LCR belt buffering and adjusting device
By designing an LCR buffer and adjustable device, the problems of difficult probe adjustment and lack of buffering were solved, achieving precise probe adjustment and contact buffering, and improving probe life and measurement accuracy.
Patent Information
- Application Number
- CN202422718036.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-08
- Publication Date
- 2025-11-11
- Estimated Expiration
- 2034-11-08
AI Technical Summary
The existing LCR probe mechanism is difficult to adjust and lacks buffer when in contact with the workpiece, which leads to premature wear, bending or breakage of the probe tip, affecting the probe life and measurement pass rate.
An LCR buffer and adjustable device was designed, including a support plate, a carrier plate, a driving component, a probe assembly, and a buffer assembly. The driving component drives the carrier plate and the probe assembly to move, and combined with the fine-tuning component and the buffer assembly, the probe can be precisely adjusted and the contact buffer can be achieved.
This allows for precise adjustment of the probe to a coplanar position, improving probe lifespan, measurement flexibility and accuracy, and significantly enhancing measurement precision.
Smart Images
Figure CN223538907U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the technical field of LCR testing equipment, specifically to an LCR buffer and adjustable device. Background Technology
[0002] The feeding machine is an essential piece of machinery in the process of splicing material strips. It can prevent employees from splicing inconsistent material strips. Therefore, the feeding machine has been equipped with a measurement function. The existing feeding machine has a fixed LCR probe mechanism, which makes probe adjustment difficult. It is difficult to adjust the tips of the A and B probes to be coplanar (XY horizontal plane and YZ vertical plane). When the probe contacts the workpiece being measured, the tip is prone to premature wear, bending or breakage due to the lack of buffer, which affects the probe life and measurement pass rate. Therefore, there is a need to provide an adjustable device with a simplified structure, easy probe adjustment, and buffer when in contact with the workpiece. Utility Model Content
[0003] To address the shortcomings of existing technologies, this invention provides a novel LCR buffer and adjustable device to solve the problem of inconvenient LCR probe adjustment in existing technologies.
[0004] To achieve the above objectives, the present invention adopts the following technical solution:
[0005] An LCR with buffer and adjustable device for making the probe adjustable and providing buffer when in contact with the workpiece, includes a support plate, a carrier plate, a first driving member, a second driving member, a first probe assembly, and a second probe assembly. The carrier plate is slidably disposed on the support plate, and the first driving member is disposed on the top of the support plate, with its working end connected to the carrier plate to drive the carrier plate to move up and down.
[0006] The first probe assembly is slidably disposed on the bottom of the support plate, and the second driving member is disposed on the support plate. Its working end is connected to the first probe assembly through a buffer assembly to drive the first probe assembly to move left and right.
[0007] A fine-tuning component is provided at the end of the support plate away from the second driving member, and the second probe component is disposed on the fine-tuning component so as to adjust the position of the second probe component through the fine-tuning component.
[0008] Furthermore, the support plate has an L-shaped structure. The vertical plate of the L-shaped support plate is provided with a first slide rail along its own height direction and is slidably connected to the support plate through the first slide rail. The horizontal plate of the L-shaped support plate is provided with a second slide rail along its own length direction and is slidably connected to the first probe assembly through the second slide rail.
[0009] Furthermore, the first driving component includes a first driving motor, a first driving screw, and a first photoelectric sensor. The first driving motor is fixed to the top of the support plate, the working end of the first driving motor is connected to the first driving screw, the nut seat of the first driving screw is connected to the bearing plate, and the first photoelectric sensor is disposed on the side of the vertical plate portion of the bearing plate.
[0010] Furthermore, the second driving component includes a second driving motor, a second driving screw, and a second photoelectric sensor. The second driving motor is fixed to the bottom of the vertical plate portion of the support plate. The working end of the second driving motor is connected to the second driving screw. A needle seat is provided on the nut seat of the second driving screw, and the needle seat is connected to the buffer assembly. The second photoelectric sensor is disposed on the side of the horizontal plate portion of the support plate.
[0011] Furthermore, the buffer assembly includes a spring seat and a slider seat. The spring seat is fixed to one end of the pin seat provided on the second driving member. A buffer groove is formed at one end of the slider seat near the spring seat. An elastic element is provided on the side wall of the buffer groove away from the spring seat. The end of the spring seat near the slider seat extends into the buffer groove and contacts the elastic element.
[0012] Furthermore, the first probe assembly is disposed on the side of the slider seat away from the spring seat, the extension portion of the spring seat is a linkage block, the linkage block is slidably disposed in the buffer groove, and the width of the linkage block is smaller than the groove width of the buffer groove.
[0013] Furthermore, the fine-tuning component includes a mounting base, a first fine-tuning element, and a second fine-tuning element. The mounting base is disposed at the end of the support plate away from the second driving element. The first fine-tuning element and the second fine-tuning element are respectively disposed on opposite sides of the mounting base. The second probe assembly is disposed on the second fine-tuning element.
[0014] Furthermore, the first fine-tuning component includes a first fine-tuning seat and a first fine-tuning screw. The upper part of the first fine-tuning seat is connected to one end of the support plate near the mounting base. The lower part of the first fine-tuning seat is provided with a first fine-tuning screw hole. The first fine-tuning screw passes through the first fine-tuning screw hole and is connected to the mounting base.
[0015] Furthermore, the second fine-tuning component includes a second fine-tuning seat, a fine-tuning block, and a second fine-tuning screw. The second fine-tuning seat is disposed on the upper side of the mounting base, the fine-tuning block passes through the mounting base, the second fine-tuning seat is provided with a second fine-tuning screw hole, the second fine-tuning screw passes through the second fine-tuning screw hole and is connected to the top of the fine-tuning block, and the second probe assembly is connected to the fine-tuning block.
[0016] Furthermore, a camera mounting base is provided on the upper part of the support plate, and a camera assembly is provided on the camera mounting base. The camera assembly is located above the first probe assembly and the second probe assembly. An illumination mounting plate is provided on the upper part of the support plate, and an illumination assembly is provided at the bottom of the illumination mounting plate. The illumination assembly is located on the side of the first probe assembly and the second probe assembly.
[0017] Compared to existing technologies, the advantages of this invention are that, by adopting the above solution, the structure is simple and suitable for the LCR probe mechanism of a receiving machine. In use, the first driving component moves the support plate up and down, enabling the first and second probe assemblies to move vertically, thus achieving Z-axis adjustment. The second probe assembly is then fine-tuned in the Y and Z directions via a fine-tuning component, allowing the probe tip to be precisely adjusted to a coplanar plane, i.e., the XY horizontal plane and the YZ vertical plane. The second driving component then moves the first probe assembly left and right to achieve X-axis adjustment, with buffering provided by a buffering component. During measurement, the probe contacts the workpiece with buffering, improving probe lifespan and measurement flexibility. The adjustable probe significantly improves measurement accuracy and precision, making it highly valuable for market applications. Attached Figure Description
[0018] Figure 1 This is a schematic diagram of the structure of an LCR band buffer and adjustable device according to an embodiment of this utility model;
[0019] Figure 2 For the present utility model Figure 1 Schematic diagrams of the first and second driving components in the embodiment;
[0020] Figure 3 For the present utility model Figure 1 A schematic diagram of the structure of the fine-tuning component in the embodiment;
[0021] Figure 4 For the present utility model Figure 1 A schematic diagram of the buffer component in the embodiment;
[0022] Figure 5 For the present utility model Figure 1 A schematic diagram of the support plate in the embodiment;
[0023] In the diagram, 1. Support plate; 11. Camera mount; 12. Camera assembly; 13. Lighting mount; 14. Lighting assembly; 2. Bearing plate; 21. First slide rail component; 22. Second slide rail component; 3. First drive component; 31. First drive motor; 32. First drive screw; 33. First photoelectric sensor; 4. Second drive component; 41. Second drive motor; 42. Second photoelectric sensor; 43. Second drive screw; 44. Needle seat; 5. First probe assembly; 6. Second probe assembly; 7. Buffer assembly; 71. Spring seat; 72. Slider seat; 73. Buffer groove; 74. Elastic component; 75. Linkage block; 8. Fine-tuning assembly; 81. Mounting base; 82. First fine-tuning component; 83. Second fine-tuning component; 84. First fine-tuning seat; 85. First fine-tuning screw; 86. Second fine-tuning screw; 87. Second fine-tuning seat; 88. Fine-tuning block. Detailed Implementation
[0024] To facilitate understanding of this utility model by those skilled in the art, specific embodiments of this utility model are described below with reference to the accompanying drawings. Preferred embodiments of this utility model are shown in the drawings. However, this utility model can be implemented in many different forms and is not limited to the embodiments described in this specification. Rather, these embodiments are provided to provide a more thorough and complete understanding of the disclosure of this utility model.
[0025] It should be noted that when a component is referred to as being "fixed to" another component, it can be directly attached to the other component or there may be an intervening component. When a component is referred to as being "connected to" another component, it can be directly connected to the other component or there may be an intervening component. The terms "mounted," "fixed," "top," "connected," and similar expressions used in this specification are for illustrative purposes only.
[0026] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the invention.
[0027] One embodiment of this utility model is as follows: Figure 1As shown, this LCR with buffer and adjustable device is used to make the probe adjustable and provide buffering when in contact with the workpiece. It includes: a support plate 1, a carrier plate 2, a first driving member 3, a second driving member 4, a first probe assembly 5, and a second probe assembly 6. The carrier plate 2 is slidably disposed on the support plate 1. The first driving member 3 is disposed on the top of the support plate 1, and its working end is connected to the carrier plate 2 to drive the carrier plate 2 to move up and down. The first probe assembly 5 is slidably disposed on the bottom of the carrier plate 2. The second driving member 4 is disposed on the carrier plate 2, and its working end is connected to the first probe assembly 5 through a buffer assembly 7 to drive the first probe assembly 5 to move left and right. A fine-tuning assembly 8 is disposed at the end of the carrier plate 2 away from the second driving member 4, and the second probe assembly 6 is disposed on the fine-tuning assembly 8 to adjust the position of the second probe assembly 6.
[0028] The LCR probe mechanism with buffer and adjustment in this solution is suitable for the LCR probe mechanism of a receiving machine. In use, the first driving component 3 first moves the support plate 2 up and down, causing the first probe assembly 5 and the second probe assembly 6 to move up and down, thereby achieving Z-axis adjustment of the first probe assembly 5 and the second probe assembly 6. The second probe assembly 6 is then finely adjusted in the Y and Z directions by the fine-tuning component 8, allowing the probe tip to be precisely adjusted to a coplanar plane, i.e., the XY horizontal plane and the YZ vertical plane. The second driving component 4 then moves the first probe assembly 5 left and right to achieve X-axis adjustment, with buffering provided by the buffer component 7. During measurement, the probe contacts the workpiece with buffering, which improves probe life and measurement flexibility. The adjustable probe significantly improves measurement accuracy and precision.
[0029] In this embodiment, as Figure 2 , 3 As shown, the support plate 2 has an L-shaped structure. The vertical plate of the L-shaped support plate 2 is provided with a first slide rail 21 along its own height direction and is slidably connected to the support plate 1 through the first slide rail 21. The horizontal plate of the L-shaped support plate 2 is provided with a second slide rail 22 along its own length direction and is slidably connected to the first probe assembly 5 through the second slide rail 22.
[0030] Specifically, the support plate 2 is L-shaped and located on the rear side of the support plate 1. The first slide rail 21 and the second slide rail 22 are disposed on the front side of the L-shaped support plate 2. The support plate 2 is driven to move along the first slide rail 21 by the first driving member 3, and the first probe assembly 5 is driven to move along the second slide rail 22 by the second driving member 4.
[0031] In this embodiment, as Figure 2 ,3 As shown, the first driving component 3 includes a first driving motor 31, a first driving screw 32, and a first photoelectric sensor 33. The first driving motor 31 is fixed to the top of the support plate 1. The working end of the first driving motor 31 is connected to the first driving screw 32. The nut seat of the first driving screw 32 is connected to the bearing plate 2. The first photoelectric sensor 33 is disposed on the side of the vertical plate portion of the bearing plate 2.
[0032] Specifically, the first drive motor 31 is a stepper motor with its working end facing downwards and connected to the first drive screw 32. The nut seat of the first drive screw 32 is provided with a connecting block, and the connecting block is connected to the top of the vertical plate portion of the support plate 2. The first photoelectric sensor 33 includes a limiting sensor plate and a photoelectric sensor. The limiting sensor plate is disposed on the side of the vertical plate portion of the support plate 2, and the photoelectric sensor is disposed on the camera mounting base 11 and located above the limiting sensor plate, so as to limit the Z-axis adjustment distance of the first probe assembly 5 and the second probe assembly 6.
[0033] In this embodiment, as Figure 2 , 3 As shown, the second driving component 4 includes a second driving motor 41, a second driving screw 43, and a second photoelectric sensor 42. The second driving motor 41 is fixed to the bottom of the vertical plate portion of the support plate 2. The working end of the second driving motor 41 is connected to the second driving screw 43. A needle seat 44 is provided on the nut seat of the second driving screw 43, and it is connected to the buffer assembly 7 through the needle seat 44. The second photoelectric sensor 42 is disposed on the side of the horizontal plate portion of the support plate 2.
[0034] Specifically, the second drive motor 41 is a stepper motor with its working end facing left and connected to the second drive screw 43. The nut seat of the second drive screw 43 passes through the needle holder 44 to connect with the buffer assembly 7 through the needle holder 44. The second photoelectric sensor 42 includes a limiting sensor plate and a photoelectric sensor. The limiting sensor plate is disposed on the rear side of the needle holder 44, and the photoelectric sensor is disposed on the rear side of the horizontal plate portion of the support plate 2 and located below the limiting sensor plate to limit the adjustment distance of the first probe assembly 5X.
[0035] In this embodiment, as Figure 4As shown, the buffer assembly 7 includes a spring seat 71 and a slider seat 72. The spring seat 71 is fixed to one end of the pin seat 44 provided on the second driving member 4. The slider seat 72 has a buffer groove 73 at one end near the spring seat 71. An elastic element 74 is provided on the side wall of the buffer groove 73 away from the spring seat 71. The end of the spring seat 71 near the slider seat 72 extends into the buffer groove 73 and contacts the elastic element 74.
[0036] Specifically, the upper part of the needle seat 44 is connected to the nut seat of the second drive screw 43. The spring seat 71 is fixed to the front side of the lower part of the needle seat 44. The rear side of the lower part of the needle seat 44 is slidably connected to the horizontal plate part of the bearing plate 2 through the second slide rail 22. The slider seat 72 is located on the left side of the spring seat 71 and on the second slide rail 22. The first probe assembly 5 is located on the left part of the slider seat 72. The second drive motor 41 of the second drive member 4 drives the needle seat 44 to move to the left along the second slide rail 22, so that the spring seat 71 pushes the slider seat 72 to move to the left, thereby realizing the leftward movement of the first probe assembly 5. During the movement, the elastic element 74 in the buffer groove 73 provides the opposite force to buffer the force of the second drive motor 41 driving the first probe assembly 5 to move to the left, so that the contact between the probe and the workpiece is buffered, avoiding premature wear, bending or breakage of the needle tip, which affects the probe life and measurement pass rate.
[0037] In this embodiment, as Figure 4 As shown, the first probe assembly 5 is disposed on the side of the slider seat 72 away from the spring seat 71. The extension portion of the spring seat 71 is a linkage block 75. The linkage block 75 is slidably disposed in the buffer groove 73. The width of the linkage block 75 is smaller than the groove width of the buffer groove 73.
[0038] Specifically, the elastic element 74 is a spring, and the two ends of the spring abut against the left side of the linkage block 75 and the right side wall of the buffer groove 73, respectively. The linkage block 75 moves left and right in the buffer groove 73, and the spring provides the opposite force.
[0039] In this embodiment, as Figure 2 , 3 As shown, the fine-tuning component 8 includes a mounting base 81, a first fine-tuning component 82, and a second fine-tuning component 83. The mounting base 81 is disposed at one end of the support plate 2 away from the second driving component 4. The first fine-tuning component 82 and the second fine-tuning component 83 are respectively disposed on opposite sides of the mounting base 81. The second probe component 6 is disposed on the second fine-tuning component 83.
[0040] Specifically, the mounting base 81 is located at the left end of the horizontal plate portion of the support plate 2, the first fine-tuning member 82 is located on the rear side of the mounting base 81, and the second fine-tuning member 83 is located on the front side of the mounting base 81, so as to make fine adjustments to the second probe assembly 6 in the Y and Z directions.
[0041] In this embodiment, as Figure 3 As shown, the first fine-tuning component 82 includes a first fine-tuning seat 84 and a first fine-tuning screw 85. The upper part of the first fine-tuning seat 84 is connected to one end of the support plate 2 near the mounting base 81. The lower part of the first fine-tuning seat 84 is provided with a first fine-tuning screw hole. The first fine-tuning screw 85 passes through the first fine-tuning screw hole and is connected to the mounting base 81.
[0042] Specifically, the upper part of the first fine-tuning seat 84 is connected to the upper left side of the horizontal plate portion of the support plate 2. The first fine-tuning seat 84 is "7" shaped. By turning the first fine-tuning screw 85 at the lower part of the first fine-tuning seat 84, the second probe assembly 6 can be finely adjusted in the Y direction.
[0043] In this embodiment, as Figure 3 As shown, the second fine-tuning component 83 includes a second fine-tuning seat 87, a fine-tuning block 88, and a second fine-tuning screw 86. The second fine-tuning seat 87 is disposed on the upper side of the mounting base 81. The fine-tuning block 88 passes through the mounting base 81. The second fine-tuning seat 87 is provided with a second fine-tuning screw hole. The second fine-tuning screw 86 passes through the second fine-tuning screw hole and is connected to the top of the fine-tuning block 88. The second probe assembly 6 is connected to the fine-tuning block 88.
[0044] Specifically, the front part of the mounting base 81 is provided with a groove along its own height direction, and the fine-tuning block 88 passes through the groove of the mounting base 81. By turning the second fine-tuning screw 86 on the second fine-tuning seat 87, the second probe assembly 6 can be finely adjusted in the Z direction.
[0045] In this embodiment, as Figure 5 As shown, a camera mounting base 11 is provided on the upper part of the support plate 1, and a camera assembly 12 is provided on the camera mounting base 11. The camera assembly 12 is located above the first probe assembly 5 and the second probe assembly 6. An illumination mounting plate 13 is provided on the upper part of the support plate 2, and an illumination assembly 14 is provided at the bottom of the illumination mounting plate 13. The illumination assembly 14 is located on the side of the first probe assembly 5 and the second probe assembly 6.
[0046] Specifically, the camera mounting base 11 is located on the top left side of the support plate 1, the lighting mounting plate 13 is located on the upper left side of the vertical plate portion of the support plate 2, and the lighting assembly 14 illuminates the first probe assembly 5 and the second probe assembly 6; a connecting frame is provided on the upper part of the support plate 1, and the support plate 1 is mounted on the frame through the connecting frame.
[0047] It should be noted that the above-mentioned technical features can be combined with each other to form various embodiments not listed above, all of which are considered to be within the scope of this utility model specification; and, for those skilled in the art, improvements or modifications can be made based on the above description, and all such improvements and modifications should fall within the protection scope of the appended claims of this utility model.
Claims
1. An LCR probe with buffer and adjustable mechanism, used to make the probe adjustable and provide buffering when in contact with the workpiece, characterized in that: It includes a support plate (1), a carrier plate (2), a first driving member (3), a second driving member (4), a first probe assembly (5), and a second probe assembly (6). The carrier plate (2) is slidably disposed on the support plate (1). The first driving member (3) is disposed on the top of the support plate (1), and its working end is connected to the carrier plate (2) to drive the carrier plate (2) to move up and down. The first probe assembly (5) is slidably disposed on the bottom of the support plate (2), and the second driving member (4) is disposed on the support plate (2). Its working end is connected to the first probe assembly (5) through the buffer assembly (7) to drive the first probe assembly (5) to move left and right. A fine-tuning component (8) is provided at one end of the support plate (2) away from the second driving member (4), and the second probe component (6) is disposed on the fine-tuning component (8) so as to adjust the position of the second probe component (6) by means of the fine-tuning component (8).
2. The LCR buffer and adjustable device according to claim 1, characterized in that, The support plate (2) has an L-shaped structure. The vertical plate of the L-shaped support plate (2) is provided with a first slide rail (21) along its own height direction and is slidably connected to the support plate (1) through the first slide rail (21). The horizontal plate of the L-shaped support plate (2) is provided with a second slide rail (22) along its own length direction and is slidably connected to the first probe assembly (5) through the second slide rail (22).
3. The LCR buffer and adjustable device according to claim 2, characterized in that, The first driving component (3) includes a first driving motor (31), a first driving screw (32) and a first photoelectric sensor (33). The first driving motor (31) is fixed to the top of the support plate (1). The working end of the first driving motor (31) is connected to the first driving screw (32). The nut seat of the first driving screw (32) is connected to the bearing plate (2). The first photoelectric sensor (33) is disposed on the side of the vertical plate portion of the bearing plate (2).
4. The LCR buffer and adjustable device according to claim 3, characterized in that, The second driving component (4) includes a second driving motor (41), a second driving screw (43), and a second photoelectric sensor (42). The second driving motor (41) is fixed at the bottom of the vertical plate portion of the support plate (2). The working end of the second driving motor (41) is connected to the second driving screw (43). A needle seat (44) is provided on the nut seat of the second driving screw (43), and it is connected to the buffer assembly (7) through the needle seat (44). The second photoelectric sensor (42) is disposed on the side of the horizontal plate portion of the support plate (2).
5. The LCR buffer and adjustable device according to claim 1, characterized in that, The buffer assembly (7) includes a spring seat (71) and a slider seat (72). The spring seat (71) is fixed to one end of a pin seat (44) provided on the second drive member (4). The slider seat (72) has a buffer groove (73) at one end near the spring seat (71). An elastic element (74) is provided on the side wall of the buffer groove (73) away from the spring seat (71). The end of the spring seat (71) near the slider seat (72) extends into the buffer groove (73) and contacts the elastic element (74).
6. The LCR buffer and adjustable device according to claim 5, characterized in that, The first probe assembly (5) is disposed on the side of the slider seat (72) away from the spring seat (71). The extension of the spring seat (71) is a linkage block (75). The linkage block (75) is slidably disposed in the buffer groove (73). The width of the linkage block (75) is smaller than the groove width of the buffer groove (73).
7. The LCR buffer and adjustable device according to claim 1, characterized in that, The fine-tuning component (8) includes a mounting base (81), a first fine-tuning element (82), and a second fine-tuning element (83). The mounting base (81) is disposed at one end of the support plate (2) away from the second driving element (4). The first fine-tuning element (82) and the second fine-tuning element (83) are respectively disposed on opposite sides of the mounting base (81). The second probe component (6) is disposed on the second fine-tuning element (83).
8. The LCR buffer and adjustable device according to claim 7, characterized in that, The first fine-tuning component (82) includes a first fine-tuning seat (84) and a first fine-tuning screw (85). The upper part of the first fine-tuning seat (84) is connected to one end of the support plate (2) near the mounting base (81). The lower part of the first fine-tuning seat (84) is provided with a first fine-tuning screw hole. The first fine-tuning screw (85) passes through the first fine-tuning screw hole and is connected to the mounting base (81).
9. The LCR buffer and adjustable device according to claim 8, characterized in that, The second fine-tuning component (83) includes a second fine-tuning seat (87), a fine-tuning block (88), and a second fine-tuning screw (86). The second fine-tuning seat (87) is disposed on the upper side of the mounting base (81). The fine-tuning block (88) passes through the mounting base (81). The second fine-tuning seat (87) is provided with a second fine-tuning screw hole. The second fine-tuning screw (86) passes through the second fine-tuning screw hole and is connected to the top of the fine-tuning block (88). The second probe assembly (6) is connected to the fine-tuning block (88).
10. The LCR buffer and adjustable device according to claim 1, characterized in that, A camera mounting base (11) is provided on the upper part of the support plate (1), and a camera assembly (12) is provided on the camera mounting base (11). The camera assembly (12) is located above the first probe assembly (5) and the second probe assembly (6). An illumination mounting plate (13) is provided on the upper part of the support plate (2), and an illumination assembly (14) is provided at the bottom of the illumination mounting plate (13). The illumination assembly (14) is located on the side of the first probe assembly (5) and the second probe assembly (6).