Testing device and circuit for aging test of power supply product

Abstract

The utility model provides a test device and circuit for aging test of a power supply product, and the device comprises a main control chip, a storage chip, a display circuit, a function key, an input isolation circuit, a sound-light alarm circuit, and a temperature sensor. The isolation circuit is used for receiving an output signal of a to-be-aged test product and carrying out numerical detection on the output signal, the sound-light alarm circuit is used for carrying out sound-light alarm after abnormity is detected, the display circuit is used for displaying and feeding back test timing time, and the storage chip is used for storing temperature values and voltage values of all circuits in a test. The main control chip is used for carrying out data receiving and control on the testing device circuit, and the function key is used for starting and stopping testing.

Description

TECHNICAL FIELD

[0001] The utility model relates to power supply product technical field more specifically, relate to a test device and circuit for power supply product aging test. BACKGROUND

[0002] Aging test refers to the process of strengthening the experiment under corresponding conditions by simulating various factors involved in the actual use of the product to cause the aging of the product, which can test whether a product meets the normal use standard range, that is, whether the product quality is qualified, and verify the product stability and find out the product quality problem in time.

[0003] In the prior art, the aging test often only adds appropriate load to simulate high load work at the output end of the power supply product, records the start time of the test, and needs to pay attention to the power supply working state at any time. Once the power supply product fails or power failure occurs during the test, it is difficult to record the relevant state of the aging test (such as aging time, circuit and part temperature rise that need to be focused on) in time, and the probability of re-performing the aging test increases, which is time-consuming and laborious, and greatly reduces the test efficiency.

[0004] Therefore, the utility model provides a test device and circuit for power supply product aging test which can timely feedback and store test data. UTILITY MODEL CONTENT

[0005] The utility model provides a test device and circuit for power supply product aging test which can timely feedback and store test data.

[0006] A test device circuit for power supply product aging test, comprising a main control chip, a storage chip, a display circuit, a function button, an input isolation circuit, an audible and visual alarm circuit and a temperature sensor, characterized in that: the output end of the product to be aged is connected with the input end of the temperature sensor and the input end of the isolation circuit, the output end of the function button, the output end of the temperature sensor and the output end of the input isolation circuit are connected with the input end of the main control chip, the output end of the main control chip is connected with the input end of the audible and visual alarm circuit and the input end of the display circuit, the main control chip is bidirectionally connected with the storage chip, the temperature sensor is used for receiving the temperature value of the product to be aged, the isolation circuit is used for receiving the output signal of the product to be aged and detecting the value, the audible and visual alarm circuit is used for alarming after detecting the abnormality, the display circuit is used for displaying the feedback test timing time, the storage chip is used for storing the temperature value and voltage value of each circuit in the test, the main control chip is used for receiving and controlling the data of the test device circuit, and the function button is used for starting and stopping the test.

[0007] Further, the input isolation circuit comprises a U1 optocoupler, a BD bridge rectifier, the collector of the output end of the U1 optocoupler is connected with the output end of the main control chip and the positive pole of the power supply respectively, the emitter of the output end of the U1 optocoupler is connected with the negative pole of the power supply, the negative pole of the input light emitting tube of the U1 optocoupler is connected with the output negative pole of the BD bridge rectifier, the positive pole of the input light emitting tube of the U1 optocoupler is connected with the output positive pole of the BD bridge rectifier, and the input end of the BD bridge rectifier is connected with the output end of the product to be aged.

[0008] Further, a resistor R1 is arranged between the collector of the output end of the U1 optocoupler and the positive pole of the power supply, and the resistor R1 functions as a pull-up resistor.

[0009] Further, a resistor R2 is arranged between the positive pole of the input light emitting tube of the U1 optocoupler and the output positive pole of the BD bridge rectifier, and the resistor R2 functions as a voltage dividing resistor.

[0010] Further, a resistor R4 and a resistor R5 are arranged between the negative pole of the input light emitting tube of the U1 optocoupler and the output negative pole of the BD bridge rectifier in sequence, and the resistor R4 and the resistor R5 function as voltage dividing resistors.

[0011] In some embodiments, the function keys comprise a SW1 start switch, a SW2 pause switch, a SW3 clear switch, and a SW4 query switch.

[0012] A test device for aging test of power supply products, comprising a main control module, a storage module, a display module, a function key module, an input isolation module, an audible and light alarm module, and a temperature sensor module, the output end of the function key module, the output end of the temperature sensor module, and the output end of the input isolation module are connected with the input end of the main control module, the output end of the main control module is connected with the input end of the audible and light alarm module and the input end of the display module, the main control module is bidirectionally connected with the storage module, the temperature sensor module is used for receiving the temperature value of the product to be aged, the isolation module is used for receiving the output signal of the product to be aged and detecting the value, the audible and light alarm module is used for alarming when an abnormality is detected, the display module is used for displaying the feedback test timing, the storage module is used for storing the temperature value and the voltage value of each circuit during the test, the main control module is used for receiving and controlling the data of the test device circuit, and the function key module is used for starting and stopping the test.

[0013] Further, the function key module comprises a start key, a pause key, a clear key, and a query key.

[0014] The utility model discloses a beneficial effect: the utility model provides a kind of test device and circuit for power supply product ageing test, through main control module, storage module, display module, function button module, input isolation module, audible and visual alarm module, temperature sensor module, once input isolation module detects that input voltage signal appears exception, main control module just suspends ageing test timing and records voltage, temperature signal during testing and relevant data are saved in storage module, and can be inquired to the relevant latest data saved in storage module by function button module, guarantee the traceability of data. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 It is a structural schematic diagram of the test device for power supply product ageing test of the application.

[0016] Figure 2 It is the circuit schematic diagram of the input isolation circuit of the application.

[0017] The following specific embodiments will further illustrate the utility model in conjunction with the above drawings. DETAILED DESCRIPTION

[0018] The following embodiments are described to assist in the understanding of the application, the embodiments are not and should not be interpreted as limiting the protection scope of the application in any way.

[0019] In the following description, those skilled in the art will recognize that components can be described as separate functional units (which can include sub-units), but those skilled in the art will recognize that various components or portions thereof can be divided into separate components, or can be integrated together (including integrated within a single system or component).

[0020] At the same time, the connection between components or systems is not intended to be limited to direct connection, on the contrary, data between these components can be modified, reformatted, or otherwise changed by intermediate components. In addition, additional or fewer connections can be used. It should also be noted that the term "coupled", "connected", or "input" should be understood to include direct connection, indirect connection through one or more intermediate devices, and wireless connection.

[0021] Example 1:

[0022] A kind of test device circuit for power supply product aging test, including master chip, storage chip, display circuit, function button, input isolation circuit, audible and visual alarm circuit, temperature sensor, it is characterized in that: the output end of the aging test product to be connected with temperature sensor input, isolation circuit input connection, the function button output end, temperature sensor output, input isolation circuit output all are connected with the input end of master chip, the output end of master chip is connected with the input end of audible and visual alarm circuit, display circuit input, master chip is bidirectionally connected with storage chip, temperature sensor is used to receive the temperature value of the output aging test product to be, isolation circuit is used to receive the output signal of the aging test product to be and carry out numerical detection, audible and visual alarm circuit is used to carry out audible and visual alarm after detecting exception, display circuit is used to display feedback test timing time, storage chip is used to carry out implementation storage to the temperature value, voltage value of each circuit in test, master chip is used to carry out data reception and control to test device circuit, function button is used to start and stop test, and function button includes SW1 start switch, SW2 pause switch, SW3 clear switch, SW4 inquiry switch;

[0023] Specifically, when the aging test product to be needs to be aged, the power switch is opened, the temperature sensor is attached to the surface of the key attention circuit or part of the aging test product to be, the output end of the aging test product to be is connected with the isolation circuit and connected with power, SW1 start switch is pressed, and the present test starts timing, while the timing time is displayed in the display circuit, the temperature value of the key attention circuit or part of the aging test product to be is collected by the temperature sensor and is recorded in the storage chip in real time, if it is needed to pause test halfway, SW2 pause switch can be pressed to pause timing, and the real-time temperature and voltage recording are paused, SW3 clear switch is pressed to clear the current displayed data, and SW1 start switch is pressed at this time to retime and record the real-time temperature and voltage value.Any time, SW4 inquiry switch is pressed to query the latest voltage value and temperature value.

[0024] When the power supply product aging test, if the function button is not pressed under any key, once the aging test product stops output, the input isolation circuit will detect input exception, and the signal is transmitted to the master chip, the master chip triggers audible and visual alarm circuit, and audible and visual alarm is carried out, reminding the operator, and the master chip stops timing and triggers storage chip to stop recording voltage and temperature value, so that the automation operation of power supply product aging test is realized, and the accident of not timely recording is avoided.

[0025] For example Figure 2As shown, the input isolation circuit includes a U1 photoelectric coupler and a BD bridge rectifier. The collector of the output end of the U1 photoelectric coupler is respectively connected to the output end of the main control chip and the positive pole of the power supply. The emitter of the output end of the U1 photoelectric coupler is connected to the negative end of the power supply. The negative end of the input light-emitting tube of the U1 photoelectric coupler is connected to the negative output end of the BD bridge rectifier. The positive end of the input light-emitting tube of the U1 photoelectric coupler is connected to the positive output end of the BD bridge rectifier. The input end of the BD bridge rectifier is connected to the output end of the product to be aging tested.

[0026] A resistor R1 is further provided between the collector of the output end of the U1 photoelectric coupler and the positive pole of the power supply, and the resistor R1 plays a pull-up role; a resistor R2 is provided between the positive terminal of the U1 photoelectric coupler input light-emitting tube and the positive output terminal of the BD bridge rectifier, and the resistor R2 plays a voltage-dividing forward voltage drop role; resistors R4 and R5 are provided in sequence between the negative terminal of the U1 photoelectric coupler input light-emitting tube and the negative output terminal of the BD bridge rectifier, and the resistors R4 and R5 play a voltage-dividing forward voltage drop role; the memory chip is a universal memory chip; the main control chip is a universal main control microcontroller;

[0027] Specifically, the output of the product under aging test is connected to IN1 and IN2 (if the output voltage is DC, polarity is not a concern). When the power supply output of the product under aging test is normal, the BD bridge rectifier will output a polarized voltage. This voltage passes through resistors R2, R3, R4, and R5, which divide it down to provide a current-limited forward voltage drop at the input of the U1 optocoupler. At this time, the light-emitting diode of the U1 optocoupler turns on and triggers the output, pulling the voltage of the main control chip pin down to a low level of approximately 0.3V. Resistor R1 acts as a pull-up resistor. After receiving the pin-pulling-down signal, the main control chip executes control according to the execution logic.

[0028] like Figure 1 As shown, a test device for aging test of power supply products includes a main control module, a storage module, a display module, a function key module, an input isolation module, an sound and light alarm module, and a temperature sensor module. The output end of the function key module, the output end of the temperature sensor module, and the output end of the input isolation module are all connected to the input end of the main control module, the output end of the main control module is connected to the input end of the sound and light alarm module and the input end of the display module, the main control module and the storage module are bidirectionally connected, the temperature sensor module is used to receive and output the temperature value of the product to be tested for aging, the isolation module is used to receive the output signal of the product to be tested for aging and perform numerical detection on it, the sound and light alarm module is used to issue an sound and light alarm after detecting an abnormality, the display module is used to display the feedback test timing time, the storage module is used to store the temperature value and voltage value of each circuit in the test, the main control module is used to receive and control the test device circuit, and the function key module is used to start and stop the test.

[0029] The function key module includes a start key, a pause key, a clear key, and an inquiry key.

[0030] Although several aspects and embodiments have been disclosed, other aspects and embodiments will be apparent to those skilled in the art from the above disclosure, and modifications and improvements will occur to the skilled practitioner. All such modifications and improvements are within the scope of the application. The aspects and embodiments disclosed herein are for purposes of illustration only and are not intended to limit the scope of the application, which is set forth in the claims.

Claims

1. A test device circuit for aging testing of power supply products, comprising a main control chip, a memory chip, a display circuit, function keys, an input isolation circuit, an audible and visual alarm circuit, and a temperature sensor, characterized in that: The output end of the product to be tested for aging is connected to the input end of the temperature sensor and the input end of the isolation circuit. The output end of the function button, the output end of the temperature sensor, and the output end of the input isolation circuit are all connected to the input end of the main control chip. The output end of the main control chip is connected to the input end of the sound and light alarm circuit and the input end of the display circuit. The main control chip is bidirectionally connected to the storage chip. The temperature sensor is used to receive and output the temperature value of the product to be tested for aging. The isolation circuit is used to receive the output signal of the product to be tested for aging and perform numerical detection on it. The sound and light alarm circuit is used to issue an sound and light alarm after detecting an abnormality. The display circuit is used to display the feedback test timing time. The storage chip is used to store the temperature value and voltage value of each circuit in the test. The main control chip is used to receive and control the test device circuit. The function button is used to start and stop the test.

2. The test device circuit for power supply product aging test according to claim 1, characterized in that: The input isolation circuit includes a U1 photoelectric coupler and a BD bridge rectifier. The collector of the output end of the U1 photoelectric coupler is respectively connected to the output end of the main control chip and the positive pole of the power supply. The emitter of the output end of the U1 photoelectric coupler is connected to the negative end of the power supply. The negative end of the input light-emitting tube of the U1 photoelectric coupler is connected to the negative output end of the BD bridge rectifier. The positive end of the input light-emitting tube of the U1 photoelectric coupler is connected to the positive output end of the BD bridge rectifier. The input end of the BD bridge rectifier is connected to the output end of the product to be aging tested.

3. The test device circuit for power supply product aging test according to claim 2, characterized in that: A resistor R1 is also provided between the collector of the output end of the U1 photocoupler and the positive pole of the power supply, and the resistor R1 plays a pull-up role.

4. The test device circuit for power supply product aging test according to claim 2, characterized in that: A resistor R2 is provided between the positive terminal of the U1 photoelectric coupler input light-emitting diode and the positive terminal of the BD bridge rectifier output. The resistor R2 acts as a voltage divider for the forward voltage drop.

5. The test device circuit for power supply product aging test according to claim 1, characterized in that: Resistors R4 and R5 are provided between the negative terminal of the U1 photoelectric coupler input light-emitting diode and the negative terminal of the BD bridge rectifier. Resistors R4 and R5 play the role of dividing the forward voltage drop.

6. The test device circuit for power supply product aging test according to claim 1, characterized in that: The function keys include SW1 start switch, SW2 pause switch, SW3 reset switch, and SW4 query switch.

7. A test device for aging test of power supply products, characterized in that: The invention comprises a test device circuit for aging test of power supply products as described in any one of claims 1 to 6, comprising a main control module, a storage module, a display module, a function key module, an input isolation module, an sound and light alarm module, and a temperature sensor module. The output end of the function key module, the output end of the temperature sensor module, and the output end of the input isolation module are all connected to the input end of the main control module, the output end of the main control module is connected to the input end of the sound and light alarm module and the input end of the display module, the main control module and the storage module are bidirectionally connected, the temperature sensor module is used to receive and output the temperature value of the product to be aged. The isolation module is used to receive the output signal of the product to be aged and perform numerical detection on it. The sound and light alarm module is used to perform sound and light alarm after detecting an abnormality. The display module is used to display the feedback test timing time. The storage module is used to store the temperature value and voltage value of each circuit in the test. The main control module is used to receive and control the test device circuit. The function key module is used to start and stop the test.

8. The testing device for aging testing of power supply products according to claim 7, characterized in that: The function button module includes a start button, a pause button, a reset button, and a query button.

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