TFT cell test mainboard

Abstract

The utility model discloses a TFT cell test mainboard, which relates to the technical field of test mainboards, and comprises a DC-DC voltage conversion circuit used for converting an input voltage into a voltage suitable for test; the MCU output PWM regulation and control voltage and time sequence control circuit is used for outputting a PWM signal to regulate and control the voltage and the time sequence; a cell test positive and negative voltage switching circuit; the backlight circuit is used for providing a backlight test; according to the scheme, the TFT cell test mainboard can be shared within 25 square wave output signal channels through design, so that the number of models of the test mainboard is reduced, the universality of the test mainboard is remarkably improved, the same mainboard can be suitable for testing TFT cells of different brands and models, and the test efficiency is improved. And the inventory management and maintenance work is simplified.

Description

TECHNICAL FIELD

[0001] The utility model relates to test mainboard technical field, concretely is a TFT cell test mainboard. BACKGROUND

[0002] In the existing TFT (Thin Film Transistor, thin film transistor) cell test field, the design of test mainboard often has some limitations and deficiencies. These test mainboards usually have multiple models to adapt to different brands and models of TFT cell, which leads to inconvenience in maintenance and management. In addition, the existing test mainboards also have limitations in function, for example, they can at most provide clock square wave signal output of 16 test points. When the TFT cell test requirement exceeds 16 signals, these mainboards cannot meet the test requirements.

[0003] Another problem is that production test personnel need to manually adjust multiple potentiometers VR on the mainboard to change the voltage value for testing to meet the specification requirements according to the voltage requirements of different models of TFT cell during the test process. This manual adjustment not only is inconvenient to operate, but also increases the risk of errors and time cost in the test process.

[0004] In addition, due to the design limitations of test mainboards, they may not be able to provide sufficient flexibility and accuracy in the test process to adapt to changing test requirements and improve test efficiency. These limitations and deficiencies hinder the development and innovation of TFT cell test technology to some extent

[0005] In order to overcome the deficiencies of the prior art, the present scheme provides a TFT cell test mainboard, which aims to realize a more efficient test process, reduce maintenance cost, and improve the flexibility and accuracy of testing. CONTENT OF THE UTILITY MODEL

[0006] In view of the deficiencies of the prior art, the utility model provides a TFT cell test mainboard, which solves the problems proposed in the background art.

[0007] To achieve the above purpose, the utility model is implemented by the following technical solutions: a TFT cell test mainboard, comprising:

[0008] A DC-DC voltage conversion circuit for converting input voltage into a voltage suitable for testing;

[0009] An MCU output PWM control voltage and timing control circuit for outputting PWM signals to control voltage and timing;

[0010] A cell test positive and negative voltage switching circuit;

[0011] A backlight circuit for providing a backlight test;

[0012] Twenty-five square wave output signal channels, each channel capable of independently adjusting duty cycle, peak value and frequency;

[0013] The MCU output PWM control voltage and timing control circuit is connected with the cell test positive and negative voltage switching circuit, to realize automatic control and adjustment of the required positive and negative voltage values of the TFT cell test point, without manual adjustment of the potentiometer VR.

[0014] Preferably, the duty cycle of the twenty-five square wave output signal channels is adjustable in the range of 0-100%, the peak value is adjustable in the range of -22V to 22V, and the frequency is adjustable in the range of 0-250KHZ,

[0015] Preferably, the twenty-five square wave output signal channels include at least twenty-five independent output pins, each pin capable of outputting an independent square wave signal, wherein the peak value of the square wave signal ranges from -22V to 22V.

[0016] Preferably, the MCU control interface is used to receive control signals from the microcontroller to realize automatic control of voltage and timing.

[0017] Preferably, the cell test positive and negative voltage switching circuit is designed to realize automatic control and adjustment of the required positive and negative voltage values of the TFT cell test point.

[0018] Preferably, the backlight circuit includes at least one LED driver and one current limiting resistor for driving the LED and limiting the current, and the MCU output PWM control voltage and timing control circuit is connected with the cell test positive and negative voltage switching circuit to realize automatic control and adjustment of the required positive and negative voltage values of the TFT cell test point.

[0019] The utility model provides a TFT cell test mainboard. Has the following beneficial effects:

[0020] (1) Improve the versatility of the test mainboard: the TFT cell test mainboard of the present scheme can be shared within 25 square wave output signal channels, thereby reducing the number of test mainboard models, which significantly improves the versatility of the test mainboard, allowing the same mainboard to be applicable to TFT cell tests of different brands and models, simplifying inventory management and maintenance work.

[0021] (2) Automatic voltage adjustment, improve test efficiency: the scheme adjusts the positive and negative voltage value required by the TFT cell test point through the MCU firmware control, without the need for production test personnel to manually adjust the potentiometer VR; this automatic voltage adjustment not only improves the efficiency of the test process, but also reduces human error, ensuring the accuracy and consistency of the test results.

[0022] (3) Enhance test flexibility and accuracy: the TFT cell test mainboard of the scheme provides 25 square wave output signal channels that can independently adjust the duty cycle, peak value and frequency; this design allows test personnel to flexibly adjust signal parameters according to specific test requirements, thereby enhancing the flexibility of the test; at the same time, through the precise control of the MCU, the accuracy of the test voltage is improved, meeting the requirements of high-precision testing.

[0023] Thus, the problems of a large number of test mainboards, limited number of signal outputs, and inconvenient manual voltage adjustment in the prior art are solved, and the test efficiency and accuracy are improved. BRIEF DESCRIPTION OF DRAWINGS

[0024] Figure 1 The figure is a functional module schematic diagram of the utility model. DETAILED DESCRIPTION

[0025] The technical solutions in the embodiments of the utility model will be described clearly and completely below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the utility model.

[0026] Embodiment 1:

[0027] The utility model embodiment provides a technical scheme: a TFT cell test mainboard, comprising:

[0028] A DC-DC voltage conversion circuit is used to convert the input voltage into a voltage suitable for testing, ensuring the stability and adaptability of the voltage during testing;

[0029] An MCU output PWM control voltage and timing control circuit is used to output a PWM signal to control the voltage and timing, realizing accurate voltage and timing control;

[0030] The MCU output PWM control voltage and timing control circuit is connected with the cell test positive and negative voltage switching circuit, so that the positive and negative voltage values required by the TFT cell test point are automatically controlled and adjusted, and the personnel manually adjusts the potentiometer VR, so that the inconvenient operation of manually adjusting the potentiometer VR in the prior art is solved, the test efficiency is improved, the human error is reduced, and the test process is more stable and reliable.

[0031] Embodiment 2:

[0032] The utility model embodiment provides a technical scheme, a kind of TFT cell test mainboard, including twenty-five square wave output signal channels, each channel can independently adjust duty ratio, peak value and frequency, specifically:

[0033] The adjustable range of duty ratio is 0-100%, allowing the tester to accurately control the duration of the signal according to the test requirements;

[0034] The adjustable range of peak value is-22V to 22V, covering a wide range of voltage test requirements;

[0035] The adjustable range of frequency is 0-250KHZ, providing sufficient frequency adjustment space to adapt to different test scenarios;

[0036] The twenty-five square wave output signal channels include at least twenty-five independent output pins, each pin can output an independent square wave signal, wherein the peak value of the square wave signal ranges from-22V to 22V, the flexibility and accuracy of the square wave output signal channel enable the scheme to adapt to various TFT cell test requirements, improving the adaptability and accuracy of the test, and also providing more test options and higher test accuracy for the tester.

[0037] Embodiment 3:

[0038] The utility model embodiment provides a technical scheme: a kind of TFT cell test mainboard, including a backlight circuit, for providing backlight test, including at least one LED driver and one current limiting resistance, for driving LED and limiting current, ensure the stability and safety of backlight test;

[0039] The MCU control interface is used to receive control signals from the microcontroller to realize automatic control of voltage and timing, enhancing the automation degree of the test mainboard;

[0040] The cell test positive and negative voltage switching circuit is designed to automatically control and adjust the positive and negative voltage values required by the TFT cell test point, further optimizing the test process;

[0041] The integration of the backlight circuit and the MCU control interface provides a comprehensive test solution, including backlight testing and precise voltage timing control, further enhancing the functionality of the test mainboard and the reliability of the test. Through centralized control by the MCU, the test process is more automated, reducing human intervention and improving the consistency and repeatability of the test.

[0042] Working principle: The external power input, usually 24V DC voltage, is converted by the DC-DC voltage conversion circuit to a voltage suitable for TFT cell testing, ensuring the stability and adaptability of the voltage during the test process; then, the MCU (Micro Control Unit) generates PWM (Pulse Width Modulation) signals according to the preset test parameters or instructions received through the external programming interface, and these signals are adjusted by the MCU output PWM control voltage and timing control circuit to meet the specific requirements of the TFT cell test points for voltage and timing; the cell test positive and negative voltage switching circuit automatically switches the required positive and negative voltage according to the control signal of the MCU, without the need for manual intervention, improving the degree of automation and efficiency of the test;

[0043] At the same time, the twenty-five square wave output signal channels independently adjust their duty cycle, peak value and frequency according to the instructions of the MCU to adapt to different testing needs; the output pin of each channel can output an independent square wave signal, and the peak value of these signals ranges from -22V to 22V, and the frequency range is 0-250KHZ; the LED driver and current limiting resistor in the backlight circuit work under the control of the MCU to provide a stable backlight test environment, in which the MCU output PWM control voltage and timing control circuit is connected to the backlight circuit to achieve precise control of the backlight intensity and timing;

[0044] The MCU control interface receives control signals from the microcontroller, which are used to adjust the resistance of the potentiometer VR to achieve automatic control of voltage and timing; through the MCU control interface, the test mainboard can achieve precise control of the test process, including the adjustment of voltage, timing and backlight parameters; the entire test process is automated through centralized control by the MCU, reducing the need for human operation and improving the consistency and repeatability of the test, while also helping to reduce errors during the test process and improve the accuracy of the test results;

[0045] This design not only improves test efficiency, but also reduces human error through automated control, making the test process more stable and reliable; through precise voltage and timing control, as well as flexible square wave output signal channels, the TFT cell test mainboard can adapt to various TFT cell testing needs, improving the adaptability and accuracy of the test; in addition, the integration of the backlight circuit provides a comprehensive test solution, further enhancing the functionality of the test mainboard and the reliability of the test.

[0046] The basic principle and main features of the present application and the advantages of the present application are shown and described above. It is obvious for those skilled in the art that the present application is not limited to the details of the above exemplary embodiments, and the present application can be implemented in other specific forms without departing from the spirit or basic characteristics of the present application. Therefore, from any point of view, the embodiments should be regarded as exemplary and non-limiting, and the scope of the present application is defined by the appended claims rather than the above description, and therefore all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be included in the present application. Any reference signs in the claims should not be considered as limiting the claims involved.

[0047] In addition, it should be understood that although the present specification is described in terms of embodiments, not every embodiment contains only one independent technical solution, and the description manner of the specification is only for the sake of clarity, those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that those skilled in the art can understand.

Claims

1. A TFT cell test mainboard, characterized in that: The application relates to a TFT cell test device, which comprises the following parts: a DC-DC voltage conversion circuit for converting an input voltage into a voltage suitable for testing; an MCU output PWM control voltage and timing control circuit for outputting a PWM signal to control voltage and timing; a cell test positive and negative voltage switching circuit; a backlight circuit for providing backlight testing; twenty-five square wave output signal channels, each of which can independently adjust duty ratio, peak value and frequency; the MCU output PWM control voltage and timing control circuit is connected with the cell test positive and negative voltage switching circuit, so that automatic control and adjustment of required positive and negative voltage values of a TFT cell test point can be realized, and a person does not need to manually adjust a potentiometer VR. 2.The TFT cell test mainboard of claim 1, wherein: The duty ratio of the twenty-five square wave output signal channels can be adjusted in the range of 0-100%, the peak value can be adjusted in the range of -22V to 22V, and the frequency can be adjusted in the range of 0-250KHZ. 3.The TFT cell test mainboard of claim 1, wherein: The twenty-five square wave output signal channels comprise at least twenty-five independent output pins, each of which can output an independent square wave signal, wherein the peak value of the square wave signal ranges from -22V to 22V.

4. The TFT cell test mainboard of claim 1, wherein: The device further comprises an MCU control interface for receiving a control signal from a microcontroller to realize automatic control of voltage and timing.

5. The TFT cell test mainboard of claim 1, wherein: The cell test positive and negative voltage switching circuit is designed to realize automatic control and adjustment of required positive and negative voltage values of a TFT cell test point.

6. The TFT cell test mainboard of claim 1, wherein: The backlight circuit comprises at least one LED driver and a current limiting resistor for driving an LED and limiting current, and the MCU output PWM control voltage and timing control circuit is connected with the cell test positive and negative voltage switching circuit to realize automatic control and adjustment of required positive and negative voltage values of a TFT cell test point.

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