PTC sheet surface electrode testing device
By designing a PTC chip surface electrode testing device, the problem of testing multiple PTC chips under power was solved, realizing a convenient and efficient testing process and ensuring product quality.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- HAINING YONGLI ELECTRONICS CERAMICS
- Filing Date
- 2025-04-23
- Publication Date
- 2026-04-17
AI Technical Summary
Existing technologies make it difficult to efficiently test the energization of surface electrodes on multiple PTC wafers, resulting in difficulties in guaranteeing product quality.
Design a PTC chip surface electrode testing device, including a frame, column, upper and lower electrode movable plates, quick clamps and other components, to achieve power-on testing of multiple PTC chips through manual operation.
This enables convenient power-on testing of multiple PTC chips, improving product quality stability and testing efficiency.
Smart Images

Figure CN224137384U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of mechanical technology and relates to a PTC sheet surface electrode testing device. Background Technology
[0002] As a heating element, the PTC chip has the ability to efficiently convert electrical energy into heat energy, thereby achieving an ideal heating effect. To ensure the quality of the final product, the PTC chip must be covered with an entire electrode surface for energization testing before it is integrated into the component; and to facilitate energization testing of multiple PTC chips at the same time, it is particularly necessary to design a PTC chip surface electrode testing device. Summary of the Invention
[0003] The purpose of this invention is to address the aforementioned problems in existing technologies by proposing a PTC sheet surface electrode testing device.
[0004] The objective of this utility model can be achieved through the following technical solution: A PTC wafer surface electrode testing device, comprising a frame, characterized in that: a column is vertically mounted on the frame, a guide sleeve is slidably connected to the column, an upper electrode movable plate is installed between the guide sleeves, at least one upper electrode is provided on the upper electrode movable plate, a horizontal plate is also installed between the columns, and the horizontal plate is located above the upper electrode movable plate, a quick clamp is installed on the horizontal plate, the working rod of the quick clamp is connected to the upper electrode movable plate, a housing is mounted on the frame, a lower electrode fixing plate is mounted on the housing, and a lower electrode that cooperates with the upper electrode is mounted on the lower electrode fixing plate.
[0005] A metal rod is vertically mounted on the upper electrode movable plate, the upper electrode is movably connected to the metal rod, and a spring is also provided between the upper electrode and the upper electrode movable plate.
[0006] An auxiliary plate is installed on the upper electrode movable plate, and the auxiliary plate is located between the horizontal plate and the upper electrode movable plate. A protective cover is installed vertically on the auxiliary plate.
[0007] Both the upper electrode movable plate and the lower electrode fixed plate are made of insulating plates.
[0008] The protective cover is a transparent, visible cover.
[0009] The upright is mounted on the frame via mounting blocks, the horizontal plate is mounted on the upright via fixing blocks, and the auxiliary plate is mounted on the upper electrode movable plate via connecting columns.
[0010] Compared with existing technologies, this PTC chip surface electrode testing device has the following advantages:
[0011] In this invention, multiple PTC chips are placed at the lower electrode corresponding to the lower electrode fixing plate. By manually operating the quick clamp, the upper electrode movable plate moves downward, and the upper electrode contacts the PTC chips, thereby enabling the power-on testing of multiple PTC products. The testing is convenient. Attached Figure Description
[0012] Figure 1 This is a three-dimensional structural schematic diagram of the present invention;
[0013] Figure 2 This is a schematic diagram of the three-dimensional structure of the removed portion of this utility model. Figure 1 ;
[0014] Figure 3 This is a schematic diagram of the three-dimensional structure of the removed portion of this utility model. Figure 2 ;
[0015] In the diagram, 1. Frame; 2. Housing; 3. Lower electrode fixing plate; 4. Lower electrode; 5. Protective cover; 6. Horizontal plate; 7. Quick clamp; 8. Column; 9. Auxiliary plate; 10. Upper electrode movable plate; 11. Guide sleeve; 12. Upper electrode; 13. Metal rod; 14. Fixing block; 15. Mounting block; 16. Spring; 17. Nut; 18. Connecting column. Detailed Implementation
[0016] The following are specific embodiments of the present invention, which are described in conjunction with the accompanying drawings. However, the present invention is not limited to these embodiments.
[0017] like Figures 1-3 As shown, this PTC wafer surface electrode testing device includes a frame 1, on which columns 8 are vertically mounted. Guide sleeves 11 are slidably connected to columns 8. An upper electrode movable plate 10 is installed between the guide sleeves 11. At least one upper electrode 12 is provided on the upper electrode movable plate 10. A horizontal plate 6 is also installed between the columns 8, and the horizontal plate 6 is located above the upper electrode movable plate 10. A quick clamp 7 is installed on the horizontal plate 6. The quick clamp 7 is a commercially available product. The working rod of the quick clamp 7 is connected to the upper electrode movable plate 10. A housing 2 is installed on the frame 1. A lower electrode fixing plate 3 is installed on the housing 2. A lower electrode 4 that cooperates with the upper electrode 12 is installed on the lower electrode fixing plate 3. In this embodiment, there are ten upper electrodes 12 and ten lower electrodes 4. The upper electrodes 12 and the lower electrodes 4 are connected to the existing testing host through wires. This is a prior art.
[0018] A metal rod 13 is vertically mounted on the upper electrode movable plate 10. The upper electrode 12 is movably connected to the metal rod 13. A spring 16 is also provided between the upper electrode 12 and the upper electrode movable plate 10. In practice, the metal rod 13 is a universal movable copper rod. Its upper end is reliably connected to the upper electrode movable plate 10 by a nut 17, and its lower end is movably connected to the upper electrode 12 in the existing way. With the cooperation of the spring 16, it is ensured that the upper electrode 12 can precisely fit the surface electrode of the PTC sheet during the pressing process.
[0019] An auxiliary plate 9 is installed on the upper electrode movable plate 10, and the auxiliary plate 9 is located between the horizontal plate 6 and the upper electrode movable plate 10. A protective cover 5 is installed vertically on the auxiliary plate 9. The protective cover 5 is a transparent and visible cover. The use of the protective cover 5 can ensure the safety of the test.
[0020] Both the upper electrode movable plate 10 and the lower electrode fixed plate 3 are made of insulating plates.
[0021] The column 8 is mounted on the frame 1 via the mounting block 15, the horizontal plate 6 is mounted on the column 8 via the fixing block 14, and the auxiliary plate 9 is mounted on the upper electrode movable plate 10 via the connecting column 18.
[0022] In this invention, multiple PTC chips are placed at the lower electrode 4 corresponding to the lower electrode fixing plate 3. By manually operating the quick clamp 7, the upper electrode movable plate 10 moves downward, and the upper electrode 12 contacts the PTC chips, thereby realizing the power-on test of multiple PTC products, which is convenient.
[0023] In summary, additional testing items have been added to the PTC product testing to ensure stable product quality.
[0024] All of the above components are general standard parts or components known to those skilled in the art. Their structure and principles can be learned by those skilled in the art through technical manuals or conventional experimental methods.
[0025] The specific embodiments described herein are merely illustrative examples illustrating the spirit of this utility model. Those skilled in the art to which this utility model pertains may make various modifications or additions to the described specific embodiments or use similar methods to substitute them, without departing from the spirit of this utility model or exceeding the scope defined by the appended claims.
Claims
1. A PTC wafer surface electrode testing device, comprising a frame (1), characterized in that, A column (8) is vertically mounted on the frame (1). A guide sleeve (11) is slidably connected to the column (8). An upper electrode movable plate (10) is installed between the guide sleeves (11). At least one upper electrode (12) is provided on the upper electrode movable plate (10). A horizontal plate (6) is also installed between the columns (8), and the horizontal plate (6) is located above the upper electrode movable plate (10). A quick clamp (7) is installed on the horizontal plate (6). The working rod of the quick clamp (7) is connected to the upper electrode movable plate (10). A housing (2) is installed on the frame (1). A lower electrode fixing plate (3) is installed on the housing (2). A lower electrode (4) that cooperates with the upper electrode (12) is installed on the lower electrode fixing plate (3).
2. The PTC sheet surface electrode testing device according to claim 1, wherein A metal rod (13) is vertically mounted on the upper electrode movable plate (10), and the upper electrode (12) is movably connected to the metal rod (13). A spring (16) is also provided between the upper electrode (12) and the upper electrode movable plate (10).
3. The PTC sheet surface electrode testing device according to claim 1, wherein An auxiliary plate (9) is installed on the upper electrode movable plate (10), and the auxiliary plate (9) is located between the horizontal plate (6) and the upper electrode movable plate (10). A protective cover (5) is installed vertically on the auxiliary plate (9).
4. The PTC sheet surface electrode testing device according to claim 1, wherein Both the upper electrode movable plate (10) and the lower electrode fixed plate (3) are made of insulating plates.
5. The PTC sheet surface electrode testing device according to claim 3, wherein The protective cover (5) is a transparent, visible cover.
6. The PTC sheet surface electrode testing device according to claim 3, wherein The column (8) is mounted on the frame (1) by the mounting block (15), the horizontal plate (6) is mounted on the column (8) by the fixing block (14), and the auxiliary plate (9) is mounted on the upper electrode movable plate (10) by the connecting column (18).