Novel camera test structure

By using the ACF test structure in camera testing, the problem of high-frequency signal attenuation caused by probe wear was solved, resulting in lower testing costs and higher product quality.

CN223885249UActive Publication Date: 2026-02-06NANCHANG TXD PRECISION OPTOELECTRONICS CO LTD
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Patent Information

Application Number
CN202520378871.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-03-06
Publication Date
2026-02-06
Estimated Expiration
2035-03-06

AI Technical Summary

Technical Problem

In existing camera testing, the conductivity of the probe is easily worn and contaminated, leading to high-frequency signal attenuation, high testing costs, and unstable quality.

Method used

The probeless ACF test structure is adopted, which is fixed to the test board with conductive adhesive. Through the interface design of the combination of vertical cavity and trapezoidal cavity, simple contact and frictionless transmission of camera pins are achieved.

Benefits of technology

This increases the number of times camera tests can be reused, reduces testing costs, and ensures stable transmission of high-frequency signals and product quality.

✦ Generated by Eureka AI based on patent content.

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    Figure CN223885249U_ABST
Patent Text Reader

Abstract

The utility model discloses a novel camera test structure, which comprises a test base and a cover plate structure, a placing cavity for placing a camera module is arranged in the middle of the top of the test base, a placing disc is arranged in an inner cavity of the placing cavity, a groove structure for installing a detection mechanism is designed at the top of the cover plate structure, and the cover plate structure is arranged in the groove structure. One side of the bottom of the cover plate structure is provided with an insertion port used for insertion and butt joint of pins, the insertion port is specifically a combination of a vertical cavity and a trapezoidal cavity, and the large-caliber end of the insertion port faces the test base. Through the cover plate structure capable of moving up and down and the design of the insertion port with the inner cavity in the specific shape of the combination of the vertical cavity and the trapezoidal cavity, when camera detection is carried out, mutual friction of pins is avoided, only simple contact is generated, excessive friction of the pins is avoided, and the number of times of recycling can be increased.
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Description

TECHNICAL FIELD

[0001] The utility model relates to camera production technical field, concretely is a novel camera test structure. BACKGROUND

[0002] Camera is traditional input device, and the process design manufacturing in all walks of life has been very mature.

[0003] In camera manufacturing industry, testing is an indispensable process, which is to ensure that the camera has data as a basis from the electrical performance and image performance when the camera is produced and delivered to the customer; many test items are included in the test, and each pcs of test module needs to be tested, so the consumption of the probe in the conventional test fixture is huge, and the new developed ACF test structure fixture does not use the probe at all, wherein the ACF test structure is simple, and the reuse frequency is high Product characteristics 1. The resistance of conductive adhesive itself is very small, which is accurate to the actual side plate; 2. Very long opening time; 3. Soft conductive glue leaves no mark on the plate surface; 4. Resistivity is as low as 4.0 μΩ; 5. Method of use: spread the conductive adhesive on the test surface of the fixture for direct use to play the role of conduction; 6. Small test PAD circular can measure 4mil above rectangular can measure 2mil-4mil above small edge to edge distance 3mil, small PITCH is 6mil; 7. Test life: generally 100,000-120,000 times, mainly according to the test fixture; 8. The same material number can be used to produce multiple test fixtures at the same time, and the production cost and time will not increase too much; 9. The fixture is light and thin, convenient to save and save space. The product is recommended to be applied to the test equipment by using the conductive adhesive pad, compared with the probe test, the probe is in contact with abrasion, and the number of times is large, which will pollute the gold surface of the probe, resulting in reduced conductive performance, which will bring unpredictable influence to the test, and the ACF is a compression test without damaging the structure.

[0004] Use ACF to fix on the test plate, the test plate is connected with the test box through the coaxial line, and the corresponding interval of the test plate corresponds to the test connector or the position of the gold finger module. After compression, the upper and lower parts are just connected to each other, and the adjacent parts are not connected to each other to transmit electrical signals.

[0005] At that time, the above-mentioned prior art scheme has some defects and deficiencies:

[0006] Low reuse rate: the probe is used for contact type transmission of conduction electrical signal, the surface of the probe is electroplated with gold, so that the conductive performance of the probe is strong. When the test increases, the gold on the surface of the probe is abraded or contaminated, the resistance between the probe and the measured object increases obviously, the high-frequency signal transmission is obviously attenuated, the image is wrong, and finally the probe needs to be replaced frequently to ensure the test quality, so that the test cost is very high.

[0007] Therefore, we propose a camera test structure to solve the above problems. The utility model discloses a novel camera test structure, which is used to solve the problems in the prior art.

[0008] The utility model discloses a novel camera test structure, which is used to solve the problems in the prior art.

[0009] To achieve the above object, the utility model provides the following technical scheme:

[0010] A novel camera test structure, which comprises a test base and a cover plate structure, wherein a placing cavity for placing a camera module is arranged in the middle of the top of the test base, a placing disc is arranged in the inner cavity of the placing cavity, a groove structure for mounting a detection mechanism is designed on the top of the cover plate structure, a plug-in interface for pin insertion and butt joint is arranged on one side of the bottom of the cover plate structure, the plug-in interface is a combination of a vertical cavity and a trapezoidal cavity, and the large-diameter end of the plug-in interface faces the test base.

[0011] Preferably, a limiting column is fixedly installed at the four corner positions of the top of the test base, and the top of the limiting column penetrates through the cover plate structure and extends to the outside of the top of the cover plate structure.

[0012] Preferably, a buffer spring is sleeved on each of the upper end and the lower end of the outer ring of the limiting column, and a limiting sheet is fixedly installed on the top of the limiting column.

[0013] Preferably, a guide column is penetratively installed at the four corner positions of the top of the placing disc, a limiting sheet structure is also installed on the top of the guide column, and a small spring is sleeved on the outer ring of the guide column.

[0014] Preferably, a roller structure is embeddedly installed on the top of the placing disc, and a positioning pressing strip is fixedly installed on the middle of the bottom of the cover plate structure.

[0015] Preferably, the roller structure is rotatably installed on the placing disc, the positioning pressing strip is a rubber strip structure, and the width of the positioning pressing strip is smaller than the width of the placing disc.

[0016] Compared with the prior art, the utility model has the beneficial effects that:

[0017] The novel camera test structure has the following advantages: the plug-in interface is designed to be a combination of a vertical cavity and a trapezoidal cavity, the cover plate structure can move up and down, and the pin does not rub against each other during camera detection, but only contacts, so that the quality of the product can be improved, the camera function can be realized even in the case of simple contact, that is, the product is an excellent product, and the pins do not rub against each other too much, so that the number of times of recycling can be increased. BRIEF DESCRIPTION OF DRAWINGS

[0018] Fig. 1 The utility model structural schematic diagram is shown in the figure;

[0019] Fig. 2 The exploded view of the test base structure of the utility model;

[0020] Fig. 3 The bottom view of the cover plate structure of the utility model.

[0021] In the figure: 1, test base; 2, cover plate structure; 3, placing cavity; 4, placing disc; 5, plug-in interface; 6, limiting column; 7, buffer spring; 8, guide column; 9, small spring; 10, roller structure; 11, positioning batten. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the utility model.

[0023] As Figs. 1-3 shown, the utility model provides a novel camera test structure technical scheme:

[0024] Embodiment:

[0025] The test device mainly includes test base 1 and cover plate structure 2, and the middle part of the top of test base 1 is provided with placing cavity 3 for placing the camera module to be detected, placing disc 4 is arranged in the inner cavity of placing cavity 3, recess structure for installing detection mechanism is arranged in the middle part of the top of cover plate structure 2, and plug-in interface 5 for pin insertion is formed in one end of the bottom of cover plate structure 2, and the specific shape of the inner cavity of plug-in interface 5 is the combination of vertical cavity and trapezoidal cavity, and the large-diameter end of plug-in interface 5 faces test base.

[0026] Among them, limiting column 6 is fixedly installed at the four corner positions of the top of test base 1, and the top of limiting column 6 penetrates cover plate structure 2 and extends to the outside of the top of cover plate structure 2.

[0027] Among them, buffer spring 7 is sleeved on the upper and lower ends of the outer circle of limiting column 6, and limiting sheet is fixedly connected to the top end of limiting column 6.

[0028] Among them, guide column 8 is penetratively installed at the top four corner positions of placing disc 4, and limiting sheet is also fixedly installed at the top of guide column 8, the bottom of guide column 8 is fixedly connected with the bottom of the inner wall of placing cavity 3, and small spring 9 is sleeved on the outer circle of guide column 8.

[0029] The roller structure 10 is embedded in the middle of the top of the placing disc 4, and the positioning pressing strip 11 is fixedly installed in the middle of the bottom of the cover plate structure 2.

[0030] The roller structure 10 is rotatably installed on the top of the placing disc 4, and the positioning pressing strip 11 is a rubber strip, and the width of the rubber strip is less than the width of the placing disc 4.

[0031] In the embodiment, when the camera module is detected by using the device, the camera module to be detected is directly placed on the placing disc 4, and the pin of the camera module is located below the plug interface 5.

[0032] Then, the detection equipment can be powered on, and the detection personnel directly presses the cover plate structure 2 downward. When the pin of the camera module starts to contact the plug interface 5, due to the position, the pin structure is not in the up-down position relationship with the pin of the detection mechanism, so the camera pin gradually slides along the inclined surface of the plug interface 5 until it is connected with the detection mechanism. In this process, the pin structure of the detection mechanism does not have too much friction, but only contacts the camera pin structure.

[0033] In the process of pressing downward and adjusting the camera pin, since the pin needs to be adjusted, the roller structure 10 can be matched to more smoothly adjust the position. After adjustment, the positioning pressing strip 11 gradually increases the acting force between the camera module, so that the detection result is not easily affected by external factors during the detection process.

[0034] In the technical solution, firstly, the plug interface is designed by the vertically movable cover plate structure 2 and the specific shape of the inner cavity is a combination of a vertical cavity and a trapezoidal cavity. When the camera is detected, the pins do not rub each other, but only contact each other, which can improve the quality requirements for products, and the camera function can be realized under the condition of simple contact, that is, the product is excellent. Secondly, the pins are not excessively rubbed, and the number of cycles can be increased.

[0035] Although the embodiments of the utility model have been shown and described, those skilled in the art can understand that various changes, modifications, replacements and variations can be made to the embodiments without departing from the principles and spirits of the utility model, and the scope of the utility model is defined by the appended claims and their equivalents.

Claims

1. A novel camera test structure comprising a test base (1) and a cover plate structure (2), characterized in that: The middle part of the top of the test base (1) is provided with a placing cavity (3) for placing a camera module, a placing disc (4) is installed in the inner cavity of the placing cavity (3), the top of the cover plate structure (2) is designed with a groove structure for installing a detection mechanism, one side of the bottom of the cover plate structure (2) is provided with a plug-in port (5) for needle pin insertion and docking, the plug-in port (5) is a combination of a vertical cavity and a trapezoidal cavity, and the large-diameter end of the plug-in port (5) faces the test base (1).

2. The novel camera test structure according to claim 1, wherein: The four corners of the top of the test base (1) are fixedly provided with limiting columns (6), the top of the limiting column (6) penetrates through the cover plate structure (2) and extends to the outside of the top of the cover plate structure (2).

3. The novel camera test structure according to claim 2, wherein: The upper and lower ends of the outer circle of the limiting column (6) are both provided with buffer springs (7), and the top of the limiting column (6) is fixedly provided with a limiting piece.

4. The novel camera test structure according to claim 1, wherein: The top of the placing disc (4) is provided with a guide column (8) penetratingly installed at the four corners, the top of the guide column (8) is also provided with a limiting piece structure, and the outer circle of the guide column (8) is provided with a small spring (9).

5. The novel camera test structure according to claim 1, wherein: The top of the placing disc (4) is embeddedly provided with a roller structure (10), and the middle part of the bottom of the cover plate structure (2) is fixedly provided with a positioning pressing strip (11).

6. The novel camera test structure according to claim 5, wherein: The roller structure (10) is rotatably installed on the placing disc (4), the positioning pressing strip (11) is a rubber strip structure, and the width of the positioning pressing strip (11) is smaller than the width of the placing disc (4).