Link mechanism ATE chip test fixture
By designing a linkage mechanism ATE chip test fixture, the entire process of chip delivery from loading to testing to storage is automated, solving the problems of low efficiency and unstable accuracy caused by manual operation in the existing technology, and improving testing efficiency and accuracy.
Patent Information
- Application Number
- CN202520239423.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-14
- Publication Date
- 2026-01-09
- Estimated Expiration
- 2035-02-14
AI Technical Summary
Existing ATE chip test fixtures rely on manual operation in the chip transport process, which leads to low efficiency and is prone to human error, affecting test accuracy and stability, and failing to meet the high-efficiency requirements of modern chip manufacturing companies.
An ATE chip testing fixture with a linkage mechanism was designed, comprising an automated conveying structure consisting of a feeder, a storage platform, a fixing component, a linkage, and a support component. The automated conveying of chips is achieved through racks, pinions, and transmission components, automating the entire process from feeder to testing and storage.
It enables efficient and automated chip delivery, improves testing efficiency, reduces human error, and ensures the accuracy and stability of testing.
Smart Images

Figure CN223784442U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of ATE chip testing technology, specifically a linkage mechanism ATE chip testing fixture. Background Technology
[0002] In the field of chip testing, ATE (Automatic Test Equipment) chip test fixtures play a crucial role in ensuring chip performance and quality. However, existing ATE chip test fixtures have certain limitations in the chip transport process.
[0003] Traditional chip delivery methods often rely heavily on manual operations. From chip delivery to testing and final storage, this process involves a lot of human intervention, which is not only inefficient but also prone to human error, affecting the accuracy and stability of testing. For example, improper manual delivery may lead to chip placement deviations, thus affecting test results. When storing tested chips, untimely or inaccurate manual sorting may also cause chip management chaos.
[0004] Furthermore, the lack of fixtures for efficient and automated transport processes makes it difficult to meet the needs of modern chip manufacturers for large-scale and high-efficiency production. As chip production continues to increase, traditional transport methods have become a bottleneck restricting the improvement of testing efficiency and cannot keep up with the pace of the rapidly developing chip industry. Utility Model Content
[0005] The purpose of this utility model is to provide a solution to the problems mentioned in the background art.
[0006] To achieve the above objectives, this utility model provides the following technical solution: a linkage mechanism ATE chip test fixture, comprising a fixture body and a test piece, wherein a bearing component is provided at the bottom end of the fixture body, and a fixing component is symmetrically fixed at the top end of the bearing component, wherein multiple connecting rods are rotatably connected to the inner side of the fixing component, and a support component is rotatably connected to the other end of the connecting rod;
[0007] The test piece has a telescopic connector fixed to its back, a rack assembly on its back, a positioning control assembly on its left side, a gear rotatably connected to the back of the fixture body, a transmission assembly on the back of the gear, and a pulley rotatably connected to the front surface of the fixing piece.
[0008] Preferably, the supporting component includes a base, which is fixed to the bottom end of the fixture body. A feeding platform is provided on the right side of the base, and a storage platform is provided on the left side of the base.
[0009] Preferably, the base, the delivery platform, and the storage platform are all provided with grooves below the supporting member.
[0010] Preferably, the rack assembly includes a rack, which is fixed to the back of the connector, and a sliding control is fixed to the left side of the rack.
[0011] Preferably, the positioning component includes a positioning rail, which is fixed to the left side of the back of the fixture body. A swinging member is rotatably connected inside the positioning rail via a pin, and a torsion spring is sleeved at the pin of the swinging member.
[0012] Preferably, one end of the torsion spring is connected to the inner wall of the control rail, and the other end of the torsion spring is connected to the swing member.
[0013] Preferably, the transmission assembly includes a transmission wheel, which is fixed at the center of the back of the gear. A first transmission member is provided at the center of the back of the fixing member, and the first transmission member is connected to a pin at the center of the back of the fixing member. A second transmission member is rotatably provided below the first transmission member.
[0014] Preferably, the back of the first transmission component and the rotating rod are both provided with belt grooves, and the transmission wheel is connected to the belt groove on the back of the first transmission component by a belt. The two ends of the second transmission component are symmetrically provided with belt grooves. The belt groove on the back of the second transmission component is connected to the belt groove at the rotating rod of the first transmission component by a belt. The belt groove on the front surface of the second transmission component is connected to the pulley by a belt.
[0015] Compared with the prior art, the beneficial effects of this utility model are: efficient chip transportation. By setting up a feeding platform, a storage platform, and a transportation structure composed of fixing parts, connecting rods, and supporting parts, the automated transportation process of chips from feeding to testing and then to storage is realized, thereby improving testing efficiency. Attached Figure Description
[0016] Figure 1 This is a detailed schematic diagram of the three-dimensional connection structure of this utility model;
[0017] Figure 2 for Figure 1 A frontal view of the detailed connection structure;
[0018] Figure 3 for Figure 1 A detailed schematic diagram of the rear cross-sectional connection structure;
[0019] Figure 4 for Figure 1 A top-view schematic diagram showing the detailed connection structure;
[0020] Figure 5 for Figure 1 Detailed schematic diagram of the connection structure in the right-side cross-section;
[0021] Figure 6 for Figure 1 Detailed schematic diagram of the connection structure in the right-side cross-section;
[0022] Figure 7 for Figure 1 A side view of the connection structure details of the middle component;
[0023] Figure 8 for Figure 1 A side-view cross-sectional schematic diagram showing the connection structure of the middle component;
[0024] Figure 9 for Figure 1 A top-view diagram showing the detailed connection structure of the middle component;
[0025] Figure 10 for Figure 1 A detailed schematic diagram of the split connection structure of the middle component;
[0026] Figure 11 for Figure 5 A detailed schematic diagram of the connection structure at point a.
[0027] In the diagram: 1. Fixture body; 2. Telescopic rod; 3. Test piece; 4. Base; 5. Feeding platform; 6. Storage platform; 7. Fixture; 8. Connecting rod; 9. Supporting component; 10. Connecting component; 11. Rack; 12. Sliding control; 13. Control rail; 14. Swinging component; 15. Torsion spring; 16. Gear; 17. Transmission wheel; 18. First transmission component; 19. Second transmission component; 20. Pulley. Detailed Implementation
[0028] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0029] Please see Figure 1-11 This utility model provides a technical solution: a linkage mechanism ATE chip test fixture, including fixture body 1 and test piece 3. Fixture body 1 is connected to test piece 3 through telescopic rod 2. At the same time, fixture body 1 can drive telescopic rod 2 to make test piece 3 move up and down.
[0030] The bottom of the fixture body 1 is provided with a support component, which includes a base 4. The top of the base 4 is used to place the chip so that the test piece 3 can be viewed from the side. At the same time, the recess at the top of the base can fix the chip. The base 4 is fixed to the bottom of the fixture body. A feeding platform 5 is provided on the right side of the base 4 for placing the chip to be tested. A storage platform 6 is provided on the left side of the base 4 for storing the chip that has been tested. The base 4, the feeding platform 5 and the storage platform 6 are all provided with grooves under the support member 9 so as not to hinder the normal operation of the support member 9.
[0031] The top of the load-bearing component is symmetrically fixed with a fixing member 7, which provides a rotation fulcrum for the connecting rod 8. Multiple connecting rods 8 are rotatably connected to the inner side of the fixing member 7. The connecting rod 8 can drive the support member under the rotation of the pin. The other end of the connecting rod 8 is rotatably connected to the support member 9, which carries the chip and transports the chip under the movement of the support member 9.
[0032] A telescopic connector 10 is fixed to the back of the test piece 3 to connect the test piece 3 and the rack 11. When the test piece 3 moves up and down, it can drive the rack to move up and down. At the same time, it has a telescopic function and can also support the rack 11 to move back and forth. A rack assembly is provided on the back of the connector 10. The rack assembly includes a rack 11, which is fixed to the back of the connector 10. The rack 11 meshes with the gear 16. When the rack 11 moves from bottom to top, it can drive the gear 16 to rotate. A sliding control 12 is fixed to the left side of the rack 11. The sliding control 12 extends into the control rail 13. When the rack 11 moves up and down, it drives the sliding control 12 to move up and down. Due to the presence of the control rail 13, the sliding control 12 controls the rack 11 to move back and forth.
[0033] A control component is provided on the left side of the rack assembly. The control component includes a control rail 13, which is fixed to the left side of the back of the fixture body 1. When the rack 11 moves up and down, thereby driving the sliding control 12 to move inside the control rail 13, the control rail 13 can use its own trajectory to control the rack 11 to move back and forth. The inside of the control rail 13 is connected to a swing member 14 through a pin. The swing member 14 swings in one direction to prevent the sliding control 12 from sliding into the wrong track. A torsion spring 15 is sleeved at the pin of the swing member 14. After the swing member 14 is pushed by the sliding control 12, the torsion spring 15 can reset the swing member 14.
[0034] A gear 16 is rotatably connected to the back of the fixture body 1. The rotation of the gear 16 transmits the rotational force to the pin inside the fixing member 7 via a transmission assembly. This, in turn, controls the movement of the support member 9 via a connecting rod 8, thereby transporting the chip. A transmission assembly is provided on the back of the gear 16, including a transmission wheel 17. The transmission wheel 17 is fixed at the center of the back of the gear 16 and rotates synchronously with the gear 16. It is connected to the belt groove on the back of the first transmission member 18 via a belt, transmitting the rotational power of the gear 16. A first transmission member 18 is provided at the center of the back of the fixing member 7, and the first transmission member 18 is connected to the pin at the center of the back of the fixing member 7. It receives the power of the transmission wheel 17 via a belt and transmits it to the second transmission member 19 and the pin at the center of the fixing member 7. A rotating part is located below the first transmission member 18. The second transmission component 19 is provided. The belt groove on the back of the first transmission component 18 is connected to the belt groove at the rotating rod of the first transmission component 18 by a belt to receive power. The belt groove on the front surface is connected to the pulley by a belt to transmit power, so that the power can be transmitted to the pulley 20. The back and rotating rod of the first transmission component 18 are provided with belt grooves, and the transmission wheel 17 is connected to the belt groove on the back of the first transmission component 18 by a belt. The two ends of the second transmission component 19 are symmetrically provided with belt grooves. The belt groove on the back of the second transmission component 19 is connected to the belt groove at the rotating rod of the first transmission component 18 by a belt. The belt groove on the front surface of the second transmission component 19 is connected to the pulley 20 by a belt. The front surface of the fixing component 7 is rotatably connected to the pulley 20. Under the drive of the transmission assembly, it rotates and can transmit power to the pin at the center position of the fixing component 7 on the front surface.
[0035] Working principle: The operator places the chip to be tested on the feed table 5. The fixture body 1 does not drive the telescopic rod 2 to move. The test piece 3 is in the lower position. The support 9 is parallel to the fixing part 7 under the influence of gravity. The connecting rod is in a position perpendicular to the support 9 and the fixing part 7. The test piece 3 begins to move upward. Because the back of the test piece 3 is fixed with a telescopic connector 10, the upward movement of the test piece 3 drives the connector 10 to move upward synchronously. The rack 11 is fixed to the back of the connector 10, which in turn drives the rack 11 to move upward. The upward movement of the rack 11 drives the gear 16 to start rotating, thus starting the power transmission process.
[0036] A transmission wheel 17, fixed at the center of the back of gear 16, rotates synchronously with gear 16. The transmission wheel 17 is connected to the belt groove on the back of the first transmission component 18 via a belt, transmitting the rotational power of gear 16 to the first transmission component 18. The first transmission component 18 is connected to a pin at the center of the back of the fixed component 7. After receiving power from the transmission wheel 17, it transmits power to the second transmission component 19 via a belt, and also to the pin at the center of the fixed component 7. The belt groove on the back of the second transmission component 19 is connected to the belt groove at the rotating rod of the first transmission component 18 via a belt, receiving power from the first transmission component 18. The belt groove on its front surface is connected to the pulley 20 via a belt, transmitting power to the pulley 20. The pulley 20 rotates, transmitting power to the pin at the center of the front surface of the fixed component 7. Since the pin is fixed to the connecting rod 8, it rotates after receiving the rotational force transmitted by the transmission assembly, thereby driving the connecting rod 8 to rotate. The rotation of link 8 breaks its vertical-parallel state with support 9 and fixing 7, driving support 9, which is rotatably connected to it, to move. Under the movement of support 9, the chip at the top of the delivery table 5 is transported to the top of the base 4.
[0037] At this time, the test piece 3 can be controlled to descend to test the chip. When the test piece 3 descends, the rack 11 and the sliding control 12 will also descend together. At this time, the sliding control 12 slides inside the control rail 13, which will drive the rack 11 to move backward using the telescopic characteristics of the connector 10. At this time, the rack 11 will no longer mesh with the gear 16, so the descent of the test piece 3 can test the chip. After the test is completed, under the action of the control rail 13, the rack 11 and the gear 16 will mesh again. When the test piece 3 moves upward, it will cause the support 9 to move, so that the chip at the top of the delivery stage 5 can be transported to the top of the base 4 again. At the same time, the chip at the top of the base 4 will also be transported to the top of the storage stage 6.
[0038] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.
Claims
1. A linkage mechanism ATE chip testing fixture, comprising a fixture body (1) and a test piece (3), characterized in that, The bottom end of the fixture body (1) is provided with a bearing component, and the top end of the bearing component is symmetrically fixed with a fixing member (7). Multiple connecting rods (8) are rotatably connected to the inner side of the fixing member (7), and the other end of the connecting rod (8) is rotatably connected with a support member (9). The back of the test piece (3) is fixed with a telescopic connector (10), the back of the connector (10) is provided with a rack assembly, the left side of the rack assembly is provided with a control assembly, the back of the fixture body (1) is rotatably connected with a gear (16), the back of the gear (16) is provided with a transmission assembly, and the front surface of the fixing piece (7) is rotatably connected with a pulley (20).
2. The linkage mechanism ATE chip testing fixture according to claim 1, characterized in that, The supporting component includes a base (4), which is fixed to the bottom of the fixture body. A feeding platform (5) is provided on the right side of the base (4), and a storage platform (6) is provided on the left side of the base (4).
3. The linkage mechanism ATE chip testing fixture according to claim 2, characterized in that, The base (4), the delivery platform (5), and the storage platform (6) are all provided with grooves below the support (9).
4. The linkage mechanism ATE chip testing fixture according to claim 1, characterized in that, The rack assembly includes a rack (11) fixed to the back of the connector (10), and a sliding control (12) fixed to the left side of the rack (11).
5. The linkage mechanism ATE chip testing fixture according to claim 1, characterized in that, The control assembly includes a control rail (13), which is fixed on the left side of the back of the fixture body (1). The control rail (13) is rotatably connected to a swing member (14) through a pin, and a torsion spring (15) is sleeved at the pin of the swing member (14).
6. The linkage mechanism ATE chip testing fixture according to claim 5, characterized in that, One end of the torsion spring (15) is connected to the inner wall of the control rail (13), and the other end of the torsion spring (15) is connected to the swing member (14).
7. The linkage mechanism ATE chip testing fixture according to claim 1, characterized in that, The transmission assembly includes a transmission wheel (17), which is fixed at the center of the back of the gear (16). A first transmission member (18) is provided at the center of the back of the fixing member (7), and the first transmission member (18) is connected to the center of the back of the fixing member (7) by a pin. A second transmission member (19) is rotatably provided below the first transmission member (18).
8. The linkage mechanism ATE chip testing fixture according to claim 7, characterized in that, The back of the first transmission member (18) and the rotating rod are provided with belt grooves, and the transmission wheel (17) is connected to the belt groove on the back of the first transmission member (18) by a belt. The two ends of the second transmission member (19) are symmetrically provided with belt grooves. The belt groove on the back of the second transmission member (19) is connected to the belt groove at the rotating rod of the first transmission member (18) by a belt. The belt groove on the front surface of the second transmission member (19) is connected to the pulley (20) by a belt.