Automatic feeding and discharging device for semiconductor testing

Abstract

The utility model discloses an automatic feeding and discharging device for semiconductor testing, which comprises a workbench and supporting frames, the supporting frames are symmetrically arranged at the top end of the workbench, a discharging conveying belt is arranged in the workbench, a feeding conveying belt is arranged at the top end of the workbench between the two groups of supporting frames, and a discharging conveying belt is arranged in the feeding conveying belt. A movable frame is slidably mounted at the top ends of the supporting frames, a first motor is mounted on the side walls of one set of supporting frames, a first threaded rod is mounted at the output end of the first motor and movably connected with the set of supporting frames, and the surface of the first threaded rod is sleeved with a first threaded sleeve; and the first threaded sleeve is in threaded connection with the first threaded rod. According to the utility model, the semiconductors can be conveniently centered, straightened and input and can be conveniently and sequentially input in a circumferential rotation manner for testing, so that the semiconductors can be conveniently lifted, moved and loaded and can be rapidly output and discharged, and the convenience of loading and unloading the semiconductors is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to a feeding and discharging device technical field, concretely is a kind of automatic feeding and discharging device for semiconductor testing. BACKGROUND

[0002] Semiconductor testing is a technology in semiconductor equipment, which mainly reflects the failure of semiconductor components when assembled into a system. Semiconductor testing is actually a technology in semiconductor equipment, which mainly reflects the failure of semiconductor components when assembled into a system. Through this process, it can ensure that the production of chips meets the required yield, reduce cost waste, provide effective test data, improve design and manufacturing, and ensure that the chip meets the requirements. The traditional semiconductor testing method is to manually pick up the semiconductor for testing, which has low testing efficiency. In order to better test the semiconductor, an automatic feeding and discharging device for semiconductor testing is proposed.

[0003] As disclosed in the authorized announcement No. CN211785946U, a kind of automatic feeding and discharging semiconductor testing equipment, including test box, it is at least provided with one top opening test cavity, test cavity is equipped with test board, the top of test cavity is equipped with upper cover, up and down material mechanical hand, it includes mechanical hand and drive mechanism for driving mechanical hand to move along the set direction, mechanical hand is located above test box;

[0004] Although the semiconductor testing equipment of the present application realizes automatic installation and disassembly of semiconductor chips during semiconductor chip testing process, realizes automatic testing of semiconductor chips, and the up and down material mechanical hand is integrated on the test box, which is compact in structure, small in floor area and space-saving. The up and down material mechanical hand drives the mechanical hand to move along the set direction through the drive mechanism, which can accurately grasp and install semiconductor chips. At the same time, the test board does not need to be plugged in and out during semiconductor testing of semiconductor chips, which improves the service life of the test board.

[0005] However, it does not solve the problem that the existing feeding and discharging device is not convenient to center and align the input semiconductor and convenient to rotate in circle to input semiconductor for testing, which is not conducive to lifting and moving the semiconductor for feeding and quickly outputting the semiconductor for discharging, affecting the convenience of semiconductor feeding and discharging. UTILITY MODEL CONTENTS

[0006] The purpose of this invention is to provide an automatic loading and unloading device for semiconductor testing, in order to solve the problems mentioned in the background art, such as the inconvenience of loading and unloading devices in aligning and aligning input semiconductors and in circumferential rotation for sequential input of semiconductors for testing, the difficulty in lifting and moving semiconductors for loading and unloading semiconductors, and the impact on the convenience of loading and unloading semiconductors.

[0007] To achieve the above objectives, this utility model provides the following technical solution: an automatic loading and unloading device for semiconductor testing, comprising a worktable and support frames. Support frames are symmetrically mounted on the top of the worktable. A loading conveyor belt is installed inside the worktable, and a loading conveyor belt is installed on the top of the worktable between two sets of support frames. A movable frame is slidably mounted on the top of each support frame. A first motor is mounted on the side wall of one set of support frames. A first threaded rod is mounted on the output end of the first motor and is movably connected to the set of support frames. A first threaded rod is fitted onto the surface of the first threaded rod. A threaded sleeve is provided, and a first threaded sleeve is threadedly connected to a first threaded rod. The first threaded sleeve is also connected to a movable frame. A support frame is installed on the side wall of the movable frame, and an L-shaped frame is slidably installed on the side wall of the support frame. A second threaded sleeve is installed inside the L-shaped frame. A movable tube is installed at the bottom end of the L-shaped frame, and a suction cup is installed at the bottom end of the movable tube. A second motor is installed at the top end of the support frame, and a second threaded rod is installed at the output end of the second motor. The second threaded rod extends through the second threaded sleeve into the interior of the movable tube, and the second threaded rod is threadedly connected to the second threaded sleeve.

[0008] Preferably, the outer wall of the feeding conveyor belt is symmetrically equipped with bearing blocks, and each bearing block is movably equipped with a rotating rod on its side wall.

[0009] Preferably, a leveling plate is installed at the top of each rotating rod, and the leveling plate is fixedly connected to the rotating rod.

[0010] Preferably, a connecting rod is provided below the feeding conveyor belt, and both ends of the connecting rod are equipped with hinge shafts.

[0011] Preferably, each of the rotating rods has a connecting arm installed at its bottom end, and the connecting arm is movably connected to the connecting rod via a hinge shaft.

[0012] Preferably, a drive motor is installed at the bottom of the worktable, and the drive motor is fixedly connected to the worktable.

[0013] Preferably, a pulley assembly is installed at the output end of the drive motor, and a movable shaft is movably installed inside the worktable on one side of the drive motor, with the pulley assembly extending to the surface of the movable shaft.

[0014] Preferably, the top end of the movable shaft is provided with a rotating disc, and the top end of the rotating disc is provided with a plurality of groups of test boxes with equal intervals.

[0015] Compared with the prior art, the feeding and discharging device has the advantages that: the feeding and discharging device not only realizes convenient centering and alignment of input semiconductors and convenient circumferential rotation of the input semiconductors for testing, facilitates lifting and moving of the semiconductors for feeding and rapid output of the semiconductors for discharging, but also improves the convenience of feeding and discharging of the semiconductors.

[0016] (1) The semiconductors to be tested are placed on the feeding conveyor belt in sequence, and the semiconductors are moved by the feeding conveyor belt. In the moving process, the semiconductors collide with the alignment plates, the alignment plates drive the rotating rods to rotate, the rotating rods drive the connecting arms to rotate about the hinge shafts under the support of the connecting rods, and the semiconductors are aligned in the middle of the feeding conveyor belt under the elastic action of the springs on the surfaces of the rotating rods. Then the semiconductors are continuously moved by the feeding conveyor belt, and when the semiconductors move to the suction cup position, the second motor drives the second threaded rod to rotate, the second threaded rod drives the L-shaped frame to move downward through the second threaded sleeve, the L-shaped frame drives the suction cup to move downward, so that the suction cup contacts the semiconductors and adsorbs the semiconductors. Then the second motor is reversely turned on, the second motor drives the semiconductors to move upward through the moving pipe and the suction cup, then the first motor is turned on, the first motor drives the first threaded rod to rotate, the first threaded sleeve drives the moving frame to move, the moving frame drives the carrier frame, the moving pipe, the suction cup and the semiconductors to move, and the semiconductors are placed on the surface of the test box after moving above the test box, so that the feeding work of the semiconductors is completed, and the input semiconductors are conveniently centered and aligned, which facilitates lifting and moving of the semiconductors for feeding.

[0017] (2) When a group of semiconductors are fed, the driving motor drives the pulley assembly to move, the pulley assembly drives the movable shaft to rotate, the movable shaft drives the rotating disc and the test boxes to rotate, so that the semiconductors are rotated to the test position, and the testing work of the semiconductors is completed. The tested semiconductors are returned to the original position under the rotating action of the rotating disc, and the above operation is repeated again. The semiconductors are adsorbed by the suction cup and moved to the surface of the discharging conveyor belt, and the semiconductors are output by the discharging conveyor belt, so that the discharging work of the semiconductors is completed. The semiconductors are conveniently circumferentially rotated for testing, which facilitates rapid output of the semiconductors for discharging, and improves the convenience of feeding and discharging of the semiconductors. BRIEF DESCRIPTION OF DRAWINGS

[0018] Figure 1 It is a three-dimensional structure schematic view of the utility model;

[0019] Figure 2The three-dimensional structure schematic diagram of the test box of the utility model is shown in the figure.

[0020] Figure 3 The front view structure schematic diagram of the utility model is shown in the figure.

[0021] Figure 4 The front view sectional structure schematic diagram of the moving pipe of the utility model is shown in the figure.

[0022] Figure 5 The three-dimensional structure schematic diagram of the righting plate of the utility model is shown in the figure.

[0023] Figure 6 The three-dimensional structure schematic diagram of the rotating disc of the utility model is shown in the figure.

[0024] In the figure: 1, workbench; 2, rotating disc; 3, test box; 4, support frame; 5, moving frame; 6, bearing frame; 7, righting plate; 8, feeding conveyor belt; 9, discharging conveyor belt; 10, first motor; 11, first threaded rod; 12, first threaded sleeve; 13, second motor; 14, moving pipe; 15, suction cup; 16, second threaded sleeve; 17, L-shaped frame; 18, second threaded rod; 19, rotating rod; 20, bearing block; 21, connecting rod; 22, hinged shaft; 23, connecting arm; 24, movable shaft; 25, driving motor; 26, pulley assembly. DETAILED DESCRIPTION

[0025] In order to further illustrate the technical means and effects adopted by the utility model to achieve the predetermined utility model purposes, the specific embodiments, structures, features and effects according to the utility model are described in detail as follows in combination with the preferred embodiments and the drawings.

[0026] Please refer to Figures 1-6The utility model provides an embodiment: a kind of automatic feeding and discharging device for semiconductor test, including workbench 1 and support frame 4, the top of workbench 1 is symmetrically equipped with support frame 4, the inside of workbench 1 is provided with discharging conveyor belt 9, and the top of workbench 1 between two groups of support frame 4 is equipped with feeding conveyor belt 8, the top of support frame 4 is slidably installed with moving frame 5, and the side wall of a group of support frame 4 is equipped with first motor 10, first motor 10 plays the role of power drive, the output of first motor 10 is equipped with first threaded rod 11, and first threaded rod 11 is movably connected with the group of support frame 4, the surface of first threaded rod 11 is equipped with first threaded sleeve 12, and first threaded sleeve 12 is screw connected with first threaded rod 11, and first threaded sleeve 12 is connected with moving frame 5, the side wall of moving frame 5 is equipped with bearing frame 6, the side wall of bearing frame 6 is slidably installed with L type frame 17, the inside of L type frame 17 is equipped with second threaded sleeve 16, the bottom of L type frame 17 is equipped with moving pipe 14, the bottom of moving pipe 14 is equipped with suction disc 15, the top of bearing frame 6 is equipped with second motor 13, second motor 13 plays the role of power drive, the output of second motor 13 is equipped with second threaded rod 18, and second threaded rod 18 extends to the inside of moving pipe 14 and is penetrated through second threaded sleeve 16, and second threaded rod 18 is screw connected with second threaded sleeve 16;

[0027] The semiconductor to be tested is placed on the feeding conveying belt 8 in turn, the feeding conveying belt 8 is opened, and the semiconductor is moved by the feeding conveying belt 8. During the movement of the semiconductor, the semiconductor collides with the alignment plate 7, the rotating rod 19 is rotated by the alignment plate 7, the connecting arm 23 is rotated by the rotating rod 19 under the support of the connecting rod 21, the alignment plate 7 is rebounded by the elastic force of the spring on the surface of the rotating rod 19, so that the semiconductor is aligned in the middle position of the feeding conveying belt 8 under the joint action of the two sets of alignment plates 7, and then the semiconductor is continuously moved by the feeding conveying belt 8. When the semiconductor moves to the position of the suction cup 15, the second motor 13 is opened, the second screw rod 18 is rotated by the second motor 13, the L-shaped frame 17 is moved downward by the second screw rod 18 through the second threaded sleeve 16 under the threaded connection of the second screw rod 18 and the second threaded sleeve 16 and the sliding cooperation of the L-shaped frame 17 and the bearing frame 6, the suction cup 15 is moved downward by the L-shaped frame 17, so that the suction cup 15 contacts the semiconductor and adsorbs the semiconductor, then the second motor 13 is opened in reverse, the semiconductor is moved upward by the second motor 13 through the moving pipe 14 and the suction cup 15, then the first motor 10 is opened, the first screw rod 11 is rotated by the first motor 10, the moving frame 5 is moved by the first threaded sleeve 12 under the threaded connection of the first screw rod 11 and the first threaded sleeve 12 and the sliding cooperation of the moving frame 5 and the support frame 4, the bearing frame 6, the moving pipe 14, the suction cup 15 and the semiconductor are moved by the moving frame 5, and then the semiconductor is placed on the surface of the test box 3, so as to complete the feeding work of the semiconductor, realize the convenient alignment and input of the semiconductor, and facilitate the lifting and movement of the semiconductor for feeding;

[0028] The outer wall of the feeding conveying belt 8 is symmetrically provided with a bearing block 20, and the side wall of the bearing block 20 is movably provided with a rotating rod 19;

[0029] The top end of the rotating rod 19 is provided with an alignment plate 7, and the alignment plate 7 is fixedly connected with the rotating rod 19;

[0030] The lower portion of the feeding conveying belt 8 is provided with a connecting rod 21, and the two ends of the connecting rod 21 are provided with a hinge shaft 22;

[0031] The bottom end of the rotating rod 19 is provided with a connecting arm 23, and the connecting arm 23 is movably connected with the connecting rod 21 through the hinge shaft 22. The bottom end of the workbench 1 is provided with a driving motor 25, which plays a role of power driving, and the driving motor 25 is fixedly connected with the workbench 1;

[0032] The output end of the driving motor 25 is provided with a belt pulley assembly 26, the inside of the workbench 1 on one side of the driving motor 25 is movably provided with a movable shaft 24, the belt pulley assembly 26 extends to the surface of the movable shaft 24, the top end of the movable shaft 24 is provided with a rotating disc 2, and the top end of the rotating disc 2 is provided with a plurality of groups of test boxes 3 at equal intervals;

[0033] When a group of semiconductor feeding is completed, the driving motor 25 is opened, the belt pulley assembly 26 is moved by the driving motor 25, the movable shaft 24 is rotated by the belt pulley assembly 26, the rotating disc 2 and the test box 3 are rotated by the movable shaft 24, so as to drive the semiconductor to rotate, the semiconductor is rotated to the test position, the test work of the semiconductor is completed, the tested semiconductor is returned to the original position under the rotating action of the rotating disc 2, and then the above operation is repeated, the semiconductor is adsorbed and moved to the surface of the discharging conveying belt 9 by the suction cup 15, the discharging conveying belt 9 is opened, the semiconductor is output by the discharging conveying belt 9, the discharging work of the semiconductor is completed, the convenient circumferential rotation is realized, the semiconductor is sequentially input for testing, the semiconductor is conveniently and quickly output and discharged, and the convenience of the semiconductor feeding and discharging is improved.

[0034] Working principle: the semiconductor to be tested is placed on the feeding conveying belt 8 in turn, the feeding conveying belt 8 is opened, the semiconductor is moved by the feeding conveying belt 8, the semiconductor collides with the righting plate 7 in the moving process, the righting plate 7 drives the rotating rod 19 to rotate, under the support of the connecting rod 21, the connecting arm 23 is driven to rotate by the rotating rod 19 with the hinged shaft 22 as the axis, under the elastic action of the spring on the surface of the rotating rod 19, the righting plate 7 is driven to rebound, so that the semiconductor is righted in the middle position of the feeding conveying belt 8 under the joint action of the two groups of righting plates 7, then the semiconductor is continuously moved by the feeding conveying belt 8, when the semiconductor moves to the position of the suction cup 15, the second screw rod 18 is driven to rotate by the second motor 13, the L-shaped frame 17 is driven to move downward by the second screw rod 18 through the second screw sleeve 16, the suction cup 15 is driven to move downward by the L-shaped frame 17, so that the suction cup 15 contacts the semiconductor and adsorbs the semiconductor, then the second motor 13 is opened in reverse, the semiconductor is driven to move upward by the second motor 13 through the moving pipe 14 and the suction cup 15, then the first motor 10 is opened, the first screw rod 11 is driven to rotate by the first motor 10, the moving frame 5 is driven to move by the first screw sleeve 12, the semiconductor is driven to move by the moving frame 5, the moving pipe 14, the suction cup 15 and the semiconductor, moves above the test box 3, then the semiconductor is placed on the surface of the test box 3, the feeding work of the semiconductor is completed, when a group of semiconductor feeding is completed, the movable shaft 24 is driven to rotate by the belt pulley assembly 26 driven by the driving motor 25, the rotating disc 2 and the test box 3 are driven to rotate by the movable shaft 24, so that the semiconductor is driven to rotate to the test position, the test work of the semiconductor is completed, the tested semiconductor returns to the original position under the rotating action of the rotating disc 2, then the above operation is repeated again, the semiconductor is adsorbed by the suction cup 15 and moved to the surface of the discharging conveying belt 9, the semiconductor is driven to output by the discharging conveying belt 9, the discharging work of the semiconductor is completed.

[0035] The above is only a preferred embodiment of the present application, and does not limit the present application in any form. Although the preferred embodiment of the present application has been disclosed as above, it is not intended to limit the present application. Any person skilled in the art can make some changes or modifications to the above disclosed technical content without departing from the technical solution range of the present application, and any equivalent embodiments with equivalent changes and modifications are still within the scope of the technical solution of the present application.

Claims

1. An automatic loading and unloading device for semiconductor testing, comprising a workbench (1) and a support frame (4), characterized in that: The top of the workbench (1) is symmetrically provided with support frames (4), the inside of the workbench (1) is provided with a feeding conveyor belt (9), the top of the workbench (1) between the two groups of support frames (4) is provided with a feeding conveyor belt (8), the top of the support frame (4) is slidably provided with a moving frame (5), the sidewall of one group of support frames (4) is provided with a first motor (10), the output end of the first motor (10) is provided with a first threaded rod (11), the first threaded rod (11) is movably connected with the group of support frames (4), the surface of the first threaded rod (11) is provided with a first threaded sleeve (12), the first threaded sleeve (12) is threadedly connected with the first threaded rod (11), and the first threaded sleeve (12) is connected with the moving frame (5), the sidewall of the moving frame (5) is provided with a bearing frame (6), the sidewall of the bearing frame (6) is slidably provided with an L-shaped frame (17), the inside of the L-shaped frame (17) is provided with a second threaded sleeve (16), the bottom end of the L-shaped frame (17) is provided with a moving pipe (14), the bottom end of the moving pipe (14) is provided with a suction disc (15), the top of the bearing frame (6) is provided with a second motor (13), the output end of the second motor (13) is provided with a second threaded rod (18), the second threaded rod (18) extends through the second threaded sleeve (16) to the inside of the moving pipe (14), and the second threaded rod (18) is threadedly connected with the second threaded sleeve (16).

2. The automatic loading and unloading device for semiconductor testing according to claim 1, characterized in that: The outer wall of the feeding conveyor belt (8) is symmetrically provided with a bearing block (20), and the sidewall of the bearing block (20) is movably provided with a rotating rod (19).

3. The automatic loading and unloading device for semiconductor testing according to claim 2, characterized in that: The top end of the rotating rod (19) is provided with a correcting plate (7), and the correcting plate (7) is fixedly connected with the rotating rod (19).

4. The automatic loading and unloading device for semiconductor testing according to claim 1, characterized in that: The lower side of the feeding conveyor belt (8) is provided with a connecting rod (21), and the two ends of the connecting rod (21) are provided with a hinged shaft (22).

5. The automatic loading and unloading device for semiconductor testing according to claim 2, characterized in that: The bottom end of the rotating rod (19) is provided with a connecting arm (23), and the connecting arm (23) is movably connected with the connecting rod (21) through the hinged shaft (22).

6. The automatic loading and unloading device for semiconductor testing according to claim 1, characterized in that: The bottom end of the workbench (1) is provided with a driving motor (25), and the driving motor (25) is fixedly connected with the workbench (1).

7. The automatic loading and unloading device for semiconductor testing according to claim 6, characterized in that: The output end of the driving motor (25) is provided with a pulley assembly (26), the inside of the workbench (1) on one side of the driving motor (25) is movably provided with a movable shaft (24), and the pulley assembly (26) extends to the surface of the movable shaft (24).

8. The automatic loading and unloading device for semiconductor testing according to claim 7, characterized in that: The top end of the movable shaft (24) is provided with a rotating disc (2), and the top end of the rotating disc (2) is provided with a plurality of groups of test boxes (3) at equal intervals.

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