High-precision voltage sampling layout structure capable of being trimmed
By setting a point at the center of the sampling source and adopting a top aluminum routing design, the problem of data deviation in the sampling layout on large-area source devices is solved, high-precision sampling and instant adjustment are achieved, and R&D costs are reduced.
Patent Information
- Application Number
- CN202421659012.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-15
- Publication Date
- 2025-09-09
- Estimated Expiration
- 2034-07-15
AI Technical Summary
Existing sampling layouts have deviations when collecting data on large-area source devices and cannot be adjusted instantly in actual working environments, resulting in insufficient accuracy and increased R&D costs.
The sampling point is set at the center of the sampling source, top aluminum routing is used, and short floating connections are made on the signal line to achieve instant adjustment, improve sampling accuracy, and reduce line resistance and parasitic capacitance.
High-precision sampling is achieved without increasing the area, and adjustments can be made immediately, saving R&D costs.
Smart Images
Figure CN223322360U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of electrical components, in particular to an adjustable high-precision voltage sampling layout structure. Background Art
[0002] Many chip protection circuits (such as overtemperature protection, overcurrent protection, overvoltage protection, and undervoltage lockout) operate by inputting a sampled signal and a reference signal simultaneously into a comparator and comparing the results to determine whether to activate protection. Sampling accuracy is a critical parameter, determining both the stability of the static bias and the stability of the reference bias.
[0003] Common sampling layout: 1. Sampling device structure: consistent with the source device structure, such as Figure 1 As shown, the sampling device B has the same structure as the source device A; 2. The sampling device is placed close to the source device, such as Figure 2 As shown in the figure, the sampling device B is located at the edge of the source device A. For easy routing, it is usually located at the edge of the source device. Figure 1 , Figure 2 In the figure, A is the source device and B is the sampling device.
[0004] There are two deficiencies in common sampling layouts:
[0005] 1. Common sampling layouts usually place the sampling point on one side of the sampling source (such as Figure 1 ), or simply being close to the sampling source (e.g. Figure 2 ). For source devices with larger areas, the collected data in this way will be biased.
[0006] 2. Sampling deviations caused by process batches and circuit design in actual working environments cannot be immediately corrected. Redesign or tape-out will increase R&D costs and extend the design cycle.
[0007] Therefore, a sampling layout that can improve accuracy and can be adjusted on the fly is needed. Summary of the Invention
[0008] This utility model addresses the issues of sampling layout accuracy and adjustment by providing an adjustable, high-precision voltage sampling layout structure. The sampling point is located at the center of the sampling source, minimizing sampled data deviation and maximizing accuracy. The sampling signal is routed using aluminum tops, reducing both line resistance and parasitic capacitance, while facilitating later FIB processing. On the signal line, short lines are connected floating up and down around the center of the sampling source. The sampling point can be adjusted, allowing sampling at the center of the sampling source and post-tapeout adjustment for immediate viewing of the modified results. This utility model improves sampling accuracy while enabling adjustment without increasing area, saving R&D costs.
[0009] The utility model provides an adjustable high-precision voltage sampling layout structure, comprising a sampling source, a sampling point C connected to the center of the sampling source, a sampling point B and a sampling point A connected in sequence to the upper part of the sampling point C, and a sampling point D and a sampling point E connected in sequence to the lower part of the sampling point C;
[0010] Sampling points A, B, D and E are all short-circuited with the sampling source;
[0011] The sampling source, sampling point A, sampling point B, sampling point C, sampling point D, and sampling point E are all located on the same metal layer.
[0012] In the adjustable high-precision voltage sampling layout structure described in the present invention, as a preferred embodiment, sampling points A and B, sampling points B and C, sampling points C and D, and sampling points D and E are all connected by signal lines on one side.
[0013] In the adjustable high-precision voltage sampling layout structure described in the present invention, as a preferred embodiment, the intervals between sampling points A and B, between sampling points B and C, between sampling points C and D, and between sampling points D and E are all the same.
[0014] The adjustable high-precision voltage sampling layout structure described in the present invention is preferably configured such that the length of the intervals is 13 μm.
[0015] In the adjustable high-precision voltage sampling layout structure described in the present invention, as a preferred embodiment, the sampling source, sampling point A, sampling point B, sampling point C, sampling point D and sampling point E are all located in the fourth metal layer.
[0016] In the adjustable high-precision voltage sampling layout structure described in the present invention, as a preferred embodiment, sampling point A, sampling point B, sampling point D and sampling point E are all aluminum wires.
[0017] The adjustable high-precision voltage sampling layout structure described in the present invention is preferably configured to bypass or slot the signal lines in the metal layer below the metal layer where sampling points A, B, D, and E are located.
[0018] In the adjustable high-precision voltage sampling layout structure described in the present invention, as a preferred embodiment, the sampling signal is led out from the end of the sampling source and connected to the sampling circuit.
[0019] The utility model discloses an adjustable high-precision voltage sampling layout structure. As a preferred embodiment, the sampling signal is led out from the same metal layer as the sampling source or is led out through a line to another aluminum layer.
[0020] This utility model designs a high-precision sampling layout that can be adjusted. The operation steps are as follows:
[0021] 1. Set the sampling point at the center of the sampling source. This will minimize the deviation of the sampling data and maximize the accuracy.
[0022] 2. The sampling signal is routed with top aluminum, which can reduce both line resistance and parasitic capacitance, and facilitate FIB processing later.
[0023] 3. On the signal line, connect short wires floating above and below the center of the sampling source.
[0024] 4. Sampling point adjustment operation.
[0025] This design allows sampling at the center of the sampling source, and the sampling point position can be adjusted after tape-out, and the modified results can be seen immediately.
[0026] The utility model has the following advantages:
[0027] The utility model not only improves the sampling accuracy, but also achieves adjustment without increasing the area, thus saving R&D costs. BRIEF DESCRIPTION OF THE DRAWINGS
[0028] Figure 1 Schematic diagram showing that the sampling device B and the source device A have the same structure in the prior art;
[0029] Figure 2 Schematic diagram of a sampling device B located at the edge of a source device A in the prior art;
[0030] Figure 3 A schematic diagram of an adjustable high-precision voltage sampling layout structure;
[0031] Figure 4 A first enlarged view of a high-precision voltage sampling layout structure that can be adjusted;
[0032] Figure 5 A second enlarged view of an adjustable high-precision voltage sampling layout structure.
[0033] Reference numerals:
[0034] 1. Sampling source; 2. Sampling point C; 3. Sampling point B; 4. Sampling point A; 5. Sampling point D; 6. Sampling point E. DETAILED DESCRIPTION
[0035] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.
[0036] Example 1
[0037] like Figures 3-5 As shown in FIG. 1 , a high-precision voltage sampling layout structure that can be adjusted is described using a 4-layer aluminum wire process as an example.
[0038] 1. In this example, the sampling signal and sampling source 1 are on the same metal layer Metal4, and the sampling signal is from sampling source 1 (i.e. Figure 3 The left side of the trapezoid Metal4) is led out.
[0039] 2.Reference Figure 3 , set the sampling point at the center of sampling source 1 (i.e. Figure 3 The temperature, current, voltage and other parameters at this sampling point have the smallest deviation from the corresponding parameters of the sampling source and the highest accuracy.
[0040] 3. Use the minimum Metal 4 width (2µm) specified in the design rules for routing the sampling signal lines. This reduces both line resistance and parasitic capacitance, while also facilitating later FIB processing. For the trimming aluminum lines (Metal n), it is recommended to route or slot the aluminum lines (Metal n-1) in the following layers to avoid interrupting the connection during FIB processing and affecting the original chip routing.
[0041] 4.Reference Figure 4 、 5 On the signal line, the adjustable sampling points A, B, D, and E (the number of reference points can be increased or decreased according to actual conditions) (4, 3, 5, and 6) are set up and down with the sampling source center point C 2 as the reference, and are short-connected to the sampling source respectively. The length of each section (AB, BC, CD, and DE) is about 13 μm.
[0042] 5. Sampling point adjustment. By default, the sampling point is at point A4. If the verification results after tape-out deviate, you can use the FIB to disconnect the signal line between AB to change the sampling point to point B3; disconnect the signal line between BC to change the sampling point to point C1; disconnect the signal line between CD to change the sampling point to point D5; and disconnect the signal line between DE to change the sampling point to point E6.
[0043] The sampling signal from Figure 3 、 4 Lead out from point II and connect to the sampling circuit according to normal routing (you can continue to use Metal4 routing, or jump to other layer aluminum wires Metal3 / Metal2 / Metal1).
[0044] This design is suitable for adjusting the sampling point during the first tape-out of NTO, which can save costs for modification and facilitate mass production.
[0045] The above is only a preferred specific implementation method of the present invention, but the protection scope of the present invention is not limited to this. Any technician familiar with the technical field within the technical scope disclosed by the present invention can make equivalent replacements or changes based on the technical solution and utility model concept of the present invention, which should be covered by the protection scope of the present invention.
Claims
1. A high-precision voltage sampling layout structure that can be adjusted, characterized by: The invention comprises a sampling source (1), a sampling point C (2) connected to the center of the sampling source (1), a sampling point B (3) and a sampling point A (4) connected in sequence to the upper part of the sampling point C (2), and a sampling point D (5) and a sampling point E (6) connected in sequence to the lower part of the sampling point C (2); The sampling point A (4), the sampling point B (3), the sampling point D (5) and the sampling point E (6) are all short-circuited with the sampling source (1); The sampling source (1), the sampling point A (4), the sampling point B (3), the sampling point C (2), the sampling point D (5) and the sampling point E (6) are all located on the same metal layer.
2. The adjustable high-precision voltage sampling layout structure according to claim 1, characterized in that: The sampling point A (4) and the sampling point B (3), the sampling point B (3) and the sampling point C (2), the sampling point C (2) and the sampling point D (5), and the sampling point D (5) and the sampling point E (6) are all connected by a signal line on one side.
3. The adjustable high-precision voltage sampling layout structure according to claim 2, characterized in that: The intervals between the sampling point A (4) and the sampling point B (3), between the sampling point B (3) and the sampling point C (2), between the sampling point C (2) and the sampling point D (5), and between the sampling point D (5) and the sampling point E (6) are all the same.
4. The adjustable high-precision voltage sampling layout structure according to claim 3, characterized in that: The length of the spaces was 13 μm.
5. The adjustable high-precision voltage sampling layout structure according to claim 1, characterized in that: The sampling source (1), the sampling point A (4), the sampling point B (3), the sampling point C (2), the sampling point D (5) and the sampling point E (6) are all located in the fourth metal layer.
6. The adjustable high-precision voltage sampling layout structure according to claim 1, characterized in that: The sampling point A (4), the sampling point B (3), the sampling point D (5) and the sampling point E (6) are all aluminum wires.
7. The adjustable high-precision voltage sampling layout structure according to claim 1, characterized in that: The signal lines of the metal layer below the metal layer where the sampling point A (4), the sampling point B (3), the sampling point D (5) and the sampling point E (6) are located are bypassed or grooved.
8. The adjustable high-precision voltage sampling layout structure according to claim 1, characterized in that: The sampling signal is drawn out from the end of the sampling source (1) and connected to the sampling circuit.
9. The adjustable high-precision voltage sampling layout structure according to claim 8, characterized in that: The sampling signal is led out from the same metal layer as the sampling source (1) or is led out through a line to another aluminum layer.