High-power laser chip testing device

Abstract

The utility model discloses a high-power laser chip testing device, which comprises a mounting plate for mounting a laser chip, a base, a sliding seat, a first integrating sphere, a second integrating sphere, a mounting seat, a PBS (Phosphate Buffer Solution) polarizing prism, a light spot projection screen and an industrial camera, the first integrating sphere, the second integrating sphere, the light spot projection screen and the industrial camera are respectively installed on the sliding seat, the PBS polarizing prism is installed on the first integrating sphere or the second integrating sphere through the installation seat, and the light spot projection screen and the industrial camera are aligned left and right. According to the utility model, the precise sampling test of the P polarized light and the S polarized light of the laser chip can be synchronously executed, the high-definition shooting and detailed test analysis of the light spot can be carried out in real time, and the test efficiency and accuracy can be obviously improved.

Description

Technical Field

[0001] The utility model relates to laser testing technology, in particular to a high-power laser chip testing device. Background Art

[0002] With the rapid development of lasers, semiconductor laser devices have found widespread application in a variety of fields, including industrial processing, optical imaging, and medical diagnostics. To meet the demand for laser power, laser chip testing equipment is often required to measure various parameters of semiconductor laser chips to ensure their reliability. However, existing laser chip testing equipment suffers from low accuracy and efficiency when testing semiconductor laser chips, adversely affecting production yield.

[0003] Therefore, it is necessary to design a new high-power laser chip testing device to solve the above technical problems. Utility Model Content

[0004] The purpose of the utility model is to provide a high-power laser chip testing device with improved testing efficiency and accuracy.

[0005] To achieve the aforementioned objectives, the present invention adopts the following technical solution: a high-power laser chip testing device, comprising a mounting plate for mounting a laser chip, a base, a sliding base, a first integrating sphere, a second integrating sphere, a mounting base, a PBS polarizing prism, a light spot projection screen and an industrial camera, wherein the sliding base is slidably arranged on the base, the first integrating sphere, the second integrating sphere, the light spot projection screen and the industrial camera are respectively mounted on the sliding base, the PBS polarizing prism is mounted on the first integrating sphere or the second integrating sphere through the mounting base, the first integrating sphere is provided with a first entrance that can be aligned left and right with the PBS polarizing prism, the second integrating sphere is provided with a second entrance that can be aligned front and back with the PBS polarizing prism, the light spot projection screen and the industrial camera are aligned left and right, and the sliding base can drive the light spot projection screen to move to be aligned left and right with the laser chip, so that the industrial camera can capture the light spot in real time.

[0006] A further improvement further includes a driving member for driving the sliding seat to move forward and backward, and the driving member is installed on the base.

[0007] As a further improvement, the driving member is a motor, and the motor is threadedly coupled to the sliding seat through a screw.

[0008] As a further improvement, the mounting plate is provided with a groove for placing the laser chip.

[0009] A further improvement also includes a semiconductor refrigeration plate stacked with the mounting plate.

[0010] A further improvement further includes a water-cooling plate stacked with the semiconductor refrigeration plate, wherein the semiconductor refrigeration plate is clamped between the mounting plate and the water-cooling plate.

[0011] This new high-power laser chip testing device integrates multiple functions, can simultaneously perform precise sampling tests of P-polarized light and S-polarized light of the laser chip, and can perform high-definition photography of the light spot and detailed test analysis in real time, significantly improving test efficiency and accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 This is a three-dimensional diagram of the high-power laser chip testing device of the utility model.

[0013] Figure 2 This is a three-dimensional exploded view of the high-power laser chip testing device of the utility model.

[0014] Figure 3 This is a three-dimensional exploded view of the high-power laser chip testing device of the utility model. DETAILED DESCRIPTION

[0015] See also Figures 1 to 3 As shown, an embodiment of the present invention discloses a high-power laser chip testing device 100, which includes a mounting plate 11, a semiconductor refrigeration plate 12, a water-cooled plate 13, a base 20, a sliding seat 30, a first integrating sphere 41, a second integrating sphere 42, a mounting seat 50, a PBS polarizing prism 60, a spot projection screen 70, a driving component 80 and an industrial camera 90.

[0016] Mounting plate 11 has a groove for placing and positioning laser chip 10. Mounting plate 11 is placed on semiconductor cooling plate 12, which in turn is placed on water-cooled plate 13. That is, semiconductor cooling plate 12 is clamped between mounting plate 11 and water-cooled plate 13. Heat from laser chip 10 is transferred to semiconductor cooling plate 12 through mounting plate 11. This heat is then further transferred to water-cooled plate 13 below, achieving efficient heat transfer and dissipation.

[0017] The sliding base 30 is mounted on the base 20 for forward and backward sliding movement. A first integrating sphere 41, a second integrating sphere 42, a spot projection screen 70, and an industrial camera 80 are mounted on the sliding base 30 and can follow the forward and backward movement of the sliding base 30. The first integrating sphere 41 has a first inlet 410, and the second integrating sphere 42 has a second inlet 420. The openings of the first and second inlets 410 and 420 are perpendicular to each other, with the first inlet 410 facing the laser chip 10. Laser detection modules are mounted on the first and second integrating spheres 41 and 42 for sampling and testing the power and / or spectrum of the diffusely reflected light beam.

[0018] The mounting base 50 is mounted on the first integrating sphere 41. The PBS polarizing prism 60 is mounted on the mounting base 50 and aligned horizontally with the laser chip 10. The first inlet 410 is aligned horizontally with the polarizing prism 60, and the second inlet 420 is aligned front-to-back with the PBS polarizing prism 60. The PBS prism 60 is composed of a pair of high-precision right-angle prisms glued together. In other embodiments, the mounting base 50 is mounted on the first integrating sphere 41.

[0019] During the operation of the high-power laser chip testing device 100, the unpolarized light from the laser chip 10 is incident on the PBS prism 60 and is decomposed into two perpendicular linearly polarized light beams: P-polarized light and S-polarized light. The P-polarized light is directly introduced into the first integrating sphere 41 through the first inlet 410 through the PBS prism 60 for sampling and testing; while the S-polarized light is reflected out at an angle of 45 degrees, and the exit path forms a 90-degree angle with the P-polarized light, and then enters the second integrating sphere 42 through the second inlet 420 for sampling and testing, ultimately achieving accurate and efficient optical path processing.

[0020] The light spot projection screen 70 is located on one side of the first integrating sphere 41 and is aligned with the industrial camera 90. When the light spot projection screen 70 is moved to be aligned with the laser chip 10, the laser from the laser chip 10 is projected onto the light spot projection screen 70, forming a clear light spot. At this time, the industrial camera 90 instantly captures the light spot and performs detailed photography and test analysis on the performance and characteristics of the tested laser.

[0021] The driving member 80 is configured as a motor and is mounted on the base 20. The motor is threadedly coupled to the sliding seat 30 via a screw 82. When the motor drives the screw 82 to rotate clockwise or counterclockwise, the spiral motion of the screw 82 guides the sliding seat 30 to move back and forth, thereby ensuring that the laser chip 10 is aligned left and right with the PBS polarizing prism 60 and the spot projection screen 70 in sequence, completing the precise adjustment and positioning of the optical path.

[0022] In summary, the high-power laser chip testing device of the present invention integrates multiple functions, can simultaneously perform precise sampling tests of P-polarized light and S-polarized light of the laser chip 10, and perform high-definition photography of the light spot and detailed test analysis in real time, significantly improving test efficiency and accuracy.

[0023] Although the preferred embodiments of the present invention have been disclosed for illustrative purposes, those skilled in the art will appreciate that various modifications, additions and substitutions are possible, without departing from the scope and spirit of the invention as disclosed in the accompanying claims.

Claims

1. A high-power laser chip testing device, characterized by: The invention comprises a mounting plate for mounting a laser chip, a base, a sliding base, a first integrating sphere, a second integrating sphere, a mounting base, a PBS polarizing prism, a light spot projection screen and an industrial camera. The sliding base is arranged on the base for sliding back and forth. The first integrating sphere, the second integrating sphere, the light spot projection screen and the industrial camera are respectively mounted on the sliding base. The PBS polarizing prism is mounted on the first integrating sphere or the second integrating sphere through the mounting base. The first integrating sphere is provided with a first entrance that can be aligned left and right with the PBS polarizing prism. The second integrating sphere is provided with a second entrance that can be aligned front and back with the PBS polarizing prism. The light spot projection screen and the industrial camera are aligned left and right. The sliding base can drive the light spot projection screen to move to be aligned left and right with the laser chip, so that the industrial camera can capture the light spot in real time.

2. The high-power laser chip testing device according to claim 1, characterized in that: It also includes a driving member for driving the sliding seat to move forward and backward, and the driving member is installed on the base.

3. The high-power laser chip testing device according to claim 2, characterized in that: The driving member is a motor, and the motor is threadedly coupled to the sliding seat through a screw.

4. The high-power laser chip testing device according to claim 1, characterized in that: The mounting plate is provided with a groove for placing the laser chip.

5. The high-power laser chip testing device according to claim 1, characterized in that: It also includes a semiconductor refrigeration plate stacked with the mounting plate.

6. The high-power laser chip testing device according to claim 5, characterized in that: It also includes a water-cooling plate stacked with the semiconductor refrigeration plate, and the semiconductor refrigeration plate is clamped between the mounting plate and the water-cooling plate.

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