Vertical probe card with tip protection device

Abstract

The utility model relates to the technical field of vertical probe cards, and discloses a vertical probe card with a needle tip protection device, which comprises a fixed frame, an adaptive opening is arranged in the fixed frame, limiting grooves are arranged on the inner wall of the fixed frame, and the limiting grooves are arranged at equal intervals on the circumference; the test part is arranged in the fixed frame; the buffer part is arranged in the fixed frame; wherein the test part comprises a protective shell which is movably connected to the top of the fixed frame. When a sliding disc slides down, the sliding disc extrudes trapezoidal sliding blocks, so that the trapezoidal sliding blocks slide and expand outwards along the track of a sliding rail, rolling wheels slide into a fixing frame, an L-shaped rotating frame rotates around a shaft in a horizontal state to be in a vertical state, and a connecting seat is driven to rotate; and therefore, the top end of the damper is extruded, and the purpose of buffering the sliding impact force of the trapezoidal sliding block is achieved.

Description

Technical Field

[0001] This utility model relates to the field of vertical probe card technology, specifically a vertical probe card with a tip protection device. Background Technology

[0002] A probe card is a test interface primarily used for testing bare chips. By connecting a tester to the chip, it transmits signals to test chip parameters. It involves directly contacting the probes on the probe card with the solder pads or bumps on the chip to extract chip signals. Combined with peripheral test instruments and software control, it achieves automated measurement.

[0003] The current equipment is frequently exposed to the risk of external impacts during handling and relocation. Because the needle tip and test plate are usually rigidly connected, there is a lack of effective cushioning mechanism to withstand impact forces, making the needle tip extremely susceptible to damage. Utility Model Content

[0004] The purpose of this invention is to provide a vertical probe card with a needle tip protection device, which solves the problem that existing devices often face the risk of external impacts during handling and relocation. Because the needle tip and test plate are usually rigidly connected, lacking an effective buffering mechanism to cope with impact forces, the needle tip is easily damaged. This invention achieves the purpose of buffering impact forces and protecting the needle tip.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a vertical probe card with a needle tip protection device, comprising: a fixed frame, wherein an adapter port is provided inside the fixed frame, and a limiting groove is provided on the inner wall of the fixed frame, the limiting groove being equidistantly arranged circumferentially; a test part disposed inside the fixed frame; and a buffer part disposed inside the fixed frame; wherein the test part comprises: a protective shell, movably connected to the top of the fixed frame; a guide plate, fixedly connected to the inner wall of the fixed frame; and an L-shaped sliding plate, slidably connected inside the limiting groove.

[0006] Preferably, a probe is installed on the inner wall of the protective shell. The probes are equidistant from each other around the circumference. The probes are adapted to the guide plate. A sliding disk is fixedly connected to the bottom end of the L-shaped sliding plate. The probes pass through and are limited by the guide plate, ensuring that the movement trajectory of the probes during the test is accurate and error-free, and improving the accuracy and repeatability of the test.

[0007] Preferably, a test buffer pad is fixedly connected to the top of the sliding disk, the test buffer pad is adapted to the probe, and a spring is provided between the sliding disk and the adapter port. One end of the spring is fixedly connected to the bottom of the sliding disk, and the other end of the spring is fixedly connected to the bottom of the inner wall of the adapter port. By introducing the test buffer pad, non-rigid contact between the probe tip and the test surface is achieved, which effectively reduces the risk of tip damage caused by vibration or collision during transportation or testing.

[0008] Preferably, the buffer portion includes: a slide rail, fixedly connected to the bottom of the inner wall of the adapter port, the slide rail being equidistant from each other around the circumference; and a fixing frame, fixedly connected to the inner wall of the adapter port, the fixing frame being equidistant from each other around the circumference.

[0009] Preferably, a trapezoidal slider is slidably connected to the outer wall of the slide rail, and a second spring is provided between the trapezoidal slider and the adapter port. The second spring is symmetrically arranged, with one end of the second spring fixedly connected to one side of the trapezoidal slider and the other end of the trapezoidal slider fixedly connected to the inner wall of the adapter port. The trapezoidal slider is adapted to the sliding plate.

[0010] Preferably, a connecting frame is fixedly connected to one side of the trapezoidal slider, an L-shaped rotating frame is rotatably connected between the inner walls of the connecting frame, and a roller is rotatably connected between the inner sides of the L-shaped rotating frame, the roller being adapted to the fixed frame.

[0011] Preferably, a connecting column is fixedly connected between the inner sides of the connecting frame, and a damper is rotatably connected to the outer wall of the connecting column. A connecting seat is fixedly connected to the top of the damper, and the connecting seat is rotatably connected between the inner sides of the L-shaped rotating frame. The sliding plate slides down and squeezes the trapezoidal slider, thereby triggering a series of chain reactions. Finally, the damper absorbs the impact force. This process demonstrates the device's efficient buffering capability.

[0012] This invention provides a vertical probe card with a tip protection device. It has the following advantages:

[0013] (1) This utility model uses a handheld protective shell to pass the probe through the guide plate, thereby limiting the movement trajectory of the probe. Then, one end of the probe is pressed against the test buffer pad for testing. When the fixed frame is transported, the sliding plate drives the test buffer pad to slide along the trajectory of the limiting groove. With the assistance of the spring, the sliding plate can be easily reset, thereby achieving the purpose of preventing the probe tip from being rigidly connected to the test buffer pad and protecting the tip.

[0014] (2) When the sliding disc slides down, it squeezes the trapezoidal slider, thereby causing each trapezoidal slider to slide outward along the track of the slide rail, so that the roller slides into the interior of the fixed frame, thereby causing the L-shaped rotating frame to rotate from a horizontal state around the axis to a vertical state, thereby driving the connecting seat to rotate, thereby squeezing the top of the damper, thus achieving the purpose of buffering the sliding impact force of the trapezoidal slider. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the main structure of this utility model;

[0016] Figure 2 This is a front view of the present utility model;

[0017] Figure 3 This is a view of the test area of ​​this utility model;

[0018] Figure 4 This is a view of the buffer section of this utility model;

[0019] Figure 5 This is a detailed view of the buffer section of this utility model.

[0020] In the diagram: 1. Fixed frame; 2. Test area; 3. Buffer area.

[0021] 211 Protective shell, 212 Probe, 213 Guide plate, 214 L-shaped sliding plate, 215 Sliding disk, 216 Test buffer pad, 217 Spring 1;

[0022] 311 Slide rail, 312 Trapezoidal slider, 313 Spring II, 314 Connecting frame, 315 L-shaped rotating frame, 316 Roller, 317 Fixed frame, 318 Connecting column, 319 Damper, 320 Connecting seat. Detailed Implementation

[0023] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0024] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances. Example

[0025] Currently used devices in existing technologies are frequently exposed to external impacts during handling and relocation. Because the connection between the probe tip and the test plate is typically rigid, there is a lack of effective cushioning mechanisms to withstand impact forces, making the probe tip highly susceptible to damage. This invention provides a preferred embodiment of a vertical probe card with a probe tip protection device, for example... Figure 1-5 As shown: A vertical probe clip with a needle tip protection device includes: a fixed frame 1, the fixed frame 1 having an adapter opening inside, and a limiting groove formed on the inner wall of the fixed frame 1, the limiting groove being equidistant from each other around the circumference; a test part 2 disposed inside the fixed frame 1; and a buffer part 3 disposed inside the fixed frame 1; wherein the test part 2 includes: a protective shell 211, movably connected to the top of the fixed frame 1; a guide plate 213, fixedly connected to the inner wall of the fixed frame 1; and an L-shaped sliding plate 214, slidably connected inside the limiting groove.

[0026] The inner wall of the protective shell 211 is equipped with a probe 212, which is equidistant from each other around the circumference. The probe 212 is adapted to the guide plate 213. The bottom end of the L-shaped sliding plate 214 is fixedly connected to a sliding disk 215.

[0027] A test buffer pad 216 is fixedly connected to the top of the sliding disk 215. The test buffer pad 216 is adapted to the probe 212. A spring 217 is provided between the sliding disk 215 and the adapter port. One end of the spring 217 is fixedly connected to the bottom of the sliding disk 215, and the other end of the spring 217 is fixedly connected to the bottom of the inner wall of the adapter port.

[0028] Furthermore, in this embodiment, the probe 212 is inserted through the guide plate 213 by holding the protective shell 211, thereby limiting the movement trajectory of the probe 212. Then, one end of the probe 212 is pressed against the test buffer pad 216 for testing. Thus, when the fixed frame 1 is transported, the sliding disk 215 drives the test buffer pad 216 to slide along the trajectory of the limiting groove. With the assistance of the spring 217, the sliding disk 215 can be easily reset, thereby achieving the purpose of preventing the probe 212 tip from being rigidly connected to the test buffer pad 216 and protecting the tip. Example

[0029] Based on Embodiment 1, a preferred embodiment of the vertical probe card with a tip protection device provided by this utility model is, for example... Figure 1-5 As shown: The buffer part 3 includes: a slide rail 311, which is fixedly connected to the bottom of the inner wall of the adapter port, and the slide rail 311 is equidistantly arranged around the circumference; and a fixing frame 317, which is fixedly connected to the inner wall of the adapter port, and the fixing frame 317 is equidistantly arranged around the circumference.

[0030] A trapezoidal slider 312 is slidably connected to the outer wall of the slide rail 311. A second spring 313 is provided between the trapezoidal slider 312 and the adapter port. The second spring 313 is symmetrically arranged. One end of the second spring 313 is fixedly connected to one side of the trapezoidal slider 312, and the other end of the trapezoidal slider 312 is fixedly connected to the inner wall of the adapter port. The trapezoidal slider 312 is adapted to the sliding disk 215.

[0031] A connecting frame 314 is fixedly connected to one side of the trapezoidal slider 312. An L-shaped rotating frame 315 is rotatably connected between the inner walls of the connecting frame 314. A roller 316 is rotatably connected between the inner sides of the L-shaped rotating frame 315. The roller 316 is adapted to the fixed frame 317.

[0032] A connecting column 318 is fixedly connected between the inner sides of the connecting frame 314. A damper 319 is rotatably connected to the outer wall of the connecting column 318. A connecting seat 320 is fixedly connected to the top of the damper 319. The connecting seat 320 is rotatably connected between the inner sides of the L-shaped rotating frame 315.

[0033] Furthermore, in this embodiment, when the sliding disk 215 slides down, it squeezes the trapezoidal slider 312, causing each trapezoidal slider 312 to slide outward along the trajectory of the slide rail 311. This causes the roller 316 to slide into the interior of the fixed frame 317, thereby causing the L-shaped rotating frame 315 to rotate from a horizontal state to a vertical state, which in turn drives the connecting seat 320 to rotate, thereby squeezing the top of the damper 319, thus achieving the purpose of buffering the sliding impact force of the trapezoidal slider 312.

[0034] In use, first hold the protective shell 211 and insert the probe 212 through the guide plate 213 to limit the movement trajectory of the probe 212. Then, place one end of the probe 212 against the test buffer pad 216 for testing. During transportation of the fixed frame 1, the sliding disk 215 drives the test buffer pad 216 to slide along the trajectory of the limiting groove. With the assistance of the spring 217, the sliding disk 215 can be easily reset, thereby achieving the purpose of de-rigidifying the connection between the probe 212 tip and the test buffer pad 216. This achieves the purpose of protecting the needle tip; secondly, when the sliding plate 215 slides down, it squeezes the trapezoidal slider 312, causing each trapezoidal slider 312 to slide outward along the track of the slide rail 311, so that the roller 316 slides into the interior of the fixed frame 317, thereby causing the L-shaped rotating frame 315 to rotate from a horizontal state to a vertical state, thereby driving the connecting seat 320 to rotate, thereby squeezing the top of the damper 319, thus achieving the purpose of buffering the sliding impact force of the trapezoidal slider 312.

[0035] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0036] Finally, it should be noted that the above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A vertical probe card with a tip protection device, characterized in that, It includes: a fixed frame (1), the fixed frame (1) having an adapter opening inside, and a limiting groove being provided on the inner wall of the fixed frame (1), the limiting groove being equidistant from each other around the circumference; The test part (2) is set inside the fixed frame (1); The buffer part (3) is set inside the fixed frame (1); The test site (2) includes: The protective shell (211) is movably connected to the top of the fixed frame (1); The guide plate (213) is fixedly connected to the inner wall of the fixed frame (1); The L-shaped sliding plate (214) is slidably connected inside the limiting groove.

2. A vertical probe card with a tip protection device according to claim 1, characterized in that: The inner wall of the protective shell (211) is equipped with a probe (212), the probe (212) is equidistantly arranged around the circumference, the probe (212) is adapted to the guide plate (213), and the bottom end of the L-shaped sliding plate (214) is fixedly connected to a sliding disk (215).

3. A vertical probe card with a tip protection device according to claim 2, characterized in that: A test buffer pad (216) is fixedly connected to the top of the sliding disk (215). The test buffer pad (216) is adapted to the probe (212). A spring (217) is provided between the sliding disk (215) and the adapter port. One end of the spring (217) is fixedly connected to the bottom of the sliding disk (215), and the other end of the spring (217) is fixedly connected to the bottom of the inner wall of the adapter port.

4. A vertical probe card with a tip protection device according to claim 1, characterized in that: The buffer section (3) includes: The slide rail (311) is fixedly connected to the bottom of the inner wall of the adapter port, and the slide rail (311) is equidistantly arranged around its circumference; A fixing bracket (317) is fixedly connected to the inner wall of the adapter port, and the fixing bracket (317) is equidistantly arranged around the circumference.

5. A vertical probe card with a tip protection device according to claim 4, characterized in that: The outer wall of the slide rail (311) is slidably connected to a trapezoidal slider (312). A second spring (313) is provided between the trapezoidal slider (312) and the adapter port. The second spring (313) is symmetrically arranged. One end of the second spring (313) is fixedly connected to one side of the trapezoidal slider (312), and the other end of the trapezoidal slider (312) is fixedly connected to the inner wall of the adapter port. The trapezoidal slider (312) is adapted to the sliding disk (215).

6. A vertical probe card with a tip protection device according to claim 5, characterized in that: A connecting frame (314) is fixedly connected to one side of the trapezoidal slider (312). An L-shaped rotating frame (315) is rotatably connected between the inner walls of the connecting frame (314). A roller (316) is rotatably connected between the inner sides of the L-shaped rotating frame (315). The roller (316) is adapted to the fixed frame (317).

7. A vertical probe card with a tip protection device according to claim 6, characterized in that: A connecting column (318) is fixedly connected between the inner sides of the connecting frame (314), and a damper (319) is rotatably connected to the outer wall of the connecting column (318). A connecting seat (320) is fixedly connected to the top of the damper (319), and the connecting seat (320) is rotatably connected between the inner sides of the L-shaped rotating frame (315).

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