High-precision multifunctional impedance test instrument probe
By designing a high-precision, multi-functional impedance testing instrument probe, the problems of limited measurement function and poor environmental adaptability were solved. Multi-parameter measurement and environmental temperature compensation were achieved, improving the functionality and adaptability of the testing instrument.
Patent Information
- Application Number
- CN202422895735.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-27
- Publication Date
- 2025-12-23
- Estimated Expiration
- 2034-11-27
AI Technical Summary
Existing impedance testing instruments have limited probe measurement functions and poor adaptability to environmental temperature, making it difficult to meet the testing needs of various measurement requirements and application scenarios.
A high-precision, multi-functional impedance testing instrument probe was designed, comprising a measurement circuit, a processing module, a temperature compensation circuit, and a power supply module. It achieves multi-parameter measurement and ambient temperature compensation through a high-precision impedance sensor, an operational amplifier, and a temperature compensation circuit.
It enables the measurement of multiple parameters, improves the functionality and efficiency of the test instrument probe, and can quickly adapt to changes in external ambient temperature to ensure the excellent operation of the test instrument.
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Figure CN223711712U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to electronic measuring instrument technical field especially relates to a high accuracy multifunctional impedance test instrument probe. BACKGROUND
[0002] Impedance test instrument is the important link in electronic equipment, component performance detection, it is a kind of electronic test instrument, it can measure complex resistance with the change of test frequency, impedance is a very important parameter of characterization electronic component, electronic circuit and component material, and its accuracy directly influences the quality control and fault diagnosis of product, the existing impedance test instrument probe has the problems such as single measurement function, poor environmental temperature adaptability during use, it is difficult to meet the test demand of increasingly diversified measurement parameters, multiple use scenes. UTILIT Y MODEL CONTENT
[0003] In view of the insufficient of prior art, the utility model provides a high accuracy multifunctional impedance test instrument probe, solve the prior art's measurement function single and the technical problem of poor adaptability to environment, reach the purpose that test instrument probe can measure multiple parameters and can quickly adapt to external environment.
[0004] In order to solve the above technical problems, the utility model provides the following technical scheme: a kind of high accuracy multifunctional impedance test instrument probe, including the measurement circuit for measuring the multiple parameters of to-be-measured circuit, processing module for operating multiple parameters, temperature compensation circuit and power module, the measurement circuit includes impedance measurement circuit, capacitance measurement circuit and current measurement circuit.
[0005] Preferably, the impedance measurement circuit is composed of high-precision impedance sensor, operational amplifier d1, current limiting resistor R1, operational amplifier D2 and output signal, the high-precision impedance sensor is connected to the positive input terminal of operational amplifier d1, the output terminal of operational amplifier d1 is connected to the negative input terminal of operational amplifier D2 through current limiting resistor R1, the output terminal of operational amplifier D2 transmits output signal, the negative input terminal and the output terminal of operational amplifier D2 are respectively connected with resistor R3 and capacitor C2 in parallel, and the output terminal of operational amplifier D2 is grounded through resistor R4.
[0006] Preferably, the capacitance measurement circuit is composed of input signal, operational amplifier D3 and capacitor signal, the input signal is connected to the negative input terminal of operational amplifier D3 through capacitor C4, capacitor C4 and the output terminal of operational amplifier D3 are connected with current limiting resistor R5 and R6 in parallel in turn, the negative input terminal of operational amplifier D3 is connected between current limiting resistor R5 and R6, and the positive input terminal of operational amplifier D3 is grounded.
[0007] Preferably, the current measurement circuit is composed of a to-be-detected current, a current-limiting resistor R9, an operational amplifier D4 and a current signal, the to-be-detected current is connected to the positive input terminal of the operational amplifier D4 through the current-limiting resistor R9, the to-be-detected current is connected to the negative input terminal of the operational amplifier D4 through current-limiting resistors R10 and R12, the negative input terminal and the output terminal of the operational amplifier D4 are connected in parallel with a shunt resistor R14, and the positive input terminal of the operational amplifier D4 is connected to the ground through a resistor R13.
[0008] Preferably, the temperature compensation circuit is composed of a 12V temperature power supply, a variable resistor R7, a thermistor R8 and a triode Q1 connected in series, the thermistor R8 is connected to the base of the triode Q1, and the collector of the triode Q1 is connected to the temperature compensation signal.
[0009] Preferably, the power module is used for supplying power to the measurement circuit, the processing module and the temperature compensation circuit, and the measurement circuit is externally connected with a probe.
[0010] Preferably, the processing module is of a TMS320F2812 model, and the power module is of a TPS767D301 model.
[0011] By the above technical scheme, the utility model provides a kind of high-precision multifunctional impedance test instrument probe, at least have the following beneficial effects:
[0012] 1, the utility model discloses the effect of measurement circuit, can measure a variety of circuit parameters in circuit, including impedance, capacitance and current, so that test instrument probe can satisfy a variety of different measurement needs, increase the functionality of test instrument probe, improve the use efficiency of test instrument probe and the work efficiency of user.
[0013] 2, the utility model discloses the synergistic effect of processing module and temperature compensation circuit, can detect ambient temperature, and according to the temperature compensation adjustment of test instrument according to the condition of ambient temperature, make test instrument be in excellent running state, eliminate the adverse effects of temperature on test instrument, increase the adaptability of test instrument. ACCURACY MULTIFUNCTIONAL IMPEDANCE TEST INSTRUMENT PROBE
[0014] The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiments of the application and serve to explain the application without imposing undue limitation thereon. In the drawings:
[0015] Figure 1 It is a structural block diagram of the utility model discloses a kind of high-precision multifunctional impedance test instrument probe;
[0016] Figure 2 It is the circuit diagram of the utility model discloses impedance measurement circuit;
[0017] Figure 3 is a circuit diagram of the current measurement circuit of the utility model;
[0018] Figure 4 is a circuit diagram of the current measurement circuit of the utility model;
[0019] Figure 5 is a circuit diagram of the temperature compensation circuit of the utility model.
[0020] In the figure: 1, probe; 2, measurement circuit; 21, impedance measurement circuit; 22, capacitance measurement circuit; 23, current measurement circuit; 3, processing module; 4, temperature compensation circuit; 5, power module. DETAILED DESCRIPTION
[0021] In order to make the above-mentioned purposes, features and advantages of the utility model more obvious and easy to understand, the utility model will be further described in detail below by combining with the drawings and specific embodiments. By this, the realization process of how to apply technical means to solve technical problems and achieve technical effects of the present application can be fully understood and implemented.
[0022] Due to the technical problems of single measurement function and poor adaptability to the environment of the prior art, please refer to Figure 1 Figure 5 The embodiment provides a high-precision multifunctional impedance testing instrument probe, which can measure various parameters and quickly adapt to external environment, and the testing instrument probe comprises a measurement circuit 2 for measuring various parameters of a to-be-measured circuit, a processing module 3 for performing operation on the various parameters, a temperature compensation circuit 4 and a power supply module 5, the power supply module 5 is used for supplying power for the measurement circuit 2, the processing module 3 and the temperature compensation circuit 4, the measurement circuit 2 is externally connected with a probe 1, the measurement circuit 2 comprises an impedance measurement circuit 21, a capacitance measurement circuit 22 and a current measurement circuit 23, the impedance measurement circuit 21 is composed of a high-precision impedance sensor, an operational amplifier d1, a current-limiting resistor R1, an operational amplifier D2 and an output signal, the high-precision impedance sensor is connected to the positive input end of the operational amplifier d1, the output end of the operational amplifier d1 is connected to the negative input end of the operational amplifier D2 through the current-limiting resistor R1, the output end of the operational amplifier D2 transmits the output signal, the negative input end and the output end of the operational amplifier D2 are respectively connected with a resistor R3 and a capacitor C2 in parallel, the output end of the operational amplifier D2 is connected to the ground through a resistor R4, the capacitance measurement circuit 22 is composed of an input signal, an operational amplifier D3 and a capacitance signal, the input signal is connected to the negative input end of the operational amplifier D3 through a capacitor C4, the capacitor C4 and the output end of the operational amplifier D3 are connected with a current-limiting resistor R5 and a current-limiting resistor R6 in parallel, the current-limiting resistor R5 and the current-limiting resistor R6 are connected with the negative input end of the operational amplifier D3, the positive input end of the operational amplifier D3 is connected to the ground, the current measurement circuit 23 is composed of a to-be-detected current, a current-limiting resistor R9, an operational amplifier D4 and a current signal, the to-be-detected current is connected to the positive input end of the operational amplifier D4 through the current-limiting resistor R9, the to-be-detected current is connected to the negative input end of the operational amplifier D4 through current-limiting resistors R10 and R12, the negative input end and the output end of the operational amplifier D4 are connected with a shunt resistor R14 in parallel, the positive input end of the operational amplifier D4 is connected to the ground through a resistor R13, the processing module 3 is of a TMS320F2812 type, and the power supply module 5 is of a TPS767D301 type.
[0023] The utility model discloses impedance measuring circuit 21 obtains impedance signal through high accuracy impedance sensor, and high accuracy impedance sensor adopts advanced microelectronic technology and precision machining process, realizes the accurate collection to the impedance value of measured object, and the measurement precision is superior to prior art standard, and has low drift, high linearity and other characteristics, and the impedance signal of acquisition is transmitted to operational amplifier D2 through operational amplifier D1 and current -limiting resistor R1, wherein resistor R3 is shunted to signal, and capacitor C2 is filtered to signal, and the output signal is transmitted to processing module 3 through operational amplifier D2, and capacitor measuring circuit 22 can measure the capacitor in the circuit, and the capacitor C4 and current -limiting resistor R5 in the circuit are the filter capacitor and equivalent parallel leakage resistance of the capacitor to be measured respectively, and current -limiting resistor R6 can be feedback resistance, and the capacitor signal is transmitted to processing module 3 through operational amplifier D3, and the current to be detected of current measuring circuit 23 is transmitted to processing module 3 through operational amplifier D4, and the negative input terminal pin of operational amplifier D4 is not directly grounded, but is grounded through current -limiting resistor R12 and R11, avoids the value of current signal to cover to 0A below, and the problem of directly taking power supply ground end as the reference is avoided to the maximum, therefore, all the circuits that exist interaction should take the same ground end as the reference, and reducing current sensing resistance value helps to minimize the current value after grounding fluctuation, processing module 3 is handled to output signal, capacitor signal and current signal and obtains the measurement value of impedance, capacitor and current, and power module 5 can provide all -weather power supply for measuring circuit 2, processing module 3 and temperature compensation circuit 4, through the action of measuring circuit, can measure a variety of circuit parameters in the circuit, including impedance, capacitor and current, so that the test instrument probe can satisfy a variety of different measurement demands, increase the functionality of test instrument probe, improve the use efficiency of test instrument probe and the work efficiency of user.
[0024] Because the temperature of test instrument probe will change in different environments, the change of temperature can easily influence the test result of test instrument, please refer to Figure 5 Temperature compensation circuit 4 is composed of 12V temperature power supply, variable resistor R7, thermistor R8 and triode Q1 in series, thermistor R8 is connected to the base of triode Q1, and the collector of triode Q1 is connected to temperature compensation signal.
[0025] The utility model discloses a temperature compensation circuit for test instrument, including processing module 3, temperature compensation circuit, test instrument, processing module 3 is connected with temperature compensation circuit, temperature compensation circuit is connected with test instrument, the utility model discloses a temperature compensation circuit for test instrument, through the temperature compensation circuit of processing module, can carry out the temperature compensation of test instrument, and the temperature compensation circuit is the constant temperature device of common, the model of temperature compensation circuit is LX-100, through the synergistic effect of processing module and temperature compensation circuit, can detect the environmental temperature to test instrument, and according to the temperature compensation adjustment of environmental temperature to test instrument, make test instrument be in the state of excellent operation, eliminate the adverse effect of temperature to test instrument, increase the adaptability of test instrument.
[0026] Each of the embodiments in the specification is described in a progressive manner, and each embodiment focuses on the difference from other embodiments, and the same or similar parts between the embodiments can be referred to each other. For the above embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the part of the method embodiments.
[0027] The above embodiments are described in detail, and the principle and implementation of the utility model are described by applying specific examples. The above embodiment is only used to help understand the method and core idea of the utility model; at the same time, for the general technical personnel in the field, according to the idea of the utility model, the specific implementation and application range will be changed, and the above, the content of the specification should not be understood as the limitation of the utility model.
Claims
1. A high-precision multifunctional impedance testing instrument probe, comprising a measurement circuit (2) for measuring a plurality of parameters of a circuit to be measured, a processing module (3) for operating the plurality of parameters, a temperature compensation circuit (4) and a power supply module (5), characterized in that, The measuring circuit (2) comprises an impedance measuring circuit (21), a capacitance measuring circuit (22) and a current measuring circuit (23). The impedance measuring circuit (21) is composed of a high-precision impedance sensor, an operational amplifier d1, a current-limiting resistor R1, an operational amplifier D2 and an output signal, the high-precision impedance sensor is connected to the positive input terminal of the operational amplifier d1, the output terminal of the operational amplifier d1 is connected to the negative input terminal of the operational amplifier D2 through the current-limiting resistor R1, the output terminal of the operational amplifier D2 transmits the output signal, the negative input terminal and the output terminal of the operational amplifier D2 are respectively connected in parallel with a resistor R3 and a capacitor C2, and the output terminal of the operational amplifier D2 is connected to the ground through a resistor R4.
2. The impedance test instrument probe of claim 1, wherein, The capacitance measuring circuit (22) is composed of an input signal, an operational amplifier D3 and a capacitance signal, the input signal is connected to the negative input terminal of the operational amplifier D3 through a capacitor C4, the capacitor C4 and the output terminal of the operational amplifier D3 are connected in parallel with a current-limiting resistor R5 and a current-limiting resistor R6 which are connected in series, the current-limiting resistor R5 and the current-limiting resistor R6 are connected to the negative input terminal of the operational amplifier D3, and the positive input terminal of the operational amplifier D3 is connected to the ground.
3. The impedance test instrument probe of claim 1, wherein, The current measuring circuit (23) is composed of a to-be-detected current, a current-limiting resistor R9, an operational amplifier D4 and a current signal, the to-be-detected current is connected to the positive input terminal of the operational amplifier D4 through the current-limiting resistor R9, the to-be-detected current is connected to the negative input terminal of the operational amplifier D4 through current-limiting resistors R10 and R12, the negative input terminal and the output terminal of the operational amplifier D4 are connected in parallel with a shunt resistor R14, and the positive input terminal of the operational amplifier D4 is connected to the ground through a resistor R13.
4. The impedance test instrument probe of claim 1, wherein, The temperature compensation circuit (4) is composed of a 12V temperature power supply, a variable resistor R7, a thermistor R8 and a transistor Q1 which are connected in series, the thermistor R8 is connected to the base of the transistor Q1, and the collector of the transistor Q1 is connected to a temperature compensation signal.
5. The impedance test instrument probe of claim 1, wherein, The power module (5) is used for supplying power to the measuring circuit (2), the processing module (3) and the temperature compensation circuit (4), and the measuring circuit (2) is externally connected with a probe (1).
6. The impedance test instrument probe of claim 1, wherein, The processing module (3) is of a TMS320F2812 type, and the power module (5) is of a TPS767D301 type.