piece at the bottom of the positioning plate can be quickly transferred to the test slot and docked with the chip, thereby quickly testing whether the chip is qualified. It has the characteristics of fast testing and high efficiency, saving manpower. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a front view of the overall structure of an anti-static chip testing fixture proposed by the present invention;

[0017] Figure 2 This is a rear view of the overall structure of an anti-static chip test fixture proposed by the present invention;

[0018] Figure 3 This is a schematic diagram of the second transverse guide rail connection structure of an anti-static chip testing fixture proposed by the present invention.

[0019] In the figure: 1. Plate rack; 2. First transverse guide rail; 3. First vertical guide rail; 4. First column; 5. Vacuum suction cup; 6. Transfer conveyor; 7. NG product conveyor; 8. Qualified product conveyor; 9. Second transverse guide rail; 10. Second vertical guide rail; 11. Second column; 12. Positioning plate; 13. Signal connecting piece; 14. First fixing frame; 15. Second fixing frame; 16. Test fixture table; 17. Feed trough plate; 18. First baffle; 19. Second baffle. DETAILED DESCRIPTION

[0020] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.

[0021] Example 1, refer to Figures 1 to 2 An anti-static chip testing fixture includes a board frame 1, a first horizontal guide rail 2 is provided on one side of the top outer wall of the board frame 1, and a first vertical guide rail 3 is fixedly connected to the slider of the first horizontal guide rail 2, a first column 4 is fixedly connected to the slider of the first vertical guide rail 3, and a vacuum suction cup 5 is installed on the bottom outer wall of the first column 4, a transfer conveyor 6 is fixedly connected to the outer wall of one side of the board frame 1, and an NG product conveyor 7 and a qualified product conveyor 8 are respectively provided at both ends of the transfer conveyor 6.

[0022] In this embodiment, through the cooperation of the first horizontal guide rail 2, the first vertical guide rail 3, the first column 4 and the vacuum suction cup 5, the chips in the feeding slot plate 17 can be quickly placed in the test slot, and after the chip test is completed, the chips of different qualities can be classified through the transfer conveyor 6, the NG product conveyor 7 and the qualified product conveyor 8, which has the characteristics of convenient operation and high degree of automation.

[0023] Example 2, refer to Figure 3 , an anti-static chip testing fixture, a second horizontal guide rail 9 is provided on the other side of the top outer wall of the board frame 1, and the second horizontal guide rail 9 is fixedly connected to the slider of the second vertical guide rail 10, and the slider of the second vertical guide rail 10 is fixedly connected to the second column 11, and a positioning plate 12 is installed on the bottom outer wall of the second column 11, and a signal connection piece 13 is fixedly connected to the top inner wall of the positioning plate 12.

[0024] In this embodiment, through the mutual cooperation of the second horizontal guide rail 9, the second vertical guide rail 10, the second column 11, the positioning plate 12 and the signal connecting piece 13, the signal connecting piece 13 at the bottom of the positioning plate 12 can be quickly transferred to the test slot and docked with the chip, thereby quickly testing whether the chip is qualified. It has the characteristics of fast testing and high efficiency, saving manpower.

[0025] Reference Figures 1 to 2 A first fixing frame 14 is welded to one side of the top outer wall of the plate frame 1 , and the first transverse guide rail 2 is fixedly connected to the inner wall of the first fixing frame 14 .

[0026] Reference Figures 2 to 3 A second fixing frame 15 is welded to the other side of the top outer wall of the plate frame 1 , and the second transverse guide rail 9 is fixedly connected to the inner wall of the second fixing frame 15 .

[0027] Reference Figure 1 A test fixture 16 is fixedly connected to the top outer wall of the board rack 1, and a test slot is opened on the top outer wall of the test fixture 16, and a chip is placed inside the test slot.

[0028] Reference Figure 2A feed trough plate 17 is welded inside the bottom of the plate frame 1, and the chip is slidably connected to the inner wall of the feed trough plate 17.

[0029] Reference Figures 1 to 2 A first baffle 18 and a second baffle 19 are welded to one end of the top outer wall of the qualified product conveyor 8 and the NG product conveyor 7, respectively.

[0030] Working principle: First, the vacuum suction cup 5 is driven by the first transverse guide rail 2 and the first vertical guide rail 3 to move the chip in the feeding slot plate 17 to the test slot in the test fixture table 16, and then the positioning plate 12 is driven by the second transverse guide rail 9 and the second vertical guide rail 10 to move, so that the signal connecting piece 13 is connected to the chip for testing. After the test is completed, it is determined whether the chip is qualified, and then the chip is moved to the transfer conveyor 6. The change in the conveying direction of the transfer conveyor 6 is used to transfer the qualified products to the qualified product conveyor 8, and the unqualified products are transferred to the NG product conveyor 7.

[0031] The above is only a preferred specific implementation method of the present invention, but the protection scope of the present invention is not limited to this. Any technician familiar with the technical field within the technical scope disclosed by the present invention can make equivalent replacements or changes based on the technical solution and utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. An anti-static chip test fixture, comprising a board frame (1), characterized in that: A first transverse guide rail (2) is provided on one side of the top outer wall of the plate rack (1), and a first vertical guide rail (3) is fixedly connected to the slider of the first transverse guide rail (2), a first column (4) is fixedly connected to the slider of the first vertical guide rail (3), and a vacuum suction cup (5) is installed on the bottom outer wall of the first column (4), a transfer conveyor (6) is fixedly connected to the outer wall of one side of the plate rack (1), and an NG product conveyor (7) and a qualified product conveyor (8) are respectively provided at both ends of the transfer conveyor (6); A second transverse guide rail (9) is provided on the other side of the top outer wall of the plate frame (1), and a second vertical guide rail (10) is fixedly connected to the slider of the second transverse guide rail (9), a second column (11) is fixedly connected to the slider of the second vertical guide rail (10), and a positioning plate (12) is installed on the bottom outer wall of the second column (11), and a signal connection piece (13) is fixedly connected to the top inner wall of the positioning plate (12).

2. The anti-static chip test fixture according to claim 1, characterized in that: A first fixing frame (14) is welded to one side of the top outer wall of the plate frame (1), and the first transverse guide rail (2) is fixedly connected to the inner wall of the first fixing frame (14).

3. The anti-static chip testing fixture according to claim 1, characterized in that: A second fixing frame (15) is welded to the other side of the top outer wall of the plate frame (1), and the second transverse guide rail (9) is fixedly connected to the inner wall of the second fixing frame (15).

4. The anti-static chip testing fixture according to claim 1, characterized in that: The top outer wall of the plate rack (1) is fixedly connected to a test fixture table (16), and the top outer wall of the test fixture table (16) is provided with a test slot, in which a chip is placed.

5. The anti-static chip testing fixture according to claim 1, characterized in that: A feeding trough plate (17) is welded inside the bottom of the plate frame (1), and the chip is slidably connected to the inner wall of the feeding trough plate (17).

6. The anti-static chip testing fixture according to claim 1, characterized in that: A first baffle (18) and a second baffle (19) are respectively welded to one end of the top outer wall of the qualified product conveyor (8) and the NG product conveyor (7).

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