Probe station clamp convenient for replacing probe

By designing a probe station fixture with a connecting column and copper pole structure, the problem that existing fixtures are difficult to clamp and replace probes is solved, and the probes can be quickly replaced and stably clamped, which improves work efficiency and reduces labor costs.

CN223346908UActive Publication Date: 2025-09-16XIAMEN JISHUN SEMICON MFG CO LTD
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Patent Information

Application Number
CN202422339280.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-09-25
Publication Date
2025-09-16
Estimated Expiration
2034-09-25

AI Technical Summary

Technical Problem

The existing probe station fixture is difficult to clamp the probe and cannot be adjusted, which makes probe replacement inconvenient, inefficient, labor-intensive, costly, difficult to operate, and easy to slip.

Method used

A probe station fixture including a connecting column and a copper pole is designed. The connecting column is provided with a positioning groove and a positioning hole. The probe is clamped by a locking screw. The connecting column is made of insulating material. The deformable part and the fixed part jointly clamp the probe. The fixing pin is adapted to the fixing groove for easy disassembly and assembly.

Benefits of technology

The probe can be quickly replaced and stably clamped, which improves work efficiency, reduces labor costs, is easy to operate and is not easy to damage.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a probe station clamp convenient for replacing a probe, which belongs to the technical field of semiconductor chip processing tools, and comprises a connecting column, one end of the connecting column is connected with a copper electrode, one side of the copper electrode is provided with a positioning groove, the positioning groove is internally provided with the probe, and the probe is arranged in the positioning groove. One side of the copper electrode is divided into a deformation part and a fixing part by the positioning groove, the deformation part is also provided with two groups of positioning holes, and the positioning holes are internally provided with locking screws, after the improvement, the replacement of the probe is convenient and fast, the copper electrode has better friction force, the probe is more effectively fixed, and the service life of the probe is prolonged. The problem that the probe is inconvenient to replace and the problem that the probe slips are solved, and meanwhile the working efficiency is improved.
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Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor chip processing tools, in particular to a probe table fixture for convenient probe replacement. Background Art

[0002] Semiconductor chips are tested using a probe station, which requires adjustment and replacement of probes. Currently, existing fixtures are difficult to clamp the probes and cannot be adjusted, making it inconvenient to replace the probes. Although this method can meet certain production needs, it also has major drawbacks: low efficiency, high labor intensity for workers, high labor costs, inconvenient operation, difficult to operate, easy to slip, and high manufacturing costs.

[0003] Based on this, the utility model designs a probe station fixture which is convenient for replacing probes to solve the above problems. Utility Model Content

[0004] The purpose of the present invention is to provide a probe station fixture that is convenient for replacing probes, so as to solve the above technical problems.

[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solution: a probe station fixture for convenient replacement of probes, comprising a connecting column, one end of the connecting column is connected to a copper pole, a positioning groove is provided on one side of the copper pole, a probe is arranged inside the positioning groove, the positioning groove divides one side of the copper pole into two parts, a deformation part and a fixed part, two groups of positioning holes are also provided on the deformation part, and locking screws are provided inside the positioning holes.

[0006] By adopting the above technical solution, it is convenient to replace the probe, thereby increasing its use effect.

[0007] Preferably, one end of the connecting column is fixedly connected to a fixing column, a fixing groove is provided on the top of the fixing column, and a fixing pin is also provided on the top of the copper pole.

[0008] By adopting the above technical solution, it is convenient to disassemble and assemble the copper electrode.

[0009] Preferably, the fixing pin and the fixing slot are adapted to each other.

[0010] By adopting the above technical solution, the connection is made more stable.

[0011] Preferably, the connecting column is made of insulating pads.

[0012] By adopting the above technical solution, an insulation effect can be achieved.

[0013] Preferably, the deformable portion cooperates with the fixing portion to clamp the probe after deformation.

[0014] By adopting the above technical solution, the clamping effect of the probe can be increased.

[0015] To sum up, this application has the following beneficial technical effects: after the modification, the probe can be replaced conveniently and quickly, and the copper pole has better friction, which can more effectively fix the probe, solving the problem of inconvenience in replacing the probe and the problem of probe slipping, while also improving work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for describing the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0017] Figure 1 Schematic diagram of the overall structure of this embodiment;

[0018] Figure 2 Schematic diagram of the structure of the connecting column in this embodiment.

[0019] In the accompanying drawings, the components represented by the reference numerals are as follows:

[0020] 1. Connecting column; 2. Copper pole; 3. Positioning groove; 4. Probe; 5. Fixing column; 6. Fixing pin; 7. Positioning hole; 8. Fixing groove; 9. Deformation part; 10. Fixing part. DETAILED DESCRIPTION

[0021] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0022] The following is combined with Figure 1-2 This application is described in further detail.

[0023] Reference Figure 1 A probe station fixture for convenient probe replacement includes a connecting column 1, one end of the connecting column 1 is connected to a copper pole 2, a positioning groove 3 is provided on one side of the copper pole 2, a probe 4 is arranged inside the positioning groove 3, and the positioning groove 3 divides one side of the copper pole 2 into a deformation part 9 and a fixed part 10. Two groups of positioning holes 7 are also provided on the deformation part 9, and a locking screw is provided inside the positioning hole 7. When the screw is turned, the probe 4 can be clamped, thereby increasing its subsequent use effect.

[0024] Reference Figure 2 One end of the connecting column 1 is fixedly connected to a fixing column 5, and a fixing groove 8 is provided on the top of the fixing column 5. A fixing pin 6 is also provided on the top of the copper pole 2. The fixing pin 6 is adapted to the fixing groove 8 to facilitate the disassembly and assembly of the copper pole 2.

[0025] Reference Figure 1 The connecting column 1 is made of insulating wood, and the deforming portion 9 works together with the fixing portion 10 to clamp the probe 4 after deformation.

[0026] The implementation principle of this embodiment is: the probe 1 is clamped on the copper pole 2, and then the copper pole 2 is installed on the connecting column 1, so that the needle insertion position of the probe 1 can be freely adjusted and the probe 1 can be easily replaced. Through this mechanism, the needle insertion position of the probe 1 can be freely adjusted and the probe 1 can be easily replaced, which is highly efficient and saves labor costs. The mechanism is very simple and compact, the operation is simpler and more convenient, it is not easy to be damaged and has a long service life.

[0027] In the description of the present invention, it should be understood that the terms "coaxial", "bottom", "one end", "top", "middle", "the other end", "upper", "one side", "top", "inside", "front", "center", "two ends", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0028] In the present invention, unless otherwise clearly stipulated and limited, the terms "install", "set", "connect", "fix", "screw" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be the internal connection of two elements or the interaction relationship between two elements. Unless otherwise clearly defined, ordinary technicians in this field can understand the specific meanings of the above terms in the present invention according to the specific circumstances.

[0029] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A probe station fixture for convenient probe replacement, comprising a connecting column (1), characterized in that: One end of the connecting column (1) is connected to a copper pole (2), a positioning groove (3) is provided on one side of the copper pole (2), a probe (4) is provided inside the positioning groove (3), and the positioning groove (3) divides one side of the copper pole (2) into two parts: a deformation part (9) and a fixed part (10), and two groups of positioning holes (7) are also provided on the deformation part (9), and locking screws are provided inside the positioning holes (7).

2. A probe station fixture for convenient probe replacement according to claim 1, characterized in that: One end of the connecting column (1) is fixedly connected to a fixing column (5), a fixing groove (8) is provided on the top of the fixing column (5), and a fixing pin (6) is also provided on the top of the copper pole (2).

3. The probe station fixture for convenient probe replacement according to claim 2, characterized in that: The fixing pin (6) and the fixing groove (8) are adapted to each other.

4. The probe station fixture for convenient probe replacement according to claim 1, characterized in that: The connecting column (1) is made of insulating wood.

5. The probe station fixture for convenient probe replacement according to claim 1, characterized in that: After deformation, the deformation portion (9) cooperates with the fixing portion (10) to clamp the probe (4).