Testing device

Abstract

The utility model provides a testing device. The testing device comprises a positioning base; the limiting structure is provided with at least two limiting parts, and the distance between every two limiting parts is adjustable; a containing space used for containing a component to be detected is defined by the at least two limiting parts, the at least two limiting parts are used for limiting the component to be detected in the containing space, and the testing device solves the technical problem that in the related technology, a testing jig is low in positioning precision during long-term work.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of electrical device test, specifically relates to a test device. BACKGROUND

[0002] With the rapid development of power electronics technology, power modules as the core components of power conversion and control are increasingly widely used in industrial automation, new energy vehicles, renewable energy systems and other fields. The performance of the power module directly affects the stability and efficiency of the entire power system. Therefore, it is particularly important to accurately and efficiently test the power module. The power module test fixture is a positioning tool for testing and verifying the function, power calibration and performance of the module, which can assist the pin of the power module to realize good electrical contact with the test board test needle.

[0003] However, when the test fixture works in a long-term high-temperature environment, stress will be generated in the fixed base and the positioning baffle due to thermal expansion and contraction effect, which will cause deformation of the fixture structure, reduce the positioning accuracy of the fixture, and even cause the fixture to be unable to use or even accidents in serious cases.

[0004] Therefore, the prior art needs to be further developed. UTILITY MODEL CONTENT

[0005] The utility model aims at overcoming the above technical defects, and provides a test device to solve the technical problem of low positioning accuracy of the test fixture in related technology when working for a long time.

[0006] To achieve the above technical purpose, the utility model adopts the following technical scheme: a test device is provided, which comprises:

[0007] A positioning base;

[0008] A limiting structure, the limiting structure has at least two limiting parts, and the distance between the at least two limiting parts is adjustably arranged; the at least two limiting parts form an accommodation space for accommodating the component to be detected between them, and the at least two limiting parts are used for limiting the component to be detected in the accommodation space.

[0009] Further, the limiting part is four, and the relative positions between the four limiting parts are adjustably arranged; the four limiting parts are respectively detachably connected with the positioning base.

[0010] Further, the four limiting parts are arranged at intervals between each other.

[0011] Further, the limiting part comprises a first limiting part and a second limiting part; the first limiting part and the second limiting part are connected with each other; the first limiting part has a first limiting surface for abutting against the component to be detected; and the second limiting part has a second limiting surface for abutting against the component to be detected.

[0012] Further,

[0013] The first limiting part is provided with a first connecting hole; the first limiting part is connected with the positioning base by screwing a fastener into the first connecting hole; and / or,

[0014] The second limiting part is provided with a second connecting hole; the second limiting part is connected with the positioning base by screwing a fastener into the second connecting hole.

[0015] Further, the positioning base is provided with a fixing hole; the limiting part is connected with the positioning base by screwing a fastener into the limiting part and the fixing hole.

[0016] Further, the positioning base comprises:

[0017] a body,

[0018] a first positioning plate body connected with the body, and the limiting part is connected with the first positioning plate body;

[0019] a second positioning plate body connected with the body, and the limiting part is connected with the first positioning plate body; and the first positioning plate body and the second positioning plate body have an operation gap therebetween.

[0020] Further, the positioning base comprises:

[0021] a third positioning plate body connected with the body, and the limiting part is connected with the third positioning plate body;

[0022] a fourth positioning plate body connected with the body, and the limiting part is connected with the fourth positioning plate body; and the third positioning plate body and the fourth positioning plate body have an operation gap therebetween.

[0023] Further, the positioning base comprises:

[0024] a support seat;

[0025] a connecting plate, one end of the connecting plate is connected with the support seat, and the other end of the connecting plate is connected with the body, so that an operation space is formed between the body and the support seat.

[0026] Further,

[0027] the positioning base is made of metal; and / or,

[0028] The limiting part is made of a biphenyl type polyimide material.

[0029] Advantages:

[0030] 1. The testing device comprises a positioning base, a limiting structure, the limiting structure has at least two limiting parts, the distance between the at least two limiting parts is adjustably arranged, an accommodation space for accommodating a component to be detected is surrounded between the at least two limiting parts, and the at least two limiting parts are used for limiting the component to be detected in the accommodation space. The technical problem of low positioning accuracy of a test fixture in related art is solved.

[0031] 2. The positioning part of the testing device is made of a biphenyl type polyimide material, the thermal expansion coefficient is similar to that of metal, and the high-temperature deformation stress is reduced.

[0032] 3. The positioning part of the testing device is changed from two to four, the positioning flexibility is improved, and the applicability is higher.

[0033] 4. The testing device adjusts the positioning base structure, so that the module is easy to disassemble after high-temperature operation. BRIEF DESCRIPTION OF DRAWINGS

[0034] Figure 1 is a working state schematic diagram of the testing device adopted by the embodiment of the utility model;

[0035] Figure 2 is a top view of the working state of the testing device adopted by the embodiment of the utility model;

[0036] Figure 3 is a side view of the working state of the testing device adopted by the embodiment of the utility model;

[0037] Figure 4 is a bottom view of the working state of the testing device adopted by the embodiment of the utility model;

[0038] Figure 5 is a structure schematic diagram of one perspective of the testing device adopted by the embodiment of the utility model;

[0039] Figure 6 is a structure schematic diagram of another perspective of the testing device adopted by the embodiment of the utility model;

[0040] Figure 7 is a bottom view of the testing device adopted by the embodiment of the utility model;

[0041] Figure 8 is a side view of the testing device adopted by the embodiment of the utility model;

[0042] Figure 9 is the structural schematic view of the positioning base of the test device adopted by the embodiment of the utility model;

[0043] Figure 10 is the top view of the positioning base of the test device adopted by the embodiment of the utility model;

[0044] Figure 11 is the structural schematic view of the limiting structure of the test device adopted by the embodiment of the utility model;

[0045] Figure 12 is the structural schematic view of the limiting part of the limiting structure of the test device adopted by the embodiment of the utility model;

[0046] Figure 13 is the top view of the limiting part of the limiting structure of the test device adopted by the embodiment of the utility model;

[0047] Figure 14 is the structural schematic view of the second embodiment of the test device adopted by the embodiment of the utility model.

[0048] Among them, the above-mentioned drawing includes the following drawing marks:

[0049] 1, positioning base; 11, fixed hole; 12, body; 13, first positioning plate body; 14, second positioning plate body; 16, third positioning plate body; 17, fourth positioning plate body; 18, support seat; 19, connecting plate;

[0050] 2, limiting structure; 21, limiting part; 20, containing space; 21, limiting part; 211, first limiting part; 212, first limiting surface; 213, second limiting part; 214, second limiting surface; 215, first connecting hole; 216, second connecting hole;

[0051] 10, to be detected component; 20, operation gap; 30, operation space; 40, containing space. DETAILED DESCRIPTION

[0052] In order to make the personnel in the technical field better understand the scheme of the present application, the technical scheme in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by the person skilled in the art without creative labor should belong to the protection scope of the present application.

[0053] Referring to Figures 1 to 13The utility model discloses an embodiment provides a test device, comprising: positioning base 1;Limiting structure 2, the limiting structure 2 has at least two limiting parts 21, and the distance between two of at least two limiting parts 21 is adjustably arranged;At least two limiting parts 21 form an accommodating space for accommodating the component to be detected 10 between them, and at least two limiting parts 21 are used for limiting the component to be detected 10 in the accommodating space 40.

[0054] By the above setting, the original two long limiting parts 21 are changed into four separate limiting parts 21, which can independently adjust the limiting position of at least two directions of the module, and at least two independently adjusted limiting parts 21 can adjust the position along with the deformation of the positioning base 1, solving the problem that the original limiting part 21 cannot be flexibly adjusted, thereby solving the technical problem of low positioning accuracy of the test fixture in the related art during long-term work.

[0055] In the test device of the embodiment, at least two limiting parts 21 are respectively detachably connected with the positioning base 1.

[0056] By the above setting, the combination and installation of each limiting part 21 are facilitated.

[0057] In the test device of the embodiment, the limiting part 21 is four, and the relative positions between two of the four limiting parts 21 are adjustably arranged;The four limiting parts 21 are arranged at a mutual interval.

[0058] Specifically, the original two long limiting parts 21 are changed into four separate limiting parts 21, which can independently adjust the limiting position of four directions of the module, solving the problem that the original baffle cannot be flexibly adjusted. In this way, each limiting part 21 is not directly connected, so that the position adjustment can be facilitated.

[0059] In the test device of the embodiment, referring to Figure 12 The limiting part 21 comprises a first limiting part 211 and a second limiting part 213;The first limiting part 211 and the second limiting part 213 are connected with each other;The first limiting part 211 has a first limiting surface 212 for abutting against the component to be detected 10, and the second limiting part 213 has a second limiting surface 214 for abutting against the component to be detected 10.

[0060] By the above setting, the limiting part 21 can limit the component to be detected 10 in two directions, so as to more firmly fix the component to be detected 10.

[0061] Referring to Figure 9In the test device of the embodiment, the first limiting part 211 is provided with a first connecting hole 215, and the first limiting part 211 is connected with the positioning base 1 by screwing a fastener into the first connecting hole 215; and / or, the second limiting part 213 is provided with a second connecting hole 216, and the second limiting part 213 is connected with the positioning base 1 by screwing a fastener into the second connecting hole 216.

[0062] In this way, each limiting part 21 can be firmly and conveniently connected with the positioning base 1.

[0063] In the test device of the embodiment, the positioning base 1 is provided with a fixing hole 11, and the limiting part 21 is connected with the positioning base 1 by screwing a fastener into the limiting part 21 and the fixing hole 11.

[0064] With the above arrangement, each limiting part 21 can be firmly and conveniently connected with the positioning base 1.

[0065] In the test device of the embodiment, referring to Figure 4 , the positioning base 1 comprises a body 12, a first positioning plate body 13 connected with the body 12, the limiting part 21 being connected with the first positioning plate body 13; a second positioning plate body 14 connected with the body 12, the limiting part 21 being connected with the first positioning plate body 13; and an operation gap 20 between the first positioning plate body 13 and the second positioning plate body 14.

[0066] With the above arrangement, the part of the positioning base 1 coinciding with the lower part of the module power terminal is cut off, so that the module is easy to disassemble after high-temperature operation, and the problem that the module is difficult to disassemble after wearing thick high-temperature gloves due to the small spacing between the power terminal and the positioning base 1 is solved.

[0067] In the test device of the embodiment, referring to Figure 4 , the positioning base 1 comprises a third positioning plate body 16 connected with the body 12, the limiting part 21 being connected with the third positioning plate body 16; a fourth positioning plate body 17 connected with the body 12, the limiting part 21 being connected with the fourth positioning plate body 17; and an operation gap 20 between the third positioning plate body 16 and the fourth positioning plate body 17.

[0068] With the above arrangement, the part of the positioning base 1 coinciding with the lower part of the module power terminal is cut off, so that the module is easy to disassemble after high-temperature operation, and the problem that the module is difficult to disassemble after wearing thick high-temperature gloves due to the small spacing between the power terminal and the positioning base 1 is solved, as shown in Figure 4 .

[0069] Referring to Figure 9In the testing device of the embodiment, the positioning base 1 comprises a support base 18 and a connecting plate 19, one end of the connecting plate 19 is connected with the support base 18, and the other end of the connecting plate 19 is connected with the body 12, so that an operation space 30 is formed between the body 12 and the support base 18.

[0070] In this way, the to-be-tested component 10 can be conveniently operated from below the body 12, and the to-be-tested component 10 is convenient to install and disassemble.

[0071] In the testing device of the embodiment, the positioning base 1 is made of metal; and / or, the limiting part 21 is made of a biphenyl polyimide material.

[0072] Specifically, the material of the limiting part 21 is replaced by a biphenyl polyimide material with a similar thermal expansion coefficient to metal. The biphenyl polyimide material can resist high temperature of 400°C or above, has a long-term use temperature range of -269-260°C, has no obvious melting point in part, and has high insulation performance. The biphenyl polyimide material effectively reduces the deformation of the positioning limiting part 21 after being heated at high temperature, has excellent size stability and structural stability, and solves the problem that the module cannot be completely inserted due to thermal deformation after multiple high-temperature tests.

[0073] Embodiment one:

[0074] The high-temperature deformation-resistant half-bridge power testing device of the embodiment comprises a positioning base 1, a limiting part 21, and an adjustable screw hole. The positioning base 1 is made of metal material, mainly to provide support for the module and has good thermal conductivity, so that the to-be-tested module can be quickly heated to the set temperature. The limiting part 21 is a non-metal material, mainly to fix the module to the preset position and prevent damage to the module bottom plate, so that the pin needle and the test probe on the test board (i.e., the to-be-tested component 10) can be well electrically connected. The main purpose of the adjustable screw hole (i.e., the fixing hole 11) is to fix the limiting part 21, and the elliptical screw hole design facilitates fine adjustment of the position of the limiting part 21.

[0075] Embodiment two:

[0076] The test device of the embodiment mainly consists of a positioning base 1 and four independent limiting parts 21, which are connected through M4 screw holes. Each limiting part 21 of the test device is provided with an oval screw hole in the same direction, and the corresponding positioning base 1 is provided with an M4 threaded hole. The four limiting parts 21 can be independently moved along the long axis of the oval screw hole according to requirements, and are fixed to the positioning base 1 and the limiting part 21 after being adjusted to the appropriate position using screws. The four limiting parts 21 respectively clamp the four base plates of the power module (i.e. the component to be detected 10) at opposite corners, thereby fixing the position of the power module. When in use, the assembled test device is placed on the test table, and the shorter side of the power module is first aligned to one side of the limiting part 21, and then the power terminal on the other side of the module is gently pressed, so that the module is completely clamped into the limiting slot formed by the four limiting parts 21. At this time, the module is closely attached to the positioning base 1 and the limiting part 21, and then it is sent to the testing machine for testing. When disassembling, the fingers are placed under the power terminal, and the power module can be taken out upward with slight force.

[0077] Embodiment three:

[0078] Referring to Figure 14 , the limiting part 21 of the embodiment is two, and the two limiting parts 21 are arranged at opposite corners. The two limiting parts 21 can be independently moved along the long axis of the oval screw hole according to requirements, and are fixed to the positioning base 1 and the limiting part 21 after being adjusted to the appropriate position using screws. The two limiting parts 21 respectively clamp the two base plates of the power module (i.e. the component to be detected 10) at opposite corners, thereby fixing the position of the power module. When in use, the assembled test device is placed on the test table, and the shorter side of the power module is first aligned to one side of the limiting part 21, and then the power terminal on the other side of the module is gently pressed, so that the module is completely clamped into the limiting slot formed by the two limiting parts 21. At this time, the module is closely attached to the positioning base 1 and the limiting part 21, and then it is sent to the testing machine for testing. When disassembling, the fingers are placed under the power terminal, and the power module can be taken out upward with slight force.

[0079] The use process of the test device of the embodiment is as follows:

[0080] According to the size of the power module to be tested, four separate limiting parts 21 are fixed in the appropriate position by adjustable screw holes using fixed screws, so that the module can be clamped between the limiting parts 21 without shaking, then the test device is fixed on the rotating heating platform station of the test machine, the heating switch is turned on, and the heating temperature is set according to the operation requirement. When the temperature reaches the preset value, the module is placed into the station and heated to the specified temperature by wearing high-temperature gloves, then the module is transferred to the test position of the machine for testing, and the module and the fixture are transferred out of the station after the test is completed using the control system. The module is taken out after the power end of the module is lifted up by wearing high-temperature gloves. After several high-temperature operations, the deformation of the limiting part 21 is less than before, and the position of the four positioning angles can be adjusted by the four separate limiting parts 21.

[0081] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application and in the above drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than that illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device including a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to the process, method, product or device.

[0082] Alternatively, specific examples in the present embodiment can refer to examples described in the above embodiments, which will not be repeated here.

[0083] The above sequence numbers of the embodiments of the present application are only for description, and do not represent the advantages or disadvantages of the embodiments.

[0084] In the above embodiments of the present application, the description of each embodiment has its own focus, and the parts not described in detail in a certain embodiment can be referred to the relevant description of other embodiments.

[0085] The above is only the preferred embodiment of the present application, and it should be pointed out that for ordinary skilled in the art, without departing from the principle of the present application, a number of improvements and refinements can be made, which should be considered as the protection scope of the present application.

Claims

1. A test device, characterized by The utility model relates to a test device for detecting the position of a component (10), comprising: a positioning base (1); a limiting structure (2) having at least two limiting parts (21) with adjustable distance between them, the limiting parts (21) enclosing a space for accommodating the component (10) to be detected, and the limiting parts (21) limiting the component (10) to be detected in the space (40).

2. The test device of claim 1, wherein, The limiting parts (21) are four, and the relative positions between the limiting parts (21) are adjustably arranged; the limiting parts (21) are respectively and detachably connected with the positioning base (1).

3. The test device of claim 2, wherein, The limiting parts (21) are arranged at intervals.

4. The test device of claim 1, wherein, The limiting parts (21) include a first limiting part (211) and a second limiting part (213); the first limiting part (211) and the second limiting part (213) are connected with each other; the first limiting part (211) has a first limiting surface (212) for abutting against the component (10) to be detected, and the second limiting part (213) has a second limiting surface (214) for abutting against the component (10) to be detected.

5. The test device according to claim 4, wherein: a first connecting hole (215) is arranged on the first limiting part (211), and the first limiting part (211) is connected with the positioning base (1) by inserting a fastener into the first connecting hole (215); and / or a second connecting hole (216) is arranged on the second limiting part (213), and the second limiting part (213) is connected with the positioning base (1) by inserting a fastener into the second connecting hole (216).

6. The test device of claim 5, wherein, A fixing hole (11) is arranged on the positioning base (1), and the limiting parts (21) are connected with the positioning base (1) by inserting a fastener into the limiting parts (21) and the fixing hole (11).

7. The test device of claim 1, wherein, The positioning base (1) comprises: a body (12), a first positioning plate body (13) connected with the body (12), and the limiting parts (21) connected with the first positioning plate body (13); a second positioning plate body (14) connected with the body (12), and the limiting parts (21) connected with the first positioning plate body (13); the first positioning plate body (13) and the second positioning plate body (14) have an operation gap (20) therebetween.

8. The test device of claim 7, wherein, The positioning base (1) comprises: a third positioning plate body (16) connected with the body (12), and the limiting parts (21) connected with the third positioning plate body (16); a fourth positioning plate body (17) connected with the body (12), and the limiting parts (21) connected with the fourth positioning plate body (17); the third positioning plate body (16) and the fourth positioning plate body (17) have an operation gap (20) therebetween.

9. The test device of claim 7, wherein, The positioning base (1) comprises: a support base (18); A connecting plate (19) is connected at one end to the support base (18) and at the other end to the body (12) to form an operating space (30) between the body (12) and the support base (18).

10. The test device of claim 1, wherein, The material of the positioning base (1) is metal; and / or, The limiting portion (21) is made of a biphenyl polyimide material.

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