Novel automatic needle inserting Block

Abstract

The utility model discloses a novel automatic probe inserting Block, which comprises a Block body, a PCB (printed circuit board) rotating plate, a plurality of probe sleeves and a plurality of single-head probes. According to the utility model, the probe sleeve is fixed on the Block body and the PCB rotating plate, so that the single-head probe is in continuous contact with the PCB rotating plate, thereby effectively avoiding the problems of unstable probe insertion and high error rate obtained by testing caused by poor electric contact due to intermittent contact; the single-head probe is fixedly arranged in the probe sleeve, so that the single-head probe does not shake, the probe inserting stability is improved, and the drawing error rate is greatly reduced; according to the automatic needle inserting Block, the probe sleeve and the Block body are fixed together, so that the service life of the single-head probe and the service life of the Block body are greatly prolonged, the workload of workers is reduced, a Block cover plate is omitted, and the cost is greatly reduced.

Description

Technical Field

[0001] This utility model belongs to the field of screen design and manufacturing, and specifically relates to a novel automatic pin-insertion block. Background Technology

[0002] In the LCD panel manufacturing industry, 100% Inline Demura (online removal of brightness unevenness) and 100% Inline API (online automated product inspection) testing of OC products has become a trend, gradually being accepted and adopted by more and more manufacturers. In this regard, the emerging company Rainbow Optoelectronics pioneered 100% Inline Demura and 100% Inline API testing of OC products from its inception, leading the industry in various indicators and achieving excellent performance. However, 100% Inline Demura and 100% Inline API testing are costly and increase equipment failure rates and downtime. Economic losses and equipment failures due to automatic pin insertion anomaly handling and automatic pin insertion block damage replacement account for a significant proportion. Therefore, how to reduce the probability of automatic pin insertion anomalies and equipment failure rates caused by automatic pin insertion block damage, and how to reduce the frequency of block damage and replacement, have become major issues affecting the production costs of OC panel manufacturers.

[0003] The traditional automatic needle block commonly used in the industry, such as Figure 1 As shown, the system includes: a PCB transition board, a block cover, a block body, probe holes, and a dual-ended probe. As can be seen from the figure, the diameter of the probe holes is larger than the diameter of the dual-ended probe. Both ends of the dual-ended probe are retractable; one end connects to the PCB transition board via the block cover, and the other end is used for probing. However, during the actual pin piercing test, due to the deformation of the PCB transition board itself, the dual-ended probe inevitably experiences intermittent contact with the PCB transition board, leading to pin piercing instability and a higher failure rate, resulting in a certain percentage of missed defective products. Furthermore, because the diameter of the probe holes is larger than that of the dual-ended probe, the block body rubs against the dual-ended probe for extended periods, easily causing the probe holes in the block body to enlarge, thus damaging the block body and causing the dual-ended probe to become misaligned within the holes. This significantly increases the probability of pin piercing deviation and greatly affects the accuracy of the test results. Utility Model Content

[0004] To address the aforementioned problems in the existing technology, this utility model provides a novel automatic needle insertion block. The technical problem to be solved by this utility model is achieved through the following technical solution:

[0005] The utility model discloses an automatic needle block of novel type, including:

[0006] Block body, PCB transfer board, a plurality of probe needle cover and a plurality of single -end probe, wherein,

[0007] The PCB transfer board is fixedly arranged at the top of the Block body;

[0008] The probe needle cover is arranged through the Block body and the PCB transfer board, and is fixed on the inside of the Block body and the PCB transfer board respectively;

[0009] The single -end probe is fixedly arranged in the probe needle cover, and the number of single -end probe is same with the probe needle cover.

[0010] In an embodiment of the utility model, the probe needle cover is arranged through the through -hole of Block body and PCB transfer board.

[0011] In an embodiment of the utility model, the diameter of through -hole is same with the outer diameter of probe needle cover.

[0012] In an embodiment of the utility model, the probe needle cover is fixed on the PCB transfer board by soldering.

[0013] In an embodiment of the utility model, the material of single -end probe and probe needle cover is conductive metal.

[0014] In an embodiment of the utility model, the distance between adjacent probe needle cover is equal.

[0015] In an embodiment of the utility model, the distance between the central axes of adjacent single -end probe is 0.5mm.

[0016] In an embodiment of the utility model, the diameter of single -end probe is same with the inner diameter of probe needle cover.

[0017] In an embodiment of the utility model, the fixed mode between PCB transfer board and Block body includes:

[0018] Screw fixing or bolt fixing.

[0019] The utility model discloses an automatic needle block of novel type, including:

[0020] In the solution provided by this utility model, by fixing the probe sleeve to the Block body and the PCB board, continuous contact is maintained between the single-headed probe and the PCB board, effectively avoiding the problem of unstable pin insertion and high error rate caused by poor electrical contact due to intermittent contact. Fixing the single-headed probe inside the probe sleeve prevents it from shaking, improving pin insertion stability and significantly reducing the error rate. Fixing the probe sleeve to the Block body greatly extends the lifespan of the Block body. Furthermore, replacing the traditional double-headed probe with a single-headed probe significantly extends the lifespan of the single-headed probe, reducing the workload of operators. The automatic pin insertion Block proposed in this utility model also eliminates the need for a Block cover plate, thereby greatly reducing costs. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of a traditional automatic needle block.

[0022] Figure 2 This is a schematic diagram of a novel automatic needle-sticking block provided in an embodiment of the present invention. Detailed Implementation

[0023] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0024] Example 1

[0025] This utility model embodiment provides a novel automatic needle insertion block, such as Figure 2 As shown, it may include:

[0026] The block body, PCB board, several probe sleeves, and several single-headed probes; among them...

[0027] The PCB adapter is fixedly mounted on the top of the Block body;

[0028] The probe sleeve is set through the Block body and the PCB adapter, and is fixed inside the Block body and on the PCB adapter respectively;

[0029] The single-headed probe is fixedly installed in the probe sleeve; the number of single-headed probes is the same as the number of probe sleeves.

[0030] Understandable, combined Figure 1 andFigure 2 The comparison shows that, compared with the traditional automatic pin-punching block, the new automatic pin-punching block proposed in this embodiment of the utility model fixes the probe pin sleeve to the PCB board, thereby eliminating the block cover plate in the traditional structure and greatly saving the corresponding cost; and by fixing the single-head probe with the probe pin sleeve, the problem of poor electrical contact caused by intermittent contact is avoided, which leads to unstable pin-punching and high error rate in the test.

[0031] Example 2

[0032] Based on the novel automatic needle insertion block proposed in Example 1, the probe needle sleeve can be set through a through hole pre-set on the block body and the PCB converter board.

[0033] The diameter of the through hole is the same as the outer diameter of the probe sleeve.

[0034] Through pre-drilled holes in the Block body and the PCB adapter, the probe sleeve can be easily and quickly inserted into both. Understandably, designing the diameter of the through hole to be the same as the outer diameter of the probe sleeve allows for a more stable fixation of the probe sleeve within the Block body and the PCB adapter. This through-hole design ensures the probe sleeve is securely fixed to the Block body and the PCB adapter, protecting the Block body and preventing damage from probes as seen in existing technologies. This significantly extends the lifespan of the Block body and reduces costs. Furthermore, the pre-drilled holes in the PCB adapter prevent poor contact caused by intermittent contact due to PCB adapter deformation.

[0035] Example 3

[0036] Optionally, based on the novel automatic pin-attaching block proposed in Embodiments 1 and / or 2, the probe sleeve is fixed to the PCB transfer board using solder. Both the single-ended probe and the probe sleeve are made of conductive metal. Preferably, the conductive metal may include silver or copper. For cost-saving purposes, copper can be selected as the material for both the single-ended probe and the probe sleeve. The probe sleeve is fixed to the PCB transfer board using solder.

[0037] It can be understood that the probe needle sleeve is fixed on the PCB conversion plate by soldering, which avoids the up and down movement of the probe needle sleeve during the test. The materials of the single-head probe and the probe needle sleeve are both conductive metals, so that the PCB conversion plate can transmit the corresponding test signal to the single-head probe through the probe needle sleeve, thereby realizing the test of the LCD panel to be tested. The fixing mode between the probe needle sleeve and the PCB conversion plate includes but is not limited to soldering, which should not be understood as a limitation on the fixing mode of the two.

[0038] Embodiment 4

[0039] Optionally, on the basis of the new automatic needle Block proposed in Embodiment 1 and / or Embodiment 2 and / or Embodiment 3, when the probe needle sleeve is set, the distance between adjacent probe needle sleeves is equal. Since the spacing between each test point in the LCD panel to be tested can be set to be equal, the embodiment of the utility model can facilitate the detection of the LCD panel to be tested by setting the distance between adjacent probe needle sleeves to be the same. As a preferred, the distance between the central axes of adjacent single-head probes can be selected to be 0.5mm. In order to facilitate the test of the LCD panel to be tested.

[0040] Optionally, the diameter of the single-head probe is the same as the inner diameter of the probe needle sleeve, so that there is no gap between the single-head probe and the sleeve, and the single-head probe will not shake, thereby improving the stability of the needle and reducing the needle drawing error rate.

[0041] Embodiment 5

[0042] Optionally, on the basis of the new automatic needle Block proposed in Embodiment 1 and / or Embodiment 2 and / or Embodiment 3 and / or Embodiment 4, a single-head telescopic probe is selected for testing. It can be understood that the conventional double-head probe generally needs to be replaced after being used for 50,000 times, while the service life of the single-head telescopic probe can generally reach 80,000 times, and the cost of the single-head probe is much lower than that of the double-head probe under the same thickness. Therefore, compared with the conventional double-head probe, the single-head probe proposed in the embodiment not only has a longer service life and higher stability, but also has a lower use cost.

[0043] Embodiment 6

[0044] Optionally, on the basis of the new automatic pinning Block proposed in Embodiment 1 and / or Embodiment 2 and / or Embodiment 3 and / or Embodiment 4 and / or Embodiment 5, the fixing method between the PCB transfer plate and the Block body can include screw fixing or bolt fixing. It can be understood that the PCB transfer plate and the Block body are fixed by screws or bolts, so that the PCB transfer plate and the Block body are more firm. But the specific fixing method includes but is not limited to screw fixing or bolt fixing, which should not be understood as a limitation on the fixing method of the two.

[0045] Embodiment 7

[0046] Optionally, on the basis of the new automatic pinning Block proposed in Embodiment 1 and / or Embodiment 2 and / or Embodiment 3 and / or Embodiment 4 and / or Embodiment 5 and / or Embodiment 6, the arrangement form of the probe needle sleeve and the single-head probe can be set to single-row arrangement, double-row arrangement, double-row staggered arrangement or other arrangement of any required form according to the needs of the OC panel to be tested. How to set it specifically, users can design it themselves according to their own product needs for the purpose of convenient use.

[0047] It can be understood that, in the traditional Inline Demura test and Inline API test, the Block body using the double-head probe is designed for 50,000 times of needle puncture, and sometimes less than 50,000 times in actual use. The Block body using the single-head probe can be used for at least 80,000 times of needle puncture, which greatly improves the use time of the probe and the Block and the test efficiency. By fixing the single-head probe in the probe needle sleeve, the damage of the Block body can be greatly avoided. Even if the single-head probe is damaged, only the corresponding single-head probe needs to be replaced, and the automatic needle puncture Block after replacing the single-head probe can continue to be used normally, thereby greatly reducing the production cost and bringing significant economic benefits. Specifically, the needle puncture difference rate in the current 100% Inline Demura test and 100% Inline API test is 3%-5%, and after using the new automatic needle puncture Block provided in the embodiments of the present application, the average value of the needle puncture difference rate is controlled to be less than 0.2%. It can be seen that the new automatic needle puncture Block used in the test can bring great economic benefits while improving the test accuracy. It can be understood that the fixing between the components in the new automatic needle puncture Block provided in the embodiments of the present application is more dependent on the horizontal limiting of its own size, and in the test process, most of the use scenarios are to control the new automatic needle puncture Block to approach the LCD panel to be tested, and the needle head of the single-head probe is used to touch the test point on the LCD panel to be tested. In such a test process, no horizontal force is received, which makes the components in the new automatic needle puncture Block fixed to each other while greatly improving the service life of each component.

[0048] The new automatic needle puncture Block provided in the embodiments of the present application fixes the probe needle sleeve to the Block body and the PCB transfer plate, so that the single-head probe and the PCB transfer plate are in continuous contact, effectively avoiding poor electrical contact caused by intermittent contact, thereby causing unstable needle puncture and high difference rate in the test. The single-head probe is fixed in the probe needle sleeve, so that the single-head probe does not shake, improves the stability of needle puncture, and greatly reduces the difference rate. The probe needle sleeve and the Block body are fixed together, so that the service life of the single-head probe and the Block body is greatly improved, thereby reducing the work burden of the workers, and the automatic needle puncture Block provided in the present application also omits the Block cover plate, thereby greatly reducing the cost.

[0049] It should be noted that in the description of the present application, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise" and other indications of orientation or position relationship are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0050] Each embodiment in the specification is described in a related manner, and the same or similar parts between each embodiment can be referred to each other, and each embodiment focuses on the difference from other embodiments.

[0051] The above only describes the preferred embodiments of the present application, and is not used to limit the protection scope of the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application is included in the protection scope of the present application.

Claims

1. A new automatic Block, characterized in that, Comprise: Block body, PCB transfer plate, several probe needle sleeves and several single-head probes; wherein, The PCB transfer plate is fixedly arranged on the top of the Block body; The probe needle sleeve is arranged through the Block body and the PCB transfer plate, and is fixed on the inside of the Block body and the PCB transfer plate respectively; The single-head probe is fixedly arranged in the probe needle sleeve; the number of the single-head probe is the same as that of the probe needle sleeve.

2. A new automatic pinning Block according to claim 1, characterized in that, The probe needle sleeve is arranged through the through hole prearranged on the Block body and the PCB transfer plate.

3. A novel automatic pinning Block as claimed in claim 2, wherein, The diameter of the through hole is the same as the outer diameter of the probe needle sleeve.

4. A new automatic pinning Block according to claim 1, characterized in that, The probe needle sleeve is fixed on the PCB transfer plate by soldering.

5. A new automatic pinning Block according to claim 1, characterized in that, The materials of the single-head probe and the probe needle sleeve are both conductive metal.

6. A new automatic pinning Block according to claim 1, characterized by, The distance between adjacent probe needle sleeves is equal.

7. A new automatic pinning Block according to claim 1, characterized by, The distance between the central axes of adjacent single-head probes is 0.5 mm.

8. A new automatic pinning Block according to claim 1, characterized by, The diameter of the single-head probe is the same as the inner diameter of the probe needle sleeve.

9. A new automatic pinning Block according to claim 1, characterized by, The fixing mode between the PCB transfer plate and the Block body comprises: Screw fixing or bolt fixing.

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