PIR light supplement module test equipment

Abstract

The utility model discloses a PIR light supplement module test device, which comprises a test box, a jig, a heating source, a lifting assembly and a test assembly, the upper surface of the test box is provided with a mounting groove, the mounting groove is internally provided with an induction hole, the test box is internally provided with a mounting cavity, and a through hole is communicated with the mounting cavity; the jig is embedded in the mounting groove; the heating source is arranged in the mounting cavity and is positioned below the jig; the lifting assembly is erected on the upper surface of the testing box, the testing assembly is connected to the driving end of the lifting assembly, and the lifting assembly drives the testing assembly to get close to or get away from the jig in the Y-axis direction. The test fixture is placed in the mounting groove, and the heating source is placed in the mounting cavity, so that a fixed distance is kept between the to-be-tested PIR light supplement module and the heating source during testing, and the influence on the detection result of the PIR light supplement module due to non-uniform distances of the emission sources is avoided. The fixed temperature is provided by adopting the heating source, so that the test environments of different batches of PIR light supplementing modules are ensured to be the same.

Description

TECHNICAL FIELD

[0001] The utility model relates to a light supplementing module test technical field, specifically, relate to a PIR light supplementing module test equipment. BACKGROUND

[0002] Since PIR sensing element is a temperature sensitive sensor, its requirement to test environment is higher, temperature, detection distance and detection angle all can influence the trigger result of PIR sensing element.

[0003] At present, in the functional test link of light supplementing lamp module with PIR sensing element, PIR light supplementing lamp module is connected test board, approaches PIR sensor by manual, judges whether the test lamp on test board is lighted, thereby judges whether PIR sensor can on-off. However, the way of manual test cannot ensure that temperature and detection distance are uniform every time, and only can test whether PIR on-off function tester is good, cannot test its sensitivity. UTILITY MODEL CONTENT

[0004] In view of the deficiency of prior art, a PIR light supplementing module test equipment is provided.

[0005] In order to achieve the above-mentioned purpose, the utility model provides a PIR light supplementing module test equipment, including test box, fixture, heat source, lifting assembly and test assembly, the upper surface of test box is provided with mounting groove, the inductive hole is arranged in the mounting groove, the test box has installation cavity, the through hole is communicated with the installation cavity;Fixture is fitted in mounting groove;Heat source is located in the installation cavity, and heat source is located below fixture;Lifting assembly is erected on the upper surface of test box, test assembly is connected to the drive end of lifting assembly, and lifting assembly drives test assembly to approach or move away from fixture along Y axis direction.

[0006] According to an embodiment of the utility model, the lifting assembly includes a bracket and a first drive cylinder, the bracket is installed on the upper surface of the test box, the first drive cylinder is installed on the bracket, the drive end of the first drive cylinder is connected to the test assembly, and the first drive cylinder drives the test assembly to approach or move away from the fixture along the Y axis direction.

[0007] According to an embodiment of the utility model, the test assembly includes a fixing member, a test board and a test probe assembly, the fixing member is installed on the drive end of the lifting assembly;The test board is arranged on the fixing member, the test probe assembly is connected to one side of the fixing member facing the fixture, and the test probe assembly is electrically connected to the test board.

[0008] According to an embodiment of the utility model, the test probe assembly includes a fixing plate and a plurality of probes, the fixing plate is arranged on the fixing member, and the plurality of probes are arranged on the fixing plate at intervals, and each probe is electrically connected to the test board;One end of each probe is arranged through the fixing plate, and the end of the probe passing through the fixing plate faces the fixture.

[0009] According to an embodiment of the utility model, the jig is provided with a plurality of first through holes, and each first through hole corresponds to a probe.

[0010] According to an embodiment of the utility model, the utility model further includes a shielding mechanism, the shielding mechanism includes a moving mechanism and a baffle assembly, the moving mechanism is installed in the installation cavity, the baffle assembly is connected to the driving end of the moving mechanism, and the baffle assembly is located between the jig and the heat source, and the moving mechanism drives the baffle assembly to move along the X-axis direction.

[0011] According to an embodiment of the utility model, the moving mechanism includes a mounting frame, a second driving cylinder, a guide rail and a moving assembly, the mounting frame is fixed in the installation cavity, the second driving cylinder is installed on the mounting frame, the guide rail is installed on the inner side wall of the installation cavity along the X-axis direction, the moving assembly is connected with the guide rail and the second driving cylinder respectively, and the second driving cylinder drives the moving assembly to move along the guide rail.

[0012] According to an embodiment of the utility model, the baffle assembly includes a fixed frame and a shielding plate, the fixed frame is fixedly connected with the moving mechanism, and the shielding plate is detachably connected with the fixed frame.

[0013] According to an embodiment of the utility model, the utility model further includes a host computer, and the host computer is electrically connected with the test assembly.

[0014] According to an embodiment of the utility model, the utility model further includes a rack, and the rack includes a rack body and a plurality of rotating wheels, the test box is arranged on the rack body, and the plurality of rotating wheels are arranged at the bottom of the rack body.

[0015] The utility model discloses the beneficial effect lies in, places the test fixture in the installation groove, and places the heat source in the installation cavity, so that the PIR light supplementing module to be tested and the heat source keep fixed interval when testing, avoid the emission source interval not uniform influence PIR light supplementing module detection detection result. By adopting the heat source to provide fixed temperature test environment, ensure that the test environment of different batches of PIR light supplementing module is same, and also can change the temperature of heat source, test the voltage value of PIR sensing element in different temperature, thereby obtain the sensitivity of PIR sensing element. BRIEF DESCRIPTION OF DRAWINGS

[0016] The drawings described herein are used to provide further understanding of the present application, and form a part of the present application, the illustrative embodiment of the present application and its description are used to explain the present application, and do not constitute improper limitation to the present application. In the drawings:

[0017] Figure 1 It is the perspective view of PIR light supplementing module test equipment in the embodiment;

[0018] Figure 2 An exploded view of the test box in the embodiment;

[0019] Figure 3 An internal schematic view of the test box in the embodiment;

[0020] Figure 4 A schematic view of the shielding mechanism in the embodiment;

[0021] Figure 5 Another perspective view of the PIR light supplement module test device in the embodiment.

[0022] Reference Signs List

[0023] 1 - test box; 10 - mounting cavity; 11 - mounting groove; 110 - induction hole; 2 - jig; 21 - first through hole; 3 - heat source; 4 - lifting assembly; 41 - bracket; 42 - first drive cylinder; 5 - test assembly; 51 - fixing piece; 52 - test plate; 53 - test probe assembly; 531 - fixing plate; 532 - probe; 6 - shielding mechanism; 61 - moving mechanism; 611 - mounting frame; 612 - second drive cylinder; 613 - guide rail; 614 - moving assembly; 6141 - moving piece; 62 - baffle assembly; 621 - fixed frame; 622 - shielding plate; 6220 - second through hole; 7 - rack; 71 - frame body; 72 - rotating wheel. DETAILED DESCRIPTION

[0024] In the following, a plurality of embodiments of the present application will be disclosed with reference to the drawings. For the purpose of clear illustration, a plurality of practical details will be described in the following description. However, it should be appreciated that these practical details should not be used to limit the present application. That is, in some embodiments of the present application, these practical details are not necessary. In addition, for the purpose of simplifying the drawings, some conventional structures and components will be shown in the drawings in a simple schematic manner.

[0025] In addition, in the present application, the description such as "first", "second", etc. is only for the purpose of description, and does not particularly mean the order or sequence, nor is it used to limit the present application. It is merely used to distinguish the components or operations described with the same technical terms, and cannot be understood as indicating or implying the relative importance of the indicated technical features or implying the number of the indicated technical features. Therefore, the features limited by "first" and "second" can explicitly or implicitly include at least one of the features. In addition, the technical solutions of each embodiment can be combined with each other, but it must be based on the realization of a person skilled in the art. When the combination of technical solutions appears to be contradictory or unachievable, it should be considered that the combination of technical solutions does not exist, nor is it within the protection scope required by the present application.

[0026] Figure 1 A perspective view of a PIR light supplement module testing device, Figure 2 An exploded view of a test box, Figure 3 An internal schematic view of a test box. The embodiment provides a PIR light supplement module testing device, which comprises a test box 1, a jig 2, a heat source 3, a lifting assembly 4 and a test assembly 5. The test box 1 has a mounting cavity 10 therein, the upper surface of the test box 1 is provided with a mounting groove 11, the mounting groove 11 is provided with a sensing hole 110, and the mounting cavity 10 is in communication with the sensing hole 110. The jig 2 is fitted in the mounting groove 11, so that the jig 2 is stably connected with the test box 1. The heat source 3 is located in the mounting cavity 10, and the heat source 3 is located below the jig 2, so that the jig 2 and the heat source 3 correspond to each other. The lifting assembly 4 is arranged on the upper surface of the test box 1, the lifting assembly 4 has a driving end, the test assembly 5 is connected to the driving end of the lifting assembly 4, and the lifting assembly 4 is used to drive the test assembly 5 to move close to or away from the jig 2 along the Y-axis direction.

[0027] In actual use, the PIR light supplement module to be tested is placed in the jig 2, and the side with the PIR sensing element faces the heat source 3, so that the PIR sensing element can sense the heat emitted by the heat source 3. During testing, the lifting assembly 4 drives the test assembly 5 to move close to the jig 2, and the test assembly 5 is connected to the PIR light supplement module to be tested. The test assembly 5 is used to electrically connect to the PIR light supplement module to be tested, to supply power to the PIR light supplement module to be tested, and to detect the voltage change state of the PIR sensing element on the PIR light supplement module to be tested in different test environments. The voltage change of the PIR sensing element is observed through the test assembly 5, so as to judge the on-off state of the PIR sensing element. By changing the heat amount of the heat source 3 and reading the test value of the test assembly 5, the sensing sensitivity of the PIR sensing element of the PIR light supplement module to be tested can be judged.

[0028] In this way, by placing the test jig 2 in the mounting groove 11, the PIR light supplement module to be tested and the heat source 3 maintain a fixed distance during testing, avoiding the influence of the non-uniform distance of the heat source 3 on the test result of the PIR light supplement module. By using the heat source 3 to provide a fixed temperature test environment, it is ensured that the test environments of different batches of PIR light supplement modules are the same, and the temperature of the heat source 3 can also be changed to test the voltage value of the PIR sensing element in different temperatures, so as to obtain the sensitivity of the PIR sensing element. In the embodiment, the heat source 3 is a temperature controller. Compared with the traditional detection method of the PIR element on the PIR light supplement module, the PIR element on the PIR light supplement module is detected by using the PIR light supplement module testing device of the present application, so that the detection is standardized, human errors are effectively avoided, the accuracy of the test result is improved, and the test efficiency is effectively improved.

[0029] Further, the lifting assembly 4 comprises a bracket 41 and a first driving cylinder 42. The bracket 41 is installed on the upper surface of the test box 1, and the first driving cylinder 42 is installed on the bracket 41. The driving end of the first driving cylinder 42 is connected to the test assembly 5. The first driving cylinder 42 drives the test assembly 5 to move along the Y-axis direction to approach or move away from the jig 2.

[0030] The test assembly 5 comprises a fixing member 51, a test board 52 and a test probe assembly 53. The fixing member 51 is installed on the driving end of the lifting assembly 4. The test board 52 and the test probe assembly 53 are both arranged on the fixing member 51. The test probe assembly 53 is connected to one end of the fixing member 51 facing the jig 2, and the test probe assembly 53 is electrically connected to the test board 52. The lifting assembly 4 drives the fixing member 51 to move up and down along the Y-axis direction, and the test board 52 and the test probe assembly 53 move following the movement of the fixing member 51. The test board 52 and the test probe assembly 53 are used to electrically connect with the PIR light supplement module to be tested, to supply power to the PIR light supplement module to be tested and to detect the PIR light supplement module to be tested. In this example, the test board 52 and the test probe assembly 53 are detachably connected to the fixing member 51, and in use, the test board 52 and the test probe assembly 53 can be replaced according to different test requirements, to adapt to the test requirements of different models of PIR light supplement modules.

[0031] Further, the test probe assembly 53 comprises a fixing plate 531 and a plurality of probes 532. The fixing plate 531 is connected to one end of the fixing member 51 facing the jig 2, and the plurality of probes 532 are arranged on the fixing plate 531 in intervals. Each probe 532 is electrically connected to the test board 52. One end of each probe 532 penetrates the fixing plate 531 and the end penetrating the fixing plate 531 faces the jig 2. During testing, the end of the probe 532 penetrating the fixing plate 531 is electrically connected to the PIR light supplement module to be tested.

[0032] Further, the jig 2 is provided with a plurality of first through holes 21, and each first through hole 21 corresponds to one probe 532. The first through hole 21 is used for the PIR sensing element of the test PIR light supplement module to penetrate. During testing, the PIR light supplement module to be tested is placed on the jig 2, and the PIR sensing element of the PIR light supplement module to be tested corresponds to the first through hole 21, so that each PIR sensing element of the PIR light supplement module to be tested corresponds to pass through a first through hole 21 to sense the heat source 3.

[0033] Please refer to Figure 3 and Figure 4 , Figure 4The schematic diagram of the shielding mechanism is shown in FIG. 6. Further, the PIR light supplement module testing device further comprises a shielding mechanism 6, which is used to shield the heat source 3 for the PIR sensing element of the PIR light supplement module to be tested. Specifically, the shielding mechanism 6 comprises a moving mechanism 61 and a baffle assembly 62. The moving mechanism 61 is arranged in the installation cavity 10. The baffle assembly 62 is connected to the driving end of the moving mechanism 61, and is located between the jig 2 and the heat source 3. The moving mechanism 61 drives the baffle assembly 62 to move along the X-axis to shield or expose the heat source 3.

[0034] During testing, the PIR light supplement module to be tested is placed in the jig 2, and the PIR sensing element is arranged to pass through the first through hole 21 and face the heat source 3. The PIR light supplement module testing device is started, the heat source 3 is turned on, the lifting assembly 4 drives the test assembly 5 to move along the Y-axis direction, and the probe 532 of the test assembly 5 is electrically connected to the PIR light supplement module to be tested. The voltage waveform generated by the PIR element of the PIR light supplement module to be tested is read by the test assembly 5, so as to determine whether the PIR element can be turned on. At this time, the shielding mechanism 6 is started, the moving mechanism 61 drives the baffle assembly 62 to move along the X-axis direction, so that the baffle assembly 62 blocks the PIR element and the heat source 3. Since the baffle assembly 62 shields the PIR element, the voltage waveform of the PIR element changes. By observing the change of the voltage waveform of the PIR element, the sensitivity of the PIR element to the change of the heat source 3 can be determined.

[0035] Further, the moving mechanism 61 comprises a mounting frame 611, a guide rail 613, a moving assembly 614 and a second driving cylinder 612. The mounting frame 611 is fixedly installed in the mounting cavity 10, and the second driving cylinder 612 is arranged on the mounting frame 611. The guide rail 613 is installed on the side wall of the mounting cavity 10 along the X-axis direction, the moving assembly 614 is slidably connected to the guide rail 613, and the moving assembly 614 is connected to the driving end of the second driving cylinder 612. The second driving cylinder 612 drives the moving assembly 614 to slide along the guide rail 613. The baffle assembly 62 is connected to the moving assembly 614 and moves with the moving assembly 614. When the shielding mechanism 6 is opened, the driving end of the second driving cylinder 612 drives the moving assembly 614 to move along the guide rail 613, and the baffle assembly 62 moves with the moving assembly 614 and shields the PIR element. In the embodiment, the second driving cylinder 612 is a lead screw cylinder. The moving assembly 614 comprises two moving pieces 6141, which are arranged at intervals on the baffle assembly 62, close to the driving end of the second driving cylinder 612, and slidably connected to the guide rail 613. The baffle assembly 62 slides relative to the guide rail 613 through the two moving pieces 6141. One of the moving pieces 6141 is connected to the second driving cylinder 612, and the second driving cylinder 612 drives the moving piece 6141 connected thereto to move along the guide rail 613, thereby driving the baffle assembly 62 and the other moving piece 6141 to move along the guide rail 613.

[0036] The baffle assembly 62 comprises a fixed frame 621 and a shielding plate 622. The fixed frame 621 is fixedly connected to the moving mechanism 61, and the moving mechanism 61 drives the fixed frame 621 to move along the X-axis direction. The shielding plate 622 is detachably connected to the fixed frame 621, and the shielding plate 622 is used to shield the PIR element. The shielding plate 622 is provided with a plurality of second through holes 6220, which are arranged at intervals and correspond to the first through holes 21 respectively. During testing, the first through holes 21 and the second through holes 6220 are connected, so that the PIR sensing element of the PIR light supplementing module to be tested can pass through the first through holes 21 and the second through holes 6220 to sense the heat source 3 in the test box 1. When it is necessary to shield the heat source 3, the moving mechanism 61 drives the baffle assembly 62 to move along the X-axis, so that the interval between the adjacent two second through holes 6220 shields a first through hole 21, thereby spacing the PIR element from the heat source 3.

[0037] In addition, the PIR light supplementing module test equipment further comprises a host computer (not shown in the figure), which is in communication connection with the test assembly 5. The host computer is used to receive and display the test data of the test assembly 5, so that the test result is intuitively presented.

[0038] Please refer to Figure 5 , Figure 5Another perspective view of the PIR light supplement module testing device. The PIR light supplement module testing device further comprises a rack 7, the rack 7 comprises a rack body 71 and a plurality of rotating wheels 72. The testing box 1 is arranged on the rack body 71, and the plurality of rotating wheels 72 are installed on the bottom of the rack body 71. Push the rack body 71, the rack body 71 can be moved through the plurality of rotating wheels 72, so that the light supplement module testing device of the testing box 1 is moved. In this example, four rotating wheels 72 are provided, and the four rotating wheels 72 are arranged at the four corners of the bottom of the rack body 71, so that the rack body 71 moves in balance.

[0039] The above merely describes the implementation of the present application and is not intended to limit the present application. The present application can be variously changed and modified by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the scope of the claims of the present application.

Claims

1. A PIR light supplement module test device, characterized in that, Include: Test box (1), fixture (2), heat source (3), lifting assembly (4) and test assembly (5), the upper surface of the test box (1) is provided with a mounting groove (11), the mounting groove (11) is provided with a sensing hole (110), the test box (1) has a mounting cavity (10), the sensing hole (110) is communicated with the mounting cavity (10); the fixture (2) is embedded in the mounting groove (11); the heat source (3) is arranged in the mounting cavity (10), and the heat source (3) is located below the fixture (2); the lifting assembly (4) is arranged on the upper surface of the test box (1), the test assembly (5) is connected to the driving end of the lifting assembly (4), and the lifting assembly (4) drives the test assembly (5) to move close to or away from the fixture (2) along the Y axis direction.

2. The PIR light supplement module test device of claim 1, wherein, The lifting assembly (4) includes a support (41) and a first drive cylinder (42), the support (41) is installed on the upper surface of the test box (1), the first drive cylinder (42) is installed on the support (41), and the driving end of the first drive cylinder (42) is connected to the test assembly (5). The first drive cylinder (42) drives the test assembly (5) to move close to or away from the fixture (2) along the Y axis direction.

3. The PIR light supplement module test device of claim 1, wherein, The test assembly (5) includes a fixing part (51), a test board (52) and a test probe assembly (53), the fixing part (51) is installed on the driving end of the lifting assembly (4); the test board (52) is arranged on the fixing part (51), and the test probe assembly (53) is connected to one side of the fixing part (51) facing the fixture (2), and the test probe assembly (53) is electrically connected with the test board (52).

4. The PIR light supplement module test device of claim 3, wherein, The test probe assembly (53) includes a fixed plate (531) and a plurality of probes (532), the fixed plate (531) is arranged on the fixing part (51), a plurality of probes (532) are arranged on the fixed plate (531) at intervals, and each probe (532) is electrically connected with the test board (52); one end of each probe (532) penetrates the fixed plate (531), and the end of the probe (532) penetrating the fixed plate (531) faces the fixture (2).

5. The PIR light supplement module test device of claim 4, wherein, The fixture (2) is provided with a plurality of first through holes (21), and each first through hole (21) corresponds to a probe (532).

6. The PIR light supplement module test device of claim 5, wherein, Further comprising a shielding mechanism (6), the shielding mechanism (6) includes a moving mechanism (61) and a baffle assembly (62); the moving mechanism (61) is installed in the mounting cavity (10), the baffle assembly (62) is connected to the driving end of the moving mechanism (61), and the baffle assembly (62) is located between the fixture (2) and the heat source (3), and the moving mechanism (61) drives the baffle assembly (62) to move along the X axis direction.

7. The PIR light supplement module test device of claim 6, wherein, The moving mechanism (61) comprises a mounting frame (611), a second driving cylinder (612), a guide rail (613) and a moving assembly (614), the mounting frame (611) is fixed in the mounting cavity (10), the second driving cylinder (612) is mounted on the mounting frame (611), the guide rail (613) is mounted on the inner side wall of the mounting cavity (10) along the X-axis direction, the moving assembly (614) is connected with the guide rail (613) and the second driving cylinder (612) respectively, and the second driving cylinder (612) drives the moving assembly (614) to move along the guide rail (613); the baffle assembly (62) is connected with the moving assembly (614).

8. The PIR light supplement module test device of claim 6, wherein, The baffle assembly (62) comprises a fixed frame (621) and a shielding baffle (622), the fixed frame (621) is fixedly connected with the moving mechanism (61), and the shielding baffle (622) is detachably connected with the fixed frame (621); the shielding baffle (622) is provided with a plurality of second through holes (6220), the plurality of second through holes (6220) are arranged at intervals, and each second through hole (6220) corresponds to one first through hole (21).

9. The PIR light supplement module test device of claim 1, wherein, The upper computer is further included, and the upper computer is electrically connected with the test assembly (5).

10. The PIR light supplement module test device of claim 1, wherein, The rack (7) is further included, the rack (7) comprises a rack body (71) and a plurality of rotating wheels (72), the test box (1) is arranged on the rack body (71), and the plurality of rotating wheels (72) are arranged on the bottom of the rack body (71).

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