Probe

Abstract

The embodiment of the utility model provides a probe, and relates to the technical field of detection. The probe comprises a base, a first probe and a first elastic piece. The first probe comprises a first probe body and a first probe head. The first probe is detachably installed at one end of the first probe body, the detection end of the first probe is far away from the first probe body, and the detection end is used for making contact with an object to be detected. The two ends of the first elastic piece are connected with the first probe and the base respectively, so that the first probe can move relative to the base. When the detection end of the first probe of the probe is worn and needs to be replaced, only the first probe needs to be dismounted, replacement can be completed, dismounting is convenient, replacement operation is simple, and maintenance convenience of the probe can be improved.

Description

TECHNICAL FIELD

[0001] The embodiment of the present application relates to the technical field of detection, in particular to a probe. BACKGROUND

[0002] As a key tool of electronic testing, the probe is widely used in circuit board testing, semiconductor detection and other precise measurement tasks. The basic function of the probe is to measure various performances of the object to be measured by physical contact between the detection end and the object to be measured.

[0003] In the current probe, one end of the probe is provided as the detection end, and the other end is connected with the cable. When the object to be measured needs to be detected, the detection end is only needed to be pressed on the outer surface of the object to be measured, so that the required information can be measured and transmitted through the cable.

[0004] However, in the current probe, the detection end is prone to damage and failure in the long-term use process. If the detection end needs to be replaced, the cable needs to be removed and the probe needs to be completely replaced, which is complicated and difficult to operate. Therefore, how to improve the maintenance convenience of the probe has become a technical problem to be solved. CONTENT OF THE INVENTION

[0005] In view of the above problems, the embodiment of the present application provides a probe. A first probe head is detachably mounted on a first probe body, and the first probe body is movably connected to the base through a first elastic member. When the detection end of the first probe head needs to be replaced due to wear, the first probe head can be simply replaced by being detached, which is convenient to detach and simple to replace, and can improve the maintenance convenience of the probe.

[0006] In one aspect of the embodiment of the present application, a probe is provided. The probe comprises a base, a first probe and a first elastic member. The first probe comprises a first probe body and a first probe head. The first probe head is detachably mounted on one end of the first probe body, and a detection end of the first probe head is away from the first probe body and used to contact the object to be measured. The two ends of the first elastic member are respectively connected with the first probe and the base, so that the first probe can move relative to the base.

[0007] In the probe, when the first probe head is worn in the long-term use process, the first probe head can be directly detached and replaced, and the cable and other parts such as the first probe body do not need to be detached during replacement, which is convenient to detach and simple to replace. In addition, the consumables consumed in replacing the first probe head are less, which is more cost-saving and has lower maintenance cost.

[0008] In an optional mode, a first connecting member is arranged on the first probe body, one end of the first elastic member is connected to the base, and the other end of the first elastic member is connected to the first connecting member.

[0009] In the mode, the first connecting piece is used as a structure specially used for connecting the first elastic piece, so that the connection of the first elastic piece is more convenient. Moreover, the first elastic piece is connected to the first probe body, so that the direct force of the first probe is avoided, and the service life of the first probe is prolonged.

[0010] In an alternative mode, the first connecting piece is detachably mounted on the first probe body. One end of the first elastic piece is detachably connected to the base, and the other end of the first elastic piece is detachably connected to the first connecting piece.

[0011] In the mode, the first elastic piece is detachably connected. When the first elastic piece is worn out during long-term use, the first connecting piece can be detached, and then the first elastic piece can be replaced, so that the replacement of the first elastic piece is more convenient.

[0012] In an alternative mode, the first probe body is provided with a first mounting portion and a second mounting portion. The first probe is detachably mounted on the first mounting portion, and the first connecting piece is detachably mounted on the second mounting portion. The first mounting portion and the second mounting portion are adjacent, and the first mounting portion avoids the space through which the first connecting piece is detached.

[0013] In the mode, the first mounting portion and the second mounting portion do not interfere with each other, so that the first probe and the first connecting piece are convenient to disassemble and assemble, the flexibility and applicability of the probe are improved, and the maintenance cost and use difficulty are reduced.

[0014] In an alternative mode, the first connecting piece is a protruding portion on the first probe body.

[0015] The mode has a simple structure, fewer overall parts, and simpler overall assembly.

[0016] In an alternative mode, one end of the first elastic piece is detachably connected to the base, and the other end of the first elastic piece is detachably connected to the first probe.

[0017] In the mode, the first elastic piece is directly connected to the first probe, has fewer parts, and is convenient to assemble. Moreover, when the first elastic piece needs to be replaced, the first probe can be directly removed, so that the maintenance is more convenient. Meanwhile, the first elastic piece directly acts on the first probe, so that the force effect is better.

[0018] In an alternative mode, the base is provided with a movable space, and the first probe body movably sleeves in the movable space. The first elastic piece is a spring, and the first probe body is provided in a columnar structure. The spring sleeves around the first probe body.

[0019] In this way, the overall structure is simple and compact, facilitating processing and assembly, and the elastic force or pressure is avoided from being wasted, so that the first probe can timely respond to the surface condition of the object to be measured and the pressing condition, and ensure that the first probe is always in contact with the outer surface of the object to be measured during the detection process.

[0020] In an alternative way, the probe further comprises a second elastic member and a second probe. The second probe is elastically connected to the first probe body through the second elastic member, so that the second probe can move relative to the first probe.

[0021] In this way, the first probe and the second probe can simultaneously measure the object to be measured, the obtained detection results are more, the detection efficiency is higher, and the overall structure is compact and occupies a small space. Moreover, the second probe can always abut against the outer surface of the object to be measured under the action of the second elastic member, thereby ensuring the stability of the second probe during the measurement process.

[0022] In an alternative way, the first probe is provided with a nesting space, and the second probe is movably sleeved in the nesting space.

[0023] In this way, the nesting space is provided, so that the first probe forms a tubular structure, and the second probe is located inside the first probe, thereby making the overall structure more compact and further reducing the overall volume.

[0024] In an alternative way, the probe further comprises an insulating member, and the insulating member separates the first probe and the second probe.

[0025] In this way, the first probe and the second probe are electrically isolated through the insulating member, so as to ensure that the electrical signals between the first probe and the second probe do not interfere with each other, thereby improving the accuracy and stability of the measurement of the first probe and the second probe.

[0026] In an alternative way, the second probe comprises a second probe body and a second probe head. The second probe head is detachably mounted at one end of the second probe body, and the detection end of the second probe head and the detection end of the first probe head are consistent in direction, so that the detection end of the first probe head and the detection end of the second probe head can be in contact with the same outer surface of the object to be measured.

[0027] In this way, the second probe head can be easily replaced after being worn out, and the convenience of maintaining the vulnerable parts of the probe can be further improved. Moreover, the cost generated by replacing the worn second probe head is relatively low, which is conducive to cost control.

[0028] The first probe is detachably mounted on the first probe body, and the first probe body is movably connected to the base through the first elastic member. When the detection end of the first probe is worn and needs to be replaced, the first probe only needs to be detached, and the replacement can be completed, which is convenient to detach, simple to operate, and higher in replacement convenience. Moreover, only the damaged first probe needs to be replaced during replacement, and the first probe body does not need to be replaced, and the maintenance cost is lower.

[0029] The above description is only a summary of the technical solutions of the embodiments of the present application, and the technical solutions can be implemented according to the content of the specification. In order to make the above and other purposes, characteristics and advantages of the embodiments of the present application more obvious and easy to understand, the following specific embodiments of the present application are described. BRIEF DESCRIPTION OF DRAWINGS

[0030] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings needed in the embodiment description. Obviously, the drawings in the following description are some embodiments of the present application, and those skilled in the art can also obtain other drawings according to these drawings without creating any creative labor.

[0031] Figure 1 The cross-sectional view of the first probe provided by the embodiments of the present application is provided with a detachable first connecting piece.

[0032] Figure 2 The cross-sectional view of the first probe provided by the embodiments of the present application is provided with a detachable first connecting piece.

[0033] Figure 3 The cross-sectional view of the first probe provided by the embodiments of the present application is provided with a detachable first connecting piece.

[0034] Figure 4 The cross-sectional view of the first probe provided by the embodiments of the present application is provided with a detachable first connecting piece, and the second probe is provided with a detachable second probe.

[0035] Figure 5 The cross-sectional view of the first probe provided by the embodiments of the present application is provided with a detachable first connecting piece, and the second probe is provided with a detachable second probe.

[0036] Figure 6 The cross-sectional view of the first probe provided by the embodiments of the present application is provided with a detachable first connecting piece, and the second probe is provided with a detachable second probe.

[0037] Reference signs:

[0038] 10, base; 11, movable space;

[0039] 20, first probe; 21, first probe body; 211, first connecting member; 212, first mounting portion; 213, second mounting portion; 22, first probe head; 23, nesting space;

[0040] 30, first elastic member; 40, second elastic member; 50, second probe; 51, second probe body; 52, second probe head; 60, insulating member. DETAILED DESCRIPTION

[0041] In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of protection of the present application.

[0042] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used in the specification herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the present application.

[0043] The terms "comprise" and "have" and any variations thereof in the specification and claims of the present application and the description of the drawings are intended to cover, without excluding, other contents. The word "one" or "an" does not exclude the presence of a plurality.

[0044] Reference herein to "embodiments" means that a particular feature, structure, or characteristic described in connection with an embodiment can be included in at least one embodiment of the present application. The appearance of the phrase "embodiment" in various places in the specification does not necessarily all refer to the same embodiment, nor is it necessarily independent or alternative embodiments to other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0045] The term "and / or" herein is only a description of the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B, which can represent the three cases of A alone, A and B together, and B alone. In addition, the character " / " herein generally represents an "or" relationship between the associated objects before and after it.

[0046] The positional words appearing in the following description are the directions shown in the drawings, and are not intended to limit the specific structure of the probe of the present application. For example, in the description of the present application, the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only intended to facilitate the description of the present application and simplify the description, and are not intended to indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0047] In addition, the expressions of the indicated directions for describing the operation and structure of the components of the probe of the present embodiment, such as the X direction, the Y direction, and the Z direction, are not absolute but relative, and although these indications are appropriate when the components of the probe are in the positions shown in the drawings, these directions should be interpreted differently to correspond to the changes when these positions change.

[0048] In addition, the terms "first", "second", and the like in the description and claims of the present application or in the above drawings are used to distinguish different objects, and are not intended to describe a particular order, and can explicitly or implicitly include one or more of the features.

[0049] In the description of the present application, unless otherwise specified, the meaning of "a plurality of" is two or more (including two), and similarly, "a plurality of groups" means two or more groups (including two groups).

[0050] In the description of the present application, it should be noted that, unless otherwise explicitly specified and limited, the terms "mounting", "connection", and "connection" should be understood broadly, for example, the "connection" or "connection" of the mechanical structure can mean a physical connection, for example, the physical connection can be a fixed connection, for example, a fixed connection by a fixing member, for example, a fixed connection by a screw, a bolt, or other fixing member; the physical connection can also be a detachable connection, for example, a mutual clamping or clamping connection; the physical connection can also be integrally connected, for example, connected by welding, bonding, or integrally formed; the "connection" or "connection" of the circuit structure can mean a physical connection, an electrical connection, or a signal connection, for example, it can be directly connected, that is, a physical connection, or indirectly connected through at least one intermediate element, as long as the circuit is connected, it can also be the connection between two elements; signal connection, in addition to signal connection through a circuit, can also mean signal connection through a medium medium, for example, radio waves. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0051] The probe provided by the embodiment of the present application is as shown in Figure 1 、 Figure 2 and Figure 3 . Figure 1 is a sectional view of the probe provided by the embodiment of the present application, in which the first probe is provided with a detachable first connecting piece. Figure 2 is a sectional view of the probe provided by the embodiment of the present application, in which the first probe is provided with a non-detachable first connecting piece. Figure 3 is a sectional view of the first probe provided by the embodiment of the present application, in which the first elastic piece is connected to the first probe head. The probe comprises a base 10, a first probe 20 and a first elastic piece 30.

[0052] The base 10 is a component for providing mounting positions and support for other components. The base 10 can be made of rigid metal materials such as stainless steel, hard alloy, etc., or can be made of relatively hard plastic and other insulating materials, so as to ensure that the base 10 can maintain the stability and precision of the structure during long-term use.

[0053] The first probe 20 is a component for contacting the object to be measured to complete the measurement task. The first probe 20 comprises a first probe body 21 and a first probe head 22.

[0054] The first probe body 21 is the main structure of the probe, and the shape and size of the first probe body 21 can be customized according to requirements, so as to adapt to different objects to be measured and measurement environments. The first probe body 21 can be provided in various structural forms, such as a columnar structure, a table structure, etc., which are not limited herein.

[0055] The first probe head 22 is a component for contacting the measured surface to detect information such as current and voltage, and the first probe head 22 is detachably mounted at one end of the first probe body 21, so that the first probe head 22 and the first probe body 21 can move synchronously.

[0056] The detection end of the first probe head 22 is away from the first probe body 21, and is used for contacting the object to be measured. The detection end can be provided in various shapes according to requirements. For example, it can be provided in a pointed end, a hemispherical end or a planar end, etc., which are not limited herein.

[0057] The first elastic piece 30 can be specifically a tension spring, a compression spring or an elastic sheet, and the stiffness and pre-tightening force of the first elastic piece 30 can be freely adjusted according to requirements, so as to ensure that the first probe 20 can maintain appropriate contact force and displacement during measurement.

[0058] The two ends of the first elastic member 30 are connected with the first probe 20 and the base 10 respectively, so that the first probe 20 can move relative to the base 10. The connection mode of the two ends of the first elastic member 30 can be hanging, abutting or clamping, etc.

[0059] The first elastic member 30 forms an elastic connection between the first probe 20 and the base 10. During the measurement process, the detection end of the first probe 22 is pressed on the measured surface, so that the first elastic member 30 is partially elastically deformed, so that the first probe 20 is subjected to a certain elastic force, and the first probe 22 can reliably abut on the measured object under the action of the elastic force. And during the detection process, if the measured object or the probe needs to be moved, even if there is a fluctuation on the outer surface of the measured object, the first probe 22 can have a certain stroke compensation, so that the first probe 22 can always be in contact with the measured surface under the action of the elastic force, thereby ensuring reliable measurement.

[0060] In this kind of probe, when the first probe 22 is worn out during long-term use, the first probe 22 can be directly disassembled and replaced, and other parts such as the cable and the first probe body 21 do not need to be disassembled during replacement, which is convenient to disassemble and simple to operate. And the consumables consumed in replacing the first probe 22 are less, which is more cost-saving and has lower maintenance cost.

[0061] In this embodiment, the first elastic member 30 and the first probe 20 can be connected in many ways. For example, the first elastic member 30 can be connected with the first probe body 21, so that the first probe 22 can move relative to the base 10 with the first probe body 21. The first elastic member 30 can also be connected with the first probe 22, so that the first probe body 21 can move relative to the base 10 with the first probe 22.

[0062] When the first probe 22 and the first probe body 21 are connected, a structure for connection can be specially arranged. For example, an optional mode is shown in Figure 1 and Figure 2 The first probe body 21 is provided with a first connecting member 211, one end of the first elastic member 30 is connected to the base 10, and the other end of the first elastic member 30 is connected to the first connecting member 211.

[0063] The first connecting member 211 is a structure for connecting the first elastic member 30. The structure of the first connecting member 211 corresponds to the connection mode of the first elastic member 30 and the first probe 20. For example, when the connection mode is abutting, the first connecting member 211 can be arranged as a stop block. When the connection mode is hanging, the first connecting member 211 can be arranged as a hanging ear.

[0064] In this way, the first connecting piece 211, as a structure specially used for connecting the first elastic piece 30, can make the connection of the first elastic piece 30 more convenient. Moreover, the first elastic piece 30 is connected to the first probe body 21, which can avoid the direct force bearing of the first probe head 22 and is beneficial to prolong the service life of the first probe head 22.

[0065] The first connecting piece 211 can be a partial structure of the first probe body 21. For example, an alternative way is as shown in Figure 2 As shown, the first connecting piece 211 is a protruding part on the first probe body 21. This structure is simple, the number of whole components is small, and the overall assembly is simpler.

[0066] The first connecting piece 211 can also be a separately provided component. For example, an alternative way is as shown in Figure 1 As shown, the first connecting piece 211 is detachably mounted on the first probe body 21. One end of the first elastic piece 30 is detachably connected to the base 10, and the other end of the first elastic piece 30 is detachably connected to the first connecting piece 211.

[0067] When the first connecting piece 211 is mounted on the first probe body 21, the first connecting piece 211 is relatively fixed with the first probe body 21, and the first probe body 21 is also indirectly elastically connected with the base 10 through the first elastic piece 30, so that the first probe body 21 can move relative to the base 10.

[0068] In this way, the connection mode of the first elastic piece 30 is detachable connection. When the first elastic piece 30 is worn out during long-term use, the first connecting piece 211 can be detached, and then the first elastic piece 30 can be taken off and replaced, so that the replacement of the first elastic piece 30 is more convenient.

[0069] Moreover, when the first connecting piece 211 is provided, the first connecting piece 211 can abut against the first probe head 22, so that the elastic force of the first elastic piece 30 can directly act on the first probe head 22, and the first probe head 22 can reliably abut against the outer surface of the object to be measured.

[0070] In this embodiment, when the first probe head 22 and the first connecting piece 211 are detachably mounted on the first probe body 21, a mounting structure specially used for mounting the first probe head 22 and the first connecting piece 211 can be provided at one end of the first probe body 21.

[0071] For example, an alternative way is as shown in Figure 1As shown, the first probe body 21 is provided with a first mounting portion 212 and a second mounting portion 213. The first probe head 22 is detachably mounted on the first mounting portion 212, and the first connecting member 211 is detachably mounted on the second mounting portion 213. The first mounting portion 212 and the second mounting portion 213 are adjacent to each other, and the first mounting portion 212 avoids the space through which the first connecting member 211 passes when being detached.

[0072] The first mounting portion 212 and the second mounting portion 213 on the first probe body 21 are positions for detachably mounting the first probe head 22 and the first connecting member 211. The first mounting portion 212 and the second mounting portion 213 can be provided with structures that are easy to mount and detach, such as threaded holes, buckle grooves, or insertion grooves, etc.

[0073] The first mounting portion 212 and the second mounting portion 213 are provided adjacent to each other on the probe body and are independent of each other, so as to ensure that the first probe head 22 and the first connecting member 211 do not interfere with each other when being mounted, and at the same time, the first probe head 22 and the first connecting member 211 can abut against each other.

[0074] The structure of the first mounting portion 212 matches the structure of the first probe head 22, so as to ensure that the first probe head 22 can be tightly and stably mounted on the first mounting portion 212. For example, the first probe head 22 can be provided with a threaded hole, and the first mounting portion 212 is correspondingly provided with a threaded column segment, so that the first probe head 22 is mounted on the first mounting portion 212 in a threaded connection manner.

[0075] The structure of the second mounting portion 213 matches the structure of the first connecting member 211, so as to ensure that the first connecting member 211 can be stably mounted on the second mounting portion 213. For example, the first connecting member 211 can be provided with a threaded hole, and the second mounting portion 213 is correspondingly provided with a threaded column segment corresponding to the threaded hole, so that the first connecting member 211 is mounted on the second mounting portion 213 in a threaded connection manner.

[0076] In addition, the first mounting portion 212 just avoids the space through which the first connecting member 211 passes when being detached, so as to ensure that the first connecting member 211 is not blocked by the first mounting portion 212 when being detached, that is, the first mounting portion 212 does not hinder the detachment of the first connecting member 211 in the detachment path of the first connecting member 211, so that the first connecting member 211 can be smoothly detached.

[0077] For example, when the first mounting portion 212 and the second mounting portion 213 are both threaded column segments, the maximum outer diameter of the first mounting portion 212 can be made smaller than the maximum outer diameter of the second mounting portion 213, and correspondingly, the threaded hole diameter on the first connecting piece 211 can be made larger than the threaded hole diameter on the first probe 22. When disassembling the first connecting piece 211, the first probe 22 can be disassembled first, and then the first connecting piece 211 is disassembled. At this time, the first mounting portion 212 can pass through the threaded hole of the first connecting piece 211, so that the first connecting piece 211 can be disassembled without obstruction.

[0078] In this way, the first mounting portion 212 and the second mounting portion 213 do not interfere with each other, facilitating the disassembly of the first probe 22 and the first connecting piece 211, improving the flexibility and applicability of the probe, and also reducing the maintenance cost and use difficulty.

[0079] The connection mode of the first mounting portion 212 and the first probe 22, and the connection mode of the second mounting portion 213 and the first connecting piece 211 can be the same or different. In a specific embodiment, at least one of the connection mode of the first mounting portion 212 and the first probe 22, and the connection mode of the second mounting portion 213 and the first connecting piece 211 is threaded connection. Specifically, the first probe 22 is detachably mounted on the first mounting portion 212 by threaded connection, and / or the first connecting piece 211 is detachably mounted on the second mounting portion 213 by threaded connection.

[0080] When the first connecting piece 211 is detachably mounted on the second mounting portion 213 by threaded connection, a threaded hole can be provided on the first connecting piece 211, and the second mounting portion 213 is provided as a threaded column segment. Alternatively, a threaded column segment can be provided on the first connecting piece 211, and the second mounting portion 213 is provided as a threaded hole.

[0081] When the first connecting piece 211 is detachably mounted on the second mounting portion 213 by threaded connection, the first connecting piece 211 only needs to be screwed onto the second mounting portion 213 when mounting the first connecting piece 211, until the first connecting piece 211 is mounted in place, so that the first connecting piece 211 has a predetermined fastening degree, thereby ensuring that the first connecting piece 211 can be stably and tightly mounted on the second mounting portion 213.

[0082] When the first probe 22 is detachably mounted on the first mounting portion 212 by threaded connection, a threaded hole can be provided on the first probe 22, and the first mounting portion 212 is provided as a threaded column segment. Alternatively, a threaded column segment can be provided on the first probe 22, and the first mounting portion 212 is provided as a threaded hole.

[0083] When the first probe 22 is detachably installed on the first mounting part 212 via a threaded connection, the first probe 22 can be installed simply by screwing it onto the first mounting part 212 until the first probe 22 abuts against the first connector 211 to achieve the predetermined tightness.

[0084] In this method, the threaded connection provides a stable connection force, ensuring that the first probe 22 and / or the first connector 211 will not loosen or fall off during installation. Furthermore, the threaded connection is easy to install and remove, and the operation is simple.

[0085] When the first elastic element 30 is connected to the first probe 22, one possible method is as follows: Figure 3 As shown, one end of the first elastic element 30 is detachably connected to the base 10, and the other end of the first elastic element 30 is detachably connected to the first probe 22.

[0086] The first elastic element 30 is connected to the end of the first probe 22 furthest from the detection end. The connection method can be abutment, hook, or other methods, which are not limited here. Furthermore, corresponding connection parts can be provided on the first probe 22 according to different connection methods.

[0087] In this method, the first elastic element 30 is directly connected to the first probe 22, resulting in fewer parts and easier assembly. Furthermore, when the first elastic element 30 needs to be replaced, the first probe 22 can be simply removed, making maintenance more convenient. Simultaneously, the first elastic element 30 acts directly on the first probe 22, resulting in better force distribution.

[0088] In this embodiment, to ensure the probe's compact structure, a reasonable spatial layout can be achieved. For example, one possible approach is as follows: Figure 1 , Figure 2 and Figure 3 As shown, the base 10 has an active space 11, and the first probe body 21 is movably fitted within the active space 11. The first elastic element 30 is a spring, and the first probe body 21 is configured as a columnar structure, with the spring fitted around the first probe body 21.

[0089] The movable space 11 set on the base 10 can be set as a cylindrical hole, a prism-shaped hole, or other shapes, without any restrictions.

[0090] At the bottom of the activity space 11, the side wall, etc., a structure for connecting the spring can be provided, such as an abutting table, a hook or a bayonet, etc., so that one end of the spring can be connected to the base 10 in a detachable manner such as abutting, hanging or buckling, etc., to ensure that the spring will not be loose or fall off on the base 10. The other end of the spring is connected to the first end of the first connecting piece 211, and the connection method can also be a detachable manner such as abutting, hanging or buckling, etc.

[0091] Since the spring is sleeved on the periphery of the first probe body 21, the extension direction of the spring is consistent with the activity direction of the first probe body 21 relative to the base 10, so that the action line of the elastic force acting on the first probe 20 and the action line of the pressure acting on the first probe 20 are consistent, thereby avoiding waste of elastic force or pressure, so that the first probe 20 can react in time according to the surface condition of the measured object and the pressing condition, and ensure that the first probe 22 is always in contact with the outer surface of the measured object during detection.

[0092] In addition, in addition to the first probe 20 for detecting the measured object, other probes for detecting the measured object can also be provided. An optional mode is shown in Figure 1 、 Figure 2 and Figure 3 The probe further comprises a second elastic member 40 and a second probe 50. The second probe 50 is elastically connected to the first probe body 21 through the second elastic member 40, so that the second probe 50 can move relative to the first probe 20.

[0093] The second probe 50 is a detection structure similar to the first probe 20, and the first probe 20 and the second probe 50 can measure different information respectively. For example, the first probe 20 can be used to measure the current value of the measured object, and the second probe 50 can be used to measure the voltage value of the measured object. Alternatively, the first probe 20 and the second probe 50 can measure the same information, such as the current value of the measured object, so as to further obtain the performance of the measured object through the difference between the measured values of the first probe 20 and the second probe 50.

[0094] The structure of the first probe 22 and the second probe 50 can be set as similar structures, such as setting the detection ends of the first probe 22 and the second probe 50 as plane ends. The structure of the first probe 22 and the second probe 50 can be set as completely different structures, such as setting the detection end of the first probe 22 as a plane end and setting the detection end of the second probe 50 as a spherical end.

[0095] The second probe 50 is elastically connected with the first probe body 21 through the second elastic member 40, so that the second probe 50 can move relative to the first probe body 21. When the detection ends of the first probe 22 and the second probe 50 are pressed on the outer surface of the object to be measured, the first probe 20 and the second probe 50 can be respectively abutted on the outer surface of the object to be measured under the elastic force of the first elastic member 30 and the second elastic member 40, so as to make the contact reliable.

[0096] The second elastic member 40 is arranged in a similar manner to the first elastic member 30, and can be a compression spring, a tension spring or an elastic sheet, etc. The connection mode of the second elastic member 40 can be detachable connection or fixed connection, which can be hanging, abutting or clamping, etc., which is not limited here.

[0097] In this way, the first probe 20 and the second probe 50 can simultaneously measure the object to be measured, the detection results obtained are more, the detection efficiency is higher, and the overall structure is compact and occupies a small space. Moreover, the second probe can always abut on the outer surface of the object to be measured under the action of the second elastic member 40, thereby ensuring the stability of the second probe 50 during measurement.

[0098] Further, in order to make the overall structure compact, an optional way is shown in Figure 1 , Figure 2 and Figure 3 , a nesting space 23 can be arranged on the first probe 20, and the second probe 50 can be movably sleeved in the nesting space 23.

[0099] The nesting space 23 is a movable space arranged for the second probe 50, which can be arranged as a cylindrical hole or other space structure. In a specific embodiment, the nesting space 23 can be spliced from the first probe body 21 and the first probe 22, and the nesting space 23 is open to the outside, so that the second probe 50 can extend out of the nesting space 23 or retract into the nesting space 23.

[0100] In this way, the nesting space 23 is arranged, so that the first probe 20 forms a tubular structure, and the second probe 50 is located inside the first probe 20, so that the overall structure is more compact, and the overall volume is further reduced.

[0101] In addition, an optional way is shown in Figure 1 , Figure 2 and Figure 3 , the probe further comprises an insulating member 60, which separates the first probe 20 and the second probe 50. The insulating member 60 can be made of ceramic, plastic, rubber or other materials with excellent insulation performance. The insulating member 60 can be fixed between the first probe 20 and the second probe 50 by pasting, buckling, threaded connection or the like.

[0102] The shape and size of the insulating piece 60 can be freely set according to the structure and size of the first probe 20 and the second probe 50, for example, the insulating piece 60 can be set as an insulating ring, an insulating sleeve or the like, so that the insulating piece 60 can separate the first probe 20 and the second probe 50 to form effective electrical isolation.

[0103] In this way, the first probe 20 and the second probe 50 are electrically isolated by the insulating piece 60, which ensures that the electrical signals between the first probe 20 and the second probe 50 do not interfere with each other, thereby improving the accuracy and stability of the measurement of the first probe 22 and the second probe.

[0104] In addition, the second probe 50 can be a one-piece structure or a split structure composed of multiple parts. The second probe 50 provided in the embodiment of the present application can be a split structure as shown in Figure 4 , Figure 5 and Figure 6 , Figure 4 the cross-sectional view of the probe provided in the embodiment of the present application, wherein the first probe is provided with a detachable first connecting piece, and the second probe is provided with a detachable second probe head, Figure 5 the cross-sectional view of the probe provided in the embodiment of the present application, wherein the first probe is provided with a non-detachable first connecting piece, and the second probe is provided with a detachable second probe head, Figure 6 the cross-sectional view of the probe provided in the embodiment of the present application, wherein the first elastic piece of the first probe is connected to the first probe head, and the second probe is provided with a detachable second probe head.

[0105] The second probe 50 includes a second probe body 51 and a second probe head 52. The second probe head 52 is detachably mounted at one end of the second probe body 51, and the detection end of the second probe head 52 and the detection end of the first probe head 22 are oriented in the same direction, so that the detection end of the first probe head 22 and the detection end of the second probe head 52 can contact the same outer surface of the object to be measured for synchronous detection.

[0106] The second probe head 52 is a part similar to the first probe head 22, and the detection end of the second probe head 52 is used to contact the outer surface of the object to be measured for detection. The detection end of the second probe head 52 is the detection end of the second probe 50. In addition, the second probe head 52 can be detachably mounted on the second probe body 51 by means of threaded connection, bayonet connection, plug-in connection or the like.

[0107] In this way, the second probe head 52 can be easily replaced after wear, which can further improve the convenience of maintaining the vulnerable parts of the probe. In addition, the cost of replacing the worn second probe head 52 is relatively low, which is conducive to cost control.

[0108] And, a second connecting piece for connecting the second elastic piece 40 can be arranged on the second probe 50, such as a step structure on the second probe body 51, or other possible structures. And, the second elastic piece 40 and the second probe 52 can also be directly connected by abutting or other ways, which is not limited here.

[0109] In addition, it should be noted that the probe in the embodiment can be provided with the second probe 50 or not, that is, the probe in the embodiment can only use the first probe 20 to measure the measured object to simplify the overall structure of the probe.

[0110] In summary, in the above-described probe, the first probe head is detachably mounted on the first probe body, and the first probe body is movably connected to the base through the first elastic piece. When the detection end of the first probe head is worn and needs to be replaced, the first probe head can be detached to complete the replacement, which is convenient to detach, simple to operate, and higher in replacement convenience. Moreover, only the damaged first probe head needs to be replaced when replacing, without the need to replace the first probe body, which is lower in maintenance cost.

[0111] Those skilled in the art can understand that although some embodiments herein do not include certain features included in other embodiments, the combination of features of different embodiments is still within the scope of the present application and forms different embodiments. For example, in the claims, any one of the claimed embodiments can be used in any combination.

[0112] The above embodiments are only used to illustrate the technical solutions of the present application, rather than limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that the technical solutions recorded in the foregoing embodiments can still be modified, or some technical features can be replaced equivalently; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A probe, characterized in that, The probe comprises a base, a first probe and a first elastic member; The first probe comprises a first probe body and a first probe head; the first probe head is detachably mounted on one end of the first probe body, and a detection end of the first probe head is away from the first probe body, and the detection end is used for contacting a to-be-detected object; Two ends of the first elastic member are connected with the first probe and the base respectively, so that the first probe can move relative to the base.

2. The probe of claim 1, wherein A first connecting member is arranged on the first probe body; one end of the first elastic member is connected with the base, and the other end of the first elastic member is connected with the first connecting member.

3. The probe of claim 2, wherein The first connecting member is detachably mounted on the first probe body; one end of the first elastic member is detachably connected with the base, and the other end of the first elastic member is detachably connected with the first connecting member.

4. The probe of claim 3, wherein The first probe body is provided with a first mounting portion and a second mounting portion; the first probe head is detachably mounted on the first mounting portion, and the first connecting member is detachably mounted on the second mounting portion. The first mounting portion and the second mounting portion are adjacent, and the first mounting portion avoids a space passed through when the first connecting member is detached.

5. The probe of claim 2, wherein The first connecting member is a protruding portion on the first probe body.

6. The probe of claim 1, wherein One end of the first elastic member is detachably connected with the base, and the other end of the first elastic member is detachably connected with the first probe head.

7. The probe of any one of claims 1-6, wherein, The base is provided with a movable space, and the first probe body movably sleeves in the movable space. The first elastic member is a spring, the first probe body is arranged in a columnar structure, and the spring sleeves outside the first probe body.

8. The probe according to any one of claims 1 to 6, wherein The probe further comprises a second elastic member and a second probe; The second probe is elastically connected with the first probe body through the second elastic member, so that the second probe can move relative to the first probe.

9. The probe of claim 8, wherein, The first probe is provided with a nesting space, and the second probe movably sleeves in the nesting space.

10. The probe of claim 8, wherein The second probe comprises a second probe body and a second probe head; The second probe head is detachably mounted on one end of the second probe body, and a detection end of the second probe head and a detection end of the first probe head are consistent in direction, so that the detection end of the first probe head and the detection end of the second probe head can contact a same outer surface of the to-be-detected object.

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