Switch pre-tightening device and test system

Abstract

The embodiment of the utility model discloses a switch pre-tightening device and a test system, the switch pre-tightening device comprises a mechanism support, a switch transmission mechanism and a pre-tightening transmission mechanism, the switch transmission mechanism comprises a knob and a clamp, the clamp is connected with the knob, and the clamp is used for driving a buckle of an IC test seat; by rotating the knob, the clamp drives the buckle, so that the flip cover is opened and closed; the pre-tightening transmission mechanism comprises a transmission shaft, a belt transmission assembly, a transmission cover and an operating rod, the transmission cover is connected with the transmission shaft through the belt transmission assembly, and the operating rod is connected with the transmission shaft; the transmission cover and the transmission shaft can move up and down synchronously or rotate synchronously so as to pre-tighten the IC test seat. Through the above mode, the power supply module can be directly replaced in a high and low temperature environment without waiting for the temperature change of the equipment, so that the test time is obviously shortened; frequent temperature change is avoided, energy consumption is reduced, and meanwhile the failure rate in the replacement process of the power module can be reduced; manual intervention is reduced, and the labor cost is reduced.

Description

TECHNICAL FIELD

[0001] The utility model embodiment relates to integrated circuit test equipment field, in particular to a switch pre tightening device and test system. BACKGROUND

[0002] High and low temperature test is an important part of the comprehensive performance of a module, and is one of the methods for evaluating the comprehensive performance of the POL. In the high and low temperature test of the power module, the manual replacement of the module usually needs the following steps: temperature reduction / temperature rise: waiting for the temperature of the equipment to reduce to room temperature or rise to room temperature; test stop: taking the module out of the high and low temperature box; replacement: installing a new power module; temperature rise / temperature reduction: waiting for the temperature of the equipment to rise to room temperature or reduce to room temperature, and retesting.

[0003] However, the existing scheme has the following defects: high time cost: since the replacement of the power module in the process needs to be performed at room temperature, and a large amount of time is consumed for waiting for the temperature of the equipment to change to room temperature, the test efficiency is reduced; high energy consumption: frequent temperature changes cause additional power consumption, and the frequent replacement of the power module may also cause poor contact or failure; high labor cost: manual operation is required, which increases the labor cost. INVENTION CONTENTS

[0004] The technical problem solved by the embodiments of the utility model is to provide a switch pre tightening device and test system, which can solve the defects in the high and low temperature test of the existing power module.

[0005] To solve the above technical problems, one technical scheme of the utility model is to provide a switch pre tightening device applied to an IC test seat including a flip cover and a base, wherein the flip cover is provided with a buckle, and the switch pre tightening device comprises a mechanism support, a switch transmission mechanism and a pre tightening transmission mechanism, wherein the switch transmission mechanism comprises a knob and a clamp, the clamp is connected with the knob, and the clamp is used to drive the buckle of the IC test seat; the clamp drives the buckle by rotating the knob, so that the flip cover is opened or closed; the pre tightening transmission mechanism comprises a transmission shaft, a belt transmission assembly, a transmission cover and a control rod, the transmission cover is connected with the transmission shaft through the belt transmission assembly, and the control rod is connected with the transmission shaft; the transmission cover can move up and down synchronously with the transmission shaft or rotate synchronously with the transmission shaft, so as to pre tighten the IC test seat.

[0006] In some embodiments, the flip cover is provided with a flip cover knob, the transmission cover comprises a transmission cover body and a transmission end arranged at the bottom of the transmission cover body, and the transmission end has a cross-shaped groove matched with the flip cover knob.

[0007] In some embodiments, the belt transmission assembly comprises a transmission belt and at least two pulleys, the transmission belt connecting the transmission shaft and the transmission cover through the pulleys to realize synchronous movement.

[0008] In some embodiments, the mechanism support is separated by a heat shield, the heat shield separating the switch transmission mechanism and the pre-tightening transmission mechanism into a test end located in a first working environment and a control end located in a second working environment.

[0009] In some embodiments, the knob and the operating rod are arranged at the control end, and the clamp and the transmission cover are arranged at the test end.

[0010] In some embodiments, the clamp comprises a connecting rod and a gripping part, one end of the connecting rod is connected with the knob, and the other end is provided with the gripping part, and the gripping part is used for gripping the buckle.

[0011] In some embodiments, the transmission shaft is installed on the mechanism support through a bearing seat, the bearing seat has a guide groove, the transmission shaft is arranged in the guide groove, and the guide groove guides the transmission shaft to move up and down.

[0012] In some embodiments, the operating rod comprises a handle and a connecting rod, one end of the connecting rod is connected with the handle, and the other end is fixedly connected with the transmission shaft.

[0013] In some embodiments, the mechanism support comprises a fixed base and a support frame, and the support frame is used for installing the switch transmission mechanism and the pre-tightening transmission mechanism.

[0014] The utility model adopts a technical scheme: provide a kind of test system, comprising: IC test seat;And the switch pre-tightening device as described above.

[0015] The utility model embodiment has the beneficial effects that, unlike prior art, the utility model embodiment does not need to wait for equipment temperature change, can directly replace power module in high-low temperature environment, significantly shortens test time;Avoid frequent temperature change, reduce energy consumption, also can reduce failure rate in power module replacement process;And reduce manual intervention, reduce labor cost. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 It is a schematic diagram of the switch pre-tightening device provided by the utility model embodiment;

[0017] Figure 2 It is an exploded view of the switch pre-tightening device provided by the utility model embodiment;

[0018] Figure 3This is a schematic diagram of the structure of a switch pre-tightening device provided in an embodiment of this utility model;

[0019] Figure 4 yes Figure 3 Enlarged view of local structure A;

[0020] Figure 5 This is a schematic diagram of the structure of a transmission cover provided in an embodiment of this utility model;

[0021] Figure 6 This is a schematic diagram of another switch pre-tightening device provided in an embodiment of the present invention;

[0022] Figure 7 yes Figure 5 Enlarged view of local structure B. Detailed Implementation

[0023] To facilitate understanding of this utility model, a more detailed description is provided below with reference to the accompanying drawings and specific embodiments. It should be noted that when an element is described as being "fixed to" another element, it can be directly on the other element, or one or more intermediate elements may exist between them. When an element is described as being "connected" to another element, it can be directly connected to the other element, or one or more intermediate elements may exist between them. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this specification are for illustrative purposes only.

[0024] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the invention. The term "and / or" as used in this specification includes any and all combinations of one or more of the associated listed items.

[0025] Implementation Method 1:

[0026] This embodiment relates to a switch preload device for a flip-type IC test socket. For example... Figures 1-5 As shown, the basic components of the device include a mechanism support 110, a switch transmission mechanism, and a pre-tension transmission mechanism. The mechanism support 110 consists of a fixed base 111 and a support frame 112, providing stable support for the entire device. Both the switch transmission mechanism and the pre-tension transmission mechanism are mounted on the support frame 112.

[0027] The switch transmission mechanism is composed of a knob 121 arranged at the normal temperature control end and a clamp 122 arranged at the high-low temperature test end. The clamp 122 is connected with the knob 121 through a connecting rod 1221, and the other end of the connecting rod 1221 is provided with a gripping part 1222. When the knob 121 is rotated, the connecting rod 1221 drives the gripping part 1222 to move, the gripping part 1222 grabs the buckle of the IC test seat and drives it to move, so as to realize the opening and closing operation of the flip cover.

[0028] The structure and working mode of the pre-tightening transmission mechanism are as follows: the mechanism is composed of a transmission shaft 132, a belt transmission assembly 133, a transmission cover 134 and a control lever 131. The transmission cover 134 is specially designed in that the bottom thereof is provided with a cross-shaped groove matched with the flip cover knob. The belt transmission assembly 133 comprises a transmission belt and two belt pulleys 1331, 1332, and the movement of the transmission shaft 132 is accurately transmitted to the transmission cover 134 through this transmission mode. The control lever 131 is composed of a handle 1311 and a connecting rod 1312, and the connecting rod 1312 is fixedly connected with the transmission shaft 132.

[0029] In order to realize the isolation of the high-low temperature environment and the normal temperature environment, the heat shield Y divides the whole mechanism into two areas: the test end in the high-low temperature environment and the control end in the normal temperature environment. The control end comprises the operating parts of the knob 121 and the control lever 131, and the test end comprises the executing parts of the clamp 122 and the transmission cover 134. The heat shield is made of high-temperature-resistant heat insulation material, and the main body part is provided with through holes for accommodating the clamp 122 and the transmission shaft 132.

[0030] The operation process of this embodiment is as follows: the operator controls the transmission shaft 132 and the transmission cover 134 to rotate through the control lever 131 in the normal temperature environment, the transmission cover 134 drives the top cover knob of the IC test seat to rotate synchronously, realizing the pre-tightening function of the IC test seat; the rotation of the knob 121 drives the clamp 122 to move, realizing the opening and closing control of the buckle of the IC test seat. This design enables the operator to not directly contact the high-low temperature environment, while ensuring the smooth progress of the test process.

[0031] Through this structural design, the device successfully solves the problem of frequent temperature conversion in traditional IC testing, significantly improves the test efficiency, and reduces the energy consumption and labor cost. In addition, this design also effectively reduces the failure rate of the power module during replacement, ensuring the stability and reliability of the test process.

[0032] Embodiment two:

[0033] This embodiment relates to a switch pre-tightening device for a flip cover type IC test seat. Figure 1 、 2The basic structure of the device includes a mechanism support 110, a switch transmission mechanism, and a pre-tightening transmission mechanism, as shown in FIGS. 6 and 7. The mechanism support 110 is composed of a fixed base and a support frame, which provides stable mechanical support for the entire device. The switch transmission mechanism and the pre-tightening transmission mechanism are both installed on the support frame.

[0034] The specific structure of the switch transmission mechanism is as follows: the mechanism mainly includes a knob 121 arranged at the normal temperature control end and a clamp 122 arranged at the high-low temperature test end. The clamp 122 includes a connecting rod and a gripping part, one end of the connecting rod is connected with the knob 121, and the other end is provided with the gripping part. When the knob 121 is rotated, the connecting rod drives the gripping part to grasp and release the buckle of the IC test seat, thereby realizing the switch control of the rotary top cover.

[0035] The pre-tightening transmission mechanism adopts a special structural design: the mechanism is composed of a transmission shaft 132, a belt transmission assembly 133, a transmission cover 134, and a control lever 131. The transmission shaft 132 is installed on the mechanism support 110 through a bearing seat, the bearing seat has a specially designed guide groove, the transmission shaft 132 is arranged in the guide groove, and the guide groove is used to guide the up-down movement of the transmission shaft 132. The belt transmission assembly 133 includes a transmission belt and a belt pulley, which transmits the movement of the transmission shaft 132 to the transmission cover 134. The control lever 131 is composed of a handle and a connecting rod, and the connecting rod is fixedly connected with the transmission shaft 132.

[0036] In order to effectively isolate the high-low temperature environment from the normal temperature environment, the heat shield Y divides the entire mechanism into two working areas: the test end located in the high-low temperature environment and the control end located in the normal temperature environment. The control end includes the operating components knob 121 and control lever 131, and the test end includes the executing components clamp 122 and transmission cover 134. The heat shield is made of high-temperature-resistant heat insulation material, and the main part is provided with a through hole for accommodating the clamp 122 and the transmission shaft 132.

[0037] The working process of this embodiment is as follows: the operator controls the up-down movement of the transmission shaft 132 and the transmission cover 134 by pulling the control lever 131 in the normal temperature environment, the transmission cover 134 drives the top cover knob of the IC test seat to move up and down, realizing the pre-tightening operation of the test seat; at the same time, the rotation of the knob 121 drives the clamp 122 to move, realizing the switch control of the IC test seat buckle. During the entire process, the transmission shaft 132 stably moves up and down under the guidance of the guide groove of the bearing seat.

[0038] The main feature of this embodiment is the use of a guide groove structure to guide the movement of the transmission shaft, while achieving the synchronous movement function of the transmission cover through belt transmission. This design not only ensures the stability of the device operation, but also improves the accuracy of the pre-tightening operation. This scheme also achieves the operation of the IC test seat without contacting the high and low temperature environment, effectively solving the temperature conversion and manual intervention problems in the traditional test method.

[0039] Based on the switch pre-tightening device provided in the above two embodiments, the embodiment of the present application provides a test system, which comprises an IC test seat and a switch pre-tightening device as in any of the above embodiments.

[0040] It should be noted that the specification and drawings of the present application provide a preferred embodiment of the present application, but the present application can be implemented in many different forms, and is not limited to the embodiments described in the specification. These embodiments are not additional limitations on the content of the present application, and the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive. Furthermore, the above technical features continue to be combined with each other to form various embodiments not listed above, which are considered to be within the scope of the present application. Furthermore, for those skilled in the art, the above description can be improved or changed, and all these improvements and changes should be within the scope of the claims of the present application.

Claims

1. A switch pre-tensioning device applied to an IC test socket comprising a flip cover and a base, the flip cover is provided with a buckle, characterized in that, The application relates to a switch pre-tightening device. The switch pre-tightening device comprises a mechanism support, a switch transmission mechanism and a pre-tightening transmission mechanism, wherein: The switch transmission mechanism comprises a knob and a clamp, the clamp is connected with the knob, and the clamp is used to drive a buckle of the IC test seat; the buckle is driven by the clamp through rotation of the knob, so that the flip cover is opened and closed; The pre-tightening transmission mechanism comprises a transmission shaft, a belt transmission assembly, a transmission cover and a control lever, the transmission cover is connected with the transmission shaft through the belt transmission assembly, and the control lever is connected with the transmission shaft; the transmission cover can move up and down synchronously with the transmission shaft or rotate synchronously with the transmission shaft, so as to pre-tighten the IC test seat.

2. The apparatus of claim 1, wherein, The flip cover is provided with a flip knob, the transmission cover comprises a transmission cover body and a transmission end arranged at the bottom of the transmission cover body, and the transmission end is provided with a cross-shaped groove matched with the flip knob.

3. The apparatus of claim 1, wherein, The belt transmission assembly comprises a transmission belt and at least two belt pulleys, the transmission belt connects the transmission shaft with the transmission cover through the belt pulleys, so as to realize synchronous movement.

4. The apparatus of claim 1, wherein, The mechanism support is provided with a heat shield, the heat shield divides the switch transmission mechanism and the pre-tightening transmission mechanism into a test end located in a first working environment and a control end located in a second working environment.

5. The apparatus of claim 4, wherein, The knob and the control lever are arranged in the control end, and the clamp and the transmission cover are arranged in the test end.

6. The apparatus of claim 1, wherein, The clamp comprises a connecting rod and a gripping part, one end of the connecting rod is connected with the knob, the other end is provided with the gripping part, and the gripping part is used to grip the buckle.

7. The apparatus of claim 1, wherein, The transmission shaft is installed on the mechanism support through a bearing seat, the bearing seat is provided with a guide groove, the transmission shaft is arranged in the guide groove, and the guide groove guides the transmission shaft to move up and down.

8. The apparatus of claim 1, wherein, The control lever comprises a handle and a connecting rod, one end of the connecting rod is connected with the handle, and the other end is fixedly connected with the transmission shaft.

9. The apparatus of claim 1, wherein, The mechanism support comprises a fixed base and a support frame, and the support frame is used to install the switch transmission mechanism and the pre-tightening transmission mechanism.

10. A test system, characterized by The application relates to an IC test seat and a switch pre-tightening device. The application relates to an IC test seat and a switch pre-tightening device. ​

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