Silicon carbide crystal growth device for improving spiral dislocation defect
By setting graphite partitions in the silicon carbide crystal growth apparatus to form an arithmetic sequence, the step flow growth mode is ensured, the problem of spiral dislocation multiplication in silicon carbide crystals is solved, and the crystal quality is improved.
Patent Information
- Application Number
- CN202423323135.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2025-12-12
- Estimated Expiration
- 2034-12-31
AI Technical Summary
During the growth of silicon carbide crystals, factors such as the inheritance of seed crystal spiral dislocations, inclusions that appear during growth, and thermal stress in the temperature field can lead to the proliferation of spiral dislocations in silicon carbide crystals, affecting device performance and reliability.
A silicon carbide crystal growth apparatus for improving spiral dislocation defects is adopted. The apparatus includes a crucible body and multiple graphite partitions inside. The graphite partitions are evenly spaced at the bottom of the crucible, and their height gradually decreases from the seed crystal facet region to the region away from the facet region, forming an arithmetic sequence. The height of the silicon carbide powder also gradually decreases, constructing raw material partitions of different heights to ensure that the step flow growth mode is the main growth mode.
The stable step-flow growth mode promotes the transformation and movement of spiral dislocations, reduces the spiral dislocation density in the crystal, and improves the crystal quality.