Irregular object inspection device

Abstract

There is provided an irregular object inspection apparatus including: a stage moving an irregular object and extending along a first axis extending in a first direction; the first camera is located on the workbench; the second camera is located on one side of the workbench; and an illumination portion located on the table and including a curved surface, the illumination portion having a tunnel shape so as to be able to provide an accommodation space in which an irregular object can be positioned on the inner side, the illumination portion irradiating light to the accommodation space, the first camera sensing indirect light generated by the illumination portion, and the second camera sensing indirect light generated by the illumination portion. The second camera senses direct light emitted from an inner side surface of the illumination portion.

Description

Technical Field

[0001] This utility model relates to an irregular object inspection device, and more specifically, to an irregular object inspection device capable of inspecting multiple types of irregular objects at once. Background Technology

[0002] To inspect irregular objects, different inspection methods must be applied depending on the type of irregular object. Various types of irregular objects can be placed on a plate, and the irregular object inspection device can inspect different types of irregular objects. Various wavelengths of light can be used for inspection, and the wavelength and brightness of the light can be adjusted to inspect the surface and interior of the irregular object. Utility Model Content

[0003] Technical issues

[0004] The technical problem to be solved by this utility model is to provide an irregular object inspection device that can inspect multiple types of irregular objects at one time and an irregular object inspection method using the same device.

[0005] The technical problem to be solved by this utility model is to provide an irregular object inspection device and a method for inspecting irregular objects that can use both indirect and direct light from the illumination section.

[0006] The technical problem to be solved by this utility model is to provide an irregular object inspection device and an irregular object inspection method that can perform quality inspection of irregular objects even if the degree of curvature and the direction of curvature of the irregular object are different.

[0007] The technical problems to be solved by this utility model are not limited to those mentioned above. Those skilled in the art can clearly understand from the following description other technical problems not mentioned.

[0008] Solution

[0009] To address the aforementioned technical problem, an irregular object inspection device according to one embodiment of the present invention may include: a worktable for moving irregular objects and extending along a first axis extending in a first direction; a first camera located on the worktable; a second camera located on one side of the worktable; and an illumination unit located on the worktable and including a curved surface, the illumination unit having a tunnel shape to provide a receiving space capable of positioning irregular objects inside, the illumination unit illuminating light into the receiving space, the first camera sensing indirect light generated by the illumination unit, and the second camera sensing direct light emitted from the inner surface of the illumination unit.

[0010] To solve the aforementioned technical problem, an irregular object inspection device according to one embodiment of the present invention may include: a worktable for moving irregular objects and extending along a first axis extending in a first direction; an illumination unit located on the worktable and having a tunnel shape; a first camera located on the illumination unit; and a second camera located on one side of the worktable. The illumination unit provides a receiving space capable of positioning the irregular object inside, the illumination unit irradiates light into the receiving space, the first camera senses indirect light generated by the illumination unit, the second camera senses direct light emitted from the inside of the illumination unit, and the height of the second camera is higher than the height of the illumination unit.

[0011] To address the aforementioned technical problem, an irregular object inspection method according to one embodiment of the present invention may include: arranging the irregular object on an irregular object inspection device; moving the irregular object; and inspecting the irregular object. The irregular object inspection device includes: a worktable for moving the irregular object and extending along a first axis extending in a first direction; an illumination unit located on the worktable; and a first camera located on one side of the illumination unit. The illumination unit has a tunnel shape and provides a receiving space. Inspecting the irregular object includes the first camera using direct light from the illumination unit to inspect the irregular object.

[0012] Specific details of other implementation methods are included in the detailed description and accompanying drawings.

[0013] Beneficial effects

[0014] According to the irregular object inspection device and method of this invention, multiple types of irregular objects can be inspected simultaneously. Furthermore, the irregular object inspection device and method of this invention can utilize both indirect and direct light from the illumination unit to inspect irregular objects.

[0015] According to the irregular object inspection device and the irregular object inspection method of the present invention, even if the degree of curvature and the direction of curvature of the irregular object are different, the quality inspection of the irregular object can be carried out.

[0016] The effects of this utility model are not limited to those mentioned above. Those skilled in the art can clearly understand from the following description other effects not mentioned. Attached Figure Description

[0017] Figure 1 This is a perspective view showing an irregular object inspection device according to an embodiment of the present invention.

[0018] Figure 2This is a plan view showing an irregular object inspection device according to an embodiment of the present invention.

[0019] Figure 3 This is a side view showing an irregular object inspection device according to an embodiment of the present invention.

[0020] Figure 4 This is a graph showing the transmittance of a filter according to the wavelength of light according to an embodiment of the present invention.

[0021] Figure 5 This is a perspective view showing the lighting unit according to an embodiment of the present invention.

[0022] Figure 6 This is a side view showing an irregular object inspection device according to an embodiment of the present invention.

[0023] Figure 7 This is a flowchart illustrating an irregular object inspection method according to an embodiment of the present invention.

[0024] Explanation of reference numerals in the attached figures

[0025] SY: Irregular object inspection device

[0026] CA1: First Camera

[0027] CA11: Camera 1-1

[0028] CA12: Cameras 1-2

[0029] CA2: Second Camera

[0030] CA21: Camera 2-1

[0031] CA22: Camera 2-2

[0032] 1: Workbench

[0033] 3: Lighting Department

[0034] AX1: First axis

[0035] AX2: Second axis

[0036] IS: Indirect Light Region

[0037] WL1: First Band

[0038] WL2: Second Band Detailed Implementation

[0039] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. Throughout this specification, the same reference numerals may refer to the same constituent elements.

[0040] In the following text, D1 can be referred to as the first direction, D2 which intersects the first direction D1 can be referred to as the second direction, and D3 which intersects each of the first direction D1 and the second direction D2 can be referred to as the third direction.

[0041] In this specification, when it is described that any component (or region, layer, part, etc.) is "on", "connected" or "joined" to other components, it means that it can be directly arranged / connected / joined to other components, or a third component can be arranged between them.

[0042] The same reference numerals refer to the same constituent elements. Furthermore, in the drawings, for the sake of effective description of the technical content, the thickness, proportions, and dimensions of the constituent elements are exaggerated. "And / or" includes more than one combination of all relevant constituent elements that can be defined.

[0043] The terms "first," "second," etc., can be used to describe various constituent elements, but the constituent elements should not be limited to these terms. The terms are used only for the purpose of distinguishing one constituent element from others. For example, without departing from the scope of this utility model, a first constituent element can be named a second constituent element, and similarly, a second constituent element can be named a first constituent element. Unless the context clearly indicates otherwise, singular expressions include plural expressions.

[0044] Furthermore, terms such as "below," "lower side," "above," and "upper side" are used to describe the relationships between the constituent elements shown in the accompanying drawings. These terms are relative concepts and are described based on the directions indicated in the drawings.

[0045] Terms such as “including” or “having” should be understood as being intended to specify the presence of features, figures, steps, operations, constituent elements, components, or combinations thereof described in the specification, rather than precluding the possibility of the presence or addition of one or more other features, figures, steps, operations, constituent elements, components, or combinations thereof.

[0046] Unless otherwise defined, all terms used in this specification (including technical and scientific terms) may have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. Furthermore, terms identical to those defined in common dictionaries shall be interpreted as having the same meaning as they have in the context of the related art, and shall not be interpreted as having overly idealized or formalistic meanings unless explicitly defined herein.

[0047] Figure 1 This is a perspective view showing the irregular object inspection device SY according to an embodiment of the present invention. Figure 2 This is a plan view showing the irregular object inspection device SY according to an embodiment of the present invention. Figure 3 This is a side view showing the irregular object inspection device SY according to an embodiment of the present invention. Figure 4 This is a graph showing the transmittance of a filter according to the wavelength of light according to an embodiment of the present invention.

[0048] refer to Figure 1 , Figure 2 and Figure 3 An irregular object inspection device SY can be provided. The irregular object inspection device SY can inspect the surface and interior of objects of various shapes. The irregular object inspection device SY can inspect the surface and interior of various types of objects. For example, the irregular object inspection device SY can inspect the surface and interior of a first irregular object. The irregular object inspection device SY can inspect the surface and interior of a second irregular object. In this specification, the first irregular object may mean an RSIC (Readout Source Integrated Circuit). RSIC can mean a readout integrated circuit. RSIC can mean a semiconductor that makes a touchscreen of a thin-film transistor liquid crystal display device without a film. RSIC can be used in ultraviolet-sensitive light sensors, infrared detectors, and X-ray readers, etc. However, the first irregular object is not limited to this and may also include various objects whose surface shape or curvature can be changed. In this specification, the second irregular object may mean an FPC (Flexible Printed Circuit). FPC can be a flexible printed substrate. FPC can be used for thin or folded parts in various devices. FPC can be used in various electronic devices such as smartphones, televisions, and laptops. However, the second irregular object is not limited to this and can also include various objects that can change the shape or curvature of the surface. The types of the first and second irregular objects can be different from each other.

[0049] The irregular object inspection device SY may include a worktable 1, a first camera CA1, a second camera CA2, and an illumination unit 3. The worktable 1 can support irregular objects. The worktable 1 can move the irregular objects. More specifically, the worktable 1 can support a first irregular object and a second irregular object. The first and second irregular objects may be supported by a plate. The first and second irregular objects may be located on the plate. The worktable 1 can inspect the first and second irregular objects by moving the plate. The worktable 1 may extend along a first axis AX1 extending in a first direction D1. In this specification, the worktable 1 may have a straight strip shape. However, the shape of the worktable 1 is not limited to this. The worktable 1 may also include various shapes capable of moving the plate and the irregular objects.

[0050] The lighting unit 3 can be located on the worktable 1. The lighting unit 3 can illuminate the worktable 1. The lighting unit 3 can provide a receiving space 3h. The lighting unit 3 can provide a first opening 3ha and a second opening 3hb. An irregular object can be located in the receiving space 3h. The irregular object can enter the receiving space 3h through the first opening 3ha and exit the receiving space 3h through the second opening 3hb. However, the direction of movement of the irregular object is not limited to this. The irregular object can enter the receiving space 3h through the second opening 3hb and exit the receiving space 3h through the first opening 3ha. For convenience, in this specification, it is described based on the premise that the irregular object enters the receiving space 3h through the first opening 3ha and exits the receiving space 3h through the second opening 3hb. The lighting unit 3 can provide a second axis AX2 that runs vertically through the lighting unit 3. The second axis AX2 can extend in a second direction D2. The first axis AX1 and the second axis AX2 can be perpendicular to each other. The lighting unit 3 will be described later.

[0051] The first camera CA1 can inspect a first irregular object. The first camera CA1 can inspect the surface and internal defects of the first irregular object. The first camera CA1 can be located on the worktable 1. The first camera CA1 can be located on the lighting unit 3. The height of the first camera CA1 can be higher than the height of the lighting unit 3. (Reference) Figure 1 and Figure 2The first camera CA1 may include a first-1 camera CA11 and a first-2 camera CA12. Both the first-1 camera CA11 and the first-2 camera CA12 can inspect irregular objects of the same type. Both the first-1 camera CA11 and the first-2 camera CA12 can inspect a first irregular object. Hereinafter, the contents of this specification for the first camera CA1 can be equally applied to the first-1 camera CA11 and the first-2 camera CA12. The first-1 camera CA11 and the first-2 camera CA12 may be located on opposite sides of the illumination unit 3. The illumination unit 3 may be located between the first-1 camera CA11 and the first-2 camera CA12. The first-1 camera CA11 may face the first opening 3ha. The first-2 camera CA12 may face the second opening 3hb.

[0052] refer to Figure 3 The first camera CA1 can inspect a first irregular object using indirect light based on the illumination unit 3. The indirect light area IS sensed by the first camera CA1 can mean an area spaced from the illumination unit 3 by about 5 mm to about 20 mm. However, the indirect light area IS sensed by the first camera CA1 is not limited to this. The first camera CA1 and the second axis AX2 can form a first angle AG1. The first angle AG1 can be about 25° to about 35°. More specifically, the first camera CA1 can be tilted from the second axis AX2 by about 30°. More specifically, the first-1 camera CA11 can be tilted from the second axis AX2 towards the upper side of the illumination unit 3 (e.g., the side of the first opening 3ha) by about 25° to about 35°. The first-2 camera CA12 can be tilted from the second axis AX2 towards the lower side of the illumination unit 3 (e.g., the side of the second opening 3hb) by about 25° to about 35°.

[0053] The first camera CA1 may include a filter. (See reference) Figure 4A graph showing the transmittance of a filter according to the wavelength of light can be provided. The horizontal axis of the graph represents the wavelength of light. The vertical axis of the graph represents the transmittance of light. A filter can allow light of a specific wavelength band to pass through. More specifically, the first camera CA1 may include a filter capable of filtering light with wavelengths below 400 nm or above 550 nm. In this specification, if the wavelength is above 400 nm and below 550 nm, it can be referred to as the first band WL1. If the wavelength is below 400 nm or above 550 nm, it can be referred to as the second band WL2. The filter can allow the light of the first band WL1 to pass through the most. More specifically, the transmittance of the first band WL1 of the filter can be 0.8 or more. The transmittance of the first band WL1 of the filter can be 80% or more. However, the filter does not only allow the light of the first band WL1 to pass through. The filter can also allow a portion of the light of the second band WL2 to pass through. By allowing a portion of the light from the second band (WL2) to pass through the filter, the surface and interior of irregular objects can be observed more clearly compared to allowing only the light from the first band (WL1) to pass through.

[0054] The second camera CA2 can sense direct light emitted from the inner surface of the illumination unit 3. The second camera CA2 may include a second-first camera CA21 and a second-second camera CA22. Both the second-first camera CA21 and the second-second camera CA22 can sense the same irregular objects. The type and configuration of the second-first camera CA21 and the second-second camera CA22 can be identical. Hereinafter, the contents applicable to the second camera CA2 can also apply to both the second-first camera CA21 and the second-second camera CA22. The height of the second camera CA2 can be higher than the height of the worktable 1. The height of the second camera CA2 can be higher than the height of the illumination unit 3. The second camera CA2 can be spaced apart from the worktable 1 in the third direction D3. The second camera CA2 can be located on one side of the worktable 1 in the third direction D3. The third direction D3 can be perpendicular to the first direction D1 and the second direction D2. The second camera CA2 can be tilted from approximately 25° to approximately 35° from the second axis AX2 that vertically penetrates the illumination unit 3. More specifically, the second camera CA2 can be tilted approximately 30° from the second axis AX2 toward the upper surface of the worktable 1. By tilting the second camera CA2, it can sense direct light emitted from the inner surface of the illumination unit 3. The second camera CA2 can form a focal point on either the inner surface of the illumination unit 3 or the upper surface of the worktable 1. The second camera CA2 can directly photograph irregular objects located on the worktable 1 to inspect their quality.

[0055] To sense irregular objects, the second camera CA2 can utilize the Chapsky condition for focus shifting. The second camera CA2 may include multiple CCD (Charge-Coupled Device) sensors. The second camera CA2 can control these multiple CCD sensors to focus its attention on the irregular curved surface.

[0056] Figure 5 This is a perspective view showing the lighting unit 3 according to an embodiment of the present invention. Figure 6 This is a side view showing an irregular object inspection device SY according to an embodiment of the present invention.

[0057] refer to Figure 5 The lighting unit 3 may have a tunnel shape. The lighting unit 3 may include a curved surface. The radius of curvature RR of the lighting unit 3 may be between 160 mm and 170 mm. More specifically, the radius of curvature RR of the lighting unit 3 may be 165 mm. However, the radius of curvature RR of the lighting unit 3 is not limited to this. The lighting unit 3 can position irregular objects within the receiving space 3h. The lighting unit 3 can illuminate the receiving space 3h. The light illuminated by the lighting unit 3 into the receiving space 3h may include white light. (Reference) Figure 6 The illumination unit 3 can rotate around the second axis AX2. As the illumination unit 3 rotates, the indirect light area IS can also rotate. By rotating the illumination unit 3, it is possible to confirm poor visibility differences based on irregular objects.

[0058] Figure 7 This is a flowchart illustrating an irregular object inspection method S according to an embodiment of the present invention.

[0059] refer to Figure 7 The irregular object inspection method S may include arranging the irregular object in the irregular object inspection device SY S1, moving the irregular object S2, and inspecting the irregular object S3. Inspecting the irregular object S3 may include using a second camera CA2 to inspect the irregular object S31 using direct light from the illumination unit 3. The second camera CA2 may be arranged at an angle relative to the illumination unit 3 to inspect the irregular object arranged in the receiving space 3h.

[0060] According to the irregular object inspection apparatus and method based on an exemplary embodiment of the present invention, multiple types of irregular objects can be inspected simultaneously. A first camera can inspect the mass of a first irregular object. A second camera can inspect the mass of a second irregular object. Even if the first and second irregular objects are located on the same plate, multiple types of cameras can inspect the mass of multiple types of irregular objects. Furthermore, by including a first camera (camera 1-1 and camera 1-2) and a second camera (camera 2-1 and camera 2-2), multiple irregular objects located in a receiving space can be inspected.

[0061] According to the irregular object inspection apparatus and method based on exemplary embodiments of the present invention, by using a filter that allows not only light of the first wavelength band to pass through but also a portion of light of the second wavelength band, the first camera can more easily identify defects in the irregular object. If the filter only transmits light of the first wavelength band while blocking all light of the second wavelength band, the visibility of defects in the irregular object may be reduced. If the first camera does not use a filter and only uses white light, the visibility of defects in the irregular object may also be reduced.

[0062] According to the irregular object inspection apparatus and method based on an exemplary embodiment of the present invention, a second camera can easily identify defects in irregular objects with highly curved surfaces by utilizing the Chapsky condition. By moving the CCD sensor of the second camera according to the Chapsky condition, the second camera can adjust its focus to align with the surface of the irregular object.

[0063] Although embodiments of the present invention have been described above with reference to the accompanying drawings, those skilled in the art will understand that the present invention can be implemented in other specific ways without changing its technical concept or essential features. Therefore, it should be understood that the embodiments described above are exemplary in all respects, and not limiting.

Claims

1. An irregular object inspection apparatus characterized by comprising: Comprise: a table that moves an irregular object and extends along a first axis extending in a first direction; a first camera located on the table; a second camera located on a side of the table; and an illumination part located on the table and comprising a curved surface, the illumination part has a tunnel shape to be able to provide a containing space in which the irregular object can be positioned inside, the illumination part irradiates light to the containing space, the first camera senses indirect light generated by the illumination part, the second camera senses direct light emitted from the inner side surface of the illumination part.

2. The irregular object inspection apparatus according to claim 1, wherein the first camera comprises a 1-1 camera and a 1-2 camera, the illumination part is located between the 1-1 camera and the 1-2 camera.

3. The irregular object inspection apparatus according to claim 1, wherein the first camera is inclined by 25° to 35° from a second axis that vertically penetrates the illumination part, the second axis is perpendicular to the first axis.

4. The irregular object inspection apparatus according to claim 1, wherein the illumination part is rotatable about a second axis that is perpendicular to the first axis.

5. The irregular object inspection apparatus according to claim 1, wherein the second camera comprises a 2-1 camera and a 2-2 camera, the second camera is spaced apart from the table in a third direction, the third direction is perpendicular to the first direction.

6. The irregular object inspection apparatus according to claim 5, wherein the second camera is inclined by 25° to 35° from a second axis that vertically penetrates the illumination part, the second axis is perpendicular to the first axis.

7. The irregular object inspection apparatus according to claim 5, wherein the second camera is capable of focus shifting using the Chapusek condition.

8. The irregular object inspection apparatus according to claim 1, wherein the first camera comprises a filter that is capable of filtering light having a wavelength of 400 nm or less or 550 nm or more.

9. The irregular object inspection apparatus according to claim 1, wherein a height of the first camera is higher than a height of the illumination part, the height of the illumination part is higher than a height of the table. ​

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