Chip test workbench capable of efficiently removing dust

Abstract

The utility model discloses an efficient dust removal chip test workbench, which comprises a chip test seat and a positioning plate, the positioning plate and the chip test seat are arranged in parallel, a cleaning channel is formed between the positioning plate and the chip test seat, two sides of the positioning plate are bent towards the chip test seat to form fixing parts, and the fixing parts are fixed on the positioning plate. One end of the fixing part is fixedly connected with the chip testing seat, a positioning column is arranged in the cleaning channel, the positioning column is sleeved with a cleaning sleeve, one end of the positioning column makes contact with the positioning part, the other end of the positioning column extends to the outside along an opening of the cleaning channel and is provided with a vertical plate, and a push block is slidably installed at one end of the vertical plate. The chip testing seat dust removal device is simple in structure, dust remaining on the chip testing seat can be rapidly removed through the moving cleaning sleeve, and the cleaning sleeve can be tightly pressed through the cleaning channel so as to ensure the dust removal quality.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip test technical field, concretely relates to a chip test workbench of high -efficient dust removal. BACKGROUND

[0002] Chip will be tested through the chip test seat after production, and the chip test seat is tested by placing the chip on the chip placement position of the test seat, but the present chip test seat cannot quickly remove the dust on the chip test seat, and the existence of dust will affect the contact and conduction between the chip and the chip test seat, thereby affecting the test quality. UTILITY MODEL CONTENTS

[0003] The utility model relates to a chip test workbench of high -efficient dust removal, through the cleaning cover of moving can remove the dust remaining on the chip test seat fast, to solve the problem raised in above -mentioned background art.

[0004] The utility model is through following technical scheme to realize: a chip test workbench of high -efficient dust removal, including chip test seat and positioning plate, the positioning plate is parallel with chip test seat arrangement, and the cleaning channel is formed between positioning plate and chip test seat, and the fixed part is formed to the two sides of positioning plate and bends to chip test seat, and one end of fixed part is fixedly connected with chip test seat, and the inside of cleaning channel is equipped with the positioning column, and the cleaning cover is equipped with the positioning column outside, and one end of positioning column is in contact with positioning part setting, and the other end of positioning column extends to outside along the opening of cleaning channel, and installs the vertical board, and the one end of vertical board is slidably installed with push block.

[0005] As a preferred technical scheme, the side surface of the chip test seat is provided with a sliding groove, and the push block is slidably arranged in the sliding groove. One end of the sliding groove is open, and the other end is sealed. One end of the push block is in contact with the sealed end of the sliding groove.

[0006] As a preferred technical scheme, the inner wall surface of the sliding groove opening is protruded to form a positioning part, and the inner side surface of the push block is provided with a positioning groove, and the positioning groove and the positioning part are transversely arranged.

[0007] As a preferred technical scheme, the two sides of the sliding groove are provided with limiting grooves, and the two sides of the push block are protruded to form limiting parts, and the limiting parts are slidably arranged in the limiting grooves.

[0008] As a preferred technical scheme, the cleaning cover is made of dust-free cloth, and the inner cavity of the cleaning cover and the cross section of the positioning column are both arranged in a rectangular structure.

[0009] As a preferred technical scheme, the positioning plate is provided with a positioning opening matched with the length and width of the chip.

[0010] As a preferred technical scheme, the positioning column is made of metal material.

[0011] The chip test seat cleaning device has the advantages that the structure is simple, the dust remaining on the chip test seat can be quickly removed through the movable cleaning sleeve, the cleaning sleeve can be pressed tightly through the cleaning channel to ensure the dust removal quality, the cleaning sleeve can be directly moved to the outside through the opening on one side of the cleaning channel, the cleaning sleeve can be quickly replaced, and the cleaning effect is further ensured. BRIEF DESCRIPTION OF DRAWINGS

[0012] In order to more clearly illustrate the technical solutions of the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiment or the prior art description. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0013] Figure 1 It is a schematic diagram of the overall structure of the present application;

[0014] Figure 2 It is a schematic diagram of the structure of the present application after removing the positioning plate and the chip test seat;

[0015] Figure 3 It is a schematic diagram of the structure of the present application after the cleaning sleeve is moved out.

[0016] 1, chip test seat; 2, positioning plate; 3, positioning port; 4, sliding groove; 5, push block; 6, vertical plate; 7, cleaning sleeve; 8, positioning part; 9, positioning groove; 10, limiting groove; 11, limiting part; 12, positioning column. DETAILED DESCRIPTION

[0017] The embodiments of the present application will be described in detail below, and examples of the embodiments are shown in the drawings, wherein the same or similar reference signs represent the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary and are only used to explain the present application, and cannot be understood as limiting the present application.

[0018] All features disclosed in this specification, or the steps of all methods or processes disclosed, can be combined in any manner, except where features or steps are mutually exclusive.

[0019] Any feature disclosed in this specification, unless otherwise stated, can be replaced by an alternative feature or replaced by a feature having the same function. That is, each feature is only an example of a series of equivalent or similar features.

[0020] AsFigure 1 and Figure 2 As shown in the utility model discloses a high -efficient dust removal's chip test workstation, including chip test seat 1 and locating plate 2, the locating plate 2 with chip test seat 1 parallel arrangement, and the cleaning channel is formed between locating plate 2 and chip test seat 1, the both sides of locating plate 2 are curved to form fixed part towards chip test seat 1, and one end of fixed part is fixedly connected with chip test seat 1, and the inside of cleaning channel is equipped with locating column 12, the outside of locating column 12 is equipped with cleaning sleeve 7, and one end of locating column 12 is in contact with setting of locating part 8, and the other end of locating column 12 extends to outside along the opening of cleaning channel, and is installed with vertical board 6, and one end of vertical board 6 is slidably installed with push block 5.

[0021] In the embodiment, the side surface of the chip test seat 1 is provided with a sliding groove 4, and the push block 5 is slidably arranged in the sliding groove 4. One end of the sliding groove 4 is open, and the other end is sealed. One end of the push block 5 is in contact with the sealed end of the sliding groove 4.

[0022] In the embodiment, the inner wall surface of the opening of the sliding groove 4 is protruded to form a locating part 8, and the inner side surface of the push block 5 is provided with a locating groove 9. The locating groove 9 is transversely arranged opposite to the locating part 8.

[0023] In the embodiment, the two sides of the sliding groove 4 are provided with limiting grooves 10, and the two sides of the push block 5 are protruded to form limiting parts 11. The limiting parts 11 are slidably arranged in the limiting grooves 10. The push block can be positioned by the limiting parts and the limiting grooves, so that the push block can only move back and forth along the limiting grooves, avoiding the push block directly separating from the sliding groove.

[0024] In the embodiment, the cleaning sleeve 7 is made of dust-free cloth, and the inner cavity of the cleaning sleeve 7 and the cross section of the locating column 12 are both arranged in a rectangular structure, so that the cleaning sleeve can be positioned, avoiding the circular rotation of the cleaning sleeve.

[0025] In the embodiment, the locating plate 2 is provided with a locating opening 3 matching the length and width of the chip. The chip can contact the chip test seat along the locating opening, and the placed chip can be positioned by the locating opening.

[0026] In the embodiment, the locating column 12 is made of metal material, which increases the firmness to ensure the bearing capacity and avoid the fracture.

[0027] In use, the push block can directly push the vertical plate, the locating column and the cleaning sleeve, so that the cleaning sleeve can quickly wipe the surface of the chip test seat along the cleaning channel. The cleaning sleeve can be pressed tightly through the cleaning channel to ensure the dust removal quality.

[0028] As shown in the utility model discloses a high -efficient dust removal's chip test workstation, including chip test seat 1 and locating plate 2, the locating plate 2 with chip test seat 1 parallel arrangement, and the cleaning channel is formed between locating plate 2 and chip test seat 1, the both sides of locating plate 2 are curved to form fixed part towards chip test seat 1, and one end of fixed part is fixedly connected with chip test seat 1, and the inside of cleaning channel is equipped with locating column 12, the outside of locating column 12 is equipped with cleaning sleeve 7, and one end of locating column 12 is in contact with setting of locating part 8, and the other end of locating column 12 extends to outside along the opening of cleaning channel, and is installed with vertical board 6, and one end of vertical board 6 is slidably installed with push block 5. Figure 3As shown, when the cleaning sleeve needs to be replaced, the push block can continue to move towards one end of the sliding groove opening, the positioning groove on the push block can be sleeved outside the positioning part, the positioning part can limit the moving distance of the push block, avoiding disengagement from the sliding groove, but at this time, the vertical plate will be disengaged from the side of the chip test seat, and the positioning column and the cleaning sleeve will be removed from the cleaning sleeve, after losing the blocking of the fixing part, the cleaning sleeve can be directly taken out along the positioning column, and a new cleaning sleeve is sleeved, after sleeving, the push block can move the positioning column into the conductive cleaning sleeve again, and through the contact between the fixing part and the cleaning sleeve, one end of the cleaning sleeve can be blocked, avoiding the axial movement of the cleaning sleeve to affect the cleaning quality.

[0029] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto, any change or replacement without creative labor should be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be limited by the protection scope defined in the claims.

Claims

1. A high-efficiency dust removal chip testing workbench, characterized in that: The utility model provides chip test seat (1) and positioning plate (2) including, positioning plate (2) is parallelly arranged with chip test seat (1), and the clean channel is formed between positioning plate (2) and chip test seat (1), and the both sides of positioning plate (2) are curved and form fixed part towards chip test seat (1), and one end of fixed part is fixedly connected with chip test seat (1), and the inside of clean channel is equipped with positioning column (12), and the outside of positioning column (12) is equipped with cleaning sleeve (7), and one end of positioning column (12) is in contact with positioning part (8) and sets up, and the other end of positioning column (12) extends to outside along the opening of clean channel, and is installed with vertical board (6), and one end of vertical board (6) is slidably installed with push block (5).

2. The high-efficiency particulate abatement chip test bench of claim 1, wherein: The side surface of chip test seat (1) is equipped with sliding slot (4), and push block (5) is slidably arranged in sliding slot (4), and one end of sliding slot (4) is open, and the other end is sealed, and one end of push block (5) is in contact with the sealed end of sliding slot (4).

3. The high-efficiency particulate-eliminating chip test bench according to claim 2, wherein: The inner wall surface of the opening of sliding slot (4) is protruded and forms positioning part (8), and the inner side of push block (5) is equipped with positioning groove (9), and positioning groove (9) is transversely opposite positioning part (8).

4. The high-efficiency particulate abatement chip test bench of claim 2, wherein: The both sides of sliding slot (4) are equipped with limiting groove (10), and the both sides of push block (5) are protruded and form limiting part (11), and limiting part (11) is slidably arranged in limiting groove (10).

5. The high-efficiency particulate abatement chip test bench of claim 1, wherein: Cleaning sleeve (7) is made of dustless cloth, and the inner cavity of cleaning sleeve (7) and the section of positioning column (12) are both rectangular structure.

6. The high-efficiency particulate abatement chip test bench of claim 1, wherein: Positioning plate (2) is equipped with positioning port (3) matching with the length and width of chip.

7. The high-efficiency particulate abatement chip test bench of claim 1, wherein: Positioning column (12) is made of metal material.

Images