Testing device for TVS diode

Abstract

The utility model discloses a testing device for a TVS diode, and relates to the technical field of TVS diode testing. Comprising a base, a plane thrust ball bearing is installed on the table top of the base, a carrier is installed on the top of the plane thrust ball bearing, a positioning groove is formed in the carrier, a rotating shaft is fixedly connected to the bottom of the carrier, and a stepping motor is installed in the base. According to the testing device for the TVS diode, the TVS diode is placed in the positioning groove of the carrier to be limited, the Z-axis linear module is controlled to drive the testing meter pens at the two ends to descend so as to make contact with pins of the TVS diode to conduct a conduction test, a measurement result is clearly and visually displayed through the digital ampere-voltage meter, then the testing meter pens ascend and reset, and the TVS diode is tested. The stepping motor is controlled to drive the carrier to axially rotate by a certain angle to change the pin position of the TVS tube, the conduction test on the TVS tube in the other direction is carried out, and the device has the advantages of being simple in operation, high in test efficiency and low in labor cost.

Description

Technical Field

[0001] The utility model relates to the technical field of TVS diode testing, in particular to a testing device for a TVS diode. Background Art

[0002] Transient suppression diodes (TVS), also known as clamping diodes, are a type of high-efficiency circuit protection device currently used internationally. When the two poles of a TVS diode are subjected to a reverse transient high-energy impact, it can change the high impedance between the two poles to a low impedance at a speed of 10 to the negative 12th power of seconds, absorbing surge power of up to several kilowatts and clamping the voltage between the two poles to a predetermined value, effectively protecting the precision components in electronic circuits from damage by various surge pulses. It has the advantages of fast response time, high transient power, low leakage current, low breakdown voltage deviation, easy to control clamping voltage, no damage limit, and small size.

[0003] Currently, a multimeter is commonly used to test the continuity of TVS tubes. The two contacts of the multimeter are connected to the TVS tube respectively, and the continuity test of the TVS tube is performed in one direction. After that, the two contacts of the multimeter need to be manually swapped. That is, the two contacts of the multimeter need to be swapped to perform the continuity test of the TVS tube in the other direction. The manual operation is cumbersome and labor-intensive, especially when testing a large number of TVS tubes, as the above operation needs to be repeated one by one. Utility Model Content

[0004] The utility model provides a testing device for a TVS diode to solve the problems in the background technology.

[0005] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a testing device for a TVS diode, comprising a base, a planar thrust ball bearing being installed on the table top of the base, and a carrier being installed on the top of the planar thrust ball bearing, a positioning groove being provided on the carrier, and a rotating shaft being fixedly connected to the bottom of the carrier, a stepper motor being installed in the base, and the output shaft end of the stepper motor being connected to the rotating shaft through a gear transmission, a Z-axis linear module being installed on the table top of the base, and a seat plate being installed on the slide of the Z-axis linear module, a digital ammeter and voltmeter being installed on the top of the seat plate, test pens being installed at both ends of the lower part of the base plate, and the test pens being electrically connected to the digital ammeter and voltmeter through wires, a control panel being embedded in the front side of the seat plate, and the stepper motor and the Z-axis linear module being electrically connected to the control panel respectively.

[0006] Furthermore, a stepped hole is provided on the table surface of the base, and the planar thrust ball bearing is installed in the stepped hole.

[0007] Furthermore, the carrier is installed in the stepped hole, and the top of the carrier is flush with the table top of the base.

[0008] Furthermore, the lower end of the rotating shaft passes through the stepped hole into the interior of the base and is meshed and connected with the output shaft end of the stepping motor through a gear.

[0009] Furthermore, the upper portion of the test lead is provided with an external thread, and a locking nut is threadedly connected to the external thread.

[0010] Furthermore, a strip-shaped hole is provided at the lower portion of the base plate, and the upper portion of the test lead is sleeved in the strip-shaped hole and fastened to the strip-shaped hole by a locking nut.

[0011] Compared with the prior art, the present invention provides a test device for TVS diodes, which has the following beneficial effects:

[0012] This TVS diode test device places the TVS diode into the positioning slot of the carrier for limiting, controls the Z-axis linear module to drive the test leads at both ends to descend, thereby contacting the pins of the TVS tube for a continuity test, and displays the measurement results clearly and intuitively on the digital current and voltage meter. After that, the test leads rise and reset, and controls the stepper motor to drive the carrier to rotate axially by a certain angle to swap the pin position of the TVS tube, so as to perform a continuity test on the TVS tube in the other direction. This device has the advantages of simple operation, high testing efficiency, and low labor cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a structural diagram of the utility model;

[0014] Figure 2 It is a front view of the utility model;

[0015] Figure 3 It is a top view of the utility model.

[0016] In the figure: 1. Base; 2. Plane thrust ball bearing; 3. Carrier; 4. Positioning groove; 5. Rotating shaft; 6. Stepper motor; 7. Z-axis linear module; 8. Base plate; 9. Digital current and voltage meter; 10. Test leads; 11. Control panel; 12. Stepped hole; 13. External thread; 14. Locking nut; 15. Strip hole. DETAILED DESCRIPTION

[0017] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0018] See also Figure 1-Figure 3 The utility model discloses a test device for TVS diodes, comprising a base 1, a plane thrust ball bearing 2 is mounted on the table of the base 1, and a carrier 3 is mounted on the top of the plane thrust ball bearing 2, a positioning groove 4 is provided on the carrier 3, and a rotating shaft 5 is fixedly connected to the bottom of the carrier 3, a stepper motor 6 is mounted in the base 1, and the output shaft end of the stepper motor 6 is connected to the rotating shaft 5 through a gear, a Z-axis linear module 7 is mounted on the table of the base 1, and a seat plate 8 is mounted on the slide of the Z-axis linear module 7, a digital current and voltage meter 9 is mounted on the top of the seat plate 8, and test probes 10 are mounted on both ends of the lower part of the bottom plate, and the test probes 10 are connected to the digital The current and voltage meter 9 is electrically connected, and the TVS diode is placed in the positioning groove 4 of the carrier 3 for limiting. The Z-axis linear module 7 is controlled to drive the test leads 10 at both ends to descend, thereby contacting the pins of the TVS tube for conductivity testing. The digital current and voltage meter 9 clearly and intuitively displays the measurement results. After that, the test leads 10 rise and reset. The stepper motor 6 is controlled to drive the carrier 3 to axially rotate a certain angle to replace the pin position of the TVS tube, and the TVS tube is tested for conductivity in another direction. It has the advantages of simple operation, high test efficiency and low labor cost. A control panel 11 is embedded on the front side of the seat plate 8, and the stepper motor 6 and the Z-axis linear module 7 are electrically connected to the control panel 11 respectively.

[0019] Specifically, a stepped hole 12 is provided on the table surface of the base 1 , and the planar thrust ball bearing 2 is installed in the stepped hole 12 .

[0020] In this embodiment, the stepped hole 12 is an assembly structure used for installing and fixing the planar thrust ball bearing 2. The planar thrust ball bearing 2 is a rolling bearing that bears axial loads and plays a supporting role in the mechanical rotating body, reducing friction during movement and ensuring rotation accuracy.

[0021] Specifically, the carrier 3 is installed in the stepped hole 12 , and the top of the carrier 3 is flush with the table surface of the base 1 .

[0022] In this embodiment, the carrier 3 is used to place the TVS diode to be tested, and the test operation can be carried out after it is positioned.

[0023] Specifically, the lower end of the rotating shaft 5 passes through the stepped hole 12 into the interior of the base 1 and is meshed and connected with the output shaft end of the stepping motor 6 through a gear.

[0024] In this embodiment, under the meshing action of the gears, the stepper motor 6 can drive the shaft 5 to rotate, thereby driving the carrier 3 to rotate axially.

[0025] Specifically, an external thread 13 is provided on the upper portion of the test lead 10 , and a locking nut 14 is threadedly connected through the external thread 13 .

[0026] In this embodiment, the external thread 13 is a connection structure for installing the test lead 10 , and the locking nut 14 is a fastener for fixing the test lead 10 .

[0027] Specifically, a strip-shaped hole 15 is provided at the lower portion of the base plate 8 , and the upper portion of the test lead 10 is sleeved in the strip-shaped hole 15 and fastened to the strip-shaped hole 15 via a locking nut 14 .

[0028] In this embodiment, if Figure 1 As shown in the figure, by loosening the locking nut 14, the position of the test lead 10 can be fine-tuned to adapt to the test of TVS diodes of more specifications. The digital current and voltage meter 9 can directly display the measurement results in digital form, with the characteristics of high precision and high resolution, and can achieve accurate measurement of voltage and current values.

[0029] During use, the TVS diode is placed in the positioning slot 4 of the carrier 3 for limiting, and the Z-axis linear module 7 is controlled to drive the test leads 10 at both ends to descend, thereby contacting the pins of the TVS tube for a conductivity test. The digital current and voltage meter 9 clearly and intuitively displays the measurement results. After that, the test lead 10 rises and resets, and the stepper motor 6 is controlled to drive the carrier 3 to axially rotate a certain angle to replace the pin position of the TVS tube, and the TVS tube is tested for conductivity in another direction. It has the advantages of simple operation, high test efficiency and low labor cost.

[0030] To sum up, the test device for TVS diode places the TVS diode into the positioning slot 4 of the carrier 3 for limiting, controls the Z-axis linear module 7 to drive the test leads 10 at both ends to descend, thereby contacting the pins of the TVS tube for conductivity test, and the digital current and voltage meter 9 clearly and intuitively displays the measurement results. After that, the test lead 10 rises and resets, and controls the stepper motor 6 to drive the carrier 3 to axially rotate a certain angle to replace the pin position of the TVS tube, and performs a conductivity test on the TVS tube in another direction. It has the advantages of simple operation, high test efficiency, and low labor cost.

[0031] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A test device for a TVS diode, comprising a base (1), characterized in that: A plane thrust ball bearing (2) is installed on the table of the base (1), and a carrier (3) is installed on the top of the plane thrust ball bearing (2), a positioning groove (4) is provided on the carrier (3), and a rotating shaft (5) is fixedly connected to the bottom of the carrier (3), a stepper motor (6) is installed in the base (1), and the output shaft end of the stepper motor (6) is transmission-connected to the rotating shaft (5) through a gear, a Z-axis linear module (7) is installed on the table of the base (1), and a seat plate (8) is installed on the slide of the Z-axis linear module (7), a digital current and voltage meter (9) is installed on the top of the seat plate (8), test probes (10) are installed at both ends of the lower part of the seat plate, and the test probes (10) are electrically connected to the digital current and voltage meter (9) through a wire, a control panel (11) is embedded on the front side of the seat plate (8), and the stepper motor (6) and the Z-axis linear module (7) are electrically connected to the control panel (11) respectively.

2. A TVS diode testing device according to claim 1, characterized in that: A stepped hole (12) is provided on the table surface of the base (1), and the plane thrust ball bearing (2) is installed in the stepped hole (12).

3. A TVS diode testing device according to claim 2, characterized in that: The carrier (3) is installed in the stepped hole (12), and the top of the carrier (3) is flush with the table surface of the base (1).

4. The TVS diode test device according to claim 2, wherein: The lower end of the rotating shaft (5) passes through the stepped hole (12) into the interior of the base (1) and is meshed and connected with the output shaft end of the stepping motor (6) through a gear.

5. The TVS diode test device according to claim 1, wherein: An external thread (13) is provided on the upper portion of the test probe (10), and a locking nut (14) is threadedly connected via the external thread (13).

6. The TVS diode test device according to claim 5, wherein: The lower portion of the seat plate (8) is provided with a strip hole (15), the upper portion of the test probe (10) is sleeved in the strip hole (15) and is fastened to the strip hole (15) via a locking nut (14).

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