Detection circuit and detection equipment

Abstract

The utility model provides a detection circuit and detection equipment. When the hard disk of the to-be-detected server cannot be identified, the edge connector of the detection circuit can be connected with the to-be-detected hard disk slot where the hard disk is located. N electric signals are generated through a signal generator to indicate the states of N indication elements, so that the connection states of N physical links are respectively indicated according to the states of the N indication elements, and the connection states comprise open circuit, poor contact and normal connection. The connection state of the physical link corresponding to the to-be-detected hard disk slot can be rapidly determined through the states of the N indicating elements, time is saved, and fault detection efficiency is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of servers, and in particular to a detection circuit and a detection device. BACKGROUND

[0002] A server is a core basic device for building cloud computing. With the development of information technology, the application demand of servers is growing. In the process of server research and development, production testing, after-sales maintenance, etc., the problem of server hard disk not being recognized often occurs, that is, the hard disk cannot be normally detected or accessed.

[0003] In the related art, the connector on the physical link of the hard disk of the server can be plugged in and the hard disk can be checked for normal recognition. If the hard disk still cannot be recognized, all components of the plurality of to-be-tested lines on the physical link need to be replaced (Swap) one by one until the faulty component is found.

[0004] However, the above method takes a long time and has low fault detection efficiency. Utility model content

[0005] Embodiments of the present application provide a detection circuit and a detection device to solve the problem of long time consumption and low fault detection efficiency of the fault detection method of the physical link of the hard disk of the server in the related art.

[0006] In a first aspect, the present application provides a detection circuit, comprising:

[0007] An edge connector is configured to connect a to-be-tested hard disk slot of a to-be-tested server, and the to-be-tested hard disk slot corresponds to N physical links.

[0008] A signal generator is connected to the edge connector through N connection lines, and an indicating element is arranged on each of the N connection lines. The signal generator is configured to generate N electrical signals when the detection circuit is powered on, and the N electrical signals are respectively used to control the states of the N indicating elements.

[0009] The states of the N indicating elements are respectively used to indicate the connection states of the N physical links, and the connection states include open circuit, poor contact and normal connection. N is a positive integer.

[0010] In the embodiment, when the hard disk of the to-be-tested server cannot be recognized, the edge connector of the detection circuit can be connected with the to-be-tested hard disk slot where the hard disk is located. N electrical signals are generated by the signal generator to indicate the states of the N indicating elements, so that the connection states of the N physical links are indicated according to the states of the N indicating elements, the connection states including open circuit, poor contact and normal connection. The connection state of the physical link corresponding to the to-be-tested hard disk slot can be determined quickly through the states of the N indicating elements, time is saved, and the fault detection efficiency is improved.

[0011] Optionally, the detection circuit, the N indicating elements are light emitting diodes (LEDs), and the states include an extinguished state, a first brightness corresponding state and a second brightness corresponding state, wherein the first brightness is greater than the second brightness.

[0012] For any one indicating element, when the state of the indicating element is the extinguished state, the connection state of the physical link corresponding to the indicating element is the open circuit; when the state of the indicating element is the first brightness corresponding state, the connection state of the physical link corresponding to the indicating element is the normal connection; and when the state of the indicating element is the second brightness corresponding state, the connection state of the physical link corresponding to the indicating element is the poor contact.

[0013] In the embodiment, the connection states of the to-be-tested lines can be determined intuitively through the states of the LEDs, time is saved, and the fault detection efficiency is improved.

[0014] Optionally, the detection circuit, the detection device further includes a push switch and a power supply, and the push switch is connected with the power supply and the signal generator respectively.

[0015] The power supply is configured to supply power to the detection device.

[0016] The push switch is configured to control the detection device to be powered on when the push switch is in a conduction state.

[0017] In the embodiment, the detection circuit is powered on through the push switch, so that energy saving can be realized when the detection circuit is not used.

[0018] Optionally, the detection circuit, the N electrical signals are alternating current signals, and the signal generator is a signal generator.

[0019] In the embodiment, the alternating current signals can be generated by a clock generator, so that the N electrical signals are output.

[0020] Optionally, the detection circuit further includes a crystal element.

[0021] The crystal element is connected with the signal generator, and the crystal element is used to provide a frequency reference for the signal generator, so that the signal generator generates the N electrical signals.

[0022] In the embodiment, a stable frequency is generated by the crystal element, so that the clock generator outputs a stable alternating current signal.

[0023] Optionally, the detection circuit is as described above, the N electrical signals are alternating current signals, and the signal generator is a frequency converter.

[0024] In the embodiment, the frequency converter can output alternating current signals, so that the N electrical signals are output.

[0025] In a second aspect, the application provides a detection device:

[0026] The detection device comprises the detection circuit as described in the first aspect.

[0027] In the embodiment, when the hard disk of the to-be-tested server cannot be recognized, the detection device can be used to detect the to-be-tested hard disk slot where the hard disk is located. Specifically, the edge connector can be connected with the to-be-tested hard disk slot where the hard disk is located. N electrical signals are generated by the signal generator to indicate the states of the N indicating elements, so that the connection states of the N physical links are indicated by the states of the N indicating elements respectively. The connection states include open circuit, poor contact and normal connection. The connection state of the physical link corresponding to the to-be-tested hard disk slot can be determined quickly by the states of the N indicating elements, time is saved, and the fault detection efficiency is improved.

[0028] Optionally, the detection device is as described above, and the detection device further comprises a shell, a cavity is arranged in the shell, and the detection circuit is arranged in the cavity.

[0029] The shell is provided with an opening, the opening communicates the cavity with the outer space of the shell, and the edge connector of the detection circuit is arranged at the opening.

[0030] In the embodiment, the detection circuit is arranged in the shell, and the edge connector is arranged at the opening of the shell. When the hard disk of the to-be-tested server cannot be recognized, the edge connector can be connected with the to-be-tested hard disk slot, so that fault detection is realized.

[0031] Optionally, the detection device is as described above, and the shell is provided with an indication panel, and the indication panel is printed with the marks of the N to-be-tested lines corresponding to the to-be-tested hard disk slot.

[0032] The N indicating elements in the detection circuit correspond to the N to-be-detected lines respectively, and are arranged on the inner side of the indication panel.

[0033] In the embodiment, the indication panel is arranged on the upper side of the shell, the N electrical signal identifiers are printed on the indication panel, and the N indicating elements correspond to the N electrical signal identifiers respectively and are arranged on the inner side of the indication panel, so that the connection states of the N to-be-detected lines corresponding to the to-be-detected hard disk slots can be indicated by the N indicating elements.

[0034] Optionally, the detection device as described above further comprises a push switch arranged on the outer side of the indication panel, and the push switch is used to control the power-on or power-off of the detection circuit.

[0035] In the embodiment, the push switch is arranged on the outer side of the indication panel, so that the maintenance personnel can control the power-on or power-off of the detection circuit.

[0036] The detection circuit and the detection device provided in the application can be connected to the to-be-detected hard disk slots where the hard disks of the to-be-detected server are arranged when the hard disks cannot be recognized, N electrical signals are generated by the signal generator to indicate the states of the N indicating elements, and the connection states of the N physical links are indicated according to the states of the N indicating elements, the connection states including open circuit, poor contact and normal connection, so that the connection states of the physical links corresponding to the to-be-detected hard disk slots can be determined quickly by the states of the N indicating elements, time is saved, and the fault detection efficiency is improved. BRIEF DESCRIPTION OF DRAWINGS

[0037] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the application and serve to explain the principles of the application together with the specification.

[0038] Figure 1 A structural schematic diagram of a detection circuit provided in an embodiment of the application;

[0039] Figure 2 A structural schematic diagram of a detection circuit corresponding to an example N of 16;

[0040] Figure 3 A structural schematic diagram of a to-be-detected server provided in an example of the application;

[0041] Figure 4 A schematic diagram of a detection circuit and a to-be-detected hard disk slot of a to-be-detected server provided in an example of the application;

[0042] Figure 5 A schematic diagram of another detection circuit provided in an embodiment of the application;

[0043] Figure 6 Another schematic diagram of a detection circuit provided for an embodiment of the present application;

[0044] Figure 7 A structural schematic diagram of a detection device provided for an embodiment of the present application;

[0045] Figure 8 A schematic diagram of an indication panel provided for an embodiment of the present application.

[0046] Explanation of reference signs:

[0047] 10 - detection circuit; 101 - edge connector;

[0048] 102 - signal generator; 103 - indication element;

[0049] 104 - push switch; 105 - power supply;

[0050] 106 - crystal element; 30 - server to be detected;

[0051] 301 - hard disk slot to be detected; 302 - hard disk backplane;

[0052] 303 - controller; 70 - detection device;

[0053] 701 - shell; 702 - chamber;

[0054] 703 - opening; 704 - indication panel.

[0055] The specific embodiments of the present application have been shown through the above-described drawings, and will be described in more detail hereinafter. These drawings and written descriptions are not intended to limit the scope of the concept of the present application by any means, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0056] The exemplary embodiments will be described in detail herein with reference to the attached drawings. The following description is made with reference to the accompanying drawings in which like reference numerals represent like elements, unless the context of use indicates otherwise. The following description of exemplary embodiments is not representative of all embodiments consistent with the present application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of the present application as detailed in the appended claims.

[0057] In the process of server development debugging, production testing, after-sales maintenance, etc., the problem of server hard disk not being recognized often occurs, that is, the hard disk cannot be normally detected or accessed.

[0058] Especially for the new generation of servers, the new generation of servers meet the characteristics of flexible configuration, scalability and so on. All key components (such as processors, memories, storages and I / O devices) in the server are connected through high-speed cables. It is more complicated to analyze the physical link problem of the hard disk on the server of this architecture, and the fault phenomenon is easily damaged during the analysis process, which leads to the inability to further analyze the cause.

[0059] In view of the above problem, the connector on the physical link of the hard disk of the server can be plugged and unplugged, and the hard disk can be checked whether it can be normally recognized. If the hard disk still cannot be recognized, all components on the physical link need to be replaced one by one until the faulty component is found.

[0060] Specifically, after finding the abnormal component through plugging or replacing operation, the resistance value and the capacitance value on each physical link need to be measured by using a multimeter. Taking a non-volatile memory (Nvme) as an example, a memory has 4 high-speed serial computer expansion bus standards (peripheral component interconnect express, PCIe) physical links, each physical link contains two groups of differential signal pairs, which are data transmission (Transmit, TX) and data reception (Receive, RX), each group of differential pairs consists of two signal lines, and 4 physical links need to measure 16 lines in total, which leads to more complicated fault detection, and manual measurement of detection points exists the risk of data measurement error.

[0061] However, each time the connector on the physical link of the hard disk is plugged or unplugged, or the component on the physical link is replaced, the power needs to be turned off and the hard disk needs to be checked whether it is normally recognized after the server is restarted. The server generally needs to be started up for about 5 minutes, and the server with more components needs to be started up for a longer time. The analysis process needs to be verified through multiple start-ups. The time required for the start-up initialization by the above method is more than 40 minutes. In addition to the operations of power-off, plugging, replacement, and checking of hard disk recognition, the time required for the entire analysis process is more than one hour, which leads to a long time consumption.

[0062] In addition, the hard disk cannot be normally recognized, which can also be caused by poor compatibility of the connector on the physical link, so that intermittent poor contact phenomenon occurs. In this case, the operation of plugging the connector or replacing the component is likely to cause the fault phenomenon to disappear, and the fault cause cannot be analyzed.

[0063] Therefore, the detection circuit is provided in the application. When the hard disk of the to-be-tested server cannot be recognized, the edge connector of the detection circuit can be connected with the to-be-tested hard disk slot, so that the connection state of the physical link of the hard disk can be quickly displayed through the indicating element (for example, a lighting emitting diode (LED)) of the detection circuit in the environment without the power supply of the mainboard of the server, for example, the state of normal connection, poor contact or open circuit can be displayed, time is saved, and the fault detection efficiency is improved.

[0064] It should be noted that, in the embodiments of the application, the hard disk refers to a storage. The edge connector can also be referred to as a golden finger.

[0065] In the embodiments of the application, the hard disk slot refers to a special space for installing and fixing a hard disk in a server. For example, the hard disk slot can be a connector for connecting a hard disk (for example, an Nvme storage), such as an SFF-8639 (an interface standard for high-speed data transmission) connector. When the server cannot recognize the hard disk, the maintenance personnel can take the hard disk out of the hard disk slot and insert the edge connector of the detection circuit into the hard disk slot, so that the edge connector is connected with the hard disk slot.

[0066] The technical solutions of the application and how the technical solutions of the application solve the above technical problems will be described in detail in specific embodiments. The following specific embodiments can be combined with each other, and the same or similar concepts or processes can not be described again in some embodiments. The embodiments of the application will be described below with reference to the drawings.

[0067] Figure 1 A structural schematic diagram of a detection circuit provided in the embodiments of the application is shown in FIG. 1. Figure 1 As shown in FIG. 1, the detection circuit 10 includes:

[0068] An edge connector 101 is used to connect a to-be-tested hard disk slot 301 of a to-be-tested server 30. The to-be-tested hard disk slot 301 corresponds to N to-be-tested lines.

[0069] A signal generator 102 is connected with the edge connector 101 through a plurality of connection lines. An indicating element 103 is arranged on each of the N connection lines. The signal generator 102 is used to generate N electrical signals when the detection circuit 10 is powered on. The N electrical signals are respectively used to control the states of the N indicating elements.

[0070] The states of the N indicating elements are respectively used to indicate the connection states of the N to-be-tested lines. The connection states include an open circuit, poor contact and normal connection. N is a positive integer.

[0071] Specifically, for any one indicating element, different states of the indicating element can be used to indicate the connection state of the corresponding to-be-tested line, for example, state 1 is used to indicate an open circuit, state 2 is used to indicate poor contact, and state 3 is used to indicate normal connection.

[0072] In the embodiments of the present application, the poor contact refers to a phenomenon of a decrease or failure of a conductive performance caused by insufficient or unstable physical contact in an electrical connection. In the connection state, the to-be-tested line is not completely open.

[0073] It can be understood that the structure of the edge connector 101 is matched with the structure of the to-be-tested hard disk slot 301. When the server fails to identify the hard disk, the maintenance personnel can take out the hard disk from the to-be-tested hard disk slot 301 and insert the edge connector 101 of the detection circuit 10 into the to-be-tested hard disk slot 301, so that the edge connector 101 is connected with the to-be-tested hard disk slot 301, and the N to-be-tested lines are connected with the N to-be-tested lines. Figure 1 It can be understood that the structure of the edge connector 101 is matched with the structure of the to-be-tested hard disk slot 301. When the server fails to identify the hard disk, the maintenance personnel can take out the hard disk from the to-be-tested hard disk slot 301 and insert the edge connector 101 of the detection circuit 10 into the to-be-tested hard disk slot 301, so that the edge connector 101 is connected with the to-be-tested hard disk slot 301, and the N to-be-tested lines are connected with the N to-be-tested lines.

[0074] Taking the hard disk accommodated in the to-be-tested hard disk slot 301 as an example, the Nvme storage includes 4 physical links, and there are 16 to-be-tested lines, that is, N is 16. Figure 2 The structure of the detection circuit corresponding to the example N of 16 is shown in the figure.

[0075] In a possible implementation, the size of the edge connector 101 can be 2.5 inches, so that the hard disk slot of the 3.5-inch disk bay and the hard disk slot of the 2.5-inch disk bay can be compatible, and different edge connectors do not need to be designed for hard disk slots of different sizes. The hard disk slot of the 2.5-inch disk bay can be applicable to a traditional hard disk, for example, a hard disk drive (HDD), and the hard disk slot of the 3.5-inch disk bay can be applicable to a solid state disk or solid state drive (SSD).

[0076] For example, the edge connector 101 can be compatible with the hard disk slot corresponding to a serial attached SCSI (SAS) interface and the hard disk slot corresponding to a serial advanced technology attachment (SATA).

[0077] Figure 3 The structure of a to-be-tested server is shown in the figure. Figure 3As shown, the to-be-tested server 30 includes a to-be-tested hard disk slot 301, a hard disk backboard 302 and a controller 303. It can be understood that the physical link corresponding to the to-be-tested hard disk slot 301 can include the to-be-tested hard disk slot 301, the hard disk backboard 302 and the controller 303.

[0078] The N to-be-tested lines corresponding to the to-be-tested hard disk slot 301 include N first sub-connection lines and N second sub-connection lines.

[0079] The to-be-tested hard disk slot 301 is connected with the hard disk backboard 302 through the N first sub-connection lines, the hard disk backboard 302 is connected with the controller 303 through the N second sub-connection lines, and the controller 303 is grounded through a preset resistor R1.

[0080] Through the above physical link, each to-be-tested line can be equivalent to a controller in series with a resistor to ground, so that a loop is formed between the to-be-tested line and the ground, the current flows through the indicating element to change the state of the indicating element, thereby indicating the connection state of the physical link.

[0081] In a possible implementation, the N electrical signals can be alternating current signals.

[0082] In a possible implementation, as shown in Figure 3 The N second sub-connection lines include a plurality of sending lines and a plurality of receiving lines, the plurality of sending lines are used for sending data to the hard disk for storage, and a preset capacitor C1 is connected in series in each sending line. Since the preset capacitor C1 passes alternating current and blocks direct current, when the direct current signal is accessed, it is equivalent to that the sending line is open, and when the alternating current signal is accessed, it is equivalent to that the sending line is short-circuited, so that after the alternating current signal is accessed, whether it is short-circuited is determined according to the state of the indicating element, if not, it is determined that the sending line is faulty, that is, the to-be-tested line where the sending line is located is faulty.

[0083] In this embodiment, when the hard disk of the to-be-tested server cannot be recognized, the edge connector of the detection circuit can be connected with the to-be-tested hard disk slot 301 where the hard disk is located. N electrical signals are generated by a signal generator to indicate the states of N indicating elements, thereby indicating the connection states of N physical links according to the states of N indicating elements, the connection states including open circuit, poor contact and normal connection. The connection state of the physical link corresponding to the to-be-tested hard disk slot 301 can be determined quickly through the states of N indicating elements, time is saved, and the fault detection efficiency is improved.

[0084] In a possible implementation, the N indicating elements can be LEDs, and the states include an extinguished state, a first brightness corresponding state and a second brightness corresponding state, wherein the first brightness is greater than the second brightness.

[0085] For example, the state corresponding to the first brightness can be normal brightness, and the state corresponding to the second brightness can be dim brightness, wherein the normal brightness can be understood as the state of the LED under the rated current and the rated voltage, i.e., the state of the LED under the standard working condition, which can be used to indicate that the connection state of the corresponding to-be-tested line is normal connection, i.e., no fault.

[0086] For any one indicating element, when the state of the indicating element is off, the connection state of the corresponding to-be-tested line is open circuit; when the state of the indicating element is the state corresponding to the first brightness, the connection state of the corresponding to-be-tested line is normal connection; and when the state of the indicating element is the state corresponding to the second brightness, the connection state of the corresponding to-be-tested line is poor contact.

[0087] It should be noted that the to-be-tested line corresponding to the indicating element refers to the to-be-tested line in communication with the line where the indicating element is located, and the state of the indicating element can be used to indicate the connection state of the to-be-tested line.

[0088] Taking the circuit structure of Figure 2 , for example, for the indicating element 1, the line where the indicating element 1 is located is the line 1, and the to-be-tested line in communication with the line 1 is the to-be-tested line 1. If the state of the indicating element 1 is off, it indicates that the connection state of the to-be-tested line 1 is open circuit; if the state of the indicating element 1 is the state corresponding to the first brightness, it indicates that the connection state of the to-be-tested line 1 is normal connection; and if the state of the indicating element 1 is the state corresponding to the second brightness, it indicates that the connection state of the to-be-tested line 1 is poor contact.

[0089] Figure 4 The schematic diagram of the to-be-tested hard disk slot of the to-be-tested server connected with the detection circuit of the present application is taken as an example. Figure 4 For example, if the connection between the controller 303 and the hardware backboard 302 of the to-be-tested line 1 appears open circuit, the electrical signal in the to-be-tested line 1 is emitted by the signal generator 102 and reaches the hardware backboard 302 through the edge connector 101. Since abnormal open circuit appears between the controller 303 and the hardware backboard 302, the current loop cannot be formed, resulting in that the indicating element 1 does not emit light, i.e., is in the off state.

[0090] If the connection between the controller 303 and the hardware backboard 302 of the to-be-tested line 1 appears poor contact (but has not completely appeared open circuit), the entire circuit is in a loop state at this time, but the impedance is relatively high, only a small part of the current can flow in the loop, resulting in that the indicating element 1 emits weak light, i.e., is in the state corresponding to the second brightness.

[0091] If the connection between the to-be-tested line 1 and the hardware backboard 302 is normal, it indicates that the connection between the controller 303 and the hardware backboard 302 in the to-be-tested line 1 is normal, and the state of the indicating element 1 is the state corresponding to the first brightness.

[0092] That is, by judging the states of the N indicating elements, whether the N to-be-tested lines are faulty can be determined respectively. For example, the state of the indicating element 1 corresponding to the to-be-tested line 1 is off, the state of the indicating element 3 corresponding to the to-be-tested line 3 is the state corresponding to the second brightness, and the states of the indicating elements corresponding to the other to-be-tested lines are all the state corresponding to the first brightness. It indicates that the to-be-tested line 1 and the to-be-tested line 3 are abnormal, and the maintenance personnel can process the faults of the two to-be-tested lines, thereby improving the fault processing efficiency.

[0093] In a possible implementation, the N indicating elements can be traditional small bulbs, and the specific implementation can refer to the above-mentioned LED, which will not be described here again.

[0094] In a possible implementation, the N indicating elements can be organic light-emitting diodes (OLEDs), and the specific implementation can refer to the above-mentioned LED, which will not be described here again.

[0095] In this embodiment, the connection states of the to-be-tested lines can be directly determined by the states of the LEDs, time is saved, and the fault detection efficiency is improved.

[0096] In a possible implementation, the detection circuit 10 further includes a press switch 104 and a power supply 105.

[0097] Figure 5 Another schematic diagram of a detection circuit provided in the embodiment of the application is shown in FIG. 4. Figure 5 The press switch 104 is connected with the power supply 105 and the signal generator 102 respectively.

[0098] The power supply 105 is configured to supply power to the detection circuit 10.

[0099] The press switch 104 is configured to control the detection device to be powered on when the press switch 104 is in a conduction state.

[0100] Specifically, the input end of the press switch 104 is connected with the power supply 105, and the output end of the press switch 104 is connected with the signal generator 102.

[0101] When the press switch 104 is in the conduction state, the path between the power supply 105 and the signal generator 102 is communicated, so that the detection circuit 10 is powered on. When the press switch 104 is in a non-conduction state, the path between the power supply 105 and the signal generator 102 is disconnected, and the detection circuit 10 is powered off.

[0102] When the server fails to identify the hard disk, the maintenance personnel can control the push switch 104 to control the on-off communication between the power supply 105 and the signal generator 102, so as to control the power-on or power-off of the detection circuit 10.

[0103] In a possible implementation, the push switch 104 can also be another switch such as a rotary switch, and the application does not limit this.

[0104] In a possible implementation, the power supply 105 can output direct current.

[0105] In a possible implementation, the power supply 105 can be a 3.3V button cell. The power supply 105 can also be another power supply device, and the application does not limit this.

[0106] In this embodiment, the power-on of the detection circuit 10 is controlled by the push switch 104, so that energy saving can be achieved when not in use.

[0107] It should be noted that in the embodiments of the application, “connection” refers to electrical connection.

[0108] In a possible implementation, the detection circuit 10 further includes a crystal element 106.

[0109] In a possible implementation, the signal generator 102 can be a clock generator, and the N electrical signals can be generated by the clock generator.

[0110] Figure 6 Another schematic diagram of a detection circuit provided in the embodiments of the application is shown in FIG. 2. Figure 6 As shown in FIG. 2, the detection circuit 10 further includes a crystal element 106.

[0111] The crystal element 106 is connected with the signal generator 102, and the crystal element 106 is configured to provide a frequency reference for the signal generator 102, so that the signal generator 102 generates the N electrical signals.

[0112] In a possible implementation, the signal generator 102 can be a clock generator. The crystal element 106 can be a quartz crystal, which has a piezoelectric effect and mechanically vibrates when a voltage is applied, so as to generate a stable frequency, thereby enabling the clock generator to output a stable alternating current signal.

[0113] In this embodiment, the N electrical signals are generated by the cooperation of the crystal element and the clock generator.

[0114] In one possible implementation, the signal generator 102 can be a frequency converter, which can convert the DC power supplied by the power supply 105 into AC power to generate an AC signal.

[0115] The following describes a detection device provided in an embodiment of this application.

[0116] Figure 7 This is a schematic diagram of the structure of a detection device provided in an embodiment of this application. The detection device 70 includes the detection circuit 10 in any of the above embodiments.

[0117] like Figure 7 As shown, the detection device 70 also includes a housing 701, and a chamber 702 is provided inside the housing 701, and the detection circuit 10 is disposed in the chamber 702.

[0118] The housing 701 has an opening 703 that connects the chamber 702 and the outer space of the housing 701, and the edge connector 101 is located at the opening 703.

[0119] The edge connector 101 is located at the opening 703 and can contact the outer space of the housing 701 so that the edge connector 101 can be connected to the hard disk slot 301 of the external server under test 30.

[0120] Figure 7 Other components of the detection circuit 10 are not shown in the figure. For the specific structure of the detection circuit 10, please refer to the above embodiment.

[0121] In this embodiment, by setting the detection circuit 10 inside the cavity of the housing of the detection device 70 and setting the edge connector 101 at the opening of the housing 701, it is convenient to connect the edge connector 101 to the hard drive slot 301 under test when the hard drive of the server under test 30 cannot be recognized, thereby realizing fault detection.

[0122] In one possible implementation, an indicator panel 704 is provided on the housing 701. Figure 8 A schematic diagram of an indicator panel provided in an embodiment of this application, as shown below. Figure 8 As shown, the indicator panel 704 is printed with the labels of the N lines to be tested corresponding to the hard disk slot 301 under test.

[0123] The N indicator elements in the detection circuit 10 are respectively located on the inside of the indicator panel 704, and are used to indicate the connection status of the N circuits under test.

[0124] For example, taking Nvme memory as an example, N is 16, and the identifiers of the N to-be-tested lines may include Txp[0], RXP[0], TXP[1], RXP[1], TXP[2], RXP[2], TXP[3], RXP[3], TXN[0], RXN[0], TXN[1], RXN[1], TXN[2], RXN[2], TXN[3] and RXN[3], for example. Among them, TXP[0] and TXN[0] are a group of data transmission and data reception differential pairs, RXP[0] and RXN[0] are a group of data transmission and data reception differential pairs, and TXP[0], TXN[0], RXP[0] and RXN[0] can be used to indicate a physical link of the Nvme memory. The other identifiers are similar to TXP[0], TXN[0], RXP[0] and RXN[0], which will not be described again.

[0125] Correspondingly, the N indicating elements are fixed inside the indicating panel 704. Taking any one of the indicating elements as an example, if the state of the indicating element is the state corresponding to the second brightness, the identifier of the to-be-tested line corresponding to the indicating element can be illuminated. If the state of the indicating element is off, the identifier of the to-be-tested line corresponding to the indicating element will not be illuminated. The maintenance personnel can quickly determine the connection state of each to-be-tested line by observing the state of the N indicating elements, so as to determine the fault cause.

[0126] In the embodiment, the indicating panel 704 is arranged on the upper side of the shell 701, the N identifiers of the electrical signals are printed on the indicating panel 704, and the N indicating elements corresponding to the N identifiers of the electrical signals are arranged inside the indicating panel 704. Therefore, the connection state of the N to-be-tested lines corresponding to the to-be-tested hard disk slot 301 can be indicated by the N indicating elements.

[0127] In a possible implementation, the detection circuit 10 further includes a push switch 104. The push switch 104 can be arranged on the outside of the indicating panel 704. The push switch 104 is used to control the power-on or power-off of the detection circuit 10.

[0128] That is, when the to-be-tested server cannot recognize the hard disk, the maintenance personnel can take out the hard disk from the to-be-tested hard disk slot 301 and insert the edge connector 101 of the detection device 70 into the to-be-tested hard disk slot 301. After the edge connector 101 is connected with the to-be-tested hard disk slot 301, the maintenance personnel can trigger the push switch 104, so that the push switch 104 is in the conduction state, the detection circuit 10 is powered on, and the fault detection is started. After the fault detection is completed, the maintenance personnel can trigger the push switch 104, so that the push switch 104 is in the non-conduction state, and the detection circuit 10 is powered off, so as to save energy.

[0129] In embodiments of the application, the controller can be a hardware processor such as a central processing unit (CPU), a graphics processing unit (GPU), a field programmable gate array (FPGA), a digital signal processing (DSP) chip, an application-specific integrated circuit (ASIC), and the like.

[0130] In embodiments of the application, the hard disk can also be any suitable magnetic or magneto-optical storage medium, such as resistive random access memory (RRAM), dynamic random access memory (DRAM), static random-access memory (SRAM), enhanced dynamic random access memory (EDRAM), high-bandwidth memory (HBM), hybrid memory cube (HMC), and the like.

[0131] It should be noted that the terms "one embodiment", "an embodiment", "certain embodiments", "some embodiments", "possible implementations" and the like refer to specified techniques, implementations, examples and / or ways of doing things, which can include structural and / or functional equivalents thereof. Thus, such terms are not necessarily referring to the same embodiment or the same general inventive concept. Furthermore, they are not necessarily referring to the same implementation or the same general inventive concept. Also, it is to be understood that the phraseology "in one embodiment" is meant to guide a person of ordinary skill to further appreciate the disclosure, and is not a limitation on the scope of embodiments. It is to be understood that the phraseology "in one embodiment" and "in an embodiment" are used herein to refer to a particular embodiment, wherein each embodiment can include different features, structures, or characteristics. Additionally, it should be understood that when a particular feature, structure, or characteristic is described in connection with an embodiment, it is submitted that it is within the purview of one of ordinary skill in the art to effect such feature, structure, or characteristic in connection with other embodiments whether or not explicit

[0132] In addition, spatially relative terms, such as "under", "below", "lower", "over", "upper" and the like, can be used herein for ease of description to describe one element or feature's relationship to another element(s) or feature(s) as illustrated in the figures. The spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientations depicted in the figures. The devices can be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

[0133] In the above embodiments, the description of each of the embodiments focuses on different aspects, and the parts not described in detail in a certain embodiment can be referred to the relevant description of other embodiments. Each of the technical features of the above embodiments can be combined arbitrarily, and in order to make the description brief, each of the technical features in the above embodiments is not described in all possible combinations, however, as long as the combinations of the technical features do not exist contradictory, it should be considered that it is within the scope of the disclosure.

[0134] Other embodiments of this application will be apparent to those skilled in the art from consideration of the specification and practice of the application disclosed herein. It is intended that the specification and examples be considered as exemplary only, with the true scope and spirit of the application being indicated by the following claims.

[0135] It is to be understood that the application is not limited to the precise construction described in the specification and shown in the drawings, and that various modifications and changes can be effected therein by those skilled in the art without departing from the scope of the application. The scope of the application is to be limited only by the appended claims.

Claims

1. A detection circuit, characterized by, The detection circuit comprises: an edge connector for connecting a to-be-tested hard disk slot of a to-be-tested server, the to-be-tested hard disk slot corresponding to N to-be-tested lines; wherein the N to-be-tested lines comprise N first sub-connection lines and N second sub-connection lines; the to-be-tested hard disk slot is connected with a hard disk backplane through the N first sub-connection lines, the hard disk backplane is connected with a controller through the N second sub-connection lines, and the controller is grounded through a preset resistor R1; a signal generator connected with the edge connector through N connection lines, wherein an indicating element is arranged on each of the N connection lines, and the signal generator is configured to generate N electrical signals when the detection circuit is powered on, and the N electrical signals are configured to control the states of the N indicating elements. The states of the N indicating elements are configured to indicate the connection states of the N to-be-tested lines, and the connection states comprise open circuit, poor contact and normal connection, wherein N is a positive integer.

2. The detection circuit of claim 1, wherein, The N indicating elements are light-emitting diodes (LEDs), and the states comprise an extinguished state, a first brightness corresponding state and a second brightness corresponding state, wherein the first brightness is greater than the second brightness. For any one of the indicating elements, when the state of the indicating element is the extinguished state, the connection state of the to-be-tested line corresponding to the indicating element is the open circuit; when the state of the indicating element is the first brightness corresponding state, the connection state of the to-be-tested line corresponding to the indicating element is the normal connection; and when the state of the indicating element is the second brightness corresponding state, the connection state of the to-be-tested line corresponding to the indicating element is the poor contact.

3. The detection circuit of claim 1, wherein, The detection circuit further comprises a press switch and a power supply; the press switch is connected with the power supply and the signal generator respectively. The power supply is configured to supply power to the detection circuit. The press switch is configured to control the detection circuit to be powered on when the press switch is in a conductive state.

4. The detection circuit according to any one of claims 1 to 3, characterized in that, The N electrical signals are alternating current signals, and the signal generator is a clock generator.

5. The detection circuit of claim 4, wherein, The detection circuit further comprises a crystal element. The crystal element is connected with the signal generator, and the crystal element is configured to provide a frequency reference for the signal generator, so that the signal generator generates the N electrical signals.

6. The detection circuit according to any one of claims 1 to 3, characterized in that, The N electrical signals are alternating current signals, and the signal generator is a frequency converter.

7. A detection device, characterized by The detection circuit comprises: The detection circuit according to any one of claims 1-6.

8. The detection device of claim 7, wherein, The detection device further comprises a shell, wherein a cavity is arranged in the shell, and the detection circuit is arranged in the cavity. The shell is provided with an opening, and the opening communicates the cavity with an external space of the shell, and the edge connector of the detection circuit is arranged at the opening.

9. The detection device of claim 8, wherein, The shell is provided with an indication panel, and the indication panel is printed with the identities of the N to-be-tested lines corresponding to the to-be-tested hard disk slot. The N indicating elements in the detection circuit are arranged on the inner side of the indication panel and correspond to the identities of the N to-be-tested lines, and the N indicating elements are configured to indicate the connection states of the N to-be-tested lines.

10. The detection device of claim 9, wherein, The detection circuit further comprises a push switch arranged on the outside of the indication panel, and the push switch is used for controlling power-on or power-off of the detection circuit.

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