Fixing device for scanning electron microscope detection

Abstract

The utility model discloses a fixing device for scanning electron microscope detection, which comprises a detection platform, and a fixing groove is arranged in the middle of the surface of the detection platform. Through structures such as the inner supporting block, when a container filled with a sample to be detected is fixed, the container is placed in the fixing groove, then the rotating block is manually rotated, the sliding block slides in the arc-shaped groove in the surface of the rotating block, and when the sliding block slides to the outermost end of the arc-shaped groove, the sliding block is located at the outermost end of the sliding groove at the moment; an inner supporting block is driven by a sliding block to slide outwards, a container containing a to-be-detected sample is fixed in an inner supporting mode through the inner supporting block, meanwhile, buffering between the inner supporting block and the inner wall of the lower end of the container is achieved through the buffering effect of a first telescopic rod structure and a first spring structure in a buffering groove, and the stability and safety during sample detection are improved; meanwhile, by means of the buffering structure, direct contact extrusion to the container is effectively reduced, and the service life of the container is prolonged.

Description

TECHNICAL FIELD

[0001] The utility model relates to electron microscope detection technical field especially relates to a kind of fixing device for scanning electron microscope detection. BACKGROUND

[0002] Electron microscope detection is a kind of technology using the high resolution ability of electron microscope to observe and analyze sample, mainly including transmission electron microscope (TEM) and scanning electron microscope (SEM), they can provide more meticulous nanometer level image than optical microscope, widely used in material science, biology, medicine and multiple fields, through fine sample preparation and possibly combined accessory such as energy dispersive spectrometer, not only can observe the microstructure of sample, but also can carry out element and chemical state analysis, is indispensable tool in modern scientific research and technical development.

[0003] In current scanning electron microscope detection technology, sample fixing device generally uses external clamping method to fix sample container.This clamping technology can realize the basic fixation of sample, but there is certain limitation in practical application.Specifically, when observing sample, external clamping device often causes a certain degree of obstruction to the field of view of scanning electron microscope, which affects the overall and detailed observation of sample, in addition, since clamping force acts on the outside of sample container, this clamping mode can cause mechanical damage to sample itself, especially when dealing with fragile or delicate structure sample, this problem is more prominent. SUMMARY

[0004] One purpose of the utility model is to provide a kind of fixing device for scanning electron microscope detection, the utility model is to solve the problem that when observing sample, external clamping device often causes a certain degree of obstruction to the field of view of scanning electron microscope, which affects the overall and detailed observation of sample, in addition, since clamping force acts on the outside of sample container, this clamping mode can cause mechanical damage to sample itself.

[0005] According to the fixing device for scanning electron microscope detection of the utility model embodiment, including detection platform, the surface middle part of the detection platform is provided with fixed slot, the inside surface of the fixed slot is provided with sliding slot, the inside of the sliding slot is slidably connected with sliding block, the sliding block is provided with four, the outside upper end of four sliding blocks is provided with buffer slot, the inside wall of the buffer slot is installed with first telescopic rod structure, the surface of the first telescopic rod structure is provided with first spring structure, the output end of the first telescopic rod structure is installed with inner support block, the lower end of the fixed slot is rotatably connected with rotating block, the surface of the rotating block is provided with arc slot, the arc slot is provided with four, the sliding block slides in the inside of arc slot;

[0006] The lower surface of the detection platform is fixedly connected with a second telescopic rod structure at one end, the output end of the second telescopic rod structure is provided with a connecting plate, the surface of the second telescopic rod structure is provided with a second spring structure, the upper surface of the connecting plate is fixedly connected with a positioning rod, and the surface of the rotating block is provided with a plurality of positioning holes.

[0007] Preferably, the surface of the detection platform is provided with mounting holes at four corner positions, and the detection platform is fixedly installed on the scanning electron microscope detection equipment through the mounting holes and mounting bolts.

[0008] Preferably, the outer surface of the rotating block is provided with a plurality of sawtooth grooves.

[0009] Preferably, the sliding groove is fixedly connected with a sliding rod inside, and the sliding block is slidingly connected to the surface of the sliding rod.

[0010] Preferably, the inner supporting block is made of antiskid rubber material.

[0011] Preferably, the upper surface of the connecting plate is fixedly connected with a handle.

[0012] Preferably, the lower end of the fixed groove is fixedly connected with a fixed block.

[0013] Preferably, the rotating block is rotatably connected to the inner lower end of the fixed block.

[0014] The utility model discloses the beneficial effects are:

[0015] The utility model discloses an inner supporting block and other structures are set up, when fixing the container with the sample to be detected, the container is placed in the inside of fixed groove, then manually rotates the rotating block, and the sliding block slides in the arc -shaped groove on the surface of rotating block, when the sliding block slides to the outermost end of arc -shaped groove, the sliding block is at the outermost end of sliding groove, and the inner supporting block is slid outward by the sliding block, the container with the sample to be detected is fixed by the inner supporting block, and the buffering effect of the first telescopic rod structure and the first spring structure in the buffer groove is realized, the buffering between the inner supporting block and the lower end inner wall of the container is realized, the stability and safety when detecting the sample are improved.

[0016] This invention, through its positioning rod and positioning hole structures, allows for rapid and precise internal support fixing of containers with different inner diameters. Before internal support fixing, the positioning rod is lifted by the handle, putting the second spring and second telescopic rod structures under tension. The rotating block is then rotated until it contacts the lower inner wall of the container, at which point rotation stops. Releasing the handle causes the positioning rod to move downwards due to the reset effect of the second spring and telescopic rod structures, inserting it into the corresponding positioning hole. This fixes the positions of the rotating block and the internal support block, enabling quick and precise internal support fixing of containers with different inner diameters, improving operational convenience and efficiency. Simultaneously, it ensures the stability of the fixed position, preventing container displacement during testing. Attached Figure Description

[0017] The accompanying drawings are provided to further illustrate the present invention and form part of the specification. They are used together with the embodiments of the present invention to explain the present invention, but do not constitute a limitation thereof. In the drawings:

[0018] Figure 1 This is an isometric view of a fixing device for scanning electron microscopy inspection proposed in this utility model;

[0019] Figure 2 This invention provides a fixture for scanning electron microscopy (SEM) inspection. Figure 1 Enlarged view of point A in the middle;

[0020] Figure 3 This is a three-dimensional schematic diagram of the bottom surface of a fixing device for scanning electron microscopy detection proposed in this utility model;

[0021] Figure 4 This invention provides a fixture for scanning electron microscopy (SEM) inspection. Figure 3 Enlarged view of point B in the middle;

[0022] In the diagram: 1. Testing platform; 2. Mounting hole; 3. Fixing groove; 4. Sliding groove; 5. Sliding rod; 6. Sliding block; 7. Buffer groove; 8. First telescopic rod structure; 9. First spring structure; 10. Inner support block; 11. Fixing block; 12. Rotating block; 13. Serrated groove; 14. Arc groove; 15. Second telescopic rod structure; 16. Second spring structure; 17. Connecting plate; 18. Handle; 19. Positioning rod; 20. Positioning hole. Detailed Implementation

[0023] The present invention will now be described in further detail with reference to the accompanying drawings. These drawings are simplified schematic diagrams, illustrating only the basic structure of the present invention, and therefore only show the components relevant to the present invention.

[0024] refer to Figures 1-4The utility model provides a fixing device for scanning electron microscope detection, including detection platform 1, the middle part of the surface of detection platform 1 is provided with fixed slot 3, the inside surface of fixed slot 3 is provided with sliding slot 4, sliding slot 4 is slidably connected with sliding block 6, sliding block 6 is provided with four, the outside upper end of four sliding blocks 6 is provided with buffer slot 7, the inside wall of buffer slot 7 is installed with first telescopic rod structure 8, the surface of first telescopic rod structure 8 is provided with first spring structure 9, the output of first telescopic rod structure 8 is installed with inner support block 10, and the purpose that the container for containing the sample to be detected is fixed by inner support is realized by the outward sliding of four inner support blocks 10, the lower end of fixed slot 3 is rotatably connected with rotating block 12, the surface of rotating block 12 is provided with arc slot 14, arc slot 14 is provided with four, sliding block 6 slides in the inside of arc slot 14, by the rotation of rotating block 12, sliding block 6 slides in the inside of arc slot 14, when sliding block 6 slides to the innermost end of arc slot 14, sliding block 6 is also at the innermost end of sliding slot 4 at this time, when sliding block 6 is at the outermost end of arc slot 14, sliding block 6 is also at the outermost end of sliding slot 4 at this time, to realize the purpose that the sliding of inner support block 10 is controlled outward or inward.

[0025] Example 1: the lower surface one end of detection platform 1 is fixedly connected with second telescopic rod structure 15, the output of second telescopic rod structure 15 is installed with connecting plate 17, the surface of second telescopic rod structure 15 is provided with second spring structure 16, the upper surface of connecting plate 17 is fixedly connected with positioning rod 19, the surface of rotating block 12 is provided with a plurality of positioning holes 20, by positioning rod 19 being clamped in the inside of positioning hole 20, the positioning of the rotation angle of rotating block 12 is realized, and the fixing of the position of upper end inner support block 10 is also realized.

[0026] Example 2: the surface four corners of detection platform 1 are provided with mounting hole 2, detection platform 1 is fixedly installed on scanning electron microscope detection equipment through mounting hole 2 and mounting bolt, the outside surface of rotating block 12 is provided with a plurality of sawtooth grooves 13, sawtooth groove 13 increases the friction between the hand of operator and rotating block 12, more conveniently rotating block 12 is rotated, the inside of sliding slot 4 is fixedly connected with sliding rod 5, sliding block 6 is slidably connected on the surface of sliding rod 5, inner support block 10 is of antiskid rubber material, the friction between inner support block 10 and container is increased by the antiskid rubber material of inner support block 10, further increase the stability of container when being fixed by inner support, the upper surface of connecting plate 17 is fixedly connected with handle 18, the lower end of fixed block 11 is rotatably connected in the inside of rotating block 12.

[0027] The process of using the fixing device for scanning electron microscope detection is as follows: first, the container containing the sample to be detected is placed in the fixing groove 3 of the detection platform 1, and the container is stably placed. Then, the operator pulls down the positioning rod 19 through the handle 18, so that the second spring structure 16 and the second telescopic rod structure 15 are in a stretched state, then manually rotates the rotating block 12, so that the sliding block 6 slides in the arc-shaped groove 14 on the surface of the rotating block 12, and at the same time drives the inner support block 10 to slide outward until the inner support block 10 contacts the lower end inner wall of the container. At this time, stop rotating the rotating block 12, and loosen the handle 18, use the reset effect of the second spring structure 16 and the second telescopic rod structure 15 to make the positioning rod 19 automatically move downward and insert into the corresponding positioning hole 20 on the surface of the rotating block 12, so as to fix the position of the rotating block 12 and the inner support block 10, complete the inner support type fixing of the container, at the same time, the first telescopic rod structure 8 and the first spring structure 9 in the buffer groove 7 provide buffering effect, which ensures the stability and safety of the sample detection, and also protects the service life of the container.

[0028] The above is only a preferred specific embodiment of the present application, but the protection scope of the present application is not limited thereto, any person skilled in the art can make equivalent replacement or change according to the technical scheme and the inventive concept of the present application within the technical range disclosed by the present application, which should be covered in the protection scope of the present application.

Claims

1. A fixing device for scanning electron microscope detection, characterized in that, The application relates to a detection platform (1), wherein a fixed groove (3) is formed in the middle part of the surface of the detection platform (1), an inner surface of the fixed groove (3) is provided with a sliding groove (4), the sliding groove (4) is slidably connected with a sliding block (6), the sliding block (6) is provided with four, a buffer groove (7) is formed in the outer side upper end of each of the four sliding blocks (6), a first telescopic rod structure (8) is arranged on the inner side wall of the buffer groove (7), a first spring structure (9) is arranged on the surface of the first telescopic rod structure (8), an inner supporting block (10) is arranged on the output end of the first telescopic rod structure (8), a rotating block (12) is rotatably connected to the lower end of the fixed groove (3), an arc-shaped groove (14) is formed in the surface of the rotating block (12), the arc-shaped groove (14) is provided with four, and the sliding block (6) slides in the arc-shaped groove (14). A second telescopic rod structure (15) is fixedly connected to the lower surface of the detection platform (1), a connecting plate (17) is arranged on the output end of the second telescopic rod structure (15), a second spring structure (16) is arranged on the surface of the second telescopic rod structure (15), a positioning rod (19) is fixedly connected to the upper surface of the connecting plate (17), and a plurality of positioning holes (20) are formed in the surface of the rotating block (12).

2. The fixing device for scanning electron microscope detection according to claim 1, characterized in that, Mounting holes (2) are formed in the surface of the detection platform (1) at four corner positions, and the detection platform (1) is fixedly mounted on a scanning electron microscope detection device through the mounting holes (2) and mounting bolts.

3. The fixing device for scanning electron microscope detection according to claim 1, characterized in that, A plurality of sawtooth grooves (13) are formed in the outer surface of the rotating block (12).

4. The fixing device for scanning electron microscope detection according to claim 1, wherein, A sliding rod (5) is fixedly connected to the inner side of the sliding groove (4), and the sliding block (6) is slidably connected to the surface of the sliding rod (5).

5. The fixing device for scanning electron microscope detection according to claim 1, characterized in that, The inner supporting block (10) is made of antiskid rubber.

6. The fixing device for scanning electron microscope detection according to claim 1, wherein, A handle (18) is fixedly connected to the upper surface of the connecting plate (17).

7. The fixing device for scanning electron microscope detection according to claim 1, wherein, A fixed block (11) is fixedly connected to the lower end of the fixed groove (3).

8. The fixing device for scanning electron microscope detection according to claim 1, characterized in that, The rotating block (12) is rotatably connected to the inner lower end of the fixed block (11). The application also discloses a scanning electron microscope detection device.

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