Workpiece defect detection device

Abstract

The embodiment of the utility model relates to the technical field of non-standard automation, and particularly discloses a workpiece defect detection device, which comprises a fixed bracket, a detection device and a detection device, the image acquisition element is connected to the fixed bracket; the light path unit comprises a first protective cover, a first light source and a lens, the first protective cover is connected to the fixing support, the first light source is arranged on the side, close to the fixing support, of the first protective cover, and the lens is arranged on the side, away from the fixing support, of the first protective cover; the first light source is used for irradiating light to a to-be-detected workpiece, the lens is used for refracting the light irradiated by the first light source into parallel light so as to irradiate the to-be-detected workpiece with the parallel light, and the image acquisition element is used for acquiring image information of the workpiece irradiated by the first light source. According to the workpiece defect detection device, the detection effect of the workpiece defect detection device is improved, so that the detection efficiency of the workpiece defect detection device is improved, and finally the production efficiency of workpieces is improved.

Description

Technical Field

[0001] The present application relates to the field of non-standard automation technology, and in particular to a workpiece defect detection device. Background Art

[0002] In the field of non-standard automation, it is well known that detection devices of different structures are used to detect product defects. In the process of researching and implementing product defect detection, the applicant found that existing detection devices have at least the following problems:

[0003] Existing workpieces have chamfered surfaces, and the common light sources in existing inspection devices are all point sources, emitting diffuse light. This makes it difficult for these common light sources to detect defects on the chamfered surfaces. If the light source is too bright, the defects will also be illuminated. If the light source brightness is reduced, the defects on the workpiece surface will be the same as the chamfered arc, making them difficult to distinguish, resulting in low inspection efficiency. Therefore, how to improve the inspection efficiency of inspection devices has become an urgent problem to be solved. Utility Model Content

[0004] An embodiment of the present application provides a workpiece defect detection device to improve the detection efficiency of the detection device.

[0005] In order to solve the above technical problems, the embodiments of the present application disclose the following technical solutions:

[0006] In one aspect, a workpiece defect detection device is provided, comprising: a fixed bracket;

[0007] An image acquisition component is connected to a fixed bracket;

[0008] The optical path unit includes: a first protective cover, a first light source and a lens, the first protective cover is connected to the fixed bracket, the first light source is arranged on a side of the first protective cover close to the fixed bracket, and the lens is arranged on a side of the first protective cover away from the fixed bracket;

[0009] The first light source is used to irradiate light onto the workpiece to be inspected, the lens is used to refract the light irradiated by the first light source into parallel light so as to use the parallel light to illuminate the workpiece to be inspected, and the image acquisition element is used to collect image information of the workpiece after being illuminated by the first light source.

[0010] One of the above technical solutions has the following advantages or beneficial effects: the present application utilizes a lens to refract the light emitted by the first light source into parallel light, so as to utilize the parallel light to illuminate the workpiece to be inspected, so that the image information of the workpiece collected by the image acquisition element can clearly show whether there are defects on the surface of the workpiece, so as to better distinguish the defects of the workpiece, thereby improving the detection effect of the workpiece defect detection device, thereby improving the detection efficiency of the workpiece defect detection device, and ultimately improving the production efficiency of the workpiece; at the same time, the structure in the present application is easier to identify all undesirable defects of the workpiece, has a wide range of applications, and has broad application prospects. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] The following detailed description of the specific embodiments of the present application in conjunction with the accompanying drawings will make the technical solutions and other beneficial effects of the present application apparent.

[0012] Figure 1 is a three-dimensional structural view of a workpiece defect detection device provided according to an embodiment of the present application;

[0013] Figure 2 is a three-dimensional structural view from another perspective of the workpiece defect detection device provided in an embodiment of the present application;

[0014] Figure 3 This is an exploded structural view of a workpiece defect detection device provided according to an embodiment of the present application;

[0015] Figure 4 is a front view of an optical path unit provided according to an embodiment of the present application;

[0016] Figure 5 is a cross-sectional view of the optical path unit along the AA direction according to an embodiment of the present application;

[0017] Figure 6 This is a cross-sectional view of the workpiece defect detection device provided by an embodiment of the present application after the image acquisition element and the second protective cover are hidden;

[0018] Figure 7 This is a three-dimensional structural view of the workpiece defect detection device provided by an embodiment of the present application after the image acquisition element and the second protective cover are hidden;

[0019] Figure 8 This is a three-dimensional structural view from another perspective of the workpiece defect detection device provided in an embodiment of the present application, after the image acquisition element and the second protective cover are hidden.

[0020] Description of reference numerals:

[0021] 100. Workpiece defect detection device;

[0022] 110, fixing bracket; 111, first mounting portion; 112, second mounting portion;

[0023] 120. Image acquisition component;

[0024] 130, optical path unit; 131, first protective cover; 132, first light source; 133, lens; 134, adapter; 1341, first adapter; 1342, second adapter;

[0025] 140. Second light source;

[0026] 150. Adjust the drive;

[0027] 160, connecting plate;

[0028] 170. Second protective shield. DETAILED DESCRIPTION

[0029] In order to make the purpose, technical solutions and beneficial effects of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and specific implementation methods. It should be understood that the specific implementation methods described in this specification are only for the purpose of explaining this application and are not intended to limit this application.

[0030] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present application. In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the said features. In the description of the present application, the meaning of "multiple" refers to two or more, unless otherwise clearly and specifically defined.

[0031] In the description of this application, it should be noted that, unless otherwise expressly specified or limited, the terms "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections, direct connections, or indirect connections through an intermediate medium; they can refer to internal communication between two components or the interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in this application based on specific circumstances.

[0032] In this application, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Moreover, a first feature being "above," "above," and "above" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0033] In the examples of this application, refer to Figures 1 to 8 The present application provides a workpiece defect detection device 100, which has a first direction X, a second direction Y, and a third direction Z that intersect each other. Exemplarily, the workpiece defect detection device 100 has the first direction X, the second direction Y, and the third direction Z that are perpendicular to each other. "Perpendicular" refers to a state where the angle formed by a straight line, a straight line and a plane, or a plane and a plane is 89° to 91°.

[0034] Specifically, the workpiece defect detection device 100 includes: a fixing bracket 110 , an image acquisition element 120 and an optical path unit 130 .

[0035] Specifically, the image acquisition element 120 is connected to the fixed bracket 110; the optical path unit 130 includes: a first protective cover 131, a first light source 132 and a lens 133, the first protective cover 131 is connected to the fixed bracket 110, the first light source 132 is arranged on the side of the first protective cover 131 close to the fixed bracket 110, and the lens 133 is arranged on the side of the first protective cover 131 away from the fixed bracket 110.

[0036] Specifically, the first light source 132 is used to irradiate light onto the workpiece to be inspected, the lens 133 is used to refract the light irradiated by the first light source 132 into parallel light so as to use the parallel light to illuminate the workpiece to be inspected, and the image acquisition element 120 is used to collect image information of the workpiece after being illuminated by the first light source 132.

[0037] The image acquisition component 120 may be an industrial camera, but is not limited thereto.

[0038] The first light source 132 may be an LED light source, but is not limited thereto.

[0039] The lens 133 is a convex lens.

[0040] It is understandable that the surface of the existing workpiece product has a circular chamfer, and the ordinary light sources in the existing detection devices are all point light sources, and the irradiated light is diffuse, which makes the defects on the chamfered surface of the workpiece product difficult to be compatible with the ordinary light sources in the existing detection devices. If the light source is too bright, the defects will also be illuminated. If the brightness of the light source is weakened, the defect characteristics on the surface of the workpiece product will be the same as the chamfered arc, which is difficult to distinguish, resulting in low detection efficiency of the detection device.

[0041] The present application utilizes a lens 133 to refract the light emitted by the first light source 132 into parallel light, so as to utilize the parallel light to illuminate the workpiece to be inspected, so that the image information of the workpiece collected by the image acquisition element 120 can clearly show whether there are defects on the surface of the workpiece, so as to better distinguish the defects of the workpiece, improve the detection effect of the workpiece defect detection device 100, thereby improving the detection efficiency of the workpiece defect detection device 100, and ultimately improving the production efficiency of the workpiece; at the same time, the structure in the present application is easier to identify all bad defects of the workpiece, has a wide range of applications, and has broad application prospects.

[0042] In one embodiment, the workpiece defect detection device 100 further includes a controller (not shown), which is connected to the fixing bracket 110 and is electrically or wirelessly connected to the image acquisition element 120 .

[0043] Among them, the controller can be a conventional product or a conventional control chip or other conventional products that can realize the control function in this application, and there is no specific limitation in this application.

[0044] It can be understood that when it is necessary to perform defect detection on the workpiece, the workpiece to be inspected is placed at the inspection station, the first light source 132 irradiates light to the workpiece to be inspected, and the lens 133 refracts the light irradiated by the first light source 132 into parallel light, so as to use the parallel light to illuminate the workpiece to be inspected. The image acquisition element 120 collects image information of the workpiece after being illuminated by the first light source 132, and sends the collected image information to the control. After receiving the collected image information, the controller sends a control instruction to the subsequent corresponding mechanism according to the detection result. If the workpiece has no defects, the subsequent mechanism is controlled not to recycle the workpiece. If there are defects on the surface of the workpiece, the subsequent mechanism is controlled to recycle and process the workpiece.

[0045] In one embodiment, referring to Figures 1 to 5The optical path unit 130 further includes: an adapter 134 , the first protective cover 131 is connected to the fixing bracket 110 through the adapter 134 , and the adapter 134 can rotate relative to the fixing bracket 110 to adjust the installation angle of the optical path unit 130 .

[0046] The present application realizes the connection between the optical path unit 130 and the fixed bracket 110 by setting an adapter 134, and uses the adapter 134 to adjust the installation angle of the optical path unit 130, ensuring that the optical path unit 130 can irradiate parallel light to different parts of the workpiece and different models of workpieces, thereby expanding the detection range of the detection device and having a wide range of applications, making the workpiece defect detection device 100 universal.

[0047] In one embodiment, referring to Figures 1 to 5 The adapter 134 includes: a first adapter portion 1341 and a second adapter portion 1342 connected to each other; the first adapter portion 1341 is fixedly connected to the first protective cover 131, and the second adapter portion 1342 is rotatably connected to the fixed bracket 110, and the second adapter portion 1342 can be rotated relative to the fixed bracket 110 to adjust the installation angle of the optical path unit 130.

[0048] Among them, the first adapter part 1341 and the second adapter part 1342 can be integrally formed, that is, the first adapter part 1341 and the second adapter part 1342 are an integrated structure; the first adapter part 1341 and the second adapter part 1342 can also be separately provided, and the two are fixedly connected. For example, the first adapter part 1341 is fixedly connected to the second adapter part 1342 by a welding process. This is not specifically limited in this application and can be specifically set according to actual circumstances. For example, in this application, the first adapter part 1341 and the second adapter part 1342 can also be separately provided, and the first adapter part 1341 and the second adapter part 1342 are screwed together by bolts.

[0049] This application uses the second adapter part 1342 to adjust the installation angle of the optical path unit 130, ensuring that the optical path unit 130 illuminates different parts of the workpiece and different models of workpieces with parallel light, thereby expanding the detection range of the detection device and having a wide range of applications, making the workpiece defect detection device 100 universal.

[0050] In one embodiment, referring to Figures 1 to 3 The fixed bracket 110 includes: a first mounting portion 111 and a second mounting portion 112 that are connected to each other. The first mounting portion 111 and the second mounting portion 112 are arranged sequentially in the first direction X. The image acquisition element 120 is connected to the first mounting portion 111. The second adapter portion 1342 is rotatably connected to the second mounting portion 112 to facilitate the overall installation of the workpiece defect detection device 100 and improve the assembly efficiency of the workpiece defect detection device 100.

[0051] Among them, the first mounting portion 111 and the second mounting portion 112 can be integrally formed, that is, the first mounting portion 111 and the second mounting portion 112 are an integrated structure; the first mounting portion 111 and the second mounting portion 112 can also be provided separately, and the two are fixedly connected. For example, the first mounting portion 111 is fixedly connected to the second mounting portion 112 by a welding process. This is not specifically limited in this application and can be specifically set according to actual circumstances. For example, in this application, the first mounting portion 111 and the second mounting portion 112 can also be provided separately, and the first mounting portion 111 and the second mounting portion 112 are screwed together by bolts.

[0052] In one embodiment, referring to Figures 4 to 6 The protective cover 131 has an axis O, the first light source 132 and the lens 133 are sequentially arranged along the extension direction of the axis O, and the axis O is arranged at an angle to the first direction X.

[0053] Specifically, the angle α between the axis O and the first direction X satisfies: 45°≤α≤55°. That is, the angle α between the axis O and the first direction X can be controlled within the range of 45° to 55°. For example, α can be one of 45°, 46°, 47°, 48°, 49°, 50°, 51°, 52°, 53°, 54° or 55°, or a range consisting of any two of them. The above specific values ​​of α are given for example only, and any value within the range of 45° to 55° is within the scope of protection of this application.

[0054] The angle α between the axis O and the first direction X is the installation angle of the optical path unit 130 .

[0055] The angle α between the axis O and the first direction X can be obtained by using an image acquisition tool (camera) to capture image information of the workpiece defect detection device 100 along the third direction Y, creating an auxiliary line of the axis O and an auxiliary line parallel to the first direction X in the image information, and measuring the angle between the two auxiliary lines multiple times using a measuring tool to calculate the average value. The measuring tool can be any one of a protractor and other dimensional measuring instruments, but is not limited thereto.

[0056] The present application limits the angle α between the axis O and the first direction X to within the range of 45° to 55°, that is, limits the installation angle of the optical path unit 130 to within the range of 45° to 55°, so as to ensure that the workpiece defect detection device 100 adjusts the installation angle of the optical path unit 130 according to different workpieces, so that the optical path unit 130 in the workpiece defect detection device 100 can irradiate parallel light to different parts of the workpiece and different models of workpieces, thereby expanding the detection range of the workpiece defect detection device 100 and having a wide range of applicability, making the workpiece defect detection device 100 universal.

[0057] In one embodiment, referring to Figures 4 and 5 , the distance between the first light source 132 and the lens 133 is H mm, satisfying: 90 ≤ H ≤ 100. That is, the distance H mm between the first light source 132 and the lens 133 can be controlled within the range of 90 mm to 100 mm. For example, H mm can be one of 90 mm, 91 mm, 92 mm, 93 mm, 94 mm, 95 mm, 96 mm, 97 mm, 98 mm, 99 mm, or 100 mm, or a range consisting of any two of them. The above specific values ​​of H mm are given for example only; any value within the range of 90 mm to 100 mm is within the scope of protection of this application.

[0058] The distance H mm between the first light source 132 and the lens 133 can be obtained by measuring the distance between the first light source 132 and the lens 133 multiple times using a measuring tool and calculating the average value. The measuring tool can be any one of a ruler, a vernier caliper, or other dimension measuring instruments, but is not limited thereto.

[0059] The present application limits the distance H mm between the first light source 132 and the lens 133 to be within the range of 90 mm to 100 mm, so as to reasonably design the structural dimensions between the first light source 132 and the lens 133, thereby ensuring that the lens 133 can refract the light irradiated by the first light source 132 into parallel light, thereby improving the detection effect of the workpiece defect detection device 100, thereby improving the detection efficiency of the workpiece defect detection device 100.

[0060] In one embodiment, referring to Figures 1 to 3 There are multiple image acquisition elements 120, and the multiple image acquisition elements 120 are arranged at intervals in the second direction Y; there are multiple groups of optical path units 130, and the multiple groups of optical path units 130 are arranged at intervals in the second direction Y.

[0061] It can be understood that the present application improves the detection efficiency of the workpiece defect detection device 100 by providing multiple image acquisition elements 120 and multiple groups of optical path units 130 to simultaneously detect multiple workpieces using multiple image acquisition elements 120 and multiple groups of optical path units 130.

[0062] In one embodiment, the installation angles of the multiple groups of optical path units 130 may be different from each other, so as to ensure that the workpiece defect detection device 100 can detect multiple different workpieces at the same time, further improving the detection efficiency of the workpiece defect detection device 100.

[0063] In one embodiment, referring to Figures 1 to 3The workpiece defect detection device 100 also includes: multiple second protective covers 170, which cover the outer periphery of a corresponding image acquisition element 120 to prevent other components from damaging the image acquisition element 120, ensure the use of the image acquisition element 120, and improve the service life of the image acquisition element 120.

[0064] In one embodiment, referring to Figures 1 to 3 、 Figures 7 and 8 , the image acquisition element 120 is arranged along the third direction Z.

[0065] The workpiece defect detection device 100 also includes: multiple second light sources 140 and an adjustment driver 150. The multiple second light sources 140 are connected to the fixed bracket 110 through a connecting plate 160, and each second light source 140 is respectively arranged between a corresponding image acquisition element 120 and the workpiece to be detected; the adjustment driver 150 is connected to the fixed bracket 110, and the adjustment driver 150 is arranged along the third direction Z, and the power output end of the adjustment driver 150 is transmission-connected to the connecting plate 160, and the adjustment driver 150 is used to drive the second light source 140 to move along the third direction Z.

[0066] The adjustment driver 150 may be a drive motor or a drive cylinder, but is not limited thereto.

[0067] It can be understood that the present application sets a second light source 140 to utilize the second light source 140 to synchronously illuminate the workpiece, further facilitating the image acquisition component 120 to collect clear and correct image information, thereby improving the detection effect of the workpiece defect detection device 100; at the same time, the present application drives the second light source 140 to move along the third direction Z by adjusting the driver 150 to adjust the relative position of the second light source 140 to ensure the illumination effect of the second light source 140 on the workpiece, further facilitating the image acquisition component 120 to collect clear and correct image information, thereby improving the detection effect of the workpiece defect detection device 100.

[0068] The above steps are merely provided to help understand the method, structure, and core concept of the present application. A person skilled in the art may make several improvements and modifications to the present application without departing from the principles of the present application, and such improvements and modifications also fall within the scope of protection of the claims of the present application.

Claims

1. A workpiece defect detection device, characterized in that: include: Fixed bracket; An image acquisition element is connected to the fixing bracket; An optical path unit, the optical path unit comprising: a first protective cover, a first light source, and a lens, the first protective cover being connected to the fixing bracket, the first light source being disposed on a side of the first protective cover close to the fixing bracket, and the lens being disposed on a side of the first protective cover away from the fixing bracket; The first light source is used to irradiate light onto the workpiece to be inspected, the lens is used to refract the light irradiated by the first light source into parallel light so as to illuminate the workpiece to be inspected with the parallel light, and the image acquisition element is used to acquire image information of the workpiece after being illuminated by the first light source.

2. The workpiece defect detection device according to claim 1, wherein: The lens is a convex lens.

3. The workpiece defect detection device according to claim 1, wherein: The optical path unit further includes a transition piece, through which the first protective cover is connected to the fixing bracket, and the transition piece can rotate relative to the fixing bracket to adjust the installation angle of the optical path unit.

4. The workpiece defect detection device according to claim 3, wherein: The adapter comprises: a first adapter portion and a second adapter portion connected to each other; The first adapter is fixedly connected to the first protective cover, and the second adapter is rotatably connected to the fixing bracket. The second adapter can rotate relative to the fixing bracket to adjust the installation angle of the optical path unit.

5. The workpiece defect detection device according to claim 4, wherein: The workpiece defect detection device has a first orientation; The fixing bracket includes: a first mounting portion and a second mounting portion that are connected to each other. The first mounting portion and the second mounting portion are arranged sequentially in the first direction. The image acquisition element is connected to the first mounting portion, and the second adapter portion is rotatably connected to the second mounting portion.

6. The workpiece defect detection device according to claim 5, wherein: The protective cover has an axis, the first light source and the lens are sequentially arranged along an extension direction of the axis, and the axis is arranged at an angle to the first direction; The angle α between the axis and the first direction satisfies: 45°≤α≤55°.

7. The workpiece defect detection device according to any one of claims 1 to 6, characterized in that: The distance between the first light source and the lens is H mm, which satisfies: 90≤H≤100.

8. The workpiece defect detection device according to claim 1, wherein: The workpiece defect detection device has a second orientation; There are a plurality of image acquisition elements, and the plurality of image acquisition elements are spaced apart in the second direction; The optical path units are provided in a plurality of groups, and the plurality of groups of optical path units are arranged at intervals in the second direction.

9. The workpiece defect detection device according to claim 8, wherein: Also includes: A plurality of second protective covers are provided, wherein the plurality of second protective covers cover the outer periphery of a corresponding one of the image acquisition elements.

10. The workpiece defect detection device according to claim 8, wherein: The workpiece defect detection device further has a third direction intersecting with the second direction; The image acquisition element is arranged along the third direction; The workpiece defect detection device further includes: a plurality of second light sources, each of which is connected to the fixing bracket via a connecting plate, and each of the second light sources is respectively arranged between a corresponding one of the image acquisition elements and the workpiece to be detected; as well as An adjusting driver is connected to the fixing bracket, the adjusting driver is arranged along the third direction, and the power output end of the adjusting driver is transmission-connected to the connecting plate, and the adjusting driver is used to drive the second light source to move along the third direction.

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