Socket test circuit structure and socket test device

Abstract

The utility model relates to a socket test circuit structure and a socket test device, the circuit structure comprises a master control MCU control circuit and a measuring circuit, the measuring circuit comprises a live wire detection end, a zero line detection end and a ground wire detection end; the live wire detection end comprises a live wire insertion piece, a fuse, a switch, a double-diode loop and a first triode, the live wire insertion piece is connected with one end of the fuse, the other end of the fuse is connected with a base electrode of the first triode, an emitting electrode of the first triode is grounded after being connected with a second diode, and a collector electrode of the first triode is connected with the control chip; the other end of the fuse is connected with one end of the switch, the other end of the switch is connected with one end of the diode loop, and the other end of the diode loop is connected with the zero line insertion piece. The zero line detection end comprises a zero line insertion piece and a resistance circuit, one end of the resistance circuit is connected with the zero line insertion piece, and the other end of the resistance circuit is connected with the live line insertion piece and one end of the fuse. The safety of the socket testing device is provided.

Description

Technical Field

[0001] The utility model relates to electrical testing, in particular to a socket testing circuit structure and a socket testing device. Background Art

[0002] In electrical equipment, the correct connection and safety of sockets are essential for ensuring the stability and safety of electrical systems. Traditional socket testing methods typically rely on manual inspection and measurement, such as using tools like multimeters. This not only requires operators to have certain electrical knowledge, but can also easily lead to inaccurate test results due to improper operation. With the advancement of electrical technology, the demand for automated and intelligent socket testing systems is increasing. Although existing socket testing equipment can provide certain detection functions, it needs to be connected to the socket during testing, resulting in safety risks such as leakage and overvoltage during testing. Utility Model Content

[0003] Based on this, it is necessary to provide a socket testing circuit structure and a socket testing device to address the problem of safety risks in socket testing equipment during testing.

[0004] The utility model provides a socket test circuit structure, including a main control MCU control circuit and a measurement circuit, wherein the main control MCU control circuit includes a control chip, and the measurement circuit includes a live wire detection terminal, a neutral wire detection terminal and a ground wire detection terminal;

[0005] The live wire detection end includes a live wire plug, a fuse, a switch, a dual diode circuit and a first transistor, wherein the live wire plug is connected to one end of the fuse, the other end of the fuse is connected in series with a first diode and a first resistor and then connected to the base of the first transistor, the emitter of the first transistor is connected to the second diode and then grounded, the collector of the first transistor is connected to the BATT_CHECK pin and the VCC pin of the control chip, the other end of the fuse is also connected to one end of the switch through a second resistor, the other end of the switch is connected to one end of the diode circuit, and the other end of the diode circuit is connected to the neutral wire plug;

[0006] The neutral line detection end includes a neutral line plug and a resistance circuit, one end of the resistance circuit is connected to the neutral line plug, and the other end of the resistance circuit is connected to the live line plug and one end of the fuse;

[0007] The ground wire detection end includes a ground wire plug, and the ground wire plug is grounded.

[0008] In some embodiments, the resistance circuit includes a first series resistor, a second series resistor, a third series resistor, a third resistor, a fourth resistor, a fifth resistor, and a first capacitor; the live wire plug is connected to one end of the first series resistor and one end of the third series resistor, the neutral wire plug is connected to the other end of the third series resistor and one end of the second series resistor, and the other end of the first series resistor and the other end of the second series resistor are grounded;

[0009] One end of the third resistor is connected to the third series resistor, the other end of the third resistor is connected to the ON pin of the control chip and one end of the fourth resistor, the other end of the fourth resistor is connected to the OO pin of the control chip and one end of the first capacitor, the other end of the first capacitor is connected to one end of the fifth resistor, and the other end of the fifth resistor is grounded.

[0010] In some embodiments, pin 48 of the control chip is connected to a debugging button.

[0011] In some embodiments, a power on / off circuit is further included, which includes a battery power supply circuit and a key circuit. The battery of the battery power supply circuit powers the key circuit and is connected to the VCC pin and LVD pin of the control chip. The power on / off button of the key circuit controls the start and shut down of the control chip.

[0012] In some embodiments, the key circuit includes a power button, a third diode, a fourth diode, a second transistor and a third transistor, one end of the power button is grounded, the other end of the power button is connected to the cathode of the third diode and the cathode of the fourth diode, the anode of the third diode is connected to the KeyPower pin of the control chip, the anode of the fourth diode is connected to the collector of the second transistor and the base of the third transistor, the emitter of the second transistor is grounded, the base of the second transistor is connected to the Power pin of the control chip, the base of the third transistor is also connected to the emitter of the third transistor and the battery through a resistor, and the collector of the third transistor is connected to the VCC pin of the control chip.

[0013] In some embodiments, a boost circuit is further included, which includes a boost chip. The VIN pin of the boost chip is connected to the VCC pin of the control chip to raise the voltage of the VCC pin, and VDD is output from the VOUT pin of the boost chip.

[0014] In some embodiments, a backlight control circuit is further included, which includes a seventh resistor, an eighth resistor, a fourth transistor and a light-emitting diode, one end of the seventh resistor is connected to the BL pin of the control chip, the other end of the seventh resistor is connected to the base of the fourth transistor, the emitter of the fourth transistor is grounded, the collector of the fourth transistor is connected to the cathode of the light-emitting diode through the eighth resistor, and the anode of the light-emitting diode is connected to VDD.

[0015] In some embodiments, a display control circuit is further included, which includes a display chip and an LCD connected to the display chip, and pin 8 of the display chip is connected to the VCC pin of the control chip and pin 9 of the display chip through a ninth resistor.

[0016] In some embodiments, a temperature and humidity sensor is further included, and the temperature and humidity sensor is connected to the VCC pin of the control chip.

[0017] The utility model also provides a socket testing device, comprising the socket testing circuit structure.

[0018] Compared with the prior art, the present invention has at least the following beneficial effects:

[0019] The circuit structure of this utility model includes a main control MCU control circuit and a measurement circuit. The main control MCU control circuit has a built-in control chip, while the measurement circuit covers the hot wire detection terminal, the neutral wire detection terminal, and the ground wire detection terminal. Specifically, the hot wire detection terminal includes a hot wire plug, a fuse, a switch, a dual-diode circuit, and a first transistor. Through the cooperation of these components, it can accurately detect the status of the hot wire and protect the circuit safety. The neutral wire detection terminal includes a neutral wire plug and a resistor circuit to monitor the connection status of the neutral wire. The ground wire detection terminal includes a ground wire plug, which is directly grounded to ensure the good grounding state of the electrical equipment and the safety of the socket test device. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 A schematic diagram of the circuit principle of a measurement circuit according to an embodiment of the present utility model;

[0021] Figure 2 This is a schematic diagram of the circuit principle of the resistance circuit at the zero line detection end shown in an embodiment of the present utility model;

[0022] Figure 3 This is a schematic diagram of the circuit principle of the main control MCU control circuit shown in an embodiment of the present utility model;

[0023] Figure 4 This is a schematic diagram of the circuit principle of the power on / off circuit shown in an embodiment of the present utility model;

[0024] Figure 5 This is a schematic diagram of the circuit principle of a boost circuit according to an embodiment of the present utility model;

[0025] Figure 6 This is a schematic diagram of the circuit principle of the backlight control circuit shown in an embodiment of the present utility model;

[0026] Figure 7 This is a schematic diagram of the circuit principle of the display control circuit shown in an embodiment of the present utility model;

[0027] Figure 8 This is a schematic diagram of the circuit principle of the temperature and humidity sensor shown in an embodiment of the present utility model. DETAILED DESCRIPTION

[0028] To make the above-mentioned objects, features, and advantages of the present invention more clearly understood, the following detailed description of specific embodiments of the present invention is provided in conjunction with the accompanying drawings. The following description sets forth many specific details to facilitate a full understanding of the present invention. However, the present invention can be implemented in many other ways than those described herein, and those skilled in the art may make similar modifications without departing from the scope of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0029] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be an intermediate element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be an intermediate element at the same time. In contrast, when an element is referred to as being "directly on" another element, there is no intermediate element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only."

[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this invention pertains. The terms used herein in the specification of this invention are intended only to describe specific embodiments and are not intended to limit this invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0031] See also Figures 1 to 3 The present invention shows a socket test circuit structure, which includes a main control MCU control circuit and a measurement circuit. The main control MCU control circuit includes a control chip U1, and the measurement circuit includes a live wire detection terminal, a neutral wire detection terminal, and a ground wire detection terminal.

[0032] The live wire detection end includes a live wire plug L, a fuse, a switch S2, a dual diode circuit and a first transistor Q2. The live wire plug L is connected to one end of the fuse, and the other end of the fuse is connected in series with a first diode D3 and a first resistor R29 and then connected to the base of the first transistor Q2. The emitter of the first transistor Q2 is connected to the ground after being connected to the second diode D4. The collector of the first transistor Q2 is connected to the BATT_CHECK pin and the VCC pin of the control chip U1. The other end of the fuse is also connected to one end of the switch S2 through a second resistor (R25-R27). The other end of the switch S2 is connected to one end of the diode circuit (D1, D2), and the other end of the diode circuit (D1, D2) is connected to the neutral wire plug E.

[0033] The neutral line detection end includes a neutral line plug E and a resistance circuit, one end of the resistance circuit is connected to the neutral line plug, and the other end of the resistance circuit is connected to the live line plug L and one end of the fuse Fuse;

[0034] The ground wire detection end includes a ground wire plug N, and the ground wire plug N is grounded.

[0035] In this embodiment, the live wire blade L, the neutral wire blade E, and the ground wire blade N of the plug are inserted into the socket, and the switch S2 is closed. Under high current, high voltage, and other conditions, the fuse is blown to improve the test safety; when the socket is normally powered on, the base voltage of the first transistor Q2 is increased, and the voltage drop detected by the BATT_CHECK pin of the control chip U1 becomes a preset value; when the socket is abnormally powered on, the base voltage of the first transistor Q2 does not change or the voltage drops, and the voltage drop detected by the BATT_CHECK pin does not change or the voltage drop changes to other values, thereby detecting abnormal conditions such as socket leakage and realizing the socket power-on function detection.

[0036] In some embodiments, as Figure 2 As shown, the resistance circuit includes a first series resistor (R9, R10, R12), a second series resistor (R13, R15, R16), a third series resistor (R17, R18, R20), a third resistor R19, a fourth resistor R22, a fifth resistor R23 and a first capacitor C9; the live wire plug L is connected to one end of the first series resistor and one end of the third series resistor, the neutral wire plug E is connected to the other end of the third series resistor and one end of the second series resistor, and the other end of the first series resistor and the other end of the second series resistor are grounded;

[0037] One end of the third resistor R19 is connected to the third series resistor, the other end of the third resistor R19 is connected to the ON pin of the control chip U1 and one end of the fourth resistor R22, the other end of the fourth resistor R22 is connected to the OO pin of the control chip U1 and one end of the first capacitor C9, the other end of the first capacitor C9 is connected to one end of the fifth resistor R23, and the other end of the fifth resistor R23 is grounded.

[0038] In this embodiment, a resistor circuit is used to reduce the voltage and current of the measurement circuit to prevent high current leakage in the socket test device during testing, ensuring the safety of the tester. At the same time, C9 and R23 form an RC circuit for signal delay and filtering.

[0039] In some embodiments, as Figure 3 As shown, the 48th pin of the control chip U1 is connected to a debugging button, so as to control the control chip U1 to start functions such as socket testing.

[0040] In some embodiments, as Figure 4 As shown, it also includes a power on / off circuit, which includes a battery power supply circuit and a key circuit. The battery of the battery power supply circuit supplies power to the key circuit and is connected to the VCC pin and LVD pin of the control chip U1. The power on / off button S1 of the key circuit controls the start and shut down of the control chip U1.

[0041] The key circuit includes a power button S1, a third diode D6, a fourth diode D5, a second transistor Q4 and a third transistor Q5. One end of the power button S1 is grounded, and the other end of the power button S1 is connected to the cathode of the third diode D6 and the cathode of the fourth diode D5. The anode of the third diode D6 is connected to the KeyPower pin of the control chip U1. The anode of the fourth diode D5 is connected to the collector of the second transistor Q4 and the base of the third transistor Q5. The emitter of the second transistor Q4 is grounded, and the base of the second transistor Q4 is connected to the Power pin of the control chip U1. The base of the third transistor Q5 is also connected to the emitter of the third transistor Q5 and the battery through a resistor R33. The collector of the third transistor Q5 is connected to the VCC pin of the control chip U1.

[0042] In this embodiment, the battery-powered circuit uses a 3V battery. After pre-filtering with capacitor C8 to reduce signal interference, one end (BATT) is connected to the key circuit. The other end is connected to the LVD pin of U1 through a series resistor R8, and then to the VCC pin of U1 through a series resistor R7. The power-on / off circuit activates the socket test device.

[0043] In some embodiments, as Figure 5 As shown, a boost circuit is also included, which includes a boost chip U2. The VIN pin of the boost chip U2 is connected to the VCC pin of the control chip U1 to raise the voltage of the VCC pin, and VDD is output from the VOUT pin of the boost chip U2.

[0044] In this embodiment, the VCC voltage is raised to output VDD through a boost circuit, so that the socket function test can be performed at a low voltage. On the basis of ensuring the safety of the test, the voltage is raised to power some power-consuming structures of the socket test device (such as the backlight control circuit, LCD, etc.).

[0045] In some embodiments, as Figure 6 As shown, it also includes a backlight control circuit, which includes a seventh resistor R2, an eighth resistor R3, a fourth transistor Q3 and a light-emitting diode DBL. One end of the seventh resistor R2 is connected to the BL pin of the control chip U1, and the other end of the seventh resistor R2 is connected to the base of the fourth transistor Q3. The emitter of the fourth transistor Q3 is grounded, and the collector of the fourth transistor Q3 is connected to the cathode of the light-emitting diode DBL through the eighth resistor R3. The anode of the light-emitting diode DBL is connected to VDD.

[0046] In this embodiment, the BL pin of U1 outputs a level signal to control the conduction or cutoff of the fourth transistor Q3, so as to turn on or off the power circuit of the light-emitting diode DBL, thereby controlling the light-emitting diode DBL to light up or go out, thereby serving as an intuitive warning for the socket test device.

[0047] In some embodiments, as Figure 7 As shown, the device further includes a display control circuit, which includes a display chip U4 and an LCD connected to the display chip U4. Pin 8 of the display chip is connected to the VCC pin of the control chip U1 and pin 9 of the display chip U4 via a ninth resistor R4. By providing the display control circuit, the LCD can be used to intuitively display test information of the socket test device, thereby achieving visual testing.

[0048] In some embodiments, as Figure 8 As shown, a temperature and humidity sensor U3 is also included, which is connected to the VCC pin of the control chip U1. By setting up the temperature and humidity sensor U3, the current temperature and humidity of the current testing environment can be observed, ensuring the safety of the testing environment and avoiding the risk of electric shock caused by testing in a high humidity environment.

[0049] The utility model also provides a socket test device, including the above-mentioned socket test circuit structure. The live wire detection terminal cooperates with the live wire plug, fuse, switch, dual diode circuit, and first transistor to accurately detect the live wire status and protect circuit safety. The neutral wire detection terminal monitors the neutral wire connection status, and the ground detection terminal directly connects to the ground to ensure a good grounding state of the electrical equipment and guarantee the safety of the socket test device.

[0050] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0051] The above-described embodiments merely represent several implementations of the present invention. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the utility model patent. It should be noted that a person skilled in the art would be able to make various modifications and improvements without departing from the concept of the present invention, and these modifications and improvements fall within the scope of protection of the present invention. Therefore, the scope of protection of the present utility model patent shall be determined by the appended claims.

Claims

1. A socket test circuit structure, characterized in that: It includes a main control MCU control circuit and a measurement circuit, wherein the main control MCU control circuit includes a control chip, and the measurement circuit includes a live wire detection terminal, a neutral wire detection terminal and a ground wire detection terminal; The live wire detection end includes a live wire plug, a fuse, a switch, a dual diode circuit and a first transistor, wherein the live wire plug is connected to one end of the fuse, the other end of the fuse is connected in series with a first diode and a first resistor and then connected to the base of the first transistor, the emitter of the first transistor is connected to the second diode and then grounded, the collector of the first transistor is connected to the BATT_CHECK pin and the VCC pin of the control chip, the other end of the fuse is also connected to one end of the switch through a second resistor, the other end of the switch is connected to one end of the diode circuit, and the other end of the diode circuit is connected to the neutral wire plug; The neutral line detection end includes a neutral line plug and a resistance circuit, one end of the resistance circuit is connected to the neutral line plug, and the other end of the resistance circuit is connected to the live line plug and one end of the fuse; The ground wire detection end includes a ground wire plug, and the ground wire plug is grounded.

2. The socket test circuit structure according to claim 1, characterized in that: The resistance circuit includes a first series resistor, a second series resistor, a third series resistor, a third resistor, a fourth resistor, a fifth resistor, and a first capacitor; the live wire plug is connected to one end of the first series resistor and one end of the third series resistor, the neutral wire plug is connected to the other end of the third series resistor and one end of the second series resistor, and the other end of the first series resistor and the other end of the second series resistor are grounded; One end of the third resistor is connected to the third series resistor, the other end of the third resistor is connected to the ON pin of the control chip and one end of the fourth resistor, the other end of the fourth resistor is connected to the OO pin of the control chip and one end of the first capacitor, the other end of the first capacitor is connected to one end of the fifth resistor, and the other end of the fifth resistor is grounded.

3. The socket test circuit structure according to claim 1, characterized in that: Pin 48 of the control chip is connected to a debugging button.

4. The socket test circuit structure according to claim 1, wherein: It also includes a power on / off circuit, which includes a battery power supply circuit and a key circuit. The battery of the battery power supply circuit powers the key circuit and is connected to the VCC pin and LVD pin of the control chip. The power on / off button of the key circuit controls the start and shut down of the control chip.

5. The socket test circuit structure according to claim 4, characterized in that: The key circuit includes a power button, a third diode, a fourth diode, a second transistor and a third transistor. One end of the power button is grounded, and the other end of the power button is connected to the cathode of the third diode and the cathode of the fourth diode. The anode of the third diode is connected to the KeyPower pin of the control chip, the anode of the fourth diode is connected to the collector of the second transistor and the base of the third transistor, the emitter of the second transistor is grounded, the base of the second transistor is connected to the Power pin of the control chip, the base of the third transistor is also connected to the emitter of the third transistor and the battery through a resistor, and the collector of the third transistor is connected to the VCC pin of the control chip.

6. The socket test circuit structure according to claim 1, characterized in that: It also includes a boost circuit, which includes a boost chip. The VIN pin of the boost chip is connected to the VCC pin of the control chip to raise the voltage of the VCC pin, and the VDD is output from the VOUT pin of the boost chip.

7. The socket test circuit structure according to claim 6, characterized in that: It also includes a backlight control circuit, which includes a seventh resistor, an eighth resistor, a fourth transistor and a light-emitting diode. One end of the seventh resistor is connected to the BL pin of the control chip, the other end of the seventh resistor is connected to the base of the fourth transistor, the emitter of the fourth transistor is grounded, the collector of the fourth transistor is connected to the cathode of the light-emitting diode through the eighth resistor, and the anode of the light-emitting diode is connected to VDD.

8. The socket test circuit structure according to claim 1, characterized in that: It also includes a display control circuit, which includes a display chip and an LCD connected to the display chip. Pin 8 of the display chip is connected to the VCC pin of the control chip and pin 9 of the display chip through a ninth resistor.

9. The socket test circuit structure according to claim 1, characterized in that: It also includes a temperature and humidity sensor, which is connected to the VCC pin of the control chip.

10. A socket testing device, characterized in that: The invention comprises a socket test circuit structure as claimed in any one of claims 1 to 9.

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