Chip temperature testing device

Abstract

The utility model discloses a chip temperature testing device, which belongs to the technical field of chip detection, and comprises a main body structure and a tester, one side of the tester is fixedly connected with a display, the top of the tester is fixedly connected with a base, the top of the base is fixedly connected with a detection seat, and the top of the detection seat is provided with a chip slot; the ejection assembly is arranged at the top of the detection seat and comprises a lifting part, the lifting part is fixedly connected to the other side of the tester, the bottom of the lifting part is fixedly connected with a heating sleeve, and the heating sleeve is located at the top of the detection seat; through the design of the connecting rod and the ejection block, the ejection groove in the bottom of the chip groove and the interference groove in the top of the base are matched, the chip can be easily ejected out of the chip groove without the help of an additional tool, damage to the chip when an operator takes out the chip is avoided, the convenience of chip operation is improved, and then the working efficiency is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip detection technical field, concretely is a chip temperature testing device. BACKGROUND

[0002] The existing chip temperature testing device heats the chip by setting the heating module on the top of the chip, and monitors the change of the chip performance parameter with temperature by using the testing device. Many chip testing devices are based on similar principles, and evaluate the performance of the chip at different temperature conditions by controlling the working temperature of the chip.

[0003] In the current chip temperature testing field, the traditional device lacks convenient and efficient design in the installation and removal of the chip. The chip card slot is often designed to be hidden or difficult to operate. The operator needs to use additional tools when putting the chip into the card slot accurately and taking out the chip after testing. The operation process is easy to damage the chip, affecting the normal use of the chip and the accuracy of the test results. It is time-consuming and laborious, and reduces the work efficiency.

[0004] Therefore, the person skilled in the art provides a chip temperature testing device to solve the problems mentioned in the prior art. UTILITY MODEL CONTENTS

[0005] In order to solve the above problems, the utility model provides a chip temperature testing device.

[0006] The utility model is realized through the following technical schemes:

[0007] A chip temperature testing device, comprising

[0008] The main body structure comprises a tester, the side of the tester is fixedly connected with a display, the top of the tester is fixedly connected with a base, the top of the base is fixedly connected with a detection seat, and the top of the detection seat is provided with a chip slot; and

[0009] The ejecting assembly is arranged on the top of the detection seat and comprises a lifting piece, the lifting piece is fixedly connected to the other side of the tester, the bottom of the lifting piece is fixedly connected with a heating sleeve, the heating sleeve is located on the top of the detection seat, and the side of the lifting piece is provided with an ejecting piece.

[0010] Preferably, the lifting piece comprises a lifting seat fixedly connected to the other side of the tester, the top of the lifting seat is rotatably connected with a screw rod through a bearing, the top of the screw rod is fixedly connected with a rotating handle, the bottom of the screw rod penetrates through the lifting seat and is threadedly connected with a movable block, the side of the movable block is fixedly connected with a movable plate, the top of the side of the movable plate is fixedly connected with a bent plate, and the bottom of the bent plate is fixedly connected with the heating sleeve.

[0011] As preferred, the lifting piece further comprises a pipe clamp fixer fixedly connected to the top of the lifting seat, which is sleeved on the surface of the screw rod.

[0012] As preferred, one side of the lifting seat is fixedly connected with a guide rail, and the other side of the movable plate is fixedly connected with a guide block which is slidingly connected to one side of the guide rail.

[0013] As preferred, the ejector comprises a connecting rod fixedly connected to the bottom of one side of the movable plate, one side of the connecting rod is fixedly connected with an ejecting block, the bottom of the chip groove is provided with an ejecting groove matched with the ejecting block, the top of the base is provided with an interference groove located at the bottom of the connecting rod and the ejecting block and matched with the connecting rod and the ejecting block.

[0014] As preferred, the inner wall of the heating sleeve is embedded with a heating wire, and the cross-sectional area of the heating sleeve is larger than that of the detection seat.

[0015] Compared with the prior art, the utility model has the advantages that:

[0016] 1、The utility model discloses a connecting rod and the design of ejecting block, cooperate the ejecting groove of the bottom of chip groove and the interference groove of the top of base, do not need to lend additional tools to easily eject the chip from the chip groove, avoid the damage of chip when taking out chip by operating personnel, improve the convenience of chip operation, and then improve work efficiency, and when installing the chip, the clear and easy chip groove position also reduces the difficulty of chip installation, and guarantees the safety of chip installation process.

[0017] 2、The utility model discloses a heating wire is embedded in the inner wall of heating sleeve and the cross-sectional area is larger than the cross-sectional area of detection seat, can realize the stable and uniform heating to chip, makes chip in stable temperature environment in the testing process. ACCURACY OF DRAWINGS

[0018] Fig. 1 It is the whole structure schematic diagram of the utility model;

[0019] Fig. 2 It is the ejector assembly structure schematic diagram of the utility model;

[0020] Fig. 3 It is the lifting piece structure explosion schematic diagram of the utility model;

[0021] Fig. 4 It is the lifting piece and the ejector local structure explosion schematic diagram of the utility model.

[0022] In the drawing: 100, main body structure;101, tester;102, display;103, base;104, detection seat;105, chip groove.

[0023] 200, ejection assembly; 201, lifting piece; 202, heating sleeve; 203, ejector;

[0024] 2011, lifting seat; 2012, screw rod; 2013, rotating handle; 2014, movable block; 2015, movable plate; 2016, bent plate; 2017, pipe clamp fixer; 2018, guide rail; 2019, guide block;

[0025] 2031, connecting rod; 2032, ejection block; 2033, ejection groove; 2034, interference groove. DETAILED DESCRIPTION

[0026] The technical solutions in the embodiments of the utility model will be apparently and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all the other embodiments obtained by the ordinary skilled in the art without creative labor fall within the protection scope of the utility model.

[0027] Please refer to Figs. 1-4 The embodiments provided by the utility model:

[0028] The chip temperature testing device disclosed by the embodiments of the present application comprises

[0029] The main body structure 100 comprises a tester 101, the tester 101 is fixedly connected with a display 102 on one side, the tester 101 is fixedly connected with a base 103 on the top, the base 103 is fixedly connected with a detection seat 104 on the top, and the detection seat 104 is provided with a chip groove 105 on the top; and

[0030] The ejection assembly 200 is arranged on the top of the detection seat 104 and comprises a lifting piece 201, the lifting piece 201 is fixedly connected to the other side of the tester 101, the bottom of the lifting piece 201 is fixedly connected with a heating sleeve 202, the heating sleeve 202 is located on the top of the detection seat 104, and the lifting piece 201 is provided with an ejector 203 on one side.

[0031] As a technical optimization scheme of the utility model, the tester 101 in the main body structure 100 is used for testing the performance parameters of the chip, the display 102 can visually display the test data, the base 103 and the detection seat 104 provide support for chip installation, the chip groove 105 is used for placing the chip, the ejection assembly 200 provides convenience for taking out the chip, and the lifting piece 201 cooperates with the heating sleeve 202 to realize the heating operation of the chip, which is the basic structure setting of the whole device to realize the temperature testing function.

[0032] The lifting piece 201 comprises a lifting seat 2011 fixedly connected to the other side of the tester 101, a screw rod 2012 rotatably connected to the top of the lifting seat 2011 through a bearing, a rotating handle 2013 fixedly connected to the top of the screw rod 2012, and a movable block 2014 threadedly connected to the bottom of the screw rod 2012, one side of the movable block 2014 being fixedly connected with an activity plate 2015, the top of one side of the activity plate 2015 being fixedly connected with a bent plate 2016, and the bottom of the bent plate 2016 being fixedly connected with the heating sleeve 202.

[0033] As a technical optimization scheme of the utility model, the lifting seat 2011 is fixed to the other side of the tester 101, the height of the movable block 2014 can be accurately adjusted by rotating the screw rod 2012 and utilizing the threaded connection between the screw rod 2012 and the movable block 2014, the movable block 2014 drives the activity plate 2015, and then the lifting of the heating sleeve 202 is realized through the bent plate 2016, which provides the possibility of controlling the distance between the heating sleeve 202 and the chip, thereby better controlling the heating effect.

[0034] The lifting piece 201 further comprises a pipe clamp fixer 2017 fixedly connected to the top of the lifting seat 2011, the pipe clamp fixer 2017 being sleeved on the surface of the screw rod 2012.

[0035] As a technical optimization scheme of the utility model, the pipe clamp fixer 2017 is sleeved on the surface of the screw rod 2012 and fixed to the top of the lifting seat 2011, which plays a role in stabilizing the screw rod 2012, prevents unnecessary shaking of the screw rod 2012 during the rotation of the screw rod 2012, ensures the stability of the lifting process, makes the lifting operation of the heating sleeve 202 more accurate and reliable, and indirectly improves the stability and controllability of the chip heating process.

[0036] One side of the lifting seat 2011 is fixedly connected with a guide rail 2018, and the other side of the activity plate 2015 is fixedly connected with a guide block 2019 which is slidingly connected to one side of the guide rail 2018.

[0037] As a technical optimization scheme of the utility model, the guide rail 2018 is fixed to one side of the lifting seat 2011, and the guide block 2019 is fixed to the other side of the activity plate 2015 and slidingly connected with the guide rail 2018, which provides a guiding effect for the movement of the activity plate 2015, so that the activity plate 2015 can only move along the direction of the guide rail 2018 during the lifting process, further ensuring the accuracy and stability of the lifting of the heating sleeve 202, avoiding deviation during the lifting process, and affecting the heating effect on the chip.

[0038] The ejector 203 comprises a connecting rod 2031 fixedly connected to the bottom of one side of the movable plate 2015, one side of the connecting rod 2031 is fixedly connected with an ejector block 2032, the bottom of the chip groove 105 is provided with an ejector groove 2033, the ejector groove 2033 is matched with the ejector block 2032, and the top of the base 103 is provided with an interference groove 2034, the interference groove 2034 is located at the bottom of the connecting rod 2031 and the ejector block 2032 and is matched with the connecting rod 2031 and the ejector block 2032.

[0039] As a technical optimization scheme of the utility model, the ejector block 2032 is connected with the connecting rod 2031, when the movable plate 2015 rises, the ejector block 2032 can rise and penetrate the ejector groove 2033, and the chip is ejected from the chip groove 105, so that the problem of inconvenient chip taking out in the traditional device is solved, and the interference groove 2034 can prevent the connecting rod 2031 and the ejector block 2032 from being unnecessarily hindered in the descending process.

[0040] The inner wall of the heating sleeve 202 is embedded with heating wires, and the cross-sectional area of the heating sleeve 202 is greater than that of the detection seat 104.

[0041] As a technical optimization scheme of the utility model, the inner wall of the heating sleeve 202 is embedded with heating wires, and the cross-sectional area of the heating sleeve 202 is greater than that of the detection seat 104, so that the chip can be better covered, the uniform heating of the chip is ensured, the chip is in a stable and uniform temperature environment in the testing process, and the change of the chip performance parameter with temperature can be accurately monitored.

[0042] Working principle: firstly, the chip is placed in the chip groove 105 on the top of the detection seat 104, at this time, the tester 101 starts to work, tests the initial performance parameter of the chip, and transmits the data to the display 102 for display, then, the rotating handle 2013 in the lifting piece 201 is rotated, the screw rod 2012 rotates in the lifting seat 2011, the movable block 2014 is driven to descend due to the threaded connection, the movable plate 2015 is lowered, the guide block 2019 slides on the guide rail 2018 to ensure the stability of the descending process, and the heating sleeve 202 gradually approaches the chip in the descending process, the heating wires are turned on to heat the chip after the heating sleeve 202 approaches the chip, the tester 101 continuously monitors the change of the chip performance parameter and displays on the display 102 as the temperature of the chip rises, and after the test is completed, the rotating handle 2013 is reversely rotated, the heating sleeve 202 is lifted, when the movable plate 2015 is lifted to a certain position, the ejector block 2032 in the ejector 203 enters the ejector groove 2033 at the bottom of the chip groove 105, and the chip is ejected from the chip groove 105, so that the chip is conveniently taken out.

[0043] In the utility model, unless another definite provision and limitation, the term "installation", "arrangement", "connection", "fix", "screw joint" and so on term should do the broad sense understanding, for example, can be fixed connection, also can be detachable connection, or be integrated;Can be mechanical connection, also can be electrical connection;Can be directly connected, also can be indirectly connected through the intermediate medium, can be two element inside's intercommunication or two element's mutual action relation, unless another definite limitation, for the ordinary skill in the art, can understand the above-mentioned term in the utility model specific meaning according to specific circumstances.

[0044] In summary, only for the preferred embodiment of the utility model, and not to limit the scope of the utility model implementation, all equivalent changes and modifications of the shape, structure, features and spirit described in the utility model claim range should be included in the utility model claim range.

Claims

1. A chip temperature testing apparatus, characterized by comprising: Comprising The main structure (100) includes a tester (101), one side of the tester (101) is fixedly connected with a display (102), the top of the tester (101) is fixedly connected with a base (103), the top of the base (103) is fixedly connected with a detection seat (104), and the top of the detection seat (104) is provided with a chip slot (105); and The ejection assembly (200) is arranged on the top of the detection seat (104) and includes a lifting piece (201), the lifting piece (201) is fixedly connected to the other side of the tester (101), the bottom of the lifting piece (201) is fixedly connected with a heating sleeve (202), the heating sleeve (202) is located on the top of the detection seat (104), and one side of the lifting piece (201) is provided with an ejection piece (203).

2. The chip temperature testing apparatus according to claim 1, wherein: The lifting piece (201) includes a lifting seat (2011) fixedly connected to the other side of the tester (101), the top of the lifting seat (2011) is rotatably connected with a screw rod (2012) through a bearing, the top of the screw rod (2012) is fixedly connected with a rotating handle (2013), the bottom of the screw rod (2012) penetrates through the lifting seat (2011) and is threadedly connected with a movable block (2014), one side of the movable block (2014) is fixedly connected with a movable plate (2015), the top of one side of the movable plate (2015) is fixedly connected with a bent plate (2016), and the bottom of the bent plate (2016) is fixedly connected with the heating sleeve (202).

3. The chip temperature testing apparatus according to claim 2, wherein: The lifting piece (201) further includes a pipe clamp fixer (2017) fixedly connected to the top of the lifting seat (2011), and the pipe clamp fixer (2017) is sleeved on the surface of the screw rod (2012).

4. The chip temperature testing apparatus according to claim 3, wherein: One side of the lifting seat (2011) is fixedly connected with a guide rail (2018), the other side of the movable plate (2015) is fixedly connected with a guide block (2019), and the guide block (2019) is slidably connected to one side of the guide rail (2018).

5. The chip temperature testing apparatus according to claim 4, wherein: The ejection piece (203) includes a connecting rod (2031) fixedly connected to the bottom of one side of the movable plate (2015), one side of the connecting rod (2031) is fixedly connected with an ejection block (2032), the bottom of the chip slot (105) is provided with an ejection slot (2033), the ejection slot (2033) is matched with the ejection block (2032), the top of the base (103) is provided with an interference slot (2034), the interference slot (2034) is located at the bottom of the connecting rod (2031) and the ejection block (2032) and is matched with the connecting rod (2031) and the ejection block (2032).

6. The chip temperature testing apparatus of claim 1, wherein: The inner wall of the heating sleeve (202) is embedded with a heating wire, and the cross-sectional area of the heating sleeve (202) is greater than that of the detection seat (104).

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