Material measuring system with multi-line scanning function

Abstract

The utility model provides a material measuring system with a multi-line scanning function. The material measuring system comprises a plurality of signal modules, a plurality of reflecting structures and a driving mechanism, the signal module is at least used for generating a transmitting wave beam and receiving an incident wave beam; the reflection structure is used for reflecting the transmitting wave beam generated by the signal module to form an emergent wave beam; the reflecting surface of the reflecting structure and the transmitting beam of the signal module form a plurality of first angles, and the reflecting surface of the reflecting structure and the emergent beam form a plurality of second angles; the reflection structures and the signal modules are arranged in a one-to-one correspondence mode. And the driving mechanism is used for driving the plurality of reflection structures and / or the plurality of signal modules to rotate so as to realize multi-line scanning of the surface profile of the material. According to the invention, the driving mechanism drives the signal modules and / or the reflection structures to rotate, so that the reflection surfaces of the reflection structures and the emission beams of the signal modules form a plurality of first angles, and the reflection surfaces of the reflection structures and the emission beams form a plurality of second angles, and three-dimensional scanning of the surface of the material is realized.

Description

Technical Field

[0001] This disclosure relates to the field of material scanning technology, and specifically to a material measurement system with multi-line scanning function. Background Technology

[0002] 3D scanning radar boasts numerous advantages, including safety, efficiency, and environmental friendliness, leading to its widespread adoption and application in three-dimensional measurement of media in industrial manufacturing and other fields. However, due to limitations in the radar's functional design and implementation, most existing 3D scanning radars suffer from frequent movement and bending of key components, resulting in lower product reliability and lifespan.

[0003] For example, existing 3D scanning radars typically require a high-frequency board to be fixed on an antenna. The microwave signals generated by the high-frequency board need to be emitted through the antenna. At the same time, the antenna is often fixed on a pitch motion device or pitch motion support. The pitch motion device or pitch motion support is connected to a horizontal motion device or horizontal motion support and moves horizontally with the device, thereby enabling the antenna to emit microwave signals from multiple angles in two dimensions to perform three-dimensional detection.

[0004] In addition, existing 3D scanning radars use horizontal or vertical motion devices to drive a high-frequency board to rotate in the horizontal or vertical direction to achieve three-dimensional scanning. This design of scanning radar has a complex structure and obtains complete material information by rotating the angle, which makes the scanning cycle to obtain complete material information relatively long and cannot meet customer needs. Summary of the Invention

[0005] This disclosure provides a material measurement system with multi-line scanning function, which is used to solve the technical problems of existing 3D scanning radars, such as relatively long scanning cycles for acquiring complete material information, and low product reliability and service life.

[0006] This disclosure provides a material measurement system with multi-line scanning capability, including:

[0007] Multiple signal modules, wherein the signal modules are at least used to generate a transmit beam and receive an incident beam;

[0008] Multiple reflective structures are provided, each set at a predetermined distance from the signal module, and reflect the transmitted beam generated by the signal module to form an emitted beam. The reflective surfaces of the reflective structures form multiple first angles / angle positions with the transmitted beam of the signal module and multiple second angles / angle positions with the emitted beam. Each reflective structure is configured in a one-to-one correspondence with the signal module.

[0009] A driving mechanism is provided to drive multiple reflective structures and / or multiple signal modules to rotate in order to achieve multi-line scanning of the material surface contour.

[0010] According to at least one embodiment of the material measurement system with multi-line scanning function of the present disclosure, a plurality of reflective structures share a driving mechanism, the plurality of reflective structures are connected to the driving mechanism through a first fixing member, and the driving mechanism is used to drive the first fixing member to rotate so as to drive the plurality of reflective structures to rotate synchronously.

[0011] According to at least one embodiment of the material measurement system with multi-line scanning function of the present disclosure, the driving mechanism is configured as a plurality of driving mechanisms, and the plurality of driving mechanisms are configured in one-to-one correspondence with the plurality of reflective structures. Each driving mechanism is connected to the corresponding reflective structure, and each driving mechanism is used to drive the corresponding reflective structure to rotate.

[0012] According to at least one embodiment of the present disclosure, a material measurement system with multi-line scanning function includes a plurality of signal modules sharing a single drive mechanism. The plurality of signal modules are connected to the drive mechanism via a second fixing member. The drive mechanism is used to drive the second fixing member to rotate so as to drive the plurality of signal modules to rotate synchronously.

[0013] According to at least one embodiment of the present disclosure, a material measurement system with multi-line scanning function is provided, wherein the driving mechanism is configured as a plurality of driving mechanisms, and the plurality of driving mechanisms are configured in one-to-one correspondence with the plurality of signal modules. Each driving mechanism is connected to the corresponding signal module, and each driving mechanism is used to drive the corresponding signal module to rotate.

[0014] According to at least one embodiment of the present disclosure, a material measurement system with multi-line scanning function includes a plurality of signal modules and a plurality of reflective structures sharing a single driving mechanism. The plurality of signal modules and the plurality of reflective structures are connected to the driving mechanism via a third fixing member. The driving mechanism is used to drive the third fixing member to rotate so as to drive the plurality of signal modules and the plurality of reflective structures to rotate synchronously.

[0015] A material measurement system with multi-line scanning function according to at least one embodiment of the present disclosure further includes a fixed frame, a plurality of signal modules and a plurality of reflective structures sharing a driving mechanism, the plurality of signal modules and the plurality of reflective structures being fixedly mounted to the fixed frame by a fourth fastener, the fixed frame being connected to the driving mechanism, and the driving mechanism being used to drive the fixed frame to rotate so as to drive the plurality of signal modules and the plurality of reflective structures to rotate synchronously.

[0016] According to at least one embodiment of the material measurement system with multi-line scanning function disclosed herein, the transmitting beam of the signal module is emitted onto the reflective surface of the reflective structure. During the rotation of the plurality of signal modules and / or the plurality of reflective structures, the plurality of first angles / angle positions formed by the reflective surface of the reflective structure and the transmitting beam of the signal module, as well as the plurality of second angles / angle positions formed by the reflective surface of the reflective structure and the transmitting beam, are continuously changing. This causes the reflected transmitting beam to reach different measurement points on the material surface, and after passing through different measurement points, it is reflected to form a reflected beam. The reflected beam is received by the reflective structure and reflected by the reflective structure to form an incident beam. The incident beam is provided to the signal module to form a measurement signal, thereby realizing the measurement of different measurement points.

[0017] According to at least one embodiment of the material measurement system with multi-line scanning function disclosed herein, the rotation direction of the drive mechanism is a single-direction continuous counterclockwise or clockwise rotation, or a reciprocating rotation within a certain angle range of clockwise and counterclockwise, or a rotation in a preset manner.

[0018] According to at least one embodiment of the material measurement system with multi-line scanning function of the present disclosure, the installation angles of any two of the plurality of reflective structures are the same or different; or, the installation angles of at least two of the plurality of reflective structures are different.

[0019] According to at least one embodiment of the material measurement system with multi-line scanning function of the present disclosure, the reflective surface of the reflective structure is at least one of a plane, a curved surface, a refracting surface, and a parabolic surface.

[0020] A material measurement system with multi-line scanning capability according to at least one embodiment of the present disclosure further includes a waveguide structure fixed to the signal module for guiding the transmitted beam to the reflective structure; and guiding the incident beam reflected back by the reflective structure to the signal module.

[0021] A material measurement system with multi-line scanning function according to at least one embodiment of the present disclosure further includes a displacement mechanism, which, by means of the displacement mechanism and / or adjusting the first angle between each of the reflective structures and the emitted beam, switches between different multiple two-dimensional scanning surfaces, thereby realizing the measurement of the material surface in multiple two-dimensional scanning surfaces, and finally realizing the three-dimensional measurement of the material surface profile based on the measurement information of multiple multi-line scanning surfaces.

[0022] According to at least one embodiment of the present disclosure, a material measurement system with multi-line scanning function is provided, wherein the displacement mechanism controls the material measurement system to move in a direction forming a predetermined angle with the two-dimensional scanning surface, so as to realize the measurement of the material surface in multiple two-dimensional scanning surfaces.

[0023] According to at least one embodiment of the present disclosure, a material measurement system with multi-line scanning function is provided, wherein the predetermined included angle is 90°.

[0024] This disclosure provides a material measurement system with multi-line scanning capability, including multiple signal modules, multiple reflective structures, and a driving mechanism. The signal modules are at least used to generate a transmitted beam and receive an incident beam. The reflective structures are positioned at a predetermined distance from the signal modules and reflect the transmitted beam generated by the signal modules to form an emitted beam. The reflective surfaces of the reflective structures form multiple first angles / angle positions with the transmitted beam of the signal modules and multiple second angles / angle positions with the emitted beam. Each reflective structure corresponds to one of the signal modules. The driving mechanism drives the multiple reflective structures and / or the multiple signal modules to rotate, thereby achieving multi-line scanning of the material surface contour. This disclosure achieves multi-line scanning of the material surface contour by setting up multiple signal modules and multiple reflective structures, and driving the signal modules and / or reflective structures to rotate through a driving mechanism. This causes the reflective surfaces of the multiple reflective structures to form multiple first angles / angle positions with the emitted beams of the multiple signal modules and multiple second angles / angle positions with the emitted beams, all of which change. Under the action of the displacement mechanism, multiple sets of multi-line scans of the material surface can be achieved, that is, three-dimensional scanning of the material surface can be achieved. Attached Figure Description

[0025] The accompanying drawings are provided to further illustrate the present disclosure and form part of the specification. They are used together with the following detailed description to explain the present disclosure, but do not constitute a limitation thereof. In the drawings:

[0026] Figure 1 This is a schematic diagram of the structure of a material measurement system with multi-line scanning function according to an embodiment of the present disclosure. Figure 1 ;

[0027] Figure 2 This is a schematic diagram of the structure of a material measurement system with multi-line scanning function according to an embodiment of the present disclosure. Figure 2 ;

[0028] Figure 3 This is a schematic diagram of the structure of a material measurement system with multi-line scanning function according to an embodiment of the present disclosure. Figure 3 ;

[0029] Figure 4 This is a schematic diagram of the structure of a material measurement system with multi-line scanning function according to an embodiment of the present disclosure. Figure 4 .

[0030] Summary of attached image labels:

[0031] 1. Signal module; 2. Reflection structure; 3. Drive mechanism;

[0032] 4. First fastener; 5. Second fastener; 6. Material. Detailed Implementation

[0033] The specific embodiments of this disclosure will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are for illustration and explanation only and are not intended to limit this disclosure.

[0034] Figure 1-4 A material measurement system with multi-line scanning capability according to an embodiment of this disclosure is shown. For example... Figure 1-4 As shown, a material measurement system with multi-line scanning function may include multiple signal modules 1, multiple reflective structures 2, and a drive mechanism 3.

[0035] In this disclosure, the beam emitted by the signal module 1 (which may be the processed beam emitted by the transmitting antenna module of the signal module 1) is the transmitting beam. The transmitting beam is reflected by the reflecting structure 2 to form the outgoing beam. The beam formed by the outgoing beam after being emitted to the material 6 and passing through the surface of the material 6 is the reflected beam. Then the reflected beam is reflected to the reflecting structure 2. The beam generated by the reflection structure 2 is the incident beam, and the incident beam is received by the receiving antenna module of the signal module 1.

[0036] The signal module 1 is at least used to generate a transmitted beam and receive an incident beam. The signal module 1 can be a microwave module or a laser module. For example, when it is a microwave module, the transmitted beam formed by the microwave module can be a narrow beam, and the beam angle of this narrow beam can be controlled to ≤3°. Specifically, the microwave module may include a microwave antenna, and this microwave antenna can transmit a microwave beam. The microwave beam can be focused into a narrow beam by a horn antenna or a lens antenna in the microwave module.

[0037] Signal module 1 can be controlled to generate transmit beams of different types and / or frequencies. For example, the frequency range of the transmit beam can be 60–300 GHz. The transmit beam can be a linearly polarized beam or a circularly polarized beam in a single direction; or it can be a hybrid beam combining multiple linearly polarized beams and circularly polarized beams; or it can be a switchable linearly polarized beam and a circularly polarized beam. When signal module 1 is a microwave module, the microwave antenna in the microwave module can be an antenna array, thereby enabling switching between multiple polarization modes or simultaneously transmitting microwave beams of multiple polarizations. These polarized microwave beams can be linearly polarized beams and circularly polarized beams, wherein the linearly polarized beams can be horizontally polarized beams and / or vertically polarized beams. In this disclosure, preferably, a hybrid beam combining multiple linearly polarized beams and circularly polarized beams or a switchable linearly polarized beam and a circularly polarized beam can be used. This allows the surface of material 6 to be scanned by microwave beams of different polarization forms, thereby obtaining reflective beams with different reflective properties in a single measurement. This approach allows for a significantly improved ability to analyze the surface of material 6 compared to existing technologies.

[0038] The reflective structure 2 is positioned at a predetermined distance from the signal module 1 and reflects the emitted beam generated by the signal module 1 to form an emitted beam. The reflective surface of the reflective structure 2 forms multiple first angles / angle positions with the emitted beam of the signal module 1 and multiple second angles / angle positions with the emitted beam. The reflective surface of the reflective structure 2 is at least one of a plane, a curved surface, a refracting surface, or a parabolic surface. Each reflective structure 2 corresponds one-to-one with a signal module 1. The driving mechanism 3 drives multiple reflective structures 2 and / or multiple signal modules 1 to rotate, thereby achieving multi-line scanning of the surface contour of the material 6.

[0039] In this disclosure, the reflective structure 2 and the signal module 1 are configured to correspond one-to-one, that is, one reflective structure 2 and one signal module 1 form a group of signal measurement units, and multiple reflective structures 2 and multiple signal modules 1 form multiple groups of signal measurement units. The multiple groups of signal measurement units are used to measure the complete contour information of the surface of the material 6.

[0040] The multiple reflective structures 2, multiple signal modules 1, or multiple sets of signal measurement units described in this disclosure will rotate under the drive of the drive mechanism 3, thereby performing multi-line scanning of the surface contour of the material 6. Specific embodiments of the three driving methods are described below.

[0041] (1) The case where the driving mechanism drives the reflective structure to rotate

[0042] Each of the reflective structures 2 is driven by the driving mechanism 3 to rotate. When the position of the signal module 1 corresponding to the reflective structure 2 is fixed, the direction of the emitted beam of the signal module 1 remains unchanged. However, since the reflective structure 2 is rotating, the first angle of the reflective surface of the reflective structure 2 relative to the emitted beam will change. Accordingly, the direction of the emitted beam generated by the reflective surface will shift relative to the previous emitted beam. Thus, the previous emitted beam was used to measure one measurement point on the surface of the material 6, while the emitted beam formed after the reflective structure 2 rotates measures another measurement point on the surface of the material 6. By continuously rotating the reflective structure 2, the material measurement system can achieve the measurement of the surface contour of the material 6 by a scanning surface composed of multiple measurement points.

[0043] During each measurement at different measurement points, the emitted beam is emitted to the reflective structure 2. After being reflected by the reflective surface of the reflective structure 2, it forms an outgoing beam. After the outgoing beam reaches the measurement point on the surface of the material 6, it is reflected to form a reflected beam. The reflected beam is received by the reflective structure 2 and reflected by the reflective structure 2 to form an incident beam. The incident beam is provided to the signal module 1 to form a measurement signal, thereby realizing the measurement at that measurement point. During each measurement at each measurement point, the reflective structure 2 is driven by the driving mechanism 3 to rotate continuously. The angle formed between the reflected beam and the reflective structure 2 at each measurement point is different from the second angle, and the angle formed between the incident beam and the reflective structure 2 is different from the first angle.

[0044] Since this disclosure includes multiple reflective structures 2 and multiple signal modules 1, and the reflective structures 2 and the signal modules 1 are configured in a one-to-one correspondence, the process of the driving mechanism 3 driving the reflective structure 2 to rotate can be divided into two cases: one case is that one driving mechanism 3 simultaneously drives multiple reflective structures 2 to rotate synchronously; the other case is that multiple driving mechanisms 3 drive multiple reflective structures 2 to rotate, specifically, each driving mechanism 3 drives one reflective structure 2 to rotate, in which case the number of driving mechanisms 3 matches the number of reflective structures 2.

[0045] Specifically, such as Figure 1As shown, multiple reflective structures 2 share a single driving mechanism 3. The multiple reflective structures 2 are connected to the driving mechanism 3 via a first fixing member 4. The driving mechanism 3 drives the first fixing member 4 to rotate, thereby causing the multiple reflective structures 2 to rotate synchronously. In this case, multiple reflective structures 2 are simultaneously driven to rotate synchronously by a single driving mechanism 3. The multiple reflective structures 2 can be fixed to the first fixing member 4. The driving mechanism 3 drives the first fixing member 4 to rotate, thereby causing the multiple signal modules 1 to perform multi-line scanning of the surface contour of the material 6.

[0046] Or, such as Figure 2 As shown, multiple driving mechanisms 3 can be configured, with each driving mechanism 3 corresponding to one of the multiple reflective structures 2. Each driving mechanism 3 is connected to the corresponding reflective structure 2, and each driving mechanism 3 is used to drive the corresponding reflective structure 2 to rotate.

[0047] At this time, the transmitting beam of each signal module 1 is emitted onto the reflecting surface (non-central region position or central region position) of the reflecting structure 2. During the rotation of the multiple reflecting structures 2, the multiple first angles formed by the reflecting surfaces of the multiple reflecting structures 2 and the transmitting beams of the multiple signal modules 1, as well as the multiple second angles formed by the transmitting beams of the multiple reflecting structures 2, are constantly changing. This causes the reflected transmitting beams to reach different measurement points on the surface of the material 6. After passing through different measurement points, the beams are reflected to form reflected beams. The reflected beams are received by the reflecting structures 2 and reflected by the reflecting structures 2 to form incident beams. The incident beams are provided to the signal modules 1 to form measurement signals, thereby realizing the measurement of different measurement points. The multiple signal modules 1 perform multi-line scanning of the surface contour of the material 6 as the multiple reflecting structures 2 rotate.

[0048] (2) Rotation of the drive mechanism drive signal module

[0049] Each signal module 1 is driven by the drive mechanism 3 to rotate. When the position of the reflective structure 2 corresponding to the signal module 1 is fixed, the position of the emitted beam of the signal module 1 changes. Although the reflective structure 2 remains fixed, the position of its reflective surface relative to the incident position of the emitted beam continuously changes. Accordingly, the exit position of the emitted beam generated by the reflective surface will also shift relative to the previous emitted beam. Thus, the previous emitted beam was used to measure one measurement point on the surface of the material 6, while the emitted beam formed after the signal module 1 rotates measures another measurement point on the surface of the material 6. By continuously rotating the signal module 1, the material measurement system can achieve the measurement of the surface contour of the material 6 by a scanning surface composed of multiple measurement points.

[0050] During each measurement at different measurement points, the emitted beam is emitted to the reflecting structure 2. After being reflected by the reflecting surface of the reflecting structure 2, it forms an outgoing beam. The outgoing beam reaches the measurement point on the surface of the material 6 and is reflected to form a reflected beam. The reflected beam is received by the reflecting structure 2 and reflected again to form an incident beam. The incident beam is provided to the signal module 1 to form a measurement signal, thereby realizing the measurement at that point. During each measurement at each measurement point, the signal module 1 is continuously rotated by the driving mechanism 3. The angle between the reflected beam and the reflecting structure 2 at each measurement point differs from the second angle position, and the angle between the incident beam and the reflecting structure 2 differs from the first angle position. The angle position refers to the location of the intersection point of the plane containing the outgoing / incident beam and the reflecting surface of the reflecting structure 2 when the outgoing / incident beam forms the first / second angle. Different angle positions correspond to different measurement point positions on the surface of the material 6.

[0051] Since this disclosure includes multiple reflective structures 2 and multiple signal modules 1, and the reflective structures 2 and the signal modules 1 are configured in a one-to-one correspondence, the process of the driving mechanism 3 driving the signal modules 1 to rotate can be divided into two cases: one case is that one driving mechanism 3 simultaneously drives multiple signal modules 1 to rotate synchronously; the other case is that multiple driving mechanisms 3 drive multiple signal modules 1 to rotate, specifically, each driving mechanism 3 drives one signal module 1 to rotate, in which case the number of driving mechanisms 3 matches the number of signal modules 1.

[0052] Specifically, such as Figure 3As shown, multiple signal modules 1 share a single driving mechanism 3. The multiple signal modules 1 are connected to the driving mechanism 3 via a second fixing member 5. The driving mechanism 3 drives the second fixing member 5 to rotate, thereby causing the multiple signal modules 1 to rotate synchronously. In this case, multiple signal modules 1 are simultaneously driven to rotate synchronously by a single driving mechanism 3. The multiple signal modules 1 can be fixed to the second fixing member 5. The driving mechanism 3 drives the second fixing member 5 to rotate, thereby causing the multiple signal modules 1 to perform multi-line scanning of the surface contour of the material 6. Figure 3 Multiple signal modules 1 share a single drive mechanism 3 via a second fixing member 5. To ensure that the rotation of the second fixing member 5 does not affect the transmission and reception of the beam, the second fixing member 5 can be connected to multiple signal modules 1 via multiple connectors, with the number of connectors matching the number of signal modules 1. The rotation of the second fixing member 5 can cause multiple signal modules 1 to rotate simultaneously. Specifically, synchronous rotation can be achieved in the following way: for example, the second fixing member 5 is positioned horizontally, and the connectors are positioned vertically. The rotation of the second fixing member 5 can be converted into the rotation of the connectors through gear meshing. This allows the rotation of the second fixing member 5 to drive the rotation of multiple connectors, which in turn drives the rotation of the signal modules 1. In this case, the rotation of the signal modules 1 is vertical, and the transmission and reception of the beams by the signal modules 1 are not affected by the rotation of the second fixing member 5 (e.g., obstruction). Of course, other connection methods besides gear meshing are possible, as long as one drive mechanism 3 can simultaneously drive multiple signal modules 1 to rotate. No specific limitation is made here.

[0053] Or, such as Figure 4 As shown, multiple drive mechanisms 3 can be configured, with each drive mechanism 3 corresponding to a different signal module 1. Each drive mechanism 3 is connected to a corresponding signal module 1, and each drive mechanism 3 is used to drive the corresponding signal module 1 to rotate.

[0054] At this time, the transmitting beam of each signal module 1 is emitted to a non-central region on the reflective surface of the reflective structure 2. During the rotation of the multiple signal modules 1, the multiple first angular positions formed by the reflective surfaces of the multiple reflective structures 2 and the transmitting beams of the multiple signal modules 1, as well as the multiple second angular positions formed by the transmitting beams, are constantly changing. This causes the reflected transmitting beams to reach different measurement points on the surface of the material 6. After passing through different measurement points, the beams are reflected to form reflected beams. The reflected beams are received by the reflective structure 2 and reflected by the reflective structure 2 to form incident beams. The incident beams are provided to the signal modules 1 to form measurement signals, thereby realizing the measurement of different measurement points. The multiple signal modules 1 perform multi-line scanning of the surface contour of the material 6 as the multiple reflective structures 2 rotate.

[0055] In both of the above cases, the signal module 1 can be directly or indirectly connected to the output shaft of the drive mechanism 3 in an L-shaped design. This allows the transmitting beam of the signal module 1 to be emitted onto the non-central region of the reflecting surface of the reflecting structure 2. As the signal module 1 rotates, the multiple first angular positions formed by the reflecting surfaces of the multiple reflecting structures 2 and the multiple transmitting beams of the multiple signal modules 1, as well as the multiple second angular positions formed by the emitted beams, continuously change.

[0056] (3) Case where the drive mechanism drives multiple signal measurement units to rotate

[0057] Multiple signal measurement units (multiple signal modules 1 and multiple reflective structures 2) are driven by the driving mechanism 3 to rotate synchronously, and the first angle of the reflecting surface of the reflective structure 2 relative to the emitted beam also changes continuously. Correspondingly, the direction of the emitted beam generated by the reflecting surface will shift relative to the previous emitted beam. Thus, the previous emitted beam was used to measure one measurement point on the surface of the material 6, while the emitted beam formed after the rotation of the multiple signal measurement units (multiple signal modules 1 and multiple reflective structures 2) measures another measurement point on the surface of the material 6. By continuously and synchronously rotating the multiple signal measurement units (multiple signal modules 1 and multiple reflective structures 2), the material measurement system can achieve measurement of the surface of the material 6 by a scanning surface composed of multiple measurement points.

[0058] During each measurement at different measurement points, the transmitted beam is emitted to the reflective structure 2. After being reflected by the reflective surface of the reflective structure 2, it forms an outgoing beam. After the outgoing beam reaches the measurement point on the surface of the material 6, it is reflected to form a reflected beam. The reflected beam is received by the reflective structure 2 and reflected by the reflective structure 2 to form an incident beam. The incident beam is provided to the signal module 1 to form a measurement signal, thereby realizing the measurement at that measurement point. During each measurement at each measurement point, multiple signal measurement units (multiple signal modules 1 and multiple reflective structures 2) are driven by the driving mechanism 3 to rotate continuously. The angle formed between the reflected beam and the reflective structure 2 at each measurement point is different from the second angle, and the angle formed between the incident beam and the reflective structure 2 is different from the first angle.

[0059] Since this disclosure includes multiple sets of signal measurement units (multiple signal modules 1 and multiple reflection structures 2), and each reflection structure 2 corresponds to a signal module 1, the process of the driving mechanism 3 rotating the multiple sets of signal measurement units (multiple signal modules 1 and multiple reflection structures 2) can be divided into two cases: one case is that one driving mechanism 3 simultaneously drives multiple sets of signal measurement units (multiple signal modules 1 and multiple reflection structures 2) to rotate synchronously; the other case is that multiple driving mechanisms 3 drive multiple sets of signal measurement units (multiple signal modules 1 and multiple reflection structures 2) to rotate, with each driving mechanism 3 driving one set of signal measurement units (one signal module 1 and one reflection structure 2) to rotate. In this case, the number of driving mechanisms 3 matches the number of signal measurement units (signal modules 1 and reflection structures 2).

[0060] Specifically, multiple signal measurement units (multiple signal modules 1 and multiple reflective structures 2) share a single driving mechanism 3. These multiple signal measurement units (multiple signal modules 1 and multiple reflective structures 2) are connected to the driving mechanism 3 via a third fixing member. The driving mechanism 3 drives the third fixing member to rotate, thereby causing the multiple signal measurement units (multiple signal modules 1 and multiple reflective structures 2) to rotate synchronously. In this case, a single driving mechanism 3 simultaneously drives multiple signal measurement units (multiple signal modules 1 and multiple reflective structures 2) to rotate synchronously. The multiple signal measurement units (multiple signal modules 1 and multiple reflective structures 2) can be fixed to the third fixing member. The driving mechanism 3 drives the third fixing member to rotate, thereby causing the multiple signal measurement units (multiple signal modules 1 and multiple reflective structures 2) to perform multi-line scanning of the surface contour of the material 6.

[0061] Alternatively, multiple drive mechanisms 3 can be configured, with each drive mechanism 3 corresponding to a set of signal measurement units (multiple signal modules 1 and multiple reflection structures 2). The output shaft of each drive mechanism 3 is connected to a corresponding set of signal measurement units (one signal module 1 and one reflection structure 2), and each drive mechanism 3 is used to drive the corresponding set of signal measurement units (one signal module 1 and one reflection structure 2) to rotate.

[0062] Alternatively, the material measurement system with multi-line scanning function disclosed herein may further include a fixed frame, multiple sets of signal measurement units (multiple signal modules 1 and multiple reflection structures 2) sharing a single drive mechanism 3, multiple sets of signal measurement units (multiple signal modules 1 and multiple reflection structures 2) being fixedly mounted to the fixed frame via a fourth fastener, the fixed frame being connected to the drive mechanism 3, and the drive mechanism 3 being used to drive the fixed frame to rotate so as to drive the multiple sets of signal measurement units (multiple signal modules 1 and multiple reflection structures 2) to rotate synchronously.

[0063] At this time, the transmitting beam of each signal module 1 is emitted onto the reflecting surface of the reflecting structure 2 (at the non-central region or the central region). During the rotation of the multiple signal measurement units (multiple signal modules 1 and multiple reflecting structures 2), the multiple first angles formed by the reflecting surfaces of the multiple reflecting structures 2 and the transmitting beams of the multiple signal modules 1, as well as the multiple second angles formed by the transmitting beams, continuously change. This causes the reflected transmitting beams to reach different measurement points on the surface of the material 6. After passing through different measurement points, the beams are reflected to form reflected beams. The reflected beams are received by the reflecting structure 2 and reflected by the reflecting structure 2 to form incident beams. The incident beams are provided to the signal module 1 to form measurement signals, thereby realizing the measurement of different measurement points. The rotation of the multiple signal measurement units (multiple signal modules 1 and multiple reflecting structures 2) causes the multiple signal modules 1 to perform multi-line scanning of the surface contour of the material 6.

[0064] In the specific embodiments of the above three driving methods, the driving mechanism 3 can be in the form of a motor or the like. The reflective structure 2 and / or the signal module 1 can be mounted on the output shaft of the motor by a fixing device, which can be the first fixing member 4, the second fixing member 5, the third fixing member and the fourth fixing member, or other fixing components.

[0065] The output shaft rotates to drive the reflective structure 2 and / or the signal module 1 to rotate. For example, the reflective structure 2 and / or the signal module 1 can be driven by a motor to rotate continuously in a single direction (counterclockwise or clockwise), or to rotate back and forth within a certain angle range of clockwise and counterclockwise, or to rotate according to a preset method.

[0066] The rotational speed of the motor can be adjusted, thereby correspondingly adjusting the rotational speed of the reflective structure 2 and / or the signal module 1. Controlling the motor's rotational speed allows for control of the rotational speed of the reflective structure 2 and / or the signal module 1. Since the rotational speed of the reflective structure 2 and / or the signal module 1 is adjustable, faster measurement of material 6 can be achieved in certain situations. Furthermore, the angle / angle position information of the reflective structure 2 and / or the signal module 1 can also be detected. This measurement can be achieved by detecting the rotational angle of the output shaft; for example, the angle / angle position information of the reflective structure 2 and / or the signal module 1 at different times can be obtained through calculation. The angle / angle position information can be measured using a rotary encoder mounted on the output shaft or using a position sensor, such as an angular displacement sensor.

[0067] Figure 1-4The diagram shows that the reflective structure 2 and / or the signal module 1 can be directly or indirectly connected to the output shaft of the motor via a fixing device; however, it should be understood that other connection methods are also possible. For example, the output shaft can be connected to the reflective structure 2 and / or the signal module 1 via a connecting mechanism with a spherical component, such as a universal joint. The rotation of the output shaft drives the rotation of the reflective structure 2 and / or the signal module 1, thereby changing the emission direction of the emitted beam. Ultimately, the rotation of the reflective structure 2 and / or the signal module 1 causes the emitted beams to form a rotating beam, thus creating a scanning surface. In this disclosure, the signal module 1 emits a transmission beam at preset fixed time intervals or time intervals that vary according to a preset pattern. For example, at the first moment, the transmission beam is emitted, reaching the reflective structure 2 and forming a first angle at the first moment. The transmission beam is reflected by the reflective structure 2 to form an outgoing beam, forming a second angle with the reflective structure 2 at the first moment. It reaches the surface of the material 6 to form a measurement point, and after being reflected by the surface of the material 6, it forms a reflected beam. Then, the reflected beam reaches the reflective structure 2 and is reflected again to form an incident beam, which is received by the signal module 1. During the process of each measurement point from the transmission beam to the incident beam, the driving mechanism 3 drives the reflective structure 2 and / or the signal module 1 to rotate at a preset fixed speed or a regularly varying speed. Then, at the second moment, the above steps are repeated... In this way, after the reflective structure 2 and / or the signal module 1 rotates one revolution or a certain angle, measurement signals of multiple measurement points on the surface of the material 6 can be obtained. Based on the measurement signals of each measurement point and the corresponding angle / angle position information of the reflective structure 2, multiple two-dimensional curves of the surface contour of the material 6 are constructed, that is, a multi-line scan of the surface of the material 6 is formed.

[0068] It should be noted that the installation angles of any two of the plurality of reflective structures 2 in this disclosure are either the same or different; or, at least two of the plurality of reflective structures 2 have different installation angles. If the initial installation angles of the plurality of reflective structures 2 are all the same, then the plurality of two-dimensional curves in the multi-line scan of the surface contour of the material 6 formed by the plurality of reflective structures 2 can be parallel or regularly arranged two-dimensional curves, and the number of two-dimensional curves is the same as the number of signal modules 1 / reflective structures 2. If the initial installation angles of the plurality of reflective structures 2 are all different or at least two are different, then the plurality of two-dimensional curves in the multi-line scan of the surface contour of the material 6 formed by the plurality of reflective structures 2 are non-parallel or irregularly arranged two-dimensional curves, and the number of two-dimensional curves is also the same as the number of signal modules 1 / reflective structures 2.

[0069] A material measurement system with multi-line scanning function according to at least one embodiment of the present disclosure may further include a waveguide structure fixed to the signal module 1 for guiding the transmitted beam to the reflective structure 2; and guiding the incident beam reflected back by the reflective structure 2 to the signal module 1.

[0070] The above describes several two-dimensional scanning measurement methods. However, in actual scenarios, the shape of material 6 is not uniform, so it is necessary to accurately measure the three-dimensional shape of material 6.

[0071] Therefore, the material measurement system of this disclosure may further include a displacement mechanism, which is used to move the aforementioned multiple sets of two-dimensional scanning measurement systems. The movement direction of the multiple sets of two-dimensional scanning measurement systems can form a predetermined angle with the multiple sets of two-dimensional scanning surfaces, thereby enabling the system to move to the next set of two-dimensional scanning surfaces after one set of two-dimensional scanning surfaces has been scanned, and repeating this process to obtain multiple sets of two-dimensional scanning surfaces. By detecting the movement information bits of the displacement mechanism, such as the movement speed and movement direction, the position information corresponding to each two-dimensional scanning surface can be obtained. Finally, by fusing the measurement information of multiple sets of two-dimensional scanning surfaces, the complete three-dimensional morphological information of material 6 can be obtained. Preferably, in this disclosure, the predetermined angle can be 90°, that is, the movement direction of the material measurement system with multi-line scanning function is perpendicular to the two-dimensional scanning surface. The signal module 1, the reflection structure 2, and the drive mechanism 3 can be regarded as a surface scanning device, and in this disclosure, the displacement mechanism causes the surface scanning device to move. The displacement mechanism can be in the form of a motor, a push rod, a guide rail, or various other forms. As an example, when the two-dimensional scanning surface is in a direction perpendicular to the paper surface, the direction in which the surface scanning device is moved can be the direction of the paper surface. When the two-dimensional scanning surface is in the direction of the paper, the direction in which the surface scanning device is moved can be perpendicular to the paper. As described in any of the preceding material measurement systems with multi-line scanning capabilities, the displacement mechanism and / or adjustment of the first angle / angle position between each of the reflecting structures 2 and the emitted beam allows switching between different two-dimensional scanning surfaces, thereby enabling measurement of the surface of the material 6 located on multiple two-dimensional scanning surfaces. Ultimately, based on the measurement information from multiple multi-line scanning surfaces, a complete three-dimensional measurement of the surface contour of the material 6 is achieved.

[0072] According to a further embodiment of this disclosure, the material measurement system of this disclosure may further include a housing, wherein the signal module 1, the reflective structure 2, and the drive mechanism 3 may be disposed inside the housing and may be fixed relative to the housing. The displacement mechanism may be disposed outside the housing, and the movement of the surface scanning device is achieved by pushing the entire housing to move. For example, the housing may be moved by connecting various types of displacement mechanisms, such as motor-type, push rod-type, and guide rail, to the outer surface of the housing. Alternatively, the displacement mechanism may be disposed separately relative to the signal measurement unit and the drive mechanism 3. For example, the signal measurement unit may be moved by various types of displacement mechanisms, such as motor-type, push rod-type, and guide rail, and the drive mechanism 3 may be moved by the various types of displacement mechanisms, such as motor-type, push rod-type, and guide rail, thereby also achieving the movement of the surface scanning device.

[0073] During the 3D scanning process, the surface scanning device can be moved to a first position, and the reflective structure 2 and / or the signal module 1 can be rotated to complete the detection of the first 2D scanning surface (the specific process can be referred to the previous description). Then, the surface scanning device can be moved to a second position, and the reflective structure 2 and / or the signal module 1 can be rotated to complete the detection of the second 2D scanning surface, and so on, until all positions are reached to complete the measurement of all 2D scanning surfaces. Afterwards, the measurement results of all 2D scanning surfaces can be combined, and by combining the moving speed and direction of the surface scanning device moved by the displacement mechanism, the corresponding position information of each 2D scanning surface can be obtained to obtain complete 3D measurement information of the material surface contour.

[0074] The preferred embodiments of this disclosure have been described in detail above with reference to the accompanying drawings. However, this disclosure is not limited to the specific details of the above embodiments. Within the scope of the technical concept of this disclosure, various simple modifications can be made to the technical solutions of this disclosure, and these simple modifications all fall within the protection scope of this disclosure.

[0075] It should also be noted that the various specific technical features described in the above specific embodiments can be combined in any suitable manner without contradiction. In order to avoid unnecessary repetition, this disclosure will not describe the various possible combinations separately.

[0076] Furthermore, various different embodiments of this disclosure can be combined in any way, as long as they do not violate the spirit of this disclosure, they should also be regarded as the content disclosed in this disclosure.

Claims

1. A material measurement system with multi-line scanning function, characterized in that, include: Multiple signal modules, wherein the signal modules are at least used to generate a transmit beam and receive an incident beam; Multiple reflective structures are provided, each set at a predetermined distance from the signal module, and reflect the transmitted beam generated by the signal module to form an emitted beam. The reflective surfaces of the reflective structures form multiple first angles / angle positions with the transmitted beam of the signal module and multiple second angles / angle positions with the emitted beam. Each reflective structure is configured in a one-to-one correspondence with the signal module. A driving mechanism is provided to drive multiple reflective structures and / or multiple signal modules to rotate in order to achieve multi-line scanning of the material surface contour.

2. The material measurement system with multi-line scanning function according to claim 1, characterized in that, Multiple reflective structures share a single driving mechanism. The multiple reflective structures are connected to the driving mechanism via a first fixing member. The driving mechanism is used to drive the first fixing member to rotate so that the multiple reflective structures rotate synchronously.

3. The material measurement system with multi-line scanning function according to claim 1, characterized in that, The driving mechanism is configured as a plurality of such mechanisms, each driving mechanism being configured in a one-to-one correspondence with a plurality of such reflective structures. Each driving mechanism is connected to a corresponding reflective structure, and each driving mechanism is used to drive the corresponding reflective structure to rotate.

4. The material measurement system with multi-line scanning function according to claim 1, characterized in that, Multiple signal modules share a single drive mechanism. The multiple signal modules are connected to the drive mechanism via a second fixing member. The drive mechanism is used to drive the second fixing member to rotate so that the multiple signal modules rotate synchronously.

5. The material measurement system with multi-line scanning function according to claim 1, characterized in that, The driving mechanism is configured as a plurality of such mechanisms, each driving mechanism being configured in a one-to-one correspondence with a plurality of such signal modules. Each driving mechanism is connected to a corresponding signal module, and each driving mechanism is used to drive the corresponding signal module to rotate.

6. The material measurement system with multi-line scanning function according to claim 1, characterized in that, Multiple signal modules and multiple reflective structures share a single driving mechanism. The multiple signal modules and multiple reflective structures are connected to the driving mechanism via a third fixing member. The driving mechanism is used to drive the third fixing member to rotate so that the multiple signal modules and multiple reflective structures rotate synchronously.

7. The material measurement system with multi-line scanning function according to claim 1, characterized in that, It also includes a fixed frame, and multiple signal modules and multiple reflective structures share a driving mechanism. Multiple signal modules and multiple reflective structures are fixedly installed on the fixed frame by a fourth fastener. The fixed frame is connected to the driving mechanism, and the driving mechanism is used to drive the fixed frame to rotate so as to drive multiple signal modules and multiple reflective structures to rotate synchronously.

8. The material measurement system with multi-line scanning function according to any one of claims 1-7, characterized in that, The transmitting beam of the signal module is emitted onto the reflective surface of the reflective structure. During the rotation of the multiple signal modules and / or multiple reflective structures, the multiple first angles / angle positions formed by the reflective surface of the reflective structure and the transmitting beam of the signal module, as well as the multiple second angles / angle positions formed by the reflective surface of the reflective structure and the emitted beam, are constantly changing. This causes the reflected emitted beam to reach different measurement points on the material surface, and after passing through different measurement points, it is reflected to form a reflected beam. The reflected beam is received by the reflective structure and reflected by the reflective structure to form an incident beam. The incident beam is provided to the signal module to form a measurement signal, thereby realizing the measurement at different measurement points.

9. The material measurement system with multi-line scanning function according to any one of claims 1-7, characterized in that, The rotation direction of the drive mechanism is a single direction of continuous counterclockwise or clockwise rotation, or a reciprocating rotation within a certain angle range of clockwise and counterclockwise, or rotation according to a preset method.

10. The material measurement system with multi-line scanning function according to claim 8, characterized in that, The installation angles of any two of the plurality of reflective structures are the same or different; or, at least two of the plurality of reflective structures have different installation angles. Preferably, the reflecting surface of the reflecting structure is at least one of a plane, a curved surface, a refracting surface, and a parabolic surface; Preferably, the system further includes a waveguide structure fixed to the signal module for guiding the transmitted beam to the reflection structure; and guiding the incident beam reflected back by the reflection structure to the signal module. Preferably, it also includes a displacement mechanism, which adjusts the first angle / angle position of each of the reflecting structures and the emitted beam to switch between different multiple two-dimensional scanning surfaces, thereby realizing the measurement of the material surface in multiple two-dimensional scanning surfaces, and finally realizing the three-dimensional measurement of the material surface contour based on the measurement information of multiple multi-line scanning surfaces; Preferably, the displacement mechanism controls the material measurement system to move in a direction that forms a predetermined angle with the two-dimensional scanning surface, so as to realize the measurement of the material surface in multiple two-dimensional scanning surfaces; Preferably, the predetermined included angle is 90°.

Images