Resistance testing device for electrochromic rearview mirror

Abstract

The utility model discloses an electrochromic rearview mirror resistance value testing device, comprising a positioning tool provided with a placing groove, and a detection probe penetrating through the placing groove; the detection probe comprises a probe head, the probe head is installed on the fixing head through an elastic piece, and the detection probe is used for adjusting the contact force and the contact area. According to the utility model, a plurality of groups of probes penetrate through the probe holes in the positioning jig, so that single-station multi-area synchronous detection is realized, the detection rhythm and the detection cost are effectively reduced, and the overall test efficiency is improved; the probe head is installed on the fixed head through the spring, and the sleeve is sleeved outside the probe head, so that the contact force can be adaptively adjusted and the contact area can be increased during resistance detection, good electric contact is ensured, the detection uniformity is effectively improved, and the misjudgment rate is reduced.

Description

TECHNICAL FIELD

[0001] The utility model relates to a rear -view mirror technical field, specifically related to a kind of electrochromic rear -view mirror resistance testing device. BACKGROUND

[0002] Electrochromic Anti-Glare Mirror is a kind of intelligent automobile accessories based on electrochromic technology, mainly used to solve the problem of dazzling caused by strong light of rear vehicle when driving at night. Its core principle is to monitor the light intensity behind in real time through the built-in photosensitive sensor, and when detecting dazzling light source (such as high beam), the electrochromic material in the mirror surface will automatically react under the action of current, making the mirror color gradually deepen, thereby reducing the intensity of reflected light, effectively reducing the glaring spot in the driver's field of view.

[0003] Currently, when testing the resistance of the glass substrate of the electrochromic rear-view mirror, manual probe and glass are needed for detection, which takes a long time for single detection, and multiple serial detection leads to high theoretical efficiency loss. When artificial detection, the contact pressure is uneven and insufficient, the consistency is poor, the contact resistance fluctuates greatly, and the problem of misjudgment occurs. UTILITY MODEL CONTENT

[0004] The utility model aims at: in order to solve the above problem, the utility model provides a kind of electrochromic rear -view mirror resistance testing device.

[0005] The utility model realizes the above-mentioned purpose by adopting the following technical solutions specifically, comprising:

[0006] Positioning jig, the positioning jig is equipped with placing groove, the detection probe is penetrated in the placing groove;

[0007] The detection probe includes probe head, the probe head is installed on the fixed head by elastic member, and the detection probe is used for adjusting contact force and contact area.

[0008] As a further description of the above technical solutions, the positioning jig edge is symmetrically provided with mounting hole, and the mounting hole is used for fixing the positioning jig.

[0009] As a further description of the above technical solutions, the placing groove is opened in the middle of the positioning jig, and a plurality of probe holes are symmetrically opened in the placing groove, and the probe hole is used to accommodate the detection probe.

[0010] As a further description of the above technical solutions, the detection probe is electrically connected with the square resistance tester through the wire.

[0011] As further description of the above technical solutions, a plurality of sets of buckles are symmetrically arranged at the edges of the placing groove, and the buckles cooperate with the placing groove to fix the sample to be tested.

[0012] As further description of the above technical solutions, the detection probe further comprises a sleeve, an accommodating cavity is arranged in the sleeve, and the probe head, the elastic member and the fixing head are installed in the accommodating cavity.

[0013] As further description of the above technical solutions, a detection outlet is arranged at the top of the sleeve, and the probe head penetrates through the detection outlet.

[0014] As further description of the above technical solutions, abutting edges are arranged at the bottom of the probe head, and the abutting edges abut against the edge of the detection outlet of the sleeve.

[0015] As further description of the above technical solutions, an installation groove is arranged in the middle of the probe head, and the installation groove is clamped with the top of the elastic member.

[0016] As further description of the above technical solutions, the bottom of the elastic member is sleeved on the top of the fixing head, and the elastic member is a spring.

[0017] The beneficial effects of the utility model are as follows:

[0018] 1. The utility model discloses a positioning jig, a plurality of sets of probes are arranged in the probe holes of the positioning jig, and the single-station multi-region synchronous detection is realized, so that the detection rhythm and the detection cost are effectively reduced, and the overall test efficiency is improved.

[0019] 2. The utility model discloses that the probe head is installed on the fixing head through the spring, and the sleeve is externally sleeved, so that the contact force can be adaptively adjusted and the contact area can be increased when resistance value detection is carried out, good electrical contact is ensured, the detection uniformity is effectively improved, and the misjudgment rate is reduced.

[0020] In order to more clearly illustrate the structural features and effects of the utility model, the utility model will be described in detail below in combination with the drawings and specific embodiments. DRAWINGS

[0021] Figure 1 It is a structural schematic diagram of the resistance value test device for the electrochromic rearview mirror of the utility model.

[0022] Figure 2 It is a sectional view schematic diagram of the resistance value test device for the electrochromic rearview mirror of the utility model.

[0023] Figure 3 It is a structural schematic diagram of the detection probe of the utility model.

[0024] REFERENCE SIGNS:

[0025] 1. Positioning fixture; 11. Placement slot; 12. Mounting hole; 13. Probe hole; 2. Detection probe; 21. Probe head; 211. Abutment edge; 212. Mounting slot; 22. Elastic element; 23. Fixing head; 24. Sleeve; 241. Receiving cavity; 242. Probe outlet; 3. Wire; 4. Shear resistance tester; 5. Buckle. Detailed Implementation

[0026] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings.

[0027] like Figures 1-3 As shown, in one embodiment, an electrochromic rearview mirror resistance testing device includes: a positioning fixture 1, detection probes 2, and a sheet resistance tester 4. The positioning fixture 1 is used to place the sample to be tested (specifically, a glass substrate whose resistance needs to be tested in this embodiment). Multiple sets of detection probes 2 are symmetrically and evenly spaced below the sample, and the detection probes 2 are electrically connected to the sheet resistance tester 4 via wires 3.

[0028] It is understandable that after pressing down on the glass substrate, the test circuit can be activated by the detection probe 2 to achieve synchronous resistance testing of multiple areas in a single station.

[0029] Furthermore, mounting holes 12 are symmetrically provided along the edge of the positioning fixture 1, allowing the positioning fixture 1 and the test platform to be detachably connected using screws or bolts; correspondingly, multiple sets of clips 5 are symmetrically provided along the edge of the placement groove 11 (e.g., Figure 1 As shown, the buckle 5 is located at the upper left, lower left, upper right and lower right positions of the placement groove 11. After the sample to be tested is placed on the placement groove 11, the edge of the sample to be tested can be fixed by the buckle 5.

[0030] It should be explained in detail that the positioning fixture 1 has a placement groove 11, and the detection probe 2 passes through the placement groove 11; specifically, the positioning fixture 1 is made of bakelite board (flatness of 0.01mm); the placement groove 11 is located in the middle of the positioning fixture 1, and multiple sets of probe holes 13 for accommodating the detection probe 2 are symmetrically formed on the placement groove 11 (e.g., Figure 1 As shown, probe holes 13 are symmetrically arranged in the left, middle and right regions of the placement groove 11, with three sets evenly spaced in each region.

[0031] Please continue reading. Figures 1-3 In this embodiment, the detection probe 2 includes a probe head 21, which is detachably mounted on the fixed head 23 via an elastic member 22.

[0032] It can be understood that the elastic member 22 can be used for buffering and protection when the probe head 21 is in contact with the sample after the sample is pressed, and the contact force and the contact area between the probe head 21 and the sample can be adaptively adjusted.

[0033] It needs to be particularly pointed out that the detection probe 2 further comprises a sleeve 24, and the sleeve 24 is internally provided with a containing cavity 241, and the probe head 21, the elastic member 22 and the fixed head 23 are combined and installed in the containing cavity 241.

[0034] Further, the sleeve 24 is provided with a probe outlet 242 at the top, and the probe head 21 penetrates out of the probe outlet 242; correspondingly, the probe head 21 is provided with an abutting edge 211 at the bottom, and the abutting edge 211 abuts with the edge of the probe outlet 242 of the sleeve 24; and the middle part of the probe head 21 is provided with a mounting groove 212, and the mounting groove 212 is clamped with the top of the elastic member 22; in addition, the bottom of the elastic member 22 is sleeved on the top of the fixed head 23.

[0035] It can be understood that first, the top of the elastic member 22 and the mounting groove 212 at the bottom of the probe head 21 are clamped, then the bottom of the elastic member 22 is sleeved on the top of the fixed head 23, and then they are installed in the containing cavity 241 inside the sleeve 24; and the probe head 21 is pushed out of the probe outlet 242 of the sleeve 24 under the elastic force of the elastic member 22, and the abutting edge 211 of the probe head 21 abuts with the edge of the probe outlet 242 of the sleeve 24.

[0036] Specifically, the probe head 21 and the sleeve 24 are made of gold-plated palladium alloy (the curvature radius is 0.2 mm), and the elastic member 22 is a constant force spring (the pressure tolerance is ±3%).

[0037] Working principle:

[0038] First, the sample (glass substrate) is placed on the mounting groove 212 of the positioning jig 1, then the edge of the sample is abutted and fixed by the buckle 5, then the sample is pressed, so that the bottom end face of the sample is in contact with the probe head 21, during which the probe head 21 moves downward under the pressure to extrude the elastic member 22, and the elastic member 22 is used for buffering and adaptively adjusting the contact pressure and the contact area, and finally the resistance values of different regions of the sample are detected and displayed synchronously by the square resistance tester 4.

[0039] Through the above technical scheme, the present application is realized by penetrating a plurality of groups of probes through the probe holes 13 on the positioning jig 1, realizing the synchronous detection of single-station multi-region, effectively reducing the detection cycle and the detection cost, and improving the overall test efficiency; the probe head 21 is installed on the fixed head 23 through the spring, and is externally sleeved with the sleeve 24, so that the contact force can be adaptively adjusted and the contact area can be increased during resistance value detection, so as to ensure good electrical contact, effectively improve the detection uniformity, and reduce the misjudgment rate.

[0040] The above description of disclosed embodiments enables one of ordinary skill in the art to make or use the application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein can be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. An electrochromic rearview mirror resistance testing device, characterized by, Include: Positioning jig (1), the positioning jig (1) is set with placing groove (11), the detecting probe (2) is penetrated in the placing groove (11); The detecting probe (2) includes probe head (21), the probe head (21) is installed on fixed head (23) by elastic member (22), the detecting probe (2) is used for adjusting contact force and contact area. The positioning jig (1) is symmetrically provided with mounting hole (12) at the edge, and the mounting hole (12) is used for fixing the positioning jig (1).

2. The electrochromic rearview mirror resistance test device of claim 1, wherein, The placing groove (11) is set in the middle of the positioning jig (1), and a plurality of probe holes (13) are symmetrically set in the placing groove (11), and the probe holes (13) are used for accommodating the detecting probe (2).

3. The electrochromic rearview mirror resistance test device of claim 1, wherein, The detecting probe (2) is electrically connected with the lead (3) and the square resistance tester (4).

4. The electrochromic rearview mirror resistance test device of claim 3, wherein, The placing groove (11) is symmetrically provided with a plurality of buckles (5) at the edge, and the buckle (5) cooperates with the placing groove (11) to fix the sample to be measured.

5. The electrochromic rearview mirror resistance test device of claim 3, wherein, The detecting probe (2) further includes sleeve (24), the sleeve (24) is provided with containing cavity (241) inside, the probe head (21), elastic member (22) and fixed head (23) are installed in the containing cavity (241).

6. The electrochromic rearview mirror resistance test device of claim 1, wherein, The top of the sleeve (24) is provided with a probe outlet (242), and the probe head (21) penetrates out of the probe outlet (242).

7. The electrochromic rearview mirror resistance test device of claim 6, wherein, The bottom of the probe head (21) is provided with abutting edge (211), and the abutting edge (211) and the edge of the probe outlet (242) of the sleeve (24) are in abutment.

8. The electrochromic rearview mirror resistance test device of claim 6, wherein, The middle of the probe head (21) is provided with mounting groove (212), and the mounting groove (212) and the top of the elastic member (22) are clamped.

9. The electrochromic rearview mirror resistance test device of claim 6, wherein, The bottom of the elastic member (22) is sleeved on the top of the fixed head (23), and the elastic member (22) is a spring.

10. The electrochromic rearview mirror resistance test device of claim 6, wherein, ​

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