High and low temperature testing device for semiconductor field effect transistor
By designing the air intake and fixing mechanism, the problems of temperature non-uniformity and transistor position instability in the high and low temperature test device were solved, achieving temperature uniformity and test accuracy, and ensuring the reliability of transistors in high and low temperature environments.
Patent Information
- Application Number
- CN202520218951.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-21
- Publication Date
- 2026-02-17
- Estimated Expiration
- 2036-01-21
AI Technical Summary
Existing high and low temperature testing equipment suffers from uneven temperature distribution during use, resulting in inconsistent heating of transistor components, which may lead to delamination or cracking of the transistors.
A high and low temperature testing device for semiconductor field-effect transistors was designed, including an air-expelling mechanism and a fixing mechanism. The air-expelling mechanism regulates the airflow inside the test chamber through a gear and rack system driven by a motor to ensure temperature uniformity. The fixing mechanism fixes the transistors through a clamping mechanism to prevent them from changing position during thermal expansion and contraction.
This method achieves uniform temperature distribution within the testing chamber, avoids the impact of thermal stress on the transistor structure, ensures the accuracy and stability of the test, and prevents transistor displacement and measurement data deviation during the testing process.
Smart Images
Figure CN223926467U_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of transistor technology, and in particular relates to a high and low temperature testing device for semiconductor field-effect transistors. Background Technology
[0002] High and low temperature testing of semiconductor field-effect transistors refers to the comprehensive testing of their electrical performance changes, such as the stability of parameters like threshold voltage and on-resistance, under high and low temperature environments. Low temperatures can expose material defects, while high temperatures test heat dissipation and thermal stress resistance. Through this test, transistors can be screened and optimized to ensure reliable operation in complex environments, thereby improving the performance and stability of electronic products.
[0003] Some existing high and low temperature testing devices may have uneven temperature distribution during use, which may lead to inconsistent heating of different parts of the transistor. As a result, different materials in different parts may shrink or expand at different temperatures, which may cause the transistor components to delaminate or crack. Utility Model Content
[0004] The purpose of this invention is to provide a high and low temperature testing device for semiconductor field-effect transistors. By incorporating a fan mechanism, it solves the problem of uneven temperature distribution that may occur in some existing high and low temperature testing devices during use.
[0005] To solve the above-mentioned technical problems, this utility model is achieved through the following technical solution:
[0006] This utility model relates to a high and low temperature testing device for semiconductor field-effect transistors, comprising a support platform, on which a fan mechanism and a fixing mechanism are provided.
[0007] The air-guiding mechanism includes a detection box fixedly connected to the top of the support platform. A ventilation plate is fixedly connected to the inner wall of the detection box. Two slide rails are fixedly connected to the top of the ventilation plate. A slider is slidably connected to the inner wall of each of the two slide rails. A rack is fixedly connected to the top of each of the two sliders. A support rod is fixedly connected to the top of the ventilation plate. A gear is rotatably connected to the top of the support rod. The gear meshes with the two racks. Two slide rods are fixedly connected to the inner wall of the support platform. Air-guiding plates are slidably connected to each of the two slide rods. Each air-guiding plate is fixedly connected to a corresponding rack.
[0008] Furthermore, a motor is fixedly connected to the top of the testing box, and the output shaft of the motor is fixedly connected to a rotating shaft via a coupling. The bottom end of the rotating shaft extends into the interior of the testing box and is rotatably connected to the testing box.
[0009] Furthermore, a connecting plate is fixedly connected to the bottom end of the rotating shaft, a connecting rod is fixedly connected to the bottom of the connecting plate, and a mouth-shaped plate is fixedly connected to the top of the corresponding rack.
[0010] Furthermore, a roller is rotatably connected to the bottom end of the connecting rod, the roller is slidably connected to the inner wall of the orifice plate, and two limiting plates are fixedly connected to the connecting rod.
[0011] Furthermore, the fixing mechanism includes a placement plate fixedly connected to the inner wall of the detection box, and two sliding rods are fixedly connected to the inner wall of the support platform, with support plates fixedly connected to the two sliding rods.
[0012] Furthermore, a second support rod is fixedly connected to the top of the support plate, a Z-shaped plate is rotatably connected to the top of the second support rod, two sliders are slidably connected to the two second sliders, and three sliders are slidably connected to the two second sliders.
[0013] Furthermore, both slider two and slider three are hinged to the Z-shaped plate with connecting plate two. The top of the placement plate has two sliding grooves. The tops of both slider two and slider three are fixedly connected with clamping plates. The tops of the two clamping plates extend to the top of the placement plate and are slidably connected to the corresponding sliding grooves.
[0014] Furthermore, a pull rod is fixedly connected to the right side of the second slider. The right end of the pull rod extends to the outside of the detection box and is slidably connected to the detection box. A spring is wound around the pull rod. One end of the spring is fixedly connected to the second slider, and the other end of the spring is fixedly connected to the right inner wall of the detection box. A knob is fixedly connected to the right end of the pull rod.
[0015] This utility model has the following beneficial effects:
[0016] 1. By setting up an air-inducing mechanism and starting the motor, the motor drives the rotating shaft to rotate. When the rotating shaft rotates, it drives the connecting plate to rotate. When the connecting plate rotates, it drives the connecting rod to rotate. When the connecting rod rotates, it drives the orifice plate to move through the rollers. When the orifice plate moves, it drives the rack connected to the orifice plate to move. When the rack connected to the orifice plate moves, it drives the gear to rotate. When the gear rotates, it drives the rack not connected to the orifice plate to move. When the two racks move, they drive the air-inducing plate to slide on the slide rod. The air-inducing mechanism changes the air pressure between the inner walls of the detection chamber, thereby promoting the continuous exchange of air between the area where the air-inducing plate is located and the surrounding environment. This makes the air in different locations in the detection chamber mix, making the temperature more uniform and avoiding the problem of temperature dead zones in corners. At the same time, it avoids the problem of local temperature differences inside the detection chamber, which can cause thermal stress. This prevents thermal stress from changing the internal structure of the transistor, thus interfering with the test results and affecting the accuracy and stability of the test.
[0017] 2. By setting a fixing mechanism, slowly releasing the knob allows the spring to return to its original tension under elastic action, causing the pull rod to move slider two. Slider two's movement moves connecting plate two, which in turn moves connecting plate two. Connecting plate two's movement rotates the Z-shaped plate, which in turn moves slider three via connecting plate two. The movement of slider two and slider three then moves the clamping plate. This fixing mechanism firmly secures the transistor, ensuring its position remains constant throughout the test. This prevents the transistor from shifting due to thermal expansion and contraction during testing, ensuring stable contact between the test probe and the transistor pins. It also prevents displacement caused by external vibrations during testing, avoiding measurement data deviations and ensuring test accuracy.
[0018] Of course, any product implementing this utility model does not necessarily need to achieve all of the advantages described above at the same time. Attached Figure Description
[0019] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0020] Figure 1 This is a schematic diagram of the overall structure of this utility model;
[0021] Figure 2 This is a front cross-sectional view of the present invention.
[0022] Figure 3 This is a schematic diagram of the left-side cross-sectional structure of this utility model;
[0023] Figure 4 This is a schematic diagram of the structure of the motor of this utility model;
[0024] Figure 5 This is a schematic diagram of the structure of the slide bar II of this utility model;
[0025] Figure 6 This utility model Figure 4 A magnified structural diagram of A in the diagram.
[0026] The attached diagram lists the components represented by each number as follows:
[0027] 1. Support platform; 2. Air intake mechanism; 3. Fixing mechanism; 21. Detection box; 22. Ventilation plate; 23. Slide rail; 24. Slider one; 25. Rack; 26. Support rod one; 27. Gear; 28. Slide rod one; 29. Air intake plate; 210. Motor; 211. Rotating shaft; 212. Connecting plate one; 213. Connecting rod; 214. Orifice plate; 215. Roller; 216. Limiting plate; 31. Placement plate; 32. Slide rod two; 33. Support plate; 34. Support rod two; 35. Z-shaped plate; 36. Slider two; 37. Slider three; 38. Connecting plate two; 39. Slide groove; 310. Clamping plate; 311. Pull rod; 312. Spring; 313. Knob. Detailed Implementation
[0028] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.
[0029] Please see Figure 1-5As shown, this utility model is a high and low temperature testing device for semiconductor field-effect transistors, including a support platform 1. The support platform 1 is equipped with a draft mechanism 2 and a fixing mechanism 3. The draft mechanism 2 includes a detection box 21 fixedly connected to the top of the support platform 1. A ventilation plate 22 is fixedly connected to the inner wall of the detection box 21. Two slide rails 23 are fixedly connected to the top of the ventilation plate 22. Sliding sliders 24 are slidably connected to the inner walls of both slide rails 23. Racks 25 are fixedly connected to the tops of both sliding sliders 24. A support rod 26 is fixedly connected to the top of the ventilation plate 22. A gear 27 is rotatably connected to the top of the support rod 26, meshing with the two racks 25. Two sliding rods 28 are fixedly connected to the inner wall of the support platform 1. Two air-guiding plates 29 are slidably connected to each other, and each air-guiding plate 29 is fixedly connected to a corresponding rack 25. A motor 210 is fixedly connected to the top of the detection box 21. The output shaft of the motor 210 is fixedly connected to a rotating shaft 211 via a coupling. The bottom end of the rotating shaft 211 extends into the interior of the detection box 21 and is rotatably connected to the detection box 21. A connecting plate 212 is fixedly connected to the bottom of the rotating shaft 211. A connecting rod 213 is fixedly connected to the bottom of the connecting plate 212. A mouth-shaped plate 214 is fixedly connected to the top of the corresponding rack 25. A roller 215 is rotatably connected to the bottom end of the connecting rod 213. The roller 215 is slidably connected to the inner wall of the mouth-shaped plate 214. Two limit plates 216 are fixedly connected to the connecting rod 213. The detection is changed by the air-guiding mechanism 2. The air pressure between the inner walls of the chamber 21 promotes continuous air exchange between the area where the air intake plate 29 is located and the surrounding environment, resulting in air mixing at different locations within the chamber 21. This makes the temperature more uniform, avoiding temperature dead zones in corners and preventing localized temperature differences within the chamber 21 that could cause thermal stress. Thermal stress can alter the internal structure of the transistor, interfering with test results and affecting the accuracy and stability of the test. The fixing mechanism 3 includes a placement plate 31 fixedly connected to the inner wall of the chamber 21. Two sliding rods 32 are fixedly connected to the inner wall of the support platform 1. A support plate 33 is fixedly connected to the two sliding rods 32, and a support rod 34 is fixedly connected to the top of the support plate 33. The top of the plate 31 is rotatably connected to a Z-shaped plate 35. Two sliders 36 and 37 are slidably connected to two sliding rods 32. Both sliders 36 and 37 are hinged to the Z-shaped plate 35 by connecting plates 38. Two grooves 39 are formed at the top of the plate 31. Clamping plates 310 are fixedly connected to the tops of both sliders 36 and 37. The tops of the clamping plates 310 extend to the top of the plate 31 and are slidably connected to the corresponding grooves 39. A pull rod 311 is fixedly connected to the right side of slider 36. The right end of the pull rod 311 extends to the outside of the detection box 21 and is slidably connected to it. A spring 312 is wound around the pull rod 311, and one end of the spring 312 is fixedly connected to slider 36.The other end of spring 312 is fixedly connected to the inner right wall of the test box 21, and a knob 313 is fixedly connected to the right end of pull rod 311. The transistor is firmly fixed by the fixing mechanism 3, ensuring that the transistor's position remains unchanged throughout the entire test process. This prevents the transistor from shifting due to thermal expansion and contraction during testing, thus ensuring stable contact between the test probe and the transistor pins. Simultaneously, it prevents the transistor from shifting due to external vibrations during testing, thereby avoiding measurement data deviations and ensuring test accuracy.
[0030] A specific application of this embodiment is as follows: Starting the motor 210, the motor 210 drives the rotating shaft 211 to rotate. When the rotating shaft 211 rotates, it drives the connecting plate 212 to rotate. When the connecting plate 212 rotates, it drives the connecting rod 213 to rotate. When the connecting rod 213 rotates, it drives the roller 215 to slide on the inner wall of the orifice plate 214, simultaneously moving the orifice plate 214. The roller 215 reduces the frictional resistance of the connecting rod 213 on the inner wall of the orifice plate 214. The limiting plate 216 limits the connection of the connecting rod 213, preventing it from disengaging from the orifice plate 214. When the orifice plate 214 moves, it drives the rack connected to the orifice plate 214. When rack 25 moves, it drives gear 27 to rotate. When gear 27 rotates, it drives rack 25, which is not connected to rack 214, to move. When both racks 25 move, they drive air guide plate 29 to slide on slide rod 28. The slide rod 28 limits the movement of air guide plate 29. The movement of air guide plate 29 causes air convection in the detection box 21, making the temperature distribution in the detection box 21 more uniform. When the two support rods 26 move, the corresponding slider 24 moves in the corresponding slide rail 23. The slide rail 23 and slider 24 limit the movement path of rack 25.
[0031] Pulling knob 313 moves lever 311, which in turn moves slider 36, causing spring 312 to contract. Sliding slider 36 rotates via connecting plate 38, and the Z-shaped plate 35 rotates via connecting plate 38. The rotation of Z-shaped plate 35 then moves slider 37, causing it to move. This causes the two clamping plates 310 to move away from each other. After placing the transistor to be tested between the two clamping plates 310, slowly release knob 313. Spring 312 is reset and stretched under elastic action, which causes pull rod 311 to drive slider 36 to move. When slider 36 moves, it drives connecting plate 38 connected to slider 36 to move. When connecting plate 38 connected to slider 36 moves, it drives Z-shaped plate 35 to rotate. When Z-shaped plate 35 rotates, it drives slider 37 to move through connecting plate 38 connected to slider 37. When slider 36 and slider 37 move, they drive clamping plate 310 to move, so that the two clamping plates 310 move closer to each other to clamp and fix the transistor.
[0032] In the description of this specification, references to terms such as "an embodiment," "example," "specific example," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.
[0033] The preferred embodiments of this utility model disclosed above are merely illustrative of the present utility model. These preferred embodiments do not exhaustively describe all details, nor do they limit the utility model to the specific implementations described. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of this utility model, thereby enabling those skilled in the art to better understand and utilize it. This utility model is limited only by the claims and their full scope and equivalents.
Claims
1. A high and low temperature testing device for semiconductor field effect transistors, comprising a support table (1), a wind guide mechanism (2) and a fixing mechanism (3) are arranged on the support table (1), characterized in that: the wind guide mechanism (2) comprises a detection box (21) fixedly connected to the top of the support table (1), the inner wall of the detection box (21) is fixedly connected with a ventilation plate (22), the top of the ventilation plate (22) is fixedly connected with two slide rails (23), the inner walls of the two slide rails (23) are both slidingly connected with slide blocks one (24), the top of the two slide blocks one (24) are both fixedly connected with racks (25), the top of the ventilation plate (22) is fixedly connected with a support rod one (26), the top end of the support rod one (26) is rotatably connected with a gear (27), the gear (27) is engaged with the two racks (25), the inner wall of the support table (1) is fixedly connected with two slide rods one (28), the two slide rods one (28) are both slidingly connected with wind guide plates (29), the two wind guide plates (29) are both fixedly connected with corresponding racks (25).
2. The device according to claim 1, wherein, The top of the detection box (21) is fixedly connected with a motor (210), the output shaft of the motor (210) is fixedly connected with a rotating shaft (211) through a shaft coupling, the bottom end of the rotating shaft (211) extends into the inside of the detection box (21) and is rotatably connected with the detection box (21).
3. The device according to claim 2, wherein, The bottom end of the rotating shaft (211) is fixedly connected with a connecting plate one (212), the bottom of the connecting plate one (212) is fixedly connected with a connecting rod (213), the top of the corresponding rack (25) is fixedly connected with a mouth-shaped plate (214).
4. The device according to claim 3, wherein the device is characterized by: The bottom end of the connecting rod (213) is rotatably connected with a roller (215), the roller (215) is slidingly connected with the inner wall of the mouth-shaped plate (214), the connecting rod (213) is fixedly connected with two limiting plates (216).
5. The device according to claim 4, wherein the device is characterized by: The fixing mechanism (3) comprises a placement plate (31) fixedly connected to the inner wall of the detection box (21), the inner wall of the support table (1) is fixedly connected with two slide rods two (32), the two slide rods two (32) are fixedly connected with support plates (33).
6. The device for high and low temperature test of semiconductor field effect transistor according to claim 5, characterized in that, The top of the support plate (33) is fixedly connected with a support rod two (34), the top end of the support rod two (34) is rotatably connected with a Z-shaped plate (35), the two slide rods two (32) are slidingly connected with slide blocks two (36), the two slide rods two (32) are slidingly connected with slide blocks three (37).
7. The device according to claim 6, wherein the device is characterized by: The slide blocks two (36) and the slide blocks three (37) are both hingedly connected with connecting plates two (38) of the Z-shaped plate (35), the top of the placement plate (31) is provided with two slide grooves (39), the top of the slide blocks two (36) and the slide blocks three (37) are both fixedly connected with clamping plates (310), the top of the two clamping plates (310) both extend to the top of the placement plate (31) and are slidingly connected with corresponding slide grooves (39).
8. The device according to claim 7, wherein, The right side of the slider two (36) is fixedly connected with a pull rod (311), the right end of the pull rod (311) extends to the outside of the detection box (21) and is in sliding connection with the detection box (21), a spring (312) is wound on the pull rod (311), one end of the spring (312) is fixedly connected with the slider two (36), the other end of the spring (312) is fixedly connected with the right side inner wall of the detection box (21), and the right end of the pull rod (311) is fixedly connected with a knob (313).