Chip testing device convenient for rapid clamping

Abstract

The utility model discloses a chip testing device convenient for rapid clamping, which comprises a testing seat and a testing block, and is provided with a lifting device and a positioning device, a motor controls a bidirectional screw to rotate, the bidirectional screw drives a movable block to move, the movable block moves to push a fixed block to move, and the fixed block drives a lifting block to move. The lifting block moves in the upward inclined direction, when the lifting block moves, the baffle cancels shielding of the positioning groove, the infrared sensor can position the position of the clamping tool, clamping is facilitated, the clamping tool can be conveniently placed and positioned through the arrangement, the time for correcting the clamping tool is saved in the process of putting in and taking out the chip, and the working efficiency is improved. And the test efficiency is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip testing device technical field, concretely is a chip testing device convenient to fast clamping. BACKGROUND

[0002] Before the chip is put into use, the performance of the chip needs to be tested by using a testing device, and the chip testing device is a device for testing the performance and function of the chip, which plays a crucial role in the chip manufacturing and research and development process, and ensures that the chip meets the design requirements and has high quality.

[0003] For example, the LED chip testing device with the publication number CN210876341U is disclosed, which includes a test table, the upper surface of the test table is provided with a groove, the outer wall of the test table is provided with a test slot, the test slot is communicated with the groove, the test slot is slidably connected with a carrier mechanism, the carrier mechanism includes a carrier plate, a placing plate and a limiting plate, the carrier plate is located below the placing plate, and the limiting plate is located above the placing plate. By setting the carrier mechanism, the unqualified chips can be picked out, the qualified LED chips can be quickly collected and arranged by the detection personnel, time is saved, and the detection efficiency is improved. By setting the test slot and the limiting plate, the LED chip can be clamped and fixed in the inside of the placing slot after the probe is fixed on the LED chip for the adhesion force test, the LED chip can be prevented from shaking or separating in the placing slot, and the push-pull force detection of the LED chip is facilitated.

[0004] Although the above-mentioned chip testing device has certain advantages for taking out the chip, it still has certain disadvantages: when the chip is put into the above-mentioned chip for testing, the chip needs to be precisely attached to the test block to ensure the test result. The chip needs to be clamped by a clamping tool during the placing process, and then placed into the test block. However, the clamping tool has a certain thickness and cannot be placed into the test seat, so it needs to be constantly calibrated during the placing process, and pressing is also needed to place it, which is relatively troublesome and affects the test efficiency. UTILITY MODEL CONTENTS

[0005] (I) Technical problem solved

[0006] In view of the deficiencies of the prior art, the utility model provides a chip testing device convenient to fast clamping, which solves the above-mentioned problems.

[0007] (II) Technical scheme

[0008] In order to achieve the above object, the utility model discloses a kind of chip test device of being convenient for quick clamping, including test seat, test block, lifting device and positioning device, the test block is set to the top of test seat, the lifting device is set to the inside of test seat, the lifting device includes two-way screw rod, motor, light pole, movable block, lifting block, fixed block, fixed rod, limit slot one and support block one, the one end of two-way screw rod is connected with the output shaft of motor by coupling and is transmission, and the other end of two-way screw rod is rotatably connected with the inside of test seat by bearing seat, the motor is installed to the left end of test seat, the light pole is fixed to the inside of test seat, the movable block is set to the outside of two-way screw rod and light pole, the lifting block is set to the outside of test block, the fixed block is fixed to the bottom end of lifting block, and it is through the inside of test seat, the outside of fixed block is fixedly connected with fixed rod, and the outside of fixed rod is set to the inside of limit slot one, the limit slot one is opened to the outside of support block one, the support block one is fixed to the inside of test seat, the positioning device is set to the inside of test seat, and the positioning device is used to position the position of clamping tool.

[0009] Preferably, the positioning device includes a positioning slot, an infrared sensor, a baffle, a connecting block, a round rod, a connecting rod, a sliding block, a limit slot two, a support block two, and a tension spring. The positioning slot is opened in the inside of the lifting block. The infrared sensor is installed in the inside of the positioning slot. The baffle penetrates the inside of the positioning slot. The connecting block is fixed to the bottom end of the baffle. The round rod penetrates the inside of the connecting block, and one end of the round rod is fixed to the outside of the positioning slot, and the other end of the round rod is fixed to the inside of the lifting block. One end of the connecting rod is rotatably connected with the connecting block through a rotating shaft, and the other end of the connecting rod is rotatably connected with the sliding block through a rotating shaft. The sliding block is set in the inside of the limit slot two. The limit slot two is opened to the outside of the support block two. The support block two is fixed to the inside of the test seat. One end of the tension spring is set in the inside of the limit slot two, and the other end of the tension spring is set to the bottom end of the sliding block.

[0010] Preferably, the outside of the movable block is provided with two groups of notches. One group of notches is internally threaded and threadedly connected with the two-way screw rod. The other group of notches is internally smooth and slidably connected with the light pole. The two-way screw rod can drive the movable block to move when rotating.

[0011] Preferably, one end of the outside of the movable block is provided with an inclined surface, which inclines downward from inside to outside. The movable block can drive the fixed block to move when moving.

[0012] Preferably, the limit slot one is inclined. The movement track of the fixed rod is limited.

[0013] Preferably, the bottom end of the fixed block is arc-shaped, which facilitates the pushing of the fixed block by the movable block.

[0014] Preferably, the outer side of the connecting block is provided with a notch and is in sliding connection with the round rod, which makes the movement of the connecting block more stable and smooth.

[0015] (Three) beneficial effects

[0016] The utility model provides a chip testing device convenient for quick clamping has the following beneficial effects: through setting up lifting device and positioning device, through motor control two -way screw rod rotation, two -way screw rod drives movable block to remove, movable block removes and pushes fixed block to remove, fixed block drives lifting block to remove, lifting block removes along the oblique upward direction, removes the baffle of lifting block and makes the positioning groove of shielding, infrared sensor can position the position of clamping tool, and it is convenient to clamp, through this setting convenient clamping tool's placement and positioning, have saved the time of clamping tool calibration in the process of putting and taking out the chip, improved test efficiency. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 It is the structural schematic diagram of the utility model;

[0018] Figure 2 It is the structure front view of lifting device in the utility model;

[0019] Figure 3 It is the structure side view of lifting device in the utility model;

[0020] Figure 4 It is the structure front view of positioning device in the utility model;

[0021] Figure 5 It is the A area local enlarged view of the utility model; Figure 4

[0022] In the drawing: test seat-1, test block-2, lifting device-3, positioning device-4, two -way screw rod-31, motor-32, light pole-33, movable block-34, lifting block-35, fixed block-36, fixed rod-37, limit slot one-38, support block one-39, positioning groove-41, infrared sensor-42, baffle-43, connecting block-44, round rod-45, connecting rod-46, sliding block-47, limit slot two-48, support block two-49, tension spring-410. DETAILED DESCRIPTION

[0023] ​With reference to the drawings of the embodiments of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments of the present application, all the other embodiments obtained by those skilled in the art without creative efforts fall within the scope of the present application.

[0024] Please refer to Figures 1-3 The utility model provides a kind of chip testing device technical scheme being conveniently and quickly clamped: a kind of chip testing device being conveniently and quickly clamped, including test seat 1, test block 2, lifting device 3 and positioning device 4, test block 2 is set to the top of test seat 1, lifting device 3 is set to the inside of test seat 1, lifting device 3 includes two-way screw rod 31, motor 32, light pole 33, movable block 34, lifting block 35, fixed block 36, fixed rod 37, limit groove one 38 and support block one 39, one end of two-way screw rod 31 is connected with the output shaft transmission of motor 32 by coupling, and the other end of two-way screw rod 31 is rotatably connected with the inside of test seat 1 by bearing seat, motor 32 is installed to the left end of test seat 1, light pole 33 is fixed to the inside of test seat 1, movable block 34 is set to the outside of two-way screw rod 31 and light pole 33, lifting block 35 is set to the outside of test block 2, fixed block 36 is fixed to the bottom end of lifting block 35, and passes through the inside of test seat 1, fixed rod 37 is fixedly connected with the outside of fixed block 36, and the outside of fixed rod 37 is set to the inside of limit groove one 38, limit groove one 38 is opened in the outside of support block one 39, support block one 39 is fixed to the inside of test seat 1, positioning device 4 is set to the inside of test seat 1, positioning device 4 is used to position the position of clamping tool, the outside of movable block 34 is equipped with two groups of notches, one group of notches is set in screw thread inside, and is connected with two-way screw rod 31 screw, the other group of notches is set in smooth inside, and is connected with light pole 33 sliding, by this setting, two-way screw rod 31 can drive movable block 34 to move when rotating, the outside one end of movable block 34 is equipped with inclined surface, and from inside to outside, it is inclined downward, by this setting, movable block 34 can push fixed block 36 to move when moving, limit groove one 38 is inclinedly set, by this setting, the movement track of fixed rod 37 is limited, the bottom end of fixed block 36 is arc-shaped setting, by this setting, it is convenient for movable block 34 to push fixed block 36.

[0025] Please refer to Figure 4 And Figure 5The utility model provides a kind of chip testing device technical scheme of being convenient for quick clamping: a kind of chip testing device being convenient for quick clamping, positioning device 4 includes locating groove 41, infrared sensor 42, baffle 43, connecting block 44, round bar 45, connecting rod 46, sliding block 47, limit slot two 48, support block two 49 and tension spring 410, locating groove 41 is opened in the inside of lifting block 35, infrared sensor 42 is installed in the inside of locating groove 41, baffle 43 penetrates the inside of locating groove 41, connecting block 44 is fixed at the bottom end of baffle 43, round bar 45 penetrates the inside of connecting block 44, and one end of round bar 45 is fixed to the outside of locating groove 41, the other end of round bar 45 is fixed to the inside of lifting block 35, one end of connecting rod 46 is rotatably connected with connecting block 44 by pivot, and the other end of connecting rod 46 is rotatably connected with sliding block 47 by pivot, sliding block 47 is arranged in the inside of limit slot two 48, limit slot two 48 is opened in the outside of support block two 49, support block two 49 is fixed in the inside of test seat 1, one end of tension spring 410 is arranged in the inside of limit slot two 48, and the other end of tension spring 410 is arranged at the bottom end of sliding block 47, the outside of connecting block 44 is equipped with notch, and is slidably connected with round bar 45, by this setting, when connecting block 44 moves, it is more stable and smooth.

[0026] Infrared sensor 42 adopts infrared sensor of LIFTMASTER 50-50996 as model, this kind of sensor can quickly detect clamping tool, when clamping tool blocks infrared sensor 42 signal, it can indicate that the position of clamping tool is correct.

[0027] Working principle is as follows:

[0028] First, before use, the chip to be tested is sent to test seat and waits for testing;

[0029] Second, when using, start motor 32, motor 32 drives bidirectional screw rod 31 to rotate, bidirectional screw rod 31 rotates and drives movable block 34 to move by the cooperation with light rod 33, movable block 34 moves and pushes fixed block 36 to move, fixed block 36 moves and is tilted and moves upward by the cooperation of the limit slot one 38 of fixed rod 37;

[0030] Third, fixed block 36 moves and drives lifting block 35 to move, so that lifting block 35 is tilted and moves upward, lifting block 35 moves and drives limit slot one 38 to move synchronously, baffle 43 moves together, baffle 43 moves and drives connecting block 44 to move, connecting block 44 moves and drives sliding block 47 to move by connecting rod 46, the track of sliding block 47 is limited by limit slot two 48, so sliding block 47 and connecting rod 46 will pull connecting block 44 to move along round bar 45, connecting block 44 moves and drives baffle 43 to move, cancels the block of baffle 43 to infrared sensor 42.

[0031] Fourth, the position of the clamping tool is detected by the infrared sensor 42, the clamping tool is placed on the lifting block 35 with the chip, the lifting block 35 is controlled to descend by the motor 32, the lifting block 35 drives the chip to enter the test block 2 when descending, when the lifting block 35 returns to the original position, the baffle 43 re-blocks the infrared sensor 42, the illumination of the infrared sensor 42 avoids affecting the test result of the chip, and then the test can be carried out;

[0032] Fifth, when the test is completed, steps two and three are repeated, the lifting block 35 is lifted, and the chip can be taken out by the clamping tool.

[0033] The control mode of the utility model is controlled by manually starting and closing switch, and the wiring diagram of power element and the provision of power supply are the common knowledge in the art, and the utility model is mainly used for protecting mechanical device, so the control mode and wiring arrangement of the utility model are not explained in detail.

[0034] The control mode of the utility model is automatically controlled by the controller, the control circuit of the controller can be realized by simple programming of the technical personnel in the art, and the provision of power supply also belongs to the common knowledge in the art, and the utility model is mainly used for protecting mechanical device, so the control mode and circuit connection of the utility model are not explained in detail.

[0035] Although the embodiments of the utility model have been shown and described, it can be understood by those skilled in the art that various changes, modifications, replacements and variations can be made to these embodiments without departing from the principles and spirits of the utility model, and the scope of the utility model is defined by the appended claims and their equivalents.

Claims

1. A chip testing device that facilitates rapid clamping, characterized in that: The test base includes a test stand (1), a test block (2), a lifting device (3), and a positioning device (4). The test block (2) is located at the top of the test stand (1). The lifting device (3) is located inside the test stand (1). The lifting device (3) includes a bidirectional screw (31), a motor (32), a guide rod (33), a movable block (34), a lifting block (35), a fixed block (36), a fixed rod (37), a limiting groove (38), and a support block (39). One end of the bidirectional screw (31) is connected to the output shaft of the motor (32) via a coupling, and the other end of the bidirectional screw (31) is rotatably connected to the inside of the test stand (1) via a bearing seat. The motor (32) is installed at the left end of the test stand (1). The guide rod... (33) is fixed inside the test base (1). The movable block (34) is located outside the bidirectional screw (31) and the light rod (33). The lifting block (35) is located outside the test block (2). The fixing block (36) is fixed to the bottom end of the lifting block (35) and penetrates the inside of the test base (1). The fixing rod (37) is fixedly connected to the outside of the fixing block (36). The outside of the fixing rod (37) is located inside the limiting groove (38). The limiting groove (38) is opened on the outside of the support block (39). The support block (39) is fixed inside the test base (1). The positioning device (4) is located inside the test base (1). The positioning device (4) is used to position the clamping tool.

2. The chip testing device for easy and rapid clamping according to claim 1, characterized in that: The positioning device (4) includes a positioning groove (41), an infrared sensor (42), a baffle (43), a connecting block (44), a round rod (45), a connecting rod (46), a sliding block (47), a second limiting groove (48), a second support block (49), and a tension spring (410). The positioning groove (41) is opened inside the lifting block (35). The infrared sensor (42) is installed inside the positioning groove (41). The baffle (43) penetrates the interior of the positioning groove (41). The connecting block (44) is fixed to the bottom end of the baffle (43). The round rod (45) penetrates the interior of the connecting block (44), and one end of the round rod (45) is fixed. On the outside of the positioning groove (41), the other end of the round rod (45) is fixed inside the lifting block (35). One end of the connecting rod (46) is rotatably connected to the connecting block (44) through a rotating shaft, and the other end of the connecting rod (46) is rotatably connected to the sliding block (47) through a rotating shaft. The sliding block (47) is located inside the limiting groove two (48). The limiting groove two (48) is opened on the outside of the support block two (49). The support block two (49) is fixed inside the test seat (1). One end of the tension spring (410) is located inside the limiting groove two (48), and the other end of the tension spring (410) is located at the bottom end of the sliding block (47).

3. The chip testing device for easy and rapid clamping according to claim 1, characterized in that: The movable block (34) has two sets of notches on its outer side. One set of notches is threaded and threaded to the bidirectional screw (31). The other set of notches is smooth and slidably connected to the smooth rod (33).

4. The chip testing device for easy and rapid clamping according to claim 1, characterized in that: The movable block (34) has an inclined surface at one end of its outer side, which is inclined downward from the inside out.

5. The chip testing device for easy and rapid clamping according to claim 1, characterized in that: The limiting groove (38) is inclined.

6. The chip testing device for easy and rapid clamping according to claim 1, characterized in that: The bottom end of the fixing block (36) is arc-shaped.

7. The chip testing device for easy and rapid clamping according to claim 2, characterized in that: The connecting block (44) has a notch on its outer side and is slidably connected to the round rod (45).

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