Charging pile aging test circuit

Abstract

The embodiment of the utility model discloses a charging pile aging test circuit, which relates to the technical field of aging test, and comprises a power supply module, a plurality of charging piles and a plurality of first load modules, the first load module is connected with all the charging piles. The power supply module is connected with all the first load modules and all the charging piles. Original electric power resources are fully utilized, and the energy-saving effect is achieved.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of aging test, especially relates to a charging stack aging test circuit. BACKGROUND

[0002] With the rapid development of the electric vehicle industry, aging test is crucial to ensure the performance of charging equipment, especially in the face of growing market demand and technological upgrading. Aging test not only simulates long-term equipment usage, but also predicts the life and performance degradation of the charging stack, thereby ensuring the safety and satisfaction of electric vehicle users. Therefore, a charging stack aging test system circuit is invented, which is used in charging stack aging test equipment. However, traditional charging stack aging test methods often lack flexibility and efficiency, making it difficult to adapt to changing test requirements and dynamic load adjustment. SUMMARY

[0003] The technical problem to be solved by the embodiments of the utility model is the low efficiency and high energy consumption of traditional charging stack aging test methods.

[0004] To solve the above problems, the utility model embodiment discloses a charging stack aging test circuit. It makes full use of existing power resources and achieves energy-saving effect.

[0005] The utility model provides a kind of charging stack aging test circuit, which includes power supply module, multiple charging stacks and multiple first load modules;The first load module is connected with all the charging stacks respectively;The power supply module is connected with all the first load modules and all the charging stacks respectively.

[0006] Further technical solutions include a first switch, which is arranged in the line connecting the first load module and the charging stack.

[0007] Further technical solutions include a second switch, which is arranged in the line connecting the power supply module and the first load module.

[0008] Further technical solutions include a controller, which is connected with the first switch and the second switch respectively.

[0009] Further technical solutions include that the first load module is provided with multiple parallel first load units.

[0010] Further technical solutions include a second load module, multiple second load modules are connected in parallel to form a combined module, and the combined module is connected with all the charging stacks and the power supply module respectively.

[0011] Further, the technical scheme is that the third switch is arranged in a line connecting the combination module and the charging stack.

[0012] Further, the technical scheme is that the second load module is provided with a plurality of parallel second load units.

[0013] Further, the technical scheme is that the charging stack is a direct current power supply module.

[0014] Further, the technical scheme is that the power supply module is an alternating current power supply module.

[0015] Compared with the prior art, the technical effects achieved by the embodiment of the utility model include:

[0016] The charging stack aging test can save more than 90% of power in the circuit, realizes the matrix type distribution of the circuit, can flexibly and variably switch the load according to actual requirements, meets the aging test requirements of the power diversification of the charging stack, saves the cost of purchasing various power segment devices, and also saves the space of the site occupied by multiple devices. BRIEF DESCRIPTION OF DRAWINGS

[0017] In order to more clearly illustrate the technical scheme of the embodiment of the utility model, the drawings needed in the embodiment description will be briefly introduced, and obviously, the drawings in the following description are some embodiments of the utility model, and for those skilled in the art, other drawings can also be obtained according to these drawings without creative labor.

[0018] Fig. 1 A charging stack aging test circuit structure block diagram is provided for the embodiment of the utility model.

[0019] Fig. 2 A charging stack aging test circuit diagram is provided for the embodiment of the utility model.

[0020] REFERENCE NUMERALS

[0021] Power supply module 1, charging stack 2, first load module 3, first switch 41, second switch 42, controller 5, first load unit 31, second load module 6, combination module 61, third switch 43, second load unit 62. DETAILED DESCRIPTION

[0022] With reference to the drawings of the embodiments of the present application, the technical solutions in the embodiments will be clearly and completely described in the present application. Obviously, the following described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments of the present application, all the other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0023] It should be understood that the terms "comprising" and "including" as used in the specification and the appended claims indicate the presence of the described features, integers, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0024] It should also be understood that the terms used in the present application embodiment specification are only for the purpose of describing specific embodiments and are not intended to limit the present application embodiments. As used in the present application embodiment specification and the appended claims, the singular forms "a", "an" and "the" are intended to include the plural forms unless the context clearly indicates otherwise.

[0025] Referring to Figs. 1-2 The present application embodiment provides a charging stack 2 aging test circuit. The charging stack 2 aging test circuit comprises a power supply module 1, a plurality of charging stacks 2 and a plurality of first load modules 3; the first load module 3 is connected with all the charging stacks 2 respectively; the power supply module 1 is connected with all the first load modules 3 and all the charging stacks 2 respectively. The specific introduction of each part is as follows:

[0026] In the present embodiment, the first load module 3 comprises a plurality of 15KW bidirectional sources, which are used to simulate the battery of the automobile in the aging test. The 15KW bidirectional source is an electronic device which can input AC and output DC after inversion, or input DC and output AC after inversion. The charging stack 2 (gun) outputs DC voltage to power the 15KW bidirectional source, which outputs AC after inversion by the 15KW bidirectional source and is connected to the power grid of the AC power supply module 1 of the charging stack 2. Since the 15KW bidirectional source is a feedback load with an efficiency of more than 90%, more than 90% of the power is fed back to the AC input end of the charging stack 2. Only less than 10% of the power needs to be supplemented to meet the power required for the aging test of the product 100%. Therefore, the charging stack 2 aging test can save more than 90% of the power in the circuit.

[0027] The first load module 3 is connected with all the charging stacks 2 respectively; the power supply module 1 is connected with all the first load modules 3 and all the charging stacks 2 respectively, so that the circuit is distributed in a matrix type, the load can be switched flexibly and variably according to actual requirements, the aging test requirements of the charging stacks 2 with power diversification are met, the cost of purchasing various power segment devices is saved, and the space occupied by multiple devices is also saved.

[0028] Continuing to refer to Figs. 1-2 In the embodiment, a first switch 41 is further included, which is arranged in a line connecting the first load module 3 with the charging stack 2.

[0029] Specifically, the first switch 41 includes a contactor, and in the embodiment, the quantity relationship of the first switch 41, the charging stack 2 and the first load module 3 is Z1=C*N1, where Z1 is the number of the first switch 41, C is the number of the charging stack 2, and N1 is the number of the first load module 3. In an embodiment, the auxiliary contact of the contactor is connected to the input IO point of the PLC to determine the attraction state of the contactor, and the attraction state indicates that the load on this line is in use, and the disconnection state indicates that the load on this line is idle. The PLC feeds back the information to the host computer, and the host computer can determine the idle state according to the information.

[0030] Further, a second switch 42 is further included, which is arranged in a line connecting the power supply module 1 with the first load module 3.

[0031] Specifically, the second switch 42 includes a contactor, and in the embodiment, the quantity relationship of the second switch 42, the first load module 3 and the second load module 6 is Z2=N1+N2, where Z2 is the number of the second switch 42, N1 is the number of the first load module 3, and N2 is the number of the second load module 6. In an embodiment, the auxiliary contact of the contactor is connected to the input IO point of the PLC to determine the attraction state of the contactor, and the attraction state indicates that the load on this line is in use, and the disconnection state indicates that the load on this line is idle. The PLC feeds back the information to the host computer, and the host computer can determine the idle state according to the information.

[0032] Further, a controller 5 is further included, which is connected with the first switch 41 and the second switch 42 respectively.

[0033] Specifically, the controller 5 includes a PLC, the auxiliary contact of the contactor is connected to the input IO point of the PLC to determine the attraction state of the contactor, and the attraction state indicates that the load on this line is in use, and the disconnection state indicates that the load on this line is idle. The PLC feeds back the information to the host computer, and the host computer can determine the idle state according to the information.

[0034] Further, the first load module 3 is provided with a plurality of first load units 31 connected in parallel.

[0035] Specifically, the first load unit 31 is a 15KW bidirectional source, and in this embodiment, the first load module 3 includes three first load units 31 connected in parallel.

[0036] Further, the second load module 6 is also included, and a plurality of the second load modules 6 are connected in parallel to form a combined module 61, which is respectively connected with all the charging stacks 2 and the power supply module 1.

[0037] In addition, the third switch 43 is also included, which is arranged in the line connecting the combined module 61 and the charging stack 2.

[0038] Specifically, the third switch 43 includes a contactor, and in this embodiment, the combined module 61 is formed by two second load modules 6 connected in parallel, and the number relationship of the third switch 43, the charging stack 2, and the combined module 61 is: Z3=C*N3, Z3 is the number of the third switch 43, C is the number of the charging stack 2, and N3 is the number of the combined module 61.

[0039] Further, the second load module 6 is provided with a plurality of second load units 62 connected in parallel.

[0040] Specifically, the second load unit 62 is a 15KW bidirectional source, and in this embodiment, the second load module 6 includes three second load units 62 connected in parallel.

[0041] Further, the charging stack 2 is a direct current power supply module 1.

[0042] Specifically, the charging stack 2 is a direct current power supply module 1, and in this embodiment, it is used to output direct current voltage power supply for the first load unit 31 and / or the second load unit 62.

[0043] Further, the power supply module 1 is an alternating current power supply module 1.

[0044] Specifically, the output end of the first load unit 31 and / or the second load unit 62 is connected with the power supply module 1, and the first load unit 31 and / or the second load unit 62 output AC after inversion and are connected to the power grid of the power supply module 1, and in this embodiment, the first load unit 31 and the second load unit 62 are both 15KW bidirectional sources, which are a kind of feedback load with efficiency of more than 90%, and more than 90% of the power is fed back to the AC input end of the charging stack 2, and only 10% or less of the power supplied by the power supply module 1 is needed to meet the power required for product 100% power aging test. Therefore, the charging stack 2 aging test can save more than 90% of the power in this circuit.

[0045] In the above embodiments, the description of each embodiment is focused on, and the parts not described in detail in a certain embodiment can be referred to the relevant description of other embodiments.

[0046] In addition, the terms "first", "second" are only for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first", "second" can explicitly or implicitly include one or more of the features. In the description of the present application, the meaning of "multiple" is two or more than two, unless otherwise specifically limited.

[0047] In the present application, unless otherwise specifically defined and limited, the terms "mounting", "connection", "connection", "fixing" and the like should be broadly understood, for example, it can be connected, or it can be detachable, or it can be integrated; it can be mechanical connection, or electrical connection; it can be directly connected, or indirectly connected through intermediate medium, or it can be the internal communication of two elements or the interaction relationship between two elements. For ordinary skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0048] In the description of the present application, the description of the terms "one embodiment", "some embodiments", "example", "specific example" or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In the present application, the illustrative description of the above terms should not be understood as necessarily referring to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in the present application.

[0049] Obviously, those skilled in the art can make various modifications and variations to the present application without departing from the spirit and scope of the present application. Thus, these modifications and variations of the present application are within the scope of the claims of the present application and its equivalent technologies, and the present application also intends to include these modifications and variations.

[0050] The above is the specific embodiment of the present application, but the protection scope of the present application is not limited to this. Any skilled person in the art can easily think of various equivalent modifications or replacements within the technical range disclosed by the present application, and these modifications or replacements should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A charge stack aging test circuit, characterized by, The power supply module, a plurality of charging stacks and a plurality of first load modules are included. The first load modules are respectively connected with all the charging stacks. The power supply module is respectively connected with all the first load modules and all the charging stacks.

2. The charge stack aging test circuit of claim 1, wherein, A first switch is further included, which is arranged in a line connecting the first load module and the charging stack.

3. The charge stack aging test circuit of claim 2, wherein, A second switch is further included, which is arranged in a line connecting the power supply module and the first load module.

4. The charge stack aging test circuit of claim 3, wherein, A controller is further included, which is connected with the first switch and the second switch respectively.

5. The charge stack aging test circuit of claim 1, wherein, The first load module is provided with a plurality of parallel first load units.

6. The charge heap aging test circuit of claim 1, wherein, A second load module is further included, a plurality of the second load modules are connected in parallel to form a combined module, and the combined module is respectively connected with all the charging stacks and the power supply module.

7. The charge stack aging test circuit of claim 6, wherein, A third switch is further included, which is arranged in a line connecting the combined module and the charging stack.

8. The charge stack aging test circuit of claim 6, wherein, The second load module is provided with a plurality of parallel second load units.

9. The charge heap aging test circuit of claim 1, wherein, The charging stack is a direct current power supply module.

10. The charge heap aging test circuit of claim 1, wherein, The power supply module is an alternating current power supply module.

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