Testing tool for charging and discharging of electrical equipment

Abstract

The utility model discloses a test tool for charging and discharging of electrical equipment. The test tool comprises a probe shell, a sub-probe and a compression stress device. One end of the probe shell is open, and the other end of the probe shell is provided with a plurality of through holes. The two ends of each sub-probe are a detection end and a common end respectively, the common ends penetrate through the through holes, the detection ends extend towards the open ends, the multiple sub-probes are distributed at intervals and comprise voltage monitoring probes and current monitoring probes, and the current monitoring probes are distributed around the voltage monitoring probes; the compression stress device is sleeved on the common end of the sub-probe and is respectively abutted against the probe shell and the detection end of the sub-probe. According to the embodiment of the invention, the plurality of sub-probes distributed at intervals are designed, so that each sub-probe is ensured to have independent expansion and contraction amount. Each sub-probe can keep good contact with the uneven surface of the battery; contact resistance can be reduced as much as possible, and abnormal heating is avoided. Operation is simple and fast, contact resistance is small, and safety and reliability of the battery are guaranteed.

Description

Technical Field

[0001] The utility model relates to the technical field of electrical equipment testing, in particular to a testing tool for charging and discharging electrical equipment. Background Art

[0002] With the development of battery technology, the capacity and discharge rate of single cells are getting larger and larger, and the maximum operating current can reach hundreds or even thousands of amperes.

[0003] To meet the requirements of high-current testing, two common testing methods are currently used. One is to weld a busbar onto the battery and then connect it to the test equipment with screws. This method requires specialized welding equipment (typically high-power laser welding equipment), which damages the battery cell surface, is complex, and time-consuming. The other is to design specialized test fixtures. Currently used test fixtures and probes can cause poor contact between the battery and the fixture, increasing contact resistance, due to uneven battery terminal surfaces, inconsistent parallelism between the fixture's positive and negative contact surfaces, and battery tilt. High current charging and discharging generate significant heat, significantly increasing battery temperature and damaging the battery. Some fixtures incorporate numerous fixtures to ensure the relative parallelism between the fixture's positive and negative probe surfaces and the battery's positive and negative terminals. However, this complicates the fixture, takes time to install, and makes debugging difficult when switching between different battery models.

[0004] In summary, existing battery testing methods have technical problems such as complex operation, long time consumption, poor contact, and battery cell damage. Utility Model Content

[0005] The purpose of this application is to overcome the above-mentioned technical deficiencies and propose a test tool for charging and discharging electrical equipment to solve the technical problems of complex operation, long time consumption, poor contact and battery cell damage in the existing technology.

[0006] In order to achieve the above technical objectives, this application adopts the following technical solutions:

[0007] The present application provides a test fixture for charging and discharging electrical equipment, comprising a probe housing, multiple sub-probes, and multiple compression force-bearing devices:

[0008] A probe housing, wherein one end of the probe housing is open and the other end has a plurality of through holes;

[0009] a plurality of sub-probes, each having a detection end and a common end, the common end passing through the through hole, the detection end extending toward the open end of the probe housing, the plurality of sub-probes being spaced apart from each other and including a voltage monitoring probe and a current monitoring probe, the current monitoring probe being distributed around the voltage monitoring probe; and

[0010] A plurality of compression force-bearing devices are sleeved on the common end of the sub-probes and respectively abut against the probe housing and the detection end of the sub-probes.

[0011] In some embodiments of the present application, the common end and the detection end both have a cylindrical outline, and the common end and the detection end are coaxially arranged.

[0012] In some embodiments of the present application, the cross-sectional area of ​​the common end is smaller than the cross-sectional area of ​​the detection end, the inner diameter of the compression force device is equal to the diameter of the common end, and the outer diameter of the compression force device is equal to the diameter of the detection end.

[0013] In some embodiments of the present application, a surface of the detection end facing away from the common end is provided with a serration structure.

[0014] In some embodiments of the present application, the voltage monitoring probe is located at the center of the probe housing, and the multiple current monitoring probes are distributed around the voltage monitoring probe in layers.

[0015] In some embodiments of the present application, a test device is further included, which is connected to the common end of the voltage monitoring probe through a voltage connection line. The test device is differentiated into multiple sub-current lines through a current connection line, and each of the sub-current lines is connected to the common end of one of the current monitoring probes.

[0016] In some embodiments of the present application, the sub-probes correspond to the compressive force-bearing devices one by one, and each of the compressive force-bearing devices is sleeved on the periphery of one of the sub-probes.

[0017] In some embodiments of the present application, the compression force device includes a spring, a cylinder or a hydraulic device.

[0018] In some embodiments of the present application, the cross-section of a single sub-probe is square, circular, or elliptical.

[0019] In some embodiments of the present application, the overall projection shape of the plurality of sub-probes is square, rectangular or circular.

[0020] Compared with the existing technology, the technical solution provided by this application brings the following beneficial technical effects:

[0021] The embodiment of the present application designs multiple sub-probes distributed at intervals, and each sub-probe is connected to a compression force device to ensure that each sub-probe has a separate expansion and contraction amount. When the entire distributed probe contacts the surface of an electrical device (such as a battery), a certain pressure is applied. Regardless of whether it is a tilted battery or a battery with bumps on the surface, each sub-probe can maintain good contact with the uneven surface of the battery. Use as many sub-probes as possible to contact the battery to maintain the maximum contact area between the entire distributed probe and the battery; it can minimize contact resistance and avoid abnormal heating. This tooling is simple and quick to operate, has low contact resistance, and ensures battery safety and reliability. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in this application, the following briefly introduces the drawings required for use in the embodiments:

[0023] Figure 1 This is a schematic structural diagram of a test fixture for charging and discharging electrical equipment provided in an embodiment of the present application;

[0024] Figure 2 1 is a schematic cross-sectional view of a test fixture for charging and discharging electrical equipment provided in an embodiment of the present application;

[0025] Figure 3 This is a working diagram of a test fixture and electrical equipment provided in an embodiment of the present application;

[0026] Figure 4 This is a working diagram of another test tool and electrical equipment provided in an embodiment of the present application.

[0027] Reference numerals:

[0028] 1-probe housing, 11-through hole end, 12-open end, 2-sub-probe, 21-detection end, 22-common end, 3-compression force device, 4-electrical equipment. DETAILED DESCRIPTION

[0029] In order to make the purpose, technical solutions and advantages of this application more clearly understood, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0030] Those skilled in the art will understand that in this specification, the wording "including" is an open-ended expression, which means that the described features exist but does not exclude other features. The directional words "up", "down", "left", "right", etc. are exemplary directions based on the drawings. Features defined as "first" and "second" implicitly include one or more of the features. Singular expressions can also be used in the plural. "Multiple" means two or more. The terms "installed", "connected", and "connected" can be fixed connections, detachable connections, or integrated connections; they can be directly connected, or indirectly connected through an intermediate medium, or they can be internal connections between two elements. In addition, "connected" can include wireless connections.

[0031] The purpose of this application is to overcome the above technical deficiencies and propose a test tool for charging and discharging electrical equipment 4 to solve the technical problems of complex operation, long time consumption, poor contact and battery damage in the prior art.

[0032] In order to achieve the above technical objectives, this application adopts the following technical solutions:

[0033] This application provides a test tool for charging and discharging an electrical device 4, such as Figure 1 and Figure 2 As shown, Figure 1 1 is a schematic structural diagram of a test fixture for charging and discharging an electrical device 4 provided in an embodiment of the present application; Figure 2 4 is a cross-sectional schematic diagram of a test fixture for charging and discharging an electrical device 4 provided in an embodiment of the present application. Figure 2 yes Figure 1 Cross-section along the AA direction.

[0034] A test fixture for charging and discharging an electrical device 4, comprising a probe housing 1, a plurality of sub-probes 2, and a plurality of compression force-bearing devices 3:

[0035] A probe housing 1, wherein one end of the probe housing 1 is open and the other end has a plurality of through holes;

[0036] a plurality of sub-probes 2, each having a detection end 21 and a common end 22 at both ends thereof, the common end 22 passing through the through hole, the detection end 21 extending toward the open end 12 of the probe housing 1, the plurality of sub-probes 2 being spaced apart from each other and including a voltage monitoring probe and a current monitoring probe, the current monitoring probe being distributed around the voltage monitoring probe; and

[0037] A plurality of compression force-bearing devices 3 are sleeved on the common end 22 of the sub-probe 2 and respectively abut against the probe housing 1 and the detection end 21 of the sub-probe 2 .

[0038] like Figure 3 and Figure 4 As shown, Figure 3 This is a working diagram of a test fixture and electrical equipment 4 provided in an embodiment of the present application; Figure 4 This is a working diagram of another test tool and electrical equipment 4 provided in an embodiment of the present application.

[0039] The embodiment of the present application designs multiple sub-probes 2 that are distributed at intervals, and each sub-probe 2 is connected to a compression force device 3 to ensure that each sub-probe 2 has a separate amount of expansion and contraction. When the entire distributed probe contacts the surface of an electrical device 4 (such as a battery), a certain amount of pressure is applied. Regardless of whether it is a tilted battery or a battery with bumps on the surface, each sub-probe 2 can maintain good contact with the uneven surface of the battery. Use as many sub-probes 2 as possible to contact the battery to maintain the maximum contact area between the entire distributed probe and the battery; it can minimize contact resistance and avoid abnormal heating. This tooling is simple and quick to operate, has low contact resistance, and ensures battery safety and reliability.

[0040] Through a distributed structural design, multiple sub-probes 2 are combined into a single probe group, and multiple probe groups are then combined into a complete test fixture. The number of sub-probes 2 in each probe group is ≥ 4, with no upper limit.

[0041] In some embodiments of the present application, the common end 22 and the detection end 21 both have a cylindrical outline, and the common end 22 and the detection end 21 are coaxially arranged.

[0042] In some embodiments of the present application, the cross-sectional area of ​​the common end 22 is smaller than the cross-sectional area of ​​the detection end 21 , the inner diameter of the compression force device 3 is equal to the diameter of the common end 22 , and the outer diameter of the compression force device 3 is equal to the diameter of the detection end 21 .

[0043] In this embodiment, the compression force-bearing device 3 used is a spring, but is not limited to a spring and can be replaced by other compression force-bearing devices 3 such as a cylinder, a hydraulic device, etc.

[0044] Specifically, the detection end 21 of the sub-probe 2 contacts the electrical device 4, which exerts a certain pressure on the detection end 21. The sub-probe 2 moves toward the through-hole end 11 of the probe housing 1, compressing the compressive force-bearing device 3 until the force is balanced by the force in the compressive force-bearing device 3 moving toward the open end 12 of the probe housing 1. At this point, the sub-probe 2 is stationary and maintains close contact with the electrical device 4.

[0045] In some embodiments of the present application, a serrated structure is provided on the surface of the detection end 21 facing away from the common end 22 .

[0046] In this embodiment, the contact surface between each sub-probe 2 and the battery is designed with a plum blossom head (sawtooth), which further increases the contact surface between the sub-probe 2 and the battery and reduces the contact resistance.

[0047] In some embodiments of the present application, the voltage monitoring probe is located at the center of the probe housing 1 , and the multiple current monitoring probes are distributed layer by layer around the voltage monitoring probe.

[0048] In some embodiments of the present application, a test device is further included, which is connected to the common end 22 of the voltage monitoring probe through a voltage connection line. The test device is differentiated into multiple sub-current lines through a current connection line, and each sub-current line is connected to the common end 22 of one current monitoring probe.

[0049] In this embodiment, a single probe is split into multiple sub-probes 2 mainly through a distributed design of probes, and 25 sub-probes 2 are arranged in a 5×5 square for example;

[0050] Select a sub-probe 2 in the middle as the voltage monitoring probe, and connect its tail to a flexible wire to serve as the voltage monitoring line. Connect the tails of the remaining 24 probes to flexible wires and combine them together to serve as the current transmission line. Use as many sub-probes 2 as possible to maximize the contact area between the sub-probes 2 and the electrical device 4, minimizing contact resistance and preventing abnormal heating that could damage the battery.

[0051] The greater the number of sub-probes 2, the more conducive it is to eliminating poor contact caused by uneven contact surfaces, and reducing contact resistance and test temperature rise.

[0052] In some embodiments of the present application, the sub-probes 2 correspond to the compressive force-bearing devices 3 in a one-to-one manner, and each of the compressive force-bearing devices 3 is sleeved on the periphery of one of the sub-probes 2 .

[0053] In this embodiment, 25 sub-probes 2 are connected to the probe housing 1 via 25 springs, ensuring that each sub-probe 2 has a unique amount of expansion and contraction. Each sub-probe 2 has a separate compression force-bearing device 3, allowing for different compression levels. When the probes contact a concave or convex surface, the varying spring compression levels ensure good contact.

[0054] When the entire distributed probe contacts the battery surface, a certain pressure is applied. Regardless of whether the battery is tilted or has bumps on the surface, each sub-probe 2 can maintain good contact with the battery.

[0055] In some embodiments of the present application, the compression force device 3 includes a spring, a cylinder or a hydraulic device.

[0056] In some embodiments of the present application, the cross-section of a single sub-probe 2 is square, circular, or elliptical.

[0057] In some embodiments of the present application, the overall projection shape of the plurality of sub-probes 2 is square, rectangular or circular.

[0058] In this embodiment, the contact surface between each sub-probe 2 and the battery is square in order to maximize the contact surface. In actual use, it can be modified to other properties (such as circle, ellipse, etc.) as needed.

[0059] The overall layout is a close arrangement in the positive direction to increase the maximum contact area between the entire distributed probe and the battery. The arrangement of the sub-probes 2 is not limited to square, rectangular, or circular, and can be arranged in any shape as needed, but in order to ensure the contact area, a close arrangement is generally adopted.

[0060] The probes are standardized. Different charge and discharge current requirements can be met by simply increasing or decreasing the number of sub-probes. This eliminates the need to redesign new probes, reduces the number of parts, and optimizes production costs. The standard probe design allows for the number of probes to be increased based on current, while maintaining the same overall structure.

[0061] A probe in the middle serves as a voltage monitoring line and has a raised design to ensure contact with the battery, ensuring that the battery voltage can be monitored in real time.

[0062] This design is mainly used in high current or relatively large current testing occasions. Under high current conditions, the contact resistance becomes larger and can generate a lot of heat (heat power P=I2*R), so this design pays great attention to the contact resistance.

[0063] The distributed probe is not limited to cylindrical battery testing, and can also be used for other battery tests.

[0064] It is not limited to battery testing, but can also be used in other high current power consumption situations.

[0065] Compared with the existing technology, the technical solution provided by this application brings the following beneficial technical effects:

[0066] The embodiment of the present application designs multiple sub-probes 2 that are distributed at intervals, and each sub-probe 2 is connected to a compression force device 3 to ensure that each sub-probe 2 has a separate amount of expansion and contraction. When the entire distributed probe contacts the surface of an electrical device 4 (such as a battery), a certain amount of pressure is applied. Regardless of whether it is a tilted battery or a battery with bumps on the surface, each sub-probe 2 can maintain good contact with the uneven surface of the battery. Use as many sub-probes 2 as possible to contact the battery to maintain the maximum contact area between the entire distributed probe and the battery; it can minimize contact resistance and avoid abnormal heating. This tooling is simple and quick to operate, has low contact resistance, and ensures battery safety and reliability.

[0067] Those skilled in the art will understand that the various operations, methods, steps, measures, and schemes in the processes discussed in this application may be alternated, changed, rearranged, decomposed, combined, or deleted.

[0068] The specific implementation methods of the present application described above do not limit the scope of protection of the present application. Any other corresponding changes and modifications made based on the technical concept of the present application should be included in the scope of protection of the claims of the present application.

Claims

1. A test fixture for charging and discharging electrical equipment, characterized in that: include: A probe housing, wherein one end of the probe housing is open and the other end has a plurality of through holes; a plurality of sub-probes, each having a detection end and a common end at both ends, the common end passing through the through hole, the detection end extending toward the open end of the probe housing, the plurality of sub-probes being spaced apart from each other and including a voltage monitoring probe and a current monitoring probe, the current monitoring probe being distributed around the voltage monitoring probe; as well as A plurality of compression force-bearing devices are sleeved on the common end of the sub-probes and respectively abut against the probe housing and the detection end of the sub-probes.

2. A test fixture for charging and discharging electrical equipment according to claim 1, characterized in that: The common end and the detection end are both cylindrical in outline, and the common end and the detection end are coaxially arranged.

3. A test fixture for charging and discharging electrical equipment according to claim 2, characterized in that: The cross-sectional area of ​​the common end is smaller than that of the detection end. The inner diameter of the compression force device is equal to the diameter of the common end. The outer diameter of the compression force device is equal to the diameter of the detection end.

4. A test fixture for charging and discharging electrical equipment according to claim 1, characterized in that: A sawtooth structure is provided on the surface of the detection end facing away from the common end.

5. The test fixture for charging and discharging electrical equipment according to claim 1, characterized in that: The voltage monitoring probe is located at the center of the probe housing, and the multiple current monitoring probes are distributed layer by layer around the voltage monitoring probe.

6. A test fixture for charging and discharging electrical equipment according to claim 5, characterized in that: It also includes a testing device, which is connected to the common end of the voltage monitoring probe through a voltage connection line. The testing device is differentiated into multiple sub-current lines through a current connection line, and each sub-current line is connected to the common end of one current monitoring probe.

7. A test fixture for charging and discharging electrical equipment according to claim 1, characterized in that: The sub-probes correspond to the compression force-bearing devices one by one, and each compression force-bearing device is sleeved on the periphery of one of the sub-probes.

8. A test fixture for charging and discharging electrical equipment according to claim 7, characterized in that: The compression force device includes a spring, a cylinder or a hydraulic device.

9. The test fixture for charging and discharging electrical equipment according to claim 1, characterized in that: The cross-section of a single sub-probe is square, circular or elliptical.

10. The test fixture for charging and discharging electrical equipment according to claim 1, characterized in that: The overall projection shape of the plurality of sub-probes is square, rectangular or circular.

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