Automatic high-speed test equipment for storage chip

Abstract

The utility model discloses an automatic high-speed test device for a memory chip, which relates to the technical field of chip testing and comprises a test frame and a plurality of springs, a first motor is fixedly arranged on the side wall of the test frame, and a chip body is inserted between every two opposite rectangular clamping grooves. According to the utility model, the plurality of left L-shaped clamping plates are respectively pulled through the L-shaped clamping plates, the corresponding L-shaped clamping plates can be pushed through the elastic force of the plurality of springs to clamp the chip bodies, and the first motor drives the first rotating plate, the two supporting plates, the plurality of L-shaped clamping plates and the plurality of chip bodies to turn over. When a plurality of chip bodies above are tested by the test probe seat, a user can quickly take out the tested chip bodies below and can clamp and assemble the chip bodies to be tested again, so that the test, loading and unloading of the chip bodies are carried out at the same time, and the test efficiency is improved. The high-speed test of the memory chip is realized, and the test efficiency is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to automatic high-speed testing equipment for storage chips. Background Art

[0002] In the field of chip technology, with the continuous advancement of semiconductor technology, the density of integrated circuits on chips has become increasingly higher, greatly improving the functionality and operating speed of chips. At the same time, the cost of testing chip performance parameters has also become increasingly high.

[0003] After searching, a chip automatic testing device with announcement number CN208207148U is found, which includes a device body, the device body includes a conveying mechanism and a testing mechanism, the conveying mechanism includes a lower base plate, an upper base plate is provided on the lower base plate, a first hinge seat is provided on the upper base plate, the chip carrier is rotatably connected to the upper base plate through the first hinge seat, a placement groove is provided on the chip carrier, the chip to be tested is placed in the placement groove, a pull rod is provided at one end of the chip carrier, a second hinge seat is provided on one side of the pull rod, and a connecting rod is rotatably connected to the pull rod through the second hinge seat.

[0004] However, the existing chip automatic testing device has certain drawbacks when used. Although the testing equipment can perform automated testing on the chip body to a certain extent, the operation is relatively cumbersome and it can only test a single chip. It is impossible to test multiple chips and load and unload materials at the same time, which makes it difficult to improve the chip testing efficiency and cannot meet the needs of high-speed chip production testing. Utility Model Content

[0005] In view of the above problems existing in the existing chip automatic testing device, the present utility model is proposed.

[0006] Therefore, the purpose of the present invention is to provide an automatic high-speed testing device for memory chips, which solves the problem that although the testing device can perform automated testing on the chip body to a certain extent, the operation is relatively cumbersome and it can only test a single chip. It is impossible to test multiple chips and load and unload materials at the same time, which makes it difficult to improve the chip testing efficiency and fail to meet the requirements of high-speed chip production testing.

[0007] In order to achieve the above purpose, the present invention provides the following technical solutions:

[0008] A memory chip automatic high-speed testing device includes a test frame and multiple springs. A first motor is fixedly mounted on a side wall of the test frame. A first rotating rod is rotatably mounted on an inner wall of the test frame. One end of the first rotating rod passes through the test frame and is fixedly connected to an output shaft of the first motor. A first rotating plate is fixedly mounted on a side wall of the first rotating rod. Two support plates are fixedly mounted on the side wall of the first rotating plate.

[0009] One side of each of the support plates is provided with multiple L-shaped card plates and multiple mounting plates, each of the L-shaped card plates is provided on one side of the corresponding mounting plate, one end of each of the springs is fixedly connected to the corresponding mounting plate, and the other end of each of the springs is fixedly connected to the corresponding L-shaped card plate, and the side walls of each of the L-shaped card plates are provided with rectangular card slots, and a chip body is inserted between every two opposing rectangular card slots, and the internal test probe seat of the test frame, each of the chip bodies matches the test probe seat, and the side walls of the test frame are provided with an adjustment mechanism, and the test probe seat matches the adjustment mechanism.

[0010] Preferably, the adjusting mechanism includes a second motor, a screw, a movable plate and a cylinder, the second motor is fixedly arranged on the side wall of the test frame, the screw is rotatably arranged on the inner wall of the test frame, one end of the screw passes through the test frame and is fixedly connected to the output shaft of the second motor, the movable plate is threadedly sleeved on the rod wall of the screw, the cylinder is fixedly arranged on the bottom of the movable plate, and the output shaft of the cylinder is fixedly connected to the test probe seat.

[0011] Preferably, a first limiting slide rod is movably sleeved inside each of the springs, a left end rod wall of each of the first limiting slide rods is movably sleeved inside the corresponding L-shaped card plate, a right end rod wall of each of the first limiting slide rods is fixedly sleeved inside the corresponding L-shaped card plate, and both ends of each of the first limiting slide rods are respectively fixedly connected to the corresponding mounting plate.

[0012] Preferably, a second rotating plate is fixedly provided on the side walls of the two support plates, a second rotating rod is fixedly provided on the side wall of the second rotating plate, and one end of the second rotating rod is rotatably provided on the inner wall of the test frame.

[0013] Preferably, a second limiting sliding rod is fixedly provided on the inner wall of the test frame, and the movable plate is movably sleeved on the rod wall of the second limiting sliding rod.

[0014] Preferably, a pull ring is fixedly provided on the side wall of each L-shaped clamping plate.

[0015] In the above technical solution, the technical effects and advantages provided by the utility model are:

[0016] 1. The utility model, through the L-shaped card plate provided, pulls multiple left L-shaped card plates respectively, and the elastic force of multiple springs can push the corresponding L-shaped card plates to clamp the chip body, and the first motor drives the first rotating plate, two support plates, multiple L-shaped card plates and multiple chip bodies to flip, and the test probe seat tests the multiple chip bodies above while the user can quickly take out the chip body after the test is completed below, and can re-clamp and assemble the multiple chip bodies to be tested, thereby realizing the testing of multiple chip bodies and loading and unloading at the same time, realizing high-speed testing of memory chips and improving testing efficiency.

[0017] 2. The utility model sets up an adjustment mechanism, which includes a second motor, a screw, a movable plate and a cylinder. Starting the second motor can drive the screw to rotate, and when the screw rotates, it can drive the movable plate, the cylinder and the test probe seat to move. When the test probe seat moves to the top of the corresponding chip body, starting the cylinder can push the test probe seat downward, thereby enabling the test probe seat to smoothly test the chip body.

[0018] 3. The utility model sets up multiple first sliding rods, and the multiple first sliding rods are movably connected to the inside of the corresponding springs, so that the left end rod wall of the first sliding rod is movably connected to the inside of the corresponding L-shaped card plate, and the right end rod wall of the first sliding rod is fixedly connected to the inside of the corresponding L-shaped card plate, thereby limiting the movement of multiple springs and multiple L-shaped card plates, ensuring that some L-shaped card plates can move stably, and thereby improving the stability of the card connection and fixation of multiple chip bodies. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments recorded in the present invention. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0020] Figure 1 This is a schematic cross-sectional view of the utility model;

[0021] Figure 2 For the utility model Figure 1 A magnified view of part A;

[0022] Figure 3 For the utility model Figure 1 Schematic diagram of the three-dimensional structure of the L-shaped pallet.

[0023] Description of reference numerals:

[0024] 1. Test frame; 2. Spring; 3. First motor; 4. First rotating rod; 5. First rotating plate; 6. Support plate; 7. L-shaped card plate; 8. Mounting plate; 9. Rectangular card slot; 10. Chip body; 11. Test probe holder; 12. Second motor; 13. Screw rod; 14. Moving plate; 15. Cylinder; 16. First limit slide; 17. Second rotating plate; 18. Second rotating rod; 19. Second limit slide; 20. Pull ring. DETAILED DESCRIPTION

[0025] In order to enable those skilled in the art to better understand the technical solution of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings.

[0026] The embodiment of the utility model discloses an automatic high-speed testing device for a memory chip.

[0027] The utility model provides Figure 1-3 The device is an automatic high-speed memory chip tester, comprising a test frame 1 and a plurality of springs 2. A first motor 3 is fixedly mounted on a side wall of the test frame 1. A first rotating rod 4 is rotatably mounted on an inner wall of the test frame 1. One end of the first rotating rod 4 extends through the test frame 1 and is fixedly connected to the output shaft of the first motor 3. A first rotating plate 5 is fixedly mounted on a side wall of the first rotating rod 4. Two support plates 6 are fixedly mounted on the side walls of the first rotating plate 5.

[0028] One side of each support plate 6 is provided with multiple L-shaped card plates 7 and multiple mounting plates 8, each L-shaped card plate 7 is provided on one side of the corresponding mounting plate 8, one end of each spring 2 is fixedly connected to the corresponding mounting plate 8, and the other end of each spring 2 is fixedly connected to the corresponding L-shaped card plate 7, and the side wall of each L-shaped card plate 7 is provided with a rectangular card slot 9, and a chip body 10 and an internal test probe seat 11 of the test frame 1 are inserted between every two opposing rectangular card slots 9, each chip body 10 is matched with the test probe seat 11, and the side wall of the test frame 1 is provided with an adjustment mechanism, and the test probe seat 11 is matched with the adjustment mechanism. While the test probe seat 11 is used to test the multiple chip bodies 10 above, the user can quickly take out the chip body 10 after the test is completed below, and can re-clamp and assemble the multiple chip bodies 10 to be tested, thereby realizing the testing of multiple chip bodies 10 and loading and unloading at the same time, realizing high-speed testing of storage chips and improving test efficiency.

[0029] In order to achieve smooth testing of the chip body 10 by the test probe seat 11, Figure 1-2As shown, the adjustment mechanism includes a second motor 12, a screw rod 13, a movable plate 14 and a cylinder 15. The second motor 12 is fixedly arranged on the side wall of the test frame 1, and the screw rod 13 is rotatably arranged on the inner wall of the test frame 1. One end of the screw rod 13 passes through the test frame 1 and is fixedly connected to the output shaft of the second motor 12. The movable plate 14 is threadedly sleeved on the rod wall of the screw rod 13. The cylinder 15 is fixedly arranged on the bottom of the movable plate 14. The output shaft of the cylinder 15 is fixedly connected to the test probe seat 11. By utilizing the set adjustment mechanism, the test probe seat 11 can smoothly test the chip body 10.

[0030] In order to ensure that part of the L-shaped card plate 7 can move stably, and thus improve the stability of the multiple chip bodies 10 being fixed together, as shown in FIG. Figure 1-3 As shown, the interior of each spring 2 is movably sleeved with a first limiting slide 16, the left end rod wall of each first limiting slide 16 is movably sleeved on the interior of the corresponding L-shaped card plate 7, and the right end rod wall of each first limiting slide 16 is fixedly sleeved on the interior of the corresponding L-shaped card plate 7, and the two ends of each first limiting slide 16 are respectively fixedly connected to the corresponding mounting plate 8. By utilizing the multiple first slides 16, it is ensured that part of the L-shaped card plate 7 can move stably, thereby improving the stability of the clamping and fixation of multiple chip bodies 10.

[0031] In order to enhance the stability of the flipping of the two support plates 6 and ensure that the two support plates 6 can be flipped stably, as shown in FIG. Figure 1-2 As shown, the side walls of the two support plates 6 are jointly fixed with a second rotating plate 17, and the side walls of the second rotating plate 17 are fixed with a second rotating rod 18. One end of the second rotating rod 18 is rotatably set on the inner wall of the test frame 1. By utilizing the set second rotating plate 17 and the second rotating rod 18, the stability of the flipping of the two support plates 6 can be enhanced, ensuring that the two support plates 6 can be flipped stably.

[0032] In order to limit the movement of the movable plate 14 and ensure that the movable plate 14 can move stably, Figure 1 As shown, a second limiting slide bar 19 is fixedly provided on the inner wall of the test frame 1, and the movable plate 14 is movably sleeved on the rod wall of the second limiting slide bar 19. The second limiting slide bar 19 is used to limit the movement of the movable plate 14, thereby ensuring that the movable plate 14 can move stably.

[0033] Finally, in order to facilitate the user to pull the L-shaped card plate 7 and quickly remove and re-clamp the chip body 10, as shown in FIG. Figure 1-3 As shown, a pull ring 20 is fixedly provided on the side wall of each L-shaped card plate 7. By utilizing the provided pull ring 20, the user can conveniently pull the L-shaped card plate 7 and can quickly take out and re-clamp the chip body 10.

[0034] The above description is merely illustrative of certain exemplary embodiments of the present invention. It goes without saying that those skilled in the art will be able to modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and description are illustrative in nature and should not be construed as limiting the scope of protection of the claims of the present invention.

Claims

1. A memory chip automatic high-speed test device, comprising a test frame (1) and a plurality of springs (2), characterized in that: A first motor (3) is fixedly provided on the side wall of the test frame (1); a first rotating rod (4) is rotatably provided on the inner wall of the test frame (1); one end of the first rotating rod (4) passes through the test frame (1) and is fixedly connected to the output shaft of the first motor (3); a first rotating plate (5) is fixedly provided on the side wall of the first rotating rod (4); and two supporting plates (6) are fixedly provided on the side wall of the first rotating plate (5); A plurality of L-shaped card plates (7) and a plurality of mounting plates (8) are provided on one side of each support plate (6); each L-shaped card plate (7) is provided on one side of a corresponding mounting plate (8); one end of each spring (2) is fixedly connected to the corresponding mounting plate (8); the other end of each spring (2) is fixedly connected to the corresponding L-shaped card plate (7); a rectangular card slot (9) is provided on the side wall of each L-shaped card plate (7); a chip body (10) is inserted between each two opposing rectangular card slots (9); an internal test probe seat (11) of the test frame (1); each chip body (10) matches the test probe seat (11); an adjustment mechanism is provided on the side wall of the test frame (1); and the test probe seat (11) matches the adjustment mechanism.

2. The automatic high-speed test equipment for memory chips according to claim 1, characterized in that: The adjusting mechanism comprises a second motor (12), a screw rod (13), a movable plate (14) and a cylinder (15); the second motor (12) is fixedly arranged on the side wall of the test frame (1); the screw rod (13) is rotatably arranged on the inner wall of the test frame (1); one end of the screw rod (13) passes through the test frame (1) and is fixedly connected to the output shaft of the second motor (12); the movable plate (14) is threadedly sleeved on the rod wall of the screw rod (13); the cylinder (15) is fixedly arranged on the bottom of the movable plate (14); and the output shaft of the cylinder (15) is fixedly connected to the test probe seat (11).

3. The automatic high-speed memory chip test equipment according to claim 1, characterized in that: A first limiting slide bar (16) is movably sleeved inside each of the springs (2), a left end rod wall of each of the first limiting slide bars (16) is movably sleeved inside the corresponding L-shaped card plate (7), a right end rod wall of each of the first limiting slide bars (16) is fixedly sleeved inside the corresponding L-shaped card plate (7), and both ends of each of the first limiting slide bars (16) are fixedly connected to the corresponding mounting plate (8).

4. The automatic high-speed memory chip test equipment according to claim 1, characterized in that: A second rotating plate (17) is fixedly provided on the side walls of the two support plates (6), a second rotating rod (18) is fixedly provided on the side wall of the second rotating plate (17), and one end of the second rotating rod (18) is rotatably provided on the inner wall of the test frame (1).

5. The automatic high-speed memory chip test equipment according to claim 2, characterized in that: A second limiting slide bar (19) is fixedly provided on the inner wall of the test frame (1), and the movable plate (14) is movably sleeved on the rod wall of the second limiting slide bar (19).

6. The automatic high-speed memory chip test equipment according to claim 1, characterized in that: A pull ring (20) is fixedly provided on the side wall of each L-shaped clamping plate (7).

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