Probe for testing integrated circuit

Abstract

The utility model discloses a probe for testing an integrated circuit, which comprises a probe station, an electromagnet is arranged above the probe station, a lifting assembly is arranged at the top of the electromagnet, a probe base is arranged at the top of the lifting assembly, sliding grooves are formed in the front side and the rear side of the bottom of the inner wall of the probe base, and the sliding grooves are communicated with the electromagnet. A sliding groove is formed in the inner wall of the probe base, a driving box is slidably connected into the sliding groove, an electric cylinder is fixedly connected to the bottom of the inner wall of the probe base, the output end of the electric cylinder is fixedly connected with the driving box, a driving assembly is arranged in the driving box, and a probe is arranged outside the driving box. According to the utility model, an ingenious design is adopted, a set of comprehensive and efficient adjusting system is constructed, the use convenience of the probe for testing the integrated circuit is greatly improved, an operator can easily meet various complex test requirements in an actual test scene, the test period is remarkably shortened, the working efficiency is improved, and the test cost is reduced. The device has the advantage of being convenient to use.

Description

TECHNICAL FIELD

[0001] The utility model relates to probe technical field, concretely is a kind of probe for integrated circuit test. BACKGROUND

[0002] At present, integrated circuit is smaller and smaller in size, more and more in function, and higher integration leads to smaller and smaller chip area, and the required test requires probe to be thinner and thinner, which poses new challenges to integrated circuit test, especially manual test and on-chip test in large quantities in research and development stage.

[0003] Compared with full-automatic test, manual test does not need to purchase probe card and does not need to program test, with lower cost and convenient test replacement, but longer test time, so manual test is suitable for application in product research and development stage. In actual manual probe test process, the following defects exist: as probe is thinner and thinner, slight collision caused by careless operation can damage needle tip, causing test error; manual test is generally used in research and development stage, and the size of developed product is indefinite, while the extension range of probe needle is generally small, probe base needs to be moved, and the probe base of existing test device is generally fixed, thus causing inconvenience in use, so it is necessary to design and reform probe for integrated circuit test to effectively prevent the phenomenon of inconvenience in use. UTILITARIAN CONTENT

[0004] To solve the problems proposed in the above background art, the purpose of the utility model is to provide a probe for integrated circuit test, which has the advantage of being convenient to use.

[0005] To achieve the above-mentioned purpose, the utility model provides the following technical scheme: a probe for integrated circuit test, comprising a probe table, an electromagnet is arranged above the probe table, a lifting assembly is arranged at the top of the electromagnet, a probe base is arranged at the top of the lifting assembly, a sliding groove is arranged on the front side and the rear side of the bottom of the inner wall of the probe base, a driving box is slidably connected in the sliding groove, an electric cylinder is fixedly connected to the bottom of the inner wall of the probe base, the output end of the electric cylinder is fixedly connected with the driving box, a driving assembly is arranged in the driving box, and a probe is arranged outside the driving box.

[0006] As preferred in the utility model, the lifting assembly comprises a support plate fixedly connected to the top of the electromagnet, a cylinder is fixedly connected around the top of the support plate, a movable rod is slidably connected in the cylinder, a movable plate is fixedly connected to the top of the movable rod, the movable plate is fixedly connected with the probe base, a fixed frame is fixedly connected to the top of the support plate, a sleeve is rotatably connected in the fixed frame, a first threaded rod is screwedly connected in the sleeve, and the first threaded rod is fixedly connected with the movable plate.

[0007] As the practical new type is preferred, the surface of the sleeve is provided with a first sprocket, the top of the supporting plate is fixedly connected with a first motor, the output end of the first motor is fixedly connected with a second sprocket, and the first sprocket and the second sprocket are connected through a chain transmission.

[0008] As the practical new type is preferred, the driving assembly comprises a second threaded rod rotatably connected in the driving box, a movable block slidably connected in the driving box, the movable block being threadedly connected with the second threaded rod, an installation frame fixedly connected with the top of the movable block through bolts, the installation frame being fixedly connected with the probe, a second motor fixedly connected with the front of the driving box, and the output end of the second motor being fixedly connected with the second threaded rod.

[0009] As the practical new type is preferred, the top of the supporting plate is fixedly connected with a supporting block, the inside of the supporting block is slidably connected with a limiting rod, the top of the supporting block is fixedly connected with a compression spring, one end of the compression spring away from the supporting block is fixedly connected with the limiting rod, and the bottom of the limiting rod is fixedly connected with a suction disc.

[0010] As the practical new type is preferred, the top of the probe base is fixedly connected with a protective plate through a screw.

[0011] Compared with the prior art, the practical new type has the following beneficial effects:

[0012] 1. The practical new type adopts a clever design and constructs a comprehensive and efficient adjusting system, greatly improves the convenience of the probe for integrated circuit testing, and the operator can easily cope with various complex testing requirements in the actual testing scene, significantly shortens the testing period, improves the work efficiency, and the device has the advantages of convenient use.

[0013] 2. The practical new type is provided with the lifting assembly, the operator can start the first motor to rotate and drive the second sprocket to rotate, and then drive the first sprocket to rotate, and then drive the sleeve to rotate, since the sleeve is threadedly connected with the first threaded rod, and the first threaded rod is fixedly connected with the movable plate, so that the first threaded rod moves up or down when the sleeve rotates, and then drives the movable plate, the probe base and the probe to move up or down. BRIEF DESCRIPTION OF DRAWINGS

[0014] Figure 1 It is a structural schematic view of the practical new type;

[0015] Figure 2 It is a top view schematic view of the practical new type electric cylinder structure;

[0016] Figure 3 It is a practical new type Figure 1 It is an enlarged schematic view of structure A in the practical new type;

[0017] Figure 4 The utility model discloses Figure 1 The structure amplification schematic diagram of B place is shown.

[0018] In the figure: 1, probe platform 2, electromagnet 3, lifting assembly 4, probe base 5, drive box 6, electric cylinder 7, drive assembly 8, probe 9, support plate 10, cylinder 11, movable rod 12, movable plate 13, fixed frame 14, sleeve 15, first threaded rod 16, first sprocket 17, first motor 18, second sprocket 19, second threaded rod 20, second motor 21, movable block 22, mounting frame 23, support block 24, limiting rod 25, compression spring 26, suction cup 27, guard plate. DETAILED DESCRIPTION

[0019] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model and not all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the utility model.

[0020] As Figures 1 to 4 shown, a kind of probe for integrated circuit test, including probe platform 1, the top of probe platform 1 is provided with electromagnet 2, the top of electromagnet 2 is provided with lifting assembly 3, the top of lifting assembly 3 is provided with probe base 4, the front side and rear side of the inner wall bottom of probe base 4 are all provided with sliding slot, and sliding slot is slidably connected with drive box 5 in its inside, the bottom of the inner wall of probe base 4 is fixedly connected with electric cylinder 6, the output end of electric cylinder 6 is fixedly connected with drive box 5, drive box 5 is provided with drive assembly 7 in its inside, and drive box 5 is provided with probe 8 outside.

[0021] Reference Figure 1 , lifting assembly 3 includes fixedly connected in the top of electromagnet 2 support plate 9, the top of support plate 9 is all fixedly connected with cylinder 10 around, cylinder 10 is slidably connected with movable rod 11 in its inside, the top of movable rod 11 is fixedly connected with movable plate 12, movable plate 12 is fixedly connected with probe base 4, the top of support plate 9 is fixedly connected with fixed frame 13, fixed frame 13 is rotatably connected with sleeve 14 in its inside, sleeve 14 is screw-connected with first threaded rod 15 in its inside, and first threaded rod 15 is fixedly connected with movable plate 12.

[0022] As a technical optimization scheme of the utility model, through the setting of lifting assembly 3, the operator can start the first motor 17 to rotate and drive the second sprocket 18 to rotate, and then drive the first sprocket 16 to rotate, and then drive the sleeve 14 to rotate, because the sleeve 14 is screwed with the first threaded rod 15, and the first threaded rod 15 is fixedly connected with the movable plate 12, so when the sleeve 14 rotates, the first threaded rod 15 moves up or down, and then drives the movable plate 12, probe base 4 and probe 8 to move up or down.

[0023] Reference Figure 3 The surface of the sleeve 14 is sleeved with the first sprocket 16, the top of the supporting plate 9 is fixedly connected with the first motor 17, the output end of the first motor 17 is fixedly connected with the second sprocket 18, and the first sprocket 16 and the second sprocket 18 are connected through chain transmission.

[0024] As a technical optimization scheme of the utility model, through the setting of the first sprocket 16, the second sprocket 18 and the first motor 17, the operator can start the first motor 17 to rotate and drive the second sprocket 18 to rotate, and then drive the first sprocket 16 to rotate, and then drive the sleeve 14 to rotate.

[0025] Reference Figure 2 The driving assembly 7 comprises a second threaded rod 19 rotatably connected in the driving box 5, the inside of the driving box 5 is slidably connected with a movable block 21, the movable block 21 is screwed with the second threaded rod 19, the top of the movable block 21 is fixedly connected with a mounting frame 22 through bolts, the mounting frame 22 is fixedly connected with the probe 8, the front of the driving box 5 is fixedly connected with a second motor 20, and the output end of the second motor 20 is fixedly connected with the second threaded rod 19.

[0026] As a technical optimization scheme of the utility model, through the setting of the driving assembly 7, the operator can start the second motor 20 to rotate and drive the second threaded rod 19 to rotate, and then drive the movable block 21 to move forward or backward, and then drive the mounting frame 22 and the probe 8 to move forward or backward.

[0027] Reference Figure 4 The top of the supporting plate 9 is fixedly connected with a supporting block 23, the inside of the supporting block 23 is slidably connected with a limiting rod 24, the top of the supporting block 23 is fixedly connected with a compression spring 25, one end of the compression spring 25 away from the supporting block 23 is fixedly connected with the limiting rod 24, and the bottom of the limiting rod 24 is fixedly connected with a suction cup 26.

[0028] As a technical optimization scheme of the utility model, through the setting of support block 23, limit rod 24, compression spring 25 and suction cup 26, the top of probe platform 1 is smooth metal surface, when electromagnet 2 moves to appropriate position, operator can move limit rod 24, at this time, compression spring 25 is compressed, so that suction cup 26 is adsorbed on the top of probe platform 1, and then the position of electromagnet 2 is assistedly fixed, and then the position of probe 8 is indirectly assistedly fixed.

[0029] Reference Figure 1 The top of the probe base 4 is fixedly connected with a protective plate 27 through a screw.

[0030] As a technical optimization scheme of the utility model, through the setting of protective plate 27, the components in probe base 4 can be protected.

[0031] The working principle and use process of the utility model are as follows: when using, when probe base 4 moves to appropriate position, when it is necessary to fix probe base 4, operator starts electromagnet 2, so that electromagnet 2 is adsorbed on the top of probe platform 1, and then the position of lifting assembly 3 and probe base 4 is fixed, when it is necessary to move probe base 4, operator closes electromagnet 2, and then moves probe base 4;

[0032] The probe 8 in the application adopts needle piercing mode for direct current test, operator can adjust the height of probe 8 through lifting assembly 3, adjusts the forward and backward movement of probe 8 through driving assembly 7, controls the left and right movement of driving box 5, movable block 21, mounting frame 22 and probe 8 through the contraction and elongation of electric cylinder 6, and then probe 8 can move flexibly within a certain range;

[0033] The above-mentioned electromagnet 2 is the existing common technology, and is the common knowledge of the people in the art, and the application will not be described in detail, the above-mentioned probe 8 is similar to the probe principle mentioned in the utility model patent for integrated circuit direct current test probe equipment with publication number CN206649060U, and the same effect is achieved, and the application will not be described in detail.

[0034] It should be noted that, in this document, relational terms such as first and second and the like can be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises", "comprising", or any other variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but can include other elements not expressly listed or inherent to such process, method, article, or apparatus.

[0035] Although the embodiments of the present application have been shown and described, it is to be understood that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present application, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A probe for testing integrated circuits, comprising a probe station (1), characterized in that: An electromagnet (2) is provided above the probe station (1). A lifting assembly (3) is provided on the top of the electromagnet (2). A probe base (4) is provided on the top of the lifting assembly (3). Slide grooves are provided on the front and rear sides of the bottom of the inner wall of the probe base (4). A drive box (5) is slidably connected inside the slide grooves. An electric cylinder (6) is fixedly connected to the bottom of the inner wall of the probe base (4). The output end of the electric cylinder (6) is fixedly connected to the drive box (5). A drive assembly (7) is provided inside the drive box (5). A probe (8) is provided outside the drive box (5).

2. The probe for integrated circuit testing according to claim 1, characterized in that: The lifting assembly (3) includes a support plate (9) fixedly connected to the top of the electromagnet (2). A cylinder (10) is fixedly connected to all four sides of the top of the support plate (9). A movable rod (11) is slidably connected inside the cylinder (10). A movable plate (12) is fixedly connected to the top of the movable rod (11). The movable plate (12) is fixedly connected to the probe base (4). A fixing frame (13) is fixedly connected to the top of the support plate (9). A sleeve (14) is rotatably connected inside the fixing frame (13). A first threaded rod (15) is threadedly connected inside the sleeve (14). The first threaded rod (15) is fixedly connected to the movable plate (12).

3. The probe for integrated circuit testing according to claim 2, characterized in that: The sleeve (14) is fitted with a first sprocket (16), the top of the support plate (9) is fixedly connected to a first motor (17), the output end of the first motor (17) is fixedly connected to a second sprocket (18), and the first sprocket (16) and the second sprocket (18) are connected by chain drive.

4. The probe for integrated circuit testing according to claim 1, characterized in that: The drive assembly (7) includes a second threaded rod (19) rotatably connected inside the drive housing (5). A movable block (21) is slidably connected inside the drive housing (5). The movable block (21) is threadedly connected to the second threaded rod (19). A mounting bracket (22) is fixedly connected to the top of the movable block (21) by bolts. The mounting bracket (22) is fixedly connected to the probe (8). A second motor (20) is fixedly connected to the front of the drive housing (5). The output end of the second motor (20) is fixedly connected to the second threaded rod (19).

5. A probe for testing integrated circuits according to claim 2, characterized in that: A support block (23) is fixedly connected to the top of the support plate (9). A limit rod (24) is slidably connected inside the support block (23). A compression spring (25) is fixedly connected to the top of the support block (23). One end of the compression spring (25) away from the support block (23) is fixedly connected to the limit rod (24). A suction cup (26) is fixedly connected to the bottom of the limit rod (24).

6. The probe for testing integrated circuits according to claim 1, characterized in that: The top of the probe base (4) is fixedly connected to a protective plate (27) by screws.

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