Test equipment
By employing a flow guide design in the chip aging test equipment, increasing the airflow velocity and synchronously directing it towards the third chamber, the problem of test data discrepancies caused by temperature field differences was solved, thus improving test accuracy.
Patent Information
- Application Number
- CN202423137131.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-18
- Publication Date
- 2025-12-23
- Estimated Expiration
- 2034-12-18
AI Technical Summary
In existing chip aging test equipment, the temperature field difference in the air circulation channel leads to excessive differences in chip test data, which reduces the test accuracy.
The design employs a flow guide, including a second cavity, a third cavity, and several through holes, forming a first fluid channel. This increases the airflow velocity and causes it to be sprayed synchronously toward the third cavity, reducing temperature differences at different test locations.
By reducing the temperature difference at different test locations on the chip, the accuracy of chip aging tests is improved.
Smart Images
Figure CN223711769U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The embodiment of the utility model relates to the test technical field, in particular to a test equipment. BACKGROUND
[0002] Chip aging test refers to a kind of chip aging test in chip aging test equipment, simulates high-low temperature condition to chip and carries out aging test, is used to evaluate the test of chip durability and reliability.This test helps chip to detect the quality of chip in early research and development stage, predicts the performance of chip in long-term use, and identifies and solves easy failure problem in time.
[0003] In chip aging test equipment, there is usually test cavity, and several chips are usually placed in test cavity for synchronous test.At present, the structure of test cavity is that one side of test cavity is air inlet, and the opposite side of test cavity is air outlet, air inlet, test cavity and air outlet are sequentially communicated to form air flow channel, and air flow channel is used for hot air or cold air to flow through chip to control the temperature rise and fall of chip.However, for the air flow channel with the above structure, when hot air or cold air enters air flow channel, there is temperature field difference from air inlet to air outlet, for example, when hot air enters air flow channel, there is temperature field decrement from air inlet to air outlet, so that the farther the test position from air inlet, the lower the temperature, and then the farther the chip from air inlet, the less the heat, so that the test data of chip different from air inlet is too different, and the test accuracy is reduced. CONTENT OF UTILITY MODEL
[0004] The technical problem solved by the embodiment of the utility model is to provide a test equipment, which can improve test accuracy.
[0005] To solve the above technical problems, the utility model discloses an embodiment adopts one technical scheme, which provides a test equipment, which comprises a shell and a flow guide piece, the shell is provided with a first cavity, a first air inlet and a first air outlet, the first air inlet and the first air outlet are communicated with opposite sides of the first cavity respectively, the flow guide piece is arranged in the first cavity, the flow guide piece is provided with a second cavity, a third cavity, a plurality of through holes, a second air inlet and a second air outlet, the second cavity and the third cavity are aligned along a first direction, the plurality of through holes are arranged between the second cavity and the third cavity, the plurality of through holes conduct the second cavity and the third cavity, the second air inlet and the first air inlet are at least partially aligned along a second direction, the second air inlet conducts the first air inlet and the second cavity, the second air outlet and the first air outlet are at least partially aligned along the second direction, the second air outlet conducts the first air outlet and the third cavity, and the first direction is perpendicular to the second direction, wherein the first air inlet, the second air inlet, the second cavity, the plurality of through holes, the third cavity, the second air outlet and the first air outlet are sequentially communicated and form a first fluid channel, the first fluid channel is used for air flow, the plurality of through holes are used for increasing the flow rate of air flow through the second cavity and driving air flow to be synchronously sprayed towards the third cavity, and the third cavity is used for placing a measured article.
[0006] In some embodiments, along the first direction, the shell is provided with a socket communicating with the first cavity, and the flow guide piece is plugged into the socket.
[0007] In some embodiments, the test equipment comprises a test board, a first socket and a second socket, the test board is arranged in the first cavity, the test board separates the third cavity and the first cavity, the test board is provided with opposite first and second surfaces, the first socket is arranged on the first surface, the first socket extends into the third cavity, the first socket is used for plugging a measured article, and the second socket is arranged on the second surface, the second socket is electrically connected with the first socket, and the second socket is used for plugging a circuit board.
[0008] In some embodiments, along the first direction, the shell is provided with a through hole communicating with the first cavity, the through hole is aligned with the second socket, and the through hole is used for connecting the circuit board partially extending into the first cavity with the second socket.
[0009] In some embodiments, the housing is provided with a second threaded portion opposite to the first threaded portion; the testing device comprises a first threaded member, a second threaded member and a circuit board, the first threaded member is threaded through the circuit board to the first threaded portion, the second threaded member is threaded through the circuit board to the second threaded portion, and the circuit board is partially threaded through the through hole and extends into the first cavity and the second socket.
[0010] In some embodiments, the housing is provided with a second fluid passage, one end of the second fluid passage is in communication with one end of the first fluid passage, and the other end of the second fluid passage is in communication with the other end of the first fluid passage, and the second fluid passage is used to place a fan.
[0011] In some embodiments, the testing device comprises a centrifugal fan, and the centrifugal fan is arranged in the second fluid passage, and is used to form an air flow and drive the air flow to circulate along the first fluid passage and the second fluid passage.
[0012] In some embodiments, the testing device comprises a temperature control member, and the temperature control member is fixed to the housing, and is used to control the temperature of the second fluid passage.
[0013] In some embodiments, the testing device comprises a heat conduction member, and the heat conduction member is fixed to the second fluid passage, and is arranged in a spaced manner with the centrifugal fan, and is close to the first air inlet, and the centrifugal fan is close to the first air outlet, and the heat conduction member is used to improve the heat transfer speed of the temperature control member to the second fluid passage.
[0014] In some embodiments, one side of the heat conduction member at least partially penetrates the second fluid passage and abuts against the temperature control member, and the other side of the heat conduction member is provided with a plurality of heat conduction fins arranged in a spaced and uniform manner.
[0015] The embodiment of the utility model provides an advantageous effect: unlike prior art, the embodiment of the utility model provides a test equipment, including casing and flow guide piece, the casing is provided with first cavity, first air inlet and first air outlet, first air inlet and first air outlet are respectively communicated on the opposite sides of first cavity, the flow guide piece is arranged in first cavity, the flow guide piece is provided with second cavity, third cavity, a plurality of through -hole, second air inlet and second air outlet, second cavity and third cavity are aligned along first direction, a plurality of through -hole are arranged between second cavity and third cavity, a plurality of through -hole are communicated with second cavity and third cavity, second air inlet and first air inlet are at least partially aligned along second direction, second air inlet is communicated with first air inlet and second cavity, second air outlet and first air outlet are at least partially aligned along second direction, second air outlet is communicated with first air outlet and third cavity, first direction is perpendicular to second direction, wherein first air inlet, second air inlet, second cavity, a plurality of through -hole, third cavity, second air outlet and first air outlet are sequentially communicated and form first fluid channel, and third cavity is used for placing measured article, when the air current flows along first fluid channel, a plurality of through -hole increase the flow rate of the air current flowing through second cavity, and drive the air current to be sprayed towards third cavity synchronously, so as to reduce the temperature difference between different test positions of third cavity, and further reduce the test data difference of the measured article placed in different test positions of third cavity, thereby improving the test accuracy. BRIEF DESCRIPTION OF DRAWINGS
[0016] In order to more clearly illustrate the technical scheme in the specific embodiments of the utility model or the prior art, the following will briefly introduce the drawings needed to be used in the specific embodiments or the prior art description. In all the drawings, similar elements or parts are generally identified by similar reference numerals. In the drawings, each element or part is not necessarily drawn according to the actual proportion.
[0017] Figure 1 It is a part structure schematic view of the test equipment provided by the embodiment of the utility model,
[0018] Figure 2 It is a part structure schematic view of the test equipment provided by the embodiment of the utility model, Figure 1 ;
[0019] Figure 3 It is a part structure schematic view of the test equipment provided by the embodiment of the utility model, Figure 2 ;
[0020] Figure 4 It is a part structure schematic view of the test equipment provided by the embodiment of the utility model,
[0021] Figure 5 It is a part structure schematic view of the test equipment provided by the embodiment of the utility model, Figure 3 ;
[0022] Figure 6 is a schematic view of a second fluid passage of the test equipment provided by the embodiment of the present application;
[0023] Figure 7 is a schematic view of the overall structure of the test equipment provided by the embodiment of the present application.
[0024] Explanation of reference signs:
[0025] 100 test equipment;
[0026] 1 housing, 11 first cavity, 12 first air inlet, 13 first air outlet, 14 socket, 15 through hole, 16 first screw part, 17 second screw part, 18 first fluid passage, 19 second fluid passage;
[0027] 2 flow guide, 21 second cavity, 22 third cavity, 23 through hole, 24 second air inlet, 25 second air outlet;
[0028] 31 test plate, 311 first surface, 312 second surface, 32 first socket, 33 second socket;
[0029] 4 centrifugal fan;
[0030] 5 temperature control member;
[0031] 6 heat conduction member, 61 heat conduction sheet;
[0032] X first direction, Y second direction, Z third direction. DETAILED DESCRIPTION
[0033] In order to facilitate the understanding of the present application, the present application will be described in more detail below in combination with the drawings and specific embodiments. It should be noted that when an element is described as "fixed to" another element, it can be directly on the other element or one or more intervening elements can be present therebetween. When an element is described as "connected to" another element, it can be directly connected to the other element or one or more intervening elements can be present therebetween. The terms "upper", "lower", "inner", "outer", "vertical", "horizontal" and the like used in the present specification indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the purpose of facilitating the description of the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application. In addition, the terms "first", "second" and the like are only for the purpose of description and cannot be understood as indicating or implying relative importance.
[0034] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. All publications, patent applications, patents, and other references mentioned herein are incorporated by reference in their entirety for the teachings relevant to the sentence and / or paragraph in which the reference is presented.
[0035] Chip aging test refers to a test for evaluating the durability and reliability of a chip by simulating high and low temperature conditions to test the chip in a chip aging test device. Such a test helps to detect the quality of the chip in the early research and development stage, predict the performance of the chip in the long-term use process, and identify and solve the failure problems in time.
[0036] In a chip aging test device, a test cavity is usually provided, and a plurality of chips are usually placed in the test cavity for synchronous testing. At present, the structure of the test cavity is usually that one side of the test cavity is an air inlet, the opposite side of the test cavity is an air outlet, and the air inlet, the test cavity and the air outlet are sequentially communicated to form an air flow passage, which is used for hot air or cold air to flow through the chip to control the temperature rise and fall of the chip. However, for the air flow passage with the above structure, when the hot air or the cold air enters the air flow passage, there is a temperature field difference from the air inlet to the air outlet, for example, when the hot air enters the air flow passage, there is a temperature field decrease from the air inlet to the air outlet, so that the farther the test position from the air inlet, the lower the temperature, and thus the farther the chip from the air inlet, the less the chip is heated, thereby causing the test data of the chips different from the air inlet to have a large difference, resulting in a reduction in the test accuracy.
[0037] In view of this, the utility model provides an embodiment of a test device 100, which has a first air inlet 12, a second air inlet 24, a second cavity 21, a plurality of through holes 23, a third cavity 22, a second air outlet 25 and a first air outlet 13 sequentially communicated to form a first fluid passage 18, and the third cavity 22 is used for placing the measured objects. When the airflow flows along the first fluid passage 18, the plurality of through holes 23 increase the flow rate of the airflow flowing through the second cavity 21 and drive the airflow to be sprayed synchronously towards the third cavity 22, so as to reduce the temperature difference between different test positions of the third cavity 22, and thus reduce the test data difference of the measured objects placed at different test positions of the third cavity 22, thereby improving the test accuracy.
[0038] In order to facilitate the reader to understand the concept of the embodiment of the utility model, the specific structure of the test device 100 is described as follows:
[0039] For the above-mentioned test device 100, please refer to Figures 1 to 4The testing device 100 comprises a housing 1 and a flow guide 2. The housing 1 is provided with a first cavity 11, a first air inlet 12 and a first air outlet 13. The first air inlet 12 and the first air outlet 13 are respectively communicated with opposite sides of the first cavity 11. The flow guide 2 is arranged in the first cavity 11. The flow guide 2 is provided with a second cavity 21, a third cavity 22, a plurality of through holes 23, a second air inlet 24 and a second air outlet 25. The second cavity 21 and the third cavity 22 are aligned along a first direction X. The plurality of through holes 23 are arranged between the second cavity 21 and the third cavity 22. The plurality of through holes 23 communicate the second cavity 21 and the third cavity 22. The second air inlet 24 is at least partially aligned with the first air inlet 12 along a second direction Y. The second air inlet 24 communicates the first air inlet 12 and the second cavity 21. The second air outlet 25 is at least partially aligned with the first air outlet 13 along the second direction Y. The second air outlet 25 communicates the first air outlet 13 and the third cavity 22. The first direction X is perpendicular to the second direction Y. The first air inlet 12, the second air inlet 24, the second cavity 21, the plurality of through holes 23, the third cavity 22, the second air outlet 25 and the first air outlet 13 are sequentially communicated and form a first fluid channel 18. The first fluid channel 18 is used for airflow. The plurality of through holes 23 are used for increasing the flow rate of the airflow flowing through the second cavity 21 and driving the airflow to be synchronously sprayed towards the third cavity 22. The third cavity 22 is used for placing the measured object.
[0040] Specifically, the first air inlet 12 and the first air outlet 13 are both composed of a plurality of penetrating holes arranged in an array. The second air inlet 24 and the second air outlet 25 are both open. The plurality of through holes 23 are uniformly spaced and arranged in an array. The plurality of through holes 23 extend along the first direction X. The sum of the volumes of the plurality of through holes 23 is less than the volume of the second cavity 21. When the airflow flows from the second cavity 21 to the third cavity 22 through the plurality of through holes 23, according to the principle of fluid dynamics, the volume decreases and the pressure increases when the airflow flows through the plurality of through holes 23, so the flow rate increases. Moreover, the plurality of through holes 23 extend along the first direction X, which changes the direction of the airflow. Therefore, the airflow is accelerated and directed to be sprayed from the second cavity 21 towards the third cavity 22, so as to reduce the temperature difference at any position of the third cavity 22.
[0041] It should be noted that the airflow flowing through the flow guide 2 includes hot airflow and cold airflow. Therefore, in order to reduce the temperature loss of the airflow flowing through the flow guide 2, the material of the flow guide 2 needs to meet the requirements of high-low temperature cycle, low thermal expansion coefficient and good temperature resistance.
[0042] For the testing device 100 described above, please refer to Figures 1 to 3 along the first direction X. The housing 1 is provided with a socket 14 communicated with the first cavity 11. The flow guide 2 is inserted into the socket 14.
[0043] Specifically, along the third direction Z, the flow guide 2 has a first width, the socket 14 has a second width, the first width is equal to the second width, so that when the flow guide 2 is inserted into the socket 14, the side wall of the flow guide 2 along the third direction Z abuts and clamps with the side wall of the socket 14 along the third direction Z, wherein the third direction Z is perpendicular to the second direction Y and the first direction X respectively. Alternatively, along the second direction Y, the flow guide 2 has a first length, the socket 14 has a second length, the first length is equal to the second length, so that when the flow guide 2 is inserted into the socket 14, the side wall of the flow guide 2 along the second direction Y abuts and clamps with the side wall of the socket 14 along the second direction Y. In the above manner, the flow guide 2 can be conveniently disassembled and assembled.
[0044] For the test device 100 described above, refer to Figure 2 and Figure 3 , the test device 100 includes a test plate 31, a first socket 32 and a second socket 33, the test plate 31 is arranged in the first cavity 11, the test plate 31 separates the third cavity 22 and the first cavity 11, the test plate 31 is provided with opposite first and second surfaces 311 and 312, the first socket 32 is arranged on the first surface 311, the first socket 32 extends into the third cavity 22, and the first socket 32 is used for inserting the measured object. The second socket 33 is arranged on the second surface 312, the second socket 33 is electrically connected with the first socket 32, and the second socket 33 is used for inserting the circuit board. In the above manner, when the airflow is sprayed from the second cavity 21 to the third cavity 22, the airflow can be uniformly sprayed to the surface of the first socket 32, so that the measured object inserted into any position of the first socket 32 is uniformly heated, the difference in heating of the measured object inserted into different positions of the first socket 32 is reduced, and the difference in test data of the measured object inserted into different positions of the first socket 32 is further reduced, thereby improving the test accuracy.
[0045] For the shell 1 described above, refer to Figure 3 , along the first direction X, the shell 1 is provided with a through port 15 communicating with the first cavity 11, the through port 15 is aligned with the second socket 33, and the through port 15 is used for the circuit board to extend into the first cavity 11 and connect with the second socket 33.
[0046] In some embodiments, the shell 1 is provided with opposite first and second screwing parts 16 and 17; the test device 100 includes first and second screwing parts and a circuit board, the first screwing part is screwed through the circuit board and screwed to the first screwing part 16, the second screwing part is screwed through the circuit board and screwed to the second screwing part 17, and the circuit board is partially inserted into the through port 15 and extends into the first cavity 11 to be inserted into the second socket 33 to be in conduction. In the above manner, when the circuit board is connected with the external power supply, the measured object is powered through the circuit board. Alternatively, the running status and test data of the measured object are obtained through the circuit board.
[0047] For the shell 1 described above, refer toFigure 4 and Figure 6 The shell 1 is provided with a second fluid passage 19, one end of the second fluid passage 19 is communicated with one end of the first fluid passage 18, the other end of the second fluid passage 19 is communicated with the other end of the first fluid passage 18, and the second fluid passage 19 is used to place a fan.
[0048] In some embodiments, the test device 100 comprises a centrifugal fan 4, the centrifugal fan 4 is arranged in the second fluid passage 19, and the centrifugal fan 4 is used to form an air flow and drive the air flow to circulate along the first fluid passage 18 and the second fluid passage 19. In the above manner, the circulation of the air flow can be realized.
[0049] For the above-mentioned test device 100, please refer to Figure 7 The test device 100 comprises a cover body, the cover body is fixed to the shell 1, and the cover body is used to cover the first fluid passage 18 and the second fluid passage 19.
[0050] For the above-mentioned test device 100, please refer to Figure 5 The test device 100 comprises a temperature control piece 5, the temperature control piece 5 is fixed to the shell 1, and the temperature control piece 5 is used to control the temperature of the second fluid passage 19.
[0051] In some embodiments, the temperature control piece 5 is a semiconductor refrigerating sheet, the semiconductor refrigerating sheet is provided with opposite third and fourth surfaces, the third surface abuts against the outer wall of the second fluid passage 19, and the semiconductor refrigerating sheet is used to control the temperature of the second fluid passage 19.
[0052] It should be noted that the principle of controlling the temperature of the semiconductor refrigerating sheet is that one of the third and fourth surfaces generates heat and the other one generates cold after the semiconductor refrigerating sheet is powered on, and the temperature difference between the two surfaces is stable at 60℃. In the present application, when the power is connected to the semiconductor refrigerating sheet, the third surface of the semiconductor refrigerating sheet generates cold and the fourth surface generates heat, so as to realize the temperature reduction of the second fluid passage 19; when the power is reversed, the third surface of the semiconductor refrigerating sheet generates heat and the fourth surface generates cold, so as to realize the temperature increase of the second fluid passage 19.
[0053] It should be further noted that the semiconductor refrigerating sheet is a prior art, and therefore, in the present application, the detailed structure of the semiconductor refrigerating sheet will not be described one by one, for example, in the present application, the semiconductor refrigerating sheet can adopt a semiconductor refrigerating sheet with a model number of TEC1-12706, TEC1-12708 or TEC1-12710.
[0054] For the above-mentioned test device 100, please refer to Figure 5The test device 100 comprises a heat conduction member 6 fixed to the second fluid channel 19, the heat conduction member 6 is arranged apart from the centrifugal fan 4, the heat conduction member 6 is close to the first air inlet 12, the centrifugal fan 4 is close to the first air outlet 13, and the heat conduction member 6 is used to improve the heat transfer speed of the temperature control member 5 to the second fluid channel 19.
[0055] Specifically, one side of the heat conduction member 6 at least partially penetrates the second fluid channel 19 and abuts against the temperature control member 5, and the other side of the heat conduction member 6 is provided with a plurality of heat conduction fins 61 uniformly spaced. Through the above-mentioned mode, when the temperature control member controls the second fluid channel 19 to be heated, the heat conduction member 6 receives heat from the temperature control member through one side and quickly dissipates the heat to the second fluid channel 19 through the other side, so that when the centrifugal fan 4 drives the airflow to flow through the second fluid channel 19, a hot airflow is formed; when the temperature control member controls the second fluid channel 19 to be cooled, the heat conduction member 6 receives cold from the temperature control member through one side and quickly dissipates the cold to the second fluid channel 19 through the other side, so that when the centrifugal fan 4 drives the airflow to flow through the second fluid channel 19, a cold airflow is formed.
[0056] In order to facilitate the reader to understand the concept of the embodiment of the utility model, the specific working process of the test device 100 is described as follows:
[0057] First, open the cover of the test device 100, then insert the measured object into the first socket 32, then insert the flow guide member 2 into the socket 14 until the flow guide member 2 abuts against the test plate 31, then close the cover of the test device 100, and finally start the external power supply to power the measured object, start the temperature control member 5 to control the second fluid channel 19 to be heated or cooled, start the centrifugal fan 4 to drive the airflow to flow through the second fluid channel 19 to form a hot airflow or a cold airflow, and drive the airflow to circulate along the second fluid channel 19 and the first fluid channel 18, so as to simulate the aging test process of the measured object.
[0058] In some embodiments, the measured object is a chip. It can be understood that the measured object includes but is not limited to a chip, for example, in other embodiments, the measured object is an electronic component or a semiconductor component, etc.
[0059] The above-mentioned is only the embodiment of the utility model, and does not limit the patent range of the utility model, and any equivalent structure or equivalent process transformation using the contents of the utility model specification and drawings, or direct or indirect application in other related technical fields, are also included in the patent protection range of the utility model.
Claims
1. A testing device, characterized in that, include: The housing is provided with a first cavity, a first air inlet and a first air outlet, wherein the first air inlet and the first air outlet are respectively connected to opposite sides of the first cavity; A flow guide is disposed in the first cavity. The flow guide includes a second cavity, a third cavity, several through holes, a second air inlet, and a second air outlet. The second cavity and the third cavity are aligned along a first direction. The several through holes are disposed between the second cavity and the third cavity, connecting the second cavity and the third cavity. The second air inlet and the first air inlet are at least partially aligned along a second direction, connecting the first air inlet and the second cavity. The second air outlet and the first air outlet are at least partially aligned along a second direction, connecting the first air outlet and the third cavity. The first direction is perpendicular to the second direction. The first air inlet, the second air inlet, the second cavity, several through holes, the third cavity, the second air outlet, and the first air outlet are sequentially connected to form a first fluid channel. The first fluid channel is used to supply airflow. The several through holes are used to increase the flow rate of the airflow through the second cavity and drive the airflow to be sprayed synchronously toward the third cavity. The third cavity is used to place the object to be tested.
2. The testing equipment according to claim 1, characterized in that, Along the first direction, the housing is provided with a port that communicates with the first cavity, and the flow guide is inserted into the port.
3. The testing equipment according to claim 2, characterized in that, The testing equipment includes a test board, a first socket, and a second socket. The test board is disposed in the first cavity and separates the third cavity from the first cavity. The test board has a first surface and a second surface facing each other. The first socket is disposed on the first surface and extends into the third cavity. The first socket is used for inserting the object to be tested. The second socket is disposed on the second surface and is electrically connected to the first socket. The second socket is used for inserting a circuit board.
4. The testing equipment according to claim 3, characterized in that, Along the first direction, the housing is provided with a through-hole that communicates with the first cavity. The through-hole is aligned with the second socket and is used for a circuit board portion to extend into the first cavity and connect to the second socket.
5. The testing equipment according to claim 4, characterized in that, The housing is provided with a second threaded portion opposite to the first threaded portion; The testing equipment includes a first screw connector, a second screw connector, and a circuit board. The first screw connector passes through the circuit board and is screwed into the first screw portion. The second screw connector passes through the circuit board and is screwed into the second screw portion. The circuit board portion passes through the opening and extends into the first cavity to be plugged into and connected to the second socket.
6. The testing equipment according to claim 1, characterized in that, The housing is provided with a second fluid channel, one end of which is connected to one end of the first fluid channel, and the other end of which is connected to the other end of the first fluid channel. The second fluid channel is used to house the fan.
7. The testing equipment according to claim 6, characterized in that, The testing equipment includes a centrifugal fan, which is disposed in the second fluid channel. The centrifugal fan is used to generate airflow and drive the airflow to circulate along the first fluid channel and the second fluid channel.
8. The testing equipment according to claim 7, characterized in that, The testing equipment includes a temperature control element, which is fixed to the housing and is used to control the temperature of the second fluid channel.
9. The testing equipment according to claim 8, characterized in that, The testing equipment includes a heat-conducting component, which is fixed to the second fluid channel. The heat-conducting component is spaced apart from the centrifugal fan. The heat-conducting component is close to the first air inlet, and the centrifugal fan is close to the first air outlet. The heat-conducting component is used to improve the heat transfer speed of the temperature control component to the second fluid channel.
10. The testing equipment according to claim 9, characterized in that, One side of the heat-conducting element extends through the second fluid channel and abuts against the temperature control element, while the opposite side of the heat-conducting element is provided with a plurality of evenly spaced heat-conducting fins.