Integrated circuit board testing device

Abstract

The utility model provides an integrated circuit board testing device. The integrated circuit board testing device comprises a lower seat assembly, an upper seat assembly and a switching long probe. The lower seat assembly comprises a lower bracket, a first short probe penetrating through the lower bracket and a test circuit board arranged below the lower bracket, and the upper seat assembly comprises an upper seat, a second short probe penetrating through the upper seat and a switching circuit board arranged above the upper seat. The switching long probe is arranged on one of the upper seat and the lower bracket in a penetrating manner. The lower seat assembly and the upper seat assembly are matched to clamp a circuit board to be tested, the first short probe is coupled and conducted with a first golden finger of the circuit board to be tested and the test circuit board, the second short probe is coupled and conducted with a second golden finger of the circuit board to be tested and the switching circuit board, and the switching long probe is coupled and conducted with the switching circuit board and the test circuit board. Thus, the test circuit board and the switching circuit board are electrically coupled through the switching long probe, the connection mode of the test circuit board and the switching circuit board is simpler, separation is easy, and an integrated circuit board with double-sided golden fingers can be efficiently tested.

Description

Technical Field

[0001] The utility model relates to the field of testing devices, in particular to an integrated circuit board testing device. Background Art

[0002] Integrated circuit boards are an indispensable component of any electrical appliance or 3C product today. In order to test whether the integrated circuit board has errors or defects, it is generally necessary to conduct tests such as Figure 1 The figure shows a typical test connection for a single-sided circuit board. A circuit board (DUT) 10 is inserted into a socket connector on a test circuit board 20, electrically coupling the IC's gold fingers to the socket connector. This method requires plugging and unplugging, hindering automated testing and resulting in lower test efficiency. The socket connector on the test circuit board 20 is also susceptible to damage, resulting in a shorter service life.

[0003] The current test method used for the circuit board 10 to be tested with double-sided gold fingers is to test the circuits on both sides separately, which will result in an incomplete intermediate test of the entire circuit and increase the test operation steps. Figure 2 In the test connection shown, the circuit board under test 10 is sandwiched between a test circuit board 20 and an adapter circuit board 40, so that the gold fingers on both sides of the integrated circuit board under test are electrically coupled to the test circuit board 20 and the adapter circuit board 40, respectively. The test circuit board 20 and the adapter circuit board 40 are then electrically coupled via a cable L (flexible cable or flexible circuit board). However, frequent placement and removal of the circuit board under test 10 requires frequent placement and removal of the adapter circuit board 40. During this process, the flexible cable and flexible circuit board also need to be moved back and forth, shortening the service life of the cables and the entire test fixture. Furthermore, the length of the flexible cable and flexible circuit board can result in excessive coupling impedance, affecting test accuracy. Utility Model Content

[0004] The embodiment of the utility model provides an integrated circuit board testing device, which can realize efficient testing of the integrated circuit board and extend the service life of the testing device.

[0005] An embodiment of the present invention provides an integrated circuit board testing device, wherein the lower surface and the upper surface of the circuit board to be tested are respectively provided with a plurality of first gold fingers and a plurality of second gold fingers; the testing device comprises:

[0006] The lower seat assembly includes: a lower bracket, a first short probe penetrating the lower bracket, and a test circuit board disposed below the lower bracket;

[0007] The upper seat assembly includes: an upper seat, a second short probe penetrating the upper seat, and a transfer circuit board disposed above the upper seat; and

[0008] A long transfer probe, the long transfer probe being inserted into one of the upper seat and the lower support seat;

[0009] Among them, the lower seat component and the upper seat component cooperate to clamp the circuit board to be tested, the first short probe is coupled to connect the first gold finger and the test circuit board, the second short probe is coupled to connect the second gold finger and the adapter circuit board, and the adapter long probe is coupled to connect the adapter circuit board and the test circuit board.

[0010] Preferably, the long transfer probe is a spring needle; the first short probe is a spring needle; and the second short probe is a spring needle.

[0011] Preferably, the lower seat assembly further comprises a first probe limiting plate, the first short probe is further provided on the first probe limiting plate, the first probe limiting plate cooperates with the lower support seat to limit and fix the needle sleeve of the first short probe, and the needle tip of one end of the first short probe extends upward from the lower support seat, and the needle tip of the other end of the first short probe extends downward from the first probe limiting plate;

[0012] Alternatively, the upper seat assembly also includes a second probe limiting plate, and the second short probe is also passed through the second probe limiting plate. The second probe limiting plate cooperates with the upper seat to limit and fix the needle sleeve of the second short probe, and the needle tip at one end of the second short probe extends upward from the upper seat, and the needle tip at the other end of the second short probe extends downward from the second probe limiting plate.

[0013] Preferably, the lower bracket further includes a limiting groove provided on the upper surface to limit the position of the circuit board to be tested, so that the first gold finger of the circuit board to be tested is aligned with the first short probe.

[0014] Further preferably, the lower bracket further comprises a guide groove provided on the peripheral side of the upper edge of the limiting groove to guide the circuit board to be tested into the limiting groove.

[0015] Preferably, the lower bracket further comprises a limiting column provided on the upper surface to cooperate with the limiting hole of the circuit board to be tested to limit the position, so that the first gold finger of the circuit board to be tested is aligned with the first short probe.

[0016] Preferably, one of the upper seat and the lower support seat includes a limiting column, and the other of the upper seat and the lower support seat includes a limiting hole or a limiting groove, and the limiting column corresponds to the position of the limiting hole or the limiting groove, so that the second short probe is aligned with the second gold finger, and the adapter long probe is aligned with one of the test circuit board and the adapter circuit board.

[0017] Preferably, it further comprises a pressing piece, the upper seat is fixedly arranged on the pressing piece; the pressing piece drives the upper seat to move, so that the upper seat component and the lower seat component are matched and coupled.

[0018] Preferably, the pressing member includes a first pressing member and a second pressing member; the upper seat is fixedly arranged on the first pressing member, and the first pressing member drives the upper seat to move so that the upper seat and the lower seat are coupled; the second pressing member is used to support the circuit board to be tested.

[0019] Preferably, the lower support and the upper support are insulators.

[0020] Compared with the prior art, the integrated circuit board testing device provided by the present invention includes a lower seat assembly, an upper seat assembly and a long adapter probe. The lower seat assembly includes a lower support seat, a first short probe inserted through the lower support seat, and a test circuit board arranged below the lower support seat; the upper seat assembly includes an upper seat, a second short probe inserted through the upper seat, and a adapter circuit board arranged above the upper seat. The long adapter probe is inserted through one of the upper seat and the lower support seat. The lower seat assembly and the upper seat assembly cooperate to clamp the circuit board to be tested, the first short probe couples and conducts the first gold finger of the circuit board to be tested and the test circuit board, the second short probe couples and conducts the second gold finger of the circuit board to be tested and the adapter circuit board, and the long adapter probe couples and conducts the adapter circuit board and the test circuit board. In this way, the test circuit board and the adapter circuit board are electrically coupled through the long adapter probe, and the connection method between the two is simpler and easier to separate, which is conducive to efficient testing of integrated circuit boards with double-sided gold fingers. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 It is a structural diagram of a testing device for integrated circuit boards in the prior art;

[0022] Figure 2 It is a schematic cross-sectional view of a testing device for testing an integrated circuit board with double-sided gold fingers in the prior art;

[0023] Figure 3 This is a schematic cross-sectional view of a testing device for testing an integrated circuit board with double-sided gold fingers in one embodiment of the present invention;

[0024] Figure 4 The figure is a schematic cross-sectional structural diagram of a testing device for testing an integrated circuit board with double-sided gold fingers in one embodiment of the present invention. DETAILED DESCRIPTION

[0025] In order to provide a further understanding of the purpose, structure, features, and functions of the present invention, the present invention is described in detail below with reference to the embodiments.

[0026] Certain terms are used throughout the specification and claims to refer to specific components. Those skilled in the art will understand that manufacturers may use different terms to refer to the same component. This specification and claims do not distinguish components by name, but rather by their functional differences. Throughout the specification and claims, the term "including" is open-ended and should be interpreted as meaning "including, but not limited to."

[0027] The present invention aims to achieve coupling between the integrated circuit board and the test circuit in the test device by using a metal probe to contact the gold fingers on the integrated circuit board. In this way, the integrated circuit board is connected to the test circuit in a simpler way, which can improve the testing efficiency of the integrated circuit board. It can also avoid friction between the integrated circuit board and the test device when replacing different integrated circuit boards for testing, thereby reducing wear of the test device and increasing its service life.

[0028] First of all, it should be explained that the circuit board 10 to be tested with double-sided gold fingers described in this article is specifically that a plurality of first gold fingers 11 and a plurality of second gold fingers 12 are respectively provided on the two opposite surfaces of the circuit board 10 to be tested. In the present utility model, the circuit board 10 to be tested is placed horizontally on the test device 1 to perform the test steps. Therefore, it is described in this article that the plurality of first gold fingers 11 are located on the lower surface of the circuit board 10 to be tested, and the plurality of second gold fingers 12 are located on the upper surface of the circuit board 10 to be tested. The directions represented by the above, below, etc. are for the convenience of description, and they do not particularly limit the placement or use direction of the circuit board 10 to be tested and the test device 1 described below, and will not be repeated.

[0029] The test device 1 provided by the utility model, please refer to Figure 3 and Figure 4, is a schematic cross-sectional structural diagram of an integrated circuit board testing device 1 in an embodiment of the present invention, comprising a lower seat assembly, an upper seat assembly, and a plurality of adapter long probes 32. The lower seat assembly comprises a lower support 21, a plurality of first short probes 31 passing through the lower support 21, and a test circuit board 20 disposed below the lower support. For example, the lower support 21 can be attached to the test circuit board 20 by screws, or the lower support 21 can also be connected to the test circuit board 20 by snaps, but the actual use is not limited to this. Preferably, the lower support 21 can be made of an insulator such as bakelite or plastic. The upper seat assembly comprises an upper seat 41, a plurality of second short probes 51 passing through the upper seat 41, and an adapter circuit board 40 disposed above the upper seat 41. For example, the upper seat 41 can be attached to the adapter circuit board 40 by screws, or the upper seat 41 can also be connected to the adapter circuit board 40 by snaps, but the actual use is not limited to this. Preferably, the upper seat 41 can be made of an insulator such as bakelite or plastic. Preferably, the lower support seat 21 and the upper support seat 41 can also be anti-static. In this embodiment, the adapter long probe 32 is provided in the lower support seat 21; in other embodiments, the adapter long probe 32 can also be provided in the upper support seat 41; however, the actual application is not limited to this. Among them, the lower support assembly and the upper support assembly cooperate to clamp the circuit board to be tested 10, the first short probe 31 couples and conducts the first gold finger 11 and the test circuit board 20, the second short probe 51 couples and conducts the second gold finger 12 and the adapter circuit board 40, and the adapter long probe 32 conducts the adapter circuit board 40 and the test circuit board 20. In this way, the test circuit board 20 and the adapter circuit board 40 are electrically coupled through the adapter long probe 32, and the connection method between the two is simpler and easy to separate, which is conducive to efficient testing of integrated circuit boards with double-sided gold fingers. In this embodiment, the number of the first short probes 31 is multiple and corresponds to the multiple first gold fingers 11, so as to couple and conduct the multiple first gold fingers 11 in a one-to-one correspondence; and the number of the second short probes 51 is multiple and corresponds to the multiple second gold fingers 12, so as to couple and conduct the multiple second gold fingers 12 in a one-to-one correspondence, but practical applications are not limited to this.

[0030] In this embodiment, the first short probe 31 , the second short probe 51 and the connecting long probe 32 are elastic probes with variable lengths, such as spring pins, conductive rubber buttons, etc.

[0031] In one embodiment, taking the long adapter probe 32 as an example, the long adapter probe 32 includes a needle sleeve and needles extending from each end of the needle sleeve. The lower needle contacts the metal contacts on the test circuit board 20, and the upper needle contacts the metal contacts on the adapter circuit board 40. The adapter circuit board 40 moves toward the test circuit board 20 and presses the two needles together, causing the two needles to retract. The spring's rebound force causes the needles at the upper and lower ends of the long adapter probe 32 to tightly abut the metal contacts on the adapter circuit board 40 and the test circuit board 20, respectively, thereby ensuring that the long adapter probe 32 achieves reliable electrical interconnection between the test circuit board 20 and the adapter circuit board 40. The first short probe 31 and the second short probe 51 are similarly described and will not be further described.

[0032] In other embodiments, the spring needle can also be a single-head spring needle. Taking the adapter long probe 32 as an example, it can be inserted into the lower bracket 21, and the lower end can be welded or plugged into the test circuit board 20, and the needle head at the upper end abuts and contacts the adapter circuit board 40, thereby achieving electrical interconnection between the test circuit board 20 and the adapter circuit board 40. The adapter long probe 32 can also be inserted into the upper bracket 41, and the upper end of the adapter long probe 32 can be welded or plugged into the adapter circuit board 40, and the needle head at the lower end abuts and contacts the test circuit board 20, thereby achieving electrical interconnection between the test circuit board 20 and the adapter circuit board 40. However, the actual application is not limited to this. In this way, the spring needle achieves electrical interconnection through telescoping and point contact, avoiding damage caused by plugging and unplugging, and can effectively increase the service life of the test device 1. In addition, compared with the use of soft wire strips or flexible circuit boards to achieve electrical interconnection, the use of adapter long probes can greatly shorten the length of the coupling line and greatly reduce the coupling impedance, which is conducive to reducing test defects and improving test accuracy.

[0033] In this embodiment, the lower support 21 has a limiting groove 21L, a first through hole 22, and a second through hole 23. The first short probe 31 is inserted into the first through hole 22, and the long transfer probe 32 is inserted into the second through hole 23. As described above, the initial lengths of the first short probe 31 and the long transfer probe 32 are slightly larger than the lengths of the first through hole 22 and the second through hole 23, respectively, thereby providing a retracted stroke for the needle to tightly contact the metal contact. The limiting groove 21L is provided on the upper surface of the lower support 21. The shape of the limiting groove 21L corresponds to the circuit board 10 to be tested and is used to limit the position of the circuit board 10 to be tested. For example, the size of at least a portion of the limiting groove 21L is slightly larger than the corresponding portion of the circuit board 10 to be tested. When the circuit board 10 to be tested is placed in the lower support 21, it can assist in positioning the circuit board 10 to be tested, thereby aligning the first gold finger 11 with the first short probe 31, facilitating contact between the first gold finger 11 and the first short probe 31. In some embodiments, the first through hole 22 is disposed within the limiting groove 21L, and the second through hole 23 is disposed outside the limiting groove 21L. The length of the second through hole 23 is greater than that of the first through hole 22. However, practical applications are not limited thereto.

[0034] Better, such as Figure 3 and Figure 4 As shown, a guide groove 21G can also be provided around the upper edge of the limiting groove 21L, and the side wall of the guide groove 21G is inclined toward the outer side of the lower support 21 compared to the side wall of the limiting groove 21L. In this way, the guide groove 21G can guide the circuit board 10 to be tested that is about to be placed in the limiting groove 21L, so as to guide the circuit board 10 to be tested into the limiting groove 21L.

[0035] In a preferred embodiment, the lower support seat 21 further includes a limiting post (not shown in the figure) provided on the upper surface to cooperate with the limiting hole of the circuit board 10 to further ensure the alignment of the first gold finger 11 of the circuit board 10 to be tested and the first short probe 31. In a preferred embodiment, one of the upper seat 41 and the lower support seat 21 includes a limiting post (not shown in the figure), and the other of the upper seat 41 and the lower support seat 21 includes a limiting hole or a limiting groove (not shown in the figure). The limiting post corresponds to the position of the limiting hole or the limiting groove to align the second short probe 51 with the second gold finger 12. In addition, in the embodiment where the adapter long probe 32 is inserted through the lower support seat 21, the above-mentioned matching limit also aligns the adapter long probe 32 with the adapter circuit board 40; in the embodiment where the adapter long probe 32 is inserted through the upper seat 41, the above-mentioned matching limit also aligns the adapter long probe 32 with the test circuit board 20.

[0036] In such Figure 3 and Figure 4In the embodiment shown, the lower bracket 21 can be integrated, that is, the first portion that supports and positions the circuit board 10 to be tested, the second portion that includes the first through hole 22, and the third portion that includes the second through hole 23 are made of a whole piece of insulating material; in other embodiments, the above-mentioned first portion, second portion and third portion can also be separated separately, or the first portion can be separated relative to the second portion, or the second portion can be separated relative to the third portion, and they are combined to form the entire lower bracket 21.

[0037] In a preferred embodiment, the lower seat assembly further includes a first probe limiting plate 21s. For example, the first probe limiting plate 21s can be detachably mounted on the lower surface of the lower support seat 21 by screws, snaps, etc. The first probe limiting plate 21s cooperates with the lower support seat 21 to limit and fix the needle sleeves of the first short probe 31 and the long adapter probe 32. Taking a double-ended spring needle as an example, the first short probe 31 and / or the long adapter probe 32 can be removed from the lower support seat 21 by removing the first probe limiting plate 21s, facilitating maintenance or replacement of the first short probe 31 and / or the long adapter probe 32. In this way, the first short probe 31 and the transfer long probe 32 can be detachably installed in the lower support seat 21, and the needle sleeves of the first short probe 31 and the transfer long probe 32 are limited and fixed by the first probe limiting plate 21s. The needles at one end of the first short probe 31 and the transfer long probe 32 extend upward from the lower support seat 21, and the needles at the other end of the first short probe 31 and the transfer long probe 32 extend downward from the first probe limiting plate 21s, so that the lower support seat 21 and the first short probe 31 and the transfer long probe 32 have better structural integrity. The lower support seat 21 can also limit and protect the first short probe 31 and the transfer long probe 32, but the actual application is not limited to this. In other embodiments, the transfer long probe 32 is passed through the upper seat 41, that is, the first probe limiting plate 21 is only used to limit and fix the first short probe 31, which will not be repeated.

[0038] In this embodiment, a third through hole 42 is provided on the upper base 41, and the second short probe 51 is passed through the third through hole 42. The initial length of the second short probe 51 is slightly larger than the length of the third through hole 42. The specific structure and function thereof will not be described in detail. Figure 3 and Figure 4 In the embodiment shown, the upper seat 41 can be integrated, that is, the first part fixed to the adapter circuit board 40 and the second part including the third through hole 42 are made of a whole piece of insulating material; in other embodiments, the above-mentioned first part and second part can also be separated and combined to form the entire upper seat 41.

[0039] Similar to the lower support seat 21, the upper seat assembly also includes a second probe stopper plate 41s, which can be removably mounted on the lower surface of the upper seat 41 by screws, snaps, etc. The second probe stopper plate 41s cooperates with the upper seat 41 to limit and fix the needle sleeve of the second short probe 51. For example, if the second short probe 51 is a double-ended spring needle, the second short probe 51 can be removed from the upper seat 41 by removing the second probe stopper plate 41s, facilitating maintenance or replacement of the second short probe 51. In this way, the second short probe 51 can be removably mounted in the upper seat 41, and the needle sleeve of the second short probe 51 is limited and fixed by the second probe stopper plate 41s. One end of the needle of the second short probe 51 extends upward from the upper seat 41, and the other end of the needle of the second short probe 51 extends downward from the second probe stopper plate 41s, thereby enhancing the structural integrity of the upper seat 41 and the second short probe 51. The upper seat 41 can also limit and protect the second short probe 51. In other embodiments, the long transfer probe 32 is passed through the upper seat 41 , and the second probe limiting plate 41 s is also used to limit and fix the long transfer probe 32 , which will not be described in detail.

[0040] In a preferred embodiment, if Figure 3 and Figure 4 As shown, the test device 1 also includes a pressing piece 60, and the upper seat 41 is fixedly arranged on the pressing piece 60. The upper seat 41 is driven by the pressing piece 60 to move downward so that the upper seat assembly and the lower seat assembly are coupled together, that is, the second short probe 51 is coupled with the second gold finger 12, and the adapter long probe 32 is coupled with the test circuit board 20 and the adapter circuit board 40 respectively. In addition, the pressing piece 60 also presses down the part of the circuit board to be tested 20 except the gold finger area to prevent the circuit board to be tested 10 from warping or popping out of the limit groove due to the stress in the gold finger area. The point of force of the pressing piece 60 can correspond to the bare board area of ​​the circuit board to be tested 10 to prevent electronic components from being affected by stress and causing welding defects. Preferably, the lower surface of the pressing piece 60 is also provided with a flexible buffer or buffer layer to reduce or even eliminate the damage to the circuit board to be tested 10 caused by the pressing operation.

[0041] The upper seat 41 can be directly fixed to the pressure piece 60 by screw locking, snap locking, etc.; the adapter circuit board 40 can also be directly fixed to the pressure piece 60 by screw locking, snap locking, etc., and then the upper seat 41 and the adapter circuit board 40 are fixedly connected, so that the upper seat 41 is indirectly fixedly connected to the upper seat 41; however, the actual application is not limited to this.

[0042] In this embodiment, the pressing member 60 includes a first pressing member 61 and a second pressing member 62. The upper seat 41 is fixedly mounted on the first pressing member 61. The first pressing member 61 drives the upper seat 41 to move, thereby coupling the upper seat assembly with the lower seat assembly. The second pressing member 62 is used to abut against the circuit board 10 under test. The first pressing member 61 and the second pressing member 62 can be integral or separate, but practical applications are not limited thereto.

[0043] In one embodiment, the pressing member 60 can be connected to a driving cylinder or servo motor that moves in the vertical direction, so that the pressing member 60 moves in the vertical direction under the drive of the driving cylinder or servo motor, thereby driving the upper seat assembly to move downward to cooperate with the lower seat assembly, or lift upward to separate from the lower seat assembly. For example, the above-mentioned first pressing member 61 and the second pressing member 62 can be separately connected to different driving cylinders or servo motors that move in the vertical direction, or only the first pressing member 61 is connected to the driving cylinder or servo motor that moves in the vertical direction, and the second pressing member 62 can be connected to the first pressing member 61, and the first pressing member 61 drives the second pressing member 62 to move downward, but the actual application is not limited to this. In other embodiments, the first pressing member 61 and the second pressing member 62 can also be a whole to ensure the synchronization of the downward pressing operation of the two. In a preferred embodiment, the pressing member 60 can also be connected to a driving cylinder or servo motor that moves in the horizontal direction, so that after the upper seat assembly is lifted and separated from the lower seat assembly, the upper seat assembly can be driven to move in the horizontal direction again to make way for replacing the circuit board 10 to be tested.

[0044] In other embodiments, the edge of the pressing member 60 can also be fixed to the lower bracket 21 by a pivot, a hook, etc., so as to achieve the matching and alignment of each probe and the circuit board, which is convenient for testing the circuit board 10 to be tested.

[0045] In summary, the integrated circuit board testing device provided by the present invention includes a lower seat assembly, an upper seat assembly and a long adapter probe. The lower seat assembly includes a lower support seat, a first short probe inserted through the lower support seat, and a test circuit board arranged below the lower support seat; the upper seat assembly includes an upper seat, a second short probe inserted through the upper seat, and a adapter circuit board arranged above the upper seat. The long adapter probe is inserted through one of the upper seat and the lower support seat. The lower seat assembly and the upper seat assembly cooperate to clamp the circuit board to be tested, the first short probe couples and conducts the first gold finger of the circuit board to be tested and the test circuit board, the second short probe couples and conducts the second gold finger of the circuit board to be tested and the adapter circuit board, and the long adapter probe couples and conducts the adapter circuit board and the test circuit board. In this way, the test circuit board and the adapter circuit board are electrically coupled through the long adapter probe, and the connection method between the two is simpler and easier to separate, which is conducive to efficient testing of integrated circuit boards with double-sided gold fingers.

[0046] The present invention has been described with reference to the above embodiments. However, these embodiments are merely exemplary embodiments of the present invention. It should be noted that the disclosed embodiments do not limit the scope of the present invention. On the contrary, modifications and improvements made without departing from the spirit and scope of the present invention are within the scope of patent protection of the present invention.

Claims

1. An integrated circuit board testing device, characterized in that: The lower surface and the upper surface of the circuit board to be tested are respectively provided with a plurality of first gold fingers and a plurality of second gold fingers; The test setup includes: The lower seat assembly includes: a lower bracket, a first short probe penetrating the lower bracket, and a test circuit board disposed below the lower bracket; The upper seat assembly includes: an upper seat, a second short probe penetrating the upper seat, and a transfer circuit board disposed above the upper seat; and A long transfer probe, the long transfer probe being inserted into one of the upper seat and the lower support seat; Among them, the lower seat component and the upper seat component cooperate to clamp the circuit board to be tested, the first short probe is coupled to connect the first gold finger and the test circuit board, the second short probe is coupled to connect the second gold finger and the adapter circuit board, and the adapter long probe is coupled to connect the adapter circuit board and the test circuit board.

2. The integrated circuit board testing device according to claim 1, wherein: The long transfer probe is a spring needle; the first short probe is a spring needle; and the second short probe is a spring needle.

3. The integrated circuit board testing device according to claim 1, wherein: The lower seat assembly further includes a first probe limiting plate, the first short probe is further provided on the first probe limiting plate, the first probe limiting plate cooperates with the lower support seat to limit and fix the needle sleeve of the first short probe, and the needle tip of one end of the first short probe extends upward from the lower support seat, and the needle tip of the other end of the first short probe extends downward from the first probe limiting plate; Alternatively, the upper seat assembly also includes a second probe limiting plate, and the second short probe is also passed through the second probe limiting plate. The second probe limiting plate cooperates with the upper seat to limit and fix the needle sleeve of the second short probe, and the needle tip at one end of the second short probe extends upward from the upper seat, and the needle tip at the other end of the second short probe extends downward from the second probe limiting plate.

4. The integrated circuit board testing device according to claim 1, wherein: The lower bracket further comprises a limiting groove arranged on the upper surface for limiting the position of the circuit board to be tested, so that the first gold finger of the circuit board to be tested is aligned with the first short probe.

5. The integrated circuit board testing device according to claim 4, characterized in that: The lower bracket further comprises a guide groove arranged on the peripheral side of the upper edge of the limiting groove to guide the circuit board to be tested into the limiting groove.

6. The integrated circuit board testing device according to claim 1, wherein: The lower bracket further comprises a limiting column arranged on the upper surface to cooperate with the limiting hole of the circuit board to be tested to limit the position, so that the first gold finger of the circuit board to be tested is aligned with the first short probe.

7. The integrated circuit board testing device according to claim 1, wherein: One of the upper seat and the lower support seat includes a limiting column, and the other of the upper seat and the lower support seat includes a limiting hole or a limiting groove. The limiting column corresponds to the position of the limiting hole or the limiting groove, so that the second short probe is aligned with the second gold finger, and the adapter long probe is aligned with one of the test circuit board and the adapter circuit board.

8. The integrated circuit board testing device according to claim 1, wherein: It also includes a pressing piece, the upper seat is fixedly arranged on the pressing piece; the pressing piece drives the upper seat to move, so that the upper seat component and the lower seat component are matched and coupled.

9. The integrated circuit board testing device according to claim 1, wherein: The pressing member includes a first pressing member and a second pressing member; the upper seat is fixedly arranged on the first pressing member, and the first pressing member drives the upper seat to move so that the upper seat and the lower seat are matched and coupled; the second pressing member is used to support the circuit board to be tested.

10. The integrated circuit board testing device according to claim 1, wherein: The lower support seat and the upper seat are insulators.

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