Parameter tester for packaging transistor

Abstract

The utility model belongs to the technical field of packaged transistor processing, and particularly relates to a parameter tester for packaged transistors, which comprises a tester body, the top of the tester body is in threaded connection with a side plate through a first bolt, the bottom of the side plate abuts against the top of the tester body, the side wall of the longitudinal end of the side plate is connected with a sealing strip, and the bottom of the sealing strip abuts against a bottom plate. The top of the bottom plate is connected with a sliding block in a sliding mode, the top of the sliding block is connected with a protective cover, the opening end of the protective cover abuts against the side plate and is connected with a sealing strip in a sleeved mode, the top of the protective cover is connected with a protruding block, and the top of the protruding block is connected to a limiting lug on the top of the side plate in a clamped mode. And the position of the protective cover on the bottom plate can be moved, so that the side view socket on the tester body can be conveniently protected when the tester body is idle, and dust and impurities in the environment are prevented from entering the socket to influence subsequent use.

Description

Technical Field

[0001] The utility model belongs to the technical field of packaged transistor processing, and in particular relates to a parameter tester for packaged transistors. Background Art

[0002] Packaged transistors, such as bipolar junction transistors (BJTs) and field-effect transistors (FETs), are essential components of electronic devices. Their performance directly impacts the overall performance and reliability of electronic devices. Therefore, using a parametric tester to accurately test packaged transistors is crucial. During the transistor production process, the transistor is inserted into the test socket of the parametric tester for testing, and the results are displayed for easy reading by the user. However, this device has the following drawbacks: Existing parametric tester test sockets are directly exposed to the environment. After testing, impurities such as dust and particles can easily enter the test socket, affecting subsequent testing and reducing the tester's service life. Utility Model Content

[0003] The purpose of the present utility model is to provide a parameter tester for packaged transistors, aiming to solve the problem in the prior art that when the above-mentioned equipment is in use, the detection socket of the existing parameter detector is directly exposed to the environment. After the test is completed, impurities such as dust and particles in the environment are easily sucked into the detection socket, thereby affecting subsequent tests and reducing the service life of the detector.

[0004] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: A parameter tester for packaged transistors, comprising: a tester body, the top of the tester body is threadedly connected to the side panel using a first bolt, the bottom of the side panel abuts against the top of the tester body, the longitudinal end side wall of the side panel is connected to a sealing strip, the bottom of the sealing strip abuts against the bottom plate, the top of the bottom plate is slidably connected to a slider, the top of the slider is connected to a protective cover, the open end of the protective cover abuts against the side panel and is sleeved with the sealing strip, the top of the protective cover is connected to a protrusion, and the top of the protrusion is snap-connected to the limiting ear at the top of the side panel.

[0005] In order to utilize the sealing strip to be sleeved on the open end of the protective cover and thus fill the gap at the intersection of the protective cover and the side plate, as a preferred parameter tester for a packaged transistor of the present invention, the sealing strip is made of elastic material and its shape and size are consistent with the open end of the protective cover.

[0006] In order to facilitate the movement of the slider in the sliding groove provided on the bottom plate, as a preferred parameter tester for packaged transistors of the present invention, a "T"-shaped sliding groove is provided on the top of the bottom plate, and its shape and size are consistent with the slider.

[0007] In order to place the transistor to be tested using a placement plate connected to a support rod with adjustable height, a parameter tester for packaged transistors is preferably used in the present invention. The top of the tester body is connected to the base, the top of the base is threadedly connected to the support rod, the top of the support rod is sleeved with the placement plate, the rear end of the placement plate is threadedly connected to the second bolt at the intersection with the support rod, an installation groove is opened on the top of the placement plate, and the top of the installation groove is threadedly connected to the limit frame.

[0008] In order to use the second bolt to fix the thread groove at the corresponding position to fix the position of the placement plate on the support rod, as a preferred parameter tester for packaged transistors of the utility model, a row of thread grooves are evenly spaced at the longitudinal end of the support rod, and the shape and size of the thread grooves are consistent with the second bolt.

[0009] In order to facilitate the transistor to be fixed on the limit frame by using the through groove opened on the surface of the placement plate so that it can be inserted into the detection socket below, as a preferred parameter tester for packaged transistors in the present invention, the side wall of the placement plate is provided with a rectangular through groove whose shape and size are consistent with the detection port on the surface of the tester body, and the limit frame is two semi-annular structures set opposite to each other.

[0010] Compared with the prior art, the beneficial effects of the present invention are:

[0011] By cooperating with the sealing strip connected to the side panel installed on the top of the tester body and the bottom plate abutting the bottom, the position of the protective cover on the bottom plate can be moved, so as to conveniently protect the side view socket on the tester body when it is idle, and prevent dust and impurities in the environment from entering the socket and affecting subsequent use;

[0012] The placement plate installed on the support rod on one side of the test socket of the tester body is used to fix the position of the transistor to be tested, avoiding test errors caused by displacement after the transistor is inserted into the test socket. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0014] Figure 1 This is a schematic diagram of the main structure of the utility model;

[0015] Figure 2 This is a schematic diagram of the main cross-sectional structure of the utility model;

[0016] Figure 3 This is a side structural diagram of the present utility model;

[0017] Figure 4This is a schematic diagram of the enlarged structure of the protective cover of the utility model;

[0018] Figure 5 This is a schematic diagram of the enlarged structure of the side panel and sealing strip of the utility model.

[0019] In the figure: 1. Tester body; 2. First bolt; 3. Side panel; 4. Sealing strip; 5. Bottom plate; 6. Slider; 7. Protective cover; 8. Bump; 9. Base; 10. Support rod; 11. Placement plate; 12. Second bolt; 13. Mounting slot; 14. Limiting frame. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0021] See also Figure 1-5 The utility model provides the following technical solutions: a parameter tester for packaged transistors, comprising: a tester body 1, the model of the tester body 1 is: transistor tester LCR-T7 T4 TC1.

[0022] The top of the tester body 1 is threadedly connected to the side panel 3 by means of the first bolt 2, the bottom of the side panel 3 abuts against the top of the tester body 1, the longitudinal end side wall of the side panel 3 is connected to the sealing strip 4, the bottom of the sealing strip 4 abuts against the bottom plate 5, the top of the bottom plate 5 is slidably connected to the slider 6, the top of the slider 6 is connected to the protective cover 7, the open end of the protective cover 7 abuts against the side panel 3 and is sleeved with the sealing strip 4, the top of the protective cover 7 is connected to the protrusion 8, and the top of the protrusion 8 is snap-fitted and connected to the limiting ear at the top of the side panel 3.

[0023] Preferably, the sealing strip 4 is made of elastic material and its shape and size are consistent with the opening end of the protective cover 7.

[0024] During specific use, the sealing strip 4 connected to one side of the side panel 3 is sleeved on the open end of the protective cover 7 , thereby filling the gap at the intersection of the side panel 3 and the protective cover 7 .

[0025] Preferably, a T-shaped sliding groove is provided on the top of the bottom plate 5 , and its shape and size are consistent with those of the sliding block 6 .

[0026] During specific use, the sliding groove provided on the top of the bottom plate 5 is used to limit the moving position of the slider 6 , thereby preventing the protective cover 7 from slipping off the bottom plate 5 .

[0027] Preferably: the top of the tester body 1 is connected to the base 9, the top of the base 9 is threadedly connected to the support rod 10, the top of the support rod 10 is sleeved with the placement plate 11, the second bolt 12 is threadedly connected at the intersection of the rear end of the placement plate 11 and the support rod 10, and a mounting groove 13 is opened at the top of the placement plate 11, and the top of the mounting groove 13 is threadedly connected to the limit frame 14.

[0028] During specific use, the limiting frame 14 is fixed to the mounting slot 13 at the corresponding position, and then a transistor is inserted through the placement plate 11 into the detection socket at the bottom for detection.

[0029] Preferably, a row of thread grooves are provided at equal intervals on the longitudinal end of the support rod 10 , and the shape and size of the thread grooves are consistent with those of the second bolts 12 .

[0030] During specific use, the second bolt 12 fixed between the support rod 10 and the placement plate 11 can be unscrewed according to the length of the transistor to be detected, and then the placement plate 11 can be used to slide up and down on the support rod 10 to an appropriate height, and then the second bolt 12 can be used to pass through the placement plate 11 and fixed in the threaded groove at the corresponding position at the rear end of the support rod 10.

[0031] Preferably, a rectangular through groove is provided on the side wall of the placement plate 11 , and its shape and size are consistent with the detection port on the surface of the tester body 1 , and the limiting frame 14 is two semi-annular structures set opposite to each other.

[0032] During specific use, after the limit frame 14 is rotated out of the fixed installation groove 13, the limit frame 14 is fixed in the installation groove 13 at the corresponding position on the top of the placement plate 11 according to the detection needs, so that the transistor to be tested can be placed downward on the limit frame 14.

[0033] Working principle: When processing the packaged transistor, first pull the handle on one side of the protective cover 7 and drag it outward, so that the slider 6 connected to the bottom slides on the bottom plate 5, and the protrusion 8 connected to the top is disengaged from the limit ear on the top of the fixed side plate 3, and then the test socket of the tester body 1 that is blocked and protected below is exposed. First, unscrew the limit frame 14 from the fixed installation groove 13, and then fix the limit frame 14 in the installation groove 13 at the corresponding position on the top of the placement plate 11 according to the detection needs, so that the transistor to be tested can be placed downward on the limit frame 14. Then, the detection end at the bottom can be downwardly passed through the through slot opened on the surface of the placement plate 11 and inserted into the corresponding test socket at the bottom, and then the transistor can be inserted into the test socket of the tester body 1 to detect its parameters. At the same time, the second bolt 12 fixed between the support rod 10 and the placement plate 11 can be unscrewed according to the length of the transistor being tested, and then the placement plate 11 can be used to slide up and down on the support rod 10 to an appropriate height, and then the second bolt 12 can be used to pass through the placement plate 11 and fixed in the threaded groove at the corresponding position of the rear end of the support rod 10, thereby fixing the connection between the two.

[0034] Finally, it should be noted that the above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art will be able to modify the technical solutions described in the aforementioned embodiments or replace some of the technical features therein with equivalents. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.

Claims

1. A parameter tester for a packaged transistor, comprising: The tester body (1) is characterized in that: the top of the tester body (1) is threadedly connected to the side plate (3) by a first bolt (2), the bottom of the side plate (3) abuts against the top of the tester body (1), the longitudinal end side wall of the side plate (3) is connected to the sealing strip (4), the bottom of the sealing strip (4) abuts against the bottom plate (5), the top of the bottom plate (5) is slidably connected to the slider (6), the top of the slider (6) is connected to the protective cover (7), the open end of the protective cover (7) abuts against the side plate (3) and is sleeved with the sealing strip (4), the top of the protective cover (7) is connected to the protrusion (8), and the top of the protrusion (8) is snap-fitted and connected to the limiting ear at the top of the side plate (3).

2. A parameter tester for packaged transistors according to claim 1, characterized in that: The sealing strip (4) is made of elastic material and has a shape and size that matches the opening end of the protective cover (7).

3. The parameter tester for packaged transistors according to claim 1, wherein: The top of the bottom plate (5) is provided with a "T"-shaped sliding groove, the shape and size of which are consistent with the sliding block (6).

4. The parameter tester for packaged transistors according to claim 1, wherein: The top of the tester body (1) is connected to the base (9), the top of the base (9) is threadedly connected to the support rod (10), the top of the support rod (10) is sleeved with the placement plate (11), the rear end of the placement plate (11) is threadedly connected to the second bolt (12) at the intersection with the support rod (10), the top of the placement plate (11) is provided with a mounting groove (13), and the top of the mounting groove (13) is threadedly connected to the limit frame (14).

5. The parameter tester for packaged transistors according to claim 4, characterized in that: A row of thread grooves are provided at equal intervals on the longitudinal end of the support rod (10), and the shape and size of the thread grooves are consistent with those of the second bolts (12).

6. The parameter tester for packaged transistors according to claim 4, characterized in that: The side wall of the placement plate (11) is provided with a rectangular through slot, the shape and size of which are consistent with the surface detection port of the tester body (1), and the limiting frame (14) is two semi-annular structures set opposite to each other.

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