Weak absorption instrument convenient for testing curved surface sample

Abstract

The utility model discloses a weak absorption instrument convenient for testing a curved surface sample, which comprises a pump light laser, a chopper, a first reflector and a focusing adjusting frame which are arranged according to the path of a first light beam, and the first light beam is vertically irradiated on the sample after being adjusted by the light path of the focusing adjusting frame; a first reflecting prism is arranged on the path of the second light beam, the second light beam obliquely irradiates the sample under the angle adjustment of the first reflecting prism, and the second light beam penetrating through the sample is obliquely emitted; a sample is assembled on the material bearing table, the material bearing table is installed at the bottom of the movable mechanical arm, and the distance between the limiting blocking piece below the material bearing table and the in-situ blocking piece is adjustable. According to the utility model, the curved surface sample is clamped in the in-situ baffle plate and the limiting baffle plate, and the clamping degree is adjusted by screwing in and screwing out the fastening bolt, so that the curved surface sample clamping device is adaptive to curved surface samples with different thicknesses, and the movable mechanical arm at the upper end is regulated and controlled to drive the material bearing table to move, so that the occupied space of the three-axis structure can be reduced.

Description

Technical Field

[0001] This utility model relates to the field of optoelectronic product measurement technology, specifically a weak absorber that facilitates testing of curved surface samples. Background Technology

[0002] Weak absorber instruments for thin film sample testing are commonly used to measure the weak absorption coefficients of optical materials or thin films. This is crucial for studying the laser damage threshold of materials, thermal lensing effects, and improving the performance of laser systems. Existing thin film sample testing devices mainly use a three-axis linkage motorized actuator to move the thin film sample and thus achieve measurement. However, this device has the following problems: 1. The three-axis linkage structure occupies a large area, requiring a relatively spacious installation, and may interfere with the original optical path system during movement; 2. The three-axis linkage structure has higher equipment costs due to the presence of multiple components; 3. The three-axis linkage structure often moves only one structure at a time during movement, resulting in slower movement efficiency, increased testing time, and lower flexibility; furthermore, this structure is generally suitable for relatively regular thin film shapes and cannot effectively fix samples with curvature.

[0003] Therefore, this invention proposes a weak absorber that is convenient for testing curved surface samples, in order to solve the above-mentioned problems. Utility Model Content

[0004] The purpose of this invention is to provide a weak absorber that is convenient for testing curved surface samples, so as to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a weak absorption instrument for testing curved surface samples, comprising a pump laser, a chopper, a first reflector, and a focusing adjustment frame arranged according to the path of a first beam, wherein the first beam is vertically struck on the sample after being adjusted by the focusing adjustment frame.

[0006] A first reflecting prism is set in the path of the second beam. The second beam hits the sample at an angle under the adjustment of the angle of the first reflecting prism, and the second beam passes through the sample and exits at an angle.

[0007] The sample is assembled on the support platform, which is installed at the bottom of the movable robotic arm. A situ baffle is fixedly installed on one side of the support platform and a limiting baffle is provided on the other side. The distance between the limiting baffle and the situ baffle is adjustable. The sample is detachably assembled between the limiting baffle and the situ baffle. A light transmission hole is provided in the center of the situ baffle.

[0008] The first beam eventually hits the power meter, and the second beam eventually hits the detector.

[0009] Preferably, the focusing adjustment frame consists of two directional adjustment knobs and a 75mm focusing lens.

[0010] Preferably, the in-situ baffle and the limiting baffle are connected by a set bolt, and the in-situ baffle is provided with a threaded hole that mates with the set bolt.

[0011] Preferably, after passing through the sample, the second beam of light is sequentially incident on the second reflecting prism and the second reflecting mirror, and finally strikes the detector.

[0012] Preferably, a focusing adjustment frame is provided between the second reflecting prism and the second reflecting mirror to adjust the optical path of the second beam.

[0013] Preferably, the focal points of the first beam and the second beam on the sample overlap.

[0014] Compared with the prior art, the beneficial effects of this utility model are:

[0015] This invention clamps curved surface samples in in-situ baffles and limiting baffles, and adjusts the clamping tightness by screwing in and out the set bolts, making it adaptable to curved surface samples of different thicknesses. Both the limiting baffles and the in-situ baffles are mounted on a support platform, which is located at the bottom of the movable robotic arm. Therefore, the support platform can be moved by adjusting the upper movable robotic arm without affecting the original optical path system. Placing the movable robotic arm above the measurement area reduces the footprint of existing three-axis structures, lowers equipment costs associated with multiple structures, and reduces the time required for sequential driving of each axis. During the testing process, it allows for rapid positioning and testing based on instructions, resulting in smoother operation. Attached Figure Description

[0016] Figure 1 This is a three-dimensional structural schematic diagram of the present invention;

[0017] Figure 2 for Figure 1 Top view;

[0018] Figure 3 for Figure 1 The front view;

[0019] Figure 4 This is an enlarged schematic diagram of the connection between the movable robotic arm and the material receiving platform in this utility model;

[0020] Figure 5 for Figure 4 The right-side cross-section.

[0021] In the diagram: 1 Pump laser, 2 Chopper, 3 First reflector, 4 Focusing adjustment frame, 5 First reflector prism, 6 Movable robotic arm, 7 Material receiving platform, 8 In-situ baffle, 81 Threaded hole, 82 Light transmission hole, 9 Limiting baffle, 91 Set bolt, 10 Second reflector prism, 11 Second reflector, 12 Detector, 13 Power meter. Detailed Implementation

[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0023] Please see Figure 1-5 This utility model provides a weak absorption instrument for easy testing of curved surface samples, including a pump laser 1, a chopper 2, a first reflector 3, and a focusing adjustment frame 4 arranged according to the first beam path. The focusing adjustment frame 4 consists of two direction adjustment knobs and a 75mm focusing lens. After the first beam is adjusted by the focusing adjustment frame 4, it hits the sample vertically. A first reflector 5 is arranged in the second beam path. The second beam hits the sample obliquely under the angle adjustment of the first reflector 5. The second beam passing through the sample is emitted obliquely.

[0024] The sample is assembled on the support platform 7, which is installed at the bottom of the movable robotic arm 6. A situ baffle 8 is fixedly installed on one side of the support platform 7 and a limiting baffle 9 is provided on the other side. The distance between the limiting baffle 9 and the situ baffle 8 is adjustable. The sample is detachably assembled between the limiting baffle 9 and the situ baffle 8. The situ baffle 8 has a light transmission hole 82 in the center. The situ baffle 8 and the limiting baffle 9 are connected by a set bolt 91. The situ baffle 8 has a threaded hole 81 that mates with the set bolt 91. The distance between the limiting baffle 9 and the situ baffle 8 can be adjusted by rotating the set bolt 91 inward to facilitate the matching of curved surface samples of different thicknesses.

[0025] The first beam eventually hits the power meter 13. The second beam passes through the sample and then enters the second reflecting prism 10 and the second reflecting mirror 11 in sequence, finally hitting the detector 12. In order to adjust the angle, a focusing adjustment frame 4 is provided between the second reflecting prism 10 and the second reflecting mirror 11 to adjust the optical path of the second beam. In actual operation, the focal positions of the first beam and the second beam on the sample overlap.

[0026] The measurement principle of this invention employs surface thermal lensing technology, specifically the photothermal co-path interferometry method based on this technology. It utilizes the photothermal effect caused by strong laser irradiation on optical materials or thin films, resulting in film distortion, i.e., photothermal deformation. This deformation can be approximated as a curved lens surface. A standard probe beam, after passing through this surface, will produce a coupling diffraction effect. By measuring this diffraction effect and inferring the deformation of the film surface, many optical properties of the optical thin film and material can be obtained. The sample under test undergoes a refractive index gradient distribution under the action of the first and second beams. The probe light is distorted as it passes through the refractive index gradient region of the sample. By measuring the degree of distortion of the probe light, the absorption of the sample is determined. This scheme facilitates side viewing of the curved sample by setting the beam... By setting the injection point vertically and positioning the movable robotic arm and the support platform vertically to the tabletop, the footprint of the existing three-axis structure is reduced, improving space utilization. The movable robotic arm positioned above the operating area increases the flexibility of moving curved samples and reduces the impact on the original optical path system. Clamping and replacing curved samples is achieved using in-situ baffles, limit baffles, and set bolts, facilitating sample replacement by staff, reducing mutual interference between parts and safety threats to staff, and decreasing sample arrival time, thus improving testing efficiency. Furthermore, this solution allows adjustment of the robotic arm's angle and spatial position based on the known sample radius of curvature and sample size. It should be noted that the movement of the movable robotic arm is an existing technology.

[0027] Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A weak absorbance analyzer for easy testing of curved surface samples, characterized in that: It includes a pump laser, a chopper, a first reflector, and a focusing adjustment frame arranged according to the first beam path. The first beam is vertically struck on the sample after being adjusted by the focusing adjustment frame. A first reflecting prism is set in the path of the second beam. The second beam hits the sample at an angle under the adjustment of the angle of the first reflecting prism, and the second beam passes through the sample and exits at an angle. The sample is assembled on the support platform, which is installed at the bottom of the movable robotic arm. A situ baffle is fixedly installed on one side of the support platform and a limiting baffle is provided on the other side. The distance between the limiting baffle and the situ baffle is adjustable. The sample is detachably assembled between the limiting baffle and the situ baffle. A light transmission hole is provided in the center of the situ baffle. The first beam eventually hits the power meter, and the second beam eventually hits the detector.

2. The weak absorbance analyzer for testing curved surface samples according to claim 1, characterized in that: The focusing adjustment frame consists of two directional adjustment knobs and a 75mm focusing lens.

3. The weak absorbance analyzer for testing curved surface samples according to claim 1, characterized in that: The in-situ baffle and the limiting baffle are connected by a set bolt, and the in-situ baffle is provided with a threaded hole that mates with the set bolt.

4. The weak absorbance analyzer for testing curved surface samples according to claim 1, characterized in that: After passing through the sample, the second beam of light sequentially enters the second reflecting prism and the second reflecting mirror, and finally hits the detector.

5. A weak absorber for testing curved surface samples according to claim 4, characterized in that: A focusing adjustment frame is also provided between the second reflecting prism and the second reflecting mirror to adjust the optical path of the second beam.

6. A weak absorber for testing curved surface samples according to any one of claims 1-5, characterized in that: The focal points of the first and second beams on the sample overlap.

Images