Film thickness gauge
By introducing a moving mechanism and a leveling and cleaning mechanism into the thin film thickness gauge, the measurement error problem caused by film vibration was solved, and accurate measurement by the infrared thickness probe was achieved.
Patent Information
- Application Number
- CN202423249484.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-27
- Publication Date
- 2025-12-05
- Estimated Expiration
- 2034-12-27
AI Technical Summary
During the PE film production process, the film thickness measurement is easily affected by external airflow due to the lack of a support structure, resulting in vibration and inaccurate measurement data.
A thin film thickness gauge was designed, comprising a support leg, a thickness gauge, a moving mechanism, an infrared thickness probe, a leveling mechanism, and a cleaning mechanism. The moving mechanism is driven by a hydraulic rod to bring the leveling mechanism close to the film, and the film is leveled using a rubber layer. Combined with a motor-driven fan blade, the film surface is cleaned to ensure accurate measurement.
This effectively avoids the influence of external airflow on the measurement, ensuring the accuracy of the infrared thickness probe's measurement data and improving the quality of thickness measurement.
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Figure CN223636809U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to the technical field of PE film production, specifically to a film thickness gauge. BACKGROUND
[0002] PE film needs to be detected in thickness sometimes after production, and the basic principle is to measure the thickness by using the functional relationship between the thickness and the attenuation degree when the infrared thickness detection probe moves above the film. When measuring, the film vibrates once the film is affected by external air flow due to the lack of supporting mechanism at the bottom of the film, and the data measured has errors, resulting in inaccurate data. Therefore, a film thickness gauge is proposed to solve the above problems. UTILITY MODEL CONTENT
[0003] The utility model discloses a film thickness gauge to solve the problems in the background art.
[0004] To achieve the above object, the utility model provides the following technical scheme: a film thickness gauge, including support leg, thickness gauge and moving mechanism,
[0005] The top of the support leg is provided with the thickness gauge, and the inside of the thickness gauge is provided with the moving mechanism. The inside of the thickness gauge is also provided with a film layer. The film layer is provided below the guide roller in rotational connection with the thickness gauge.
[0006] The bottom of the moving mechanism is fixedly connected with the infrared thickness detection probe for detecting the thickness of the film layer. The infrared thickness detection probe is provided with the leveling mechanism on both sides. The leveling mechanism is fixedly connected with the moving end of the moving mechanism.
[0007] The inside of the leveling mechanism is provided with the cleaning mechanism for cleaning the surface of the film layer.
[0008] The leveling mechanism includes a moving frame, a second motor and a rotating shaft. The top of the moving frame is fixedly connected with the moving end of the moving mechanism. One side of the moving frame is fixedly connected with the second motor. The main shaft end of the second motor is fixedly connected with the rotating shaft. The other end of the rotating shaft is fixedly connected with the moving frame in rotational connection. The outer side of the rotating shaft is fixedly connected with the rotating roller. The outer side of the rotating roller is fixedly connected with the rubber layer. The inside of the moving frame is provided with the cleaning mechanism.
[0009] Further, the upper and lower sides of the thickness gauge are fixedly connected with the hydraulic rod, and the free end of the hydraulic rod is fixedly connected with the moving mechanism. The two sides of the moving mechanism are fixedly connected with the sliding sleeve. The inside of the sliding sleeve is slidingly connected with the guide column. The two sides of the guide column are fixedly connected with the thickness gauge.
[0010] Further, the moving mechanism comprises a lifting frame, a first motor and a threaded shaft, the outer side of the lifting frame is fixedly connected with the moving end of the hydraulic rod, the two sides of the lifting frame are fixedly connected with sliding sleeves, the inside of the lifting frame is fixedly connected with the first motor, the other end of the first motor is rotationally connected with the lifting frame, the outer side of the threaded shaft is spirally connected with a moving sleeve, the outer side of the moving sleeve is fixedly connected with a mounting seat, and the outer side of the mounting seat is fixedly connected with the infrared thickness measuring probe and the leveling mechanism.
[0011] After the PE film is produced, sometimes the thickness thereof needs to be detected, the infrared thickness measuring probe is moved above the film, and basically the principle is to measure the thickness by utilizing the functional relationship between the thickness and the attenuation degree; during the measurement, since there is no supporting mechanism at the bottom of the film, once the film is affected by external air flow, the film vibrates, and at this time, the measured data has errors, and the data is inaccurate; when the device is used, the film layer is located between the moving mechanisms on the upper side and the lower side, during the thickness measurement, the hydraulic rods on the upper side and the lower side are started to drive the moving mechanisms to move, at this time, the moving mechanisms drive the leveling mechanisms on the one side to approach the film layer, the outer side of the rubber layer is in contact with the film layer, and the moving mechanisms slowly drive the infrared thickness measuring probe and the leveling mechanisms to move, at this time, the leveling mechanisms play a role in leveling the film layer, so that the film layer is not affected by external air flow, and the thickness data measured by the infrared thickness measuring probe is accurate.
[0012] Further, the cleaning mechanism comprises a cleaning frame, a third motor and a fan blade, the outer side of the cleaning frame is fixedly connected with the leveling mechanism, the inside of the cleaning frame is fixedly connected with the third motor, and the main shaft tail end of the third motor is fixedly connected with the fan blade.
[0013] The inside of the cleaning frame is also provided with a guide frame, and one side of the guide frame is fixedly connected with a guide nozzle.
[0014] Further, the guide nozzle is arranged in an inclined mode.
[0015] When the leveling mechanism moves, the third motor drives the fan blade to rotate, at this time, air flows and is discharged through the guide frame and the guide nozzle, so that the purpose of cleaning the surface of the film layer can be achieved, and the thickness measurement quality is ensured; the cleaning mechanism in the leveling mechanism is installed on the side far away from the infrared thickness measuring probe, at this time, the leveling mechanism can play a role in fixing the film layer, so that the cleaning work of the cleaning mechanism will not cause the film layer in the thickness measurement area of the infrared thickness measuring probe to vibrate.
[0016] Compared with the prior art, the device has the advantages that:
[0017] The utility model discloses a moving mechanism is located between the upper and lower sides when using, when measuring the thickness, the moving mechanism is moved through the hydraulic rod of starting upper and lower sides, the moving mechanism drives the flattening mechanism of one side to approach the film layer at this moment, and the rubber layer outside contacts with the film layer, and the moving mechanism drives the infrared thickness gauge probe and flattening mechanism to move slowly, the flattening mechanism plays the flattening work to the film layer at this moment, avoids its hand external air flow influence, ensures the thickness data precision of infrared thickness gauge probe;
[0018] When the flattening mechanism moves, the fan blade is rotated through the third motor, and air flows out through the guide frame and guide nozzle at this moment, so that the surface of the film layer can be cleaned, and the thickness measurement quality is ensured. BRIEF DESCRIPTION OF DRAWINGS
[0019] Figure 1 It is the whole structure schematic diagram of the utility model;
[0020] Figure 2 It is the structure schematic diagram of the moving mechanism of the utility model;
[0021] Figure 3 It is the structure schematic diagram of the flattening mechanism of the utility model;
[0022] Figure 4 It is the structure schematic diagram of the cleaning mechanism of the utility model;
[0023] Figure 5 It is the structure schematic diagram of the guide frame of the utility model.
[0024] In the drawing: 1, support leg;2, thickness gauge;3, moving mechanism;301, lifting frame;302, first motor;303, threaded shaft;304, moving sleeve;305, mounting seat;4, infrared thickness gauge probe;5, flattening mechanism;501, moving frame;502, second motor;503, rotating shaft;504, rotating roller;505, rubber layer;6, film layer;7, cleaning mechanism;701, cleaning frame;702, third motor;703, fan blade;704, guide frame;705, guide nozzle;8, guide roller;9, hydraulic rod;10, guide column;11, sliding sleeve. DETAILED DESCRIPTION
[0025] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts belong to the scope of the present application.
[0026] Embodiment 1: refer to Figure 1 、 Figure 2 、 Figure 3 and Figure 4 , the present application provides a technical scheme:
[0027] A film thickness gauge, comprising a supporting leg 1, a thickness gauge 2 and a moving mechanism 3;
[0028] The top of the supporting leg 1 is provided with the thickness gauge 2, and the inside of the thickness gauge 2 is provided with the moving mechanism 3, and the inside of the thickness gauge 2 is further provided with a film layer 6, and the lower side of the film layer 6 is provided with a guide roller 8 in rotation connection with the thickness gauge 2;
[0029] The bottom of the moving mechanism 3 is fixedly connected with an infrared thickness probe 4 for detecting the thickness of the film layer 6, and the two sides of the infrared thickness probe 4 are provided with leveling mechanisms 5, and the top of the leveling mechanism 5 is fixedly connected with the moving end of the moving mechanism 3;
[0030] The inside of the leveling mechanism 5 is provided with a cleaning mechanism 7 for cleaning the surface of the film layer 6;
[0031] The leveling mechanism 5 comprises a moving frame 501, a second motor 502 and a rotating shaft 503, the top of the moving frame 501 is fixedly connected with the moving end of the moving mechanism 3, one side of the moving frame 501 is fixedly connected with the second motor 502, the end of the main shaft of the second motor 502 is fixedly connected with the rotating shaft 503, the other end of the rotating shaft 503 is fixedly connected with the moving frame 501 in rotation connection, the outer side of the rotating shaft 503 is fixedly connected with a rotating roller 504, the outer side of the rotating roller 504 is fixedly connected with a rubber layer 505, and the inside of the moving frame 501 is provided with the cleaning mechanism 7.
[0032] The upper and lower sides of the thickness gauge 2 are fixedly connected with hydraulic rods 9, and the free ends of the hydraulic rods 9 are fixedly connected with the moving mechanism 3, the two sides of the moving mechanism 3 are fixedly connected with sliding sleeves 11, the inside of the sliding sleeve 11 is slidingly connected with guide columns 10, and the two sides of the guide column 10 are fixedly connected with the thickness gauge 2.
[0033] The moving mechanism 3 comprises a lifting frame 301, a first motor 302 and a threaded shaft 303, the outer side of the lifting frame 301 is fixedly connected with the moving end of the hydraulic rod 9, the two sides of the lifting frame 301 are fixedly connected with the sliding sleeve 11, the inside of the lifting frame 301 is fixedly connected with the first motor 302, the other end of the first motor 302 is rotationally connected with the lifting frame 301, the outer side of the threaded shaft 303 is spirally connected with a moving sleeve 304, the outer side of the moving sleeve 304 is fixedly connected with a mounting seat 305, and the outer side of the mounting seat 305 is fixedly connected with the infrared thickness measuring probe 4 and the leveling mechanism 5.
[0034] After the production of the PE film is completed, sometimes the thickness of the PE film needs to be detected. The basic principle of the detection is to measure the thickness by using the functional relationship between the thickness and the attenuation degree. During the measurement, since there is no supporting mechanism at the bottom of the film, once the film is affected by the external air flow, the film vibrates, and at this time, the measured data has errors, and the data is not accurate. However, in the use of the device, the film layer 6 is located between the moving mechanisms 3 on the upper and lower sides, and when the thickness is measured, the hydraulic rods 9 on the upper and lower sides are started to drive the moving mechanisms 3 to move. At this time, the moving mechanisms 3 drive the leveling mechanisms 5 on one side to approach the film layer 6, the outer side of the rubber layer 505 contacts the film layer 6, and the moving mechanisms 3 slowly move the infrared thickness measuring probe 4 and the leveling mechanisms 5. At this time, the leveling mechanisms 5 play a role in leveling the film layer 6, avoiding the influence of the external air flow, and ensuring the accuracy of the thickness data measured by the infrared thickness measuring probe 4.
[0035] In the embodiment, when the moving mechanism 3 moves, the second motor 502 drives the rotating shaft 503 to rotate, the rotating shaft 503 drives the rotating roller 504 to rotate, and the rotating roller 504 drives the outer side of the rubber layer 505 to contact. At this time, the film 6 can be positioned and leveled, and the thickness data of the film 6 can be accurately measured by the infrared thickness measuring probe 4. The cooperation of the sliding sleeve 11 and the guide column 10 can ensure the stable movement of the moving mechanism 3. The first motor 302 drives the threaded shaft 303 to rotate, the threaded shaft 303 drives the moving sleeve 304 on the outer side to move, and then the mounting seat 305 can be moved. At this time, the infrared thickness measuring probe 4 and the leveling mechanisms 5 at the bottom of the mounting seat 305 can move synchronously, which is convenient for subsequent thickness measurement.
[0036] Embodiment 2: The embodiment is an improvement on embodiment 1. Please refer to Figure 1 , specifically, the cleaning mechanism 7 comprises a cleaning frame 701, a third motor 702 and a fan blade 703, the outer side of the cleaning frame 701 is fixedly connected with the leveling mechanism 5, the inside of the cleaning frame 701 is fixedly connected with the third motor 702, and the main shaft end of the third motor 702 is fixedly connected with the fan blade 703.
[0037] The interior of the cleaning frame 701 is further provided with a guide frame 704, and one side of the guide frame 704 is fixedly connected with a guide nozzle 705.
[0038] The guide nozzle 705 is obliquely arranged.
[0039] When the leveling mechanism 5 moves, the fan blade 703 is driven to rotate by the third motor 703, at this time, the air flows and is discharged through the guide frame 704 and the guide nozzle 705, so that the surface of the film layer 6 can be cleaned, and the measurement thickness quality is ensured, and the cleaning mechanism 7 in the leveling mechanism 5 is installed on the side far away from the infrared thickness measuring probe 4, at this time, the leveling mechanism 5 can fix the film layer 6, so that the cleaning work of the cleaning mechanism 7 will not cause the film layer 6 in the thickness measuring area of the infrared thickness measuring probe 4 to vibrate;
[0040] In the embodiment, the guide nozzle 705 at the bottom of the guide frame 704 is obliquely arranged, which can face two sides, and when moving, the guide nozzle 705 can blow the dust on the film layer 6 to the two sides, so as to achieve the purpose of cleaning.
[0041] It should be noted that, in the present document, relational terms such as first and second and the like can be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises", "comprising", or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but can include other elements not expressly listed or inherent to such process, method, article, or apparatus.
[0042] Although the embodiments of the present application have been shown and described, it is to be understood that for the purpose of the present application, the embodiments can be changed, modified, replaced and varied in many ways without departing from the principles and spirit of the present application, and the scope of the present application is defined by the appended claims and their equivalents.
Claims
1. A film thickness gauge, characterized by: Including the supporting leg (1), the thickness gauge (2) and the moving mechanism (3); The top of the supporting leg (1) is provided with the thickness gauge (2), and the inside of the thickness gauge (2) is provided with the moving mechanism (3), the inside of the thickness gauge (2) is further provided with the film layer (6), and the lower side of the film layer (6) is provided with the guide roller (8) which is rotatably connected with the thickness gauge (2); The bottom of the moving mechanism (3) is fixedly connected with the infrared thickness probe (4) for detecting the thickness of the film layer (6), and the two sides of the infrared thickness probe (4) are provided with the leveling mechanism (5) which is fixedly connected with the moving end of the moving mechanism (3); The inside of the leveling mechanism (5) is provided with the cleaning mechanism (7) for cleaning the surface of the film layer (6).
2. A film thickness gauge according to claim 1, characterised in that: The leveling mechanism (5) comprises a moving frame (501), a second motor (502) and a rotating shaft (503), the top of the moving frame (501) is fixedly connected with the moving end of the moving mechanism (3), one side of the moving frame (501) is fixedly connected with the second motor (502), the main shaft end of the second motor (502) is fixedly connected with the rotating shaft (503), the other end of the rotating shaft (503) is fixedly connected with the moving frame (501) in a rotatable manner, the outer side of the rotating shaft (503) is fixedly connected with the rotating roller (504), the outer side of the rotating roller (504) is fixedly connected with the rubber layer (505), and the inside of the moving frame (501) is provided with the cleaning mechanism (7).
3. A film thickness gauge according to claim 2, characterised in that: The upper and lower sides of the thickness gauge (2) are fixedly connected with the hydraulic rod (9), and the free end of the hydraulic rod (9) is fixedly connected with the moving mechanism (3), the two sides of the moving mechanism (3) are fixedly connected with the sliding sleeve (11), the inside of the sliding sleeve (11) is slidably connected with the guide column (10), and the two sides of the guide column (10) are fixedly connected with the thickness gauge (2).
4. The film thickness gauge of claim 2, wherein: The moving mechanism (3) comprises a lifting frame (301), a first motor (302) and a threaded shaft (303), the outer side of the lifting frame (301) is fixedly connected with the moving end of the hydraulic rod (9), the two sides of the lifting frame (301) are fixedly connected with the sliding sleeve (11), the inside of the lifting frame (301) is fixedly connected with the first motor (302), the other end of the first motor (302) is rotatably connected with the lifting frame (301), and the outer side of the threaded shaft (303) is spirally connected with the moving sleeve (304), the outer side of the moving sleeve (304) is fixedly connected with the mounting seat (305), and the outer side of the mounting seat (305) is fixedly connected with the infrared thickness probe (4) and the leveling mechanism (5).
5. The film thickness gauge of claim 2, wherein: The cleaning mechanism (7) comprises a cleaning frame (701), a third motor (702) and a fan blade (703), the outer side of the cleaning frame (701) is fixedly connected with the leveling mechanism (5), the inside of the cleaning frame (701) is fixedly connected with the third motor (702), and the main shaft end of the third motor (702) is fixedly connected with the fan blade (703). The interior of the cleaning frame (701) is further provided with a guide frame (704), and one side of the guide frame (704) is fixedly connected with a guide nozzle (705).
6. A film thickness gauge according to claim 5, characterised in that: The guide nozzle (705) is arranged in an inclined mode.