Schlieren instrument for detecting internal and external defects of crystal

Abstract

The utility model relates to the technical field of crystal defect detection, in particular to a schlieren instrument for detecting internal and external defects of a crystal, which comprises a shell plate, a two-dimensional moving table is mounted on the left side of the top end of the outer wall of the shell plate, and a three-dimensional moving table is mounted at the top end of the outer wall of the two-dimensional moving table. According to the utility model, the personnel can visually observe the external and internal characteristics and defects of the crystal through the display screen, and meanwhile, the structure design is exquisite, the structure is simple, the operation is convenient, the cost is low, the production efficiency is high, and the production cost is low. The long-optical-path space folding is realized through the reflector, the portability of the system is improved, the schlieren instrument camera fixing module is firm by using the camera fixing bracket of the two displacement adjusting frames, and the position of the camera is convenient to adjust, so that the camera can well receive light source information of a detection sample.

Description

Technical Field

[0001] The utility model relates to the technical field of crystal defect detection, in particular to a schlieren instrument used for detecting internal and external defects of a crystal. Background Art

[0002] Schlieren technology utilizes the basic principle that the gas density distribution in the flow field is uneven and the refractive index of light in the uneven flow field is different. It converts the invisible change of the airflow density gradient in the flow field into a more easily detectable change of relative light intensity. It only needs to record the area where the light is obviously refracted in the gas flow field to convert it into an observable and distinguishable actual image, and then analyze the image to obtain detailed information of the gas flow field. It is a device for visually detecting changes or unevenness of the refractive index of air or other transparent media.

[0003] During the preparation process, existing crystals often have defects such as external fine dust, external crystal defects, internal growth lines, internal bubbles, and internal scratches on the crystals due to the influence of the manufacturing environment or manufacturing process. Traditional crystal defect detection generally uses the naked eye to observe crystal defects under a cold light source. This method is time-consuming and more laborious to observe micron-level defects, which is not conducive to batch detection of crystals. Therefore, the existing crystal external defect detection still has certain shortcomings.

[0004] In summary, it is necessary to invent a schlieren instrument for detecting internal and external defects of crystals. Utility Model Content

[0005] To this end, the utility model provides a schlieren instrument for detecting internal and external defects of crystals to solve the problem that traditional crystal defect detection generally uses the naked eye to observe crystal defects under a cold light source. This method is time-consuming and more laborious for observing micron-level defects, which is not conducive to batch detection of crystals.

[0006] In order to achieve the above-mentioned purpose, the present invention provides the following technical solution: a schlieren instrument for detecting internal and external defects of crystals, comprising a shell plate, a two-dimensional moving stage is installed on the left side of the top end of the outer wall of the shell plate, a three-dimensional moving stage is installed on the top end of the outer wall of the two-dimensional moving stage, a visual detection component is installed on the side wall of the three-dimensional moving stage, and a light source detection component is installed inside the shell plate and below the two-dimensional moving stage.

[0007] Preferably, a partition is fixed on the inner wall of the shell plate and on the side away from the two-dimensional moving platform, and the visual detection component includes a camera, which is fixed on the right side of the outer wall of the three-dimensional moving platform, and a zoom lens is connected to the bottom end of the outer wall of the camera.

[0008] Preferably, a through hole is provided at the top of the outer wall of the shell plate and directly below the zoom lens, a Schlieren knife edge is installed at the top of the outer wall of the shell plate and at a position corresponding to the through hole, a knife edge bracket is fixed on the rear side of the outer wall of the Schlieren knife edge, and the bottom end of the knife edge bracket is connected to the top of the outer wall of the shell plate.

[0009] Preferably, the light source detection component includes a light source body, the front end of the outer wall of the light source body is fixed to the front end of the inner wall of the shell plate through a light source bracket and is located on the right side of the partition, and an aperture is installed on the right side of the outer wall of the partition at a position corresponding to the light emitting point of the light source body.

[0010] Preferably, a first lens is provided on the left side of the outer wall of the partition and at a position corresponding to the aperture. The first lens is fixed to the left side of the outer wall of the partition through a first fixing bracket. The first lens is connected to the aperture. A beam splitter is installed on the bottom end of the inner wall of the shell plate and located on the left side of the first lens through a second fixing bracket. The beam splitter is arranged below the zoom lens.

[0011] Preferably, a second lens is installed on the right side of the inner wall of the shell plate and at a position corresponding to the spectrometer, and a reflector is provided on the left side of the outer wall of the shell plate and at a position corresponding to the second lens. The reflector is installed on the optical platform through a fifth fixed bracket, and a crystal sample for detection is provided between the second lens and the reflector.

[0012] Preferably, a cooling fan for heat dissipation is installed at the bottom end of the outer wall of the shell plate and below the light source body, and a power supply is installed on the right side of the outer wall of the shell plate, and a power supply filter is installed on the power supply.

[0013] The beneficial effects of the utility model are:

[0014] In the utility model, personnel can visually observe the external and internal features and defects of the crystal through the display screen. At the same time, the structural design is sophisticated, and the long optical path is spatially folded through the reflector, which improves the portability of the system. The camera fixing bracket using two displacement adjustment brackets makes the Schlieren instrument camera fixing module firm, which is convenient for adjusting the camera position so that the camera can well receive the light source information of the test sample.

[0015] The utility model can save manpower and time. After using the schlieren scheme, the defect characteristics of the magnified crystal can be directly observed on the display screen. The observation range can be down to the micron level, which is more conducive to batch detection of crystals and can save more manpower and time.

[0016] The utility model is easy to install and use, the internal optical path system of the schlieren instrument is fixed and utilizes the space folding of the long optical path, thereby improving the portability of the system. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1This is a schematic diagram of the three-dimensional structure of the utility model when viewed from the left side;

[0018] Figure 2 This is a schematic diagram of the three-dimensional structure of the utility model when viewed from the right side;

[0019] Figure 3 This is a schematic diagram of a portion of the structure of the light source detection component in the present invention when viewed from above;

[0020] Figure 4 It is a schematic diagram of the partial structure of the housing in the present invention when viewed from above.

[0021] In the figure: 100, shell plate; 200, two-dimensional moving stage; 210, three-dimensional moving stage; 220, camera; 221, zoom lens; 230, schlieren blade; 231, blade bracket; 300, power supply; 400, light source body; 410, light source bracket; 420, aperture; 421, first lens; 430, spectrometer; 460, second lens; 470, reflector; 480, crystal sample; 500, cooling fan. DETAILED DESCRIPTION

[0022] The preferred embodiments of the present invention are described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention and are not used to limit the present invention.

[0023] Refer to the attached Figure 1-4The utility model provides a schlieren instrument for detecting internal and external defects of crystals, including a shell plate 100, a two-dimensional moving stage 200 is installed on the left side of the top end of the outer wall of the shell plate 100, and the set two-dimensional moving stage 200 can drive the three-dimensional moving stage 210 to move in the two-dimensional directions of front and back and left and right, and the three-dimensional moving stage 210 is installed on the top end of the outer wall of the two-dimensional moving stage 200. The three-dimensional moving stage 210 can be fixed to the top end of the outer wall of the two-dimensional moving stage 200 through a vertical pole, and the three-dimensional moving stage 210 can be adjusted up and down on the vertical pole, so that the camera 220 can be adjusted in the third dimension up and down, and a visual detection component is installed on the side wall of the three-dimensional moving stage 210, and a partition is fixed on the inner wall of the shell plate 100 and away from the side of the two-dimensional moving stage 200, and the visual detection component includes a camera 220, which is fixed on the right side of the outer wall of the three-dimensional moving stage 210, and the set camera 220 can be connected to the camera 220 through a BNC line. A group of displays are connected, and personnel can use the displays to inspect the appearance of the crystal. The bottom end of the outer wall of the camera 220 is connected to a zoom lens 221, and the zoom lens 221 is provided to enable the camera 220 to photograph the defects of the crystal sample 480 more clearly. A through hole is provided at the top end of the outer wall of the shell plate 100 and directly below the zoom lens 221. The through hole is provided to enable the camera 220 to perform external defect detection on the crystal sample 480. A Schlieren knife edge 230 is installed at the top end of the outer wall of the shell plate 100 and at a position corresponding to the through hole. A knife edge bracket 231 is fixed to the rear side of the outer wall of the Schlieren knife edge 230, and the bottom end of the knife edge bracket 231 is connected to the top end of the outer wall of the shell plate 100. The Schlieren knife edge 230 is also called a "blade system", which is mainly used to control and adjust the movement balance in the device, and plays an important role in improving shooting stability and picture quality.

[0024] A light source detection component is installed inside the shell 100 and below the two-dimensional moving stage 200. The light source detection component includes a light source body 400. The front end of the outer wall of the light source body 400 is fixed to the front end of the inner wall of the shell 100 through a light source bracket 410 and is located on the right side of the partition. The light source emitted by the set light source body 400 can be a visible light source or a laser light source of a certain band, such as a 633nm laser light source. An aperture 420 is installed on the right side of the outer wall of the partition at a position corresponding to the light point of the light source body 400. A first lens 421 is provided on the left side of the outer wall of the partition and at a position corresponding to the aperture 420. The first lens 421 is fixed through a first fixed The fixed bracket is fixed to the left side of the outer wall of the partition, and the aperture 420 is provided to convert the laser light emitted by the light source body 400 into a uniform point light source. The first lens 421 is connected to the aperture 420. A beam splitter 430 is installed at the bottom end of the inner wall of the shell plate 100 and to the left of the first lens 421 via a second fixed bracket. The beam splitter 430 is arranged below the zoom lens 221. A second lens 460 is installed on the right side of the inner wall of the shell plate 100 and at a position corresponding to the beam splitter 430. The point light source after passing through the aperture 420 will be emitted through the first lens 421 to the beam splitter 430, and the beam splitter 430 will refract the light source to pass through the second lens 460;

[0025] A reflector 470 is provided on the left side of the outer wall of the shell plate 100 and at a position corresponding to the second lens 460. The reflector 470 is mounted on the optical platform through a fifth fixing bracket. A crystal sample 480 for detection is provided between the second lens 460 and the reflector 470. The crystal sample 480 can also be placed on the optical detection platform. The point laser emitted by the second lens 460 will pass through the crystal sample 480 and be arranged on the reflector 470. The reflector 470 will reflect the emitted laser back, and the reflected laser will pass through the second lens 460 to illuminate the optical detection platform. The laser beam is projected onto the spectrometer 430, and finally the spectrometer 430 irradiates the reflected laser beam onto the blade 230 of the schlieren instrument to the zoom lens 221 and the camera 220. A cooling fan 500 for heat dissipation is installed at the bottom end of the outer wall of the shell plate 100 and below the light source body 400. The cooling fan 500 is provided to dissipate heat from the light source body 400. A power supply 300 is installed on the right side of the outer wall of the shell plate 100, and a power supply filter is installed on the power supply 300. The power supply 300 and the power supply filter are provided to supply power for the operation of the device.

[0026] The use process of the present invention is as follows: First, personnel can assemble the device according to the above instructions, calibrate the device after completion, and then adjust and calibrate the three-dimensional position of the camera 220, such as front, back, left, right, up and down, by using the two-dimensional moving stage 200 and the three-dimensional moving stage 210;

[0027] After the calibration is completed, the personnel can take out the crystal sample 480 to be tested and place the crystal sample 480 between the second lens 460 and the reflector 470. Then the personnel can turn on the power to start the light source body 400. The light source body 400 will emit laser, and the aperture 420 can convert the laser emitted by the light source body 400 into a uniform point light source. After passing through the aperture 420, the point light source will be emitted through the first lens 421 to the spectroscope 430, and the spectroscope 430 will refract the light source to the second lens 460 and then pass through it. The point laser emitted by lens 460 will pass through the crystal sample 480 and hit the reflector 470, and the reflector 470 will reflect the emitted laser back. The reflected laser will pass through the second lens 460 and hit the spectrometer 430. Finally, the spectrometer 430 will hit the reflected laser on the edge 230 of the schlieren instrument to the zoom lens 221 and the camera 220, and the two-dimensional moving stage 200 will transmit the detected image to the display, and personnel can view the external defects of the crystal sample 480 through the display.

[0028] The above description is merely a preferred embodiment of the present invention. Anyone skilled in the art may utilize the above-described technical solutions to modify the present invention or create equivalent technical solutions. Therefore, any simple modification or equivalent replacement based on the technical solutions of the present invention falls within the scope of protection claimed by the present invention.

Claims

1. A schlieren instrument for detecting internal and external defects of a crystal, comprising a shell plate (100), a two-dimensional moving stage (200) being mounted on the left side of the top end of the outer wall of the shell plate (100), and a three-dimensional moving stage (210) being mounted on the top end of the outer wall of the two-dimensional moving stage (200), characterized in that: A visual detection component is installed on the side wall of the three-dimensional moving platform (210), and a light source detection component is installed inside the shell plate (100) and below the two-dimensional moving platform (200).

2. The schlieren instrument for detecting internal and external defects of a crystal according to claim 1, characterized in that: A partition is fixed on the inner wall of the shell plate (100) and on a side away from the two-dimensional moving platform (200). The visual detection component includes a camera (220). The camera (220) is fixed on the right side of the outer wall of the three-dimensional moving platform (210). The bottom end of the outer wall of the camera (220) is connected to a zoom lens (221).

3. The schlieren instrument for detecting internal and external defects of a crystal according to claim 2, characterized in that: A through hole is provided at the top of the outer wall of the shell plate (100) and directly below the zoom lens (221); a Schlieren instrument blade (230) is installed at the top of the outer wall of the shell plate (100) and at a position corresponding to the through hole; a blade bracket (231) is fixedly provided on the rear side of the outer wall of the Schlieren instrument blade (230); and the bottom end of the blade bracket (231) is connected to the top of the outer wall of the shell plate (100).

4. The schlieren instrument for detecting internal and external defects of a crystal according to claim 2, characterized in that: The light source detection component comprises a light source body (400), the front end of the outer wall of the light source body (400) is fixed to the front end of the inner wall of the shell plate (100) through a light source bracket (410) and is located on the right side of the partition, and a diaphragm (420) is installed on the right side of the outer wall of the partition at a position corresponding to the light irradiation point of the light source body (400).

5. The schlieren instrument for detecting internal and external defects of a crystal according to claim 4, characterized in that: A first lens (421) is provided on the left side of the outer wall of the partition and at a position corresponding to the diaphragm (420); the first lens (421) is fixed to the left side of the outer wall of the partition via a first fixing bracket; the first lens (421) is communicated with the diaphragm (420); a beam splitter (430) is installed at the bottom end of the inner wall of the shell plate (100) and located on the left side of the first lens (421) via a second fixing bracket; the beam splitter (430) is provided below the zoom lens (221).

6. The schlieren instrument for detecting internal and external defects of a crystal according to claim 5, characterized in that: A second lens (460) is installed on the right side of the inner wall of the shell plate (100) and at a position corresponding to the spectroscope (430), and a reflector (470) is provided on the left side of the outer wall of the shell plate (100) and at a position corresponding to the second lens (460). The reflector (470) is installed on the optical platform through a fifth fixing bracket, and a crystal sample (480) for detection is provided between the second lens (460) and the reflector (470).

7. The schlieren instrument for detecting internal and external defects of a crystal according to claim 4, characterized in that: A cooling fan (500) for heat dissipation is installed at the bottom end of the outer wall of the shell plate (100) and below the light source body (400). A power supply (300) is installed on the right side of the outer wall of the shell plate (100), and a power supply filter is installed on the power supply (300).

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