Anti-aging test device for crystal frequency chip

Abstract

The utility model relates to an anti-aging testing device for crystal frequency chips. The anti-aging testing device is sequentially arranged in the conveying direction of the crystal frequency chips. The bearing assembly comprises a bearing disc, and a bearing groove is formed in the bearing disc; the feeding assembly comprises a feeding table, and a conveying mechanism is placed on the feeding table; the anti-aging heating assembly comprises a supporting table, a box body is placed on the supporting table, and heating modules are arranged at the top and the bottom of the box body; and the detection assembly comprises a detection table, and a light shield is fixedly mounted on the top surface of the detection table. The bearing assembly can bear the crystal frequency chip to be subjected to anti-aging detection, the crystal frequency chip is conveyed to the anti-aging heating assembly through the feeding assembly, and then the crystal frequency chip in the bearing assembly is heated and aged through a heating module in the anti-aging heating assembly. And the heated and aged crystal frequency sheet is illuminated by a light source I of the detection assembly, and at the moment, whether cracks exist on the surface of the crystal frequency sheet or not can be checked in a direct observation mode.

Description

Technical Field

[0001] This utility model relates to the field of crystal frequency wafer testing technology, specifically a crystal frequency wafer anti-aging testing device. Background Technology

[0002] In the field of electronic component manufacturing, crystal frequency chips (also known as crystal oscillators) are key components widely used in various electronic devices, such as computers, communication equipment, and timers. The performance stability of crystal frequency chips is crucial to the accuracy and reliability of the equipment. However, over time, crystal frequency chips may age due to environmental factors (such as temperature, humidity, and light), leading to a decrease in their frequency stability and affecting the overall performance of the equipment. To ensure the quality of crystal frequency chips, manufacturers need to conduct rigorous anti-aging tests on them during the production process. Traditional anti-aging testing devices usually only have a single testing function, such as only performing heating aging tests or only performing frequency stability tests, lacking comprehensive testing equipment that integrates feeding, heating aging, and testing.

[0003] Therefore, to address this deficiency, we have made technical improvements to existing equipment to enhance testing efficiency, accuracy, and automation, thereby meeting the demands of the modern electronic component manufacturing industry for high-quality crystal frequency wafers. Utility Model Content

[0004] The technical problem to be solved by this utility model is to provide a crystal frequency wafer anti-aging test device that integrates feeding, anti-aging heating and anti-aging detection functions to address the shortcomings of the existing technology.

[0005] The technical problem to be solved by this utility model is achieved through the following technical solution: a crystal frequency wafer anti-aging test device, which is arranged in sequence according to the crystal frequency wafer conveying direction;

[0006] The carrier assembly includes a carrier disk with several carrier slots for carrying the crystal frequency chip, and a slider is fixedly installed on the bottom surface of the carrier disk.

[0007] The loading assembly includes a loading platform on which a conveying mechanism for conveying a carrier tray is placed;

[0008] The anti-aging heating assembly includes a support platform on which a housing is placed. One side of the housing faces the conveying mechanism and is set as the feeding surface, while the other side is set as the discharging surface. Heating modules are set at the top and bottom of the housing. Several sets of slide rails that cooperate with the sliders on the bottom surface of the support plate are set on the inner wall of the middle part of the housing.

[0009] The testing assembly includes a testing stage, an opaque light shield fixedly mounted on the top surface of the testing stage, an opening on one side of the light shield, a support base fixedly mounted on the top surface of the testing stage inside the light shield, a support surface formed on the top surface of the support base to support the bottom surface of the support plate, a mounting groove opened in the middle of the support base, and a light source I fixedly mounted in the mounting groove to illuminate the support plate, thereby facilitating the observation of the crystal frequency plate.

[0010] The technical problem to be solved by this utility model can also be achieved through the following technical solution: the crystal frequency plate anti-aging test device described above has a through hole in the middle of the bearing groove to facilitate the passage of light from light source I.

[0011] The technical problem to be solved by this utility model can also be achieved through the following technical solution: the crystal frequency wafer anti-aging test device described above has a vertical beam fixedly provided on the side of the feeding assembly, a horizontal beam fixedly provided on the top of the vertical beam, and a light source II facing the conveying mechanism fixedly provided on the bottom surface of the horizontal beam.

[0012] The technical problem to be solved by this utility model can also be achieved through the following technical solution: the crystal frequency wafer anti-aging test device described above has sealing doors hinged to both the feed surface and the discharge surface of the housing.

[0013] The technical problem to be solved by this utility model can also be achieved through the following technical solution: the above-mentioned crystal frequency plate anti-aging test device, wherein the heating module is an electric heating tube.

[0014] The technical problem to be solved by this utility model can also be achieved through the following technical solution: the crystal frequency chip anti-aging test device described above, wherein the slide rails are used in pairs, and three pairs of slide rails are arranged at intervals from top to bottom in the box, each pair of slide rails is composed of two slide rails symmetrically fixed on the inner wall of the box.

[0015] The technical problem to be solved by this utility model can also be achieved through the following technical solution: the crystal frequency chip anti-aging test device described above has a support plate fixed on the middle side wall of the test platform, and a carrier box for accommodating defective crystal frequency chips is placed on the top surface of the support plate.

[0016] The technical problem to be solved by this utility model can also be achieved through the following technical solution: the crystal frequency plate anti-aging test device described above has a light source III fixedly installed on the top inner wall of the light shield.

[0017] Compared with the prior art, the beneficial technical effects of this utility model are as follows:

[0018] (1) The carrier assembly can carry the crystal frequency sheet to be tested for anti-aging and transport it to the anti-aging heating assembly through the feeding assembly. The heating module in the anti-aging heating assembly heats and ages the crystal frequency sheet in the carrier assembly. Then, the light source I of the detection assembly illuminates the heated and aged crystal frequency sheet. At this time, the surface of the crystal frequency sheet can be checked for cracks by direct observation, thereby achieving the purpose of feeding, anti-aging heating and observation of the crystal frequency sheet. Compared with the previous detection method of multiple processes and different production lines, this device has a higher degree of functional integration and higher detection efficiency.

[0019] (2) A through hole is provided on the bearing groove to facilitate the direct contact between the light emitted by the light source I and the crystal frequency plate. This makes the illumination conditions of the crystal frequency plate better and easier to observe. In addition, the light source III of the light shield can illuminate the upper surface of the crystal frequency plate, further enhancing the illumination effect of the crystal frequency plate.

[0020] (3) A light source III is provided on the side of the feeding assembly. The light source III can illuminate the upper surface of the crystal frequency plate when the carrier plate is transported by the conveying mechanism. When there are obvious cracks on the surface of the crystal frequency plate, they can be detected immediately and the crystal frequency plate can be removed from the carrier plate without further anti-aging testing. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the main structure of this utility model;

[0022] Figure 2 for Figure 1 A magnified schematic diagram of a portion of the structure.

[0023] Reference numerals: 1. Carrier plate; 2. Crystal frequency plate; 3. Carrier groove; 4. Light source I; 5. Through hole; 6. Slider; 7. Light source II; 8. Light source III; 9. Loading platform; 10. Conveying mechanism; 11. Vertical beam; 12. Horizontal beam; 13. Support platform; 14. Box body; 15. Sealing door; 16. Heating module; 17. Slide rail; 18. Detection platform; 19. Light shield; 20. Carrier seat. Detailed Implementation

[0024] The specific technical solutions of this utility model are further described below with reference to the accompanying drawings, so as to enable those skilled in the art to further understand this utility model, without constituting a limitation on its rights.

[0025] Example 1, referring to Figure 1-2 A crystal frequency wafer anti-aging testing device, which is arranged sequentially according to the crystal frequency wafer conveying direction;

[0026] The support assembly includes a support disk 1, which is formed into a roughly square disk structure. Several support grooves 3 for supporting the crystal frequency chip 2 are formed on the support disk 1. The support grooves 3 are formed into square groove structures. A through hole 5 for light source I 4 to pass through is formed in the middle of the support groove 3. The through hole 5 is formed into a square hole. A slider 6 is fixedly installed on the bottom surface of the support disk 1. The slider 6 is a square block structure. The light source I 4, light source II 7 and light source III 8 can be LED tubes.

[0027] The feeding assembly includes a feeding platform 9, which is formed into a generally square platform structure. A conveying mechanism 10 for conveying the carrying tray 1 is placed on the feeding platform 9. The conveying mechanism 10 can be a belt conveyor.

[0028] A vertical beam 11 is fixedly provided on the side of the feeding assembly. The vertical beam 11 is formed into a square beam. A horizontal beam 12 is vertically fixed on the top of the vertical beam 11. The horizontal beam 12 is formed into a square beam. A light source II 7 facing the conveying mechanism 10 is fixedly provided on the bottom surface of the horizontal beam 12.

[0029] The anti-aging heating assembly includes a support platform 13, which is roughly square. A housing 14 is placed on the support platform 13. The housing 14 is roughly square. One side of the housing 14 faces the conveying mechanism 10 and is set as the feeding surface, while the other side is set as the discharging surface. Sealing doors 15 are hinged to both the feeding and discharging surfaces of the housing 14. Heating modules 16 are provided at the top and bottom of the housing 14. The heating modules 16 are electric heating tubes. The electric heating tubes are existing technologies and can be selected according to the usage requirements. Several sets of slide rails 17 are provided on the inner wall of the middle part of the housing 14 to cooperate with the sliders 6 on the bottom surface of the bearing plate 1. The slide rails 17 are used in pairs. Three pairs of slide rails 17 are arranged at intervals from top to bottom inside the housing 14. Each pair of slide rails 17 consists of two slide rails 17 symmetrically fixed on the inner wall of the housing 14.

[0030] The heating module 16 in the anti-aging heating assembly can heat and age the crystal frequency plate 2 inside the housing 14.

[0031] The testing assembly includes a testing platform 18, which is generally square in shape. An opaque light shield 19 is fixedly installed on the top surface of the testing platform 18. The light shield 19 is generally square in shape. A light source Ⅲ8 is fixedly installed on the inner top wall of the light shield 19. One side of the light shield 19 has an opening, which is square, to facilitate the placement of the carrier plate 1 on the carrier seat 20 (described later). The carrier seat 20 is fixedly installed on the top surface of the testing platform 18 inside the light shield 19. The carrier seat 20 is generally square in shape. A support surface is formed on the top surface of the carrier seat 20 to support the bottom surface of the carrier plate 1. A mounting groove is provided in the middle of the carrier seat 20. The mounting groove is square. A light source Ⅰ4 is fixedly installed in the mounting groove to illuminate the carrier plate 1, thereby facilitating the observation of the crystal frequency plate 2.

[0032] The purpose of the testing assembly is to illuminate the crystal frequency chip 2, so as to facilitate the observation of the crystal frequency chip 2 by the staff;

[0033] A support plate is fixed on the middle side wall of the testing station 18. The support plate is formed into a roughly square plate structure. A carrier box for accommodating the defective crystal frequency chip 2 is placed on the top surface of the support plate. The carrier box is formed into a roughly square box structure.

[0034] First, place the crystal frequency chips 2 that need to be tested for anti-aging one by one into the carrier slots 3 of the carrier tray 1, ensuring that only one crystal frequency chip 2 is placed in each carrier slot 3. Then, place the carrier tray 1 on the conveying mechanism 10 of the loading assembly, and the conveying mechanism 10 will transport the carrier tray 1 to the housing 14. During this period, the light source II 7 can illuminate the crystal frequency chips 2 on the conveying mechanism 10, so that the surface condition of the crystal frequency chips 2 can be observed in advance under illumination. When there are obvious cracks on the surface of the crystal frequency chips 2, they can be detected immediately, and the crystal frequency chips 2 can be removed from the carrier tray 1 and no longer subjected to anti-aging test. Then, the carrier tray 1 can be placed in the housing 14, and the crystal frequency chips 2 in the carrier tray 1 can be heated by the heating module 16. The heating temperature and heating time can be selected according to the process requirements.

[0035] After heating, the carrier plate 1 is removed from the box 14 and placed on the carrier seat 20 inside the light shield 19. At this time, the crystal frequency plate 2 on the carrier plate 1 is irradiated by the light source I 4 and the light source III 8. The staff can directly observe the crystal frequency plate 2 to check for cracks. The crystal frequency plate 2 with cracks is then placed in the carrier box in the middle of the test table 18.

Claims

1. A crystal frequency chip anti-aging testing device, characterized in that: It is arranged sequentially according to the crystal frequency slice conveying direction; The carrier assembly includes a carrier plate with several carrier slots for carrying the crystal frequency chip, and a slider is fixedly installed on the bottom surface of the carrier plate. The loading assembly includes a loading platform on which a conveying mechanism for conveying a carrier tray is placed; The anti-aging heating assembly includes a support platform on which a housing is placed. One side of the housing faces the conveying mechanism and is set as the feeding surface, while the other side is set as the discharging surface. Heating modules are set at the top and bottom of the housing. Several sets of slide rails that cooperate with the sliders on the bottom surface of the support plate are set on the inner wall of the middle part of the housing. The testing assembly includes a testing stage, an opaque light shield fixedly mounted on the top surface of the testing stage, an opening on one side of the light shield, a support base fixedly mounted on the top surface of the testing stage inside the light shield, a support surface formed on the top surface of the support base to support the bottom surface of the support plate, a mounting groove opened in the middle of the support base, and a light source I fixedly mounted in the mounting groove to illuminate the support plate, thereby facilitating the observation of the crystal frequency plate.

2. The crystal frequency plate anti-aging testing device according to claim 1, characterized in that: The bearing groove has a through hole in the middle to facilitate the passage of light from light source I.

3. The crystal frequency chip anti-aging testing device according to claim 1, characterized in that: A vertical beam is fixedly installed on the side of the feeding assembly, a horizontal beam is fixedly installed vertically on the top of the vertical beam, and a light source II facing the conveying mechanism is fixedly installed on the bottom surface of the horizontal beam.

4. The crystal frequency plate anti-aging testing device according to claim 1, characterized in that: Both the feed surface and the discharge surface of the box are hinged with sealing doors.

5. The crystal frequency plate anti-aging testing device according to claim 1, characterized in that: The heating module is an electric heating element.

6. The crystal frequency plate anti-aging testing device according to claim 1, characterized in that: The slide rails are used in pairs. The box is equipped with three pairs of slide rails spaced apart from top to bottom. Each pair of slide rails consists of two slide rails that are symmetrically fixed on the inner wall of the box.

7. The crystal frequency plate anti-aging testing device according to claim 1, characterized in that: A support plate is fixed on the middle side wall of the testing station, and a carrier box for holding defective crystal frequency chips is placed on the top surface of the support plate.

8. The crystal frequency plate anti-aging testing device according to claim 1, characterized in that: A light source III is fixedly installed on the top inner wall of the light shield.

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