Chip particle test production line

Abstract

The utility model provides a chip particle testing production line, which relates to the technical field of chip particle testing and comprises a conveying shuttle used for conveying chip particles, a feeding structure, a testing machine table, a discharging structure and an automatic sorting machine are sequentially arranged close to the conveying shuttle, and the feeding structure and the discharging structure are respectively in separated contact with the conveying shuttle. The conveying shuttle, the feeding structure, the testing machine table, the discharging structure and the automatic sorting machine are further connected with a control system. The chip particle test production line provided by the utility model can efficiently and quickly test chip particles, ensures smoothness of feeding, testing, discharging, sorting and conveying processes, realizes automatic conveying of raw materials for a plurality of test machines, improves production efficiency and test quality, and improves production efficiency and test quality through the production line for automatically conveying the raw materials. The chip particles are automatically detected, and the detection efficiency is improved.

Description

Technical Field

[0001] This utility model belongs to the field of chip particle testing technology, and specifically relates to a chip particle testing production line. Background Technology

[0002] Currently, the testing time for memory chip chips increases proportionally to their capacity. In order to maximize equipment production efficiency, testing equipment is presented in the form of a production line. Increasing or decreasing the number of testing equipment becomes very important. However, the existing testing equipment used for testing packaged chips has the problem of low testing efficiency, which causes the chip loading, testing, sorting and conveying process to be interrupted and cannot form a continuous process. Utility Model Content

[0003] The purpose of this utility model is to provide a chip particle testing production line, which solves the technical problem of how to test chip particles efficiently and quickly, ensures the smoothness of the feeding, testing, unloading, sorting and conveying process, realizes the automated conveying of raw materials to multiple testing machines, improves production efficiency and testing quality, and realizes the automatic detection of chip particles through the automated raw material conveying production line, thereby improving detection efficiency.

[0004] A chip particle testing production line includes a conveyor shuttle for conveying chip particles. A feeding structure, a testing machine, an unloading structure, and an automatic sorting machine are arranged sequentially near the conveyor shuttle. The feeding structure and the unloading structure are in separate contact with the conveyor shuttle. The conveyor shuttle, the feeding structure, the testing machine, the unloading structure, and the automatic sorting machine are also connected to a control system.

[0005] The feeding structure consists of a robotic arm and a power structure connected to the robotic arm, used to transfer raw materials to the testing machine.

[0006] The testing equipment is a flash memory chip testing machine, used to evaluate the performance of chip chips under different parameters.

[0007] The unloading structure consists of a second robotic arm and a second power structure connected to the second robotic arm, used to collect the chip particles after the test is completed.

[0008] It should be noted that the overall structure of the feeding structure and the feeding structure are similar, and will not be described in detail here.

[0009] The automatic sorting machine is connected to the feeding structure and is used to assist in distributing raw materials onto the testing machine and sorting chip particles.

[0010] The automatic sorting machine described in this solution serves to separate and pick up materials. More preferably, equipment produced by Xincetong can be used. Existing technical equipment will not be described in detail.

[0011] The conveyor shuttle includes a horizontally arranged slide rail, a movable plate that slides along the slide rail, and a gear transmission structure connected to the movable plate. The upper surface of the movable plate is provided with multiple opening slots, and chip particles are placed in the opening slots.

[0012] The gear transmission structure includes an annular toothed belt distributed along the length of the slide rail, a gear meshing with the inner side of the annular toothed belt, and a power structure connected to the gear. The annular toothed belt includes a male transmission belt and a female transmission belt distributed vertically. The gear meshes between the male transmission belt and the female transmission belt. The upper end face of the male transmission belt is fixedly connected to the moving plate.

[0013] The conveyor shuttle is a complete automated conveyor network that ensures that raw materials can be seamlessly connected between different testing stages.

[0014] The power structure includes a gear shaft coaxially passing through the gear and a motor connected to the gear shaft.

[0015] The test equipment has multiple units.

[0016] The control system is connected to the host computer.

[0017] The control system is the core of the entire automation system. It is responsible for coordinating and managing the operation of all automated components, ensuring the efficiency and accuracy of the entire testing process.

[0018] The chip particle testing in this solution specifically refers to the chip particle testing after packaging.

[0019] The beneficial effects of this utility model are as follows:

[0020] (1) Automated raw material conveying: Automatic detection of chip particles is achieved through an automated raw material conveying production line.

[0021] (2) Integrated material sorting and picking: Integrating material sorting and picking functions into one, realizing automatic sorting and picking of chip particles, and improving production efficiency.

[0022] (3) System integration: Integrate multiple testing machines and material picking systems into a unified automated production line to achieve automation and intelligence in the production process.

[0023] (4) Since the testing equipment is presented in the form of a production line, it is easy to increase or decrease the number of testing equipment without having to develop a separate solution, thus achieving the goal of speed and cost reduction. Attached Figure Description

[0024] Figure 1 This is a schematic diagram of the test machine in an embodiment of the present invention.

[0025] Figure 2 This is a schematic diagram of the connection structure between the conveyor shuttle and the automatic sorting machine in an embodiment of this utility model.

[0026] Figure 3 This is a partial structural diagram of the conveyor shuttle in an embodiment of the present utility model. Figure 1 .

[0027] Figure 4 This is a partial structural diagram of the conveyor shuttle in an embodiment of the present utility model. Figure 2 .

[0028] Figure 5 This is a partial structural diagram of the production line (excluding the feeding and unloading structures) in an embodiment of this utility model.

[0029] The attached figures are labeled as follows: 1. Test machine; 2. Automatic sorting machine; 3. Conveyor shuttle; 31. Conveyor belt; 32. Slide rail; 33. Moving plate; 331. Open slot; 34. Conveyor belt. Detailed Implementation

[0030] To more clearly illustrate the technical features of this solution, the following detailed implementation method will be used to explain the solution.

[0031] Example 1

[0032] See Figures 1-5 A chip particle testing production line includes a conveyor shuttle 3 for conveying chip particles. A feeding structure, a testing machine 1, a discharging structure, and an automatic sorting machine 2 are arranged in sequence near the conveyor shuttle 3. The feeding structure and the discharging structure are in separate contact with the conveyor shuttle 3. The conveyor shuttle 3, the feeding structure, the testing machine 1, the discharging structure, and the automatic sorting machine 2 are also connected to a control system.

[0033] The feeding structure consists of a robotic arm and a power structure connected to the robotic arm, used to transfer raw materials to the testing machine 1.

[0034] Test machine 1 is a flash memory chip tester, used to evaluate the performance of chip chips under different parameters.

[0035] The unloading structure consists of a second robotic arm and a second power structure connected to the second robotic arm, used to collect the chip particles after the test is completed.

[0036] The automatic sorting machine 2 is connected to the feeding structure and is used to assist in distributing raw materials to the testing machine 1 and sorting chip particles.

[0037] The automatic sorting machine 2 in this solution serves to separate and pick up materials. More preferably, equipment produced by Xincetong can be used. Existing technology and equipment will not be described in detail.

[0038] The conveyor shuttle 3 includes a horizontally arranged slide rail 32, a movable plate 33 that slides along the slide rail 32, and a gear transmission structure connected to the movable plate 33. The upper end surface of the movable plate 33 is provided with multiple opening slots 331, and chip particles are placed in the opening slots 331.

[0039] The gear transmission structure includes an annular toothed belt distributed along the length of the slide rail 32, a gear meshing with the inner side of the annular toothed belt, and a power structure connected to the gear. The annular toothed belt includes a male transmission belt 34 and a female transmission belt 31 distributed vertically. The gear meshes between the male transmission belt 34 and the female transmission belt 31. The upper end face of the male transmission belt 34 is fixedly connected to the moving plate 33.

[0040] The conveyor shuttle 3 is a complete automated conveyor network that ensures that raw materials can be seamlessly connected between different testing stages.

[0041] The power structure includes a gear shaft coaxially passing through the gear and a motor connected to the gear shaft. For the sake of simplicity, the specific structure of the power structure will not be described in detail, nor will it be shown in the accompanying drawings.

[0042] Test machine 1 has multiple units.

[0043] The control system is connected to the host computer.

[0044] The specific working process of this utility model:

[0045] The raw materials are placed on the automatic sorting machine 2 and loaded onto the testing machine 1 by the moving plate through the feeding structure. The testing machine 1 tests the assigned raw materials and the test results are recorded.

[0046] After the test, the chip particles are collected by the moving plate under the action of the feeding structure and automatically transferred to the automatic sorting machine 2 by the conveyor shuttle 3, and sorted according to the preset program and test results.

[0047] Therefore, it can be seen that the automatic sorting machine 2 has two functions: one is to sort the chip particles after the test, and the other is to assist in the sorting of raw materials and convey them to the test machine 1 through the feeding structure.

[0048] Example 2

[0049] Based on Embodiment 1, Embodiment 2 is presented here. The control system includes a data storage module, a position acquisition module, and a transmission control module. The data storage module stores data generated during the chip transfer process, the position acquisition module acquires the position of the chip, and the transmission control module controls the movement of the transmission shuttle according to the chip transfer progress.

[0050] Example 3

[0051] Based on Embodiment 1, Embodiment 3 is presented here. The robotic arm in this solution includes an X-axis moving structure, a Y-axis moving structure, and a Z-axis moving structure. The Z-axis moving structure is provided with a left-right rotating structure and a right-right rotating structure connected to the left-right rotating structure. The right-right rotating structure is provided with a clamping structure, and the clamping structure is separately connected to the chip particles for clamping.

[0052] The X-axis moving structure, Y-axis moving structure, and Z-axis moving structure move in mutually perpendicular directions. They can be connected by a track, a toothed belt set on the track, and a gear connected to the toothed belt. The gear is connected to the corresponding power frame to perform reciprocating motion. Existing technologies will not be described in detail here.

[0053] Example 4

[0054] Based on Embodiment 1, Embodiment 4 is presented here. The automatic sorting machine includes a support platform, a tray assembly disposed on the support platform, and a chip transfer assembly. The tray assembly includes an infeed assembly and an outfeed assembly. The infeed assembly includes multiple parallel tracks I and a support disk I movably disposed on the tracks I. The outfeed assembly includes multiple parallel tracks II and a support disk II movably disposed on the tracks II. Chip particles for detection are disposed on the support disks I and II.

[0055] The chip transfer assembly is essentially a transfer robot used to transfer chip particles from an automatic sorting machine to a feeding structure.

[0056] The technical features of this utility model not described can be implemented by or by using existing technology, and will not be repeated here. Of course, the above description is not a limitation of this utility model, and this utility model is not limited to the examples above. Any changes, modifications, additions or substitutions made by those skilled in the art within the scope of this utility model should also be within the protection scope of this utility model.

Claims

1. A chip particle test production line characterized by, Including the conveying shuttle (3) for conveying chip particles, the feeding structure, the test machine (1), the discharging structure, and the automatic sorting machine (2) are arranged in sequence close to the conveying shuttle (3), the feeding structure and the discharging structure are respectively in contact with the conveying shuttle (3) in a separated mode; the conveying shuttle (3), the feeding structure, the test machine (1), the discharging structure and the automatic sorting machine (2) are also connected with the control system.

2. The chip particle test production line according to claim 1, wherein, The feeding structure is a mechanical arm one, and a power structure one connected with the mechanical arm one, which is used for conveying raw materials to the test machine (1).

3. The chip particle test production line according to claim 1, wherein, The test machine (1) is a flash memory chip particle tester, which is used for evaluating the performance of chip particles under different parameters.

4. The chip particle test production line according to claim 1, wherein, The discharging structure is a mechanical arm two, and a power structure two connected with the mechanical arm two, which is used for collecting chip particles after testing.

5. The chip particle test production line of claim 1, wherein, The automatic sorting machine (2) is connected with the feeding structure, which is used for assisting the distribution of raw materials to the test machine (1) and sorting chip particles.

6. The chip particle test line according to any one of claims 1 to 5, characterized in that The conveying shuttle (3) includes a horizontal slide rail (32), a moving plate (33) sliding along the slide rail (32), a gear transmission structure connected with the moving plate (33), and a plurality of open grooves (331) arranged on the upper end surface of the moving plate (33), and the open grooves (331) contain chip particles.

7. The chip particle test production line according to claim 6, wherein, The gear transmission structure includes an annular toothed belt distributed along the length direction of the slide rail (32), a gear meshing connected with the inner side of the annular toothed belt, and a power structure connected with the gear, the annular toothed belt includes an upper and lower distribution conveying male belt (34) and a conveying female belt (31), the gear is meshing connected between the conveying male belt (34) and the conveying female belt (31), and the upper end surface of the conveying male belt (34) is fixedly connected with the moving plate (33).

8. The chip particle test production line according to claim 7, wherein, The power structure includes a gear shaft coaxially penetrating through the gear, and a motor connected with the gear shaft.

9. The chip particle test production line of claim 1, wherein, The test machine (1) has a plurality of.

10. The chip particle test production line of claim 1, wherein, The control system is connected to the host computer.

Images