Power device testing device

Abstract

The utility model relates to the technical field of device testing equipment, in particular to a power device testing device which comprises a temperature difference adjusting type testing assembly, the temperature difference adjusting type testing assembly comprises a vacuum cover, an oscilloscope and a detection body, the detection body is arranged in the vacuum cover, and the input end of the oscilloscope penetrates through the vacuum cover to be arranged above the detection body. An original structure is modified and replaced by a temperature difference adjusting type testing assembly, so that the problem that the whole tested part and a measuring probe are directly placed in a low-temperature box for testing in an existing low-temperature test, but the probe, especially a Rogowski coil probe, can generate a relatively large error at a low temperature is effectively solved.

Description

TECHNICAL FIELD

[0001] The utility model relates to device test equipment technical field especially relates to a kind of power device testing device. BACKGROUND

[0002] The electrical performance of power device can be affected by temperature, and it is easier to test high temperature of power device, but it is more difficult to test low temperature.

[0003] Some low temperature tests (-40 degrees) in the prior art directly place the entire measured part and the measurement probe in a low temperature chamber for testing, but the probe, especially the Rogowski coil (a commonly used current probe), generates a large error at low temperature.

[0004] To solve the above problems, we propose a power device testing device that can easily implement high and low temperature testing, and the accuracy of low temperature testing can be guaranteed. UTILITY MODEL CONTENT

[0005] The utility model aims at providing a kind of power device testing device, solve the low temperature test of prior art, directly the entire measured part is placed in low temperature chamber with measurement probe to test, but due to probe, especially the Rogowski coil probe generates a large error at low temperature.

[0006] To achieve the above object, the utility model adopts a kind of power device testing device, including adjusting temperature difference type test component, the adjusting temperature difference type test component includes vacuum cover, oscilloscope and detection body, the detection body is arranged in the inside of the vacuum cover, the input of the oscilloscope is arranged above the detection body through the vacuum cover.

[0007] Among them, the vacuum cover includes base and cover body, the base is arranged below the oscilloscope, and the base is also arranged below the detection body, the cover body is detachably connected with the base and located above the base, and the cover body is arranged on the outer surface of the detection body.

[0008] Among them, the vacuum cover further includes vacuumizing connector and threading hole, the vacuumizing connector is fixedly connected with the cover body and located above the cover body, the threading hole is fixedly connected with the cover body and located on the side of the cover body, and the threading hole is arranged on the side of the vacuumizing connector.

[0009] Among them, the vacuum cover further includes condenser and high-low temperature gas generator, the output of the condenser is arranged on one side of the detection body through the cover body, the output of the high-low temperature gas generator is arranged on the side of the detection body away from the condenser through the cover body, and the high-low temperature gas generator is arranged on the side of the cover body away from the condenser.

[0010] The oscilloscope comprises a first voltage probe, a second voltage probe, a third voltage probe and a current probe, the first voltage probe is arranged inside the cover through the wire hole, and the first voltage probe is further arranged above the detection body, the second voltage probe is arranged inside the cover through the wire hole, and the second voltage probe is further arranged on one side of the first voltage probe, the third voltage probe is arranged inside the cover through the wire hole, and the third voltage probe is further arranged on the side of the second voltage probe away from the first voltage probe, and the current probe is arranged inside the cover through the wire hole, and the current probe is further arranged on one side of the third voltage probe.

[0011] The detection body comprises a measured module mounting seat and a heat sink, the heat sink is detachably connected with the base and located above the base, the measured module mounting seat is detachably connected with the heat sink and located above the heat sink, and the measured module mounting seat is arranged below the first voltage probe, the second voltage probe, the third voltage probe and the current probe.

[0012] The utility model discloses a kind of power device testing devices, including adjusting temperature difference type test component, the adjusting temperature difference type test component includes vacuum cover, oscilloscope and detection body, the detection body is arranged in the inside of the vacuum cover, one end of the oscilloscope is arranged above the detection body through the vacuum cover, since the original structure modification replacement is adjusted temperature difference type test component, thus it will effectively solve the existing low temperature test, directly the whole measured part is placed in low temperature box with measurement probe to test, but due to probe, especially large error problem that rohac coil probe is generated under low temperature. BRIEF DESCRIPTION OF DRAWINGS

[0013] In order to more clearly illustrate the technical scheme in the embodiments of the present utility model or prior art, the drawings needed to be used in the embodiment or prior art description will be simply introduced below, and obviously, the drawings in the following description are only some embodiments of the present utility model, and for those skilled in the art, other drawings can also be obtained according to these drawings without creative labor.

[0014] Figure 1 It is the overall structure schematic diagram of the present utility model.

[0015] Figure 2 It is the measurement circuit schematic diagram of the overall structure of the present utility model.

[0016] 1 - vacuum cover, 101 - vacuum joint, 102 - condenser, 103 - high and low temperature gas generator, 104 - threading hole, 105 - base, 106 - cover body, 2 - oscilloscope, 201 - No. 1 voltage probe, 202 - No. 2 voltage probe, 203 - current probe, 204 - No. 3 voltage probe, 3 - detection body, 301 - heat sink, 302 - measured module seat. DETAILED DESCRIPTION

[0017] The embodiments of the present application are described in detail below, examples of which are shown in the drawings, wherein the same or similar notations represent the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by reference to the drawings are exemplary and are intended to explain the present application, and cannot be understood as a limitation of the present application.

[0018] Please refer to Figure 1 and Figure 2 , Figure 1 is a structural schematic diagram of the whole of the present application, Figure 2 is a measurement circuit schematic diagram of the whole of the present application.

[0019] The utility model provides a kind of power device testing device, including adjusting temperature difference type test component, the adjusting temperature difference type test component includes vacuum cover 1, oscilloscope 2 and detection body 3, the vacuum cover 1 includes base 105 and cover body 106, vacuum joint 101 and threading hole 104, condenser 102 and high-low temperature gas generator 103, the oscilloscope 2 includes voltage probe 201, voltage probe 202, voltage probe 204 and current probe 203, the detection body 3 includes measured module seat 302 and radiator 301, the preceding scheme is solved the existing low temperature test, directly the whole measured part is placed in cryogenic cabinet with measurement probe to test, but due to probe, especially large error problem that rothens coil probe generates under low temperature, it can be understood that the preceding scheme can be installed in matching measured module seat 302 according to the measured device and install radiator 301;The voltage probe 201 of the oscilloscope 2, the voltage probe 202, the voltage probe 204 and the current probe 203 are connected on the measured module seat 302 as required;Vacuumization is carried out on the cover body 106 using air extractor connection vacuum joint 101;High-low temperature gas generator 103 supplies cold gas or hot gas as required, passes through pipeline and flows through radiator 301, and the measured module seat 302 is heated or cooled;The temperature of the radiator 301 is read;The radiator 301 is powered on;The condenser 102 exchanges the heat in the radiator 301, so that the outflowing gas is normal temperature, can avoid that pipeline is blocked by ice or gas scald, under vacuum environment, the measured module seat 302 is heated or cooled by the radiator 301, and the influence on the ambient temperature of the measured module seat 302 is limited, so that the voltage probe 201, the voltage probe 202, the voltage probe 204 and the current probe 203 are not affected by temperature, can test the parameter under-40 degrees Celsius~175 degrees Celsius, temperature can be adjusted according to actual situation, and the voltage probe 204 is connected to voltmeter at the end away from the measured module seat 302, can measure the voltage of measured device, so as to infer the junction temperature of measured device according to the K coefficient of device, thereby effectively solve the existing low temperature test, directly the whole measured part is placed in cryogenic cabinet with measurement probe to test, but due to probe, especially large error problem that rothens coil probe generates under low temperature.

[0020] For this specific embodiment, the detection body 3 is arranged inside the vacuum cover 1, and one end of the oscilloscope 2 is arranged above the detection body 3 through the vacuum cover 1.

[0021] The base 105 is arranged below the oscilloscope 2 and also below the detection body 3, the cover body 106 is detachably connected with the base 105 and arranged above the base 105, and the cover body 106 is arranged on the outer surface of the detection body 3.

[0022] Secondly, the vacuum joint 101 is fixedly connected with the cover body 106 and arranged above the cover body 106, the threading hole 104 is fixedly connected with the cover body 106 and arranged on one side of the cover body 106, and the threading hole 104 is arranged on one side of the vacuum joint 101. The vacuum joint 101 is connected with an air extractor to perform vacuumization on the cover body 106, and the threading hole 104 is convenient for the first voltage probe 201, the second voltage probe 202, the third voltage probe 204 and the current probe 203 to pass through. After the voltage probe 201, the second voltage probe 202, the third voltage probe 204 and the current probe 203 are installed, the threading hole 104 is sealed, so that the cover body 106 does not leak air after vacuumization.

[0023] Meanwhile, the output end of the condenser 102 is arranged on one side of the detection body 3 through the cover body 106, the output end of the high and low temperature gas generator 103 is arranged on the side of the detection body 3 away from the condenser 102 through the cover body 106, and the high and low temperature gas generator 103 is arranged on the side of the cover body 106 away from the condenser 102.

[0024] In addition, the first voltage probe 201 is arranged inside the cover body 106 through the threading hole 104, and the first voltage probe 201 is also arranged above the detection body 3, the second voltage probe 202 is arranged inside the cover body 106 through the threading hole 104, and the second voltage probe 202 is also arranged on one side of the first voltage probe 201, the third voltage probe 204 is arranged inside the cover body 106 through the threading hole 104, and the third voltage probe 204 is also arranged on the side of the second voltage probe 202 away from the first voltage probe 201, the current probe 203 is arranged inside the cover body 106 through the threading hole 104, and the current probe 203 is also arranged on one side of the third voltage probe 204, and the first voltage probe 201, the second voltage probe 202, the third voltage probe 204 and the current probe 203 of the oscilloscope 2 are connected with the radiator 301 as needed.

[0025] The heat sink 301 is detachably connected with the base 105 and is located above the base 105, the measured module installation seat 302 is detachably connected with the heat sink 301 and is located above the heat sink 301, and the measured module installation seat 302 is arranged below the first voltage probe 201, the second voltage probe 202, the third voltage probe 204 and the current probe 203, and the measured device is installed on the matched measured module installation seat 302 and the heat sink 301.

[0026] In use, the measured device is installed on the matched measured module installation seat 302 and the heat sink 301, the first voltage probe 201, the second voltage probe 202, the third voltage probe 204 and the current probe 203 of the oscilloscope 2 are connected on the measured module installation seat 302 as required, the cover body 106 is vacuumized by using the air extractor connected with the vacuumizing connector 101, the high-low temperature gas generator 103 supplies cold air or hot air as required, the cold air or hot air flows through the heat sink 301 through a pipeline, and the measured module installation seat 302 is heated or cooled, the temperature of the heat sink 301 is read, the heat sink 301 is powered on, and the condenser 102 exchanges the heat in the heat sink 301, so that the outflowing gas is at room temperature, the pipeline is prevented from being blocked by ice or the gas from scalding, the measured module installation seat 302 is heated or cooled by heat conduction through the heat sink 301 in a vacuum environment, the influence of the ambient temperature of the measured module installation seat 302 is limited, the first voltage probe 201, the second voltage probe 202, the third voltage probe 204 and the current probe 203 are prevented from being affected by the temperature, parameters at-40 degrees Celsius to 175 degrees Celsius can be tested, the temperature can be adjusted according to actual conditions, and the third voltage probe 204 is connected to a voltmeter at the end away from the measured module installation seat 302, the voltage of the measured device is measured, the junction temperature of the measured device is inferred according to the K coefficient of the device, and therefore the problem that the existing low-temperature test directly places the entire measured part and the measurement probe in a low-temperature box for testing but the probe, especially the Rogowski coil probe, generates a large error at low temperature is solved.

[0027] The above only discloses a preferred embodiment of the utility model, and of course cannot limit the scope of the utility model, and the person skilled in the art can understand that all or part of the processes of the above embodiment are implemented, and equivalent changes are made according to the utility model claim, which still belongs to the range covered by the utility model.

Claims

1. A power device testing device, characterized in that, it comprises an adjusting temperature difference testing assembly, the adjusting temperature difference testing assembly comprises a vacuum cover, an oscilloscope and a detection body, the detection body is arranged inside the vacuum cover, and an input end of the oscilloscope is arranged above the detection body through the vacuum cover.

2. The power device testing device according to claim 1, characterized in that, the vacuum cover comprises a base and a cover body, the base is arranged below the oscilloscope, and the base is also arranged below the detection body, the cover body is detachably connected with the base and is arranged above the base, and the cover body is arranged on an outer surface of the detection body.

3. The power device testing device according to claim 2, characterized in that, the vacuum cover further comprises a vacuumizing joint and a threading hole, the vacuumizing joint is fixedly connected with the cover body and is arranged above the cover body, the threading hole is fixedly connected with the cover body and is arranged on one side of the cover body above the vacuumizing joint, and the threading hole is arranged on one side of the vacuumizing joint.

4. The power device testing device according to claim 3, characterized in that, the vacuum cover further comprises a condenser and a high-low temperature gas generator, an output end of the condenser is arranged on one side of the detection body through the cover body, an output end of the high-low temperature gas generator is arranged on a side of the detection body away from the condenser through the cover body, and the high-low temperature gas generator is arranged on the side of the cover body away from the condenser.

5. The power device testing device according to claim 4, characterized in that, the oscilloscope comprises a first voltage probe, a second voltage probe, a third voltage probe and a current probe, the first voltage probe is arranged inside the cover body through the threading hole, and the first voltage probe is further arranged above the detection body, the second voltage probe is arranged inside the cover body through the threading hole, and the second voltage probe is further arranged on one side of the first voltage probe, the third voltage probe is arranged inside the cover body through the threading hole, and the third voltage probe is further arranged on a side of the second voltage probe away from the first voltage probe, and the current probe is arranged inside the cover body through the threading hole, and the current probe is further arranged on one side of the third voltage probe.

6. The power device testing device according to claim 5, characterized in that, the detection body comprises a measured module mounting seat and a heat sink, the heat sink is detachably connected with the base and is arranged above the base, the measured module mounting seat is detachably connected with the heat sink and is arranged above the heat sink, and the measured module mounting seat is arranged below the first voltage probe, the second voltage probe, the third voltage probe and the current probe.

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