Multi-channel program-controlled fast-charging aging test circuit and electronic equipment

Abstract

The utility model relates to the technical field of charging aging, in particular to a multi-channel program-controlled fast charging aging test circuit and electronic equipment. Comprising a main control module, a fast charging module, a parameter acquisition module, a power supply module and a communication module, the first end of the power supply module is connected with the first end of the fast charging module; the first end of the main control module is connected with the second end of the fast charging module, and the third end of the fast charging module is connected with an external output interface; the output interface is connected with the first end of the parameter acquisition module, and the second end of the parameter acquisition module is connected with the fourth end of the fast charging module; the second end of the master control module is connected with the first end of the communication module, and the second end of the communication module is connected with an external upper computer. According to the invention, the flexibility, the data acquisition capability and the economic benefit of the fast charge aging method can be improved, and a more intelligent aging test solution is provided.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of charging aging, and in particular to a multi-channel program-controlled fast-charging aging test circuit and electronic equipment. BACKGROUND

[0002] In the aging test process of fast-charging mobile power supplies, it is usually necessary to perform fast charge-discharge cycles on the products to evaluate their performance and stability. However, in current fast-charging aging equipment, most still use adapters directly for aging processing. Although this method can achieve the function of fast charging, there are several major problems:

[0003] 1. Lack of flexibility: In fast-charging aging tests using adapters, the voltage is usually preset and fixed, which means that the charging power or voltage cannot be adjusted according to specific needs. This fixedness limits the comprehensive examination of product performance under different conditions.

[0004] 2. Insufficient data collection and analysis: The existing aging scheme is difficult to effectively collect and record key parameters (such as current, temperature, etc.) during the entire aging process, making it impossible to deeply analyze the aging state and potential problems of the product. In addition, the lack of systematic data storage mechanism also makes the analysis of the results difficult.

[0005] 3. Low cost-effectiveness: Different models of products often require corresponding dedicated adapters for testing, which not only increases the cost of equipment purchase, but also increases the complexity of daily maintenance and management. Obviously, each time the adapter is replaced, additional time and economic burden is incurred.

[0006] In summary, the existing traditional fast-charging aging method based on adapters, although simple and easy to implement, has obvious shortcomings in flexibility, data collection capability, and economic efficiency. Therefore, it is particularly important to develop a more intelligent aging test solution. CONTENT OF THE INVENTION

[0007] In order to overcome the shortcomings of the prior art, the present application provides a multi-channel program-controlled fast-charging aging test circuit and electronic equipment to improve the flexibility, data collection capability, and economic efficiency of the fast-charging aging method, and to provide a more intelligent aging test solution.

[0008] The technical solution adopted by the present application to solve its technical problems is:

[0009] In a first aspect, the present application provides a multi-channel program-controlled fast-charging aging test circuit, which includes a main control module, a fast-charging module, a parameter acquisition module, a power supply module, and a communication module.

[0010] The first end of the power supply module is connected to the first end of the fast charging module, for providing a fixed voltage signal to the fast charging module;

[0011] The first end of the master control module is connected to the second end of the fast charging module, and the third end of the fast charging module is connected to an external output interface, for converting the fixed voltage signal into a fast charging demand voltage according to the control signal sent by the master control module and then outputting the fast charging demand voltage to the output interface;

[0012] The output interface is connected to the first end of the parameter acquisition module, and the second end of the parameter acquisition module is connected to the fourth end of the fast charging module, for acquiring voltage and current parameters at the output interface and outputting the voltage and current parameters to the fast charging module for detection, and then returning the detection result to the master control module;

[0013] The second end of the master control module is connected to the first end of the communication module, and the second end of the communication module is connected to an external host computer, for transmitting the detection result as a communication signal to the host computer through the communication module.

[0014] Optionally, the circuit further comprises an address selection module;

[0015] The first end of the address selection module is connected to the second end of the power supply module, and the second end of the address selection module is connected to the third end of the master control module, for providing multiple communication addresses to expand the master control module with a multi-channel circuit and test multiple potential points.

[0016] Optionally, the address selection module comprises a code dial switch and multiple pull-up resistors;

[0017] The code dial switch comprises six address selection pins;

[0018] Each address selection pin is connected in series with at least one pull-up resistor, and the connection of all the pull-up resistors is connected to the third end of the master control module and an external direct current signal source.

[0019] Optionally, the master control module comprises a single-chip microcomputer;

[0020] The first end of the single-chip microcomputer is connected to the second end of the fast charging module;

[0021] The second end of the single-chip microcomputer is connected to the third end of the power supply module, and the third end of the single-chip microcomputer is grounded;

[0022] The fourth end of the single-chip microcomputer is connected to the second end of the address selection module;

[0023] The fifth end of the single-chip microcomputer is connected to the first end of the communication module.

[0024] Optionally, the fast charging module comprises a fast charging control chip, an input signal processing unit, and an output filter processing unit.

[0025] The first end of the fast charging control chip is connected to the output end of the input signal processing unit, and the input end of the input signal processing unit is connected to the first end of the power supply module, for signal processing of the fixed voltage signal and input of the processed fixed voltage signal to the fast charging control chip.

[0026] The second end of the fast charging control chip is connected to the second end of the parameter acquisition module, for the acquisition result of the voltage and current parameters of the output interface by the parameter acquisition module.

[0027] The third end of the fast charging control chip is connected to the input end of the output filter processing unit, and the output end of the output filter processing unit is connected to the output interface.

[0028] The fourth end of the fast charging control chip is connected to the first end of the single-chip microcomputer.

[0029] Optionally, the parameter acquisition module comprises a sampling resistor and a filter capacitor.

[0030] The sampling resistor is connected in series between the fast charging control chip and the output interface, and the two ends of the sampling resistor are respectively connected to the second end of the fast charging control chip.

[0031] The filter capacitor is connected in parallel to the two ends of the sampling resistor.

[0032] Optionally, the communication module comprises a 485 transceiver, a first optocoupler, a first triode, a second optocoupler, and a second triode.

[0033] The base of the first triode is connected to the fifth end of the single-chip microcomputer, the collector of the first triode is connected to the first end of the first optocoupler, and the second end of the first optocoupler is connected to an external direct current signal source.

[0034] The third end of the first optocoupler is connected to the base of the second triode, and the collector of the second triode is connected to the first end of the 485 transceiver; the second end of the 485 transceiver is connected to the host computer.

[0035] The third end of the 485 transceiver is connected to the first end of the second optocoupler, the second end of the second optocoupler is connected to an external direct current signal source, and the third end of the second optocoupler is connected to the fifth end of the single-chip microcomputer.

[0036] In a second aspect, the present application provides an electronic device loaded with the above-mentioned multi-channel program-controlled fast charging aging test circuit.

[0037] To sum up, the multi-channel program-controlled fast charging aging test circuit provided by the application is designed by combining a single-chip microcomputer control circuit with a fast charging module, and specifically, the application has at least one beneficial effect as follows:

[0038] 1. The charging voltage and power of the fast charging module can be adjusted by the master module, so that the aging test is more comprehensive, and different products do not need to be frequently replaced with adapters, thereby reducing the aging cost and improving the economic benefit.

[0039] 2. Not only the function of collecting voltage and current parameters is designed, but also the collected parameters can be returned to the master module, and then the communication module and the host computer can be communicated, the host computer can record and save data reports for easy analysis and review of data reports, so that relevant personnel can analyze the aging results. BRIEF DESCRIPTION OF DRAWINGS

[0040] Figure 1 is a module connection diagram of the multi-channel program-controlled fast charging aging test circuit provided by the embodiment of the application;

[0041] Figure 2 is a circuit principle diagram of an address selection module of the multi-channel program-controlled fast charging aging test circuit provided by the embodiment of the application;

[0042] Figure 3 is a circuit principle diagram of a master module of the multi-channel program-controlled fast charging aging test circuit provided by the embodiment of the application;

[0043] Figure 4 is a circuit principle diagram of a fast charging module of the multi-channel program-controlled fast charging aging test circuit provided by the embodiment of the application;

[0044] Figure 5 is a circuit principle diagram of a parameter collection module of the multi-channel program-controlled fast charging aging test circuit provided by the embodiment of the application;

[0045] Figure 6 is a circuit principle diagram of an output interface of the multi-channel program-controlled fast charging aging test circuit provided by the embodiment of the application;

[0046] Figure 7 is a circuit principle diagram of a communication module of the multi-channel program-controlled fast charging aging test circuit provided by the embodiment of the application. DETAILED DESCRIPTION

[0047] The application will be further described below in combination with the drawings and embodiments.

[0048] The concept, specific structure and generated technical effects of the present application will be described clearly and completely in combination with the embodiments and drawings, so as to fully understand the purpose, features and effects of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all the embodiments, and other embodiments obtained by those skilled in the art based on the embodiments of the present application without creative labor are within the scope of protection of the present application. In addition, all the coupling / connection relationships involved in the patent do not mean that the components are directly connected, but that a better coupling structure can be composed by adding or reducing coupling accessories according to the specific implementation. The technical features in the creation of the present application can be combined interactively without conflict.

[0049] Reference Figure 1 , Figure 1 is a module connection diagram of a multi-channel program-controlled fast charging aging test circuit provided by the embodiments of the present application, comprising a master control module, a fast charging module, a parameter acquisition module, a power supply module and a communication module, and each module will be described in detail as follows:

[0050] The first end of the power supply module is connected to the first end of the fast charging module, for providing a fixed voltage signal to the fast charging module.

[0051] Regarding the power supply module: the power supply module in the embodiments of the present application comprises a power supply unit and a DC-DC 5V voltage reduction unit, the power supply unit is used to provide a fixed 24V voltage signal to the fast charging circuit, the fixed voltage signal can also be converted into a 5V voltage signal through the DC-DC 5V voltage reduction unit, and the 5V voltage signal can be used to power the master control module, the address selection module and the communication module.

[0052] Further, the first end of the master control module is connected to the second end of the fast charging module, and the third end of the fast charging module is connected to an external output interface, for converting the fixed voltage signal into a fast charging demand voltage according to the control signal sent by the master control module and then outputting the fast charging demand voltage to the output interface.

[0053] Regarding the master control module and the fast charging module: the master control module comprises a single-chip microcomputer, which has the ability to control the charging voltage and power of the fast charging module, and the fast charging module comprises a fast charging chip, which receives the 24V fixed voltage signal provided by the power supply module, converts the fixed voltage signal into a fast charging demand voltage determined according to the control signal sent by the single-chip microcomputer, and then outputs the fast charging demand voltage to the output interface for aging test.

[0054] Further, the output interface is connected to the first end of the parameter acquisition module, the second end of the parameter acquisition module is connected to the fourth end of the fast charging module, for collecting the voltage and current parameters at the output interface, and outputting the voltage and current parameters to the fast charging module for detection, and returning the detection results to the main control module.

[0055] Regarding the parameter acquisition module: the parameter acquisition module collects the voltage and current parameters output by the fast charging module to the output interface, returns the collection results to the fast charging module for detection, and communicates with the main control module to return the detection data to the main control module.

[0056] Further, the second end of the main control module is connected to the first end of the communication module, and the second end of the communication module is connected to an external host computer, for transmitting the detection results as communication signals to the host computer through the communication module.

[0057] Regarding the communication module: the communication module includes a 485 transceiver, when sending data to the host computer, the original TTL signal is converted into a 485 differential signal output through the 485 transceiver, when receiving data sent by the host computer, the host computer converts the signal into a 485 differential signal through the corresponding PC end, and then returns it to the main control module after conversion into a TTL signal through the 485 transceiver, so as to realize communication between the main control module and the host computer.

[0058] Further, the circuit further comprises an address selection module;

[0059] The first end of the address selection module is connected to the second end of the power supply module, and the second end of the address selection module is connected to the third end of the main control module, for providing multiple communication addresses to expand multiple channel circuits to the main control module, so as to test multiple potential points.

[0060] Regarding the address selection module: refer to Figure 2 , Figure 2 It is the circuit principle diagram of the address selection module of the multi-channel program-controlled fast charging aging test circuit provided by the embodiment of the application. The address selection module comprises a code switch and a plurality of pull-up resistors (illustrated as R30 / R31 / R35 / R36 / R37 / R38). Wherein, the code switch adopted by the application is of SW DIP-6 type.

[0061] The code switch comprises six address selection pins;

[0062] Each of the address selection pins is connected in series with at least one of the pull-up resistors, and the connection of all the pull-up resistors is connected to the third end of the main control module and an external DC signal source (a positive electrode VCC of the power supply provided by the power supply module).

[0063] Specifically, the circuit address is set by a dial switch, different addresses can be set for module expansion, multiple circuit addresses communicate without interference, and the master control module can read the circuit address through the above connection mode to complete address selection.

[0064] Further, referring to Figure 3 , Figure 3 is a circuit schematic diagram of a master control module of a multi-channel program-controlled fast charging aging test circuit provided by the embodiment of the application, as shown in Figure 3 , the master control module comprises a single-chip microcomputer U7;

[0065] The first end of the single-chip microcomputer (the 2-3 pin and the 19-20 pin of the U7) is connected to the second end of the fast charging module; wherein each pin in the first end is connected to the positive electrode VCC of the power supply through a pull-up resistor, and the pull-up resistor comprises R46, R49, R42 and R44. That is, the fast charging circuit is read and set through the IIC (Inter-Integrated Circuit, Inter-Integrated Circuit) communication mode, so as to obtain the fast charging voltage and current data and set the fast charging voltage power.

[0066] The second end of the single-chip microcomputer (the 5 / 6 / 8 pin of the U7 is connected to the positive electrode VCC of the power supply) is connected to the third end of the power supply module, and the third end of the single-chip microcomputer (the 4 / 7 / 10 pin of the U7 is connected to the negative electrode GND of the power supply) is grounded.

[0067] The fourth end of the single-chip microcomputer (the 14 / 18 / 9 pin of the U7) is connected to the second end of the address selection module; for obtaining the circuit address of the current module, so as to expand more channels.

[0068] The fifth end of the single-chip microcomputer (the 11-13 pin of the U7) is connected to the first end of the communication module, for indirectly sending and receiving the host computer data through the communication module, and realizing communication.

[0069] More specifically, the 1 pin of the single-chip microcomputer U7 controls an indicator lamp, so as to indicate whether the communication is normal.

[0070] Further, referring to Figure 4 , Figure 4 is a circuit schematic diagram of a fast charging module of a multi-channel program-controlled fast charging aging test circuit provided by the embodiment of the application, comprising a fast charging control chip U1, an input signal processing unit (a fuse F1, a 26V TVS diode D1, filter capacitors C4 / C5 / C6), an output filter processing unit (filter capacitors C7 / C8 / C9 / C10 and an inductor L1). Wherein, the model of the fast charging control chip U1 provided by the embodiment of the application is SW3526_QFN24_4X4.

[0071] The first end (13-16 pins of U1) of the fast charging control chip is connected to the output end of the input signal processing unit, the input end of the input signal processing unit is connected to the first end of the power supply module, for signal processing of the fixed voltage signal, and the processed fixed voltage signal is input to the fast charging control chip.

[0072] Specifically, the 13th-16th pins of U1 are input pins of U1, 24V DC voltage is input from the input pins, capacitors C4-C6 are connected in parallel on the input pins for input power filtering, D1 is a 26V TVS diode for input overvoltage protection, and the power input interface is connected through F1 fuse.

[0073] The second end (1 pin and 24 pin of U1) of the fast charging control chip is connected to the second end of the parameter acquisition module, for the acquisition result of the voltage and current parameters of the output interface by the parameter acquisition module.

[0074] The third end (2-6 pins of U1) of the fast charging control chip is connected to the input end of the output filtering processing unit, and the output end of the output filtering processing unit is connected to the output interface; for outputting the adjusted fast charging demand voltage in the form of PWM signal.

[0075] Specifically, the capacitor C7 and the resistor R7 are connected at the output end, the PWM signal is filtered by the inductor L1 to be a direct current voltage, and then output to the parameter acquisition module after filtering by the capacitors C8-C10.

[0076] The fourth end (8 / 9 pins of U1) of the fast charging control chip is connected to the first end of the single-chip microcomputer, for realizing communication with the single-chip microcomputer U7.

[0077] More specifically, the 22nd pin and the 25th pin of U1 are connected to LED tubes D6 / D7 to indicate the power supply and fast charging triggering conditions.

[0078] Further, referring to Figure 5 , Figure 5 is a circuit principle diagram of the parameter acquisition module of the multi-channel program-controlled fast charging aging test circuit provided by the embodiment of the application, comprising a sampling resistor R2 and a filtering capacitor C3.

[0079] The sampling resistor R2 is connected in series between the fast charging control chip U1 and the output interface, and the two ends of the sampling resistor R2 are respectively connected to the second end of the fast charging control chip.

[0080] The filtering capacitor C3 is connected in parallel at the two ends of the sampling resistor R2, for filtering, so that the collected parameters are more stable.

[0081] Further, referring to Figure 6 , Figure 6This is a circuit schematic diagram of the output interface of the multi-channel programmable fast charging aging test circuit provided in this application embodiment. In this circuit, P1 is the output positive and negative interface. Pins 1-6 of P1 are the positive pins of BVBUSC (i.e., bus power supply). After passing through the voltage and current sampling circuit, they are connected to pins 1-6 of P1. Pins 7-12 of P1 are connected to the negative power supply GND. Pin P3 is the signal output pin, which is connected to the signal pin of the fast charging module.

[0082] Furthermore, referring to Figure 7 , Figure 7 This is a circuit schematic diagram of the communication module of the multi-channel programmable fast charging aging test circuit provided in this application embodiment, including a 485 transceiver U9, a first optocoupler U10, a first transistor Q2, a second optocoupler U5, and a second transistor Q1.

[0083] Wherein, the base of the first transistor Q2 is connected to the fifth terminal of the microcontroller, the collector of the first transistor Q2 is connected to the first terminal of the first optocoupler U10, and the second terminal of the first optocoupler U10 is connected to an external DC signal source.

[0084] The third terminal of the first optocoupler U10 is connected to the base of the second transistor Q1, and the collector of the second transistor Q1 is connected to the first terminal of the 485 transceiver U9; the second terminal of the 485 transceiver U9 is connected to the host computer.

[0085] Specifically, when the microcontroller needs to send data to the host computer, it goes through... Figure 7 Resistor R54 controls the base of the first transistor Q2 to conduct, allowing the signal from its emitter to pass through the transistor Q2, then through pin 3 of the first optocoupler U10, and form a signal loop with resistor R50. Resistor R50 is connected to an external DC signal source VCC. In this case, pin 6 of the first optocoupler U10 outputs the output to control the base of the second transistor Q1 to conduct and cut off, indirectly transmitting data to pins 2 and 3 of the 485 transceiver U9. The 485 transceiver U9 converts the input high and low level TTL signals into 485 differential signals and outputs them to the PC through pins 6 and 7. The PC then performs internal conversion and sends the data to the host computer.

[0086] Furthermore, the third terminal of the 485 transceiver U9 is connected to the first terminal of the second optocoupler U5, the second terminal of the second optocoupler U5 is connected to an external DC signal source, and the third terminal of the second optocoupler U5 is connected to the fifth terminal of the microcontroller.

[0087] Specifically, when the host computer needs to send data to the single-chip microcomputer, the host computer converts the signal to be sent into a 485 differential signal through the PC end and inputs it into the 6 / 7 pin of the 485 transceiver U9, which is converted into a TTL signal after internal conversion and is output from the 1 pin of the 485 transceiver U9, so as to control the 2 pin of the second optocoupler U5 to send the signal to the 3 pin of the second optocoupler U5, and then output to the single-chip microcomputer.

[0088] The signal adopted by the first optocoupler U10 and the second optocoupler U5 is 6N137, and the model of the 485 transceiver U9 is SN65LBC184D.

[0089] In the second aspect, the application provides an electronic device loaded with the multi-channel program-controlled fast-charging aging test circuit.

[0090] The above is a specific description of the preferred implementation of the application, but the application creation is not limited to the described embodiments, and those skilled in the art can make various equivalent modifications or replacements without departing from the spirit of the application. These equivalent modifications or replacements are all included in the scope defined by the claims of the application.

Claims

1. A multi-channel program-controlled fast-charge aging test circuit, characterized in that, The circuit comprises a master control module, a fast charging module, a parameter acquisition module, a power supply module and a communication module; The first end of the power supply module is connected to the first end of the fast charging module, for providing a fixed voltage signal to the fast charging module; The first end of the master control module is connected to the second end of the fast charging module, and the third end of the fast charging module is connected to an external output interface, for converting the fixed voltage signal into a fast charging demand voltage according to the control signal sent by the master control module and then outputting the fast charging demand voltage to the output interface; The output interface is connected to the first end of the parameter acquisition module, and the second end of the parameter acquisition module is connected to the fourth end of the fast charging module, for acquiring voltage and current parameters at the output interface and outputting the voltage and current parameters to the fast charging module for detection, and then returning the detection result to the master control module; The second end of the master control module is connected to the first end of the communication module, and the second end of the communication module is connected to an external host computer, for transmitting the detection result as a communication signal to the host computer through the communication module.

2. The multi-channel programmed fast charge burn-in test circuit of claim 1, wherein, The circuit further comprises an address selection module; The first end of the address selection module is connected to the second end of the power supply module, and the second end of the address selection module is connected to the third end of the master control module, for providing multiple communication addresses to expand the master control module with a multi-channel circuit and test multiple potential points.

3. The multi-channel program-charge fast-charge burn-in test circuit of claim 2, wherein, The address selection module comprises a dial switch and multiple pull-up resistors; The dial switch comprises six address selection pins; Each address selection pin is connected in series with at least one pull-up resistor, and the connection of all the pull-up resistors is connected to the third end of the master control module and an external DC signal source.

4. The multi-channel programmed fast charge burn-in test circuit of claim 2, wherein, The master control module comprises a single-chip microcomputer; The first end of the single-chip microcomputer is connected to the second end of the fast charging module; The second end of the single-chip microcomputer is connected to the third end of the power supply module, and the third end of the single-chip microcomputer is grounded; The fourth end of the single-chip microcomputer is connected to the second end of the address selection module; The fifth end of the single-chip microcomputer is connected to the first end of the communication module.

5. The multi-channel program-charge fast-charge burn-in test circuit of claim 4, wherein, The fast charging module comprises a fast charging control chip, an input signal processing unit and an output filter processing unit; The first end of the fast charging control chip is connected to the output end of the input signal processing unit, the input end of the input signal processing unit is connected to the first end of the power supply module, for signal processing of the fixed voltage signal and input of the processed fixed voltage signal to the fast charging control chip; The second end of the fast charging control chip is connected to the second end of the parameter acquisition module, for the acquisition result of the voltage and current parameters of the output interface by the parameter acquisition module; The third end of the fast charging control chip is connected to the input end of the output filter processing unit, and the output end of the output filter processing unit is connected to the output interface; The fourth end of the fast charging control chip is connected to the first end of the single-chip microcomputer.

6. The multi-channel program-charge fast-charge burn-in test circuit of claim 5, wherein, The parameter acquisition module comprises a sampling resistor and a filter capacitor; The sampling resistor is connected between the fast charging control chip and the output interface, and two ends of the sampling resistor are connected to a second end of the fast charging control chip respectively. The filtering capacitor is connected in parallel to the two ends of the sampling resistor.

7. The multi-channel program-charge fast-charge burn-in test circuit of claim 4, wherein, The communication module comprises a 485 transceiver, a first optocoupler, a first triode, a second optocoupler and a second triode. The base of the first triode is connected to a fifth end of the single-chip microcomputer, the collector of the first triode is connected to a first end of the first optocoupler, and a second end of the first optocoupler is connected to an external direct-current signal source. A third end of the first optocoupler is connected to the base of the second triode, and the collector of the second triode is connected to a first end of the 485 transceiver; a second end of the 485 transceiver is connected to the host computer. A third end of the 485 transceiver is connected to a first end of the second optocoupler, a second end of the second optocoupler is connected to an external direct-current signal source, and a third end of the second optocoupler is connected to the fifth end of the single-chip microcomputer.

8. An electronic device, comprising: The multi-channel program-controlled fast charging aging test circuit as claimed in any one of claims 1-7 is loaded.

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